CN114820803A - Backlight product phase taking analysis method and device, computer equipment and storage medium - Google Patents

Abstract

The invention relates to a backlight product phase taking analysis method, a device, computer equipment and a storage medium, wherein the analysis method comprises the following steps: establishing a coordinate system for indicating a test picture shot by an area-array camera in real time, and presetting n measuring point positions in the coordinate system; taking N groups of test pictures of the test products, and obtaining a fitting equation of each measurement point position by adopting a least square method according to the picture brightness value of each measurement point position of the test pictures and the actual brightness value of the corresponding test product; and obtaining a brightness compensation value of each measuring point according to a fitting equation, obtaining an average brightness value and a brightness uniformity parameter according to the brightness compensation value, and comparing the average brightness value and the brightness uniformity parameter with a standard value. The whole product is shot through the area array camera to form a test picture, a fitting equation, an average brightness value and brightness uniformity parameters are obtained through operation, the measurement picture is compensated and corrected, large-batch detection work can be carried out after preliminary calibration, the test process is quicker, and the efficiency is higher.

Description

Backlight product phase analysis method, device, computer equipment and storage medium

technical field

The present invention relates to the technical field of backlight product processing, in particular to a method, device, computer equipment and storage medium for analyzing the phase of backlight products.

Background technique

Optical inspection is one of the key links in the production and processing of backlight products. It determines whether the backlight products emit light normally based on information such as brightness analysis, uniformity analysis, and chromaticity analysis. At present, optical inspection mainly uses chromaticity and brightness tester for point-by-point detection. The servo drive mechanism drives the camera to take phases at several points for analysis and processing. Because the servo drive mechanism needs to drive the camera to move above each measurement point for acquisition Like analysis, it takes a long time to measure a piece of product, which makes it difficult to implement on-line production with the production line. It can only be used as a sampling inspection, and it is difficult to meet the current processing needs of mass production.

SUMMARY OF THE INVENTION

In order to solve the above technical problems, the present invention provides a method, device, computer equipment and storage medium for analyzing the phase of backlight products, which have the advantages of improving measurement efficiency and measurement accuracy.

For achieving the above object, technical scheme of the present invention is as follows:

A method for taking a phase analysis of a backlight product, comprising:

establishing a coordinate system indicating the test image captured by the area array camera in real time, and preset n measurement points in the coordinate system;

Taking the test pictures of N groups of test products, according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product, use the least squares method to obtain the fitting equation of each measurement point; and,

According to the fitting equation, the brightness compensation value of each measurement point is obtained, and the average brightness value and the brightness uniformity parameter are obtained according to the brightness compensation value, and compared with the standard value.

As a preferred solution of the present invention, the preset n measurement points in the coordinate system are specifically:

Take Post0[x0, y0] as the starting point coordinate, PostN[xn, yn] as the end point coordinate, set the number of rows as a, the number of columns as b, and the coordinate of the Nt-th measurement point as PostNt[x0+(xn-x0 )/(b-1),y0+(yn-y0)/a-1].

As a preferred solution of the present invention, according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product, the fitting equation obtained by the least square method for each measurement point specifically includes:

Obtain the corresponding picture brightness value in the test picture according to the coordinates of each measurement point, denoted as G=[G1,G2,...,Gn], and the picture brightness value of N pieces of test products is denoted as

Use the chromaticity and brightness tester to measure the actual brightness of the corresponding test product point by point according to the coordinates of each measurement point, denoted as L=[L1, L2,..., Ln], the actual brightness value of the N-piece test product marked as

The fitting equation Lt=K*G+B is obtained by the least square method, where,

B=(Lsum-K*Gsum)/N.

As a preferred solution of the present invention, the picture brightness value G=0.299R+0.587G+0.114B, wherein R, G, and B are respectively the RGB values of the three channels of the test picture collected by the area scan camera.

As a preferred solution of the present invention, the brightness compensation value of each measurement point is obtained according to the fitting equation, and the average brightness value and the brightness uniformity parameter are obtained according to the brightness compensation value, and are compared with the standard values. include:

Calculate the brightness compensation value of each measurement site according to the fitting equation and record it as Lt, Lt=[Lt1, Lt2,...,Ltn];

Calculate the average brightness value according to the brightness compensation value and record it as Lavg, Lavg=AVG[Lt1,Lt2,...,Ltn];

Calculate the brightness uniform parameter according to the brightness compensation value and record it as Lu, Lu=MIN[Lt1,Lt2,...,Ltn]/MAX[Lt1,Lt2,...,Ltn]*100%;

Compare the average brightness value and brightness uniformity parameters with standard values to judge product performance.

On the other hand, the present invention also provides a backlight product phase analysis device, comprising:

The point setting unit is used to establish a coordinate system indicating the test image captured by the area array camera in real time, and preset n measurement points in the coordinate system;

The fitting operation unit is used for taking the test pictures of N groups of test products, and according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product, the least square method is used to obtain the fitting of each measurement point. equation; and,

The operation and comparison unit is used to obtain the brightness compensation value of each measurement point according to the fitting equation, and obtain the average brightness value and the brightness uniform parameter according to the brightness compensation value, and compare with the standard value.

As a preferred solution of the present invention, the fitting operation unit specifically includes:

The brightness calculation module is used to obtain the corresponding picture brightness value in the test picture according to the coordinates of each measurement point, which is recorded as G=[G1,G2,...,Gn], and the picture brightness value of N pieces of test products is recorded as

The brightness acquisition module is used to measure the actual brightness of the corresponding test product point by point using the chromaticity brightness tester according to the coordinates of each measurement point, denoted as L=[L1,L2,...,Ln], N slices The actual brightness value of the test product is recorded as

The fitting calculation module is used to obtain the fitting equation Lt=K*G+B by using the least square method, wherein,

B=(Lsum-K*Gsum)/N.

As a preferred solution of the present invention, the operation comparison unit includes:

a brightness compensation calculation module, used for calculating the brightness compensation value of each measurement site according to the fitting equation and denoting it as Lt, Lt=[Lt1, Lt2,...,Ltn];

The average brightness calculation module is used to calculate the average brightness value according to the brightness compensation value and record it as Lavg, Lavg=AVG[Lt1,Lt2,...,Ltn];

The uniform parameter calculation module calculates the uniform brightness parameter according to the brightness compensation value and records it as Lu, Lu=MIN[Lt1,Lt2,...,Ltn]/MAX[Lt1,Lt2,...,Ltn]*100%;

The calculation and comparison module is used to compare the average brightness value and the brightness uniformity parameter with the standard value to judge the product performance.

In another aspect, the present invention also provides a computer device, comprising a memory and a processor, wherein computer-readable instructions are stored in the memory, and when the computer-readable instructions are executed by the processor, the processor causes the processor to execute Take the steps of the phase analysis method as described in any of the above technical solutions.

In another aspect, the present invention also provides a storage medium, the memory stores computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, causes the one or more processors to execute the above-mentioned The steps of the phase-taking analysis method described in any technical solution.

To sum up, the present invention has the following beneficial effects:

The present invention provides a method, device, computer equipment and storage medium for taking a phase analysis of a backlight product, and forms a test picture by shooting the entire product with an area array camera. Limited by the performance of the camera itself, the test picture may be bright in the middle and dark on both sides. , and the overall brightness of the actual product is basically the same. According to the set measurement point, the fitting equation, the average brightness value and the brightness uniformity parameter are obtained through calculation, and the measurement picture is compensated and corrected to eliminate the camera The lens is distorted in the picture, so as to ensure the accuracy of the measurement data. After preliminary calibration, a large number of inspection work can be carried out, and the entire product is captured by the area scan camera during acquisition, and the test process is faster and more efficient.

Description of drawings

In order to explain the embodiments of the present invention or the technical solutions in the prior art more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained according to these drawings without creative efforts.

FIG. 1 is a flowchart of an analysis method in an embodiment of the present invention.

FIG. 2 is a control block diagram of an analysis device in an embodiment of the present invention.

FIG. 3 is a structural block diagram of a computer device in an embodiment of the present invention.

Corresponding part names represented by numbers and letters in the figure:

100, a point setting unit; 200, a fitting operation unit; 300, an operation comparison unit.

Detailed ways

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

Example

A method for analyzing the phase of backlight products, as shown in Figure 1, includes:

S01 , establish a coordinate system indicating the test image captured by the area array camera in real time, and preset n measurement points in the coordinate system, and n can usually take values such as 20, 25, and 30.

The area scan camera can take the overall picture of the test product at one time when taking the phase. The preset n measurement points in this coordinate system are as follows: take Post0[x0, y0] as the starting point coordinates, PostN[xn, yn] as the The coordinates of the end point, set the number of rows as a, the number of columns as b, and the coordinates of the Nt-th measurement point as PostNt[x0+(xn-x0)/(b-1), y0+(yn-y0)/a-1 ].

S02, take the test pictures of N groups of test products, and obtain the fitting equation of each measurement point by using the least squares method according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product, and N can usually be Take 8-10.

Specifically, it includes:

Obtain the corresponding picture brightness value in the test picture according to the coordinates of each measurement point, denoted as G=[G1,G2,...,Gn], and the picture brightness value of N pieces of test products is denoted as

Use the chromaticity and brightness tester to measure the actual brightness of the corresponding test product point by point according to the coordinates of each measurement point, denoted as L=[L1, L2,..., Ln], the actual brightness value of the N-piece test product marked as

The fitting equation Lt=K*G+B is obtained by the least square method, where,

B=(Lsum-K*Gsum)/N.

In this embodiment, the picture brightness value G=0.299R+0.587G+0.114B, where R, G, and B are respectively the RGB values of the three channels of the test picture collected by the area scan camera.

The above operation process is carried out in the initial stage of detection, and after an accurate fitting equation is obtained, subsequent large-scale detection work can be carried out.

S03, obtain the brightness compensation value of each measurement point according to the fitting equation, and obtain the average brightness value and the brightness uniform parameter according to the brightness compensation value, and compare with the standard value.

Specifically, it includes:

According to the fitting equation, the brightness compensation value of each measurement point is obtained, and the average brightness value and brightness uniformity parameter are obtained according to the brightness compensation value, and compared with the standard value. Specifically, it includes:

Calculate the brightness compensation value of each measurement site according to the fitting equation and record it as Lt, Lt=[Lt1,Lt2,...,Ltn];

Calculate the average brightness value according to the brightness compensation value and record it as Lavg, Lavg=AVG[Lt1,Lt2,...,Ltn], which is the average value of Lt1 to Ltn;

Calculate the brightness uniform parameter according to the brightness compensation value and record it as Lu, Lu=MIN[Lt1,Lt2,...,Ltn]/MAX[Lt1,Lt2,...,Ltn]*100%, that is, the maximum brightness compensation value the ratio of the value to the minimum value;

The average brightness value and brightness uniformity parameter are compared with the standard value to judge the product performance. When the difference between the average brightness value and the brightness uniformity parameter and the standard value is within the predetermined threshold range, the product performance is qualified.

A test image is formed by shooting the entire product with an area scan camera. Due to the performance limitations of the camera, the test image may be bright in the middle and dark on both sides. However, the overall brightness of the actual product is basically the same. According to the set measurement Position, after calculation, the fitting equation, average brightness value and brightness uniformity parameters are obtained to compensate and correct the measured picture, eliminate the lens distortion when the camera takes the picture, so as to ensure the accuracy of the measured data, and can be carried out after preliminary calibration. Large-scale inspection work, and the entire product is captured by the area scan camera during acquisition, the test process is faster and more efficient.

As shown in FIG. 2 , an embodiment of the present invention further provides a backlight product phase acquisition and analysis device, including: a point setting unit 100 for establishing a coordinate system indicating a test image captured by an area scan camera in real time, N measurement points are preset in the coordinate system; the fitting operation unit 200 is used for taking test pictures of N groups of test products, and according to the picture brightness values of each measurement point of the test pictures and the actual brightness of the corresponding test products and the calculation and comparison unit 300 is used to obtain the brightness compensation value of each measurement point according to the fitting equation, and obtain the average brightness value according to the brightness compensation value and brightness uniformity parameters, and compared with the standard value.

The fitting operation unit 100 specifically includes: a brightness calculation module, a brightness acquisition module, and a fitting calculation module.

The brightness calculation module is used to obtain the corresponding picture brightness value in the test picture according to the coordinates of each measurement point, which is recorded as G=[G1,G2,...,Gn], and the picture brightness value of N pieces of test products is recorded as

The brightness acquisition module is used to measure the actual brightness of the corresponding test product point by point using the chromaticity brightness tester according to the coordinates of each measurement point, denoted as L=[L1,L2,...,Ln], N slices The actual brightness value of the test product is recorded as

B＝(Lsum-K*Gsum)/N。The fitting calculation module is used to obtain the fitting equation Lt=K*G+B by using the least square method, wherein,

B=(Lsum-K*Gsum)/N.

The operation and comparison unit 300 includes: a brightness compensation calculation module, a uniform parameter calculation module and a calculation and comparison module.

The brightness compensation calculation module is used to calculate the brightness compensation value of each measurement site according to the fitting equation and record it as Lt, Lt=[Lt1,Lt2,...,Ltn]; the average brightness calculation module is used to calculate the brightness according to the brightness The compensation value calculates the average brightness value and records it as Lavg, Lavg=AVG[Lt1,Lt2,...,Ltn];

The uniform parameter calculation module calculates the uniform brightness parameter according to the brightness compensation value and records it as Lu, Lu=MIN[Lt1,Lt2,...,Ltn]/MAX[Lt1,Lt2,...,Ltn]*100%;

The calculation and comparison module is used to compare the average brightness value and the brightness uniformity parameter with the standard value to judge the product performance.

As shown in FIG. 3 , the present invention also provides a computer device, which includes a processor, a non-volatile storage medium, a memory and a network interface connected through a system bus. Wherein, the non-volatile storage medium of the computer device stores an operating system, a database and computer-readable instructions, the database may store a control information sequence, and when the computer-readable instructions are executed by the processor, the processor can be made to realize the above-mentioned method of phase analysis. The processor of the computer device is used to provide computing and control capabilities and support the operation of the entire computer device. Computer-readable instructions may be stored in the memory of the computer device, and when executed by the processor, the computer-readable instructions may cause the processor to execute the above-mentioned method for phase acquisition and analysis. The network interface of the computer equipment is used for communication with the terminal connection. Those skilled in the art can understand that the structure shown in FIG. 3 is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer equipment to which the solution of the present application is applied. Include more or fewer components than shown in the figures, or combine certain components, or have a different arrangement of components.

The processor in this embodiment is used to execute the specific functions of the point setting unit, the fitting operation unit, and the operation comparison unit, the memory stores program codes and various data required for executing the above units, and the network interface is used to provide user Data transfer between terminals or servers.

The present invention also provides a storage medium storing computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, the one or more processors perform the steps of the phase acquisition and analysis method in any of the foregoing embodiments.

Those of ordinary skill in the art can understand that the realization of all or part of the processes in the methods of the above embodiments can be accomplished by instructing relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium, and the program is During execution, it may include the processes of the embodiments of the above-mentioned methods. The aforementioned storage medium may be a non-volatile storage medium such as a magnetic disk, an optical disk, a read-only memory (Read-Only Memory, ROM), or a random access memory (Random Access Memory, RAM).

It should be understood that although the various steps in the flowchart of the accompanying drawings are sequentially shown in the order indicated by the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless explicitly stated herein, the execution of these steps is not strictly limited to the order and may be performed in other orders. Moreover, at least a part of the steps in the flowchart of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but may be executed at different times, and the execution sequence is also It does not have to be performed sequentially, but may be performed alternately or alternately with other steps or at least a portion of sub-steps or stages of other steps.

Claims (10)

1. a backlight product phase analysis method, is characterized in that, comprises: establishing a coordinate system indicating the test image captured by the area array camera in real time, and preset n measurement points in the coordinate system; Taking the test pictures of N groups of test products, according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product, use the least squares method to obtain the fitting equation of each measurement point; and, According to the fitting equation, the brightness compensation value of each measurement point is obtained, and the average brightness value and the brightness uniformity parameter are obtained according to the brightness compensation value, and compared with the standard value. 2. The method for analyzing the phase of a backlight product according to claim 1, wherein the preset n measurement points in the coordinate system are specifically: Take Post0[x0, y0] as the starting point coordinate, PostN[xn, yn] as the end point coordinate, set the number of rows as a, the number of columns as b, and the coordinate of the Nt-th measurement point as PostNt[x0+(xn-x0 )/(b-1),y0+(yn-y0)/a-1]. 3. The method for analyzing the phases of backlight products according to claim 2, characterized in that, according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product, the least squares method is used to obtain each The fitting equation of the measurement point includes: Obtain the corresponding picture brightness value in the test picture according to the coordinates of each measurement point, denoted as G=[G1,G2,...,Gn], and the picture brightness value of N pieces of test products is denoted as

Use the chromaticity and brightness tester to measure the actual brightness of the corresponding test product point by point according to the coordinates of each measurement point, denoted as L=[L1, L2,..., Ln], the actual brightness value of the N-piece test product marked as

The fitting equation Lt=K*G+B is obtained by the least square method, where,

B=(Lsum-K*Gsum)/N. 4. The method for analyzing the phase of backlight products according to claim 3, wherein the picture brightness value G=0.299R+0.587G+0.114B, wherein R, G, and B are collected by the area scan camera, respectively. The RGB values of the three channels of the test image. 5. The method according to claim 4, wherein the brightness compensation value of each measurement point is obtained according to the fitting equation, and the average brightness value and the brightness compensation value are obtained according to the brightness compensation value. Brightness uniformity parameters and compared with standard values include: Calculate the brightness compensation value of each measurement site according to the fitting equation and record it as Lt, Lt=[Lt1, Lt2,...,Ltn]; Calculate the average brightness value according to the brightness compensation value and record it as Lavg, Lavg=AVG[Lt1,Lt2,...,Ltn]; Calculate the brightness uniform parameter according to the brightness compensation value and record it as Lu, Lu=MIN[Lt1,Lt2,...,Ltn]/MAX[Lt1,Lt2,...,Ltn]*100%; Compare the average brightness value and brightness uniformity parameters with standard values to judge product performance. 6. A backlight product phase analysis device, characterized in that, comprising: The point setting unit is used to establish a coordinate system indicating the test image captured by the area array camera in real time, and preset n measurement points in the coordinate system; The fitting operation unit is used to take the test pictures of N groups of test products, and obtain the fitting of each measurement point by the least squares method according to the picture brightness value of each measurement point of the test picture and the actual brightness value of the corresponding test product. equation; and, The operation and comparison unit is used for obtaining the brightness compensation value of each measurement point according to the fitting equation, and obtaining the average brightness value and the brightness uniform parameter according to the brightness compensation value, and comparing with the standard value. 7. The device for analyzing backlight products according to claim 5, wherein the fitting operation unit specifically comprises: The brightness calculation module is used to obtain the corresponding picture brightness value in the test picture according to the coordinates of each measurement point, which is recorded as G=[G1,G2,...,Gn], and the picture brightness value of N pieces of test products is recorded as

The brightness acquisition module is used to measure the actual brightness of the corresponding test product point by point using the chromaticity brightness tester according to the coordinates of each measurement point, denoted as L=[L1,L2,...,Ln], N slices The actual brightness value of the test product is recorded as

The fitting calculation module is used to obtain the fitting equation Lt=K*G+B by using the least square method, wherein,

B=(Lsum-K*Gsum)/N. 8. The device for analyzing the phase of backlight products according to claim 5, wherein the operation and comparison unit comprises: a brightness compensation calculation module, used for calculating the brightness compensation value of each measurement site according to the fitting equation and denoting it as Lt, Lt=[Lt1, Lt2,...,Ltn]; The average brightness calculation module is used to calculate the average brightness value according to the brightness compensation value and record it as Lavg, Lavg=AVG[Lt1,Lt2,...,Ltn]; The uniform parameter calculation module calculates the uniform brightness parameter according to the brightness compensation value and records it as Lu, Lu=MIN[Lt1,Lt2,...,Ltn]/MAX[Lt1,Lt2,...,Ltn]*100%; The calculation and comparison module is used to compare the average brightness value and the brightness uniformity parameter with the standard value to judge the product performance. 9. A computer device, characterized in that it comprises a memory and a processor, wherein computer-readable instructions are stored in the memory, and when the computer-readable instructions are executed by the processor, the processor can execute the The steps of the phase-taking analysis method according to any one of claims 1 to 5. 10. A storage medium, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, causes the one or more processors to execute the method of claim 1 The steps of the phase taking analysis method described in any one of claims 5 to 5.

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