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CN113218872B - A method for simultaneous identification of multiple parameters of optical properties of high-temperature translucent materials - Google Patents

A method for simultaneous identification of multiple parameters of optical properties of high-temperature translucent materials Download PDF

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CN113218872B
CN113218872B CN202110377004.1A CN202110377004A CN113218872B CN 113218872 B CN113218872 B CN 113218872B CN 202110377004 A CN202110377004 A CN 202110377004A CN 113218872 B CN113218872 B CN 113218872B
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李可夫
朱泽宇
于薇
周建华
朱春英
丁玎
吴小芳
谢浪
齐宏
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Abstract

本发明公开了一种高温半透明材料光学特性多参数同时辨识方法，属于高温材料热物性测量技术领域。本发明解决现有高温情况下光谱透过率测量受杂散光、温度均匀性等影响而具有难以预测的复杂性的问题。本发明建立基于优化LOA算法的反演模型来计算高温情况下半透明材料高温光谱方向表观发射率，该方法计算得到的表观方向发射率与实验的测量值吻合较好。

Figure 202110377004

The invention discloses a simultaneous multi-parameter identification method for optical properties of high-temperature translucent materials, which belongs to the technical field of thermal physical property measurement of high-temperature materials. The invention solves the problem that the spectral transmittance measurement under the existing high temperature is affected by stray light, temperature uniformity and the like, which is difficult to predict. The invention establishes an inversion model based on an optimized LOA algorithm to calculate the apparent emissivity in the high temperature spectral direction of the translucent material under high temperature conditions, and the apparent directional emissivity calculated by the method is in good agreement with the experimental measurement value.

Figure 202110377004

Description

一种高温半透明材料光学特性多参数同时辨识方法A method for simultaneous identification of multiple parameters of optical properties of high-temperature translucent materials

技术领域technical field

本发明涉及一种高温半透明材料光学特性多参数同时辨识方法，属于高温材料热物性测量技术领域。The invention relates to a multi-parameter simultaneous identification method for optical properties of high-temperature translucent materials, and belongs to the technical field of thermal physical property measurement of high-temperature materials.

背景技术Background technique

半透明材料在很多领域有广泛应用，如红外光学探测中的窗口材料。红外光学探测具有空间分辨率高、灵敏度高、抗干扰能力强、复杂背景条件下工作能力强等优点，因此红外成像制导技术得到了广泛应用。随着飞行器飞行速度越来越快，制导环境变得越来越恶劣，传统的制导技术已不能满足要求。Translucent materials are widely used in many fields, such as window materials in infrared optical detection. Infrared optical detection has the advantages of high spatial resolution, high sensitivity, strong anti-interference ability, and strong working ability under complex background conditions, so infrared imaging guidance technology has been widely used. As the aircraft flies faster and faster, the guidance environment becomes more and more harsh, and the traditional guidance technology can no longer meet the requirements.

受高速流场摩擦对光学窗口的气动加热影响，光学窗口会产生高温和变形，导致折射率、吸收系数及散射系数等光学特性参数分布不均匀，在视场内引入光程差，严重影响成像质量；高温窗口的热辐射效应形成辐射干扰，甚至淹没目标信号而不能接收目标辐射，严重降低制导精度。因此，需要对半透明光学窗口介质的折射率、吸收系数及散射系数等光谱物性同时进行准确测量。Affected by the aerodynamic heating of the optical window by the friction of the high-speed flow field, the optical window will generate high temperature and deformation, resulting in uneven distribution of optical parameters such as refractive index, absorption coefficient and scattering coefficient, and the optical path difference is introduced in the field of view, which seriously affects the imaging. Quality; the thermal radiation effect of the high temperature window forms radiation interference, and even drowns the target signal and cannot receive the target radiation, which seriously reduces the guidance accuracy. Therefore, it is necessary to accurately measure the spectral properties such as the refractive index, absorption coefficient and scattering coefficient of the semi-transparent optical window medium at the same time.

基于反演技术的辐射物性参数重建具有高度非线性、不适定性和低效性等问题，目前尚没有一种反演技术和重建模型能够有效解决多参数重建问题，特别是对于多参数场的同时重建，其病态性、多值性及串扰问题至今未得到彻底解决。The reconstruction of radiation physical property parameters based on inversion technology has problems such as high nonlinearity, ill-posedness and inefficiency. At present, there is no inversion technology and reconstruction model that can effectively solve the problem of multi-parameter reconstruction, especially for the simultaneous multi-parameter field. The problems of ill-conditioned, multi-valued and crosstalk have not been completely solved yet.

发明内容SUMMARY OF THE INVENTION

本发明为了解决现有高温情况下光谱透过率测量受杂散光、温度均匀性等影响而具有难以预测的复杂性的问题，提供一种高温半透明材料光学特性多参数同时辨识方法。In order to solve the problem of unpredictable complexity of spectral transmittance measurement under the influence of stray light, temperature uniformity, etc. under the condition of high temperature, the present invention provides a simultaneous identification method of multi-parameter optical characteristics of high temperature translucent material.

本发明的技术方案：Technical scheme of the present invention:

一种高温半透明材料光学特性多参数同时辨识方法，该方法包括以下步骤：A multi-parameter simultaneous identification method for optical properties of a high-temperature translucent material, the method comprises the following steps:

步骤1，通过实验方法获得角度为θ1,θ2,θ3,θ4半透明材料光谱方向表观发射率测量值εi(λ,θ),i＝1,2,3,4；Step 1, obtain the measured value of the apparent emissivity ε i (λ, θ), i=1, 2, 3, 4 in the spectral direction of the semi-transparent material with angles θ 1 , θ 2 , θ 3 , θ 4 by an experimental method;

步骤2，根据辐射传输逆问题求解算法，假设半透明试件的光谱折射率为n′λ、光谱吸收系数为κ′λ和光谱漫反射率为ρ′dλ，通过求解辐射传输方程计算得到该半透明材料的光谱方向表观发射率估计值ε′i(λ,θ)；Step 2: According to the algorithm for solving the inverse radiative transfer problem, assuming that the spectral refractive index of the translucent specimen is n′ λ , the spectral absorption coefficient is κ′ λ and the spectral diffuse reflectance is ρ′ dλ , the radiative transfer equation is calculated by solving the radiation transfer equation. Estimated apparent emissivity in the spectral direction of the translucent material ε′ i (λ, θ);

步骤3，将步骤1得到的半透明材料光谱方向表观发射率测量值εi(λ,θ)和步骤2得到的半透明材料的光谱方向表观发射率估计值ε′i(λ,θ)代入如下目标函数计算公式，计算得到目标函数值Fobj，目标函数为：In step 3, the measured value of the apparent emissivity in the spectral direction of the translucent material obtained in step 1 ε i (λ, θ) and the estimated value of the apparent emissivity in the spectral direction of the translucent material obtained in step 2 ε′ i (λ, θ ) ) into the following objective function calculation formula, the objective function value F obj is obtained by calculation, and the objective function is:

Figure BDA0003011461010000021
Figure BDA0003011461010000021

步骤4，判断步骤3获得的目标函数值Fobj是否小于设定阈值ξ，若目标函数值Fobj小于或等于设定阈值ξ，则步骤2中所假设的半透明试件的光谱折射率n′λ、光谱吸收系数κ′λ和光谱漫反射率为ρ′dλ即为该半透明试件的真实光谱折射率nλ、光谱吸收系数κλ和光谱漫反射率为；Step 4, determine whether the objective function value F obj obtained in step 3 is less than the set threshold ξ, if the objective function value F obj is less than or equal to the set threshold ξ, then the assumed spectral refractive index n of the translucent specimen in step 2 ′ λ , spectral absorption coefficient κ′ λ and spectral diffuse reflectance ρ′ dλ are the true spectral refractive index n λ , spectral absorption coefficient κ λ and spectral diffuse reflectance of the translucent specimen;

若目标函数值Fobj大于设定阈值ξ，返回步骤2，根据逆问题算法更新半透明试件的光谱折射率n′λ、光谱吸收系数κ′λ和光谱漫反射率为ρ′dλ，设定值重新计算，直至步骤3中的目标函数值Fobj小于或等于设定阈值ξ，则最后更新的半透明试件的光谱折射率n′λ、光谱吸收系数κ′λ和光谱漫反射率为ρ′dλ即为该半透明试件的真实光谱折射率nλ、光谱吸收系数κλ和光谱漫反射率为ρdλ；If the objective function value F obj is greater than the set threshold ξ, go back to step 2, and update the spectral refractive index n′ λ , the spectral absorption coefficient κ′ λ and the spectral diffuse reflectance ρ′ dλ of the translucent specimen according to the inverse problem algorithm, set Recalculate the fixed value until the objective function value F obj in step 3 is less than or equal to the set threshold ξ, then the spectral refractive index n′ λ , the spectral absorption coefficient κ′ λ and the spectral diffuse reflectance of the translucent specimen are finally updated. is ρ′ dλ is the real spectral refractive index n λ , spectral absorption coefficient κ λ and spectral diffuse reflectance of the translucent specimen ρ dλ ;

步骤5，根据步骤4计算得到的半透明试件的真实光谱折射率nλ、光谱吸收系数κλ和光谱漫反射率为ρdλ，通过求解辐射传输方程计算得到该半透明材料的光谱方向表观发射率

Figure BDA0003011461010000022
完成半透明材料高温光谱方向表观发射率的测量。Step 5: According to the real spectral refractive index n λ , spectral absorption coefficient κ λ and spectral diffuse reflectance ρ dλ of the translucent specimen calculated in step 4, the spectral direction table of the translucent material is calculated by solving the radiation transfer equation. apparent emissivity
Figure BDA0003011461010000022
Complete the measurement of the apparent emissivity in the high temperature spectral direction of the translucent material.

进一步限定，在一维条件下，当介质处于稳态条件下且不考虑介质散射时，所述的步骤2中辐射传递方程为：It is further defined that, under one-dimensional conditions, when the medium is in a steady state and the scattering of the medium is not considered, the radiation transfer equation in step 2 is:

Figure BDA0003011461010000023
Figure BDA0003011461010000023

边界条件为：The boundary conditions are:

Figure BDA0003011461010000024
Figure BDA0003011461010000024

Figure BDA0003011461010000025
Figure BDA0003011461010000025

式中，θ为前向辐射、后向辐射分别与x＝0、x＝D内表面法线的夹角；In the formula, θ is the angle between the forward radiation and the backward radiation and the normal line of the inner surface of x=0 and x=D, respectively;

ρdλ为由介质入射到真空的表面漫反射率，ρ dλ is the surface diffuse reflectance incident from the medium to the vacuum,

ρsλ为由介质入射到真空的表面镜反射率，其表达式如下所示，ρ sλ is the mirror reflectivity of the surface incident from the medium to the vacuum, and its expression is as follows,

Figure BDA0003011461010000031
Figure BDA0003011461010000031

更进一步限定，步骤2中对辐射传递方程进行求解可以得到：To be further limited, the radiation transfer equation is solved in step 2 to obtain:

Figure BDA0003011461010000032
Figure BDA0003011461010000032

式中，A、B、C、D的表达式如下所示，In the formula, the expressions of A, B, C, and D are as follows,

Figure BDA0003011461010000033
Figure BDA0003011461010000033

则表观视角的光谱方向辐射强度为Then the radiant intensity in the spectral direction of the apparent viewing angle is

Figure BDA0003011461010000034
Figure BDA0003011461010000034

所以，光谱方向表观发射率估计值ε′i(λ)的表达式为，Therefore, the expression of the apparent emissivity estimate ε′ i (λ) in the spectral direction is,

Figure BDA0003011461010000035
Figure BDA0003011461010000035

式中，Ibλ(T)为实验测量温度下波长为λ的黑体光谱辐射强度。In the formula, I bλ (T) is the spectral radiation intensity of the black body with wavelength λ at the experimentally measured temperature.

进一步限定，在一维条件下，当介质处于稳态条件下且不考虑介质散射时，所述的步骤5中辐射传递方程为：It is further defined that, under one-dimensional conditions, when the medium is in a steady state and the scattering of the medium is not considered, the radiation transfer equation in step 5 is:

Figure BDA0003011461010000036
Figure BDA0003011461010000036

边界条件为：The boundary conditions are:

Figure BDA0003011461010000037
Figure BDA0003011461010000037

Figure BDA0003011461010000038
Figure BDA0003011461010000038

式中，θ为前向辐射、后向辐射分别与x＝0、x＝D内表面法线的夹角；In the formula, θ is the angle between the forward radiation and the backward radiation and the normal line of the inner surface of x=0 and x=D, respectively;

ρdλ为由介质入射到真空的表面漫反射率，ρ dλ is the surface diffuse reflectance incident from the medium to the vacuum,

ρsλ为由介质入射到真空的表面镜反射率，其表达式如式(11)所示，ρ sλ is the mirror reflectivity of the surface incident from the medium to the vacuum, and its expression is shown in formula (11),

Figure BDA0003011461010000041
Figure BDA0003011461010000041

更进一步限定，对辐射传递方程进行求解可以得到：As a further limitation, solving the radiative transfer equation yields:

Figure BDA0003011461010000042
Figure BDA0003011461010000042

式中，A、B、C、D的表达式如式(13)所示，In the formula, the expressions of A, B, C, and D are shown in formula (13),

Figure BDA0003011461010000043
Figure BDA0003011461010000043

则表观视角的光谱方向辐射强度为Then the radiant intensity in the spectral direction of the apparent viewing angle is

Figure BDA0003011461010000044
Figure BDA0003011461010000044

所以，光谱方向表观发射率估计值ε′i(λ)的表达式为，Therefore, the expression of the apparent emissivity estimate ε′ i (λ) in the spectral direction is,

Figure BDA0003011461010000045
Figure BDA0003011461010000045

式中，Ibλ(T)为实验测量温度下波长为λ的黑体光谱辐射强度。In the formula, I bλ (T) is the spectral radiation intensity of the black body with wavelength λ at the experimentally measured temperature.

本发明具有以下有益效果：本发明建立基于优化LOA算法的反演模型来计算高温情况下半透明材料高温光谱方向表观发射率，该方法计算得到的表观方向发射率与实验的测量值吻合较好，有效解决了现有高温情况下光谱透过率测量受杂散光、温度均匀性等影响而具有难以预测的复杂性的问题。The invention has the following beneficial effects: the invention establishes an inversion model based on an optimized LOA algorithm to calculate the apparent emissivity in the high temperature spectral direction of the translucent material under high temperature conditions, and the apparent directional emissivity calculated by the method is consistent with the measured value of the experiment Preferably, it effectively solves the problem of unpredictable complexity in the existing spectral transmittance measurement under high temperature conditions, which is affected by stray light, temperature uniformity, and the like.

附图说明Description of drawings

图1为半透明材料光谱方向表观发射率测量装置；Figure 1 is a device for measuring apparent emissivity in the spectral direction of translucent materials;

图2为半透明材料光谱方向表观发射率测量装置的加热结构；Fig. 2 is the heating structure of the apparent emissivity measuring device in the spectral direction of the translucent material;

图3为能量法获得的蓝宝石试样光谱法向发射率与透过率；Figure 3 is the spectral normal emissivity and transmittance of the sapphire sample obtained by the energy method;

图4为能量法获得的蓝宝石试样光谱方向发射率；Figure 4 is the spectral directional emissivity of the sapphire sample obtained by the energy method;

图5为镜反射边界条件反演算法获得的蓝宝石试样光谱吸收系数反演结果；Figure 5 shows the spectral absorption coefficient inversion results of the sapphire sample obtained by the mirror reflection boundary condition inversion algorithm;

图6为镜反射边界条件反演算法获得的蓝宝石试样光谱折射率反演结果；Figure 6 shows the spectral refractive index inversion results of the sapphire sample obtained by the mirror reflection boundary condition inversion algorithm;

图7为本发明的方法结合镜反射边界正问题模型对光谱法向发射率计算结果；Fig. 7 is the method of the present invention in conjunction with the mirror reflection boundary positive problem model to the spectral normal emissivity calculation result;

图8为漫反射边界条件反演算法获得的蓝宝石试样光谱吸收系数反演结果；Figure 8 shows the spectral absorption coefficient inversion results of the sapphire sample obtained by the diffuse reflection boundary condition inversion algorithm;

图9为漫反射边界条件反演算法获得的蓝宝石试样光谱折射率反演结果；Figure 9 shows the inversion results of the spectral refractive index of the sapphire sample obtained by the diffuse reflection boundary condition inversion algorithm;

图10为本发明的方法结合漫反射边界正问题模型对光谱方向发射率反演结果；10 is the method of the present invention combined with the diffuse reflection boundary positive problem model to the spectral direction emissivity inversion result;

图11为本发明的方法结合漫反射边界正问题模型对0°光谱方向发射率反演结果；11 is the method of the present invention combined with the diffuse reflection boundary positive problem model to the 0° spectral direction emissivity inversion result;

图12为本发明的方法结合漫反射边界正问题模型对80°光谱方向发射率反演结果。FIG. 12 shows the results of inversion of the emissivity in the 80° spectral direction by the method of the present invention combined with the diffuse reflection boundary positive problem model.

具体实施方式Detailed ways

为了使本发明的目的、技术方案及优点更加清楚明白，以下结合附图及实施例，对本发明进行进一步详细说明。应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限定本发明。In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

实施例1：Example 1:

步骤1，使用图1和图2所示的装置，通过实验方法获得角度为θ1,θ2,θ3,θ4半透明材料光谱方向表观发射率测量值εi(λ,θ),i＝1,2,3,4。Step 1, using the device shown in Figure 1 and Figure 2, obtain the measured value of the apparent emissivity ε i (λ, θ) in the spectral direction of the semi-transparent material with angles θ 1 , θ 2 , θ 3 , θ 4 through an experimental method, i=1,2,3,4.

步骤2，根据辐射传输逆问题求解算法，假设半透明试件的光谱折射率为n′λ、光谱吸收系数为κ′λ和光谱漫反射率为ρ′dλ，通过求解辐射传输方程计算得到该半透明材料的光谱方向表观发射率估计值ε′i(λ,θ)。Step 2: According to the algorithm for solving the inverse radiative transfer problem, assuming that the spectral refractive index of the translucent specimen is n′ λ , the spectral absorption coefficient is κ′ λ and the spectral diffuse reflectance is ρ′ dλ , the radiative transfer equation is calculated by solving the radiation transfer equation. Spectral direction apparent emissivity estimates for translucent materials ε′ i (λ, θ).

通过求解辐射传输方程计算得到该半透明材料的光谱法向表观发射率估计值ε′i(λ,θ)的具体方法为：The specific method for calculating the estimated spectral normal apparent emissivity ε′ i (λ, θ) of the translucent material by solving the radiation transfer equation is as follows:

在一维条件下，当介质处于稳态条件下且不考虑介质散射时，辐射传递方程为：In one-dimensional conditions, when the medium is in a steady state condition and medium scattering is not considered, the radiation transfer equation is:

Figure BDA0003011461010000051
Figure BDA0003011461010000051

边界条件为：The boundary conditions are:

Figure BDA0003011461010000052
Figure BDA0003011461010000052

Figure BDA0003011461010000053
Figure BDA0003011461010000053

式中，θ为前向辐射、后向辐射分别与x＝0、x＝D内表面法线的夹角；In the formula, θ is the angle between the forward radiation and the backward radiation and the normal line of the inner surface of x=0 and x=D, respectively;

ρdλ为由介质入射到真空的表面漫反射率，ρ dλ is the surface diffuse reflectance incident from the medium to the vacuum,

ρsλ为由介质入射到真空的表面镜反射率，其表达式如式(4)所示，ρ sλ is the mirror reflectivity of the surface incident from the medium to the vacuum, and its expression is shown in formula (4),

Figure BDA0003011461010000061
Figure BDA0003011461010000061

对辐射传递方程进行求解可以得到：Solving the radiation transfer equation yields:

Figure BDA0003011461010000062
Figure BDA0003011461010000062

式中，A、B、C、D的表达式如式(6)所示，In the formula, the expressions of A, B, C, and D are shown in formula (6),

Figure BDA0003011461010000063
Figure BDA0003011461010000063

则表观视角的光谱方向辐射强度为Then the radiant intensity in the spectral direction of the apparent viewing angle is

Figure BDA0003011461010000064
Figure BDA0003011461010000064

所以，光谱方向表观发射率估计值ε′i(λ)的表达式为，Therefore, the expression of the apparent emissivity estimate ε′ i (λ) in the spectral direction is,

Figure BDA0003011461010000065
Figure BDA0003011461010000065

式中，Ibλ(T)为实验测量温度下波长为λ的黑体光谱辐射强度。In the formula, I bλ (T) is the spectral radiation intensity of the black body with wavelength λ at the experimentally measured temperature.

步骤3，将步骤1得到的半透明材料光谱方向表观发射率测量值εi(λ,θ)和步骤2得到的半透明材料的光谱方向表观发射率估计值ε′i(λ,θ)代入如下目标函数计算公式，计算得到目标函数值Fobj；In step 3, the measured value of the apparent emissivity in the spectral direction of the translucent material obtained in step 1 ε i (λ, θ) and the estimated value of the apparent emissivity in the spectral direction of the translucent material obtained in step 2 ε′ i (λ, θ ) ) is substituted into the following objective function calculation formula, and the objective function value F obj is obtained by calculation;

Figure BDA0003011461010000066
Figure BDA0003011461010000066

步骤4，判断步骤3中的目标函数值Fobj是否小于设定阈值ξ，若是，则步骤2中所假设的半透明试件的光谱折射率为n′λ、光谱吸收系数为κ′λ和光谱漫反射率为ρ′dλ即为该半透明试件的真实光谱折射率和光谱吸收系数；若不是，则返回步骤2，根据逆问题算法更新半透明试件的光谱折射率为n′λ、光谱吸收系数为κ′λ和光谱漫反射率为ρ′dλ，设定值重新计算，直至步骤3中的目标函数值Fobj小于设定阈值ξ，得到该半透明试件的真实光谱折射率nλ、光谱吸收系数κλ和光谱漫反射率为ρdλ。Step 4, determine whether the objective function value F obj in step 3 is less than the set threshold ξ, if so, the spectral refractive index of the semitransparent specimen assumed in step 2 is n′ λ , the spectral absorption coefficient is κ′ λ and The spectral diffuse reflectance ρ′ dλ is the real spectral refractive index and spectral absorption coefficient of the translucent specimen; if not, return to step 2, and update the spectral refractive index of the translucent specimen according to the inverse problem algorithm to n′ λ , the spectral absorption coefficient is κ′ λ and the spectral diffuse reflectance is ρ′ dλ , the set value is recalculated until the objective function value F obj in step 3 is less than the set threshold ξ, and the true spectral refraction of the translucent specimen is obtained. rate n λ , spectral absorption coefficient κ λ and spectral diffuse reflectance ρ dλ .

步骤5，根据步骤四中计算得到的半透明试件的真实光谱折射率nλ、光谱吸收系数κλ和光谱漫反射率为ρdλ，通过求解辐射传输方程计算得到该半透明材料的光谱方向表观发射率

Figure BDA0003011461010000071
完成半透明材料高温光谱方向表观发射率的测量。Step 5: According to the true spectral refractive index n λ , spectral absorption coefficient κ λ and spectral diffuse reflectance ρ dλ of the translucent specimen calculated in step 4, the spectral direction of the translucent material is calculated by solving the radiation transfer equation. apparent emissivity
Figure BDA0003011461010000071
Complete the measurement of the apparent emissivity in the high temperature spectral direction of the translucent material.

通过求解辐射传输方程计算得到该半透明材料的光谱方向表观发射率

Figure BDA0003011461010000072
具体方法为：The apparent emissivity in the spectral direction of the translucent material is calculated by solving the radiative transfer equation
Figure BDA0003011461010000072
The specific method is:

在一维条件下，当介质处于稳态条件下且不考虑介质散射时，辐射传递方程为：In one-dimensional conditions, when the medium is in a steady state condition and medium scattering is not considered, the radiation transfer equation is:

Figure BDA0003011461010000073
Figure BDA0003011461010000073

边界条件为：The boundary conditions are:

Figure BDA0003011461010000074
Figure BDA0003011461010000074

Figure BDA0003011461010000075
Figure BDA0003011461010000075

式中，θ为前向辐射、后向辐射分别与x＝0、x＝D内表面法线的夹角；In the formula, θ is the angle between the forward radiation and the backward radiation and the normal line of the inner surface of x=0 and x=D, respectively;

ρdλ为由介质入射到真空的表面漫反射率，ρ dλ is the surface diffuse reflectance incident from the medium to the vacuum,

ρsλ为由介质入射到真空的表面镜反射率，其表达式如式(11)所示，ρ sλ is the mirror reflectivity of the surface incident from the medium to the vacuum, and its expression is shown in formula (11),

Figure BDA0003011461010000076
Figure BDA0003011461010000076

对辐射传递方程进行求解可以得到：Solving the radiation transfer equation yields:

Figure BDA0003011461010000077
Figure BDA0003011461010000077

式中，A、B、C、D的表达式如式(13)所示，In the formula, the expressions of A, B, C, and D are shown in formula (13),

Figure BDA0003011461010000081
Figure BDA0003011461010000081

则表观视角的光谱方向辐射强度为Then the radiant intensity in the spectral direction of the apparent viewing angle is

Figure BDA0003011461010000082
Figure BDA0003011461010000082

所以，光谱方向表观发射率估计值ε′i(λ)的表达式为，Therefore, the expression of the apparent emissivity estimate ε′ i (λ) in the spectral direction is,

Figure BDA0003011461010000083
Figure BDA0003011461010000083

式中，Ibλ(T)为实验测量温度下波长为λ的黑体光谱辐射强度。In the formula, I bλ (T) is the spectral radiation intensity of the black body with wavelength λ at the experimentally measured temperature.

验证试验：Verification test:

(1)选用温度为T＝773K时，使用图1和图2所示的装置，基于能量法对蓝宝石试样的法向光谱发射率与光谱透过率进行测试，实验样品厚度为0.4mm，波长范围选为3～6μm。样品的光谱法向发射率与透过率数据如图3所示，样品的表观方向发射率的实验数据如图4所示，采用漫反射边界条件反演程序计算各方向表观发射率随波长变化的趋势相近，数值大小不同。(1) When the temperature is T=773K, the device shown in Figure 1 and Figure 2 is used to test the normal spectral emissivity and spectral transmittance of the sapphire sample based on the energy method, and the thickness of the experimental sample is 0.4mm. The wavelength range is selected to be 3 to 6 μm. The spectral normal emissivity and transmittance data of the sample are shown in Figure 3, and the experimental data of the apparent directional emissivity of the sample is shown in Figure 4. The diffuse reflection boundary condition inversion program is used to calculate the apparent emissivity in each direction. The trends of wavelength changes are similar, and the values are different.

(2)使用镜反射边界条件反演算法，基于(1)测量得到的法向发射率与透过率，对材料光谱吸收系数与折射率的反演结果，如图5和图6所示。(2) Using the mirror reflection boundary condition inversion algorithm, based on the normal emissivity and transmittance measured in (1), the inversion results of the spectral absorption coefficient and refractive index of the material are shown in Figures 5 and 6.

结合镜反射边界正问题模型，基于光谱吸收系数与折射率的反演结果，对光谱法向发射率进行计算，计算结果如图7所示，图中线条代表计算结果，点代表实验结果的误差，由图7可知，使用本发明建立基于优化LOA算法的反演模型计算得到的表观法向发射率与实验的测量值吻合较好，证明本发明提出的反演算法的合理性与可靠性。Combined with the mirror reflection boundary positive problem model, based on the inversion results of the spectral absorption coefficient and refractive index, the spectral normal emissivity is calculated. The calculation results are shown in Figure 7. The lines in the figure represent the calculation results, and the dots represent the error of the experimental results. , it can be seen from Fig. 7 that the apparent normal emissivity calculated by the inversion model based on the optimized LOA algorithm established by the present invention is in good agreement with the measured value of the experiment, which proves the rationality and reliability of the inversion algorithm proposed by the present invention. .

(3)使用漫反射边界条件反演算法，基于实验测量得到的0°、60°与80°表观方向发射率，对材料光谱吸收系、数折射率以及反射率的反演结果如图8和图9所示。(3) Using the diffuse reflection boundary condition inversion algorithm, based on the apparent directional emissivity at 0°, 60° and 80° measured by the experiment, the inversion results of the spectral absorption coefficient, number refractive index and reflectivity of the material are shown in Figure 8 and shown in Figure 9.

结合漫反射边界正问题模型，基于光谱吸收系数、折射率与反射率的反演结果，对光谱方向发射率的计算结果如图10、11和12所示，图中线条代表计算结果，点代表实验结果的误差，由图10、11和12可知，使用本发明建立基于优化LOA算法的反演模型计算得到的表观法向发射率与实验的测量值吻合较好，进一步证明本发明提出的反演算法的合理性与可靠性。Combined with the diffuse reflection boundary positive problem model, based on the inversion results of the spectral absorption coefficient, refractive index and reflectivity, the calculation results of the spectral directional emissivity are shown in Figures 10, 11 and 12. The lines in the figure represent the calculation results, and the dots represent the calculation results. The error of the experimental results can be seen from Figures 10, 11 and 12 that the apparent normal emissivity calculated by the inversion model based on the optimized LOA algorithm established by the present invention is in good agreement with the experimental measurement value, which further proves that the proposed method of the present invention The rationality and reliability of the inversion algorithm.

以上所述仅为本发明的较佳实施例而已，并不用以限制本发明，凡在本发明的精神和原则之内所作的任何修改、等同替换和改进等，均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention shall be included in the protection of the present invention. within the range.

Claims (3)

1. A method for simultaneously identifying multiple parameters of optical characteristics of a high-temperature translucent material is characterized by comprising the following steps:
step 1, obtaining an angle theta through an experimental method1,θ2,θ3,θ4Apparent emissivity measured value epsilon of semitransparent material in spectral directioni(λ,θ),i＝1,2,3,4；
Step 2, according to the inverse problem of radiation transmissionSolving algorithm, wherein the spectral refractive index of the semitransparent test piece is assumed to be n'λAnd the spectral absorption coefficient is k'λAnd diffuse reflectance of spectrum is ρ'dλCalculating to obtain an estimated value epsilon 'of apparent emissivity in the spectrum direction of the translucent material by solving a radiation transmission equation'i(λ,θ)；
Under one-dimensional conditions, when the medium is in a steady state condition and the scattering of the medium is not considered, the radiation transmission equation in step 2 is as follows:
Figure FDA0003526583660000011
the boundary conditions are as follows:
Figure FDA0003526583660000012
Figure FDA0003526583660000013
in the formula, theta is an included angle between the forward radiation and the backward radiation and a normal line of the inner surface, wherein x is 0, and x is D;
ρdλfor diffuse reflectivity of a surface incident from a medium to a vacuum,
ρsλfor the surface mirror reflectivity of the medium incident to vacuum, the expression is shown below,
Figure FDA0003526583660000014
step 3, the measured value epsilon of the apparent emissivity in the spectrum direction of the semitransparent material obtained in the step 1i(lambda, theta) and an estimate epsilon 'of the apparent emissivity in the spectral direction of the translucent material obtained in step 1'i(lambda, theta) is substituted into the following objective function calculation formula, and an objective function value F is obtained through calculationobjThe objective function is:
Figure FDA0003526583660000015
step 4, judging the objective function value F obtained in the step 3objIf it is less than set threshold value xi, if the objective function value FobjIs less than or equal to a set threshold value xi, the spectral refractive index n 'of the semitransparent test piece assumed in the step 2'λAnd spectral absorption coefficient κ'λAnd spectral diffuse reflectance ρ'dλNamely the true spectral refractive index n of the semitransparent test pieceλSpectral absorption coefficient kappaλAnd spectral diffuse reflectance ρdλ；
If the value of the objective function FobjIf the refractive index is larger than the set threshold value xi, returning to the step 2, and updating the spectrum refractive index n 'of the semitransparent test piece according to an inverse problem algorithm'λAnd spectral absorption coefficient κ'λAnd spectral diffuse reflectance ρ'dλThe set value is recalculated until the objective function value F in step 3objIs less than or equal to the set threshold value xi, the finally updated spectral refractive index n 'of the semitransparent test piece'λAnd spectral absorption coefficient κ'λAnd the diffuse reflectance of the spectrum is rho'dλNamely the true spectral refractive index n of the semitransparent test pieceλSpectral absorption coefficient kappaλAnd spectral diffuse reflectance ρdλ；
Step 5, calculating the true spectral refractive index n of the semitransparent test piece according to the step 4λSpectral absorption coefficient kappaλAnd spectral diffuse reflectance of ρdλCalculating to obtain the apparent emissivity of the translucent material in the spectral direction by solving a radiation transmission equation
Figure FDA0003526583660000021
The measurement of the apparent emissivity of the semitransparent material in the high-temperature spectral direction is completed
Under one-dimensional conditions, when the medium is in a steady state condition and the scattering of the medium is not considered, the radiation transmission equation in step 5 is:
Figure FDA0003526583660000022
the boundary conditions are as follows:
Figure FDA0003526583660000023
Figure FDA0003526583660000024
in the formula, theta is an included angle between the forward radiation and the backward radiation and a normal line of the inner surface, wherein x is 0, and x is D;
ρdλis the diffuse reflectance of the surface from the medium incident to the vacuum;
ρsλthe surface mirror reflectivity of the medium incident to the vacuum is expressed by the formula (11),
Figure FDA0003526583660000031
2. the method for simultaneously identifying multiple parameters of optical characteristics of a high-temperature translucent material according to claim 1, wherein the solution of the radiation transfer equation in the step 2 can obtain:
Figure FDA0003526583660000032
in the formula, the expression of A, B, C, D is as follows,
Figure FDA0003526583660000033
wherein L is a translucent material thickness,. mu. theta. kappa.'λIs the spectral absorption coefficient;
the apparent viewing angle has a spectral direction radiation intensity of
Figure FDA0003526583660000034
Therefore, the apparent emissivity estimated value ε 'in the spectral direction'iThe expression of (lambda) is as follows,
Figure FDA0003526583660000035
in the formula IbλAnd (T) is the radiation intensity of the black body spectrum with the wavelength of lambda at the experimental measurement temperature.
3. The method for simultaneously identifying multiple parameters of optical characteristics of high-temperature translucent materials according to claim 1, wherein solving the radiation transfer equation can obtain:
Figure FDA0003526583660000036
in the formula, A, B, C, D is expressed by the formula (13),
Figure FDA0003526583660000041
the apparent viewing angle has a spectral direction radiation intensity of
Figure FDA0003526583660000042
Therefore, the apparent emissivity estimate in the spectral direction is ε'iThe expression of (lambda) is as follows,
Figure FDA0003526583660000043
in the formula IbλAnd (T) is the radiation intensity of the black body spectrum with the wavelength of lambda at the experimental measurement temperature.
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CN102749307A (en) * 2012-07-27 2012-10-24 哈尔滨工业大学 Measuring method of optical constant of semi-transparent solid material
CN104880437A (en) * 2015-06-24 2015-09-02 哈尔滨工业大学 Semi-transparent dielectric material photo-thermal character measuring system and method
CN108362733A (en) * 2018-02-11 2018-08-03 哈尔滨工业大学 The trnaslucent materials Photothermal characterisation distribution measurement method being combined with optical chromatography based on locking phase heat wave

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CN103674888B (en) * 2013-12-24 2015-11-11 哈尔滨工业大学 High temperature semitransparent material spectrum direction apparent emissivity backstepping measurement mechanism and method
CN105203494B (en) * 2015-09-21 2018-04-24 哈尔滨工业大学 High temperature semitransparent material refractive index and absorption coefficient inversion measuring device and method
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WO2020084622A1 (en) * 2018-10-24 2020-04-30 Technion Research & Development Foundation Limited Means and methods for detection and characterization of spectrally structured, continuously changing, diffuse radiation sources

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102749307A (en) * 2012-07-27 2012-10-24 哈尔滨工业大学 Measuring method of optical constant of semi-transparent solid material
CN104880437A (en) * 2015-06-24 2015-09-02 哈尔滨工业大学 Semi-transparent dielectric material photo-thermal character measuring system and method
CN108362733A (en) * 2018-02-11 2018-08-03 哈尔滨工业大学 The trnaslucent materials Photothermal characterisation distribution measurement method being combined with optical chromatography based on locking phase heat wave

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