CN113295710A - Method for detecting LCD module, electronic equipment and storage medium - Google Patents
Method for detecting LCD module, electronic equipment and storage medium Download PDFInfo
- Publication number
- CN113295710A CN113295710A CN202110496483.9A CN202110496483A CN113295710A CN 113295710 A CN113295710 A CN 113295710A CN 202110496483 A CN202110496483 A CN 202110496483A CN 113295710 A CN113295710 A CN 113295710A
- Authority
- CN
- China
- Prior art keywords
- primary color
- lcd module
- light wave
- light
- bright point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 61
- 238000003860 storage Methods 0.000 title claims abstract description 23
- 230000007547 defect Effects 0.000 claims abstract description 77
- 239000003086 colorant Substances 0.000 claims abstract description 23
- 238000001914 filtration Methods 0.000 claims abstract description 18
- 230000004044 response Effects 0.000 claims description 86
- 239000000428 dust Substances 0.000 claims description 61
- 230000011218 segmentation Effects 0.000 claims description 16
- 238000005498 polishing Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 51
- 230000004069 differentiation Effects 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 9
- 238000003384 imaging method Methods 0.000 description 8
- 230000006870 function Effects 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 230000009286 beneficial effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000004590 computer program Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000002085 persistent effect Effects 0.000 description 4
- 238000003745 diagnosis Methods 0.000 description 3
- 239000002131 composite material Substances 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 239000002355 dual-layer Substances 0.000 description 1
- 230000004313 glare Effects 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000003709 image segmentation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003909 pattern recognition Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
Abstract
The application relates to a method for detecting an LCD module, an electronic device and a storage medium. The method comprises the following steps: providing a first light wave and a second light wave, wherein the first light wave is emitted by a surface light source, the first light wave is any one of three primary colors of light, a primary color filter is any one of three primary color filters in a light filtering device, the second light wave is emitted by a backlight light source, and the second light wave comprises at least one primary color of light different from the first light wave; switching a first primary color filter according to the primary color of the first light wave; shooting the LCD module through a first primary color filter by a black and white industrial camera to obtain a first LCD module image; switching a second primary color filter according to the primary color of the second light wave; and shooting the LCD module through the second primary color filter by the black and white industrial camera to obtain a second LCD module image. The scheme that this application provided can realize defect detection and differentiation to the LCD module.
Description
Technical Field
The present disclosure relates to the field of defect detection technologies, and in particular, to a method, an electronic device, and a storage medium for detecting an LCD module.
Background
The LCD module is usually a multi-layer structure, and during the process of manufacturing the LCD module, there are various processes of film sticking and pressing, and some foreign matters such as dust and impurities are inevitably introduced during the process of manufacturing, so that the finished product of the LCD module has defects. The traditional solution is to adopt a manual detection mode, however, with the rapid development of the machine vision industry, the machine vision defect detection has replaced the old manual detection mode in various industries, and the detection efficiency is greatly improved. Machine vision defect detection usually utilizes the black and white industry camera of high resolution to carry out imaging detection to LCD module picture, shoots two product pictures respectively, and one is the formation of image picture of LCD module when the backlight is lighted, and another is the LCD module formation of image picture that the surface was polished, thereby distinguishes and discerns the foreign matter defect through the position of bright spot between detection algorithm contrast two images.
In the prior art, in patent publication No. CN110445921A (a mobile phone screen backlight foreign matter defect diagnosis method and device based on machine vision), a foreign matter defect diagnosis method is proposed, in which a dust side light device is designed for removing dust interference factors, so as to eliminate the interference of dust on the backlight foreign matter defect, and a set of detection algorithm is designed for detecting the whole backlight foreign matter defect to identify whether the mobile phone screen contains defects.
The above prior art has the following disadvantages:
when the dust side light device brightens and images dust, foreign matter defects are easily imaged, and the defects are possibly judged as surface dust by mistake and filtered out, so that the problem of missing detection of the foreign matter defects is caused. Therefore, it is required to develop a method for distinguishing surface dust and foreign matter defects in an image to be measured according to gray values.
Disclosure of Invention
In order to overcome the problems in the related art, the application provides a method for detecting the LCD module, and the method can improve the accuracy of detecting the foreign body defects of the LCD module and improve the detection efficiency.
The application provides a method for detecting an LCD module in a first aspect, which comprises the following steps: providing a first light wave and a second light wave, wherein the first light wave is emitted by a surface light source, the first light wave is any one of three primary colors, a primary color filter is any one of three primary color filters in a light filtering device, the second light wave is emitted by a backlight light source, and the second light wave comprises at least one primary color light different from the first light wave; switching a first primary color filter according to the primary color of the first light wave; shooting the LCD module through the first primary color filter by a black and white industrial camera to obtain a first LCD module image; switching a second primary color filter according to the primary color of the second light wave; and shooting the LCD module through the second primary color filter by the black-and-white industrial camera to obtain a second LCD module image.
In one embodiment, the method further comprises: respectively extracting interested areas of each LCD module image to obtain a corresponding LCD image to be detected, wherein the LCD image to be detected comprises at least one response bright spot; acquiring a bright point gray value corresponding to at least one response bright point in the LCD image to be detected; and performing threshold segmentation on the bright point gray values respectively corresponding to at least one response bright point by using a gray threshold, and determining a foreign matter type corresponding to at least one response bright point in each LCD module image, wherein the foreign matter type comprises dust and a foreign matter defect.
In one embodiment, switching the second primary color filter according to the primary color of the second light wave comprises: if the second light wave is light combined by three primary colors, switching the second primary color filter into a filter with a color different from the primary color of the first light wave in the three primary color filters; if the second light wave is light combined by any two primary colors, the second primary color filter is switched to be a filter with the color different from that of the first light wave and consistent with any one primary color of the second light wave in the three-primary color filter; if the second light wave is a primary color light, the second primary color filter is switched to be a filter with the color consistent with the primary color of the second light wave in the three primary color filters.
In one embodiment, the gray threshold is determined according to a numerical range of a gray value of a bright point corresponding to at least one response bright point in the same LCD image to be measured; performing threshold segmentation on the bright point gray values respectively corresponding to at least one response bright point by using a gray threshold, wherein the threshold segmentation comprises the following steps: and comparing the gray value of each bright point with a gray threshold value respectively.
In one embodiment, determining the type of the foreign object corresponding to at least one of the response bright points in each of the LCD module images comprises: if the gray value of the current bright point is smaller than the gray threshold, judging that the type of the foreign matter responding to the bright point corresponding to the gray value of the current bright point is dust; and if the gray value of the current bright point is greater than the gray threshold, judging that the foreign matter type of the response bright point corresponding to the gray value of the current bright point is a foreign matter defect.
In one embodiment, after determining the type of the foreign object corresponding to at least one of the response bright points in each LCD module image, the method includes: and filtering the response bright spots judged as dust in the LCD image to be detected.
In one embodiment, the region of interest extraction for each LCD module image comprises: and extracting the interested region of each LCD module image through a threshold segmentation algorithm.
In one embodiment, before the LCD module is photographed by a black and white industrial camera, the method further includes: the LCD module is lightened through the backlight light source and the surface polishing light source; the surface light source irradiates the LCD module with an irradiation angle alpha, the irradiation angle is an included angle formed by light waves emitted by the surface light source and a normal line of a horizontal plane, and alpha is larger than zero.
In one embodiment, the photographing of the LCD module through the first primary color filter or the second secondary color filter by the black and white industrial camera includes: and shooting the front view of the screen surface of the LCD module through the first primary color filter or the second secondary color filter by using a black and white industrial camera.
A second aspect of the present application provides an electronic device, comprising: a processor; and a memory having executable code stored thereon, which when executed by the processor, causes the processor to perform the method as described above.
A third aspect of the application provides a non-transitory machine-readable storage medium having stored thereon executable code which, when executed by a processor of an electronic device, causes the processor to perform a method as described above.
The technical scheme provided by the application can comprise the following beneficial effects:
the method comprises the steps of switching a first primary color filter according to the primary color of a first light wave, switching a second primary color filter according to the primary color of a second light wave, and shooting the LCD module through the switched primary color filters under a preset light source through a black-and-white industrial camera, so that surface dust and foreign matter defects of the LCD module are in different colors, and the detection and the distinguishing of the dust and the foreign matter defects are realized. The first light wave is any one of three primary colors of light emitted by the surface light source, the primary color filter is a filter with one of the three primary colors of light in the filter device, the preset light source comprises a backlight light source and a surface light source, and the second light wave emitted by the backlight light source comprises at least one primary color different from the first light wave.
In some embodiments, the regions of interest of the first LCD module image and the second LCD module image obtained by shooting are extracted respectively, the extracted LCD to-be-detected image includes at least one response bright point, each bright point gray value of all response bright points in the LCD to-be-detected image is obtained, and threshold segmentation operation is performed on the bright point gray values corresponding to all response bright points in the LCD to-be-detected image to obtain the foreign matter attribute classification of the response bright points. Compared with the prior art, the scheme has the advantages that the switching primary color filter shoots the LCD module through the black-and-white industrial camera in the specific environment that the background light source and the light wave emitted by the surface light source are obviously different, the foreign matter defects in the LCD module and the dust on the surface of the LCD module are lightened, the foreign matter defects and the dust are displayed as response bright spots in an imaged LCD module image, bright spot gray values corresponding to the response bright spots are obtained, threshold segmentation is carried out on the bright spot gray values of the response bright spots through the gray threshold, then the foreign matter types corresponding to the response bright spots are determined, the effect of distinguishing the surface dust and the foreign matter defects in the module is achieved, the detection accuracy is improved, the detection implementation difficulty is low, the detection efficiency is improved, the detection cost is reduced, and the foreign matter detection compatibility is strong.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
The foregoing and other objects, features and advantages of the application will be apparent from the following more particular descriptions of exemplary embodiments of the application, as illustrated in the accompanying drawings wherein like reference numbers generally represent like parts throughout the exemplary embodiments of the application.
Fig. 1 is a schematic flowchart illustrating a first embodiment of a method for inspecting an LCD module according to an embodiment of the present disclosure;
fig. 2 is a schematic flowchart illustrating a second embodiment of a method for inspecting an LCD module according to an embodiment of the present application;
fig. 3 is a schematic flowchart illustrating a third embodiment of a method for inspecting an LCD module according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of an electronic device shown in an embodiment of the present application.
Detailed Description
Preferred embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While the preferred embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this application and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items.
It should be understood that although the terms "first," "second," "third," etc. may be used herein to describe various information, these information should not be limited to these terms. These terms are only used to distinguish one type of information from another. For example, first information may also be referred to as second information, and similarly, second information may also be referred to as first information, without departing from the scope of the present application. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
Example one
The LCD module is usually a multi-layer structure, and during the process of manufacturing the LCD module, there are various processes of film sticking and pressing, and some foreign matters such as dust and impurities are inevitably introduced during the process of manufacturing, so that the finished product of the LCD module has defects. The traditional solution is to adopt a manual detection mode, however, with the rapid development of the machine vision industry, the machine vision defect detection has replaced the old manual detection mode in various industries, and the detection efficiency is greatly improved. Machine vision defect detection usually utilizes the black and white industry camera of high resolution to carry out imaging detection to LCD module picture, shoots two product pictures respectively, and one is the formation of image picture of LCD module when the backlight is lighted, and another is the LCD module formation of image picture that the surface was polished, thereby distinguishes and discerns the foreign matter defect through the position of bright spot between detection algorithm contrast two images. In the prior art, a foreign matter defect diagnosis method is provided, a dust side light device is designed for removing dust interference factors, the interference of dust on the backlight foreign matter defect can be eliminated, and a set of detection algorithm is designed for detecting the whole backlight foreign matter defect to identify whether a mobile phone screen contains the defect. However, the prior art has the following disadvantages: when the dust side light device brightens and images dust, foreign matter defects are easily imaged, and the defects are possibly judged as surface dust by mistake and filtered out, so that the problem of missing detection of the foreign matter defects is caused. Therefore, it is required to develop a method for distinguishing surface dust and foreign matter defects in an image to be measured according to gray values.
In view of the above problems, an embodiment of the present application provides a method for detecting an LCD module, which can improve the accuracy of detecting the foreign object defects of the LCD module and improve the detection efficiency.
The technical solutions of the embodiments of the present application are described in detail below with reference to the accompanying drawings.
Fig. 1 is a schematic flowchart illustrating a first embodiment of a method for inspecting an LCD module according to an embodiment of the present disclosure.
Referring to fig. 1, an embodiment of a method for detecting a foreign object defect of an LCD according to the present application includes:
101. switching a primary color filter according to the primary color of the first light wave;
in the embodiment of the present application, the first light wave is a light wave emitted by the surface light source, the first light wave is any one of three primary colors, the three primary colors refer to red, green and blue light, and the primary color refers to any one of the red, green and blue light.
In some embodiments, the filtering means comprises a first primary color filter, a second primary color filter and a third primary color filter. The primary color filter is any one of three primary color filters in the light filtering device, the light filtering device has a function of converting the three primary color filters, the three primary color filters are a red filter, a green filter and a blue filter, and any one primary color filter can only allow light with the primary color to pass through, for example, the red filter can only allow red light to pass through.
Assuming that the first light wave is red light, the first light wave illuminates surface dust and then is imaged, the color of the dust can be regarded as the same as the color of the first light wave within a reasonable error range, therefore, the responding bright points corresponding to the dust will be more obviously displayed only when the red filter is used for shooting, but because the second light wave is obviously different from the first light wave, namely, the responding bright points corresponding to the foreign matter defects illuminated by the second light wave can be obviously displayed when the green filter or the blue filter is used for shooting, and the response bright spots corresponding to the dust are not obvious or even not shown, so that under the current condition, a green filter or a blue filter can be selected as a primary color filter for shooting, and the response bright spots corresponding to the dust and the response bright spots corresponding to the foreign matter defects can be clearly distinguished.
It is understood that the above method for switching the primary color filters is only exemplary, and only for better understanding of the principle of switching the primary color filters, in practical applications, the first light wave may also be green light, and may also be blue light, and is not limited herein.
102. Respectively shooting the LCD module through the first primary color filter and the second primary color filter by a black-and-white industrial camera;
the industrial camera is a key component in a machine vision system, the most essential function of the industrial camera is to convert an optical signal into an ordered electrical signal, the industrial camera has high image stability, high transmission capability and high anti-interference capability, and most of image sensors of the industrial camera are based on a CCD chip or a CMOS chip. The picture taken by the black and white industrial camera is a black and white picture. In the embodiment of the application, the black and white industrial camera is used for shooting the LCD module to obtain the image of the LCD module.
The photographing by the black and white industrial camera may be photographing under a preset light source. The preset light source is a light source for shooting, which includes a backlight light source and a surface light source, where the backlight light source emits a second light wave, and the second light wave includes at least one primary color light different from the first light wave, and exemplarily, the first light wave is assumed to be red light, and the second light wave includes at least one primary color light different from the red light, that is, the second light wave may be blue light, or a composite light of the red light and the blue light, or white light, but cannot be red light same as the first light wave, so as to achieve an effect that the surface light source and the light wave emitted by the backlight light source should be obviously different.
The LCD module is generally a multi-layer structure including at least an upper polarizer layer, a liquid crystal layer and a lower polarizer layer, wherein the liquid crystal layer is disposed between the upper polarizer layer and the lower polarizer layer. The foreign matter defect that the finished product of LCD module exists is present between last polaroid and the liquid crystal layer and between lower polaroid and the liquid crystal layer, and the characteristics of this foreign matter defect are when the LCD module is struck by backlight, and the foreign matter defect exists among the screen as a bright spot, therefore in this application embodiment, can include backlight among the preset light source, in order to distinguish dust and the foreign matter defect on LCD module surface, still can include among the preset light source and have the surface that obviously distinguishes to strike light the dust on LCD module surface with backlight among the preset light source.
103. Respectively extracting interested areas of each LCD module image to obtain a corresponding LCD image to be detected;
the method comprises the steps of respectively carrying out image processing on various shot LCD module images (namely a first LCD module image and a second LCD module image), wherein in each LCD module image, because a backlight light source can only penetrate through the position where a foreign matter defect is located and can not penetrate through the normal part of a screen, and because the main function of a surface light source is to brighten surface dust, the obtained LCD module images are mostly dark-tone images, and sporadic response bright spots exist in the images, namely at least one response bright spot is included. Taking the second LCD module image as an example, in some embodiments, some of the response bright spots mainly include a foreign matter defect bright spot that is brightened by the backlight light source, and other weak response bright spots may be dust bright spots that are brightened by veiling glare in the shooting environment, and the response bright spots are all extracted by the image processing technology to form the LCD image to be measured.
104. Acquiring a bright point gray value corresponding to at least one response bright point in an LCD image to be detected;
the bright point gray value refers to a gray value of a response bright point, after the response bright point passes through the primary color filter, the bright point gray value of the response bright point reflects the brightness degree of the primary color light passing through the primary color filter in the response bright point, if the bright point gray value is low, the response bright point is relatively dark, and if the bright point gray value is high, the response bright point is relatively bright.
As for the manner of acquiring the gray value of the bright point, the embodiment of the present application acquires the gray value by using the image color acquiring software, and it can be understood that in practical applications, the manner of acquiring the gray value of the bright point is various, the manner of acquiring the gray value of the bright point by using the software is merely exemplary, and other suitable algorithms or software can be selected according to practical application situations, where the manner of acquiring the gray value of the bright point is not limited uniquely.
105. And performing threshold segmentation on the bright point gray values respectively corresponding to the at least one response bright point by using the gray threshold value, and determining the type of the foreign matter corresponding to the at least one response bright point in each LCD module image.
In some embodiments, the gray threshold is used to divide the bright point gray values corresponding to all the responding bright points into two sets, wherein the foreign object type corresponding to the responding bright point corresponding to the bright point gray value in one set is dust, and the foreign object type corresponding to the responding bright point corresponding to the bright point gray value in the other set is a foreign object defect in the LCD module.
The following beneficial effects can be seen from the first embodiment:
the method comprises the steps of switching a first primary color filter according to the primary color of a first light wave for shooting, switching a second primary color filter according to the primary color of a second light wave for shooting, wherein the first light wave is any one of three primary color lights emitted by a surface lighting light source, the primary color filters are filters with one of the primary colors in the three primary color filters in a light filtering device, shooting an LCD module by a black-and-white industrial camera through switching to the corresponding primary color filters under a preset light source, the preset light source comprises a backlight light source and the surface lighting light source, the backlight light source emits the second light wave comprising at least one primary color light different from the first light wave, extracting the region of interest of each shot LCD module image, extracting to-be-detected LCD images to include at least one response bright point, and acquiring each gray value of all the response bright points in the LCD to-be-detected images, and performing threshold segmentation operation on the bright point gray values corresponding to all the response bright points in the LCD image to be detected to obtain the foreign matter attribute classification of the response bright points.
Compared with the prior art, the scheme has the advantages that the black-and-white industrial camera shoots the LCD module through the switched primary color filter under the specific environment that the light waves emitted by the background light source and the surface light source are obviously different, the foreign matter defects in the LCD module and the dust on the surface of the LCD module are lightened to enable the foreign matter defects and the dust to be displayed as response bright spots in an imaged LCD module image, bright spot gray values corresponding to the response bright spots are obtained respectively, threshold segmentation is carried out on the bright spot gray values of the response bright spots through the gray threshold, then the foreign matter types corresponding to the response bright spots are determined, the effect of distinguishing the surface dust from the foreign matter defects in the module is achieved, the detection accuracy is improved, the detection implementation difficulty is low, the detection efficiency is improved, the detection cost is reduced, and the foreign matter detection compatibility is strong.
Example two
In practical application, in addition to the primary colors of the first light wave, how many primary colors are contained in the second light wave is also considered to accurately determine the second primary color filter, and after the second primary color filter is switched, the second primary color filter can be shot by a black-and-white industrial camera through the second primary color filter under a preset light source, so that the detection efficiency is improved, and the repeated shooting of pictures with the same detection effect is avoided.
Fig. 2 is a schematic flow chart of a second method for detecting a foreign object defect in an LCD according to an embodiment of the present application.
Referring to fig. 2, an embodiment of a method for inspecting an LCD module according to the embodiment of the present application includes:
201. determining a primary color filter according to the colors of the first light wave and the second light wave;
and switching the first primary color filter according to the primary color of the first light wave, wherein the first primary color filter can be a filter with the same primary color as the first light wave. Assuming that the first light wave is red, the first primary color filter may be a red filter. The second primary color filter is switched according to the primary color of the second light wave, and the primary color of the second primary color filter can be determined according to the primary colors of the first light wave and the second light wave, which will be described in detail below.
If the second light wave is light combined by three primary colors, the second primary color filter is switched to be a filter with the color different from the primary color of the first light wave in the three primary color filters. Assuming that the first light wave is red light, and the second light wave is composite light in which three primary colors are combined, it can be determined that in the second LCD module image imaged after filtering with the green filter or the blue filter, since the first light wave cannot be imaged through the green filter or the blue filter, a response bright point corresponding to dust illuminated with the first light wave is displayed darkly, while green light and blue light in the second light wave can both be displayed brightly through the green filter and the blue filter, a response bright point corresponding to a foreign object defect illuminated with the second light wave is displayed brightly, and a response bright point corresponding to dust is greatly different from a response bright degree corresponding to the foreign object defect, so that the green filter or the blue filter can be selected as the second primary color filter under the current circumstances.
If the second light wave is light combined by any two primary colors, the second primary color filter is switched to be a filter which has the color different from the primary color of the first light wave and is consistent with any primary color of the second light wave in the three-primary color filter. Assuming that the first light wave is red light, the second light wave may be a combination of red light and blue light or green light, or a combination of blue light and green light, in the case of the combination of red light and blue light, both the first light wave and the second light wave can pass through the red filter, and the blue light part of the second light wave can pass through the blue filter, it is determined that, in the second LCD module image formed after filtering by using the blue filter in this case, the response bright spot corresponding to the foreign object defect illuminated by the second light wave is displayed brighter, the response bright spot corresponding to the dust illuminated by the first light wave is displayed darker, and the response bright spot corresponding to the dust is greatly different from the response bright spot corresponding to the foreign object defect, so that the blue filter can be selected as the second primary color filter in the present case.
If the second light wave is a primary color light, the second primary color filter is switched to be a filter with the color consistent with the primary color of the second light wave in the three primary color filters. Assuming that the first light wave is red light and the second light wave is green light different from the first light wave, it can be determined that, in the second LCD module image imaged after filtering with the green filter, since the first light wave cannot be imaged through the green filter, the response bright point corresponding to the dust illuminated by the first light wave is displayed darkly, and the green light in the second light wave can pass through the green filter, the response bright point corresponding to the foreign object defect illuminated by the second light wave is displayed brightly, and the response bright point corresponding to the dust and the response bright point corresponding to the foreign object defect are distinguished to a greater extent, so that the green filter can be selected as the second primary color filter under the current circumstances.
It is understood that the above hypothetical description is only used for better understanding of the scheme, and the first optical wave and the second optical wave can be set differently in practical application according to the practical application, and are not limited herein.
It can be understood that, in the embodiment of the present invention, by using the two light sources with different colors (i.e., the first light wave and the second light wave), the dust on the surface of the LCD module can be made to take one color, and the foreign object defect inside the LCD module can take another color, so that LCD module images with different images can be obtained by switching the primary color filters, so as to distinguish between the dust and the foreign object defect. Although the color industrial camera can achieve the purpose of distinguishing dust and foreign matter by directly distinguishing RGB imaging, the imaging accuracy of the color industrial camera is lower than that of a black-and-white industrial camera. In order to more intuitively understand the advantages of the present embodiment, the following description is made with reference to table one, wherein in the prior art, in consideration of the precision problem, a black and white industrial camera is generally used to detect the foreign object defect on the LCD screen.
Table one:
| whether dust is distinguishable from foreign matter | Precision of imaging | |
| Prior art (i.e. single use black and white industrial camera) | Whether or not | Is higher than |
| Color industrial camera scheme | Is that | Is lower than |
| Black and white industrial camera + external optical filter | Is that | Is higher than |
As can be seen from the comparison results in table one, the use of the combination of the black-and-white industrial camera and the primary color filter in the embodiment of the present invention not only can achieve the purpose of distinguishing the defects of dust and foreign matter, but also can effectively improve the imaging precision, and is beneficial to further improving the accuracy of defect detection.
202. The LCD module is lightened through the backlight light source and the surface polishing light source;
the LCD module is positioned between the backlight source and the surface light source, the brightness of the backlight source and the surface light source is required to be more than x, wherein the gray value of the response bright point corresponding to the dust and the foreign matter defect in the imaged LCD module image on any channel is more than x, and the value of x can be 150.
The surface light source irradiates the LCD module with an irradiation angle α, which is an included angle formed by a light wave emitted by the surface light source and a normal of a horizontal plane, where α is greater than zero.
203. Shooting the LCD module through a corresponding primary color filter by a black and white industrial camera;
the filtering device where the primary color filter is located is installed right in front of a lens group of the black-and-white industrial camera, and light enters the lens group through the filtering device and then is imaged through a photosensitive chip of the black-and-white industrial camera. In some embodiments, the black-and-white industrial camera shoots the LCD module through different primary color filters to respectively acquire a first LCD module image containing a dust bright spot and a second LCD module image containing a foreign matter defect bright spot for the same LCD module, thereby being beneficial to more accurately distinguishing the dust and the foreign matter defect.
The front view of the screen surface of the LCD module is shot by the black-and-white industrial camera through the first primary color filter or the second primary color filter, and the black-and-white industrial camera can be arranged right above the LCD module to shoot.
The following beneficial effects can be seen from the second embodiment:
the method comprises the steps of determining a primary color filter according to the colors of a first light wave and a second light wave, shooting an LCD module under a preset light source through a corresponding primary color filter by a black-and-white industrial camera after the primary color filter is determined, lighting the LCD module at a certain brightness and angle through a backlight light source and a surface lighting light source during shooting, and shooting the front view of the LCD module to obtain an image of the LCD module. Compared with the prior art, the technical scheme of the application adopts the effect of clearly distinguishing the response bright spots corresponding to the dust and the response bright spots corresponding to the foreign matter defects through the primary color filter shooting, the combination mode of the multiple light colors of the first light wave and the second light wave is fully considered, but the three primary color filters are not required to be completely used for shooting, the repeated shooting of pictures with the same detection effect is avoided, the repeated detection and invalid detection are avoided, the detection efficiency is improved, the detection cost is reduced, the detection method is high in compatibility, the quality of the obtained LCD module image can be guaranteed under the preset light source, and the detection accuracy is improved.
EXAMPLE III
For convenience of understanding, an embodiment of the method for detecting the foreign object defect of the LCD is provided below for explanation, and in practical application, after the classification of the type of the foreign object corresponding to the responding bright point is completed, the responding bright point corresponding to the dust is filtered out, and the position of the foreign object defect is detected.
Fig. 3 is a schematic flowchart of a third embodiment of a method for inspecting an LCD module according to the embodiment of the present application.
Referring to fig. 3, a third method embodiment shown in the present application includes:
301. respectively extracting interested areas of each LCD module image to obtain a corresponding LCD image to be detected;
and extracting the interested region of each LCD module image through a threshold segmentation algorithm, and filtering out other non-target detection objects except each LCD module.
The threshold segmentation algorithm is an image segmentation technology based on regions, and the principle is to divide image pixel points into a plurality of classes, which are necessary image processing processes before image analysis, feature extraction and pattern recognition.
302. Acquiring a bright point gray value corresponding to at least one response bright point in an LCD image to be detected;
in the embodiment of the present application, the specific content of step 302 is similar to that of step 104 in the first embodiment, and is not described herein again.
303. Performing threshold segmentation on the bright point gray values respectively corresponding to at least one response bright point by using a gray threshold value, and determining the type of foreign matters corresponding to at least one response bright point in each LCD module image;
the gray threshold is determined according to the numerical range of the bright point gray value corresponding to at least one response bright point in the same LCD image to be tested, and the average value of the bright point gray values corresponding to all the response bright points in the same LCD image to be tested can be selected as the gray threshold.
Performing threshold segmentation on the bright point gray value, namely comparing each bright point gray value with the gray threshold respectively, and if the current bright point gray value is smaller than the gray threshold, indicating that the main light source responding to the bright point currently is the first light wave, determining that the foreign matter type responding to the bright point corresponding to the current bright point gray value is dust; if the gray value of the current bright point is greater than the gray threshold, it is determined that the main light source of the current response bright point is the second light wave, and the foreign object type of the response bright point corresponding to the gray value of the current bright point is a foreign object defect.
304. Detecting the position of the LCD foreign matter defect;
and filtering the response bright spots judged as dust in the LCD image to be detected, wherein the remaining response bright spots in the LCD image to be detected are the response bright spots of the foreign matter defect, and the position of the foreign matter defect can be judged to be the position of the remaining response bright spots.
The following beneficial effects can be seen from the third embodiment:
the method comprises the steps of extracting an interested region of an LCD module image by adopting a threshold segmentation algorithm, filtering other non-target detection objects except the LCD module to obtain an LCD image to be detected, comparing a bright dot gray value with a gray threshold value in the LCD image to be detected, distinguishing a response bright dot corresponding to dust and a response bright dot corresponding to a foreign matter defect, filtering the response bright dot corresponding to the dust, and detecting the position of the response bright dot corresponding to the foreign matter defect. Compared with the prior art, the scheme filters other non-target detection objects except the response bright spots, reduces the interference to detection, distinguishes the response bright spots in the LCD image to be detected through the gray threshold, accurately determines the position of the foreign matter defect after removing the distinguished response bright spots corresponding to the dust, improves the detection accuracy, and has low detection implementation difficulty and high detection efficiency.
Example four
Corresponding to the embodiment of the application function realization method, the application also provides an electronic device for executing the LCD foreign matter defect detection method and a corresponding embodiment.
Fig. 4 is a schematic structural diagram of an electronic device shown in an embodiment of the present application.
Referring to fig. 4, the electronic device 1000 includes a memory 1010 and a processor 1020.
The Processor 1020 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 1010 may include various types of storage units, such as system memory, Read Only Memory (ROM), and permanent storage. Wherein the ROM may store static data or instructions that are needed by the processor 1020 or other modules of the computer. The persistent storage device may be a read-write storage device. The persistent storage may be a non-volatile storage device that does not lose stored instructions and data even after the computer is powered off. In some embodiments, the persistent storage device employs a mass storage device (e.g., magnetic or optical disk, flash memory) as the persistent storage device. In other embodiments, the permanent storage may be a removable storage device (e.g., floppy disk, optical drive). The system memory may be a read-write memory device or a volatile read-write memory device, such as a dynamic random access memory. The system memory may store instructions and data that some or all of the processors require at runtime. Further, the memory 1010 may include any combination of computer-readable storage media, including various types of semiconductor memory chips (DRAM, SRAM, SDRAM, flash memory, programmable read-only memory), magnetic and/or optical disks, among others. In some embodiments, memory 1010 may include a removable storage device that is readable and/or writable, such as a Compact Disc (CD), a read-only digital versatile disc (e.g., DVD-ROM, dual layer DVD-ROM), a read-only Blu-ray disc, an ultra-density optical disc, a flash memory card (e.g., SD card, min SD card, Micro-SD card, etc.), a magnetic floppy disc, or the like. Computer-readable storage media do not contain carrier waves or transitory electronic signals transmitted by wireless or wired means.
The memory 1010 has stored thereon executable code that, when processed by the processor 1020, may cause the processor 1020 to perform some or all of the methods described above.
The aspects of the present application have been described in detail hereinabove with reference to the accompanying drawings. In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments. Those skilled in the art should also appreciate that the acts and modules referred to in the specification are not necessarily required in the present application. In addition, it can be understood that the steps in the method of the embodiment of the present application may be sequentially adjusted, combined, and deleted according to actual needs, and the modules in the device of the embodiment of the present application may be combined, divided, and deleted according to actual needs.
Furthermore, the method according to the present application may also be implemented as a computer program or computer program product comprising computer program code instructions for performing some or all of the steps of the above-described method of the present application.
Alternatively, the present application may also be embodied as a non-transitory machine-readable storage medium (or computer-readable storage medium, or machine-readable storage medium) having stored thereon executable code (or a computer program, or computer instruction code) which, when executed by a processor of an electronic device (or electronic device, server, etc.), causes the processor to perform part or all of the various steps of the above-described method according to the present application.
It should be noted that the black and white industrial camera has better imaging quality than the color industrial camera, and will be exemplified below. For example, for a color industrial camera and a black and white industrial camera using the same type of sensor, the essential differences are: a layer of Bayer ("bayer") filters (R, G and B filters) are additionally arranged in front of a sensor of the color industrial camera, three pixels are used for receiving information of R, G and B components of the same point, and then RGB information of the point is obtained through processing of an internal algorithm of the camera; and the sensor of the black and white industrial camera has no optical filter, and a single pixel senses the information of a single point. The difference point enables the black-and-white industrial camera not to keep the color information of the image, and can restore the gray scale of each pixel in the image more truly, so that the imaging precision of the black-and-white industrial camera is higher.
Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the applications disclosed herein may be implemented as electronic hardware, computer software, or combinations of both.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems and methods according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
Having described embodiments of the present application, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen in order to best explain the principles of the embodiments, the practical application, or improvements made to the technology in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
Claims (10)
1. A method for inspecting an LCD module, comprising:
providing a first light wave and a second light wave, wherein the first light wave is emitted by a surface light source, the first light wave is any one of three primary colors, a primary color filter is any one of three primary color filters in a light filtering device, the second light wave is emitted by a backlight light source, and the second light wave comprises at least one primary color light different from the first light wave;
switching a first primary color filter according to the primary color of the first light wave;
shooting the LCD module through the first primary color filter by a black and white industrial camera to obtain a first LCD module image;
switching a second primary color filter according to the primary color of the second light wave;
and shooting the LCD module through the second primary color filter by the black-and-white industrial camera to obtain a second LCD module image.
2. The method of claim 1, further comprising:
respectively extracting interested areas of each LCD module image to obtain a corresponding LCD image to be detected, wherein the LCD image to be detected comprises at least one response bright spot;
acquiring a bright point gray value corresponding to at least one response bright point in the LCD image to be detected;
and performing threshold segmentation on the bright point gray values respectively corresponding to at least one response bright point by using a gray threshold, and determining a foreign matter type corresponding to at least one response bright point in each LCD module image, wherein the foreign matter type comprises dust and a foreign matter defect.
3. The method of claim 1,
the switching of the second primary color filter according to the primary color of the second light wave comprises:
if the second light wave is light combined by three primary colors, switching the second primary color filter into a filter with a color different from the primary color of the first light wave in the three primary color filters;
if the second light wave is light combined by any two primary colors, switching the second primary color filter into a filter with a color different from the primary color of the first light wave and consistent with any one primary color of the second light wave in a three-primary color filter;
and if the second light wave is a primary color light, switching the second primary color filter into a filter with the color consistent with the primary color of the second light wave in the three-primary color filter.
4. The method of claim 2,
the gray threshold is determined according to the numerical range of the bright point gray value corresponding to at least one response bright point in the same LCD image to be detected;
the threshold segmentation of the bright point gray values respectively corresponding to at least one response bright point by using the gray threshold comprises the following steps:
and comparing the gray value of each bright point with the gray threshold value respectively.
5. The method of claim 4,
the determining the type of the foreign matter corresponding to at least one response bright point in each LCD module image comprises the following steps:
if the gray value of the current bright point is smaller than the gray threshold, judging that the type of the foreign matter responding to the bright point corresponding to the gray value of the current bright point is the dust;
and if the gray value of the current bright point is larger than the gray threshold, judging that the type of the foreign matter of the response bright point corresponding to the gray value of the current bright point is the foreign matter defect.
6. The method of claim 5,
after determining the foreign matter type corresponding to at least one response bright point in each LCD module image, the method comprises the following steps:
and filtering the response bright point which is judged to be the dust in the LCD image to be detected.
7. The method of claim 1,
before the LCD module is shot by the black and white industrial camera, the method further comprises the following steps:
the LCD module is lightened through the backlight light source and the surface polishing light source;
the surface light source irradiates the LCD module with an irradiation angle alpha, the irradiation angle is an included angle formed by light waves emitted by the surface light source and a normal line of a horizontal plane, and the alpha is larger than zero.
8. The method of claim 1,
the step of shooting the LCD module through the first primary color filter or the second secondary color filter by the black and white industrial camera comprises the following steps:
and shooting the front view of the screen surface of the LCD module through the first primary color filter or the second primary color filter by the black-and-white industrial camera.
9. An electronic device, comprising:
a processor; and
a memory having executable code stored thereon, which when executed by the processor, causes the processor to perform the method of any one of claims 1-8.
10. A non-transitory machine-readable storage medium having stored thereon executable code, which when executed by a processor of an electronic device, causes the processor to perform the method of any one of claims 1-8.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110496483.9A CN113295710A (en) | 2021-05-07 | 2021-05-07 | Method for detecting LCD module, electronic equipment and storage medium |
| CN202210488527.8A CN114965498A (en) | 2021-05-07 | 2022-05-06 | Method for detecting LCD module, electronic equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110496483.9A CN113295710A (en) | 2021-05-07 | 2021-05-07 | Method for detecting LCD module, electronic equipment and storage medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113295710A true CN113295710A (en) | 2021-08-24 |
Family
ID=77321025
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110496483.9A Pending CN113295710A (en) | 2021-05-07 | 2021-05-07 | Method for detecting LCD module, electronic equipment and storage medium |
| CN202210488527.8A Pending CN114965498A (en) | 2021-05-07 | 2022-05-06 | Method for detecting LCD module, electronic equipment and storage medium |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210488527.8A Pending CN114965498A (en) | 2021-05-07 | 2022-05-06 | Method for detecting LCD module, electronic equipment and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (2) | CN113295710A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114881958A (en) * | 2022-04-29 | 2022-08-09 | 深圳市青虹激光科技有限公司 | Cutting edge detection method, system and computer readable storage medium |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6427128B1 (en) * | 1999-04-22 | 2002-07-30 | Satake Corporation | Apparatus and method for evaluating quality of granular object |
| CN101743503A (en) * | 2007-07-24 | 2010-06-16 | 夏普株式会社 | Liquid crystal display device and its manufacturing method |
| CN109119009A (en) * | 2017-06-26 | 2019-01-01 | 深圳回收宝科技有限公司 | Screen defect inspection method, detection device, system and storage medium |
| CN110445921A (en) * | 2019-09-06 | 2019-11-12 | 东北大学 | A kind of Mobile phone screen backlight foreign matter defect diagnostic method and device based on machine vision |
| CN110441323A (en) * | 2019-07-11 | 2019-11-12 | 大族激光科技产业集团股份有限公司 | The method for polishing and system of product surface |
| CN111982931A (en) * | 2020-08-27 | 2020-11-24 | 惠州高视科技有限公司 | High-precision wafer surface defect detection device and detection method thereof |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100625581B1 (en) * | 2005-05-12 | 2006-09-20 | 주식회사 인터크리에이티브 | LCD automatic gravity inspection device and method |
| KR101286534B1 (en) * | 2008-02-29 | 2013-07-16 | 엘지디스플레이 주식회사 | inspection apparatus of Liquid crystal display apparatus and inspection method using the same |
| WO2014017066A1 (en) * | 2012-07-27 | 2014-01-30 | シャープ株式会社 | Method of inspecting liquid crystal display panel, and liquid crystal display panel inspection device |
| CN107390393B (en) * | 2017-07-24 | 2020-09-22 | 惠州高视科技有限公司 | Re-judgment layering method after defect detection of liquid crystal module |
| CN107767377B (en) * | 2017-11-09 | 2024-02-06 | 高视科技(苏州)股份有限公司 | Liquid crystal display defect and dust distinguishing method and detection device based on binocular vision system |
| CN108646445B (en) * | 2018-05-03 | 2021-03-16 | 武汉精测电子集团股份有限公司 | Defect detection device that self-adaptation is shaded |
| CN109752394B (en) * | 2019-01-28 | 2021-10-29 | 凌云光技术股份有限公司 | High-precision detection method and system for defects of display screen |
| CN110007493B (en) * | 2019-03-28 | 2021-08-20 | 凌云光技术股份有限公司 | Method for detecting broken bright spots in liquid crystal display screen |
| CN112394064B (en) * | 2020-10-22 | 2021-10-29 | 高视科技(苏州)有限公司 | Point-line measuring method for screen defect detection |
-
2021
- 2021-05-07 CN CN202110496483.9A patent/CN113295710A/en active Pending
-
2022
- 2022-05-06 CN CN202210488527.8A patent/CN114965498A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6427128B1 (en) * | 1999-04-22 | 2002-07-30 | Satake Corporation | Apparatus and method for evaluating quality of granular object |
| CN101743503A (en) * | 2007-07-24 | 2010-06-16 | 夏普株式会社 | Liquid crystal display device and its manufacturing method |
| CN109119009A (en) * | 2017-06-26 | 2019-01-01 | 深圳回收宝科技有限公司 | Screen defect inspection method, detection device, system and storage medium |
| CN110441323A (en) * | 2019-07-11 | 2019-11-12 | 大族激光科技产业集团股份有限公司 | The method for polishing and system of product surface |
| CN110445921A (en) * | 2019-09-06 | 2019-11-12 | 东北大学 | A kind of Mobile phone screen backlight foreign matter defect diagnostic method and device based on machine vision |
| CN111982931A (en) * | 2020-08-27 | 2020-11-24 | 惠州高视科技有限公司 | High-precision wafer surface defect detection device and detection method thereof |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114881958A (en) * | 2022-04-29 | 2022-08-09 | 深圳市青虹激光科技有限公司 | Cutting edge detection method, system and computer readable storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114965498A (en) | 2022-08-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112798613B (en) | LCD foreign matter defect color imaging detection method, electronic equipment and storage medium | |
| TWI626440B (en) | Defect detection apparatus, defect detection method and program product | |
| US8391585B2 (en) | Defect detecting device, defect detecting method, image sensor device, image sensor module, defect detecting program, and computer-readable recording medium | |
| CN112858318B (en) | Method for distinguishing screen foreign matter defect from dust, electronic equipment and storage medium | |
| US8107716B2 (en) | Defect detecting apparatus and method | |
| CN113781396B (en) | Screen defect detection method, device, equipment and storage medium | |
| JPH1019731A (en) | Method for inspecting display screen | |
| CN113295710A (en) | Method for detecting LCD module, electronic equipment and storage medium | |
| KR101022187B1 (en) | Substrate inspection device | |
| KR20070101669A (en) | Vision Inspection System and Inspection Method of Mounting Plate Assembly | |
| JP2007248051A (en) | Defect inspection method for object surface | |
| CN112987356B (en) | Liquid crystal display panel bottom foreign matter filtering device | |
| JP2008014842A (en) | Spot defect detection method and apparatus | |
| CN113628212A (en) | Defective polarizer identification method, electronic device, and storage medium | |
| JP2009236760A (en) | Image detection device and inspection apparatus | |
| JP5257063B2 (en) | Defect detection method and defect detection apparatus | |
| JP2009281759A (en) | Color filter defect inspection method, inspection apparatus, and color filter manufacturing method using it | |
| CN113484333B (en) | Method for distinguishing foreign matter defect of multi-layer structure screen, electronic device and storage medium | |
| JP4967132B2 (en) | Defect inspection method for object surface | |
| CN112666733B (en) | LCD gray scale picture offline defect detection method, electronic equipment and storage medium | |
| JPH08152412A (en) | Appearance inspection device | |
| CN110458840B (en) | Method, system and terminal equipment for reducing panel defect over-detection rate | |
| JP2004226212A (en) | Method and device for detecting pinhole defect and contamination defect on transparent object | |
| JP3216669B2 (en) | Optical disk defect inspection method | |
| JP2009036696A (en) | Image inspecting apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20210824 |
|
| WD01 | Invention patent application deemed withdrawn after publication |