CN101799603A - TFT-LCD (Thin Film Transistor Liquid Crystal Display) array substrate and manufacture method thereof - Google Patents
TFT-LCD (Thin Film Transistor Liquid Crystal Display) array substrate and manufacture method thereof Download PDFInfo
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- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
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- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
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Abstract
本发明涉及一种TFT-LCD阵列基板及其制造方法。阵列基板包括形成在基板上的栅线和数据线,所述栅线和数据线限定的像素区域内形成像素电极和薄膜晶体管,所述栅线的上方形成有与所述像素电极一起构成存储电容的存储电极。进一步地,所述存储电极与所述数据线同层设置,所述存储电极通过栅绝缘层薄膜上开设的栅绝缘层过孔与所述栅线连接。所述存储电极分段设置在所述数据线两侧的栅线的上方。本发明通过将存储电极设置在栅线上方,提高了单位面积存储电容,同时不会遮挡像素区域,因此有效提高了开口率和显示亮度,从整体上提高了显示质量。
The invention relates to a TFT-LCD array substrate and a manufacturing method thereof. The array substrate includes gate lines and data lines formed on the substrate. Pixel electrodes and thin film transistors are formed in pixel regions defined by the gate lines and data lines. storage electrode. Further, the storage electrode is provided on the same layer as the data line, and the storage electrode is connected to the gate line through a gate insulating layer via hole opened on the gate insulating layer film. The storage electrode segments are arranged above the gate lines on both sides of the data lines. In the present invention, by arranging the storage electrode above the gate line, the storage capacitance per unit area is increased without blocking the pixel area, so the aperture ratio and display brightness are effectively improved, and the display quality is improved as a whole.
Description
技术领域technical field
本发明涉及一种薄膜晶体管液晶显示器结构及其制造方法,尤其是一种TFT-LCD阵列基板及其制造方法。The invention relates to a thin film transistor liquid crystal display structure and a manufacturing method thereof, in particular to a TFT-LCD array substrate and a manufacturing method thereof.
背景技术Background technique
薄膜晶体管液晶显示器(Thin Film Transistor Liquid Crystal Display,简称TFT-LCD)具有体积小、功耗低、无辐射等特点,在当前的平板显示器市场中占据了主导地位。Thin Film Transistor Liquid Crystal Display (TFT-LCD for short) has the characteristics of small size, low power consumption, and no radiation, and occupies a dominant position in the current flat panel display market.
TFT-LCD主要由对盒的阵列基板和彩膜基板构成,其中阵列基板上形成有矩阵式排列的薄膜晶体管和像素电极,每个像素电极由薄膜晶体管控制。当薄膜晶体管打开时,像素电极在打开时间内充电,充电结束后,像素电极电压将维持到下一次扫描时重新充电。一般来说,液晶电容不大,仅靠液晶电容不能维持像素电极的电压,因此现有设计均设置一个存储电容来保持像素电极的电压。通常,存储电容的主要类型为:存储电容在栅线上(Cson Gate)、存储电容在公共电极线上(Cson Common)和组合结构,组合结构是指存储电容一部分在栅极扫描线上,另一部分在公共电极线上。但无论是哪种类型,现有技术均是采用栅金属层薄膜作为存储电容一个电极板,与作为存储电容另一个电极板的像素电极之间夹设有栅绝缘层薄膜和钝化层薄膜。由存储电容的计算公式可知,单位面积存储电容的大小与两电极板之间的距离成反比,由于现有TFT-LCD阵列基板中存储电容两电极板之间夹设栅绝缘层薄膜和钝化层薄膜,两电极板之间的距离较大,因此导致单位面积存储电容相对较小。TFT-LCD is mainly composed of an array substrate and a color filter substrate in a box, wherein thin-film transistors and pixel electrodes arranged in a matrix are formed on the array substrate, and each pixel electrode is controlled by a thin-film transistor. When the thin film transistor is turned on, the pixel electrode is charged during the turn-on time, and after the charging is completed, the voltage of the pixel electrode will be maintained until recharging in the next scan. Generally speaking, the liquid crystal capacitance is not large, and the voltage of the pixel electrode cannot be maintained only by the liquid crystal capacitance. Therefore, a storage capacitor is provided in the existing designs to maintain the voltage of the pixel electrode. Usually, the main types of storage capacitors are: storage capacitor on the gate line (Cson Gate), storage capacitor on the common electrode line (Cson Common) and combined structure. The combined structure means that a part of the storage capacitor is on the gate scanning line, and the other A part is on the common electrode line. However, regardless of the type, in the prior art, a gate metal layer film is used as one electrode plate of the storage capacitor, and a gate insulating layer film and a passivation layer film are interposed between the pixel electrode as the other electrode plate of the storage capacitor. It can be seen from the calculation formula of the storage capacitor that the size of the storage capacitor per unit area is inversely proportional to the distance between the two electrode plates, because the gate insulating film and the passivation layer are interposed between the two electrode plates of the storage capacitor in the existing TFT-LCD array substrate. A thin film, the distance between the two electrode plates is relatively large, so the storage capacitance per unit area is relatively small.
发明内容Contents of the invention
本发明的目的是提供一种TFT-LCD阵列基板及其制造方法,不仅可以有效提高单位面积存储电容,还具有高开口率和高显示亮度等优点。The object of the present invention is to provide a TFT-LCD array substrate and its manufacturing method, which can not only effectively increase the storage capacitance per unit area, but also have the advantages of high aperture ratio and high display brightness.
为了实现上述目的,本发明提供了一种TFT-LCD阵列基板,包括形成在基板上的栅线和数据线,所述栅线和数据线限定的像素区域内形成像素电极和薄膜晶体管,所述栅线的上方形成有与所述像素电极一起构成存储电容的存储电极。In order to achieve the above object, the present invention provides a TFT-LCD array substrate, including gate lines and data lines formed on the substrate, pixel electrodes and thin film transistors are formed in the pixel area defined by the gate lines and data lines, the A storage electrode forming a storage capacitor together with the pixel electrode is formed above the gate line.
所述存储电极与所述数据线同层设置。The storage electrodes are arranged on the same layer as the data lines.
所述存储电极通过栅绝缘层薄膜上开设的栅绝缘层过孔与所述栅线连接。The storage electrode is connected to the gate line through a gate insulating layer via hole opened on the gate insulating layer film.
所述存储电极分段设置在所述数据线两侧的栅线的上方。The storage electrode segments are arranged above the gate lines on both sides of the data lines.
所述像素区域内还形成有遮挡条,所述遮挡条与所述存储电极同层设置,并与所述存储电极连接。A shielding strip is also formed in the pixel area, and the shielding strip is arranged on the same layer as the storage electrode and connected to the storage electrode.
为了实现上述目的,本发明还提供了一种TFT-LCD阵列基板制造方法,包括:In order to achieve the above object, the present invention also provides a method for manufacturing a TFT-LCD array substrate, comprising:
步骤1、在基板上沉积栅金属层薄膜,通过构图工艺形成包括栅线和栅电极的图形;
步骤2、在完成步骤1的基板上沉积栅绝缘层薄膜、半导体层薄膜和掺杂半导体层薄膜,通过构图工艺形成包括有源层和栅绝缘层过孔的图形,所述栅绝缘层过孔位于所述栅线的上方;
步骤3、在完成步骤2的基板上沉积源漏金属层薄膜,通过构图工艺形成包括数据线、源电极、漏电极、TFT沟道区域和存储电极的图形,所述存储电极位于所述数据线两侧的栅线之上,且通过所述栅绝缘层过孔与所述栅线连接;
步骤4、在完成步骤3的基板上沉积钝化层薄膜,通过构图工艺形成包括钝化层过孔的图形,所述钝化层过孔位于所述漏电极的上方;
步骤5、在完成步骤4的基板上沉积透明导电薄膜,通过构图工艺形成包括像素电极的图形,所述像素电极通过所述钝化层过孔与漏电极连接。
所述步骤2包括:Said
采用等离子体增强化学气相沉积方法依次沉积栅绝缘层薄膜、半导体层薄膜和掺杂半导体层薄膜;A plasma-enhanced chemical vapor deposition method is used to sequentially deposit a gate insulating layer film, a semiconductor layer film and a doped semiconductor layer film;
采用半色调或灰色调掩模板通过构图工艺形成包括有源层和栅绝缘层过孔的图形,所述栅绝缘层过孔位于所述栅线的上方。A half-tone or gray-tone mask is used to form a pattern including an active layer and a gate insulating layer via hole through a patterning process, and the gate insulating layer via hole is located above the gate line.
所述采用半色调或灰色调掩模板通过构图工艺形成包括有源层和栅绝缘层过孔的图形包括:The forming of the pattern including the via holes in the active layer and the gate insulating layer through a patterning process by using a half-tone or gray-tone mask includes:
在所述掺杂半导体层薄膜上涂覆一层光刻胶;Coating a layer of photoresist on the doped semiconductor layer film;
采用半色调或灰色调掩模板曝光,使光刻胶形成光刻胶完全去除区域、光刻胶完全保留区域和光刻胶半保留区域;光刻胶完全保留区域对应于有源层图形所在区域,光刻胶完全去除区域对应于栅绝缘层过孔图形所在区域,光刻胶半保留区域对应于上述图形以外的区域;显影处理后,光刻胶完全保留区域的光刻胶厚度没有变化,光刻胶完全去除区域的光刻胶被完全去除,光刻胶半保留区域的光刻胶厚度减少;Use a half-tone or gray-tone mask to expose the photoresist to form a photoresist completely removed area, a photoresist completely reserved area, and a photoresist half-retained area; the photoresist fully reserved area corresponds to the area where the active layer pattern is located , the photoresist completely removed area corresponds to the area where the gate insulating layer via hole pattern is located, and the photoresist semi-retained area corresponds to the area other than the above pattern; after the development treatment, the photoresist thickness in the photoresist completely reserved area does not change, The photoresist in the photoresist complete removal area is completely removed, and the photoresist thickness in the photoresist semi-retained area is reduced;
通过第一次刻蚀工艺完全刻蚀掉光刻胶完全去除区域的掺杂半导体层薄膜、半导体层薄膜和栅绝缘层薄膜,形成栅绝缘层过孔图形;The doped semiconductor layer film, the semiconductor layer film and the gate insulating layer film in the photoresist completely removed region are completely etched away by the first etching process to form a gate insulating layer via hole pattern;
通过灰化工艺去除光刻胶半保留区域的光刻胶,暴露出该区域的掺杂半导体层薄膜;Remove the photoresist in the semi-retained area of the photoresist through an ashing process, exposing the doped semiconductor layer film in this area;
通过第二次刻蚀工艺完全刻蚀掉光刻胶半保留区域的掺杂半导体层薄膜和半导体层薄膜,形成有源层图形;The doped semiconductor layer film and the semiconductor layer film in the semi-retained area of the photoresist are completely etched away by the second etching process to form an active layer pattern;
剥离剩余的光刻胶。Strip remaining photoresist.
所述步骤3包括:采用磁控溅射或热蒸发的方法沉积源漏金属层薄膜,采用普通掩模板通过构图工艺对源漏金属层薄膜进行构图,形成数据线、源电极、漏电极、TFT沟道区域和存储电极图形,其中存储电极位于数据线两侧的栅线上方,并通过栅绝缘层过孔与栅线连接。The
所述步骤3还同时形成有遮挡条图形,所述遮挡条与存储电极连接。In the
本发明提供了一种TFT-LCD阵列基板及其制造方法,将存储电极设置在栅线上方,存储电极与数据线、源电极和漏电极同层设置,在同一次构图工艺中形成,由存储电极和像素电极形成存储电容的两个电极板。与两个电极板之间夹设栅绝缘层薄膜和钝化层薄膜的现有存储电容结构相比,本发明存储电容两个电极板之间的距离只有钝化层的厚度,因此提高了单位面积存储电容。由于存储电极设置在栅线上方,不会遮挡像素区域,因此本发明有效提高了开口率和显示亮度,从整体上提高了显示质量。进一步地,由于本发明存储电极设置在栅线上方,因此可以根据实际需要通过改变存储电极的面积来设计合适的存储电容,这样就保证了充足的存储电容余量,可以有效地减少跳变电压ΔVp,提高显示质量。The invention provides a TFT-LCD array substrate and a manufacturing method thereof. The storage electrodes are arranged above the gate lines, and the storage electrodes are arranged on the same layer as the data lines, source electrodes and drain electrodes, and are formed in the same patterning process. The electrode and the pixel electrode form the two electrode plates of the storage capacitor. Compared with the existing storage capacitor structure in which a gate insulating layer film and a passivation layer film are interposed between two electrode plates, the distance between the two electrode plates of the storage capacitor in the present invention is only the thickness of the passivation layer, thus improving the unit area storage capacitor. Since the storage electrode is arranged above the gate line and does not block the pixel area, the invention effectively improves the aperture ratio and display brightness, and improves the display quality as a whole. Further, since the storage electrode of the present invention is arranged above the gate line, an appropriate storage capacitor can be designed by changing the area of the storage electrode according to actual needs, thus ensuring sufficient storage capacitor margin and effectively reducing the jump voltage ΔV p , to improve display quality.
附图说明Description of drawings
图1为本发明TFT-LCD阵列基板一个像素单元的平面图;Fig. 1 is the plan view of a pixel unit of TFT-LCD array substrate of the present invention;
图2为图1中A1-A1向的剖面图;Fig. 2 is the sectional view of A1-A1 direction in Fig. 1;
图3为图1中B1-B1向的剖面图;Fig. 3 is the sectional view of B1-B1 direction in Fig. 1;
图4为本发明TFT-LCD阵列基板第一次构图工艺后一个像素单元的平面图;4 is a plan view of a pixel unit after the first patterning process of the TFT-LCD array substrate of the present invention;
图5为图4中A2-A2向的剖面图;Fig. 5 is the sectional view of A2-A2 direction in Fig. 4;
图6为图4中B2-B2向的剖面图;Fig. 6 is the sectional view of B2-B2 in Fig. 4;
图7为本发明TFT-LCD阵列基板第二次构图工艺后一个像素单元的平面图;7 is a plan view of a pixel unit after the second patterning process of the TFT-LCD array substrate of the present invention;
图8为本发明TFT-LCD阵列基板第二次构图工艺中曝光显影后A3-A3向的剖面图;8 is a cross-sectional view of A3-A3 after exposure and development in the second patterning process of the TFT-LCD array substrate of the present invention;
图9为本发明TFT-LCD阵列基板第二次构图工艺中曝光显影后B3-B3向的剖面图;9 is a cross-sectional view of B3-B3 after exposure and development in the second patterning process of the TFT-LCD array substrate of the present invention;
图10为本发明TFT-LCD阵列基板第二次构图工艺中第一次刻蚀工艺后B 3-B3向的剖面图;Fig. 10 is the sectional view of B3-B3 after the first etching process in the second patterning process of the TFT-LCD array substrate of the present invention;
图11为本发明TFT-LCD阵列基板第二次构图工艺中灰化工艺后A3-A3向的剖面图;11 is a cross-sectional view of A3-A3 after the ashing process in the second patterning process of the TFT-LCD array substrate of the present invention;
图12为本发明TFT-LCD阵列基板第二次构图工艺中灰化工艺后B3-B3向的剖面图;12 is a cross-sectional view of B3-B3 after the ashing process in the second patterning process of the TFT-LCD array substrate of the present invention;
图13为本发明TFT-LCD阵列基板第二次构图工艺中第二次刻蚀工艺后A3-A 3向的剖面图;13 is a cross-sectional view of A3-
图14为本发明TFT-LCD阵列基板第二次构图工艺中第二次刻蚀工艺后B3-B3向的剖面图;14 is a cross-sectional view of B3-B3 after the second etching process in the second patterning process of the TFT-LCD array substrate of the present invention;
图15为本发明TFT-LCD阵列基板第二次构图工艺后A3-A3向的剖面图;15 is a sectional view of A3-A3 after the second patterning process of the TFT-LCD array substrate of the present invention;
图16为本发明TFT-LCD阵列基板第三次构图工艺后一个像素单元的平面图;16 is a plan view of a pixel unit after the third patterning process of the TFT-LCD array substrate of the present invention;
图17为图16中A4-A4向的剖面图;Figure 17 is a sectional view of A4-A4 direction in Figure 16;
图18为图16中B4-B4向的剖面图;Fig. 18 is a sectional view of B4-B4 direction in Fig. 16;
图19为本发明TFT-LCD阵列基板第四次构图工艺后一个像素单元的平面图;19 is a plan view of a pixel unit after the fourth patterning process of the TFT-LCD array substrate of the present invention;
图20为图19中A5-A5向的剖面图;Figure 20 is a sectional view of A5-A5 direction in Figure 19;
图21为图19中B5-B5向的剖面图;Figure 21 is a sectional view of B5-B5 direction in Figure 19;
图22为本发明TFT-LCD阵列基板制造方法的流程图;Fig. 22 is a flow chart of the manufacturing method of the TFT-LCD array substrate of the present invention;
图23为本发明TFT-LCD阵列基板制造方法具体实施例的流程图。FIG. 23 is a flow chart of a specific embodiment of the manufacturing method of the TFT-LCD array substrate of the present invention.
附图标记说明:Explanation of reference signs:
1-基板; 2-栅电极; 3-栅绝缘层薄膜;1-substrate; 2-gate electrode; 3-gate insulating film;
4-半导体层薄膜; 5-掺杂半导体层薄膜; 6-源电极;4-semiconductor layer film; 5-doped semiconductor layer film; 6-source electrode;
7-漏电极; 8-钝化层薄膜; 9-像素电极;7-drain electrode; 8-passivation layer film; 9-pixel electrode;
10-栅线; 11-数据线; 12-栅绝缘层过孔;10-gate line; 11-data line; 12-gate insulating layer via hole;
13-存储电极; 14-钝化层过孔; 30-光刻胶。13-storage electrode; 14-passivation layer via; 30-photoresist.
具体实施方式Detailed ways
下面通过附图和实施例,对本发明的技术方案做进一步的详细描述。The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.
图1为本发明TFT-LCD阵列基板一个像素单元的平面图,图2为图1中A1-A1向的剖面图,图3为图1中B1-B1向的剖面图。如图1~图3所示,本发明TFT-LCD阵列基板的主体结构包括形成在基板1上的栅线10、数据线11、像素电极9、薄膜晶体管和存储电极13,相互垂直的栅线10和数据线11定义了像素区域,薄膜晶体管和像素电极9形成在像素区域内,栅线10用于向薄膜晶体管提供开启信号,数据线11用于向像素电极9提供数据信号,存储电极13用于与像素电极9一起构成存储电容。本发明存储电极13设置在栅线10的上方,与数据线11同层。具体地,本发明TFT-LCD阵列基板包括形成在基板1上的栅线10和栅电极2,栅电极2与栅线10连接;栅绝缘层薄膜3形成在栅电极2和栅线10上并覆盖整个基板1,栅绝缘层薄膜3上开设有栅绝缘层过孔12,至少一个栅绝缘层过孔12设置在栅线10位置,用于使存储电极13通过栅绝缘层过孔12与栅线10连接;有源层(半导体层薄膜4和掺杂半导体层薄膜5)形成在栅绝缘层薄膜3上并位于栅电极2的上方;源电极6的一端形成在有源层上,另一端与数据线11连接,漏电极7的一端形成在有源层上,另一端通过钝化层薄膜8上开设的钝化层过孔14与像素电极9连接,源电极6和漏电极7之间形成TFT沟道区域,TFT沟道区域的掺杂半导体层薄膜(欧姆接触层)5被完全刻蚀掉,暴露出半导体层薄膜4;存储电极13与数据线11、源电极6和漏电极7同层,并位于栅线10上方,存储电极13通过栅绝缘层薄膜3上开设的栅绝缘层过孔12与栅线10连接;钝化层薄膜8形成在数据线11、源电极6、漏电极7和存储电极13上并覆盖整个基板1,在漏电极7位置开设有使漏电极7与像素电极9连接的钝化层过孔14;像素电极9形成在钝化层薄膜8上,像素电极9通过钝化层过孔14与漏电极7连接。Fig. 1 is a plan view of a pixel unit of the TFT-LCD array substrate of the present invention, Fig. 2 is a sectional view along A1-A1 in Fig. 1 , and Fig. 3 is a sectional view along B1-B1 in Fig. 1 . As shown in Figures 1 to 3, the main structure of the TFT-LCD array substrate of the present invention includes
图4~图21为本发明TFT-LCD阵列基板制造过程的示意图,可以进一步说明本发明的技术方案,在以下说明中,本发明所称的构图工艺包括光刻胶涂覆、掩模、曝光、刻蚀等工艺,光刻胶以正性光刻胶为例。4 to 21 are schematic diagrams of the manufacturing process of the TFT-LCD array substrate of the present invention, which can further illustrate the technical solution of the present invention. In the following description, the patterning process referred to in the present invention includes photoresist coating, masking, exposure , etching and other processes, the photoresist takes positive photoresist as an example.
图4为本发明TFT-LCD阵列基板第一次构图工艺后的一个像素单元平面图,图5为图4中A2-A2向的剖面图,图6为图4中B2-B2向的剖面图。首先采用磁控溅射或热蒸发的方法,在基板1(如玻璃基板或石英基板)上沉积栅金属层薄膜,栅金属层薄膜可以采用Cr、W、Ti、Ta、Mo、Al、Cu等金属或合金,也可以采用由多个金属层薄膜构成的复合层薄膜。采用普通掩模板(也称单调掩模板)通过构图工艺形成包括栅线10和栅电极2的图形,如图4~图6所示。4 is a plan view of a pixel unit after the first patterning process of the TFT-LCD array substrate of the present invention, FIG. 5 is a cross-sectional view of A2-A2 in FIG. 4 , and FIG. 6 is a cross-sectional view of B2-B2 in FIG. 4 . First, magnetron sputtering or thermal evaporation is used to deposit a gate metal layer film on a substrate 1 (such as a glass substrate or a quartz substrate). The gate metal layer film can be made of Cr, W, Ti, Ta, Mo, Al, Cu, etc. Metals or alloys, composite layer films composed of multiple metal layer films can also be used. A pattern including the
图7为本发明TFT-LCD阵列基板第二次构图工艺后一个像素单元的平面图,图8为本发明TFT-LCD阵列基板第二次构图工艺中曝光显影后A3-A3向的剖面图,图9为本发明TFT-LCD阵列基板第二次构图工艺中曝光显影后B3-B3向的剖面图。在完成图4结构图形的基板上,采用等离子体增强化学气相沉积(简称PECVD)方法,依次沉积栅绝缘层薄膜3、半导体层薄膜4和掺杂半导体层薄膜5(也称欧姆接触层)。栅绝缘层薄膜3可以选用氧化物、氮化物或氧氮化合物,对应的反应气体可以为SiH4、NH3、N2的混合气体或SiH2Cl2、NH3、N2的混合气体;半导体层薄膜4对应的反应气体可以为SiH4、H2的混合气体或SiH2Cl2、H2的混合气体;掺杂半导体层薄膜5对应的反应气体可以为SiH4、PH3、H2的混合气体或SiH2Cl2、PH3、H2的混合气体。随后,在掺杂半导体层薄膜5上涂覆一层光刻胶30,采用半色调或灰色调掩模板曝光,使光刻胶形成完全曝光区域A、未曝光区域B和半曝光区域C。未曝光区域B对应于有源层图形所在区域,完全曝光区域A对应于栅绝缘层过孔图形所在区域,半曝光区域C对应于上述图形以外的区域。显影处理后,未曝光区域B的光刻胶厚度没有变化,形成光刻胶完全保留区域,完全曝光区域A的光刻胶被完全去除,形成光刻胶完全去除区域,半曝光区域C的光刻胶厚度减少,形成光刻胶半保留区域,如图8、图9所示。7 is a plan view of a pixel unit after the second patterning process of the TFT-LCD array substrate of the present invention, and FIG. 8 is a cross-sectional view of A3-A3 direction after exposure and development in the second patterning process of the TFT-LCD array substrate of the present invention. 9 is a cross-sectional view along the B3-B3 direction after exposure and development in the second patterning process of the TFT-LCD array substrate of the present invention. On the substrate with the structural pattern shown in Figure 4, the gate insulating
图10为本发明TFT-LCD阵列基板第二次构图工艺中第一次刻蚀工艺后B3-B3向的剖面图。通过第一次刻蚀工艺完全刻蚀掉完全曝光区域A的掺杂半导体层薄膜5、半导体层薄膜4和栅绝缘层薄膜3,形成栅绝缘层过孔12图形,栅绝缘层过孔12内暴露出栅线10,如图10所示。10 is a cross-sectional view along B3-B3 after the first etching process in the second patterning process of the TFT-LCD array substrate of the present invention. The doped
图11为本发明TFT-LCD阵列基板第二次构图工艺中灰化工艺后A3-A3向的剖面图,图12为本发明TFT-LCD阵列基板第二次构图工艺中灰化工艺后B3-B3向的剖面图。通过灰化工艺,去除掉半曝光区域C的光刻胶,暴露出该区域的掺杂半导体层薄膜5,如图11、图12所示。由于未曝光区域B光刻胶的厚度大于半曝光区域C光刻胶的厚度,因此灰化工艺后,未曝光区域B仍涂覆有一定厚度的光刻胶30。Figure 11 is a sectional view of A3-A3 after the ashing process in the second patterning process of the TFT-LCD array substrate of the present invention, and Figure 12 is a B3-A3 after the ashing process in the second patterning process of the TFT-LCD array substrate of the present invention Sectional view of direction B3. Through the ashing process, the photoresist in the semi-exposed region C is removed, exposing the doped semiconductor layer
图13为本发明TFT-LCD阵列基板第二次构图工艺中第二次刻蚀工艺后A3-A3向的剖面图,图14为本发明TFT-LCD阵列基板第二次构图工艺中第二次刻蚀工艺后B3-B3向的剖面图。通过第二次刻蚀工艺完全刻蚀掉半曝光区域C的掺杂半导体层薄膜5和半导体层薄膜4,形成有源层图形,有源层包括半导体层薄膜4和掺杂半导体层薄膜5,如图13、图14所示。Fig. 13 is a cross-sectional view of A3-A3 after the second etching process in the second patterning process of the TFT-LCD array substrate of the present invention, and Fig. 14 is the second patterning process of the TFT-LCD array substrate of the present invention. Cross-sectional view of B3-B3 direction after etching process. The doped
图15为本发明TFT-LCD阵列基板第二次构图工艺后A3-A3向的剖面图。最后剥离剩余的光刻胶,完成本发明TFT-LCD阵列基板第二次构图工艺,如图7、图14和图15所示。本发明第二次构图工艺后,有源层形成在栅电极2上方,栅绝缘层过孔12形成在栅线10上方。栅绝缘层过孔12的具体形状也可为多种,比如方形、圆形等。实际应用中,可以在栅线10上方设置多个栅绝缘层过孔结构,本实施例只示意了采用二个栅绝缘层过孔的结构。FIG. 15 is a cross-sectional view along the A3-A3 direction of the TFT-LCD array substrate of the present invention after the second patterning process. Finally, the remaining photoresist is stripped off to complete the second patterning process of the TFT-LCD array substrate of the present invention, as shown in FIG. 7 , FIG. 14 and FIG. 15 . After the second patterning process of the present invention, the active layer is formed above the
图16为本发明TFT-LCD阵列基板第三次构图工艺后一个像素单元的平面图,图17为图16中A4-A4向的剖面图,图18为图16中B4-B4向的剖面图。在完成图7结构图形的基板上,采用磁控溅射或热蒸发的方法,沉积源漏金属层薄膜,源漏金属层薄膜可以采用Cr、W、Ti、Ta、Mo、Al、Cu等金属或合金,也可以采用由多个金属层薄膜构成的复合层薄膜。采用普通掩模板通过构图工艺对源漏金属层薄膜进行构图,形成数据线11、源电极6、漏电极7、TFT沟道区域和存储电极13图形,其中源电极6的一端位于有源层上,另一端与数据线11连接,漏电极7的一端位于有源层上,与源电极6相对设置,源电极6与漏电极7之间形成TFT沟道区域,TFT沟道区域的之间的掺杂半导体层薄膜5被完全刻蚀掉,并刻蚀掉部分厚度的半导体层薄膜4,暴露出半导体层薄膜4;存储电极13分段设置在数据线11的两侧,并位于栅线10上方,通过栅绝缘层过孔12与栅线10连接,如图16、图17和图18所示。实际应用中,本次构图工艺还可以同时形成遮挡条结构,遮挡条用于进一步遮挡漏光区域的光线,进一步地,遮挡条还可以与存储电极连接成一个整体。存储电极13的形状和尺寸可以根据实际需要设计。16 is a plan view of a pixel unit after the third patterning process of the TFT-LCD array substrate of the present invention, FIG. 17 is a sectional view along the A4-A4 direction in FIG. 16 , and FIG. 18 is a sectional view along the B4-B4 direction in FIG. 16 . On the substrate with the structural pattern shown in Figure 7, magnetron sputtering or thermal evaporation is used to deposit the source-drain metal layer thin film. The source-drain metal layer thin film can be made of metals such as Cr, W, Ti, Ta, Mo, Al, Cu, etc. Or an alloy, and a composite layer film composed of a plurality of metal layer films can also be used. Use a common mask to pattern the source-drain metal layer film through a patterning process to form
图19为本发明TFT-LCD阵列基板第四次构图工艺后一个像素单元的平面图,图20为图19中A5-A5向的剖面图,图21为图19中B5-B5向的剖面图。在完成图16结构图形的基板上,采用PECVD方法沉积钝化层薄膜8。钝化层薄膜8可以采用氧化物、氮化物或氧氮化合物,对应的反应气体可以为SiH4、NH3、N2的混合气体或SiH2Cl2、NH3、N2的混合气体。采用普通掩模板通过构图工艺对钝化层薄膜8进行构图,形成钝化层过孔14,钝化层过孔14位于漏电极7的上方,如图19、图20和图21所示。本构图工艺中,还同时形成有栅线接口区域(栅线PAD)的栅线接口过孔和数据线接口区域(数据线PAD)的数据线接口过孔等图形。上述通过构图工艺形成栅线接口过孔和数据线接口过孔图形的工艺已广泛应用于目前的构图工艺中,这里不再赘述。19 is a plan view of a pixel unit after the fourth patterning process of the TFT-LCD array substrate of the present invention, FIG. 20 is a sectional view along the A5-A5 direction in FIG. 19 , and FIG. 21 is a sectional view along the B5-B5 direction in FIG. 19 . On the substrate with the structural pattern shown in Figure 16, a
最后,在完成上述结构图形的基板上,采用磁控溅射或热蒸发的方法,沉积透明导电薄膜,透明导电薄膜可以采用氧化铟锡(ITO)、氧化铟锌(IZO)或氧化铝锌等材料,也可以采用其它金属及金属氧化物。采用普通掩模板通过构图工艺形成像素电极9,像素电极9通过钝化层过孔14与漏电极7连接,如图1~图3所示。Finally, on the substrate with the above-mentioned structural patterns, magnetron sputtering or thermal evaporation is used to deposit a transparent conductive film. The transparent conductive film can be made of indium tin oxide (ITO), indium zinc oxide (IZO) or aluminum zinc oxide. Materials, other metals and metal oxides can also be used. The
以上所说明的五次构图工艺仅仅是制备本发明TFT-LCD阵列基板的一种实现方法,实际使用中还可以通过增加或减少构图工艺次数、选择不同的材料或材料组合来实现本发明。例如,本发明TFT-LCD阵列基板第二次构图工艺可以由二次采用普通掩模板的构图工艺完成,即通过一次采用普通掩模板的构图工艺形成有源层图形,通过一次采用普通掩模板的构图工艺形成栅绝缘层过孔,这里不再赘述。The five-time patterning process described above is only one implementation method for preparing the TFT-LCD array substrate of the present invention. In actual use, the present invention can also be realized by increasing or decreasing the number of patterning processes and selecting different materials or combinations of materials. For example, the second patterning process of the TFT-LCD array substrate of the present invention can be completed by the second patterning process using a common mask, that is, the active layer pattern is formed by a patterning process using a common mask once, and the patterning of the active layer is formed by a patterning process using a common mask once. The patterning process forms gate insulating layer via holes, which will not be repeated here.
本发明提供了一种TFT-LCD阵列基板,将存储电极设置在栅线上方,存储电极与数据线、源电极和漏电极同层设置,在同一次构图工艺中形成,由存储电极和像素电极形成存储电容的两个电极板。与两个电极板之间夹设栅绝缘层薄膜和钝化层薄膜的现有存储电容结构相比,本发明存储电容两个电极板之间的距离只有钝化层薄膜的厚度,因此提高了单位面积存储电容。由于存储电极设置在栅线上方,不会遮挡像素区域,因此本发明有效提高了开口率和显示亮度,从整体上提高了显示质量。The invention provides a TFT-LCD array substrate. The storage electrode is arranged above the gate line, and the storage electrode is arranged on the same layer as the data line, source electrode and drain electrode, and is formed in the same patterning process. The storage electrode and the pixel electrode The two electrode plates that form the storage capacitor. Compared with the existing storage capacitor structure in which a gate insulating layer film and a passivation layer film are sandwiched between two electrode plates, the distance between the two electrode plates of the storage capacitor in the present invention is only the thickness of the passivation layer film, thus improving the storage capacitor per unit area. Since the storage electrode is arranged above the gate line and does not block the pixel area, the invention effectively improves the aperture ratio and display brightness, and improves the display quality as a whole.
在TFT-LCD工作时,由于源电极与栅电极之间、漏电极与栅电极之间存在寄生电容,因此在像素电极充电结束的瞬间会产生一个跳变电压ΔVp,跳变电压的表达式为:其中Vgh为栅电极的开启电压,Vgl栅电极的关断电压,Clc为液晶电容,Cgs为寄生电容,Cs为存储电容。研究表明,跳变电压ΔVp的存在会使像素电极的极性发生改变,进而导致正负极性的电压差不一致,导致显示画面产生闪烁(flicker)现象,严重地影响了显示质量,因此设计上要求产生的跳变电压ΔVp越小越好。由于本发明存储电极设置在栅线上方,因此可以根据实际需要通过改变存储电极的面积来设计合适的存储电容Cs,这样就保证了充足的存储电容余量,可以有效地减少跳变电压ΔVp,提高显示质量。When the TFT-LCD is working, due to the parasitic capacitance between the source electrode and the gate electrode, and between the drain electrode and the gate electrode, a jump voltage ΔV p will be generated at the moment when the charging of the pixel electrode ends. The expression of the jump voltage for: Among them, V gh is the turn-on voltage of the gate electrode, V gl is the turn-off voltage of the gate electrode, C lc is the liquid crystal capacitance, C gs is the parasitic capacitance, and C s is the storage capacitance. Studies have shown that the existence of the jump voltage ΔV p will change the polarity of the pixel electrode, which will lead to the inconsistency of the voltage difference between positive and negative polarities, resulting in flicker phenomenon in the display screen, which seriously affects the display quality. Therefore, the design The smaller the jump voltage ΔV p required to be generated, the better. Since the storage electrode of the present invention is arranged above the gate line, a suitable storage capacitor C s can be designed by changing the area of the storage electrode according to actual needs, thus ensuring sufficient storage capacitor margin and effectively reducing the jump voltage ΔV p , to improve display quality.
图22为本发明TFT-LCD阵列基板制造方法的流程图,包括:Fig. 22 is a flow chart of the manufacturing method of the TFT-LCD array substrate of the present invention, including:
步骤1、在基板上沉积栅金属层薄膜,通过构图工艺形成包括栅线和栅电极的图形;
步骤2、在完成步骤1的基板上沉积栅绝缘层薄膜、半导体层薄膜和掺杂半导体层薄膜,通过构图工艺形成包括有源层和栅绝缘层过孔的图形,所述栅绝缘层过孔位于所述栅线的上方;
步骤3、在完成步骤2的基板上沉积源漏金属层薄膜,通过构图工艺形成包括数据线、源电极、漏电极、TFT沟道区域和存储电极的图形,所述存储电极位于所述数据线两侧的栅线之上,且通过所述栅绝缘层过孔与所述栅线连接;
步骤4、在完成步骤3的基板上沉积钝化层薄膜,通过构图工艺形成包括钝化层过孔的图形,所述钝化层过孔位于所述漏电极的上方;
步骤5、在完成步骤4的基板上沉积透明导电薄膜,通过构图工艺形成包括像素电极的图形,所述像素电极通过所述钝化层过孔与漏电极连接。
本发明上述技术方案中,由于存储电极设置在栅线上方,存储电极与漏电极、源电极和数据线同层设置,因此提高了单位面积存储电容。由于存储电极设置在栅线上方,不会遮挡像素区域,因此本发明有效提高了开口率和显示亮度,从整体上提高了显示质量。In the above technical solution of the present invention, since the storage electrode is arranged above the gate line, and the storage electrode is arranged on the same layer as the drain electrode, the source electrode and the data line, the storage capacitance per unit area is increased. Since the storage electrode is arranged above the gate line and does not block the pixel area, the invention effectively improves the aperture ratio and display brightness, and improves the display quality as a whole.
图23为本发明TFT-LCD阵列基板制造方法具体实施例的流程图,在图22所示技术方案中,所述步骤2包括:Fig. 23 is a flowchart of a specific embodiment of the method for manufacturing a TFT-LCD array substrate according to the present invention. In the technical solution shown in Fig. 22, the
步骤11、采用等离子体增强化学气相沉积方法,在完成步骤1的基板上依次沉积栅绝缘层薄膜、半导体层薄膜和掺杂半导体层薄膜;
步骤12、在所述掺杂半导体层薄膜上涂覆一层光刻胶;
步骤13、采用半色调或灰色调掩模板曝光,使光刻胶形成光刻胶完全去除区域、光刻胶完全保留区域和光刻胶半保留区域;光刻胶完全保留区域对应于有源层图形所在区域,光刻胶完全去除区域对应于栅绝缘层过孔图形所在区域,光刻胶半保留区域对应于上述图形以外的区域;显影处理后,光刻胶完全保留区域的光刻胶厚度没有变化,光刻胶完全去除区域的光刻胶被完全去除,光刻胶半保留区域的光刻胶厚度减少;Step 13: Exposing the photoresist with a half-tone or gray-tone mask to form a photoresist completely removed area, a photoresist completely reserved area, and a photoresist half-retained area; the photoresist completely reserved area corresponds to the active layer The area where the pattern is located, the area where the photoresist is completely removed corresponds to the area where the via hole pattern of the gate insulating layer is located, and the semi-retained area of the photoresist corresponds to the area other than the above pattern; after the development treatment, the thickness of the photoresist in the area where the photoresist is completely retained No change, the photoresist in the photoresist completely removed area is completely removed, and the photoresist thickness in the photoresist semi-retained area is reduced;
步骤14、通过第一次刻蚀工艺完全刻蚀掉光刻胶完全去除区域的掺杂半导体层薄膜、半导体层薄膜和栅绝缘层薄膜,形成栅绝缘层过孔图形;
步骤15、通过灰化工艺去除光刻胶半保留区域的光刻胶,暴露出该区域的掺杂半导体层薄膜;
步骤16、通过第二次刻蚀工艺完全刻蚀掉光刻胶半保留区域的掺杂半导体层薄膜和半导体层薄膜,形成有源层图形;
步骤17、剥离剩余的光刻胶。
本实施例是一种采用多步刻蚀工艺通过一次构图工艺同时形成有源层和栅绝缘层过孔图形的技术方案,其制备过程已在前述图7~图15所示技术方案中详细介绍,这里不再赘述。This embodiment is a technical solution for simultaneously forming the active layer and the gate insulating layer through a patterning process using a multi-step etching process. The preparation process has been introduced in detail in the technical solutions shown in Figures 7-15 above , which will not be repeated here.
实际使用中,本发明TFT-LCD阵列基板制造方法的步骤2可以由二次采用普通掩模板的构图工艺完成,即通过一次采用普通掩模板的构图工艺形成有源层图形,通过一次采用普通掩模板的构图工艺形成栅绝缘层过孔。In actual use,
本发明步骤1中,首先采用磁控溅射或热蒸发的方法,在基板(如玻璃基板或石英基板)上沉积栅金属层薄膜,栅金属层薄膜可以采用Cr、W、Ti、Ta、Mo、Al、Cu等金属或合金,也可以采用由多个金属层薄膜构成的复合层薄膜。采用普通掩模板通过构图工艺形成包括栅线和栅电极的图形。In
本发明步骤3中,采用磁控溅射或热蒸发的方法,沉积源漏金属层薄膜,源漏金属层薄膜可以采用Cr、W、Ti、Ta、Mo、Al、Cu等金属或合金,也可以采用由多个金属层薄膜构成的复合层薄膜。采用普通掩模板通过构图工艺对源漏金属层薄膜进行构图,形成数据线、源电极、漏电极、TFT沟道区域和存储电极图形,其中源电极的一端位于有源层上,另一端与数据线连接,漏电极的一端位于有源层上,与源电极相对设置,源电极与漏电极之间形成TFT沟道区域,TFT沟道区域的之间的掺杂半导体层薄膜被完全刻蚀掉,并刻蚀掉部分厚度的半导体层薄膜,暴露出半导体层薄膜;存储电极位于数据线两侧的栅线上方,并通过栅绝缘层过孔与栅线连接。实际应用中,本次构图工艺还可以同时形成遮挡条图形,遮挡条用于进一步遮挡漏光区域的光线,进一步地,遮挡条还可以与存储电极连接成一个整体。存储电极的形状和尺寸可以根据实际需要设计。In
本发明步骤4中,采用PECVD方法沉积钝化层薄膜。钝化层薄膜可以采用氧化物、氮化物或氧氮化合物,对应的反应气体可以为SiH4、NH3、N2的混合气体或SiH2Cl2、NH3、N2的混合气体。采用普通掩模板通过构图工艺对钝化层薄膜进行构图,形成钝化层过孔,其中钝化层过孔位于漏电极的上方。本构图工艺中,还同时形成有栅线接口区域的栅线接口过孔和数据线接口区域的数据线接口过孔等图形。上述通过构图工艺形成栅线接口过孔和数据线接口过孔图形的工艺已广泛应用于目前的构图工艺中。In
本发明步骤5中,采用磁控溅射或热蒸发的方法,沉积透明导电薄膜,透明导电薄膜可以采用氧化铟锡(ITO)、氧化铟锌(IZO)或氧化铝锌等材料,也可以采用其它金属及金属氧化物。采用普通掩模板通过构图工艺形成像素电极,像素电极通过钝化层过孔与漏电极连接。In
最后应说明的是:以上实施例仅用以说明本发明的技术方案而非限制,尽管参照较佳实施例对本发明进行了详细说明,本领域的普通技术人员应当理解,可以对本发明的技术方案进行修改或者等同替换,而不脱离本发明技术方案的精神和范围。Finally, it should be noted that: the above examples are only used to illustrate the technical solutions of the present invention without limitation, although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be Modifications or equivalent replacements can be made without departing from the spirit and scope of the technical solutions of the present invention.
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