CN113192981B - A kind of preparation method of TFT substrate, display device and TFT substrate - Google Patents
A kind of preparation method of TFT substrate, display device and TFT substrate Download PDFInfo
- Publication number
- CN113192981B CN113192981B CN202110396587.2A CN202110396587A CN113192981B CN 113192981 B CN113192981 B CN 113192981B CN 202110396587 A CN202110396587 A CN 202110396587A CN 113192981 B CN113192981 B CN 113192981B
- Authority
- CN
- China
- Prior art keywords
- layer
- metal layer
- via hole
- drain
- anode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 68
- 238000002360 preparation method Methods 0.000 title claims abstract description 6
- 229910052751 metal Inorganic materials 0.000 claims abstract description 168
- 239000002184 metal Substances 0.000 claims abstract description 168
- 238000000034 method Methods 0.000 claims abstract description 45
- 238000005530 etching Methods 0.000 claims abstract description 38
- 230000008569 process Effects 0.000 claims abstract description 30
- 239000003990 capacitor Substances 0.000 claims abstract description 24
- 238000003860 storage Methods 0.000 claims abstract description 24
- 238000000059 patterning Methods 0.000 claims abstract description 16
- 238000002161 passivation Methods 0.000 claims description 26
- 230000004888 barrier function Effects 0.000 claims description 25
- 239000010409 thin film Substances 0.000 claims description 9
- 238000005240 physical vapour deposition Methods 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- 238000009826 distribution Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 7
- 238000005229 chemical vapour deposition Methods 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- 230000009286 beneficial effect Effects 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000000844 transformation Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/481—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0231—Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1216—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/123—Connection of the pixel electrodes to the thin film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/131—Interconnections, e.g. wiring lines or terminals
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
本案是以申请日为2018-03-21,申请号为201810234371.4,名称为“一种TFT阵列基板、显示装置及TFT阵列基板的制备方法”的发明专利为母案而进行的分案申请。This case is a divisional application based on the invention patent with the application date of 2018-03-21, the application number 201810234371.4, and the title "A TFT array substrate, display device, and method for preparing a TFT array substrate".
技术领域technical field
本发明涉及显示技术领域,尤其涉及一种TFT基板、显示装置及TFT基板的制备方法。The invention relates to the field of display technology, in particular to a TFT substrate, a display device and a preparation method of the TFT substrate.
背景技术Background technique
由于显示屏始终有高清的要求,这就要求像素面积不断减小,以增大像素的分布密度(PPI)。近年来,显示面板的像素密度(PPI)的提高一般受限于像素结构中薄膜晶体管(TFT)的尺寸及布线间距,通过减小TFT的尺寸大小以及布线间距可提高PPI。例如,通过共用电极的方法来缩减布线间距,达到提高PPI的效果。然而,像素面积不断减小,必然会导致工艺的复杂度提高、TFT器件存储电容不断降低,甚至使TFT器件的可靠性难以保证。Since the display screen always has high-definition requirements, this requires the pixel area to be continuously reduced to increase the pixel distribution density (PPI). In recent years, the improvement of the pixel density (PPI) of the display panel is generally limited by the size and wiring pitch of the thin film transistor (TFT) in the pixel structure, and the PPI can be improved by reducing the size of the TFT and the wiring pitch. For example, the method of sharing electrodes is used to reduce the wiring pitch to achieve the effect of improving PPI. However, the continuous reduction of the pixel area will inevitably lead to the increase of the complexity of the process, the continuous reduction of the storage capacity of the TFT device, and even make it difficult to guarantee the reliability of the TFT device.
发明内容Contents of the invention
本发明所要解决的技术问题是:提供一种TFT基板、显示装置及TFT基板的制备方法,该TFT阵列基板具有双层存储电容结构,可在保证TFT器件的存储电容的容量一定以及保证TFT器件可靠性的前提下,减小像素面积,提高显示面板的PPI,同时增加版图设计的灵活性。The technical problem to be solved by the present invention is to provide a TFT substrate, a display device, and a method for preparing the TFT substrate. The TFT array substrate has a double-layer storage capacitor structure, which can reduce the pixel area, improve the PPI of the display panel, and increase the flexibility of layout design while ensuring a constant capacity of the storage capacitor of the TFT device and ensuring the reliability of the TFT device.
为了解决上述技术问题,本发明采用的技术方案为:In order to solve the problems of the technologies described above, the technical solution adopted in the present invention is:
一种TFT阵列基板,包括第一金属层、有源层、第三金属层和辅助金属层;所述第一金属层形成栅极,所述第三金属层形成源极和漏极,所述源极和漏极之间的有源层为沟道区域;所述第三金属层位于所述第一金属层的上方,所述辅助金属层位于所述第一金属层和第三金属层之间,所述第一金属层、第三金属层和辅助金属层之间通过绝缘层隔开;所述第一金属层、辅助金属层与夹在所述第一金属层和辅助金属层之间的绝缘层构成第一存储电容;所述第三金属层、辅助金属层与夹在所述第三金属层和辅助金属层之间的绝缘层构成第二存储电容。A TFT array substrate comprising a first metal layer, an active layer, a third metal layer and an auxiliary metal layer; the first metal layer forms a gate, the third metal layer forms a source and a drain, the active layer between the source and the drain is a channel region; the third metal layer is located above the first metal layer, the auxiliary metal layer is located between the first metal layer and the third metal layer, and the first metal layer, the third metal layer and the auxiliary metal layer are separated by an insulating layer; The insulating layer between the layers forms a first storage capacitor; the third metal layer, the auxiliary metal layer, and the insulating layer sandwiched between the third metal layer and the auxiliary metal layer form a second storage capacitor.
本发明采用的另一技术方案为:Another technical scheme that the present invention adopts is:
一种显示装置,包括上述的TFT阵列基板。A display device includes the above-mentioned TFT array substrate.
本发明采用的另一技术方案为:Another technical scheme that the present invention adopts is:
一种TFT阵列基板的制备方法,包括如下步骤:A method for preparing a TFT array substrate, comprising the steps of:
步骤1:在基板上依次形成栅极、栅极绝缘层、有源层和刻蚀阻挡层,所述栅极由第一金属层形成;Step 1: sequentially forming a gate, a gate insulating layer, an active layer and an etching barrier layer on the substrate, the gate being formed by a first metal layer;
步骤2:在所述刻蚀阻挡层上形成辅助金属层;Step 2: forming an auxiliary metal layer on the etching barrier layer;
步骤3:在所述刻蚀阻挡层和辅助金属层上形成钝化层;Step 3: forming a passivation layer on the etching barrier layer and the auxiliary metal layer;
步骤4:通过一次构图工艺同时对钝化层和刻蚀阻挡层图案化,形成均与有源层连接的第一过孔和第二过孔;Step 4: Simultaneously pattern the passivation layer and the etching barrier layer through a patterning process to form a first via hole and a second via hole connected to the active layer;
步骤5:在所述钝化层上形成第三金属层,所述第三金属层通过所述第一过孔和第二过孔与所述有源层连接;所述第三金属层在所述第一过孔和第二过孔处分别形成源极和漏极。Step 5: forming a third metal layer on the passivation layer, the third metal layer is connected to the active layer through the first via hole and the second via hole; the third metal layer forms a source electrode and a drain electrode at the first via hole and the second via hole respectively.
本发明的有益效果在于:The beneficial effects of the present invention are:
本发明提供的TFT阵列基板,在形成栅极的第一金属层和形成源漏极的第三金属层之间增加辅助金属层,并且在三个金属层之间形成双层存储电容结构,这样在保证TFT器件的存储电容的容量一定以及保证TFT器件可靠性的前提下,可以减小像素面积,提高显示面板的PPI,同时增加版图设计的灵活性;此外,将辅助金属层设置在第一金属层和第三金属层之间,可以使辅助金属层上方和下方的绝缘层通过一次构图工艺同时完成图案化,这样可以节约一张掩膜版、减少一道构图工艺的曝光、刻蚀和剥离等制程,节约制程成本。In the TFT array substrate provided by the present invention, an auxiliary metal layer is added between the first metal layer forming the gate and the third metal layer forming the source and drain, and a double-layer storage capacitor structure is formed between the three metal layers, so that the pixel area can be reduced, the PPI of the display panel can be improved, and the flexibility of layout design can be increased under the premise of ensuring a certain storage capacity of the TFT device and the reliability of the TFT device; in addition, the auxiliary metal layer is arranged between the first metal layer and the third metal layer, so that the insulating layers above and below the auxiliary metal layer can be patterned simultaneously through a patterning process. , which can save a mask, reduce the exposure, etching and stripping process of a patterning process, and save the process cost.
附图说明Description of drawings
图1所示为本发明实施例一的一种TFT阵列基板的结构示意图;FIG. 1 is a schematic structural diagram of a TFT array substrate according to Embodiment 1 of the present invention;
图2所示为本发明实施例二的一种TFT阵列基板的制备方法的步骤1-4的制程图;FIG. 2 is a process diagram of steps 1-4 of a method for preparing a TFT array substrate according to Embodiment 2 of the present invention;
图3所示为本发明实施例二的一种TFT阵列基板的制备方法的步骤5-7的制程图;FIG. 3 is a process diagram of steps 5-7 of a method for preparing a TFT array substrate according to Embodiment 2 of the present invention;
图4所示为本发明实施例二的一种TFT阵列基板的制备方法的步骤8-10的制程图;FIG. 4 is a process diagram of steps 8-10 of a method for preparing a TFT array substrate according to Embodiment 2 of the present invention;
图5所示为本发明实施例三的一种AMOLED显示器件的等效电路图;FIG. 5 is an equivalent circuit diagram of an AMOLED display device according to Embodiment 3 of the present invention;
图6所示为本发明实施例三的一种AMOLED显示器件布线设计版图;FIG. 6 shows a wiring design layout of an AMOLED display device according to Embodiment 3 of the present invention;
图7所示为本发明实施例三的一种AMOLED显示器件的双层电容的结构示意图;FIG. 7 is a schematic structural diagram of a double-layer capacitor of an AMOLED display device according to Embodiment 3 of the present invention;
标号说明:Label description:
1、基板;2、第一金属层;3、栅极绝缘层;4、有源层;5、刻蚀阻挡层;6、辅助金属层;7、钝化层;8、第一过孔;9、第二过孔;10、第三金属层;11、源极;12、漏极;13、平坦化层;14、第三过孔;15、阳极;16、第四绝缘层;17、第四过孔。1. Substrate; 2. First metal layer; 3. Gate insulating layer; 4. Active layer; 5. Etching barrier layer; 6. Auxiliary metal layer; 7. Passivation layer; 8. First via hole; 9. Second via hole; 10. Third metal layer; 11. Source electrode; 12. Drain electrode; 13. Planarization layer; 14. Third via hole;
具体实施方式Detailed ways
为详细说明本发明的技术内容、所实现目的及效果,以下结合实施方式并配合附图予以说明。In order to describe the technical content, achieved goals and effects of the present invention in detail, the following descriptions will be made in conjunction with the embodiments and accompanying drawings.
本发明最关键的构思在于:在形成栅极的第一金属层和形成源漏极的第三金属层之间增加辅助金属层,并且在三个金属层之间形成双层存储电容结构,这样在保证TFT器件的存储电容的容量一定的情况下,可以减小像素面积,提高PPI;此外,将辅助金属层设置在第一金属层和第三金属层之间,可以使辅助金属层上方和下方的绝缘层通过一次构图工艺同时完成图案化。The most critical idea of the present invention is: an auxiliary metal layer is added between the first metal layer forming the gate and the third metal layer forming the source and drain, and a double-layer storage capacitor structure is formed between the three metal layers, so that the pixel area can be reduced and the PPI can be improved while ensuring a certain storage capacitor capacity of the TFT device; in addition, the auxiliary metal layer is arranged between the first metal layer and the third metal layer, so that the insulating layers above and below the auxiliary metal layer can be patterned simultaneously through a single patterning process.
本发明提供一种TFT阵列基板,包括第一金属层、有源层、第三金属层和辅助金属层;所述第一金属层形成栅极,所述第三金属层形成源极和漏极,所述源极和漏极之间的有源层为沟道区域;所述第三金属层位于所述第一金属层的上方,所述辅助金属层位于所述第一金属层和第三金属层之间,所述第一金属层、第三金属层和辅助金属层之间通过绝缘层隔开;所述第一金属层、辅助金属层与夹在所述第一金属层和辅助金属层之间的绝缘层构成第一存储电容;所述第三金属层、辅助金属层与夹在所述第三金属层和辅助金属层之间的绝缘层构成第二存储电容。The present invention provides a TFT array substrate, comprising a first metal layer, an active layer, a third metal layer and an auxiliary metal layer; the first metal layer forms a gate, the third metal layer forms a source and a drain, and the active layer between the source and drain is a channel region; the third metal layer is located above the first metal layer, the auxiliary metal layer is located between the first metal layer and the third metal layer, and the first metal layer, the third metal layer and the auxiliary metal layer are separated by an insulating layer; The insulating layer between the auxiliary metal layers constitutes a first storage capacitor; the third metal layer, the auxiliary metal layer and the insulating layer sandwiched between the third metal layer and the auxiliary metal layer constitute a second storage capacitor.
从上述描述可知,本发明的有益效果在于:As can be seen from the foregoing description, the beneficial effects of the present invention are:
本发明提供的TFT阵列基板,在形成栅极的第一金属层和形成源漏极的第三金属层之间增加辅助金属层,并且在三个金属层之间形成双层存储电容结构,这样在保证TFT器件的存储电容的容量一定以及保证TFT器件可靠性的前提下,可以减小像素面积,提高显示面板的PPI,同时增加版图设计的灵活性;此外,将辅助金属层设置在第一金属层和第三金属层之间,可以使辅助金属层上方和下方的绝缘层通过一次构图工艺同时完成图案化,这样可以节约一张掩膜版、减少一道构图工艺的曝光、刻蚀和剥离等制程,节约制程成本。In the TFT array substrate provided by the present invention, an auxiliary metal layer is added between the first metal layer forming the gate and the third metal layer forming the source and drain, and a double-layer storage capacitor structure is formed between the three metal layers, so that the pixel area can be reduced, the PPI of the display panel can be improved, and the flexibility of layout design can be increased under the premise of ensuring a certain storage capacity of the TFT device and the reliability of the TFT device; in addition, the auxiliary metal layer is arranged between the first metal layer and the third metal layer, so that the insulating layers above and below the auxiliary metal layer can be patterned simultaneously through a patterning process. , which can save a mask, reduce the exposure, etching and stripping process of a patterning process, and save the process cost.
进一步的,所述TFT阵列基板包括基板、设于所述基板上的由第一金属层形成的栅极、设于所述基板和栅极上的栅极绝缘层、设于所述栅极绝缘层上的有源层、设于所述有源层和栅极绝缘层上的刻蚀阻挡层、设于所述刻蚀阻挡层上的辅助金属层、设于所述刻蚀阻挡层和辅助金属层上的钝化层、穿过所述钝化层和刻蚀阻挡层且分别对应于所述有源层的两侧上方的第一过孔和第二过孔、设于所述钝化层上的第三金属层,所述第三金属层分别通过所述第一过孔和第二过孔与所述有源层连接;所述第三金属层在所述第一过孔和第二过孔处分别形成源极和漏极。Further, the TFT array substrate includes a substrate, a gate formed by a first metal layer disposed on the substrate, a gate insulating layer disposed on the substrate and the gate, an active layer disposed on the gate insulating layer, an etching barrier layer disposed on the active layer and the gate insulating layer, an auxiliary metal layer disposed on the etching barrier layer, a passivation layer disposed on the etching barrier layer and the auxiliary metal layer, first via holes passing through the passivation layer and the etching barrier layer and respectively corresponding to the upper sides of the active layer and a second via hole, a third metal layer disposed on the passivation layer, the third metal layer is respectively connected to the active layer through the first via hole and the second via hole; the third metal layer forms a source electrode and a drain electrode at the first via hole and the second via hole respectively.
进一步的,所述TFT阵列基板还包括设于所述源极、漏极和钝化层上的平坦化层、穿过所述平坦化层且对应于所述漏极上方的第三过孔、设于所述平坦化层上且通过所述第三过孔与所述漏极连接的阳极以及设于所述平坦化层和阳极上的第四绝缘层,所述第四绝缘层的对应于所述阳极上方的位置设有第四过孔。Further, the TFT array substrate further includes a planarization layer provided on the source, drain and passivation layer, a third via hole passing through the planarization layer and corresponding to above the drain, an anode provided on the planarization layer and connected to the drain through the third via hole, and a fourth insulating layer provided on the planarization layer and the anode, and a fourth via hole is provided on the fourth insulating layer corresponding to the position above the anode.
其中,各绝缘层的材料可以为氧化硅SiOx、氮化硅SiNx、氮氧化硅SiON、氧化铝Al2O3中的一种或多种。Wherein, the material of each insulating layer may be one or more of silicon oxide SiO x , silicon nitride SiN x , silicon oxynitride SiON, and aluminum oxide Al 2 O 3 .
进一步的,所述阳极为ITO/Ag/ITO夹心层结构。Further, the anode has an ITO/Ag/ITO sandwich layer structure.
进一步的,所述有源层由含有铟、镓和锌的非晶氧化物(IGZO)薄膜材料形成。Further, the active layer is formed of an amorphous oxide (IGZO) film material containing indium, gallium and zinc.
进一步的,所述第一金属层、辅助金属层和第三金属层均为Mo/Al/Mo夹心层结构。当然,所述第一金属层、辅助金属层和第三金属层也可以为Mo、Mo/Al/Nd/Mo或Au/Ti等金属或合金形成的金属层。Further, the first metal layer, the auxiliary metal layer and the third metal layer all have a Mo/Al/Mo sandwich layer structure. Certainly, the first metal layer, the auxiliary metal layer and the third metal layer may also be metal layers formed of metals or alloys such as Mo, Mo/Al/Nd/Mo or Au/Ti.
本发明还提供一种显示装置,包括上述的TFT阵列基板。所述显示装置可以为电视机、显示面板、显示器、平板电脑、移动电话、导航仪、照相机或摄像机等任何具有显示功能的设备。The present invention also provides a display device, comprising the above-mentioned TFT array substrate. The display device may be any device with a display function such as a TV, a display panel, a monitor, a tablet computer, a mobile phone, a navigator, a camera or a video camera.
从上述描述可知,本发明的有益效果在于:As can be seen from the foregoing description, the beneficial effects of the present invention are:
本发明提供的显示装置,采用了上述的TFT阵列基板,在相同的显示尺寸下,该显示装置的像素分布密度大大提高,显示画面更清晰。The display device provided by the present invention adopts the above-mentioned TFT array substrate. Under the same display size, the pixel distribution density of the display device is greatly improved, and the display screen is clearer.
本发明还提供一种TFT阵列基板的制备方法,包括如下步骤:The present invention also provides a method for preparing a TFT array substrate, comprising the following steps:
步骤1:在基板上依次形成栅极、栅极绝缘层、有源层和刻蚀阻挡层,所述栅极由第一金属层形成;Step 1: sequentially forming a gate, a gate insulating layer, an active layer and an etching barrier layer on the substrate, the gate being formed by a first metal layer;
步骤2:在所述刻蚀阻挡层上形成辅助金属层;Step 2: forming an auxiliary metal layer on the etching barrier layer;
步骤3:在所述刻蚀阻挡层和辅助金属层上形成钝化层;Step 3: forming a passivation layer on the etching barrier layer and the auxiliary metal layer;
步骤4:通过一次构图工艺同时对钝化层和刻蚀阻挡层图案化,形成均与有源层连接的第一过孔和第二过孔;Step 4: Simultaneously pattern the passivation layer and the etching barrier layer through a patterning process to form a first via hole and a second via hole connected to the active layer;
步骤5:在所述钝化层上形成第三金属层,所述第三金属层通过所述第一过孔和第二过孔与所述有源层连接;所述第三金属层在所述第一过孔和第二过孔处分别形成源极和漏极。Step 5: forming a third metal layer on the passivation layer, the third metal layer is connected to the active layer through the first via hole and the second via hole; the third metal layer forms a source electrode and a drain electrode at the first via hole and the second via hole respectively.
进一步的,在所述步骤5之后还包括在如下步骤:Further, after the step 5, the following steps are also included:
在所述钝化层、源极和漏极上形成平坦化层;forming a planarization layer on the passivation layer, source and drain;
对所述平坦化层进行图案化处理,形成第三过孔;所述第三过孔穿过所述平坦化层与所述漏极连接;performing patterning on the planarization layer to form a third via hole; the third via hole passes through the planarization layer and is connected to the drain;
在所述平坦化层上形成阳极,所述阳极通过所述第三过孔与所述漏极连接;forming an anode on the planarization layer, the anode is connected to the drain through the third via hole;
以及在所述平坦化层和阳极上沉积第四绝缘层,对所述第四绝缘层进行图案化处理,在第四绝缘层的对应于所述阳极上方的位置形成第四过孔。and depositing a fourth insulating layer on the planarization layer and the anode, patterning the fourth insulating layer, and forming a fourth via hole on the fourth insulating layer corresponding to the position above the anode.
其中,可以采用物理气相沉积或溅射等方法形成各金属层,可以采用化学气相沉积或溅射等方法形成各绝缘层。The metal layers can be formed by methods such as physical vapor deposition or sputtering, and the insulating layers can be formed by methods such as chemical vapor deposition or sputtering.
进一步的,形成有源层的步骤为:在栅极绝缘层上通过物理气相沉积法沉积IGZO薄膜,然后经过曝光、刻蚀和剥离工艺形成所需的有源层图案。Further, the step of forming the active layer is: depositing an IGZO thin film on the gate insulating layer by physical vapor deposition, and then forming the required active layer pattern through exposure, etching and stripping processes.
请参照图1,本发明的实施例一为:Please refer to Fig. 1, embodiment one of the present invention is:
一种TFT阵列基板,包括基板1、设于所述基板1上的由第一金属层2形成的栅极、设于所述基板1和栅极上的栅极绝缘层3、设于所述栅极绝缘层3上的有源层4、设于所述有源层4和栅极绝缘层3上的刻蚀阻挡层5、设于所述刻蚀阻挡层5上的辅助金属层6、设于所述刻蚀阻挡层5和辅助金属层6上的钝化层7、穿过所述钝化层7和刻蚀阻挡层5且分别对应于所述有源层4的两侧上方的第一过孔8和第二过孔9、设于所述钝化层7上的第三金属层10,所述第三金属层10分别通过所述第一过孔8和第二过孔9与所述有源层4连接;所述第三金属层10在所述第一过孔8和第二过孔9处分别形成源极11和漏极12;所述第一金属层2、辅助金属层6与夹在所述第一金属层2和辅助金属层6之间的绝缘层构成第一存储电容;所述第三金属层10、辅助金属层6与夹在所述第三金属层10和辅助金属层6之间的绝缘层构成第二存储电容。A TFT array substrate, comprising a substrate 1, a gate formed by a first metal layer 2 disposed on the substrate 1, a gate insulating layer 3 disposed on the substrate 1 and the gate, an active layer 4 disposed on the gate insulating layer 3, an etching barrier layer 5 disposed on the active layer 4 and the gate insulating layer 3, an auxiliary metal layer 6 disposed on the etching barrier layer 5, a passivation layer 7 disposed on the etching barrier layer 5 and the auxiliary metal layer 6, passing through the passivation layer 7 and the etching barrier layer 5 And respectively corresponding to the first via hole 8 and the second via hole 9 above the two sides of the active layer 4, and the third metal layer 10 arranged on the passivation layer 7, the third metal layer 10 is respectively connected to the active layer 4 through the first via hole 8 and the second via hole 9; the third metal layer 10 forms a source electrode 11 and a drain electrode 12 at the first via hole 8 and the second via hole 9 respectively; Storage capacitor: the third metal layer 10 , the auxiliary metal layer 6 and the insulating layer sandwiched between the third metal layer 10 and the auxiliary metal layer 6 form a second storage capacitor.
所述TFT阵列基板还包括设于所述源极11、漏极12和钝化层7上的平坦化层13、穿过所述平坦化层13且对应于所述漏极12上方的第三过孔14、设于所述平坦化层13上且通过所述第三过孔14与所述漏极12连接的阳极15以及设于所述平坦化层13和阳极15上的第四绝缘层16,所述第四绝缘层16的对应于所述阳极15上方的位置设有第四过孔17。The TFT array substrate also includes a planarization layer 13 arranged on the source electrode 11, drain electrode 12 and passivation layer 7, a third via hole 14 passing through the planarization layer 13 and corresponding to the top of the drain electrode 12, an anode 15 arranged on the planarization layer 13 and connected to the drain electrode 12 through the third via hole 14, and a fourth insulating layer 16 arranged on the planarization layer 13 and the anode 15. The fourth via hole 17 .
所述阳极15为ITO/Ag/ITO夹心层结构。The anode 15 has an ITO/Ag/ITO sandwich layer structure.
所述有源层4由IGZO薄膜材料形成。The active layer 4 is formed of IGZO film material.
所述第一金属层2、辅助金属层6和第三金属层10均为Mo/Al/Mo夹心层结构。The first metal layer 2, the auxiliary metal layer 6 and the third metal layer 10 all have a Mo/Al/Mo sandwich layer structure.
请参照图2至图4,本发明的实施例二为:Please refer to Fig. 2 to Fig. 4, embodiment two of the present invention is:
一种TFT阵列基板的制备方法,包括如下步骤:A method for preparing a TFT array substrate, comprising the steps of:
步骤1:在基板1上采用物理气相沉积法(PVD)蒸镀第一金属层(M1)2,一般为Mo/AL/Mo夹心层结构,光阻涂布后曝光(photo),根据掩膜版(MASK)设计形成所需图案,然后对第一金属层(M1)2进行刻蚀(etch),形成栅极(GE)的图案;Step 1: Evaporate the first metal layer (M1) 2 on the substrate 1 by physical vapor deposition (PVD), generally with a Mo/AL/Mo sandwich layer structure, expose (photo) after coating the photoresist, form the required pattern according to the mask (MASK) design, and then etch the first metal layer (M1) 2 to form the pattern of the gate (GE);
步骤2:在经步骤1处理后的基板上采用化学气相沉积法(CVD)蒸镀栅极绝缘层(GI)3;Step 2: Evaporating a gate insulating layer (GI) 3 on the substrate treated in step 1 by chemical vapor deposition (CVD);
步骤3:在经步骤2处理后的基板上采用PVD法蒸镀IGZO薄膜,经过曝光(photo)、刻蚀(etch)和剥离(stripe)工序;最终形成所需的有源层(SE)4的图案;Step 3: Evaporate an IGZO film on the substrate treated in step 2 by PVD method, and go through exposure (photo), etching (etch) and stripping (stripe) processes; finally form the required pattern of the active layer (SE) 4;
步骤4:在经步骤3处理后的基板上采用CVD法蒸镀刻蚀阻挡层(ES)5;Step 4: Evaporating an etching stopper layer (ES) 5 on the substrate treated in step 3 by CVD;
步骤5:在经步骤4处理后的基板上采用PVD法蒸镀辅助金属层(M2)6,一般为Mo/AL/Mo夹心层结构,光阻涂布后曝光(photo),根据掩膜版(MASK)设计形成所需图案,然后对辅助金属层(M2)6进行刻蚀(etch),形成辅助金属层6的走线图案;Step 5: An auxiliary metal layer (M2) 6 is vapor-deposited on the substrate processed in step 4, generally having a Mo/AL/Mo sandwich layer structure, exposed (photo) after coating the photoresist, and the required pattern is formed according to the mask plate (MASK), and then the auxiliary metal layer (M2) 6 is etched (etch) to form the wiring pattern of the auxiliary metal layer 6;
步骤6:在经步骤5处理后的基板上采用CVD法蒸镀钝化层(PV)7,采用一张掩膜版(MASK)同时对钝化层(PV)7和刻蚀阻挡层(ES)5进行曝光(photo)、刻蚀(etch)和剥离(stripe)工序;形成连接有源层(SE)4的第一过孔8和第二过孔9;Step 6: Evaporate a passivation layer (PV) 7 on the substrate treated in step 5, and use a mask plate (MASK) to simultaneously perform exposure (photo), etching (etch) and stripping (stripe) processes on the passivation layer (PV) 7 and the etching stopper layer (ES) 5; form a first via hole 8 and a second via hole 9 connecting the active layer (SE) 4;
步骤7:在经步骤6处理后的基板上采用PVD法蒸镀第三金属层(M3)10,一般为Mo/AL/Mo夹心层结构,光阻涂布后曝光(photo),根据掩膜版(MASK)设计形成所需图案,然后对第三金属层(M3)10进行刻蚀(etch),形成第三金属层(M3)10的走线图案;第三金属层(M3)10在第一过孔8和第二过孔9处分别形成与有源层(SE)4连接的源极11和漏极12;Step 7: Evaporate the third metal layer (M3) 10 on the substrate treated in step 6, generally Mo/AL/Mo sandwich layer structure, expose (photo) after photoresist coating, form the required pattern according to the mask plate (MASK) design, then etch the third metal layer (M3) 10 to form the wiring pattern of the third metal layer (M3) 10; the third metal layer (M3) 10 is formed at the first via hole 8 and the second via hole 9 respectively A source 11 and a drain 12 connected to the active layer (SE) 4;
步骤8:在经步骤7处理后的基板上采用CVD法蒸镀平坦化层(OC)13,光阻涂布后经过曝光(photo)、刻蚀(etch)和剥离(stripe)工序,形成连接漏极12的第三过孔14;Step 8: Evaporate a planarization layer (OC) 13 on the substrate treated in step 7 by CVD, and go through exposure (photo), etching (etch) and stripping (stripe) processes after photoresist coating to form a third via hole 14 connected to the drain electrode 12;
步骤9:在经步骤8处理后的基板上采用PVD法蒸镀阳极金属层,一般为ITO/Ag/ITO夹心层结构,光阻涂布后曝光(photo),根据掩膜版(MASK)设计形成所需图案,然后经刻蚀(etch)和剥离(stripe)工序,形成阳极(anode)15的走线图案,阳极金属层在第三过孔14处与漏极12连接;Step 9: On the substrate treated in step 8, an anode metal layer is vapor-deposited by PVD method, which is generally an ITO/Ag/ITO sandwich layer structure, exposed (photo) after photoresist coating, and the required pattern is formed according to the mask plate (MASK) design, and then the wiring pattern of the anode (anode) 15 is formed through etching (etch) and stripping (stripe) processes, and the anode metal layer is connected to the drain electrode 12 at the third via hole 14;
步骤10:在经步骤8处理后的基板上采用CVD法蒸镀第四绝缘层(PDL)16,光阻涂布后经过曝光(photo)、刻蚀(etch)和剥离(stripe)工序,在第四绝缘层(PDL)16的对应于阳极(anode)15上方的位置形成第四过孔17。Step 10: Evaporate a fourth insulating layer (PDL) 16 on the substrate treated in step 8 by CVD, and after photoresist coating, go through exposure (photo), etching (etch) and stripping (stripe) processes, and form a fourth via hole 17 on the fourth insulating layer (PDL) 16 corresponding to the position above the anode (anode) 15.
请参照图5至图7,本发明的实施例三为:Please refer to Fig. 5 to Fig. 7, embodiment three of the present invention is:
一种主动式矩阵驱动有机发光二极管(AMOLED)显示器件,包括实施例1中TFT阵列基板。其等效电路图如图5所示,在薄膜晶体管T1与薄膜晶体管T2之间夹着一个存储电容C1。薄膜晶体管T1、T2均为是实施例1中描述的晶体管。薄膜晶体管T1为信号切换晶体管,其用于数据信号的传送和切断;薄膜晶体管T2为驱动晶体管,其与有机发光二极管连接;存储电容C1为第一金属层2、辅助金属层6及二者之间的绝缘层以及第三金属层10、辅助金属层6及二者之间的绝缘层构成双层电容。具体的,信号切换晶体管T1的栅极接收扫描信号Vgate,源极接收数据信号Vdata,漏极与驱动晶体管T2的栅极连接;驱动晶体管T2的源极接电源VDD,漏极接有机发光二极管的阳极;有机发光二极管的阴极接地;存储电容C1连接在信号切换晶体管T1的漏极与驱动晶体管T2的源极之间。An active matrix driven organic light emitting diode (AMOLED) display device, including the TFT array substrate in Embodiment 1. Its equivalent circuit diagram is shown in FIG. 5 , and a storage capacitor C 1 is sandwiched between the thin film transistor T1 and the thin film transistor T2 . Both the thin film transistors T1 and T2 are the transistors described in the first embodiment. The thin film transistor T1 is a signal switching transistor, which is used to transmit and cut off the data signal; the thin film transistor T2 is a driving transistor, which is connected to the organic light emitting diode; the storage capacitor C1 is the first metal layer 2, the auxiliary metal layer 6 and the insulating layer between the two, and the third metal layer 10, the auxiliary metal layer 6 and the insulating layer between the two constitute a double-layer capacitor. Specifically, the gate of the signal switching transistor T1 receives the scanning signal V gate , the source receives the data signal V data , and the drain is connected to the gate of the driving transistor T2; the source of the driving transistor T2 is connected to the power supply VDD, and the drain is connected to the anode of the organic light emitting diode; the cathode of the organic light emitting diode is grounded; the storage capacitor C1 is connected between the drain of the signal switching transistor T1 and the source of the driving transistor T2.
图6所示,为本实施例中AMOLED显示器件的布线(layout)设计版图,主要存在以下优点:As shown in FIG. 6, it is the layout design layout of the AMOLED display device in this embodiment, which mainly has the following advantages:
1.电源VDD走线不仅采用第三金属层(M3)10竖直方向走线,也采用辅助金属层(M2)6水平方向走线,这样设计可以增加VDD在显示器件中不同位置的电压均匀性,降低VDD阻抗和不同位置处的电压差异(IR_drop);1. The VDD wiring of the power supply not only adopts the third metal layer (M3) 10 vertical wiring, but also uses the auxiliary metal layer (M2) 6 horizontal wiring. This design can increase the voltage uniformity of VDD at different positions in the display device, and reduce the VDD impedance and the voltage difference (IR_drop) at different positions;
2.图6中B处若采用第一金属层(M1)2或第三金属层(M3)10走线,为防止同层导线距离太近造成短路的情况,需要增大同层导线之间的间距,这势必会增加版图的宽度;而本实施例采用辅助金属层(M2)6走线,不存在短路的问题,减小了版图面积;2. If the first metal layer (M1) 2 or the third metal layer (M3) 10 are used for routing at B in Figure 6, in order to prevent the short circuit caused by the too close distance of the same layer wires, it is necessary to increase the spacing between the same layer wires, which will inevitably increase the width of the layout; and this embodiment adopts the auxiliary metal layer (M2) 6 routing, there is no short circuit problem, and the layout area is reduced;
3.图6中的电容C1为第一金属层(M1)2、辅助金属层(M2)6及二者之间的绝缘层以及第三金属层(M3)10、辅助金属层(M2)6及二者之间的绝缘层构成双层电容(如图7所示),在相同的电容量下,电容面积会减小一半。3. The capacitor C1 in Figure 6 is the first metal layer (M1) 2, the auxiliary metal layer (M2) 6 and the insulating layer between the two, and the third metal layer (M3) 10, the auxiliary metal layer (M2) 6 and the insulating layer between the two to form a double-layer capacitor (as shown in Figure 7). Under the same capacitance, the capacitance area will be reduced by half.
因而,在相同的显示尺寸下,该AMOLED显示器件的在版图设计上可以更灵活,像素分布密度大大提高,显示画面更清晰。Therefore, under the same display size, the layout design of the AMOLED display device can be more flexible, the pixel distribution density is greatly improved, and the display picture is clearer.
综上所述,本发明提供的TFT阵列基板,在形成栅极的第一金属层和形成源漏极的第三金属层之间增加辅助金属层,并且在三个金属层之间形成双层存储电容结构,这样在保证TFT器件的存储电容的容量一定以及保证TFT器件可靠性的前提下,可以减小像素面积,提高显示面板的PPI,同时增加版图设计的灵活性;此外,将辅助金属层设置在第一金属层和第三金属层之间,可以使辅助金属层上方和下方的绝缘层通过一次构图工艺同时完成图案化,这样可以节约一张掩膜版、减少一道构图工艺的曝光、刻蚀和剥离等制程,节约TFT阵列基板的制程成本;In summary, in the TFT array substrate provided by the present invention, an auxiliary metal layer is added between the first metal layer forming the gate and the third metal layer forming the source and drain, and a double-layer storage capacitor structure is formed between the three metal layers. In this way, the pixel area can be reduced, the PPI of the display panel can be improved, and the flexibility of layout design can be increased while ensuring the storage capacity of the TFT device. The patterning process is completed at the same time, which can save a mask, reduce the exposure, etching and stripping processes of a patterning process, and save the process cost of the TFT array substrate;
本发明提供的显示装置,采用了上述的TFT阵列基板,在相同的显示尺寸下,该显示装置的像素分布密度大大提高,显示画面更清晰。The display device provided by the present invention adopts the above-mentioned TFT array substrate. Under the same display size, the pixel distribution density of the display device is greatly improved, and the display screen is clearer.
以上所述仅为本发明的实施例,并非因此限制本发明的专利范围,凡是利用本发明说明书及附图内容所作的等同变换,或直接或间接运用在相关的技术领域,均同理包括在本发明的专利保护范围内。The above description is only an embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent transformations made by using the description of the present invention and the contents of the drawings, or directly or indirectly used in related technical fields, are all included in the scope of patent protection of the present invention.
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110396587.2A CN113192981B (en) | 2018-03-21 | 2018-03-21 | A kind of preparation method of TFT substrate, display device and TFT substrate |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810234371.4A CN108493216B (en) | 2018-03-21 | 2018-03-21 | A kind of TFT array substrate, display device and preparation method of TFT array substrate |
CN202110396587.2A CN113192981B (en) | 2018-03-21 | 2018-03-21 | A kind of preparation method of TFT substrate, display device and TFT substrate |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810234371.4A Division CN108493216B (en) | 2018-03-21 | 2018-03-21 | A kind of TFT array substrate, display device and preparation method of TFT array substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113192981A CN113192981A (en) | 2021-07-30 |
CN113192981B true CN113192981B (en) | 2023-07-25 |
Family
ID=63318896
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110396587.2A Active CN113192981B (en) | 2018-03-21 | 2018-03-21 | A kind of preparation method of TFT substrate, display device and TFT substrate |
CN201810234371.4A Active CN108493216B (en) | 2018-03-21 | 2018-03-21 | A kind of TFT array substrate, display device and preparation method of TFT array substrate |
CN202110396565.6A Active CN113192980B (en) | 2018-03-21 | 2018-03-21 | Array substrate structure, display device and preparation method of array substrate structure |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810234371.4A Active CN108493216B (en) | 2018-03-21 | 2018-03-21 | A kind of TFT array substrate, display device and preparation method of TFT array substrate |
CN202110396565.6A Active CN113192980B (en) | 2018-03-21 | 2018-03-21 | Array substrate structure, display device and preparation method of array substrate structure |
Country Status (1)
Country | Link |
---|---|
CN (3) | CN113192981B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109116605A (en) * | 2018-09-14 | 2019-01-01 | 惠科股份有限公司 | Display panel and manufacturing method thereof |
CN111128875B (en) * | 2019-12-20 | 2022-07-12 | 武汉华星光电半导体显示技术有限公司 | Preparation method of flexible array substrate and flexible array substrate |
CN112397526B (en) * | 2020-11-03 | 2023-12-01 | Tcl华星光电技术有限公司 | Array substrate and preparation method thereof and display panel |
CN113517305B (en) * | 2021-05-25 | 2024-11-08 | 京东方科技集团股份有限公司 | Array substrate and display panel |
CN113721432B (en) * | 2021-09-16 | 2025-02-11 | 北京京东方技术开发有限公司 | Electronically controlled drum, manufacturing method thereof, and printer |
CN114530482A (en) * | 2022-02-18 | 2022-05-24 | 京东方科技集团股份有限公司 | Display panel, manufacturing method thereof and display device |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101799603A (en) * | 2009-02-11 | 2010-08-11 | 北京京东方光电科技有限公司 | TFT-LCD (Thin Film Transistor Liquid Crystal Display) array substrate and manufacture method thereof |
CN102360146A (en) * | 2011-10-14 | 2012-02-22 | 深圳市华星光电技术有限公司 | TFT-LCD (thin film transistor-liquid crystal display) array base plate and manufacturing method thereof |
CN102420183A (en) * | 2011-12-07 | 2012-04-18 | 深圳市华星光电技术有限公司 | Manufacturing method of TFT (Thin Film Transistor) array substrate and TFT array substrate |
CN103018991A (en) * | 2012-12-24 | 2013-04-03 | 京东方科技集团股份有限公司 | Array substrate, manufacturing method thereof and display device |
CN103186001A (en) * | 2013-03-27 | 2013-07-03 | 北京京东方光电科技有限公司 | Array substrate as well as manufacturing method thereof and display device |
WO2015106552A1 (en) * | 2014-01-16 | 2015-07-23 | 京东方科技集团股份有限公司 | Array substrate, method for manufacturing array substrate, display device, thin film transistor and method for manufacturing thin film transistor |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101113354B1 (en) * | 2010-04-16 | 2012-02-29 | 삼성모바일디스플레이주식회사 | Display device and fabrication method of the same |
CN102983135B (en) * | 2012-12-13 | 2016-03-16 | 京东方科技集团股份有限公司 | The preparation method of a kind of array base palte, display unit and array base palte |
CN103199094B (en) * | 2013-03-25 | 2016-01-20 | 南京中电熊猫液晶显示科技有限公司 | TFT-LCD array substrate and manufacture method thereof |
CN103811503A (en) * | 2014-02-19 | 2014-05-21 | 合肥鑫晟光电科技有限公司 | Array substrate and preparation method and display panel |
CN104022142B (en) * | 2014-06-12 | 2017-10-17 | 四川虹视显示技术有限公司 | The top emitting AMOLED devices and method for making of high aperture |
CN104064601B (en) * | 2014-06-30 | 2017-12-26 | 上海天马微电子有限公司 | TFT, TFT array substrate, manufacturing method of TFT array substrate, display panel and display device |
CN104091785A (en) * | 2014-07-22 | 2014-10-08 | 深圳市华星光电技术有限公司 | Manufacturing method for TFT backboard and TFT backboard structure |
CN104637956B (en) * | 2015-02-03 | 2018-03-27 | 京东方科技集团股份有限公司 | Array base palte and preparation method thereof and display device |
CN104752344A (en) * | 2015-04-27 | 2015-07-01 | 深圳市华星光电技术有限公司 | Thin film transistor array substrate and manufacturing method thereof |
CN104966721B (en) * | 2015-07-15 | 2018-10-02 | 京东方科技集团股份有限公司 | A kind of array substrate and preparation method thereof, display panel and display device |
CN105304643A (en) * | 2015-09-28 | 2016-02-03 | 深圳市华星光电技术有限公司 | TFT array substrate and preparation method thereof |
CN105390507B (en) * | 2015-12-03 | 2018-04-10 | 深圳市华星光电技术有限公司 | Preparation method, array base palte and the display device of tft array substrate |
CN105679768B (en) * | 2016-01-25 | 2019-07-12 | 武汉华星光电技术有限公司 | Array substrate, liquid crystal display panel and liquid crystal display device |
CN105679714B (en) * | 2016-01-27 | 2019-05-31 | 深圳市华星光电技术有限公司 | Array substrate and preparation method thereof |
CN105914229B (en) * | 2016-06-24 | 2017-12-15 | 京东方科技集团股份有限公司 | A kind of AMOLED display base plates and preparation method thereof, display device |
CN106653768B (en) * | 2016-12-13 | 2020-01-31 | 武汉华星光电技术有限公司 | TFT backplane and manufacturing method thereof |
CN107146818B (en) * | 2017-06-27 | 2020-02-18 | 京东方科技集团股份有限公司 | A thin film transistor, its manufacturing method, array substrate and display device |
CN107808885B (en) * | 2017-10-25 | 2020-04-28 | 深圳市华星光电半导体显示技术有限公司 | Back-channel etched oxide semiconductor TFT substrate and method of making the same |
-
2018
- 2018-03-21 CN CN202110396587.2A patent/CN113192981B/en active Active
- 2018-03-21 CN CN201810234371.4A patent/CN108493216B/en active Active
- 2018-03-21 CN CN202110396565.6A patent/CN113192980B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101799603A (en) * | 2009-02-11 | 2010-08-11 | 北京京东方光电科技有限公司 | TFT-LCD (Thin Film Transistor Liquid Crystal Display) array substrate and manufacture method thereof |
CN102360146A (en) * | 2011-10-14 | 2012-02-22 | 深圳市华星光电技术有限公司 | TFT-LCD (thin film transistor-liquid crystal display) array base plate and manufacturing method thereof |
CN102420183A (en) * | 2011-12-07 | 2012-04-18 | 深圳市华星光电技术有限公司 | Manufacturing method of TFT (Thin Film Transistor) array substrate and TFT array substrate |
CN103018991A (en) * | 2012-12-24 | 2013-04-03 | 京东方科技集团股份有限公司 | Array substrate, manufacturing method thereof and display device |
CN103186001A (en) * | 2013-03-27 | 2013-07-03 | 北京京东方光电科技有限公司 | Array substrate as well as manufacturing method thereof and display device |
WO2015106552A1 (en) * | 2014-01-16 | 2015-07-23 | 京东方科技集团股份有限公司 | Array substrate, method for manufacturing array substrate, display device, thin film transistor and method for manufacturing thin film transistor |
Also Published As
Publication number | Publication date |
---|---|
CN108493216B (en) | 2021-04-27 |
CN113192980B (en) | 2023-06-16 |
CN113192981A (en) | 2021-07-30 |
CN108493216A (en) | 2018-09-04 |
CN113192980A (en) | 2021-07-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN113192981B (en) | A kind of preparation method of TFT substrate, display device and TFT substrate | |
US9373649B2 (en) | Array substrate and method for manufacturing the same, and display device | |
US10741787B2 (en) | Display back plate and fabricating method for the same, and display device | |
US9748280B2 (en) | Thin film transistor and method of fabricating the same, array substrate and method of fabricating the same, and display device | |
US11723257B2 (en) | Organic light emitting diode display substrate, manufacturing method therefor, and organic light emitting diode display device | |
US11610922B2 (en) | Array substrate and display panel design improving aperture ratio | |
US9881942B2 (en) | Array substrate, manufacturing method thereof and display device | |
CN109309122A (en) | Array substrate, method for manufacturing the same, and display device | |
US9496284B2 (en) | Display panel and display apparatus including the same | |
US9893206B2 (en) | Thin film transistor, array substrate, their manufacturing methods, and display device | |
WO2021036840A1 (en) | Display substrate, manufacturing method thereof, and display device | |
CN103456745B (en) | A kind of array base palte and preparation method thereof, display device | |
CN108831914B (en) | Organic light-emitting display panel, manufacturing method thereof and display device | |
US9461075B2 (en) | Array substrate and manufacturing method thereof, and display device | |
WO2020056803A1 (en) | Display panel and manufacturing method therefor, and display module | |
CN111682031B (en) | Display substrate, preparation method thereof and display device | |
CN109037346A (en) | Thin film transistor (TFT), display base plate and preparation method thereof, display device | |
US12232373B2 (en) | Display substrate with transition area and manufacturing method thereof, and display apparatus | |
CN105070684A (en) | Array substrate preparation method, array substrate and display device | |
US20210296368A1 (en) | Display substrate and manufacturing method therefor, and display panel and display apparatus | |
US12022686B2 (en) | Manufacturing method of OLED panel and OLED panel | |
US9685463B2 (en) | Array substrate, its manufacturing method, display panel and display device | |
CN108461520A (en) | A kind of OLED backboards and preparation method thereof | |
US9515101B2 (en) | Array substrate and method for manufacturing the same, and display device | |
US20240215312A1 (en) | Display panel and display device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |