CN117804344A - Width measurement method and device - Google Patents

Abstract

The embodiment of the specification provides a width measurement method and a device, wherein the width measurement method comprises the following steps: under the condition that a material to be measured is placed in the width measuring instrument, a starting instruction is sent to at least two infrared transmitting tubes; acquiring at least two infrared intensities of at least two infrared transmitting tubes under the condition that the at least two infrared transmitting tubes are started; determining edge information of a material to be measured based on at least two infrared intensities; width data of the material to be measured is determined based on the edge information. Sending a starting instruction to at least two infrared emission tubes under the condition that a material to be measured is placed in the width measuring instrument; acquiring at least two infrared intensities of at least two infrared transmitting tubes under the condition that the at least two infrared transmitting tubes are started; determining edge information of a material to be measured based on at least two infrared intensities; width data of the material to be measured is determined based on the edge information, thereby improving the accuracy of measurement.

Description

Width measurement methods and devices

Technical field

The embodiments of this specification relate to the technical field of data measurement, and in particular to a width measurement method.

Background technique

Existing coil width measurement is generally done manually with handheld measuring tools. Manual measurement is a huge workload during the production process. A small number of methods use industrial cameras to capture images and then use algorithms to identify the coil border to obtain pixel width and actual width, which is then converted through algorithms to obtain the actual width of the coil.

Manual roll width measurement involves a large workload and will produce reading errors. Continuous measurements cannot be made during measurement. If there is a deviation between the actual width of the roll and the target width, it cannot be discovered immediately. When adjusting the production equipment, Manual adjustment of the knob is required. In order to reduce the manual workload, some people now use cameras to collect image recognition width, which can replace manual labor. However, the pixels of industrial cameras are generally relatively low, and the distance between the roll and the camera will also affect the size of the image. When taking pictures, The material must be in a static state, the background for taking pictures must be flat and clean, and the background color must be significantly different from the material color. In this way, the accuracy of the width value after processing by the algorithm will be relatively low, which is suitable for occasions with relatively low requirements. If you want to improve the measurement accuracy, you can only increase the pixels of the camera and the recognition algorithm, which will increase the cost of the camera.

Therefore, a better solution is urgently needed.

Summary of the invention

In view of this, embodiments of this specification provide a width measurement method. One or more embodiments of this specification simultaneously relate to a width measuring device, a computing device, a computer-readable storage medium, and a computer program to solve technical deficiencies existing in the prior art.

According to a first aspect of the embodiment of this specification, a width measurement method is provided, including:

When the material to be measured is placed in the width measuring instrument, start instructions are sent to at least two infrared emission tubes;

When at least two infrared emitting tubes are activated, obtaining at least two infrared intensities of the at least two infrared emitting tubes;

Determining edge information of the material to be measured based on at least two infrared intensities;

The width data of the material to be measured is determined based on the edge information.

In a possible implementation, obtaining at least two infrared intensities of at least two infrared emission tubes includes:

Determining an acquisition order based on an arrangement order of at least two infrared emitting tubes;

At least two infrared ray intensities of at least two infrared emission tubes are acquired based on the acquisition sequence.

In a possible implementation, edge information of the material to be measured is determined based on at least two infrared intensities, including:

Comparing at least two infrared intensities with the target intensity in sequence to determine a first edge point and a second edge point;

The edge information of the material to be measured is determined based on the first edge point and the second edge point.

In a possible implementation, at least two infrared ray intensities are compared with the target intensity in sequence to determine the first edge point and the second edge point, including:

determining a first intensity value and a second intensity value based on the target intensity;

Select the value of the infrared intensity from the two infrared intensities in turn as the current intensity value;

When the current intensity value for the first time is not the first intensity value and the second intensity value, determine the first edge point;

When the current intensity value for the second time is not the first intensity value and the second intensity value, a second edge point is determined.

In a possible implementation, the edge information of the material to be measured is determined based on the first edge point and the second edge point, including:

Determine the first edge width based on the first edge point and the width calculation rule;

Determine the second edge width based on the second edge point and the width calculation rule;

Edge information of the material to be measured is determined based on the first edge width and the second edge width.

In a possible implementation, the at least two infrared emitting tubes include a first infrared emitting tube group and a second infrared emitting tube group;

The first infrared emission tube group and the second infrared emission tube group are arranged side by side.

In a possible implementation, the width data of the material to be measured is determined based on edge information, including:

Determine the first width data based on the edge information corresponding to the first infrared emission tube group;

Determine the second width data based on the edge information corresponding to the second infrared emission tube group;

Width data of the material to be measured is determined based on the first width data and the second width data.

According to a second aspect of an embodiment of this specification, there is provided a width measuring device, comprising:

The instruction sending module is configured to send a start instruction to at least two infrared transmitting tubes when the width gauge is placed with the material to be measured;

an intensity acquisition module configured to acquire at least two infrared intensities of at least two infrared emission tubes when at least two infrared emission tubes are activated;

an edge identification module configured to determine edge information of the material to be measured based on at least two infrared ray intensities;

The width determination module is configured to determine width data of the material to be measured based on the edge information.

According to a third aspect of the embodiments of this specification, a computing device is provided, including:

memory and processor;

The memory is used to store computer-executable instructions, and the processor is used to execute the computer-executable instructions. When the computer-executable instructions are executed by the processor, the steps of the above width measurement method are implemented.

According to a fourth aspect of the embodiments of this specification, a computer-readable storage medium is provided, which stores computer-executable instructions that implement the steps of the above width measurement method when executed by a processor.

According to a fifth aspect of the embodiments of this specification, a computer program is provided, wherein when the computer program is executed in a computer, the computer is caused to perform the steps of the above width measurement method.

Embodiments of this specification provide a width measurement method and device, wherein the width measurement method includes: when the width measuring instrument is placed in the material to be measured, sending starting instructions to at least two infrared emission tubes; In this case, at least two infrared intensities of at least two infrared emission tubes are obtained; edge information of the material to be measured is determined based on the at least two infrared intensities; width data of the material to be measured is determined based on the edge information. By sending start instructions to at least two infrared emitting tubes when the material to be measured is placed in the width measuring instrument; and obtaining at least two infrared intensities of the at least two infrared emitting tubes when at least two infrared emitting tubes are started. ; Determine edge information of the material to be measured based on at least two infrared ray intensities; determine width data of the material to be measured based on the edge information, thereby improving measurement accuracy.

Description of drawings

Figure 1 is a flow chart of a width measurement method provided by an embodiment of this specification;

Figure 2 is a schematic structural diagram of a width measuring device provided by an embodiment of this specification;

FIG. 3 is a structural block diagram of a computing device provided by an embodiment of the present specification.

Detailed ways

In the following description, numerous specific details are set forth to facilitate a thorough understanding of this specification. However, this specification can be implemented in many other ways different from those described here. Those skilled in the art can make similar extensions without violating the connotation of this specification. Therefore, this specification is not limited by the specific implementation disclosed below.

The terminology used in one or more embodiments of this specification is for the purpose of describing particular embodiments only and is not intended to limit the one or more embodiments of this specification. As used in one or more embodiments of this specification and the appended claims, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It will also be understood that the term "and/or" as used in one or more embodiments of this specification refers to and includes any and all possible combinations of one or more of the associated listed items.

It should be understood that although the terms first, second, etc. may be used to describe various information in one or more embodiments of this specification, the information should not be limited to these terms. These terms are only used to distinguish information of the same type from each other. For example, without departing from the scope of one or more embodiments of this specification, the first may also be called the second, and similarly, the second may also be called the first. Depending on the context, the word "if" as used herein may be interpreted as "when" or "when" or "in response to determining."

In this specification, a width measurement method is provided. This specification also relates to a width measurement device, a computing device, and a computer-readable storage medium, which will be described in detail one by one in the following embodiments.

Referring to Figure 1, Figure 1 shows a flow chart of a width measurement method according to an embodiment of this specification, which specifically includes the following steps.

Step 101: With the material to be measured placed in the width measuring instrument, send start instructions to at least two infrared emission tubes.

In practical applications, the infrared sensor width gauge uses the principle of infrared through-beam tubes to detect objects. When there is no object between a pair of infrared through-beam tubes, the receiving tube can receive the infrared rays emitted by the transmitting tube. When there is an object, The receiving tube cannot receive infrared signals. When some objects block it, the infrared rays received by the receiving tube will become weaker.

Based on the principle of a pair of sensors detecting the presence or absence of an object, multiple sets of transmitting tubes and receiving tubes are used to measure the width of the object. The width gauge is designed as a C-shaped sensor structure. A row of neatly spaced infrared transmitting tubes are arranged at the upper part of the C-type to emit infrared rays vertically downward. A row of neatly-spaced infrared receiving tubes are arranged at the lower part of the C-type to receive Infrared, the spacing is 3mm, and the roll is placed in the middle for width measurement.

Specifically, the material to be measured is placed on the width gauge, and the infrared emitting tube at the upper end is controlled by the MCU to emit infrared rays.

Step 102: When at least two infrared emitting tubes are activated, obtain at least two infrared intensities of at least two infrared emitting tubes.

In a possible implementation, obtaining at least two infrared intensities of at least two infrared emitting tubes includes: determining the acquisition order based on the arrangement order of the at least two infrared emitting tubes; obtaining the infrared intensities of the at least two infrared emitting tubes based on the acquisition order. At least two infrared intensities.

Specifically, after starting the infrared transmitting tube, use the ADC on the MCU to collect and read the infrared intensity value received by the corresponding receiving tube directly below the transmitting tube.

Step 103: Determine edge information of the material to be measured based on at least two infrared ray intensities.

In a possible implementation, edge information of a material to be measured is determined based on at least two infrared intensities, including: sequentially comparing at least two infrared intensities with a target intensity to determine a first edge point and a second edge point; and determining edge information of the material to be measured based on the first edge point and the second edge point.

Specifically, at least two infrared intensities are compared with the target intensity in sequence to determine the first edge point and the second edge point, including: determining the first intensity value and the second intensity value based on the target intensity; selecting the value of the infrared intensity from the two infrared intensities in sequence as the current intensity value; determining the first edge point when the current intensity value is not the first intensity value and the second intensity value for the first time; and determining the second edge point when the current intensity value is not the first intensity value and the second intensity value for the second time.

In practical applications, the intensity value range of infrared intensity can be 0-1023; if the received infrared intensity is 1023 at the maximum, then there is no rolled material between the infrared radiation tubes; if the received infrared intensity is 0 at the maximum hour, then there is coiled material between the infrared tubes in this group; if the received infrared intensity value is between the maximum and minimum values, then the infrared tubes in this group are at the edge of the material; by starting from the first group on the left The method of sending infrared rays from the infrared beam tube and collecting the infrared ray intensity on the receiving tube is performed sequentially to the right to the last group. Through this method, the MCU can collect a set of numerical sequences of infrared intensity from left to right. In this sequence, a mutation value from large to small can be found from left to right. This position is the left edge of the roll; You can find a sudden change from small to large from left to right. This position is the right edge of the roll.

In a possible implementation, determining the edge information of the material to be measured based on the first edge point and the second edge point includes: determining the first edge width based on the first edge point and the width calculation rule; based on the second edge point and the width calculation rule to determine the second edge width; determine the edge information of the material to be measured based on the first edge width and the second edge width.

In practical applications, the above method can be used to determine the location of the left and right edges of the material, and find the mutation point from large to small. The value of the ADC (value1) can be converted to the width of the material between the pair of sensors. The width W1= 3*(1023- value1)/1024; Find the mutation point from small to large. The value of the ADC (value2) can be converted to the width of the material between the pair of sensors. The width W2= 3*(1023-value2)/ 1024; The ADC values between these two values are all the minimum value 0, and the width of all blocks blocked by the material is W3=3*the number of ADC values of 0; the total width of the material is W=W1+W2+W3.

Step 104: Determine the width data of the material to be measured based on the edge information.

In a possible implementation, the at least two infrared emitting tubes include a first infrared emitting tube group and a second infrared emitting tube group; the first infrared emitting tube group and the second infrared emitting tube group are arranged in parallel.

Specifically, the total width of the material can be obtained by the above method, with a minimum resolution of 0.003mm. In order to improve the repeatability of the measurement, a sliding weighted filtering algorithm can be added to the software implementation, that is, the acquired data is first subjected to a sliding weighted filtering algorithm. A row of infrared radiating tubes can also be added to the hardware to be cross-arranged, and two width values can be obtained after each acquisition.

In a possible implementation, determining the width data of the material to be measured based on the edge information includes: determining the first width data based on the edge information corresponding to the first infrared emission tube group; and determining the first width data based on the edge information corresponding to the second infrared emission tube group. Determine second width data; determine width data of the material to be measured based on the first width data and the second width data.

Specifically, after each acquisition, two width values are obtained, and then the average value of the width values is calculated, which can improve the accuracy of the width measurement.

In practical applications, the width data can be displayed on the screen, and the data can be sent to the PLC to control the actuator to adjust the width through the communication line.

Embodiments of this specification provide a width measurement method and device, wherein the width measurement method includes: when the width measuring instrument is placed in the material to be measured, sending starting instructions to at least two infrared emission tubes; In this case, at least two infrared intensities of at least two infrared emission tubes are obtained; edge information of the material to be measured is determined based on the at least two infrared intensities; width data of the material to be measured is determined based on the edge information. By sending starting instructions to at least two infrared emitting tubes when the material to be measured is placed in the width measuring instrument; and obtaining at least two infrared intensities of the at least two infrared emitting tubes when at least two infrared emitting tubes are started. ; Determine edge information of the material to be measured based on at least two infrared ray intensities; determine width data of the material to be measured based on the edge information, thereby improving measurement accuracy.

Furthermore, the embodiments of this specification solve the tedious steps and manual workload of manual width measurement in roll material width measurement, and also solve the error of manual reading. The operator can read the width value directly through the screen. It effectively reduces the environmental requirements for industrial camera width measurement and reduces the cost of industrial cameras. The measurement results can be updated in real time, and a warning can be issued immediately when there is a deviation between the actual width and the target width. It can communicate with PLC to control the actuator to adjust the width in real time.

Corresponding to the above method embodiment, this specification also provides an embodiment of a width measurement device. FIG2 shows a schematic diagram of the structure of a width measurement device provided by an embodiment of this specification. As shown in FIG2 , the device includes:

The instruction sending module 201 is configured to send a start instruction to at least two infrared transmitting tubes when the width gauge is placed with the material to be measured;

The intensity acquisition module 202 is configured to acquire at least two infrared intensities of at least two infrared emission tubes when at least two infrared emission tubes are activated;

The edge identification module 203 is configured to determine edge information of the material to be measured based on at least two infrared intensities;

The width determination module 204 is configured to determine width data of the material to be measured based on the edge information.

In a possible implementation, the intensity acquisition module 202 is also configured as:

Determining an acquisition order based on an arrangement order of at least two infrared emitting tubes;

At least two infrared ray intensities of at least two infrared emission tubes are acquired based on the acquisition sequence.

In a possible implementation, the edge identification module 203 is also configured to:

Compare at least two infrared ray intensities with the target intensity in sequence to determine the first edge point and the second edge point;

The edge information of the material to be measured is determined based on the first edge point and the second edge point.

In a possible implementation, the edge identification module 203 is also configured to:

determining a first intensity value and a second intensity value based on the target intensity;

Select the infrared intensity value from the two infrared intensity values as the current intensity value;

When the first current intensity value is not the first intensity value or the second intensity value, determining a first edge point;

When the second current intensity value is not the first intensity value and the second intensity value, a second edge point is determined.

In a possible implementation, the edge identification module 203 is also configured to:

determining a first edge width based on the first edge point and a width calculation rule;

Determine the second edge width based on the second edge point and the width calculation rule;

Edge information of the material to be measured is determined based on the first edge width and the second edge width.

In a possible implementation, the instruction sending module 201 is also configured to:

The first infrared emission tube group and the second infrared emission tube group are arranged side by side.

In a possible implementation, the width determination module 204 is also configured to:

Determine first width data based on edge information corresponding to the first infrared emitting tube group;

Determine the second width data based on the edge information corresponding to the second infrared emission tube group;

Width data of the material to be measured is determined based on the first width data and the second width data.

Embodiments of this specification provide a width measurement method and device, wherein the width measurement device includes: when the width measuring instrument is placed in the material to be measured, starting instructions are sent to at least two infrared emission tubes; In this case, at least two infrared intensities of at least two infrared emission tubes are obtained; edge information of the material to be measured is determined based on the at least two infrared intensities; width data of the material to be measured is determined based on the edge information. By sending starting instructions to at least two infrared emitting tubes when the material to be measured is placed in the width measuring instrument; and obtaining at least two infrared intensities of the at least two infrared emitting tubes when at least two infrared emitting tubes are started. ; Determine edge information of the material to be measured based on at least two infrared ray intensities; determine width data of the material to be measured based on the edge information, thereby improving measurement accuracy.

The above is a schematic scheme of a width measuring device of this embodiment. It should be noted that the technical scheme of the width measuring device and the technical scheme of the width measuring method described above are of the same concept, and the details not described in detail in the technical scheme of the width measuring device can be referred to the description of the technical scheme of the width measuring method described above.

Figure 3 shows a structural block diagram of a computing device 300 provided according to an embodiment of this specification. Components of the computing device 300 include, but are not limited to, memory 310 and processor 320 . The processor 320 and the memory 310 are connected through a bus 330, and the database 350 is used to save data.

Computing device 300 also includes an access device 340 that enables computing device 300 to communicate via one or more networks 360 . Examples of these networks include Public Switched Telephone Network (PSTN), Local Area Network (LAN), Wide Area Network (WAN), Personal Area Network (PAN), or communication networks such as the Internet The combination. Access device 340 may include one or more of any type of network interface (eg, network interface card (NIC)), wired or wireless, such as an IEEE 802.11 Wireless Local Area Network (WLAN) wireless interface , Worldwide Interoperability for Microwave Access (Wi-MAX, Worldwide Interoperability for Microwave Access) interface, Ethernet interface, Universal Serial Bus (USB, Universal Serial Bus) interface, cellular network interface, Bluetooth interface, Near Field Communication (NFC, Near Field Communication ).

In one embodiment of the present description, the above-mentioned components of the computing device 300 and other components not shown in FIG. 3 may also be connected to each other, such as through a bus. It should be understood that the structural block diagram of the computing device shown in FIG. 3 is for illustrative purposes only and does not limit the scope of this specification. Those skilled in the art can add or replace other components as needed.

Computing device 300 may be any type of stationary or mobile computing device, including a mobile computer or mobile computing device (e.g., tablet computer, personal digital assistant, laptop computer, notebook computer, netbook, etc.), a mobile telephone (e.g., smartphone ), wearable computing devices (e.g., smart watches, smart glasses, etc.) or other types of mobile devices, or stationary computing devices such as desktop computers or personal computers (PC, Personal Computer). Computing device 300 may also be a mobile or stationary server.

The processor 320 is configured to execute the following computer-executable instructions. When the computer-executable instructions are executed by the processor, the steps of the above width measurement method are implemented. The above is a schematic solution of a computing device in this embodiment. It should be noted that the technical solution of the computing device and the technical solution of the above-mentioned width measurement method belong to the same concept. For details that are not described in detail in the technical solution of the computing device, please refer to the description of the technical solution of the above width measurement method.

An embodiment of the present specification also provides a computer-readable storage medium that stores computer-executable instructions. When the computer-executable instructions are executed by a processor, the steps of the above width measurement method are implemented.

The above is a schematic solution of a computer-readable storage medium in this embodiment. It should be noted that the technical solution of the storage medium and the technical solution of the above-mentioned width measurement method belong to the same concept. For details that are not described in detail in the technical solution of the storage medium, please refer to the description of the technical solution of the above-mentioned width measurement method.

An embodiment of the present specification also provides a computer program, wherein when the computer program is executed in a computer, the computer is caused to perform the steps of the above width measurement method.

The above is a schematic solution of a computer program in this embodiment. It should be noted that the technical solution of the computer program and the technical solution of the above-mentioned width measurement method belong to the same concept. For details that are not described in detail in the technical solution of the computer program, please refer to the description of the technical solution of the above-mentioned width measurement method.

The foregoing describes specific embodiments of this specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be performed in a different order than in the embodiments and still achieve desired results. Additionally, the processes depicted in the figures do not necessarily require the specific order shown, or sequential order, to achieve desirable results. Multitasking and parallel processing are also possible or may be advantageous in certain implementations.

The computer instructions include computer program code, which may be in the form of source code, object code, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording media, U disk, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory) , Random Access Memory (RAM, Random Access Memory), electrical carrier signals, telecommunications signals, and software distribution media, etc. It should be noted that the content contained in the computer-readable medium can be appropriately added or deleted according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer-readable medium Excludes electrical carrier signals and telecommunications signals.

It should be noted that, for the above-mentioned method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the embodiments of this specification are not limited by the order of the actions described, because according to the embodiments of this specification, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the embodiments of this specification.

In the above embodiments, each embodiment is described with its own emphasis. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments.

The preferred embodiments of this specification disclosed above are only used to help explain this specification. The optional embodiments do not describe all the details in detail, nor do they limit the invention to only the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of the embodiments of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the embodiments of this specification, so that technicians in the relevant technical field can well understand and use this specification. This specification is limited only by the claims and their full scope and equivalents.

Claims (10)

1. A width measurement method, characterized by including: When the width measuring instrument is placed into the material to be measured, a start command is sent to at least two infrared emission tubes; When the at least two infrared emitting tubes are activated, obtain at least two infrared intensities of the at least two infrared emitting tubes; Determine edge information of the material to be measured based on the at least two infrared ray intensities; Width data of the material to be measured is determined based on the edge information. 2. The method according to claim 1, characterized in that the obtaining of at least two infrared intensities of the at least two infrared emitting tubes comprises: Determine the acquisition sequence based on the arrangement sequence of the at least two infrared emission tubes; At least two infrared ray intensities of the at least two infrared emitting tubes are acquired based on the acquisition sequence. 3. The method according to claim 1, characterized in that the step of determining the edge information of the material to be measured based on the at least two infrared intensities comprises: Comparing the at least two infrared intensities with the target intensity in sequence to determine a first edge point and a second edge point; The edge information of the material to be measured is determined based on the first edge point and the second edge point. 4. The method according to claim 3, characterized in that, comparing the infrared intensities of the at least two infrared rays with the target intensity in sequence to determine the first edge point and the second edge point includes: determining a first intensity value and a second intensity value based on the target intensity; Selecting the value of the infrared intensity from the two infrared intensities in turn as the current intensity value; When the current intensity value is not the first intensity value and the second intensity value for the first time, determine a first edge point; When the current intensity value is not the first intensity value and the second intensity value for the second time, a second edge point is determined. 5. The method according to claim 3, wherein the determining based on the first edge point and the second edge point, the edge information of the material to be measured includes: Determine a first edge width based on the first edge point and a width calculation rule; determining a second edge width based on the second edge point and the width calculation rule; Edge information of the material to be measured is determined based on the first edge width and the second edge width. 6. The method according to claim 1, wherein the at least two infrared emitting tubes comprise a first infrared emitting tube group and a second infrared emitting tube group; The first infrared emitting tube group and the second infrared emitting tube group are arranged in parallel. 7. The method of claim 6, wherein determining the width data of the material to be measured based on the edge information includes: Determine the first width data based on the edge information corresponding to the first infrared emission tube group; Determine second width data based on edge information corresponding to the second infrared emitting tube group; Width data of the material to be measured is determined based on the first width data and the second width data. 8. A width measuring device, characterized in that it includes: An instruction sending module configured to send starting instructions to at least two infrared emission tubes when the width measuring instrument is placed in the material to be measured; an intensity acquisition module, configured to acquire at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; an edge identification module configured to determine edge information of the material to be measured based on the at least two infrared intensities; A width determination module configured to determine width data of the material to be measured based on the edge information. 9. A computing device, characterized by comprising: memory and processor; The memory is used to store computer-executable instructions, and the processor is used to execute the computer-executable instructions. When the computer-executable instructions are executed by the processor, the steps of the width measurement method of any one of claims 1 to 7 are implemented. . 10. A computer-readable storage medium storing computer-executable instructions, wherein the computer-executable instructions, when executed by a processor, implement the steps of the width measurement method according to any one of claims 1 to 7.