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CN112332813B - CMOS hybrid type edge memristor D trigger circuit with asynchronous setting and resetting - Google Patents

CMOS hybrid type edge memristor D trigger circuit with asynchronous setting and resetting Download PDF

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CN112332813B
CN112332813B CN202011282372.XA CN202011282372A CN112332813B CN 112332813 B CN112332813 B CN 112332813B CN 202011282372 A CN202011282372 A CN 202011282372A CN 112332813 B CN112332813 B CN 112332813B
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memristor
terminal
inverter
latch module
output terminal
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CN112332813A (en
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林弥
陈俊杰
李路平
王旭亮
韩琪
罗文瑶
吕伟锋
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Guangzhou Chick Information Technology Co ltd
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Hangzhou Dianzi University
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356Bistable circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/012Modifications of generator to improve response time or to decrease power consumption
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

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Abstract

The invention discloses a CMOS mixed edge memristor D trigger circuit with asynchronous setting and resetting, which has the characteristic of non-volatile and has an asynchronous setting and resetting function. The whole circuit comprises three modules: the device comprises a front-stage memristor D latch module, a rear-stage memristor D latch module and an asynchronous memristor set reset module. The front-stage memristor D latch module comprises a MOS tube T 1 、T 2 、T 3 、T 4 And T 5 Memristor M 1 Resistance R 1 2 CMOS inverters N 1 And N 2 The method comprises the steps of carrying out a first treatment on the surface of the The later-stage memristor D latch module comprises a MOS tube T 6 、T 7 、T 8 、T 9 And T 10 Memristor M 2 Resistor R 2 2 CMOS inverters N 5 And N 6 The method comprises the steps of carrying out a first treatment on the surface of the The asynchronous memristor setting and resetting module comprises a memristor M 3 、M 4 、M 5 、M 6 、M 7 、M 8 And M 9 And 2 inverters N 7 And N 8 The method comprises the steps of carrying out a first treatment on the surface of the There are also 2 CMOS inverters N for clock input 3 And N 4 . The circuit utilizes the Biolek threshold type memristor, the model has threshold characteristics and memory characteristics, and the whole circuit is simple in structure and high in response speed by utilizing the memristor model.

Description

一种带异步置位复位的CMOS混合型边沿忆阻D触发器电路A CMOS Hybrid Edge Memristor D Flip-Flop Circuit with Asynchronous Set-Reset

技术领域technical field

本发明属于电路设计技术领域,涉及一种忆阻D触发器电路,具体涉及一种带异步置位复位的CMOS混合型边沿忆阻D触发器电路,实现上升沿触发、具有非易失性的特点和异步置位复位功能。The invention belongs to the technical field of circuit design, and relates to a memristor D flip-flop circuit, in particular to a CMOS hybrid edge memristor D flip-flop circuit with asynchronous reset, which realizes rising edge triggering and has non-volatile features and an asynchronous set-reset function.

背景技术Background technique

忆阻器最早于1971年被提出,作为新型器件已经被广泛研究,针对忆阻器的非易失性和滞回等特性,将忆阻器应用于神经网络、存储器、数字逻辑电路等领域的研究已经相对比较全面。但是由于纳米技术存在制作困难和成本高等不足,忆阻器还未作为一个商业产品走向市场,目前主要利用忆阻器的各种等效电路模型和数学模型来设计电路,其中阈值型忆阻器模型可以使忆阻器工作在高低阻态上,类似开关的特性,非常适合应用于数字逻辑电路,比如与、或、异或等忆阻逻辑运算单元,以及加法器、乘法器等忆阻组合逻辑电路,但是目前对忆阻时序逻辑电路特别是触发器电路的研究还较少。The memristor was first proposed in 1971 and has been widely studied as a new type of device. Aiming at the characteristics of non-volatility and hysteresis of the memristor, the memristor is applied to the neural network, memory, digital logic circuit and other fields. The research has been relatively comprehensive. However, due to the difficulties in manufacturing and high cost of nanotechnology, memristors have not yet entered the market as a commercial product. At present, various equivalent circuit models and mathematical models of memristors are mainly used to design circuits. The model can make memristors work in high and low resistance states, and has characteristics similar to switches. It is very suitable for digital logic circuits, such as memristive logic operation units such as AND, OR, XOR, and memristive combinations such as adders and multipliers. Logic circuits, but there is still less research on memristive sequential logic circuits, especially flip-flop circuits.

发明内容Contents of the invention

针对现在技术和研究成本上所存在的问题,本发明提供了一种带异步置位复位的CMOS混合型边沿忆阻D触发器电路,其中的忆阻器采用Biolek阈值型忆阻器,可对该模型的最大阻值Roff、最小阻值Ron、参数β(用于控制忆阻器模型的阻值变化速率,一般为1013)、阈值电压Vt等关键参数进行直接调整。Aiming at the problems existing in current technology and research cost, the present invention provides a CMOS hybrid edge memristor D flip-flop circuit with asynchronous reset, wherein the memristor adopts Biolek threshold type memristor, which can control Key parameters such as the maximum resistance value R off , the minimum resistance value R on , the parameter β (used to control the resistance change rate of the memristor model, generally 10 13 ), and the threshold voltage V t of the model are directly adjusted.

本发明解决技术问题所采取的技术方案如下:The technical solution adopted by the present invention to solve the technical problems is as follows:

一种带异步置位复位的CMOS混合型边沿忆阻D触发器电路,包括前级忆阻D锁存器模块、异步忆阻置位复位模块和后级忆阻D锁存器模块。其中,前级忆阻D锁存器模块包括MOS管T1、T2、T3、T4和T5,忆阻器M1,电阻R1以及CMOS反相器N1和N2;后级忆阻D锁存器模块包括MOS管T6,T7,T8,T9和T10,忆阻器M2,电阻R2以及CMOS反相器N5和N6;异步忆阻置位复位模块包括忆阻器M3、M4、M5、M6、M7、M8和M9以及反相器N7和N8;用于时钟输入的CMOS反相器N3和N4;其中MOS管T2、T4、T5、T6、T8和T10为NMOS晶体管,T1、T3、T7和T9为PMOS晶体管,M1、M2、M3、M4、M5、M6、M7、M8和M9均为Biolek阈值型忆阻器。在前级忆阻D锁存器模块内,T1、T2、T3、T4和T5的栅极连接反相器N3的输出端和N4的输入端相连接作为前级忆阻D锁存器模块的时钟输入口;T2的源极作为前级忆阻D锁存器模块的信号输入端也即整个边沿忆阻D触发器的输入端D,T2的漏极连接T1和T4的漏极;T1的源极连接直流电压V2;T4的源极连接电阻R1的一端、忆阻器M1的负端和反相器N1的输入端;T3的源极连接直流电压V1,漏极连接忆阻器M1的正端和T5的源极;T5的漏极连接反相器N1的输出端和反相器N2的输入端;电阻R1的另一端连接地;反相器N2的输出端作为前级忆阻器D锁存器模块的输出端Q1;在后级忆阻D锁存器模块内,T6、T7、T8、T9和T10的栅极连接反相器N4的输出端作为后级忆阻D锁存器模块的时钟输入口;MOS管T6的源极作为后级忆阻D锁存器模块的信号输入口连接前级忆阻D锁存器的输出端Q1(反相器N2的输出端),T6的漏极连接T7和T8的漏极;MOS管T7的源极连接直流电压V3;MOS管T8的源极连接电阻R2的一端、忆阻器M2的负端和反相器N5的输入端;MOS管T9的源极连接直流电压V4,漏极连接忆阻器M2的正端和MOS管T10的源极;MOS管T10的漏极连接反相器N5的输出端和反相器N6的输入端;电阻R2的另一端连接地;反相器N6的输出端作为后级忆阻D锁存器模块的信号输出端Q2。异步忆阻置位复位模块作为D触发器的外加电路,其连接为:反相器N7的输入端与忆阻器M3的正端连接在一起作为置位信号S的输入端,N7的输出端连接忆阻器M5的正端;反相器N8的输入端作为复位信号R的输入端,N8的输出端连接忆阻器M6和M4的正端;忆阻器M7的正端连接后级忆阻D锁存器模块的输出端Q2(反相器N6的输出端);忆阻器M3和M4的负端连接连接忆阻器M8的负端;忆阻器M5、M6和M6的负端连接连接忆阻器M9的负端;忆阻器M8和M9的负端连接作为整个边沿忆阻D触发器最终输出端Q。A CMOS hybrid edge memristor D flip-flop circuit with an asynchronous set-reset comprises a front-stage memristive D-latch module, an asynchronous memristive set-reset module and a subsequent-stage memristive D-latch module. Among them, the front-stage memristor D latch module includes MOS transistors T 1 , T 2 , T 3 , T 4 and T 5 , memristor M 1 , resistor R 1 and CMOS inverters N 1 and N 2 ; The stage memristor D latch module includes MOS transistors T 6 , T 7 , T 8 , T 9 and T 10 , memristor M 2 , resistor R 2 and CMOS inverters N 5 and N 6 ; the asynchronous memristor Bit reset module includes memristors M 3 , M 4 , M 5 , M 6 , M 7 , M 8 and M 9 and inverters N 7 and N 8 ; CMOS inverters N 3 and N for clock input 4 ; wherein MOS transistors T2 , T4 , T5 , T6 , T8 and T10 are NMOS transistors, T1 , T3 , T7 and T9 are PMOS transistors, M1 , M2 , M3 , M 4 , M 5 , M 6 , M 7 , M 8 and M 9 are all Biolek threshold memristors. In the previous-stage memristive D-latch module, the gates of T 1 , T 2 , T 3 , T 4 and T 5 are connected to the output terminal of inverter N 3 and the input terminal of N 4 as the previous-stage memory The clock input port of the resistive D latch module; the source of T2 is used as the signal input terminal of the previous memristive D latch module, that is, the input terminal D of the entire edge memristive D flip-flop, and the drain of T2 is connected The drains of T1 and T4 ; the source of T1 is connected to DC voltage V2 ; the source of T4 is connected to one end of resistor R1 , the negative end of memristor M1 and the input end of inverter N1 ; The source of T 3 is connected to the DC voltage V 1 , the drain is connected to the positive terminal of the memristor M 1 and the source of T 5 ; the drain of T 5 is connected to the output of the inverter N 1 and the output of the inverter N 2 input terminal; the other end of the resistor R 1 is connected to the ground; the output terminal of the inverter N 2 is used as the output terminal Q 1 of the previous-stage memristor D-latch module; in the subsequent-stage memristor D-latch module, T 6. The gates of T 7 , T 8 , T 9 and T 10 are connected to the output terminal of the inverter N 4 as the clock input port of the memristive D latch module of the subsequent stage; the source of the MOS transistor T 6 is used as the subsequent stage The signal input port of the memristive D-latch module is connected to the output terminal Q 1 of the preceding memristive D-latch (the output terminal of the inverter N 2 ), and the drain of T 6 is connected to the drains of T 7 and T 8 ; The source of the MOS transistor T7 is connected to the DC voltage V3 ; the source of the MOS transistor T8 is connected to one end of the resistor R2 , the negative end of the memristor M2 and the input end of the inverter N5 ; the MOS transistor T9 The source of the MOS transistor T10 is connected to the positive terminal of the memristor M2 and the source of the MOS transistor T10 ; the drain of the MOS transistor T10 is connected to the output terminal of the inverter N5 and the inverter N5 6 ; the other end of the resistor R 2 is connected to the ground; the output of the inverter N 6 is used as the signal output terminal Q 2 of the subsequent memristive D-latch module. The asynchronous memristor set reset module is used as an additional circuit of the D flip-flop, and its connection is as follows: the input terminal of the inverter N7 is connected with the positive terminal of the memristor M3 as the input terminal of the set signal S, and the N7 The output end of N8 is connected to the positive end of memristor M5 ; the input end of inverter N8 is used as the input end of reset signal R, and the output end of N8 is connected to the positive end of memristor M6 and M4 ; the memristor The positive terminal of M 7 is connected to the output terminal Q 2 (the output terminal of the inverter N 6 ) of the subsequent memristor D latch module; the negative terminals of the memristors M 3 and M 4 are connected to the memristor M 8 Negative terminal; the negative terminal of memristor M5 , M6 and M6 is connected to the negative terminal of memristor M9 ; the negative terminal of memristor M8 and M9 is connected as the final output of the entire edge memristor D flip-flop Terminal Q.

更进一步地,电阻R1的阻值需远远大于忆阻器M1设定的最低阻值且远远小于设定的最高阻值;电阻R2的阻值需远远大于忆阻器M2设定的最低阻值且远远小于设定的最高阻值。Furthermore, the resistance value of the resistor R1 needs to be much larger than the minimum resistance value set by the memristor M1 and much smaller than the maximum resistance value set; the resistance value of the resistor R2 needs to be much larger than the memristor M 2 The lowest resistance value set and far less than the highest resistance value set.

更进一步地,电压V1、V2、V3和V4为直流电压,V2和V3设定高电平,直流电压V1和V4的电压小于忆阻器M1和M4所设定的阈值电压。Furthermore, the voltages V 1 , V 2 , V 3 and V 4 are DC voltages, V 2 and V 3 are set to a high level, and the voltages of the DC voltages V 1 and V 4 are smaller than those set by the memristors M 1 and M 4 set the threshold voltage.

更进一步地,置位信号S和复位信号R不能同时1。Furthermore, the set signal S and the reset signal R cannot be 1 at the same time.

与现有技术相比,本发明提出了一种带异步置位复位的CMOS混合型边沿忆阻D触发器,其设计思路是将2个由CMOS与忆阻器混合构成的忆阻D锁存器级联构成,并且添加由忆阻器构成的异步置位复位电路,电路结构简单,功能齐全,系统的集成度高。前级忆阻D锁存器模块和后级忆阻D锁存器模块由忆阻器与CMOS混合构成,电路具有非易失性。异步忆阻置位复位模块由忆阻器构成的与门和或门构建而成,该模块使D触发器具有异步置位和复位的功能。本发明采用Biolek阈值型忆阻器模型,利用该阈值型忆阻器与CMOS实现了带异步置位复位的混合型边沿忆阻器D触发器电路具有非易失性,拥有异步置位和复位功能。Compared with the prior art, the present invention proposes a CMOS hybrid edge memristor D flip-flop with an asynchronous reset, and its design idea is to combine two memristor D latches composed of CMOS and memristor Memristors are cascaded, and an asynchronous set-reset circuit composed of memristors is added. The circuit structure is simple, the functions are complete, and the system integration is high. The front-stage memristor D-latch module and the subsequent-stage memristor D-latch module are composed of a mixture of memristor and CMOS, and the circuit is non-volatile. The asynchronous memristor set-reset module is constructed by an AND gate and an OR gate composed of memristors, and this module enables the D flip-flop to have asynchronous set and reset functions. The present invention adopts the Biolek threshold type memristor model, utilizes the threshold type memristor and CMOS to realize the hybrid edge memristor D flip-flop circuit with asynchronous set and reset has non-volatility, and has asynchronous set and reset Function.

附图说明Description of drawings

图1是本发明的电路结构框图。Fig. 1 is a block diagram of the circuit structure of the present invention.

图2是本发明所采用忆阻器的电路符号。Fig. 2 is a circuit symbol of the memristor used in the present invention.

图3是本发明所采用阈值型忆阻器模型的电流-电压曲线图。Fig. 3 is a current-voltage curve diagram of a threshold-type memristor model used in the present invention.

图4是本发明的具体电路结构图。Fig. 4 is a specific circuit structure diagram of the present invention.

图5是本发明的仿真波形图。Fig. 5 is a simulation waveform diagram of the present invention.

具体实施方式Detailed ways

为了使本发明的目的、技术方案及优点更加清楚明白,以下结合附图及发明实例,对本发明进一步说明。In order to make the objectives, technical solutions and advantages of the present invention more clear, the present invention will be further described below in conjunction with the accompanying drawings and examples of the invention.

图1是本发明的电路结构框图,本发明将前级忆阻D锁存、后级忆阻D锁存器和忆阻异步置位复位电路各作为一个模块,将这3个模块依次连接起来构建带异步置位复位的CMOS混合型边沿忆阻D触发器。如图1所示,构建边沿忆阻D触发器的方式是将前级忆阻D锁存器模块和后级D锁存器模块通过级联的方式构成,本发明还为使整个D触发器添加了完全由忆阻器构成的异步置位复位电路,整个D触发器使用的器件数量大大减少,电路结构简单,可以极大提高速度并降低功耗。Fig. 1 is a block diagram of the circuit structure of the present invention. In the present invention, the front-stage memristive D latch, the subsequent memristive D-latch and the memristive asynchronous reset circuit are each taken as a module, and these three modules are connected in sequence Construction of a CMOS hybrid edge memristive D flip-flop with asynchronous set-reset. As shown in Figure 1, the way to construct the edge memristive D flip-flop is to form the front-stage memristive D-latch module and the rear-stage D-latch module by cascading, and the present invention is also to make the entire D flip-flop With the addition of an asynchronous set-reset circuit composed entirely of memristors, the number of devices used in the entire D flip-flop is greatly reduced, and the circuit structure is simple, which can greatly increase the speed and reduce power consumption.

图2是本发明采用Biolek提出的阈值型忆阻器模型的电路符号,图3是忆阻器在外加正弦激励信号下的电流-电压波形,其中忆阻器相关参数设定为:β=1013、Roff=100kΩ、Ron=800Ω、Vt=4.5V;外加正弦电压激励相关参数设定为:幅度为6V,频率为100Hz。图2可以看出,该忆阻器模型具有滞回特性和阈值特性,正负电压下都各具有1个阈值,+Vt和-Vt。当忆阻器外加的正向激励电压大于正向阈值+Vt时忆阻器会成高阻态;当反向激励电压大于负向阈值-Vt时忆阻器会转变成低阻态,且在上述变化后若电压不变或者变化范围小于阈值电压,则忆阻器将会保持之前的阻态,直到忆阻器两端所加的激励电压差大于阈值。本发明中前级忆阻D锁存器模块和后级忆阻D锁存器模块中的忆阻器模型都承担起了记忆存储的作用。而异步忆阻置位复位模块则是利用忆阻器构成与门和或门,实现异步置位和复位的功能。Fig. 2 is the circuit symbol of the threshold type memristor model proposed by Biolek in the present invention, and Fig. 3 is the current-voltage waveform of the memristor under the external sinusoidal excitation signal, wherein the relevant parameters of the memristor are set as: β = 10 13. R off = 100kΩ, R on = 800Ω, V t = 4.5V; the parameters related to the external sinusoidal voltage excitation are set as: the amplitude is 6V, and the frequency is 100Hz. It can be seen from Fig. 2 that the memristor model has hysteresis characteristics and threshold characteristics, and each has a threshold value, +V t and -V t , under positive and negative voltages. When the positive excitation voltage applied to the memristor is greater than the positive threshold +V t , the memristor will be in a high resistance state; when the reverse excitation voltage is greater than the negative threshold -V t , the memristor will be transformed into a low resistance state, And after the above change, if the voltage remains unchanged or the variation range is smaller than the threshold voltage, the memristor will maintain the previous resistance state until the excitation voltage difference applied to both ends of the memristor is greater than the threshold value. In the present invention, both the memristor models in the front-stage memristive D-latch module and the subsequent-stage memristive D-latch module play the role of memory storage. The asynchronous memristor set reset module uses memristors to form AND gates and OR gates to realize asynchronous set and reset functions.

图4是本发明基于带异步置位复位的CMOS混合型边沿忆阻D触发器具体电路图。电压参数设定为:V2=V3=8V,V1=V4=3.4V;忆阻器参数设定为:M1和M2:β=1013、Roff=100kΩ、Ron=800Ω、Vt=3.5V;M3、M4、M5、M6、M7、M8和M9:β=1013、Roff=100kΩ、Ron=800Ω、Vt=0.5V;其他相关参数设定为:R1=R2=10kΩ。如图3所示,该边沿忆阻D触发器包括9个忆阻器M1、M2、M3,M4、M5、M6、M7、M8和M9定值电阻R1、R2(Ron<<R1,R2<<Roff,其中Ron和Roff分别为忆阻器设定的最低阻值和最高阻值),MOS管T2、T4、T5、T6、T8和T10为NMOS晶体管,T1、T3、T7和T9为PMOS晶体管,M1、M2、M3、M4、M5、M6、M7、M8和M9均为Biolek阈值型忆阻器。T1、T2、T3、T4和T5的栅极连接反相器N3的输出端和N4的输入端;T2的源极作为整个边沿忆阻D触发器的输入端D,T2的漏极连接T1和T4的漏极;T1的源极连接直流电压V2;T4的源极连接电阻R1的一端、忆阻器M1的负端和反相器N1的输入端;T3的源极连接直流电压V1,漏极连接忆阻器M1的正端和T5的源极;T5的漏极连接反相器N1的输出端和反相器N2的输入端;电阻R1的另一端连接地;反相器N2的输出端连接MOS管T6的源极;T6、T7、T8、T9和T10的栅极连接反相器N4的输出端;MOS管T6的源极连接反相器N2的输出端,T6的漏极连接T7和T8的漏极;MOS管T7的源极连接直流电压V3;MOS管T8的源极连接电阻R2的一端、忆阻器M2的负端和反相器N5的输入端;MOS管T9的源极连接直流电压V4,漏极连接忆阻器M2的正端和MOS管T10的源极;MOS管T10的漏极连接反相器N5的输出端和反相器N6的输入端;电阻R2的另一端连接地;反相器N6的输出端连接忆阻器M7的正端。反相器N7的输入端连接置位信号S,输出端连接忆阻器M5的正端;反相器N8的输入端连接复位端R,输出端连接忆阻器M6和M4的正端;忆阻器M3的正端连接置位信号S;忆阻器M7的正端连接反相器N6的输出端;忆阻器M3和M4的负端连接连接忆阻器M8的负端;忆阻器M5、M6和M6的负端连接连接忆阻器M9的负端;忆阻器M8和M9的负端连接作为整个边沿忆阻D触发器最终输出端Q;FIG. 4 is a specific circuit diagram of the present invention based on a CMOS hybrid edge memristive D flip-flop with asynchronous reset. The voltage parameters are set as: V 2 =V 3 =8V, V 1 =V 4 =3.4V; the memristor parameters are set as: M 1 and M 2 : β=10 13 , R off =100kΩ, R on = 800Ω, V t = 3.5V; M 3 , M 4 , M 5 , M 6 , M 7 , M 8 and M 9 : β = 10 13 , R off = 100kΩ, R on = 800Ω, V t = 0.5V; Other related parameters are set as: R 1 =R 2 =10kΩ. As shown in Figure 3, the edge memristor D flip-flop includes nine memristors M 1 , M 2 , M 3 , M 4 , M 5 , M 6 , M 7 , M 8 and M 9 fixed value resistor R 1 , R 2 (R on <<R 1 , R 2 <<R off , where R on and R off are the lowest resistance value and the highest resistance value set by the memristor respectively), MOS transistors T 2 , T 4 , T 5. T 6 , T 8 and T 10 are NMOS transistors, T 1 , T 3 , T 7 and T 9 are PMOS transistors, M 1 , M 2 , M 3 , M 4 , M 5 , M 6 , M 7 , Both M 8 and M 9 are Biolek threshold memristors. The gates of T 1 , T 2 , T 3 , T 4 and T 5 are connected to the output terminal of inverter N 3 and the input terminal of N 4 ; the source of T 2 is used as the input terminal D of the entire edge memristive D flip-flop , the drain of T 2 is connected to the drains of T 1 and T 4 ; the source of T 1 is connected to the DC voltage V 2 ; the source of T 4 is connected to one end of resistor R 1 , the negative end of memristor M 1 and the reverse phase The input terminal of the device N1 ; the source of T3 is connected to the DC voltage V1 , the drain is connected to the positive terminal of the memristor M1 and the source of T5 ; the drain of T5 is connected to the output terminal of the inverter N1 and the input terminal of inverter N2 ; the other end of resistor R1 is connected to ground; the output terminal of inverter N2 is connected to the source of MOS transistor T6 ; T6 , T7 , T8 , T9 and T10 The gate of the MOS transistor T6 is connected to the output terminal of the inverter N4 ; the source of the MOS transistor T6 is connected to the output terminal of the inverter N2 , and the drain of T6 is connected to the drains of T7 and T8 ; the drain of the MOS transistor T7 The source is connected to the DC voltage V3 ; the source of the MOS transistor T8 is connected to one end of the resistor R2 , the negative terminal of the memristor M2 and the input terminal of the inverter N5 ; the source of the MOS transistor T9 is connected to the DC voltage V 4 , the drain is connected to the positive terminal of the memristor M2 and the source of the MOS transistor T10 ; the drain of the MOS transistor T10 is connected to the output terminal of the inverter N5 and the input terminal of the inverter N6 ; the resistor The other end of R 2 is connected to the ground; the output end of the inverter N 6 is connected to the positive end of the memristor M 7 . The input terminal of the inverter N7 is connected to the set signal S, and the output terminal is connected to the positive terminal of the memristor M5 ; the input terminal of the inverter N8 is connected to the reset terminal R, and the output terminal is connected to the memristors M6 and M4 The positive terminal of the memristor M3 is connected to the set signal S; the positive terminal of the memristor M7 is connected to the output terminal of the inverter N6 ; the negative terminals of the memristor M3 and M4 are connected to the memory The negative terminal of resistor M8 ; the negative terminal of memristor M5 , M6 and M6 is connected to the negative terminal of memristor M9 ; the negative terminal of memristor M8 and M9 is connected as the whole edge memristor The final output terminal Q of the D flip-flop;

下面参照图5所示的PSPICE仿真波形图具体来解释本发明的带异步置位复位的混合型边沿忆阻D触发器工作原理。其中输入信号D、时钟输入信号CLK,置位信号S和复位信号R均为方波。本发明的边沿忆阻D触发器工作原理为:当CLK=0时,MOS管T2、T4和T5处于打开状态,MOS管T1和T3处于关断状态,此时输入信号D从Q1端输出,由于反相器N1的存在,忆阻器M1两端电压差大于忆阻器阈值电压,此时忆阻器M1会根据输入信号D的状态而存储相应状态(若D=1,则M1为低阻态即Ron;若D=0,则忆阻器为高阻态即Roff),当CLK由0变为1时,MOS管T2、T4和T5处于关断状态,MOS管T1和T3处于打开状态,电压V1由于小于忆阻器所设定的阈值电压,通过V1可以读出忆阻器M1此前存储的数据(若M1为高阻态则读出0,M1为低阻态则读出1),然后经过反相器N1和N2从Q2端输出。以上为前级忆阻器D锁存器工作原理,后级忆阻D锁存器工作原理与前级一样。将这两个锁存器级联可构成上升沿触发的D触发器,其原理为:当CLK=0时,前级忆阻D锁存器输入端打开忆阻器用于存储当前的转态,此时Q1=D,后级忆阻D锁存器输入端关闭,MOS管T7和T8打开,通过电压V4读出此前存储的状态并且通过Q2端输出。当上升沿到来时前级忆阻D锁存器输入端关闭(T2、T4和T5关闭),后级忆阻D锁存器输入端打开(T6、T8和T10打开),由电压V1读出M1中存储的状态,然后从Q1端输入到后级忆阻器D锁存器中并且从Q2端输出,即Q2=D。忆阻异步置位复位电路工作原理为:忆阻器M3和M4构成二输入与门,忆阻器M5、M6和M7构成三输入与门,忆阻器M8和M9构成二输入或门,因此整个忆阻异步置位复位电路的逻辑输出表达式为(S和R不能同时为1),当S=1,R=0时,由忆阻器M3和M4构成的二输入与门输出为1(M3和M4的负端),由忆阻器M8和M9构成二输入或门一端(M8的负端)为1,此时无论上升沿是否到来,输出端Q=1,起到了异步置位的功能;当S=0,R=1时,由忆阻器M3和M4构成的二输入与门输出为0,由忆阻器M5、M6和M7构成三输入与门输出为0,此时忆阻器M8和M9构成二输入或门两端(M8的负端,M9的负端)同时为0;此时无论上升沿是否到来,输出端Q=0起到异步复位的功能。在图5中,置位信号S在0-6us内为1,复位信号R在12.5-14us内为1,从图5中可以看出0-6us时输出端Q一直为1而不随输入信号变化和上升沿到来的影响;6-12.5us时输出端Q在CLK上升沿到来时,输出信号Q与输入信号D一致,符合D触发器定义;12.5-14us时输出端Q一直为0,而不受输入信号D变化和上升沿到来的影响,因此电路具有异步置位和复位的功能。The working principle of the hybrid edge memristive D flip-flop with asynchronous reset of the present invention will be explained in detail below with reference to the PSPICE simulation waveform shown in FIG. 5 . The input signal D, the clock input signal CLK, the set signal S and the reset signal R are all square waves. The working principle of the edge memristive D flip-flop of the present invention is: when CLK=0, MOS transistors T 2 , T 4 and T 5 are in the on state, and MOS transistors T 1 and T 3 are in the off state, at this time the input signal D Output from the Q1 terminal, due to the existence of the inverter N1 , the voltage difference between the two ends of the memristor M1 is greater than the threshold voltage of the memristor, and at this time, the memristor M1 will store the corresponding state according to the state of the input signal D ( If D=1, then M 1 is in a low-impedance state (R on ); if D=0, the memristor is in a high-impedance state (R off ), when CLK changes from 0 to 1, MOS transistors T 2 and T 4 and T5 are in the off state, MOS transistors T1 and T3 are in the open state, and since the voltage V1 is less than the threshold voltage set by the memristor, the previously stored data of the memristor M1 can be read through V1 ( If M 1 is in a high-impedance state, read 0, and if M 1 is in a low-impedance state, read 1), and then output from Q 2 through inverters N 1 and N 2 . The above is the working principle of the front-stage memristor D-latch, and the working principle of the subsequent-stage memristor D-latch is the same as that of the previous stage. Cascading these two latches can form a rising-edge triggered D flip-flop. The principle is: when CLK=0, the input terminal of the previous-stage memristive D-latch turns on the memristor to store the current transition state. At this time, Q 1 =D, the input terminal of the subsequent memristive D latch is closed, the MOS transistors T 7 and T 8 are opened, and the previously stored state is read out through the voltage V 4 and output through the Q 2 terminal. When the rising edge arrives, the input terminal of the memristive D-latch of the previous stage is closed (T 2 , T 4 and T 5 are closed), and the input terminal of the subsequent memristive D-latch is open (T 6 , T 8 and T 10 are open) , the state stored in M1 is read from the voltage V1 , and then input from the Q1 terminal to the subsequent memristor D latch and output from the Q2 terminal, that is, Q2 =D. The working principle of the memristor asynchronous set-reset circuit is: memristors M3 and M4 form a two-input AND gate, memristors M5 , M6 and M7 form a three-input AND gate, memristors M8 and M9 constitutes a two-input OR gate, so the logic output expression of the entire memristor asynchronous reset circuit is (S and R can not be 1 simultaneously), when S=1, R=0, the two-input AND gate output that is formed by memristor M3 and M4 is 1 (the negative terminal of M3 and M4 ), by Memristors M 8 and M 9 constitute a two-input OR gate and one end (the negative end of M 8 ) is 1. At this time, no matter whether the rising edge arrives, the output Q=1, which plays the function of asynchronous setting; when S=0 , when R=1, the output of the two-input AND gate composed of memristors M 3 and M 4 is 0, and the output of the three-input AND gate composed of memristors M 5 , M 6 and M 7 is 0. At this time, the memristor Devices M8 and M9 form a two-input OR gate, and both ends of the gate (the negative terminal of M8 and the negative terminal of M9 ) are simultaneously 0; at this time, no matter whether the rising edge comes or not, the output terminal Q=0 serves as an asynchronous reset function. In Figure 5, the set signal S is 1 within 0-6us, and the reset signal R is 1 within 12.5-14us. It can be seen from Figure 5 that the output terminal Q is always 1 during 0-6us without changing with the input signal and the impact of the rising edge; when the output terminal Q arrives at the rising edge of CLK at 6-12.5us, the output signal Q is consistent with the input signal D, which conforms to the definition of D flip-flop; at 12.5-14us, the output terminal Q is always 0, instead of Affected by the change of the input signal D and the arrival of the rising edge, the circuit has the function of setting and resetting asynchronously.

在本发明中,需注意的是电阻R1的阻值需远远大于忆阻器M1设定的最低阻值且远远小于设定的最高阻值;电阻R2的阻值需远远大于忆阻器M2设定的最低阻值且远远小于设定的最高阻值。In the present invention, it should be noted that the resistance value of the resistor R1 needs to be much larger than the minimum resistance value set by the memristor M1 and far smaller than the set maximum resistance value; the resistance value of the resistor R2 needs to be much larger The minimum resistance value set for the memristor M2 is much smaller than the maximum resistance value set.

在本发明中,还需注意的是电压V1、V2、V3、V4、V5和V6为直流电压,电压V2和V5为高电平,电压V1、V3和V4小于忆阻器所设定的阈值电压。In the present invention, it should also be noted that the voltages V 1 , V 2 , V 3 , V 4 , V 5 and V 6 are DC voltages, the voltages V 2 and V 5 are high level, and the voltages V 1 , V 3 and V4 is less than the threshold voltage set by the memristor.

在本发明中,需注意置位信号S和复位信号R的不能同时为1In the present invention, it should be noted that the set signal S and the reset signal R cannot be 1 at the same time

本发明所提供的一种带异步置位复位的CMOS混合型边沿忆阻D触发器,电路性能稳定,具有非易失性,电路具有异步置位和复位功能,且电路仿真测试效果良好。可根据具本发明具体电路图进行实际样品的制作。The CMOS hybrid edge memristor D flip-flop with asynchronous setting and reset provided by the present invention has stable circuit performance and non-volatility, the circuit has asynchronous setting and resetting functions, and the circuit simulation test effect is good. The production of actual samples can be carried out according to the specific circuit diagram of the present invention.

本领域的技术人员容易理解,以上所述仅为本发明的较佳实施例,并不用以限制本发明,凡在本发明的精神和原则之内,所做的任何修改、替换和改进等,均应包含在本发明的保护范围内。Those skilled in the art can easily understand that the above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, substitutions and improvements made within the spirit and principles of the present invention, etc., All should be included in the protection scope of the present invention.

Claims (4)

1.一种带异步置位复位的CMOS混合型边沿忆阻D触发器电路,其特征在于整个电路包括前级忆阻D锁存器模块、异步忆阻置位复位模块和后级忆阻D锁存器模块,其中,前级忆阻D锁存器模块包括MOS管T1、T2、T3、T4和T5,忆阻器M1,电阻R1以及CMOS反相器N1和N2;后级忆阻D锁存器模块包括MOS管T6、T7、T8、T9和T10,忆阻器M2,电阻R2以及CMOS反相器N5和N6;异步忆阻置位复位模块包括忆阻器M3、M4、M5、M6、M7、M8和M9以及反相器N7和N8;用于时钟输入的CMOS反相器N3和N4;其中MOS管T2、T4、T5、T6、T8和T10为NMOS晶体管,T1、T3、T7和T9为PMOS晶体管,M1、M2、M3、M4、M5、M6、M7、M8和M9均为Biolek阈值型忆阻器;在前级忆阻D锁存器模块内,T1、T2、T3、T4和T5的栅极连接反相器N3的输出端和N4的输入端作为前级忆阻D锁存器模块的时钟输入口;T2的源极作为前级忆阻D锁存器模块的信号输入端也即整个边沿忆阻D触发器的输入端D,T2的漏极连接T1和T4的漏极;T1的源极连接直流电压V2;T4的源极连接电阻R1的一端、忆阻器M1的负端和反相器N1的输入端;T3的源极连接直流电压V1,漏极连接忆阻器M1的正端和T5的源极;T5的漏极连接反相器N1的输出端和反相器N2的输入端;电阻R1的另一端连接地;反相器N2的输出端作为前级忆阻器D锁存器模块的输出端Q1;在后级忆阻D锁存器模块内,T6、T7、T8、T9和T10的栅极连接反相器N4的输出端作为后级忆阻D锁存器模块的时钟输入口;MOS管T6的源极作为后级忆阻D锁存器模块的信号输入口连接前级忆阻D锁存器的输出端Q1,即反相器N2的输出端,T6的漏极连接T7和T8的漏极;MOS管T7的源极连接直流电压V3;MOS管T8的源极连接电阻R2的一端、忆阻器M2的负端和反相器N5的输入端;MOS管T9的源极连接直流电压V4,漏极连接忆阻器M2的正端和MOS管T10的源极;MOS管T10的漏极连接反相器N5的输出端和反相器N6的输入端;电阻R2的另一端连接地;反相器N6的输出端作为后级忆阻D锁存器模块的信号输出端Q2;异步忆阻置位复位模块其连接为:反相器N7的输入端与忆阻器M3的正端连接在一起作为置位信号S的输入端,N7的输出端连接忆阻器M5的正端;反相器N8的输入端作为复位信号R的输入端,N8的输出端连接忆阻器M6和M4的正端;忆阻器M7的正端连接后级忆阻D锁存器模块的输出端Q2,即反相器N6的输出端;忆阻器M3和M4的负端连接连接忆阻器M8的负端;忆阻器M5、M6和M6的负端连接连接忆阻器M9的负端;忆阻器M8和M9的负端连接作为整个边沿忆阻D触发器最终输出端Q。1. A CMOS hybrid edge memristor D flip-flop circuit with an asynchronous reset, characterized in that the entire circuit includes a front-stage memristor D latch module, an asynchronous memristor reset module and a post-stage memristor D A latch module, wherein the pre-memristor D latch module includes MOS transistors T 1 , T 2 , T 3 , T 4 and T 5 , a memristor M 1 , a resistor R 1 and a CMOS inverter N 1 and N 2 ; the subsequent memristive D latch module includes MOS transistors T 6 , T 7 , T 8 , T 9 and T 10 , memristor M 2 , resistor R 2 and CMOS inverters N 5 and N 6 ; Asynchronous memristor set reset module includes memristors M 3 , M 4 , M 5 , M 6 , M 7 , M 8 and M 9 and inverters N 7 and N 8 ; CMOS inversion for clock input Devices N 3 and N 4 ; where MOS transistors T 2 , T 4 , T 5 , T 6 , T 8 and T 10 are NMOS transistors, T 1 , T 3 , T 7 and T 9 are PMOS transistors, M 1 , M 2 , M 3 , M 4 , M 5 , M 6 , M 7 , M 8 and M 9 are all Biolek threshold type memristors; in the previous stage memristive D-latch module, T 1 , T 2 , T 3. The gates of T4 and T5 are connected to the output terminal of inverter N3 and the input terminal of N4 as the clock input port of the previous-stage memristor D-latch module; the source of T2 is used as the previous-stage memristor The signal input terminal of the D latch module is also the input terminal D of the entire edge memristive D flip-flop. The drain of T2 is connected to the drains of T1 and T4 ; the source of T1 is connected to the DC voltage V2 ; T The source of T3 is connected to one end of resistor R1 , the negative end of memristor M1 and the input end of inverter N1 ; the source of T3 is connected to DC voltage V1 , and the drain is connected to the positive end of memristor M1 terminal and the source of T5 ; the drain of T5 is connected to the output terminal of inverter N1 and the input terminal of inverter N2 ; the other end of resistor R1 is connected to ground; the output terminal of inverter N2 is used as The output terminal Q 1 of the memristor D latch module of the previous stage; in the memristor D latch module of the subsequent stage, the gates of T 6 , T 7 , T 8 , T 9 and T 10 are connected to the inverter N The output terminal of 4 is used as the clock input port of the memristor D latch module of the subsequent stage; the source of the MOS transistor T6 is used as the signal input port of the memristor D latch module of the latter stage and connected to the The output terminal Q1 is the output terminal of the inverter N2 , the drain of T6 is connected to the drains of T7 and T8 ; the source of the MOS transistor T7 is connected to the DC voltage V3 ; the source of the MOS transistor T8 Connect one end of the resistor R2 , the negative end of the memristor M2 and the input end of the inverter N5 ; the source of the MOS transistor T9 is connected to the DC voltage V4 , and the drain is connected to the positive end of the memristor M2 and The source of the MOS transistor T10 ; the drain of the MOS transistor T10 is connected to the output terminal of the inverter N5 and the input terminal of the inverter N6 ; the other end of the resistor R2 is connected to the ground; the output of the inverter N6 terminal as the signal output terminal Q2 of the subsequent memristor D latch module; the connection of the asynchronous memristor reset module is as follows: the input terminal of the inverter N7 is connected with the positive terminal of the memristor M3 as The input terminal of the setting signal S, the output terminal of N7 is connected to the positive terminal of the memristor M5 ; the input terminal of the inverter N8 is used as the input terminal of the reset signal R, and the output terminal of N8 is connected to the memristor M6 and the positive terminal of M4 ; the positive terminal of memristor M7 is connected to the output terminal Q2 of the subsequent memristor D latch module, that is, the output terminal of inverter N6 ; the positive terminal of memristor M3 and M4 The negative terminal is connected to the negative terminal of the memristor M8 ; the negative terminal of the memristor M5 , M6 and M6 is connected to the negative terminal of the memristor M9 ; the negative terminal of the memristor M8 and M9 is connected As the final output terminal Q of the entire edge memristive D flip-flop. 2.根据权利要求1所述的带异步置位复位的CMOS混合型边沿忆阻D触发器电路,其特征在于,电阻R1的阻值需远远大于忆阻器M1设定的最低阻值且远远小于设定的最高阻值;电阻R2的阻值需远远大于忆阻器M2设定的最低阻值且远远小于设定的最高阻值。2. The CMOS hybrid edge memristor D flip-flop circuit with asynchronous reset according to claim 1, wherein the resistance value of resistor R1 needs to be far greater than the minimum resistance set by memristor M1 value and far less than the set maximum resistance value; the resistance value of the resistor R2 needs to be much greater than the set minimum resistance value of the memristor M2 and far less than the set maximum resistance value. 3.根据权利要求1所述的带异步置位复位的CMOS混合型边沿忆阻D触发器电路,其特征在于,电压V1、V2、V3和V4为直流电压,V2和V3是高电平,直流电压V1和V4的电压大小小于忆阻器所设定的阈值电压。3. The CMOS hybrid edge memristor D flip-flop circuit with asynchronous set reset according to claim 1, characterized in that, voltages V 1 , V 2 , V 3 and V 4 are DC voltages, and V 2 and V 3 is a high level, and the voltages of the DC voltages V 1 and V 4 are smaller than the threshold voltage set by the memristor. 4.根据权利要求1所述的带异步置位复位的CMOS混合型边沿忆阻D触发器电路,置位端S和复位端R的不能同时为1。4. The CMOS hybrid edge memristor D flip-flop circuit with asynchronous set and reset according to claim 1, the set terminal S and the reset terminal R cannot be 1 at the same time.
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