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CN114050871A - W-band signal testing method - Google Patents

W-band signal testing method Download PDF

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Publication number
CN114050871A
CN114050871A CN202111331944.3A CN202111331944A CN114050871A CN 114050871 A CN114050871 A CN 114050871A CN 202111331944 A CN202111331944 A CN 202111331944A CN 114050871 A CN114050871 A CN 114050871A
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conversion module
frequency conversion
frequency
signal
tested piece
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CN114050871B (en
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刘益萍
管玉静
李�灿
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Beijing Tiandiyige Technology Co ltd
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Beijing Tiandiyige Technology Co ltd
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/0082Monitoring; Testing using service channels; using auxiliary channels

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Abstract

The invention discloses a W-band signal testing method, and relates to the field of microwave signal measurement. A W-band signal testing method comprises the following steps: connecting a tested piece between two compatible and expandable frequency conversion modules, wherein the two frequency conversion modules comprise a first frequency conversion module and a second frequency conversion module; the first frequency conversion module is used as a transmitting end to transmit a W-waveband test signal to a tested piece, and the second frequency conversion module is used as a receiving end to receive the W-waveband test signal after passing through the tested piece; the analysis equipment analyzes and calculates the W-waveband test signals before and after passing through the tested piece to obtain the characteristic parameters of the tested piece. According to the W-band signal testing method, the frequency conversion modules which can be compatibly expanded are respectively added at the transmitting and receiving ends, so that the W-band signal test is converted into the X-band signal test, the frequency and power requirements of a testing instrument are reduced, and the flexibility and convenience of the testing process are improved.

Description

W-band signal testing method
Technical Field
The invention relates to the technical field of microwave signal measurement, in particular to a W-band signal testing method.
Background
For the test of W-band signals, the existing test methods mainly include a method of directly measuring with a high-end instrument, and a method of converting the W-band signals to a low-frequency band for testing by using a frequency-spreading component to perform frequency multiplication and then frequency division, or a method of testing with the aid of a W-band frequency-mixing module.
If a direct measurement mode of a high-end instrument is adopted, the cost of the instrument and the cable is extremely high, and the instrument and the cable are inconvenient to move. If a W-band spread spectrum assembly is adopted, the measurement of a tested piece is realized by cascading the spread spectrum assembly on a vector network analyzer, the output power of the spread spectrum assembly is high (about 8-9 dBm) and is not adjustable, the adaptability is poor, and the different testing workpieces are difficult to adapt.
Disclosure of Invention
To overcome the above problems or partially solve the above problems, an object of the present invention is to provide a method for testing W-band signals, so as to improve the flexibility and adaptability of the test.
The invention is realized by the following technical scheme:
the embodiment of the invention provides a W-band signal testing method, which comprises the following steps:
s101, connecting a tested piece between two frequency conversion modules capable of being expanded compatibly, wherein the two frequency conversion modules comprise a first frequency conversion module and a second frequency conversion module; s102, the first frequency conversion module serves as a transmitting end to transmit a W-band test signal to the tested piece, and the second frequency conversion module serves as a receiving end to receive the W-band test signal after the tested piece passes through; s103, analyzing and calculating the W-waveband test signals passing through the tested piece by the analysis equipment to obtain the characteristic parameters of the tested piece.
In some embodiments of the present invention, a microwave PCB is disposed in the frequency conversion module, the microwave PCB is provided with a mixer U2 and a frequency multiplier U3, an output end of the frequency multiplier U3 is connected to a local oscillator signal end of the mixer U2, and an input end of the frequency multiplier U3 is connected to an attenuator U4 in series and then connected to a local oscillator input interface; according to the difference between the series elements of the intermediate frequency signal terminal and the radio frequency signal terminal of the mixer U2, the frequency conversion module is divided into three types, which are: type I frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 in series and then is connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the quartz probe B1 in series and then is connected with the waveguide port; type II frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 and the intermediate frequency amplifier chip U6 in series in sequence and then is connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the W-band power amplifier chip U1 and the quartz probe B1 in series in sequence and then is connected with the waveguide port; III type frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 and the intermediate frequency amplifier chip U6 in series in sequence and then connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the W-band low-noise amplifier chip U1' and the quartz probe B1 in series in sequence and then connected with the waveguide port.
In some embodiments of the present invention, in a conventional W-band test, the first frequency conversion module and the second frequency conversion module are directly connected to two ends of the tested object, the vector network analyzer is used to provide local oscillation signals to the first frequency conversion module and the second frequency conversion module, respectively, and the S-parameter measurement function of the vector network analyzer is used to measure the transmission parameters of the tested object.
In some embodiments of the present invention, the first frequency conversion module and the second frequency conversion module are both the type i frequency conversion module.
In some embodiments of the invention, when the emission characteristic of the tested piece is measured in a darkroom test environment, the first frequency conversion module is directly connected with the input end of the tested piece, and the second frequency conversion module is connected with the standard gain loudspeaker; the standard gain loudspeaker receives a signal sent by the tested piece in an air-spaced mode and feeds the received signal into the second frequency conversion module; providing local oscillation signals and intermediate frequency signals for the first frequency conversion module and the second frequency conversion module by using a vector network analyzer; the input power fed into the tested piece by the first frequency conversion module is lower than-10 dBm.
In some embodiments of the present invention, if the measured component is a high-gain transmitting component, the first frequency conversion module is an i-type frequency conversion module, otherwise, the first frequency conversion module is a ii-type frequency conversion module; the second frequency conversion module is a III-type frequency conversion module.
In some embodiments of the present invention, in a darkroom testing environment, when a receiving characteristic of a tested object is measured, a first frequency conversion module is connected to a standard gain speaker, a signal transmitted by the first frequency conversion module is fed into an input end of the tested object through the standard gain speaker in an isolated manner, and an output end of the tested object is directly connected to the first frequency conversion module; providing local oscillation signals and intermediate frequency signals for the first frequency conversion module and the second frequency conversion module by using a vector network analyzer; the input power fed into the standard gain horn by the first frequency conversion module is equal to 15 dBm.
In some embodiments of the present invention, the first frequency conversion module is a type ii frequency conversion module, and the second frequency conversion module is a type iii frequency conversion module.
In some embodiments of the present invention, in an external field test environment, when measuring characteristics of a tested piece, a first frequency conversion module is connected to a standard gain speaker, a signal sent by the first frequency conversion module is fed into an input end of the tested piece through the standard gain speaker in an isolated manner, and an output end of the tested piece is connected to a second frequency conversion module through a low noise amplifier; and respectively providing a local oscillator signal and an intermediate frequency signal for the first frequency conversion module by using a first handheld signal source and a second handheld signal source, providing a local oscillator signal for the second frequency conversion module by using a third handheld signal source, and receiving a signal output by the second frequency conversion module by using the handheld frequency spectrograph.
In some embodiments of the present invention, the first frequency conversion module is a type ii frequency conversion module, and the second frequency conversion module is a type iii frequency conversion module.
Compared with the prior art, the invention at least has the following advantages and beneficial effects:
the W-band signal test method described by the invention converts the W-band signal test into the X-band signal test by respectively adding the compatibly-expanded frequency conversion modules at the transmitting and receiving ends, thereby reducing the frequency and power requirements of a test instrument. The test system of the integrated frequency conversion module has linear characteristic, and the power of the intermediate frequency port can be adjusted according to the requirement. The frequency conversion module has expansibility, and can be expanded into a high-transmitting-power up-conversion module from the up-down frequency conversion module or be expanded into a high-receiving-gain low-noise down-conversion module under the condition that a shielding cavity structure and a driving power panel are not replaced, so that different test environments can be built according to test requirements. The test system has few parts, is convenient to build, can conveniently build an outfield test environment together with the handheld device, and can ensure long-time work under the condition of power supply of the mobile power supply due to low power consumption of the frequency conversion module. The frequency conversion module has small size and comprehensive integrated function, and can complete the test under the condition of few additional accessories.
Drawings
In order to more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and that for those skilled in the art, other related drawings can be obtained from these drawings without inventive effort. In the drawings:
FIG. 1 is a flowchart illustrating an embodiment of a W-band signal testing method;
FIG. 2 is a schematic diagram of a frequency conversion module;
FIG. 3 is a schematic diagram of connection of devices during conventional W-band test;
FIG. 4 is a schematic diagram of the connection of devices during the emission characteristic test of a device under test in a darkroom test environment;
FIG. 5 is a schematic diagram of the connection of the devices during the reception characteristic test of the device under test in a darkroom test environment;
fig. 6 is a schematic diagram of connection of devices during a characteristic test of a device under test in an external field test environment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
It should be noted that the terms "first", "second", etc. appearing in the description of the present invention are used merely for distinguishing between the descriptions and are not intended to indicate or imply relative importance.
Example 1
Referring to fig. 1 and fig. 2, a method for testing a W-band signal is provided in an embodiment of the present invention,
s101, connecting a tested piece between two frequency conversion modules capable of being expanded compatibly, wherein the two frequency conversion modules comprise a first frequency conversion module and a second frequency conversion module;
the existing spread spectrum assembly adopting the W wave band realizes a measurement mode of a tested piece by cascading the spread spectrum assembly through a vector network analyzer, the output power of the spread spectrum assembly is high (about 8-9 dBm) and is not adjustable, the tested piece with gain is easily tested to be in a saturated output power state, and the tested piece is burnt under severe conditions.
In order to avoid the above situation, in this embodiment, a frequency conversion module capable of being extended compatibly is used as a test end of the test platform.
Exemplarily, a microwave PCB is built in the frequency conversion module, the microwave PCB is provided with a mixer U2 and a frequency multiplier U3, an output end of the frequency multiplier U3 is connected to a local oscillator signal end of the mixer U2, and an input end of the frequency multiplier U3 is connected to an attenuator U4 in series and then connected to a local oscillator input interface; according to the difference between the series elements of the intermediate frequency signal terminal and the radio frequency signal terminal of the mixer U2, the frequency conversion module is divided into three types, which are:
type I frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 in series and then connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the quartz probe B1 in series and then connected with the waveguide port. In fig. 1, no chip is placed at U1 and U6, microstrip lines can be directly routed at U1, and a microstrip line through-plate gold wire bonding transition mode can be adopted at U6. The frequency conversion module is now used as an up/down conversion module.
Type II frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 and the intermediate frequency amplifier chip U6 in series in sequence and then is connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the W-band power amplifier chip U1 and the quartz probe B1 in series in sequence and then is connected with the waveguide port; in fig. 1, chip slots are left at U1 and U6, a chip of an intermediate frequency amplifier is used at U6, a chip of a W-band power amplifier is used at U1, and a frequency conversion module is used as an up-conversion module with high output power, so that when the intermediate frequency input power is about-5 dBm, the saturated output power above about +15dBm can be deduced.
III type frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 and the intermediate frequency amplifier chip U6 in series in sequence and then connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the W-band low-noise amplifier chip U1' and the quartz probe B1 in series in sequence and then connected with the waveguide port. In fig. 1, chip slots are left at U1 and U6, an intermediate frequency amplifier chip (reverse transmission direction is opposite to that of a type ii frequency conversion module) is adopted at U6, a W-band low-noise amplifier chip is adopted at U1, and a frequency conversion module is used as a down-conversion module with low noise coefficient and high frequency conversion gain, so that the input power can be ensured to be linear below-10 dBm, and the overall frequency conversion gain is above 20 dB.
Aiming at the above 3 types of frequency conversion modules, the I type frequency conversion module can meet most of conventional test requirements, the II type and the III type mainly meet darkroom environment tests, and meanwhile, the I type frequency conversion module can be added and replaced according to some unconventional tested pieces, namely, the frequency conversion module can be flexibly configured according to use requirements.
In this embodiment, chips placed at U1 and U6 may be replaced/loaded/unloaded to adapt to different scenarios and test conditions, and further, different branches may be separately set according to the three situations, and the intermediate frequency signal terminal and the radio frequency signal terminal of the mixer U2 may be switched to the branches adapted to each other according to the test situation and requirements.
S102, the first frequency conversion module serves as a transmitting end to transmit a W-band test signal to the tested piece, and the second frequency conversion module serves as a receiving end to receive the W-band test signal after the tested piece passes through;
illustratively, when measuring transmission parameters of a test piece, a first frequency conversion module and a second frequency conversion module are directly connected to two ends of the test piece, and a vector network analyzer is used for measurement in cooperation, as shown in fig. 2, for a four-port vector network analyzer, continuous wave local oscillation signals (local oscillation power of about 0 dBm) are fed into the first frequency conversion module and the second frequency conversion module respectively through ports P3 and P4 of the vector network analyzer, the first frequency conversion module multiplies the frequency of an X-band signal output from a radio frequency port of the vector network analyzer to a W-band, after passing through a W-band test piece, the output signal is divided to the X-band through the second frequency conversion module and is transmitted back to another radio frequency port of the vector network analyzer, so as to realize measurement of the transmission parameters.
S103, analyzing and calculating the W-waveband test signals passing through the tested piece by the analysis equipment to obtain the characteristic parameters of the tested piece.
For example, the analysis device may be a vector network analyzer, and the measurement of the transmission parameters of the measured object may be implemented by performing X-band measurement using an S-parameter measurement function of the vector network analyzer.
Example 2
In the frequency conversion module, the frequency multiplier is an active frequency multiplier, and the frequency mixer is an active frequency mixer.
The active frequency multiplier U3 amplifies an input local oscillation signal LO under the condition of power supply of a driving power supply, performs secondary frequency multiplication and driving amplification on the signal, and has a certain inhibiting effect on fundamental waves and 3-th harmonic waves;
the active mixer U2 performs third-time frequency multiplication and driving amplification on an input local oscillation signal 2 LO (2 times of frequency multiplication and driving amplification) under the condition of power supply of a driving power supply to obtain a mixing local oscillation signal 6 LO, and has stronger fundamental wave and 2-time harmonic suppression on the input local oscillation signal 2 LO; the local oscillator signal 6 × LO after frequency multiplication and amplification drives a mixer to complete a mixing function, and the local oscillator signal is mixed with an intermediate frequency signal IF under the condition of up-conversion to obtain a radio frequency signal RF ═ 6 × LO + IF, and is mixed with the radio frequency signal RF under the condition of down-conversion to obtain an intermediate frequency signal IF ═ RF-6 × LO; the mixer has stronger isolation, and can effectively inhibit the problem of local oscillator interference caused by leakage of 6-x LO signals to an RF end;
the quartz probe B1 is used for matching and optimizing a microstrip-gold wire-microstrip transition structure from the mixer to the probe, so that the mixing flatness performance is improved; meanwhile, the quartz probe completes microstrip-waveguide transition, and outputs signals to a WR12 standard waveguide port or receives W-waveband signals from a WR12 standard waveguide port;
the attenuator U4, the attenuator U5, attenuator U4 add to the input port of local oscillator, used for improving the standing wave characteristic of port; the attenuator U5 is added to the mixing if port to improve the standing wave characteristics of the mixing if port and improve the mixing flatness of the mixer, and also to improve the antistatic performance of the if port in the case of the mixer embodiment 1.
Besides, the method also comprises the following steps:
the power supply board is driven, and power supplied by the Type-C port is converted into power supply voltage required by a frequency multiplier U3, a frequency mixer U2, an intermediate frequency amplifier U6 (a chip is selected and a power supply port is reserved), a W-band amplifier U1 (a chip is selected and a power supply port is reserved), and negative bias voltage required by the frequency mixer and the W-band amplifier;
example 3
Referring to fig. 2 and 3, in a conventional W-band test, a first frequency conversion module and a second frequency conversion module are directly connected to two ends of a tested piece, a vector network analyzer is used to provide local oscillation signals to the first frequency conversion module and the second frequency conversion module, and an S parameter measurement function of the vector network analyzer is used to measure transmission parameters of the tested piece.
In conventional W-band active/passive testing, a four-port measurement scheme using a vector network analyzer, as shown in fig. 2, or a two-port measurement scheme using a vector network analyzer, as shown in fig. 3, may be employed. When the four-port vector network analyzer is used for matching measurement, continuous wave local oscillation signals (local oscillation power is about 0 dBm) are fed in through the ports P3 and P4 of the vector network analyzer, and the transmission parameters of a measured piece can be measured by adopting the S parameter measurement function of the vector network analyzer. Under the condition that only a two-port vector network analyzer is limited, two local oscillator signals can be fed in a signal source power divider mode. In the two measurement schemes, the first frequency conversion module and the second frequency conversion module both adopt I-type frequency conversion modules, the insertion loss of the frequency conversion modules is about 12dB, and the input P1dB compression point is about 5dBm (radio frequency and intermediate frequency end P1 dB); in order to ensure that the measured value is a linear characteristic value, the power of the intermediate frequency port of the vector network analyzer can be adjusted according to the gain of the tested piece, and the frequency conversion module and the tested piece are ensured to be in a linear working state.
Example 4
The embodiment provides a W-band signal testing method, which can perform the measurement of the emission characteristic of the tested piece by using the scheme shown in fig. 4 and the measurement of the reception characteristic of the tested piece by using the scheme shown in fig. 5 in a darkroom testing environment. When the emission characteristic of the tested piece is measured, the first frequency conversion module is directly connected with the input end of the tested piece, and the second frequency conversion module is connected with the standard gain loudspeaker; the standard gain loudspeaker receives and strengthens the signal sent by the tested piece in an air-spaced mode, and then outputs the strengthened signal to the second frequency conversion module; when the receiving characteristic of the tested piece is measured, the first frequency conversion module is connected with the standard gain loudspeaker, a signal sent by the first frequency conversion module is transmitted to the input end of the tested piece through the standard gain loudspeaker in an air-spaced mode, and the output end of the tested piece is directly connected with the second frequency conversion module. In the two tests, the vector network analyzer can be used for providing the local oscillator signal and the intermediate frequency signal for the first frequency conversion module and the second frequency conversion module. In addition, when the tested piece is a passive product, it needs to be ensured that the input power fed into the tested piece/standard gain loudspeaker by the first frequency conversion module is higher than 15 dBm.
Under a darkroom measurement environment, considering the space loss between a receiving link and a transmitting link, the first frequency conversion module adopts a II-type frequency conversion module, and the input power fed into a standard gain loudspeaker or a passive tested piece is ensured to be higher than 15 dBm; meanwhile, when the tested piece is a high-gain transmitting component, the first frequency conversion module can adopt an I-type frequency conversion module so as to ensure the output signal-to-noise ratio of the transmitting signal. At a receiving end, the second frequency conversion module adopts a III-type frequency conversion module, a low-noise amplifier chip U1 of an input stage ensures a lower noise coefficient of a receiving link, and a transmitting signal is subjected to spatial attenuation, so that the situation that the signal is compressed in the frequency conversion module in a non-linear mode can be ensured under the condition of high gain of a tested piece. As an optimization, under the condition that the condition of the vector network analyzer is limited, the method in fig. 3 may be adopted to provide two local oscillation signals by way of the signal source power divider.
Example 5
The embodiment provides a W-band signal testing method, in an external field testing environment, when measuring characteristics of a tested piece, a first frequency conversion module is connected with a standard gain horn, a signal sent by the first frequency conversion module is fed into an input end of the tested piece through the standard gain horn in an isolated manner, an output end of the tested piece is connected with a second frequency conversion module through a low noise amplifier, and an output end of the tested piece is directly connected with the second frequency conversion module; and a third handheld signal source and a handheld frequency spectrograph are used for respectively providing the local oscillator signal and the intermediate frequency signal for the second frequency conversion module.
Under the external field test environment, the scheme shown in FIG. 6 can be adopted to measure the characteristics of the tested piece. The transmitting end transmits high power, and the receiving end amplifies the high gain with the low noise amplifier in the frequency conversion module by adding an extra primary low noise amplifier to compensate high space loss under the external field test environment. Preferably, the first handheld signal source, the second handheld signal source and the third handheld signal source can be replaced by portable frequency source modules, and the frequency source modules are powered by the mobile power supply, so that convenience of the test scheme is further improved.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims (10)

1. A W-band signal testing method is characterized by comprising the following steps:
connecting a tested piece between two compatible and expandable frequency conversion modules, wherein the two frequency conversion modules comprise a first frequency conversion module and a second frequency conversion module;
the first frequency conversion module is used as a transmitting end to transmit a W-waveband test signal to the tested piece, and the second frequency conversion module is used as a receiving end to receive the W-waveband test signal after passing through the tested piece;
the analysis equipment analyzes and calculates the W-waveband test signals before and after passing through the tested piece to obtain the characteristic parameters of the tested piece.
2. The W-band signal testing method according to claim 1, wherein a microwave PCB is arranged in the frequency conversion module, a mixer U2 and a frequency multiplier U3 are arranged on the microwave PCB, an output end of the frequency multiplier U3 is connected with a local oscillator signal end of the mixer U2, and an input end of the frequency multiplier U3 is connected with an attenuator U4 in series and then connected with a local oscillator input interface;
according to the difference between the series elements of the intermediate frequency signal end and the radio frequency signal end of the mixer U2, the frequency conversion module is divided into three types, which are:
type I frequency conversion module: an intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 in series and then is connected with an intermediate frequency input/output interface, and a radio frequency signal end of the mixer is connected with the quartz probe B1 in series and then is connected with a waveguide port;
type II frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 and the intermediate frequency amplifier chip U6 in series in sequence and then is connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the W-band power amplifier chip U1 and the quartz probe B1 in series in sequence and then is connected with the waveguide port;
III type frequency conversion module: the intermediate frequency signal end of the mixer U2 is connected with the attenuator U5 and the intermediate frequency amplifier chip U6 in series in sequence and then connected with the intermediate frequency input/output interface, and the radio frequency signal end of the mixer is connected with the W-band low-noise amplifier chip U1' and the quartz probe B1 in series in sequence and then connected with the waveguide port.
3. The method according to claim 2, wherein in a conventional W-band test, the first frequency conversion module and the second frequency conversion module are directly connected to two ends of the tested object, the local oscillation signals are respectively provided to the first frequency conversion module and the second frequency conversion module by using a vector network analyzer, and the transmission parameters of the tested object are measured by using an S-parameter measurement function of the vector network analyzer.
4. The method for testing W-band signals according to claim 3, wherein the first frequency conversion module and the second frequency conversion module are both the I-type frequency conversion module.
5. The W-band signal testing method of claim 2, wherein when the emission characteristic of the tested piece is measured in a darkroom testing environment, the first frequency conversion module is directly connected with the input end of the tested piece, and the second frequency conversion module is connected with the standard gain loudspeaker; the standard gain loudspeaker receives a signal sent by the tested piece in an air-spaced mode and feeds the received signal into the second frequency conversion module;
providing local oscillation signals and intermediate frequency signals for the first frequency conversion module and the second frequency conversion module by using a vector network analyzer;
the input power fed into the tested piece by the first frequency conversion module is lower than-10 dBm.
6. The method for testing W-band signals according to claim 5, wherein if the tested device is a high-gain transmitter module, the first frequency conversion module is a type I frequency conversion module, otherwise, the first frequency conversion module is a type II frequency conversion module; the second frequency conversion module is a III-type frequency conversion module.
7. The method for testing the W-band signal according to claim 2, wherein when the receiving characteristic of the tested piece is measured in a darkroom testing environment, the first frequency conversion module is connected with a standard gain loudspeaker, a signal sent by the first frequency conversion module is fed into the input end of the tested piece through the standard gain loudspeaker in an air-isolated manner, and the output end of the tested piece is directly connected with the second frequency conversion module;
providing local oscillation signals and intermediate frequency signals for the first frequency conversion module and the second frequency conversion module by using a vector network analyzer;
the input power fed into the standard gain horn by the first frequency conversion module is equal to 15 dBm.
8. The method for testing W-band signals according to claim 7, wherein the first frequency conversion module is a type ii frequency conversion module, and the second frequency conversion module is a type iii frequency conversion module.
9. The method for testing the W-band signal according to claim 2, wherein when the characteristic of the tested piece is measured in an external field test environment, a first frequency conversion module is connected with a standard gain loudspeaker, a signal sent by the first frequency conversion module is fed into an input end of the tested piece through the standard gain loudspeaker in an air-isolated mode, and an output end of the tested piece is connected with a second frequency conversion module through a low-noise amplifier;
and respectively providing a local oscillator signal and an intermediate frequency signal for the first frequency conversion module by using a first handheld signal source and a second handheld signal source, providing a local oscillator signal for the second frequency conversion module by using a third handheld signal source, and receiving a signal output by the second frequency conversion module by using the handheld frequency spectrograph.
10. The method for testing W-band signals according to claim 9, wherein the first frequency conversion module is a type ii frequency conversion module, and the second frequency conversion module is a type iii frequency conversion module.
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CN115189713A (en) * 2022-08-19 2022-10-14 河北新华北集成电路有限公司 Mixer testing device and method
CN115421111A (en) * 2022-08-30 2022-12-02 北京天地一格科技有限公司 Encapsulation radar self-checking method and device and readable storage medium

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