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CN114823351A - Metal bump structure and its manufacturing method and driving substrate - Google Patents

Metal bump structure and its manufacturing method and driving substrate Download PDF

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Publication number
CN114823351A
CN114823351A CN202110118630.9A CN202110118630A CN114823351A CN 114823351 A CN114823351 A CN 114823351A CN 202110118630 A CN202110118630 A CN 202110118630A CN 114823351 A CN114823351 A CN 114823351A
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metal bump
driving substrate
insulating layer
metal
pad
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CN114823351B (en
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曾子章
陈铭如
罗正中
王金胜
唐伟森
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Unimicron Technology Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
    • H01L21/4814Conductive parts
    • H01L21/4846Leads on or in insulating or insulated substrates, e.g. metallisation
    • H01L21/4853Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H01L23/49816Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49838Geometry or layout
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/441Interconnections, e.g. scanning lines
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Wire Bonding (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

The invention provides a metal bump structure, a manufacturing method thereof and a driving substrate. The manufacturing method of the metal bump structure comprises the following steps. A drive substrate is provided. At least one pad and an insulating layer are formed on the driving substrate. The pad is formed on the configuration surface of the driving substrate and has an upper surface. The insulating layer covers the configuration surface of the driving substrate and the connecting pad and exposes part of the upper surface of the connecting pad. And forming a patterned metal layer on the upper surface of the pad exposed by the insulating layer and extending to cover part of the insulating layer. And performing a chemical plating process to form at least one metal bump on the patterned metal layer. The first extending direction of the metal bump is perpendicular to the second extending direction of the driving substrate. The metal bump structure and the manufacturing method thereof have the advantages of simple manufacturing process, low cost, no environmental pollution and the like.

Description

金属凸块结构及其制作方法与驱动基板Metal bump structure and its manufacturing method and driving substrate

技术领域technical field

本发明涉及一种凸块结构及其制作方法与基板,尤其涉及一种金属凸块结构及其制作方法与具有此金属凸块结构的驱动基板。The present invention relates to a bump structure, a manufacturing method thereof, and a substrate, in particular to a metal bump structure, a fabrication method thereof, and a driving substrate having the metal bump structure.

背景技术Background technique

目前主动式驱动(AM Driving)的微型发光二极管显示器(Micro LED Display),大都是使用薄膜晶体管(Thin Film Transistor,TFT)玻璃基板来驱动发光二极管。然而,薄膜晶体管为薄膜制程,其上的金属导线与发光区(pixel area)的铟锡氧化物(IndiumTin Oxide,ITO)仅为纳米级,因此当发光二极管或表面黏着元件(Surface Mount Device,SMD)要焊接(Solder Bonding)在铟锡氧化物导电层上面时,无法形成可靠的介面金属化合物(Intermetallic Compound,IMC)而黏接在一起。为了解决上述的问题,目前是采用电镀(Electrodeplating)的方式在铟锡氧化物导电层上形成一层厚铜。然而,电镀厚铜的制程冗长复杂,除了会增加制造的费用之外,因为是湿式制程,也容易造成环境污染。At present, the Micro LED Displays of active driving (AM Driving) mostly use Thin Film Transistor (TFT) glass substrates to drive the light emitting diodes. However, the thin film transistor is a thin film process, and the metal wires on it and the indium tin oxide (ITO) in the pixel area are only nano-scale, so when the light emitting diode or surface mount device (Surface Mount Device, SMD) ) when soldering (Solder Bonding) on the indium tin oxide conductive layer, a reliable interface metal compound (Intermetallic Compound, IMC) cannot be formed and bonded together. In order to solve the above problems, a thick layer of copper is formed on the indium tin oxide conductive layer by electroplating at present. However, the process of electroplating thick copper is long and complicated, which not only increases the manufacturing cost, but also easily causes environmental pollution because it is a wet process.

发明内容SUMMARY OF THE INVENTION

本发明是针对一种金属凸块结构及其制作方法,其具有制程简单、低成本且不会造成环境污染等优势。The present invention is directed to a metal bump structure and a manufacturing method thereof, which have the advantages of simple manufacturing process, low cost, and no environmental pollution.

本发明是针对一种驱动基板,包括上述的金属凸块结构,可具有较佳的结构可靠度。The present invention is directed to a driving substrate including the above-mentioned metal bump structure, which can have better structural reliability.

根据本发明的实施例,金属凸块结构的制作方法,其包括以下步骤。提供驱动基材。驱动基材上已形成有至少一接垫以及绝缘层。接垫形成于驱动基材的配置面上且具有上表面。绝缘层覆盖驱动基材的配置面与接垫且暴露出接垫的部分上表面。形成图案化金属层于绝缘层所暴露出的接垫的上表面上且延伸覆盖部分绝缘层。进行化学镀(Electrodeless Plating,ELP)程序,以于图案化金属层上形成至少一金属凸块。金属凸块的第一延伸方向垂直于驱动基材的第二延伸方向。According to an embodiment of the present invention, a method for fabricating a metal bump structure includes the following steps. Supplied with drive substrate. At least one pad and an insulating layer have been formed on the driving substrate. The pads are formed on the disposition surface of the driving substrate and have an upper surface. The insulating layer covers the configuration surface of the driving substrate and the pads and exposes a part of the upper surface of the pads. A patterned metal layer is formed on the upper surface of the pad exposed by the insulating layer and extends to cover part of the insulating layer. An electroless plating (ELP) process is performed to form at least one metal bump on the patterned metal layer. The first extension direction of the metal bump is perpendicular to the second extension direction of the driving substrate.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的形成图案化金属层的步骤,包括形成催化剂层于绝缘层以及绝缘层所暴露出的接垫的上表面上。对催化剂层进行活化程序与图案化程序,而形成图案化金属层。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the above-mentioned step of forming a patterned metal layer includes forming a catalyst layer on the insulating layer and the upper surface of the pads exposed by the insulating layer. The activation process and the patterning process are performed on the catalyst layer to form a patterned metal layer.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的形成催化剂层的方法包括喷墨印刷(Inkjet Printing)法。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the above-mentioned method for forming the catalyst layer includes an inkjet printing method.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的催化剂层的材质包括纳米钯(Nano-Pd),或任何可还原化学铜的纳米金属例如纳米金或纳米银。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the material of the catalyst layer includes nano-palladium (Nano-Pd), or any nano-metal that can reduce chemical copper, such as nano-gold or nano-silver.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的活化程序包括激光活化(Laser Activation)程序或加热程序。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the above-mentioned activation procedure includes a laser activation procedure or a heating procedure.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的图案化金属层的材质包括钯、金或银。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the material of the patterned metal layer includes palladium, gold or silver.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的金属凸块的材质包括铜、金、锡或镍。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the material of the above-mentioned metal bump includes copper, gold, tin or nickel.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的金属凸块的剖面形状包括类圆形或矩形。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the cross-sectional shape of the above-mentioned metal bump includes a circle or a rectangle.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的接垫的材质包括铟锡氧化物(Indium Tin Oxide,ITO),或任何溅镀的金属层例如钛、铜、钼、铝或铬。In the method for fabricating the metal bump structure according to the embodiment of the present invention, the material of the above-mentioned pads includes Indium Tin Oxide (ITO), or any sputtered metal layer such as titanium, copper, molybdenum, Aluminum or Chrome.

在根据本发明的实施例的金属凸块结构的制作方法中,上述的金属凸块的厚度介于1微米至10微米之间。In the method for fabricating a metal bump structure according to an embodiment of the present invention, the thickness of the aforementioned metal bump is between 1 μm and 10 μm.

根据本发明的实施例,金属凸块结构,配置于驱动基材上。驱动基材上配置有接垫以及绝缘层。接垫配置于驱动基材的配置面上且具有上表面。绝缘层覆盖驱动基材的配置面与接垫且暴露出接垫的部分上表面。金属凸块结构包括图案化金属层以及金属凸块。图案化金属层配置于绝缘层所暴露出的接垫的上表面上且延伸覆盖部分绝缘层。金属凸块配置于图案化金属层上,其中金属凸块的第一延伸方向垂直于驱动基材的第二延伸方向。According to an embodiment of the present invention, the metal bump structure is disposed on the driving substrate. A pad and an insulating layer are arranged on the driving substrate. The pads are arranged on the arrangement surface of the driving substrate and have an upper surface. The insulating layer covers the configuration surface of the driving substrate and the pads and exposes a part of the upper surface of the pads. The metal bump structure includes a patterned metal layer and metal bumps. The patterned metal layer is disposed on the upper surface of the pad exposed by the insulating layer and extends to cover part of the insulating layer. The metal bumps are disposed on the patterned metal layer, wherein the first extension direction of the metal bumps is perpendicular to the second extension direction of the driving substrate.

在根据本发明的实施例的金属凸块结构中,上述的图案化金属层的材质包括钯,或任何可还原化学铜的纳米金属例如金、银。In the metal bump structure according to the embodiment of the present invention, the material of the above-mentioned patterned metal layer includes palladium, or any nano metal such as gold and silver that can reduce chemical copper.

在根据本发明的实施例的金属凸块结构中,上述的金属凸块的材质包括铜、金、锡或镍。In the metal bump structure according to the embodiment of the present invention, the material of the aforementioned metal bump includes copper, gold, tin or nickel.

在根据本发明的实施例的金属凸块结构中,上述的金属凸块的剖面形状包括类圆形或矩形。In the metal bump structure according to the embodiment of the present invention, the cross-sectional shape of the above-mentioned metal bump includes a quasi-circle or a rectangle.

在根据本发明的实施例的金属凸块结构中,上述的金属凸块的厚度介于1微米至10微米之间。In the metal bump structure according to the embodiment of the present invention, the thickness of the aforementioned metal bump is between 1 μm and 10 μm.

根据本发明的实施例,驱动基板,其包括驱动基材、至少一主动元件、至少一接垫、绝缘层以及至少一金属凸块结构。驱动基材具有配置面。主动元件配置于驱动基材的配置面上。接垫配置于驱动基材的配置面上,且具有上表面。绝缘层覆盖驱动基材的配置面、主动元件以及接垫,且绝缘层暴露出接垫的部分上表面。金属凸块结构包括图案化金属层以及金属凸块。图案化金属层配置于绝缘层所暴露出的接垫的上表面上且延伸覆盖部分绝缘层。金属凸块配置于图案化金属层上。金属凸块的第一延伸方向垂直于驱动基材的第二延伸方向。According to an embodiment of the present invention, a driving substrate includes a driving substrate, at least one active element, at least one pad, an insulating layer, and at least one metal bump structure. The drive substrate has a configuration surface. The active element is arranged on the arrangement surface of the driving substrate. The pads are arranged on the arrangement surface of the driving substrate and have an upper surface. The insulating layer covers the configuration surface of the driving substrate, the active element and the pad, and the insulating layer exposes a part of the upper surface of the pad. The metal bump structure includes a patterned metal layer and metal bumps. The patterned metal layer is disposed on the upper surface of the pad exposed by the insulating layer and extends to cover part of the insulating layer. The metal bumps are disposed on the patterned metal layer. The first extension direction of the metal bump is perpendicular to the second extension direction of the driving substrate.

在根据本发明的实施例的驱动基板中,上述的图案化金属层的材质包括钯,而金属凸块的材质包括铜、金、锡或镍。In the driving substrate according to the embodiment of the present invention, the material of the patterned metal layer includes palladium, and the material of the metal bump includes copper, gold, tin or nickel.

在根据本发明的实施例的驱动基板中,上述的金属凸块的剖面形状包括类圆形或矩形。In the driving substrate according to the embodiment of the present invention, the cross-sectional shape of the above-mentioned metal bump includes a quasi-circle or a rectangle.

在根据本发明的实施例的驱动基板中,上述的金属凸块的厚度介于1微米至10微米之间。In the driving substrate according to the embodiment of the present invention, the thickness of the above-mentioned metal bumps is between 1 μm and 10 μm.

在根据本发明的实施例的驱动基板中,上述的接垫的材质包括铟锡氧化物,或任何溅镀的金属层例如钛、铜、钼、铝或铬。In the driving substrate according to the embodiment of the present invention, the material of the above-mentioned pads includes indium tin oxide, or any sputtered metal layer such as titanium, copper, molybdenum, aluminum or chromium.

基于上述,在本发明的金属凸块结构的制作方法中,是通过化学镀程序来形成金属凸块。相较于现有以湿式制程的电镀程序来形成金属凸块而言,本发明采干式制程来形成金属凸块,可具有制程简单、低成本且不会造成环境污染等优势。此外,采用本发明的金属凸块结构的驱动基板,于后续接合发光元件时,发光元件可与金属凸块结构之间可形成良好介面金属化合物,可具有较佳的结构可靠度。Based on the above, in the method for fabricating the metal bump structure of the present invention, the metal bump is formed through an electroless plating process. Compared with the conventional wet process electroplating process to form the metal bumps, the present invention adopts the dry process to form the metal bumps, which has the advantages of simple process, low cost and no environmental pollution. In addition, when using the driving substrate of the metal bump structure of the present invention, when the light emitting element is subsequently bonded, a good interface metal compound can be formed between the light emitting element and the metal bump structure, which can have better structural reliability.

附图说明Description of drawings

图1A至图1D是依照本发明的一实施例的一种金属凸块结构的制作方法的剖面示意图;1A to 1D are schematic cross-sectional views of a method for fabricating a metal bump structure according to an embodiment of the present invention;

图2示出为本发明的另一实施例的一种金属凸块结构的剖面示意图;2 is a schematic cross-sectional view of a metal bump structure according to another embodiment of the present invention;

图3A示出为本发明的一实施例的一种驱动基板的剖面示意图;3A is a schematic cross-sectional view of a driving substrate according to an embodiment of the present invention;

图3B示出为在图3A的驱动基板上配置发光元件的剖面示意图。FIG. 3B is a schematic cross-sectional view of disposing a light-emitting element on the driving substrate of FIG. 3A .

附图标记说明Description of reference numerals

100:驱动基板;100: driving substrate;

110:驱动基材;110: driving the substrate;

112:配置面;112: configuration surface;

120:接垫;120: pad;

122:上表面;122: upper surface;

130:绝缘层;130: insulating layer;

140:主动元件;140: active element;

200a、200b:金属凸块结构;200a, 200b: metal bump structures;

210:图案化金属层;210: patterned metal layer;

210a:催化剂层;210a: catalyst layer;

220a、220b:金属凸块;220a, 220b: metal bumps;

222:上表面;222: upper surface;

300:发光元件;300: light-emitting element;

D1:第一延伸方向;D1: the first extension direction;

D2:第二延伸方向;D2: the second extension direction;

T:厚度。T: Thickness.

具体实施方式Detailed ways

现将详细地参考本发明的示范性实施例,示范性实施例的实例说明于附图中。只要有可能,相同元件符号在附图和描述中用来表示相同或相似部分。Reference will now be made in detail to the exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numerals are used in the drawings and description to refer to the same or like parts.

图1A至图1D是依照本发明的一实施例的一种金属凸块结构的制作方法的剖面示意图。请先参考图1A,关于本实施例的金属凸块结构的制作方法,首先,提供驱动基材110。驱动基板110上已形成有至少一接垫(示意地示出两个接垫120)以及绝缘层130。接垫120形成于驱动基材110的配置面112上且具有上表面122。绝缘层130覆盖驱动基材110的配置面112与接垫120且暴露出接垫120的部分上表面122。此处,驱动基材110例如是薄膜晶体管(TFT)玻璃基板,而接垫120的材质例如是铟锡氧化物,或任何溅镀的金属层例如钛、铜、钼、铝或铬。意即,接垫120与驱动基材110上的像素电极属于同一层,皆采用铟锡氧化物来制作。1A to 1D are schematic cross-sectional views of a method for fabricating a metal bump structure according to an embodiment of the present invention. Referring first to FIG. 1A , regarding the fabrication method of the metal bump structure of the present embodiment, first, a driving substrate 110 is provided. At least one pad (two pads 120 are schematically shown) and an insulating layer 130 have been formed on the driving substrate 110 . The pads 120 are formed on the disposition surface 112 of the driving substrate 110 and have an upper surface 122 . The insulating layer 130 covers the configuration surface 112 of the driving substrate 110 and the pads 120 and exposes a part of the upper surface 122 of the pads 120 . Here, the driving substrate 110 is, for example, a thin film transistor (TFT) glass substrate, and the material of the pads 120 is, for example, indium tin oxide, or any sputtered metal layer such as titanium, copper, molybdenum, aluminum or chromium. That is, the pads 120 and the pixel electrodes on the driving substrate 110 belong to the same layer, and are both made of indium tin oxide.

接着,请先参考图1C,形成图案化金属层210于绝缘层130所暴露出的接垫120的上表面122上且延伸覆盖部分绝缘层130。详细来说,形成图案化金属层210的步骤,请参考图1B,形成催化剂层210a于绝缘层130以及绝缘层130所暴露出的接垫120的上表面122上。催化剂层210a于驱动基材110上的正投影大于对应的接垫120于驱动基材110上的正投影。此处,形成催化剂层210a的方法例如是喷墨印刷法,而催化剂层210a的材质例如是纳米钯,或任何可还原化学铜的纳米金属例如纳米金或纳米银。Next, referring to FIG. 1C , a patterned metal layer 210 is formed on the upper surface 122 of the pad 120 exposed by the insulating layer 130 and extends to cover part of the insulating layer 130 . In detail, for the steps of forming the patterned metal layer 210 , please refer to FIG. 1B , forming a catalyst layer 210 a on the insulating layer 130 and the upper surface 122 of the pads 120 exposed by the insulating layer 130 . The orthographic projection of the catalyst layer 210 a on the driving substrate 110 is larger than the orthographic projection of the corresponding pad 120 on the driving substrate 110 . Here, the method for forming the catalyst layer 210a is, for example, inkjet printing, and the material of the catalyst layer 210a is, for example, nano-palladium, or any nano-metal that can reduce chemical copper, such as nano-gold or nano-silver.

之后,请再同时参考图1B与图1C,对催化剂层210a进行活化程序与图案化程序,而形成图案化金属层210。图案化金属层210于驱动基材110上的正投影小于对应的接垫120于驱动基材110上的正投影。此处,活化程序例如是激光活化程序或加热程序。若采用纳米钯(此为离子态)来做为催化剂层210a,则经由活化后的催化剂层210a可形成金属钯,之后,经由图案化程序此金属钯,则可形成图案化金属层210。因此,本实施例的图案化金属层的材质具体化为钯,或任何可还原化学铜的纳米金属例如金或银。After that, please refer to FIG. 1B and FIG. 1C at the same time, and perform an activation process and a patterning process on the catalyst layer 210 a to form a patterned metal layer 210 . The orthographic projection of the patterned metal layer 210 on the driving substrate 110 is smaller than the orthographic projection of the corresponding pads 120 on the driving substrate 110 . Here, the activation procedure is, for example, a laser activation procedure or a heating procedure. If nano-palladium (in ionic state) is used as the catalyst layer 210a, metal palladium can be formed through the activated catalyst layer 210a, and then the patterned metal layer 210 can be formed by patterning the metal palladium. Therefore, the material of the patterned metal layer in this embodiment is embodied as palladium, or any nano metal such as gold or silver that can reduce chemical copper.

最后,请参考图1D,进行化学镀程序,以于图案化金属层210上形成至少一金属凸块(示意地示出两个金属凸块220a)。化学镀的机制是通过氧化还原反应,具有较低的成本,且生产时间短,可依据需求而选择性地成长成所需的形状。金属凸块220a的第一延伸方向D1垂直于驱动基材110的第二延伸方向D2。此处,金属凸块220a的材质例如是铜、金或镍。金属凸块220a的剖面形状例如是矩形,且金属凸块220a的厚度T例如介于1微米至10微米之间。至此,已完成金属凸块结构200a的制作。Finally, referring to FIG. 1D , an electroless plating process is performed to form at least one metal bump (two metal bumps 220 a are schematically shown) on the patterned metal layer 210 . The mechanism of electroless plating is through redox reaction, which has low cost and short production time, and can be selectively grown into a desired shape according to demand. The first extending direction D1 of the metal bumps 220 a is perpendicular to the second extending direction D2 of the driving substrate 110 . Here, the material of the metal bump 220a is, for example, copper, gold or nickel. The cross-sectional shape of the metal bump 220 a is, for example, a rectangle, and the thickness T of the metal bump 220 a is, for example, between 1 μm and 10 μm. So far, the fabrication of the metal bump structure 200a has been completed.

在结构上,请再参考图1D,金属凸块结构200a配置于驱动基材110上。驱动基材110上配置有接垫120以及绝缘层130。接垫120配置于驱动基材110的配置面112上且具有上表面122。绝缘层130覆盖驱动基材110的配置面112与接垫120且暴露出接垫120的部分上表面122。金属凸块结构200a包括图案化金属层210以及金属凸块220a。图案化金属层210配置于绝缘层130所暴露出的接垫120的上表面122上且延伸覆盖部分绝缘层130,其中图案化金属层210的材质例如是钯,或任何可还原化学铜的纳米金属例如金或银。金属凸块220a配置于图案化金属层210上,其中金属凸块220a的第一延伸方向D1垂直于驱动基材110的第二延伸方向D2。此处,金属凸块220a的材质例如是铜、金或镍,而金属凸块220a的剖面形状例如是矩形,且金属凸块220a的厚度T介于1微米至10微米之间。Structurally, please refer to FIG. 1D again, the metal bump structure 200 a is disposed on the driving substrate 110 . A pad 120 and an insulating layer 130 are disposed on the driving substrate 110 . The pads 120 are disposed on the disposition surface 112 of the driving substrate 110 and have an upper surface 122 . The insulating layer 130 covers the configuration surface 112 of the driving substrate 110 and the pads 120 and exposes a part of the upper surface 122 of the pads 120 . The metal bump structure 200a includes a patterned metal layer 210 and metal bumps 220a. The patterned metal layer 210 is disposed on the upper surface 122 of the pads 120 exposed by the insulating layer 130 and extends to cover part of the insulating layer 130 , wherein the material of the patterned metal layer 210 is, for example, palladium, or any nanometer capable of reducing chemical copper. Metals such as gold or silver. The metal bumps 220 a are disposed on the patterned metal layer 210 , wherein the first extending direction D1 of the metal bumps 220 a is perpendicular to the second extending direction D2 of the driving substrate 110 . Here, the material of the metal bump 220a is, for example, copper, gold or nickel, and the cross-sectional shape of the metal bump 220a is, for example, a rectangle, and the thickness T of the metal bump 220a is between 1 μm and 10 μm.

由于本实施例是通过化学镀程序来形成金属凸块220a,因此相较于现有以湿式制程的电镀程序来形成金属凸块而言,本实施例的金属凸块结构200a因采干式制程来形成金属凸块220a,可具有制程简单、低成本且不会造成环境污染等优势。Since the metal bumps 220a are formed by the electroless plating process in this embodiment, compared with the conventional wet process electroplating process to form the metal bumps, the metal bump structure 200a of this embodiment adopts a dry process To form the metal bumps 220a, it has the advantages of simple process, low cost and no environmental pollution.

在此必须说明的是,下述实施例沿用前述实施例的元件标号与部分内容,其中采用相同的标号来表示相同或近似的元件,并且省略了相同技术内容的说明。关于省略部分的说明可参考前述实施例,下述实施例不再重复赘述。It must be noted here that the following embodiments use the element numbers and part of the contents of the previous embodiments, wherein the same numbers are used to represent the same or similar elements, and the description of the same technical contents is omitted. For the description of the omitted part, reference may be made to the foregoing embodiments, and repeated descriptions in the following embodiments will not be repeated.

图2示出为本发明的另一实施例的一种金属凸块结构的剖面示意图。请同时参考图1D与图2,本实施例的金属凸块结构200b与上述的金属凸块结构200a相似,两者的差异在于:在本实施例中,金属凸块结构200b的金属凸块220b的剖面形状具体化为类圆形。换言之,可进一步将金属凸块结构200a通过高温回火(reflow)的程序,形成所需的金属凸块220b的形状。FIG. 2 is a schematic cross-sectional view of a metal bump structure according to another embodiment of the present invention. Please refer to FIG. 1D and FIG. 2 at the same time, the metal bump structure 200b of the present embodiment is similar to the above-mentioned metal bump structure 200a, the difference between the two is: in the present embodiment, the metal bump structure 200b of the metal bump structure 220b The cross-sectional shape is embodied as a quasi-circle. In other words, the metal bump structure 200a can be further subjected to a high temperature reflow process to form the desired shape of the metal bump 220b.

图3A示出为本发明的一实施例的一种驱动基板的剖面示意图。图3B示出为在图3A的驱动基板上配置发光元件的剖面示意图。请先参考图3A,在本实施例中,驱动基板100包括驱动基材110、至少一接垫(示意地示出两个接垫120)、绝缘层130、至少一主动元件(示意地示出一个主动元件140)以及至少一金属凸块结构(示意地示出两个金属凸块结构200a)。驱动基材110具有配置面112,其中驱动基材110例如是薄膜晶体管(TFF)玻璃基板。主动元件140配置于驱动基材110的配置面112上,其中主动元件140例如是薄膜晶体管,但不以此为限。接垫120配置于驱动基材110的配置面112上,且具有上表面122,其中接垫120的材质例如是铟锡氧化物,或任何溅镀的金属层例如钛、铜、钼、铝或铬。意即,接垫120与驱动基材110上的像素电极属于同一层,皆采用铟锡氧化物来制作。绝缘层130覆盖驱动基材110的配置面112、主动元件140以及接垫120,且绝缘层130暴露出接垫120的部分上表面122。金属凸块结构200a包括图案化金属层210以及金属凸块220a。图案化金属层210配置于绝缘层130所暴露出的接垫120的上表面122上且延伸覆盖部分绝缘层130。金属凸块220a配置于图案化金属层210上。金属凸块220a的第一延伸方向D1垂直于驱动基材110的第二延伸方向D2。FIG. 3A is a schematic cross-sectional view of a driving substrate according to an embodiment of the present invention. FIG. 3B is a schematic cross-sectional view of disposing a light-emitting element on the driving substrate of FIG. 3A . Referring first to FIG. 3A , in this embodiment, the driving substrate 100 includes a driving substrate 110 , at least one pad (shown schematically with two pads 120 ), an insulating layer 130 , and at least one active element (shown schematically One active element 140) and at least one metal bump structure (two metal bump structures 200a are schematically shown). The driving substrate 110 has a configuration surface 112 , wherein the driving substrate 110 is, for example, a thin film transistor (TFF) glass substrate. The active element 140 is disposed on the disposition surface 112 of the driving substrate 110 , wherein the active element 140 is, for example, a thin film transistor, but not limited thereto. The pad 120 is disposed on the configuration surface 112 of the driving substrate 110 and has an upper surface 122, wherein the material of the pad 120 is, for example, indium tin oxide, or any sputtered metal layer such as titanium, copper, molybdenum, aluminum or chromium. That is, the pads 120 and the pixel electrodes on the driving substrate 110 belong to the same layer, and are both made of indium tin oxide. The insulating layer 130 covers the configuration surface 112 of the driving substrate 110 , the active element 140 and the pads 120 , and the insulating layer 130 exposes a part of the upper surface 122 of the pads 120 . The metal bump structure 200a includes a patterned metal layer 210 and metal bumps 220a. The patterned metal layer 210 is disposed on the upper surface 122 of the pad 120 exposed by the insulating layer 130 and extends to cover part of the insulating layer 130 . The metal bumps 220 a are disposed on the patterned metal layer 210 . The first extending direction D1 of the metal bumps 220 a is perpendicular to the second extending direction D2 of the driving substrate 110 .

请参考图3B,发光元件300适于配置于驱动基板100上,而与驱动基板100形成显示器,其中发光元件300配置于金属凸块结构200a的金属凸块220a上。进一步来说,发光元件300例如是微型发光二极管,其中每一发光元件300是以覆晶的方式接合在驱动基板100的两个金属凸块结构200a上。发光元件300结构性且电性连接至金属凸块220a的上表面222,且通过金属凸块220a及图案化金属层210与接垫120电性连接。由于本实施例是采用化学镀程序来形成具有一定厚度的金属凸块220a,因此当发光元件300与金属凸块结构200a焊接时,发光元件300与金属凸块结构200a之间可形成良好介面金属化合物,因而可具有较佳的结构可靠度。Referring to FIG. 3B , the light emitting element 300 is suitable for being disposed on the driving substrate 100 to form a display with the driving substrate 100 , wherein the light emitting element 300 is disposed on the metal bump 220a of the metal bump structure 200a. Further, the light-emitting element 300 is, for example, a miniature light-emitting diode, wherein each light-emitting element 300 is bonded to the two metal bump structures 200 a of the driving substrate 100 in a flip-chip manner. The light emitting element 300 is structurally and electrically connected to the upper surface 222 of the metal bump 220 a, and is electrically connected to the pad 120 through the metal bump 220 a and the patterned metal layer 210 . Since the present embodiment adopts an electroless plating process to form the metal bumps 220 a with a certain thickness, when the light-emitting element 300 and the metal bump structure 200 a are welded, a good interface metal can be formed between the light-emitting element 300 and the metal bump structure 200 a compound, and thus can have better structural reliability.

综上所述,在本发明的金属凸块结构的制作方法中,是通过化学镀程序来形成金属凸块。相较于现有以湿式制程的电镀程序来形成金属凸块而言,本发明采干式制程来形成金属凸块,可具有制程简单、低成本且不会造成环境污染等优势。此外,采用本发明的金属凸块结构的驱动基板,于后续接合发光元件时,发光元件可与金属凸块结构之间可形成良好介面金属化合物,可具有较佳的结构可靠度。To sum up, in the method for fabricating the metal bump structure of the present invention, the metal bump is formed through an electroless plating process. Compared with the conventional wet process electroplating process to form the metal bumps, the present invention adopts the dry process to form the metal bumps, which has the advantages of simple process, low cost and no environmental pollution. In addition, when using the driving substrate of the metal bump structure of the present invention, when the light emitting element is subsequently bonded, a good interface metal compound can be formed between the light emitting element and the metal bump structure, which can have better structural reliability.

最后应说明的是:以上各实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述各实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分或者全部技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的范围。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, but not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions described in the foregoing embodiments can still be modified, or some or all of the technical features thereof can be equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the technical solutions of the embodiments of the present invention. scope.

Claims (20)

1. A method for fabricating a metal bump structure includes:
providing a driving substrate, wherein at least one connecting pad and an insulating layer are formed on the driving substrate, the at least one connecting pad is formed on a configuration surface of the driving substrate and has an upper surface, and the insulating layer covers the configuration surface of the driving substrate and the at least one connecting pad and exposes a part of the upper surface of the at least one connecting pad;
forming a patterned metal layer on the upper surface of the at least one pad exposed by the insulating layer and extending to cover a part of the insulating layer; and
and performing an electroless plating process to form at least one metal bump on the patterned metal layer, wherein a first extending direction of the at least one metal bump is perpendicular to a second extending direction of the driving substrate.
2. The method of claim 1, wherein the step of forming the patterned metal layer comprises:
forming a catalyst layer on the insulating layer and the upper surface of the at least one pad exposed by the insulating layer; and
and performing an activation process and a patterning process on the catalyst layer to form the patterned metal layer.
3. The method of claim 2, wherein the method of forming the catalyst layer comprises ink-jet printing.
4. The method of claim 2, wherein the catalyst layer comprises pd, au or ag.
5. The method of claim 2, wherein the activation process comprises a laser activation process or a heating process.
6. The method of claim 1, wherein the patterned metal layer comprises Pd, Au or Ag.
7. The method of claim 1, wherein the metal bump is made of copper, gold, tin or nickel.
8. The method of claim 1, wherein a cross-sectional shape of the metal bump includes a circular-like shape or a rectangular shape.
9. The method of claim 1, wherein the at least one pad comprises ito, ti, cu, mo, al, or cr.
10. The method of claim 1, wherein the metal bump has a thickness of 1-10 μm.
11. A metal bump structure disposed on a driving substrate, wherein the driving substrate is disposed with a pad and an insulating layer, the pad is disposed on a disposition surface of the driving substrate and has an upper surface, and the insulating layer covers the disposition surface and the pad and exposes a portion of the upper surface of the pad, the metal bump structure comprising:
the patterned metal layer is configured on the upper surface of the connecting pad exposed by the insulating layer and extends to cover part of the insulating layer; and
and the metal bump is arranged on the patterned metal layer, wherein the first extending direction of the metal bump is vertical to the second extending direction of the driving substrate.
12. The metal bump structure of claim 11, wherein the material of the patterned metal layer comprises palladium, gold, or silver.
13. The metal bump structure of claim 11 wherein the metal bump material comprises copper, gold, tin, or nickel.
14. The metal bump structure of claim 11, wherein a cross-sectional shape of the metal bump comprises a quasi-circular shape or a rectangular shape.
15. The metal bump structure of claim 11 wherein the metal bump has a thickness of between 1 and 10 microns.
16. A drive substrate, comprising:
a drive substrate having a disposition surface;
at least one active element configured on the configuration surface of the driving substrate;
at least one pad disposed on the disposition surface of the driving substrate and having an upper surface;
the insulating layer covers the configuration surface of the driving substrate, the at least one active element and the at least one connecting pad, and the insulating layer exposes part of the upper surface of the connecting pad; and
at least one metal bump structure, comprising:
the patterned metal layer is configured on the upper surface of the connecting pad exposed by the insulating layer and extends to cover part of the insulating layer; and
and the metal bump is arranged on the patterned metal layer, wherein the first extending direction of the metal bump is vertical to the second extending direction of the driving substrate.
17. The driving substrate as claimed in claim 16, wherein the material of the patterned metal layer comprises palladium, and the material of the metal bump comprises copper, gold, tin or nickel.
18. The driving substrate as claimed in claim 16, wherein the cross-sectional shape of the metal bump comprises a circular-like shape or a rectangular shape.
19. The driving substrate as claimed in claim 16, wherein the metal bump has a thickness of 1-10 μm.
20. The driving substrate as recited in claim 16, wherein the at least one pad comprises ito, ti, cu, mo, al or cr.
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