CN111748789B - A device and method for depositing pure DLC with graphite cathode arc enhanced glow discharge - Google Patents
A device and method for depositing pure DLC with graphite cathode arc enhanced glow discharge Download PDFInfo
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Abstract
一种石墨阴极弧增强辉光放电沉积纯DLC的装置及其方法,本发明涉及一种石墨阴极弧增强辉光放电沉积纯DLC的装置及其方法。本发明的目的是解决现有金属阴极弧增强辉光放电制备DLC时金属元素对DLC的“污染”问题,本发明在石墨阴极弧与阳极之间构建放电通路,含碳气体在放电通路上通入,通入的含碳气体被石墨阴极弧发射出来的高密度电子离化,沉积在工件表面形成纯DLC。含碳等离子体中离子与原子的比例可以通过改变阴、阳极之间的放电模式以及调节放电参数来控制。本发明避免了金属靶增强辉光放电制备DLC时,金属掺杂对摩擦学性能的不良影响。本发明应用于等离子体增强化学气相沉积制备DLC领域。
A graphite cathode arc enhanced glow discharge deposition pure DLC device and method, the invention relates to a graphite cathode arc enhanced glow discharge deposition pure DLC device and method. The purpose of the present invention is to solve the problem of "contamination" of DLC by metal elements when the DLC is prepared by the enhanced glow discharge of the metal cathode arc. The carbon-containing gas is ionized by the high-density electrons emitted by the graphite cathode arc and deposited on the surface of the workpiece to form pure DLC. The ratio of ions to atoms in carbon-containing plasma can be controlled by changing the discharge pattern between the cathode and anode and adjusting the discharge parameters. The invention avoids the bad influence of metal doping on the tribological properties when the metal target enhances the glow discharge to prepare the DLC. The invention is applied to the field of preparing DLC by plasma enhanced chemical vapor deposition.
Description
技术领域technical field
本发明涉及一种石墨阴极弧增强辉光放电沉积纯DLC的装置及其方法。The invention relates to a device and a method for a graphite cathode arc enhanced glow discharge deposition pure DLC.
背景技术Background technique
DLC(Diamond-like carbon)薄膜由于其低摩擦系数、高硬度、耐磨性好以及其化学惰性得到了广泛应用,如汽车零部件、船体耐海水腐蚀以及对于铝合金的加工等。DLC (Diamond-like carbon) films have been widely used due to their low friction coefficient, high hardness, good wear resistance and chemical inertness, such as auto parts, seawater corrosion resistance of ship hulls, and processing of aluminum alloys.
沉积DLC方法很多,主要是基于等离子体化学气相沉积(PECVD)的方法。工业上应用最多的是工件自辉光放电的方法。这种方法是以工件自身作为放电源,在其上施加中、高频偏压,偏压大小一般高于-300V。这种方法存在以下问题:1、受工件形状以及装炉量的影响很大,工件变化的话,需要重新调整工艺;2、辉光放电强弱主要依赖于偏压大小,这样薄膜的结构及性能无法灵活调控;3、工作气压一般很高,对于带孔的工件处理困难;4、沉积速率低,一般小于1.5μm/h;There are many methods for depositing DLC, mainly based on plasma chemical vapor deposition (PECVD). The most widely used method in industry is the method of self-glow discharge of workpieces. This method uses the workpiece itself as the discharge source, and applies medium and high frequency bias on it, and the bias is generally higher than -300V. This method has the following problems: 1. It is greatly affected by the shape of the workpiece and the amount of furnace loading. If the workpiece changes, the process needs to be re-adjusted; 2. The strength of the glow discharge mainly depends on the bias voltage, so the structure and performance of the film Unable to adjust flexibly; 3. The working pressure is generally high, and it is difficult to handle workpieces with holes; 4. The deposition rate is low, generally less than 1.5μm/h;
AE公司推出的阳极层离子源,使得离化与偏压进行了解耦,但是由于离子源的工作特点,在镀膜时,离子源容易打火,造成镀膜过程不稳定,甚至打火产生的杂质容易进入薄膜中,影响薄膜质量,同时该技术的沉积速率也比较低;The anode layer ion source introduced by AE company decouples ionization and bias voltage. However, due to the working characteristics of the ion source, the ion source is easy to ignite during coating, resulting in unstable coating process and even impurities generated by ignition. It is easy to enter the film, affecting the quality of the film, and the deposition rate of this technology is relatively low;
使用微波放电来沉积DLC,在微波激发的高密度等离子体下,DLC的沉积速率可以高达15μm/h。但是微波自身工艺安全性不容易控制,且设备复杂、工艺窗口窄、造价昂贵;Using microwave discharge to deposit DLC, the deposition rate of DLC can be as high as 15 μm/h under the high density plasma excited by microwave. However, the process safety of microwave itself is not easy to control, and the equipment is complicated, the process window is narrow, and the cost is high;
利用笼网型空心阴极制备DLC,其沉积速率可以达到6μm/h。但是由于其工件是封闭在笼网内部的,很难进行打底层的设计以及制备金属掺杂DLC,因此很难满足一些工况要求;The DLC is prepared by using a cage-mesh hollow cathode, and its deposition rate can reach 6 μm/h. However, because the workpiece is enclosed in the cage net, it is difficult to design the bottom layer and prepare metal-doped DLC, so it is difficult to meet the requirements of some working conditions;
在阴极弧工作过程中会产生大量的电子,可以通过外置阳极将电子从靶附近引出用来离化真空室中的气体,提高了气体辉光放电的强度,产生高密度等离子体。利用弧增强辉光放电的方法提高Ar气离化率,在镀膜前Ar离子刻蚀过程中起到很好的效果,提高了薄膜与基体之间的结合力。A large number of electrons will be generated during the working process of the cathode arc, and the electrons can be extracted from the vicinity of the target through the external anode to ionize the gas in the vacuum chamber, which improves the intensity of the gas glow discharge and produces high-density plasma. The arc-enhanced glow discharge method is used to improve the ionization rate of Ar gas, which has a good effect in the process of Ar ion etching before coating, and improves the bonding force between the film and the substrate.
但用常规金属弧增强辉光放电的方法离化乙炔来制备DLC时,在电子被阳极引出的过程中,金属离子会伴随电子被牵引出,沉积到薄膜表面,形成元素掺杂的DLC,在应用上会对DLC的摩擦学性能起到不良影响;However, when the conventional metal arc enhanced glow discharge method is used to ionize acetylene to prepare DLC, in the process of electrons being drawn out by the anode, the metal ions will be pulled out along with the electrons and deposited on the surface of the film to form element-doped DLC. In application, it will adversely affect the tribological properties of DLC;
发明内容SUMMARY OF THE INVENTION
本发明的目的是解决现有金属阴极弧增强辉光放电制备DLC时金属元素对DLC的“污染”问题,而提供一种石墨阴极弧增强辉光放电沉积纯DLC的装置及其方法。The purpose of the present invention is to solve the problem of "contamination" of DLC by metal elements in the preparation of DLC by metal cathode arc enhanced glow discharge, and to provide a device and method for depositing pure DLC by graphite cathode arc enhanced glow discharge.
本发明一种石墨阴极弧增强辉光放电沉积纯DLC的装置,包括真空室、转架、偏压电源、第一石墨阴极弧、第二石墨阴极弧、第一金属阴极、第二金属阴极、第一阳极、第二阳极、第一高脉冲电源、第二高脉冲电源、第一直流电源和第二直流电源;真空室底部开有进气口;转架位于真空室底部圆心处,转架与真空室转动连接,沿圆周方向在真空室壁上均匀设有四个法兰,四个法兰分别固定连接第一石墨阴极弧、第一金属阴极、第二石墨阴极弧和第二金属阴极;第一石墨阴极弧和第二石墨阴极弧与转架之间均设有挡板,挡板两端与真空室内壁留有间隙;第一石墨阴极弧和第二石墨阴极弧为相对设置,第一金属阴极和第二金属阴极为相对设置;第一石墨阴极弧和第一金属阴极之间设有第一阳极、第二石墨阴极弧和第二金属阴极之间设有第二阳极;第一阳极和第二阳极均由基座和阳极本体组成,阳极本体与基座固定连接,真空室上开有阳极通孔,阳极基座通过阳极通孔插接在真空室上,阳极本体位于真空室内部;第一石墨阴极弧和第一阳极之间连有第一高脉冲电源、第二石墨阴极弧和第二阳极之间连有第二高脉冲电源;第一金属阴极和真空室之间连有第一直流电源,第二金属阴极和真空室之间连有第二直流电源;转架和真空室之间连有偏压电源。The present invention is a device for depositing pure DLC with graphite cathode arc enhanced glow discharge, comprising a vacuum chamber, a turret, a bias power supply, a first graphite cathode arc, a second graphite cathode arc, a first metal cathode, a second metal cathode, The first anode, the second anode, the first high-pulse power supply, the second high-pulse power supply, the first DC power supply and the second DC power supply; an air inlet is opened at the bottom of the vacuum chamber; The frame is rotatably connected with the vacuum chamber, and four flanges are evenly arranged on the wall of the vacuum chamber along the circumferential direction, and the four flanges are respectively fixedly connected to the first graphite cathode arc, the first metal cathode, the second graphite cathode arc and the second metal cathode. Cathode; baffles are provided between the first graphite cathode arc and the second graphite cathode arc and the turret, and there are gaps between the two ends of the baffle and the inner wall of the vacuum; the first graphite cathode arc and the second graphite cathode arc are oppositely arranged the first metal cathode and the second metal cathode are arranged oppositely; the first anode is arranged between the first graphite cathode arc and the first metal cathode, and the second anode is arranged between the second graphite cathode arc and the second metal cathode; The first anode and the second anode are both composed of a base and an anode body, the anode body is fixedly connected to the base, an anode through hole is opened on the vacuum chamber, the anode base is inserted into the vacuum chamber through the anode through hole, and the anode body is located in the vacuum chamber. Inside the vacuum chamber; a first high-pulse power supply is connected between the first graphite cathode arc and the first anode, and a second high-pulse power supply is connected between the second graphite cathode arc and the second anode; the connection between the first metal cathode and the vacuum chamber is A first DC power supply is connected intermittently, a second DC power supply is connected between the second metal cathode and the vacuum chamber, and a bias power supply is connected between the turn frame and the vacuum chamber.
本发明一种石墨阴极弧增强辉光放电沉积纯DLC的方法,包含以下步骤:一、用酒精超声清洗待镀工件,取出后吹干;然后置于真空室内的转架上,将真空室抽至真空度小于5×10-3Pa;二、对待镀工件进行Ar离子轰击清洗:从进气口向真空室里通入Ar气保持真空室的气压为0.3-1.0Pa,然后开启偏压电源,调整偏压值为-150--500V,占空比为10-80%;调整高脉冲电源,直流端电流为30-150A,脉冲端平均电流为30-200A,A method for depositing pure DLC with graphite cathode arc enhanced glow discharge of the present invention comprises the following steps: 1. ultrasonically cleaning the workpiece to be plated with alcohol, taking it out and drying it; The vacuum degree is less than 5×10 -3 Pa; 2. Ar ion bombardment cleaning of the workpiece to be plated: Pass Ar gas into the vacuum chamber from the air inlet to keep the air pressure of the vacuum chamber at 0.3-1.0Pa, and then turn on the bias power supply , adjust the bias voltage to -150--500V, the duty cycle is 10-80%; adjust the high pulse power supply, the current of the DC terminal is 30-150A, the average current of the pulse terminal is 30-200A,
脉冲放电电流50-5000A,频率为10-20000Hz,脉宽为5-1000μs,或仅开直流端,放电电流为30-150A,工件清洗时间为5-100min,得到清洗后的待镀工件;The pulse discharge current is 50-5000A, the frequency is 10-20000Hz, the pulse width is 5-1000μs, or only the DC terminal is opened, the discharge current is 30-150A, the workpiece cleaning time is 5-100min, and the workpiece to be plated after cleaning is obtained;
三、在清洗后的待镀工件上沉积过渡层;其中过渡层为Cr/CrN/CrCN/Cr-C、Ti/TiN/TiCN/Ti-C、Ti/TiAlN、Cr/CrAlN或Si/Si-DLC;3. Deposit a transition layer on the workpiece to be plated after cleaning; the transition layer is Cr/CrN/CrCN/Cr-C, Ti/TiN/TiCN/Ti-C, Ti/TiAlN, Cr/CrAlN or Si/Si- DLC;
四、石墨阴极弧增强辉光放电制备纯DLC:从进气口向真空室内通入氩气以及含碳前驱体气体,维持真空室的气压为0.1-5.0Pa;调整偏压电源的偏压值为50-10000V,占空比5-80%;调整高脉冲电源的平均电流为30-200A,脉冲放电电流50-50000A,频率为10-20000Hz,脉宽为5-1000μs,DLC的沉积时间5-500min;其中含碳前驱体气体为CH4、C2H2和C6H6中的一种或多种按任意比混合;4. Preparation of pure DLC by graphite cathode arc enhanced glow discharge: Pass argon gas and carbon-containing precursor gas into the vacuum chamber from the air inlet to maintain the pressure of the vacuum chamber at 0.1-5.0Pa; adjust the bias value of the bias power supply 50-10000V, duty cycle 5-80%; adjust the average current of high pulse power supply to 30-200A, pulse discharge current 50-50000A, frequency 10-20000Hz, pulse width 5-1000μs, DLC deposition time 5 -500min; wherein the carbon-containing precursor gas is one or more of CH 4 , C 2 H 2 and C 6 H 6 mixed in any ratio;
本发明的所述技术方案有如下优点:The technical solution of the present invention has the following advantages:
本发明所述的一种石墨阴极弧增强辉光放电沉积纯DLC的方法,解决了常规金属阴极弧增强辉光放电制备DLC时金属元素对DLC的“污染”问题。同时,实现了偏压源与离化源的解耦,即含碳气体的离化过程与沉积到工件入射离子的能量可以分别独立控制,使沉积过程薄膜成分和性能更易于调节,工艺窗口拓宽;放电电子源于阴极弧放电,因此密度较高,通过放电模式以及脉冲放电参数的调控可以实现等离子体中离子与原子比例的调整,得到高的沉积速率;本工艺的放电过程为阴极弧放电,电压较低,因此放电过程稳定不会出现打火现象,对镀膜的质量有很高的保障;所述方法可以在低气压下进行,因此可以对深孔进行处理,不会受到工件形状和结构的影响;所述方法离化源是独立的,可以通过在真空室内配置其它种类靶材的弧源,根据实际需求实现金属掺杂DLC的制备,由于掺杂源与离化源的放电独立,因此不会相互干扰,掺杂过程稳定;阴极材料为石墨与阳极材料为常见金属材料(如不锈钢、C钢、Al、Ti、Cr、Cu等),价格不贵,因此本方法成本不高;这种高沉积速率、成本低的工艺方法更适合工业化生产。将石墨作为阴极弧的靶材,利用弧增强辉光放电的方法制备DLC的过程中,可以避免来自阴极弧的靶材元素对DLC薄膜的“污染”,可以实现纯DLC的沉积。The method for depositing pure DLC by graphite cathode arc enhanced glow discharge according to the present invention solves the problem of "contamination" of DLC by metal elements when conventional metal cathode arc enhanced glow discharge prepares DLC. At the same time, the decoupling of the bias source and the ionization source is realized, that is, the ionization process of the carbon-containing gas and the energy of the incident ions deposited on the workpiece can be independently controlled, making it easier to adjust the composition and properties of the film during the deposition process, and the process window is widened. ; The discharge electrons originate from cathodic arc discharge, so the density is high. The ratio of ions to atoms in the plasma can be adjusted by adjusting the discharge mode and pulse discharge parameters to obtain a high deposition rate. The discharge process of this process is cathodic arc discharge. , the voltage is low, so the discharge process is stable and there will be no sparking phenomenon, which has a high guarantee for the quality of the coating; the method can be carried out under low pressure, so the deep hole can be processed without being affected by the shape of the workpiece and the The influence of the structure; the ionization source of the method is independent, and the preparation of metal-doped DLC can be realized according to actual needs by configuring arc sources of other types of targets in the vacuum chamber. Since the discharge of the doping source and the ionization source are independent , so they will not interfere with each other, and the doping process is stable; the cathode material is graphite and the anode material is common metal materials (such as stainless steel, C steel, Al, Ti, Cr, Cu, etc.), the price is not expensive, so the cost of this method is not high ; This high deposition rate, low cost process is more suitable for industrial production. Using graphite as the target of the cathode arc, in the process of preparing DLC by the arc-enhanced glow discharge method, the "contamination" of the DLC film by the target elements from the cathode arc can be avoided, and the deposition of pure DLC can be achieved.
附图说明Description of drawings
图1为本发明的装置示意图;1 is a schematic diagram of the device of the present invention;
图2为实施例中转架的结构示意图;Fig. 2 is the structural representation of the turret in the embodiment;
图3石墨阴极弧增强辉光放电图(脉冲电流500A);Fig. 3 graphite cathode arc enhanced glow discharge diagram (pulse current 500A);
图4为石墨阴极弧在不同放电电流下的波形图(脉冲平均电流设定20A,直流端设定为55A);Fig. 4 is the waveform diagram of graphite cathode arc under different discharge currents (the average pulse current is set to 20A, and the DC terminal is set to 55A);
图5为实施例1制备的DLC实物图;Fig. 5 is the DLC physical map prepared by
图6为实施例1制备的DLC的XPS(C1s)测试结果;Fig. 6 is the XPS (C1s) test result of the DLC prepared by
图7为实施例2制备的DLC薄膜扫描电镜下的表面形貌;Fig. 7 is the surface morphology under the scanning electron microscope of the DLC film prepared in Example 2;
图8为实施例2制备的DLC薄膜扫描电镜下的截面形貌;Fig. 8 is the sectional morphology under the scanning electron microscope of the DLC film prepared in Example 2;
图9为实施例3制备的DLC薄膜扫描电镜下的截面形貌;Fig. 9 is the sectional morphology under the scanning electron microscope of the DLC film prepared in Example 3;
图10为实施例5制备的DLC薄膜的拉曼光谱及拟合分峰结果;Fig. 10 is the Raman spectrum of the DLC film prepared by Example 5 and fitting peak splitting result;
图11为对比实施例DLC的EDS测试图片;Fig. 11 is the EDS test picture of comparative example DLC;
图12为对比实施例的EDS成分分析结果。FIG. 12 is the EDS component analysis result of the comparative example.
具体实施方式Detailed ways
具体实施方式一:本实施方式一种石墨阴极弧增强辉光放电沉积纯DLC的装置包括真空室9、转架2、偏压电源10、第一石墨阴极弧1-1、第二石墨阴极弧1-2、第一金属阴极5-1、第二金属阴极5-2、第一阳极3-1、第二阳极3-2、第一高脉冲电源4-1、第二高脉冲电源4-2、第一直流电源6-1和第二直流电源6-2;真空室9底部开有进气口7;转架2位于真空室9底部圆心处,转架2与真空室9转动连接,沿圆周方向在真空室9壁上均匀设有四个法兰,四个法兰分别固定连接第一石墨阴极弧1-1、第一金属阴极5-1、第二石墨阴极弧1-2和第二金属阴极5-2;第一石墨阴极弧1-1和第二石墨阴极弧1-2与转架2之间均设有挡板8,挡板8两端与真空室9内壁留有间隙;第一石墨阴极弧1-1和第二石墨阴极弧1-2为相对设置,第一金属阴极5-1和第二金属阴极5-2为相对设置;第一石墨阴极弧1-1和第一金属阴极5-1之间设有第一阳极3-1、第二石墨阴极弧1-2和第二金属阴极5-2之间设有第二阳极3-2;第一阳极3-1和第二阳极3-2均由基座和阳极本体组成,阳极本体与基座固定连接,真空室9上开有阳极通孔,阳极基座通过阳极通孔插接在真空室9上,阳极本体位于真空室9内部;第一石墨阴极弧1-1和第一阳极3-1之间连有第一高脉冲电源4-1、第二石墨阴极弧1-2和第二阳极3-2之间连有第二高脉冲电源4-2;第一金属阴极5-1和真空室9之间连有第一直流电源6-1,第二金属阴极5-2和真空室9之间连有第二直流电源6-2;转架2和真空室9之间连有偏压电源10。Embodiment 1: In this embodiment, a graphite cathode arc enhanced glow discharge deposition pure DLC device includes a
本实施方式中第一高脉冲电源4-1和第二高脉冲电源4-2的直流端电流均为30-150A,脉冲端平均电流均为30-200A,脉冲放电电流均为50-5000A,频率均为10-20000Hz,脉宽均为5-1000μs。In this embodiment, the DC terminal currents of the first high-pulse power supply 4-1 and the second high-pulse power supply 4-2 are both 30-150A, the average currents at the pulse terminals are both 30-200A, and the pulse discharge currents are both 50-5000A. The frequency is 10-20000Hz, and the pulse width is 5-1000μs.
具体实施方式二:本实施方式与具体实施方式一不同的是,转架2、第一石墨阴极弧1-1、第二石墨阴极弧1-2、第一金属阴极5-1、第二金属阴极5-2、第一阳极3-1、第二阳极3-2、挡板8均与真空室9绝缘。其他与具体实施方式一相同。Embodiment 2: The difference between this embodiment and
本实施方式中转架2、第一石墨阴极弧1-1、第二石墨阴极弧1-2、第一金属阴极5-1、第二金属阴极5-2、第一阳极3-1、第二阳极3-2、挡板8均通过聚四氟乙烯与真空室9绝缘。In this embodiment, the turret 2, the first graphite cathode arc 1-1, the second graphite cathode arc 1-2, the first metal cathode 5-1, the second metal cathode 5-2, the first anode 3-1, the second The anode 3-2 and the baffle 8 are insulated from the
具体实施方式三:本实施方式与具体实施方式一或二不同的是:第一阳极3-1的电连接端与第一高脉冲电源4-1的正极电气连接,第一高脉冲电源4-1的负极与第一石墨阴极弧1-1的电连接端电气连接;第二阳极3-2的电连接端与第二高脉冲电源4-2的正极电气连接,第二高脉冲电源4-2的负极与第二石墨阴极弧1-2的电连接端电气连接。其他与具体实施方式一或二相同。Embodiment 3: The difference between this embodiment and
具体实施方式四:本实施方式与具体实施方式一至三之一不同的是:第一金属阴极5-1的电连接端与第一直流电源6-1的负极电气连接,第二金属阴极5-2的电连接端与第二直流电源6-2的负极电气连接,偏压电源10的负极与转架2的电连接端电气连接,真空室9的电连接端分别与第一直流电源6-1的正极、第二直流电源6-2的正极、偏压电源10的正极电气连接,且真空室9的接地。其他与具体实施方式一至三之一相同。Embodiment 4: The difference between this embodiment and one of
具体实施方式五:本实施方式一种石墨阴极弧增强辉光放电沉积纯DLC的方法包括以下步骤:一、用酒精超声清洗待镀工件,取出后吹干;然后置于真空室9内的转架2上,将真空室9抽至真空度小于5×10-3Pa;二、对待镀工件进行Ar离子轰击清洗:从进气口7向真空室9里通入Ar气保持真空室9的气压为0.3-1.0Pa,然后开启偏压电源10,调整偏压值为-150--500V,占空比为10-80%;开启第一高脉冲电源4-1和第二高脉冲电源4-2,工件清洗时间为5-100min,得到清洗后的待镀工件;其中第一高脉冲电源4-1和第二高脉冲电源4-2同时开启直流端和脉冲端,直流端电流为30-150A,脉冲端平均电流为30-200A,脉冲放电电流50-5000A,频率为10-20000Hz,脉宽为5-1000μs;或者只开启直流端,直流端电流为30-150A;Embodiment 5: A method for depositing pure DLC with graphite cathode arc enhanced glow discharge in this embodiment includes the following steps: 1. ultrasonically clean the workpiece to be plated with alcohol, take it out and blow dry; On the rack 2, the
三、关闭第一高脉冲电源4-1和第二高脉冲电源4-2,在清洗后的待镀工件上沉积过渡层;其中过渡层为Cr/CrN/CrCN/Cr-C、Ti/TiN/TiCN/Ti-C、Ti/TiAlN、Cr/CrAlN或Si/Si-DLC;3. Turn off the first high-pulse power supply 4-1 and the second high-pulse power supply 4-2, and deposit a transition layer on the cleaned workpiece to be plated; the transition layer is Cr/CrN/CrCN/Cr-C, Ti/TiN /TiCN/Ti-C, Ti/TiAlN, Cr/CrAlN or Si/Si-DLC;
四、石墨阴极弧增强辉光放电制备纯DLC:保持第一直流电源6-1和第二直流电源6-2关闭,然后从进气口7向真空室9内通入氩气以及含碳前驱体气体,维持真空室9的气压为0.1-5.0Pa;调整偏压电源10的偏压值为50-10000V,占空比5-80%;调整第一高脉冲电源4-1和第二高脉冲电源4-2,DLC的沉积时间5-500min;其中第一高脉冲电源4-1和第二高脉冲电源4-2同时开启直流端和脉冲端,直流端电流为30-150A,脉冲端平均电流为30-200A,脉冲放电电流50-5000A,频率为10-20000Hz,脉宽为5-1000μs;或者只开启直流端,直流端电流为30-150A;其中含碳前驱体气体为CH4、C2H2和C6H6中的一种或多种按任意比混合。4. Preparation of pure DLC by graphite cathode arc enhanced glow discharge: keep the first DC power supply 6-1 and the second DC power supply 6-2 closed, and then pass argon gas and carbon-containing gas into the vacuum chamber 9 from the air inlet 7 Precursor gas, maintain the air pressure of the vacuum chamber 9 at 0.1-5.0Pa; adjust the bias value of the bias power supply 10 to 50-10000V, and the duty cycle is 5-80%; adjust the first high pulse power supply 4-1 and the second High-pulse power supply 4-2, the deposition time of DLC is 5-500min; wherein the first high-pulse power supply 4-1 and the second high-pulse power supply 4-2 turn on the DC terminal and the pulse terminal at the same time, the current of the DC terminal is 30-150A, and the pulse The average terminal current is 30-200A, the pulse discharge current is 50-5000A, the frequency is 10-20000Hz, and the pulse width is 5-1000μs; or only the DC terminal is turned on, the DC terminal current is 30-150A; the carbon-containing precursor gas is CH 4. One or more of C 2 H 2 and C 6 H 6 are mixed in any ratio.
具体实施方式六:本实施方式与具体实施方式五不同的是:步骤三中过渡层为Cr/CrN/CrCN/Cr-C,沉积方法为:关闭第一高脉冲电源4-1和第二高脉冲电源4-2,向真空室9内通入Ar,流量为100-500sccm,维持真空室9的气压0.2-4.0Pa,开启第一直流电源6-1和第二直流电源6-2,放电电流为直流30-200A,调整偏压电源10的偏压值为-30--300V,沉积时间为10-60min,制备Cr过渡层;然后,关闭Ar气,同时向真空室9内通入N2,流量为100-500sccm,维持真空室9气压为0.2-4.0Pa,沉积时间10-60min,制备CrN过渡层;再向真空室9内通入C2H2,流量为100-500sccm,维持真空室9气压0.2-4.0Pa,沉积时间为10-60min,制备CrCN过渡层;然后关闭N2,并向真空室9内通入Ar,流量为100-500sccm,维持真空室9气压为0.2-4.0Pa,沉积时间为10-60min,沉积时间为10-60min,制备Cr-C过渡层其中;第一金属阴极5-1、第二金属阴极5-2均为Cr。其他与具体实施方式一至五相同。Embodiment 6: The difference between this embodiment and
具体实施方式七:本实施方式与具体实施方式五或六不同的是:步骤三中过渡层为Ti/TiN/TiCN/Ti-C时,沉积方法为:关闭第一高脉冲电源4-1和第二高脉冲电源4-2,向真空室9内通入Ar,流量为100-500sccm,维持真空室9的气压为0.2-4.0Pa,开启第一直流电源6-1和第二直流电源6-2,放电电流为直流30-200A,调整偏压电源10的偏压值为-30--300V,沉积时间为10-60min,制备Ti过渡层;然后,关闭Ar气,同时向真空室9内通入N2,流量为100-500sccm,维持真空室9气压为0.2-4.0Pa,沉积时间10-60min,制备TiN过渡层;再向真空室9内通入C2H2,流量为100-500sccm,维持真空室9气压0.2-4.0Pa,沉积时间为10-60min,制备TiCN过渡层;然后关闭N2,并向真空室9内通入Ar,流量为100-500sccm,维持真空室9气压为0.2-4.0Pa,沉积时间为10-60min,制备Ti-C过渡层其中;第一金属阴极5-1、第二金属阴极5-2均为Ti。其他与具体实施方式五或六相同。Embodiment 7: The difference between this embodiment and
具体实施方式八:本实施方式与具体实施方式五至七之一不同的是:步骤三中过渡层为Ti/TiAlN时,沉积方法为:关闭第一高脉冲电源4-1和第二高脉冲电源4-2,向真空室9内通入Ar,流量为100-500sccm,维持真空室9的气压0.2-4.0Pa,开启第一直流电源6-1,放电电流为直流30-200A,调整偏压电源10的偏压值为-30--300V,沉积时间为10-60min,制备Ti过渡层;然后,关闭Ar气与第一直流电源6-1,开启第二直流电源6-2,同时向真空室9内通入N2,流量为100-500sccm,维持真空室9气压为0.2-4.0Pa,沉积时间10-60min,制备TiAlN过渡层;第一金属阴极5-1为Ti、第二金属阴极5-2为TiAl。其他与具体实施方式五至七之一相同。Embodiment 8: The difference between this embodiment and one of
具体实施方式九:本实施方式与具体实施方式五至八之一不同的是:步骤三中过渡层为Cr/CrAlN时,沉积方法为:关闭第一高脉冲电源4-1和第二高脉冲电源4-2,向真空室9内通入Ar,流量为100-500sccm,维持真空室9的气压0.2-4.0Pa,开启第一直流电源6-1,放电电流为直流30-200A,调整偏压电源10的偏压值为-30--300V,沉积时间为10-60min,制备Cr过渡层;然后,关闭Ar气与第一直流电源6-1,开启第二直流电源6-2,同时向真空室9内通入N2,流量为100-500sccm,维持真空室9气压为0.2-4.0Pa,沉积时间10-60min,制备CrAlN过渡层;第一金属阴极5-1为Cr、第二金属阴极5-2为CrAl。其他与具体实施方式五至八之一相同。Embodiment 9: The difference between this embodiment and one of
具体实施方式十:本实施方式与具体实施方式五至九之一不同的是:步骤三中过渡层为Si/Si-DLC时,沉积方法为:向真空室9内通入Ar和SiH4,流量均为100-500sccm,维持真空室9的气压0.2-4.0Pa,保持第一高脉冲电源4-1和第二高脉冲电源4-2开启,调整偏压电源10的偏压值为-30--300V,沉积时间为10-60min,制备Si过渡层;继续向真空室9内通入C2H2气体,流量为100-500sccm,维持气压0.2-4.0Pa,沉积时间为10-60min,制备Si-DLC过渡层;其中第一高脉冲电源4-1和第二高脉冲电源4-2同时开启直流端和脉冲端,直流端电流为30-150A,脉冲端平均电流为30-200A,脉冲放电电流50-5000A,频率为10-20000Hz,脉宽为5-1000μs;或者只开启直流端,直流端电流为30-150A。其他与具体实施方式五至九之一相同。Embodiment 10: This embodiment differs from one of Embodiments 5 to 9 in that: in step 3, when the transition layer is Si/Si-DLC, the deposition method is as follows: Ar and SiH 4 are introduced into the vacuum chamber 9 , The flow rate is 100-500sccm, the air pressure of the vacuum chamber 9 is maintained at 0.2-4.0Pa, the first high-pulse power supply 4-1 and the second high-pulse power supply 4-2 are kept on, and the bias value of the bias power supply 10 is adjusted to -30 --300V, deposition time is 10-60min, prepare Si transition layer; continue to pass C 2 H 2 gas into vacuum chamber 9, flow rate is 100-500sccm, maintain air pressure 0.2-4.0Pa, deposition time is 10-60min, A Si-DLC transition layer is prepared; wherein the first high-pulse power supply 4-1 and the second high-pulse power supply 4-2 turn on the DC terminal and the pulse terminal at the same time, the current of the DC terminal is 30-150A, and the average current of the pulse terminal is 30-200A, The pulse discharge current is 50-5000A, the frequency is 10-20000Hz, and the pulse width is 5-1000μs; or only the DC terminal is turned on, and the DC terminal current is 30-150A. Others are the same as one of the fifth to ninth embodiments.
具体实施方式十一:本实施方式与具体实施方式五至十之一不同的是:保持第一直流电源6-1和第二直流电源6-2关闭,然后从进气口7向真空室9内通入氩气、乙炔与TMS或HMDSN的混合气体,维持真空室9的气压为0.1-5.0Pa;调整偏压电源10的偏压值为50-10000V,占空比5-80%;调整第一高脉冲电源4-1和第二高脉冲电源4-2,DLC的沉积时间5-500min;其中第一高脉冲电源4-1和第二高脉冲电源4-2同时开启直流端和脉冲端,直流端电流为30-150A,脉冲端平均电流为30-200A,脉冲放电电流50-5000A,频率为10-20000Hz,脉宽为5-1000μs;或者只开启直流端,直流端电流为30-150A,完成石墨阴极弧增强辉光放电制备元素掺杂形式的DLC。通入气体为氩气、乙炔与TMS时,制备的是Si-DLC,通入气体为氩气、乙炔与TMS时,制备的是(Si、N)-DLC,其他与具体实施方式五至九之一相同。Embodiment 11: The difference between this embodiment and
具体实施方式十一:本实施方式与具体实施方式五至十之一不同的是:开启第二直流电源6-2,然后从进气口7向真空室9内通入氩气与乙炔混合气体,维持真空室9的气压为0.1-5.0Pa;调整偏压电源10的偏压值为50-10000V,占空比5-80%;调整第一高脉冲电源4-1和第二高脉冲电源4-2,DLC的沉积时间5-500min;其中第一高脉冲电源4-1和第二高脉冲电源4-2同时开启直流端和脉冲端,直流端电流为30-150A,脉冲端平均电流为30-200A,脉冲放电电流50-5000A,频率为10-20000Hz,脉宽为5-1000μs;或者只开启直流端,直流端电流为30-150A,完成石墨阴极弧增强辉光放电制备元素掺杂形式的DLC。阴极5-2的材料可以是Cr、Ti、CrAl或TiAl,分别制备出相应元素掺杂的DLC。其他与具体实施方式五至十之一相同。Embodiment 11: The difference between this embodiment and
为验证本发明的有益效果进行了以下实验:The following experiments were carried out for verifying the beneficial effects of the present invention:
实施例1Example 1
一、清洗待镀工件:将待镀工件置于酒精中,超声清洗10min,取出后用热空气吹干,置于真空室9内的转架2的工件托盘16上,随后将真空室9抽至真空度小于5×10-3Pa;1. Cleaning the workpiece to be plated: the workpiece to be plated is placed in alcohol, ultrasonically cleaned for 10 minutes, taken out and dried with hot air, placed on the
二、对待镀工件进行Ar离子轰击清洗:在真空室9里通入Ar气,流量为300sccm,保持真空室9气压为0.5Pa,转架2上接通偏压电源10,脉冲偏压值设定为-200V,占空比为75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,电流设定为60A,在第一石墨阴极弧1-1与第一阳极3-1之间,在第二石墨阴极弧1-2与第二阳极3-2之间建立起放电回路;工件清洗时间为40min;2. Carry out Ar ion bombardment cleaning on the workpiece to be plated: Ar gas is introduced into the
三、过渡层沉积:向真空室9内通入Ar,流量为300sccm,维持真空室9气压为0.4Pa;保持偏压电源10的偏压值为-200V;开启第一直流电源6-1和第二直流电源6-2,放电电流为直流80A在第一金属阴极5-1与真空室9之间,第二金属阴极5-2和真空室9之间建立起放电,沉积时间为15min,制备Cr过渡层;然后关闭Ar,同时向真空室9内通入N2,流量为125sccm,维持真空室9气压为1.0Pa;调整偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为30min,制备CrN过渡层;向真空室9内通入N2与C2H2,流量分别为125sccm和35sccm,维持真空室9的气压为1.0Pa,保持偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为20min,制备CrCN过渡层;向真空室9内通入C2H2,流量为50sccm,维持真空室9气压为0.5Pa;调整偏压电源10的偏压值为-150V,调整第一直流电源6-1和第二直流电源6-2的放电电流为直流70A,沉积时间为15min,制备Cr-C过渡层;其中第一金属阴极5-1和第二金属阴极5-2均为Cr;3. Deposition of transition layer: Ar is introduced into the vacuum chamber 9, the flow rate is 300sccm, the air pressure of the vacuum chamber 9 is maintained at 0.4Pa; the bias value of the bias power supply 10 is maintained at -200V; the first DC power supply 6-1 is turned on And the second DC power supply 6-2, the discharge current is DC 80A between the first metal cathode 5-1 and the vacuum chamber 9, between the second metal cathode 5-2 and the vacuum chamber 9 to establish a discharge, the deposition time is 15min , prepare the Cr transition layer; then turn off Ar, and at the same time pass N 2 into the vacuum chamber 9, the flow rate is 125sccm, and the air pressure of the vacuum chamber 9 is maintained at 1.0Pa; The discharge current of the DC power source 6-1 and the second DC power source 6-2 is DC 80A, the deposition time is 30min, and the CrN transition layer is prepared; N 2 and C 2 H 2 are introduced into the vacuum chamber 9, and the flow rates are respectively 125sccm and 35sccm, maintaining the air pressure of the vacuum chamber 9 to be 1.0Pa, maintaining the bias voltage value of the bias power supply 10 to be -70V, and maintaining the discharge current of the first DC power supply 6-1 and the second DC power supply 6-2 to be DC 80A, The deposition time is 20min, and the CrCN transition layer is prepared; C 2 H 2 is introduced into the vacuum chamber 9, the flow rate is 50 sccm, and the air pressure of the vacuum chamber 9 is maintained at 0.5Pa; The discharge current of the DC power supply 6-1 and the second DC power supply 6-2 is DC 70A, the deposition time is 15min, and the Cr-C transition layer is prepared; wherein the first metal cathode 5-1 and the second metal cathode 5-2 Both are Cr;
四、石墨阴极弧增强辉光放电制备DLC:关闭第一直流电源6-1和第二直流电源6-2,向真空室9内通入氩气与C2H2,流量分别为75sccm和75sccm,维持真空室9气压在0.3Pa;调整偏压电源10的偏压值为200V,占空比75%;调整第一高脉冲电源4-1和第二高脉冲电源4-2,平均电流为75A,直流端电流为55A,脉冲端平均电流为20A,脉冲端峰值电流为500A,频率为520Hz,脉宽为150μs;DLC的沉积时间60min,完成石墨阴极弧增强辉光放电制备DLC;图2为石墨阴极弧增强辉光放电时的照片。此工艺下DLC的沉积速率可达2.1μm/h。4. Preparation of DLC by graphite cathode arc enhanced glow discharge: turn off the first DC power supply 6-1 and the second DC power supply 6-2, pass argon and C 2 H 2 into the
图3为石墨阴极弧增强辉光放电图(脉冲电流500A),说明本实施例阴极和阳极的相对位置,验证可行性。FIG. 3 is a graph of graphite cathode arc enhanced glow discharge (pulse current 500A), illustrating the relative positions of the cathode and the anode in this embodiment, and verifying the feasibility.
图4为石墨阴极弧在不同放电电流下的波形图:说明本技术可以实现直流放电和脉冲放电的两种放电模式。Fig. 4 is a waveform diagram of graphite cathode arc under different discharge currents: it shows that this technology can realize two discharge modes of DC discharge and pulse discharge.
图5为石墨阴极弧增强辉光放电沉积DLC实物图:本实施例待镀工件分别为铝和钢,其中a为铝箔,b为高速钢,本方法可以在实体工件上沉积DLC。Fig. 5 is a graph of graphite cathode arc enhanced glow discharge deposition of DLC: the workpieces to be plated in this embodiment are aluminum and steel respectively, wherein a is aluminum foil, b is high-speed steel, and this method can deposit DLC on solid workpieces.
图6为实施例1里的制备DLC的XPS(C1s)测试结果,由图6可知,仅有C-C键和C-O存在,并没有其他键的(如C-Cr)的存在,说明制备的是纯DLC。这里C-O的产生是长期放置在空气中产生的。Figure 6 is the XPS (C1s) test result of preparing DLC in Example 1. It can be seen from Figure 6 that only C-C bonds and C-O exist, and no other bonds (such as C-Cr) exist, indicating that the prepared ones are pure DLC. The generation of C-O here is generated by long-term placement in the air.
实施例2Example 2
一、清洗待镀工件:将待镀工件(单晶硅)置于酒精中,超声清洗10min,取出后用热空气吹干,置于真空室9内的转架2的工件托盘16上,随后将真空室9抽至真空度小于5×10- 3Pa;1. Cleaning the workpiece to be plated: The workpiece to be plated (single crystal silicon) is placed in alcohol, ultrasonically cleaned for 10 minutes, taken out and dried with hot air, placed on the
二、对待镀工件进行Ar离子轰击清洗:在真空室9里通入Ar气,流量为300sccm,保持真空室9气压为0.5Pa,转架2上接通偏压电源10,脉冲偏压值设定为-200V,占空比为75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,电流设定为60A,在第一石墨阴极弧1-1与第一阳极3-1之间,在第二石墨阴极弧1-2与第二阳极3-2之间建立起放电回路;工件清洗时间为40min;2. Carry out Ar ion bombardment cleaning on the workpiece to be plated: Ar gas is introduced into the
三、过渡层沉积:向真空室9内通入Ar,流量为300sccm,维持真空室9气压为0.4Pa;保持偏压电源10的偏压值为-200V;开启第一直流电源6-1和第二直流电源6-2,放电电流为直流80A在第一金属阴极5-1与真空室9之间,第二金属阴极5-2和真空室9之间建立起放电,沉积时间为15min,制备Cr过渡层;然后关闭Ar,同时向真空室9内通入N2,流量为125sccm,维持真空室9气压为1.0Pa;调整偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为30min,制备CrN过渡层;向真空室9内通入N2与C2H2,流量分别为125sccm和35sccm,维持真空室9的气压为1.0Pa,保持偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为20min,制备CrCN过渡层;向真空室9内通入C2H2,流量为50sccm,维持真空室9气压为0.5Pa;调整偏压电源10的偏压值为-150V,调整第一直流电源6-1和第二直流电源6-2的放电电流为直流70A,沉积时间为15min,制备Cr-C过渡层;其中第一金属阴极5-1和第二金属阴极5-2均为Cr;3. Deposition of transition layer: Ar is introduced into the vacuum chamber 9, the flow rate is 300sccm, the air pressure of the vacuum chamber 9 is maintained at 0.4Pa; the bias value of the bias power supply 10 is maintained at -200V; the first DC power supply 6-1 is turned on And the second DC power supply 6-2, the discharge current is DC 80A between the first metal cathode 5-1 and the vacuum chamber 9, between the second metal cathode 5-2 and the vacuum chamber 9 to establish a discharge, the deposition time is 15min , prepare the Cr transition layer; then turn off Ar, and at the same time pass N 2 into the vacuum chamber 9, the flow rate is 125sccm, and the air pressure of the vacuum chamber 9 is maintained at 1.0Pa; The discharge current of the DC power source 6-1 and the second DC power source 6-2 is DC 80A, the deposition time is 30min, and the CrN transition layer is prepared; N 2 and C 2 H 2 are introduced into the vacuum chamber 9, and the flow rates are respectively 125sccm and 35sccm, maintaining the air pressure of the vacuum chamber 9 to be 1.0Pa, maintaining the bias voltage value of the bias power supply 10 to be -70V, and maintaining the discharge current of the first DC power supply 6-1 and the second DC power supply 6-2 to be DC 80A, The deposition time is 20min, and the CrCN transition layer is prepared; C 2 H 2 is introduced into the vacuum chamber 9, the flow rate is 50 sccm, and the air pressure of the vacuum chamber 9 is maintained at 0.5Pa; The discharge current of the DC power supply 6-1 and the second DC power supply 6-2 is DC 70A, the deposition time is 15min, and the Cr-C transition layer is prepared; wherein the first metal cathode 5-1 and the second metal cathode 5-2 Both are Cr;
四、石墨阴极弧增强辉光放电制备DLC:关闭第一直流电源6-1和第二直流电源6-2,向真空室9内通入氩气与C2H2,流量分别为100sccm和100sccm,维持真空室9气压在0.3Pa;调整偏压电源10的偏压值为200V,占空比75%;调整第一高脉冲电源(4-1)和第二高脉冲电源4-2,平均电流为75A,直流端电流为55A,脉冲端平均电流为20A,脉冲端峰值电流为500A,频率为800Hz,脉宽为95μs;DLC的沉积时间30min,完成石墨阴极弧增强辉光放电制备DLC;此工艺下DLC的沉积速率可达1.8μm/h。图7为实施例2中制备DLC薄膜扫描电镜下的表面形貌;制备的DLC的表面放大1000倍后的照片,图8为实施例2中制备DLC薄膜扫描电镜下的截面形貌;可以看出截面薄膜的微观结构,以及评估沉积速率。4. Preparation of DLC by graphite cathode arc enhanced glow discharge: turn off the first DC power supply 6-1 and the second DC power supply 6-2, and pass argon and C 2 H 2 into the
实施例3Example 3
一、清洗待镀工件:将待镀工件(单晶硅)置于酒精中,超声清洗10min,取出后用热空气吹干,置于真空室9内的转架2的工件托盘16上,随后将真空室9抽至真空度小于5×10- 3Pa;1. Cleaning the workpiece to be plated: The workpiece to be plated (single crystal silicon) is placed in alcohol, ultrasonically cleaned for 10 minutes, taken out and dried with hot air, placed on the
二、对待镀工件进行Ar离子轰击清洗:在真空室9里通入Ar气,流量为300sccm,保持真空室9气压为0.5Pa,转架2上接通偏压电源10,脉冲偏压值设定为-200V,占空比为75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,电流设定为60A,在第一石墨阴极弧1-1与第一阳极3-1之间,在第二石墨阴极弧1-2与第二阳极3-2之间建立起放电回路;工件清洗时间为40min;2. Carry out Ar ion bombardment cleaning on the workpiece to be plated: Ar gas is introduced into the
三、过渡层沉积:向真空室9内通入Ar,流量为300sccm,维持真空室9气压为0.4Pa;保持偏压电源10的偏压值为-200V;开启第一直流电源6-1和第二直流电源6-2,放电电流为直流80A在第一金属阴极5-1与真空室9之间,第二金属阴极5-2和真空室9之间建立起放电,沉积时间为15min,制备Cr过渡层;然后关闭Ar,同时向真空室9内通入N2,流量为125sccm,维持真空室9气压为1.0Pa;调整偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为30min,制备CrN过渡层;向真空室9内通入N2与C2H2,流量分别为125sccm和35sccm,维持真空室9的气压为1.0Pa,保持偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为20min,制备CrCN过渡层;向真空室9内通入C2H2,流量为50sccm,维持真空室9气压为0.5Pa;调整偏压电源10的偏压值为-150V,调整第一直流电源6-1和第二直流电源6-2的放电电流为直流70A,沉积时间为15min,制备Cr-C过渡层;其中第一金属阴极5-1和第二金属阴极5-2均为Cr;3. Deposition of transition layer: Ar is introduced into the vacuum chamber 9, the flow rate is 300sccm, the air pressure of the vacuum chamber 9 is maintained at 0.4Pa; the bias value of the bias power supply 10 is maintained at -200V; the first DC power supply 6-1 is turned on And the second DC power supply 6-2, the discharge current is DC 80A between the first metal cathode 5-1 and the vacuum chamber 9, between the second metal cathode 5-2 and the vacuum chamber 9 to establish a discharge, the deposition time is 15min , prepare the Cr transition layer; then turn off Ar, and at the same time pass N 2 into the vacuum chamber 9, the flow rate is 125sccm, and the air pressure of the vacuum chamber 9 is maintained at 1.0Pa; The discharge current of the DC power source 6-1 and the second DC power source 6-2 is DC 80A, the deposition time is 30min, and the CrN transition layer is prepared; N 2 and C 2 H 2 are introduced into the vacuum chamber 9, and the flow rates are respectively 125sccm and 35sccm, maintaining the air pressure of the vacuum chamber 9 to be 1.0Pa, maintaining the bias voltage value of the bias power supply 10 to be -70V, and maintaining the discharge current of the first DC power supply 6-1 and the second DC power supply 6-2 to be DC 80A, The deposition time is 20min, and the CrCN transition layer is prepared; C 2 H 2 is introduced into the vacuum chamber 9, the flow rate is 50 sccm, and the air pressure of the vacuum chamber 9 is maintained at 0.5Pa; The discharge current of the DC power supply 6-1 and the second DC power supply 6-2 is DC 70A, the deposition time is 15min, and the Cr-C transition layer is prepared; wherein the first metal cathode 5-1 and the second metal cathode 5-2 Both are Cr;
四、石墨阴极弧增强辉光放电制备DLC:关闭第一直流电源6-1和第二直流电源6-2,向真空室9内通入氩气与C2H2,流量分别为75sccm和75sccm,维持真空室9气压在0.3Pa;调整偏压电源的偏压值为200V,占空比75%;调整第一高脉冲电源4-1和第二高脉冲电源4-2,直流端电流为75A,关闭脉冲端,DLC的沉积时间45min,完成石墨阴极弧增强辉光放电制备DLC;此工艺下DLC的沉积速率可达3.8μm/h。4. Preparation of DLC by graphite cathode arc enhanced glow discharge: turn off the first DC power supply 6-1 and the second DC power supply 6-2, pass argon and C 2 H 2 into the
图9为实施例3中制备DLC薄膜扫描电镜下的截面形貌;可以看出截面薄膜的微观结构,以及计算沉积速率。FIG. 9 is the cross-sectional morphology of the DLC film prepared in Example 3 under the scanning electron microscope; the microstructure of the cross-sectional film can be seen, and the deposition rate is calculated.
实施例4Example 4
一、清洗待镀工件:将待镀工件(单晶硅)置于酒精中,超声清洗10min,取出后用热空气吹干,置于真空室9内的转架2的工件托盘16上,随后将真空室9抽至真空度小于5×10- 3Pa;1. Cleaning the workpiece to be plated: The workpiece to be plated (single crystal silicon) is placed in alcohol, ultrasonically cleaned for 10 minutes, taken out and dried with hot air, placed on the
二、对待镀工件进行Ar离子轰击清洗:在真空室9里通入Ar气,流量为300sccm,保持真空室9气压为0.5Pa,转架2上接通偏压电源10,脉冲偏压值设定为-200V,占空比为75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,电流设定为60A,在第一石墨阴极弧1-1与第一阳极3-1之间,在第二石墨阴极弧1-2与第二阳极3-2之间建立起放电回路;工件清洗时间为40min;2. Carry out Ar ion bombardment cleaning on the workpiece to be plated: Ar gas is introduced into the
三、过渡层沉积:向真空室9内通入Ar,流量为300sccm,维持真空室9气压为0.4Pa;保持偏压电源10的偏压值为-200V;开启第一直流电源6-1和第二直流电源6-2,放电电流为直流80A在第一金属阴极5-1与真空室9之间,第二金属阴极5-2和真空室9之间建立起放电,沉积时间为15min,制备Cr过渡层;然后关闭Ar,同时向真空室9内通入N2,流量为125sccm,维持真空室9气压为1.0Pa;调整偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为30min,制备CrN过渡层;向真空室9内通入N2与C2H2,流量分别为125sccm和35sccm,维持真空室9的气压为1.0Pa,保持偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为20min,制备CrCN过渡层;向真空室9内通入C2H2,流量为50sccm,维持真空室9气压为0.5Pa;调整偏压电源10的偏压值为-150V,调整第一直流电源6-1和第二直流电源6-2的放电电流为直流70A,沉积时间为15min,制备Cr-C过渡层;其中第一金属阴极5-1和第二金属阴极5-2均为Cr;3. Deposition of transition layer: Ar is introduced into the vacuum chamber 9, the flow rate is 300sccm, the air pressure of the vacuum chamber 9 is maintained at 0.4Pa; the bias value of the bias power supply 10 is maintained at -200V; the first DC power supply 6-1 is turned on And the second DC power supply 6-2, the discharge current is DC 80A between the first metal cathode 5-1 and the vacuum chamber 9, between the second metal cathode 5-2 and the vacuum chamber 9 to establish a discharge, the deposition time is 15min , prepare the Cr transition layer; then turn off Ar, and at the same time pass N 2 into the vacuum chamber 9, the flow rate is 125sccm, and the air pressure of the vacuum chamber 9 is maintained at 1.0Pa; The discharge current of the DC power source 6-1 and the second DC power source 6-2 is DC 80A, the deposition time is 30min, and the CrN transition layer is prepared; N 2 and C 2 H 2 are introduced into the vacuum chamber 9, and the flow rates are respectively 125sccm and 35sccm, maintaining the air pressure of the vacuum chamber 9 to be 1.0Pa, maintaining the bias voltage value of the bias power supply 10 to be -70V, and maintaining the discharge current of the first DC power supply 6-1 and the second DC power supply 6-2 to be DC 80A, The deposition time is 20min, and the CrCN transition layer is prepared; C 2 H 2 is introduced into the vacuum chamber 9, the flow rate is 50 sccm, and the air pressure of the vacuum chamber 9 is maintained at 0.5Pa; The discharge current of the DC power supply 6-1 and the second DC power supply 6-2 is DC 70A, the deposition time is 15min, and the Cr-C transition layer is prepared; wherein the first metal cathode 5-1 and the second metal cathode 5-2 Both are Cr;
四、石墨阴极弧增强辉光放电制备DLC:关闭第一直流电源6-1和第二直流电源6-2,向真空室9内通入氩气与C2H2,流量分别为100sccm和100sccm,维持真空室9气压在0.3Pa;调整偏压电源10的偏压值为200V,占空比75%;调整第一高脉冲电源4-1和第二高脉冲电源4-2,平均电流为75A,直流端电流为55A,脉冲端平均电流为20A,脉冲端峰值电流为500A,频率为260Hz,脉宽为260μs;DLC的沉积时间60min,完成石墨阴极弧增强辉光放电制备DLC;此工艺下DLC的沉积速率可达2.7μm/h。4. Preparation of DLC by graphite cathode arc enhanced glow discharge: turn off the first DC power supply 6-1 and the second DC power supply 6-2, and pass argon and C 2 H 2 into the
实施例5Example 5
一、清洗待镀工件:将待镀工件(单晶硅)置于酒精中,超声清洗10min,取出后用热空气吹干,置于真空室9内的转架2的工件托盘16上,随后将真空室9抽至真空度小于5×10- 3Pa;1. Cleaning the workpiece to be plated: The workpiece to be plated (single crystal silicon) is placed in alcohol, ultrasonically cleaned for 10 minutes, taken out and dried with hot air, placed on the
二、对待镀工件进行Ar离子轰击清洗:在真空室9里通入Ar气,流量为300sccm,保持真空室9气压为0.5Pa,转架2上接通偏压电源10,脉冲偏压值设定为-200V,占空比为75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,电流设定为60A,在第一石墨阴极弧1-1与第一阳极3-1之间,在第二石墨阴极弧1-2与第二阳极3-2之间建立起放电回路;工件清洗时间为40min;2. Carry out Ar ion bombardment cleaning on the workpiece to be plated: Ar gas is introduced into the
三、过渡层沉积:关闭第一高脉冲电源4-1和第二高脉冲电源4-2,然后向真空室9内通入Ar,流量为300sccm,维持真空室9气压为0.4Pa;保持偏压电源10的偏压值为-200V;开启第一直流电源6-1和第二直流电源6-2,放电电流为直流80A,在第一金属阴极5-1与真空室9之间,第二金属阴极5-2和真空室9之间建立起放电,沉积时间为15min,制备Cr过渡层;然后关闭Ar,同时向真空室9内通入N2,流量为125sccm,维持真空室9气压为1.0Pa;调整偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为30min,制备CrN过渡层;向真空室9内通入N2与C2H2,流量分别为125sccm和35sccm,维持真空室9的气压为1.0Pa,保持偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为20min,制备CrCN过渡层;向真空室9内通入C2H2,流量为50sccm,维持真空室9气压为0.5Pa;调整偏压电源10的偏压值为-150V,调整第一直流电源6-1和第二直流电源6-2的放电电流为直流70A,沉积时间为15min,制备Cr-C过渡层;其中第一金属阴极5-1和第二金属阴极5-2均为Cr;3. Deposition of transition layer: Turn off the first high pulse power supply 4-1 and the second high pulse power supply 4-2, then pass Ar into the
四、石墨阴极弧增强辉光放电制备DLC:向真空室9内通入氩气与C2H2,流量分别为75sccm和75sccm,维持气压在0.5Pa,调整偏压电源10的偏压值为200V,占空比75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,直流端电流为75A,在第一石墨阴极弧1-1与第一阳极3-1之间、在第二石墨阴极弧1-2与第二阳极3-2建立起放电回路;调整第一直流电源6-1和第二直流电源6-2的放电电流为65A,进行金属掺杂DLC的制备,Cr-DLC的沉积时间60min,完成石墨阴极弧增强辉光放电制备DLC;4. Preparation of DLC by graphite cathode arc enhanced glow discharge: Pour argon gas and C 2 H 2 into the
图10为本实施例中制备DLC薄膜的拉曼光谱及拟合分峰结果。该结果展示了典型的DLC薄膜的拉曼峰,分峰结果显示ID/IG结果为0.55。说明采用本实施例的方法也可用来沉积掺杂DLC。FIG. 10 is the Raman spectrum of the DLC film prepared in this example and the fitting peak splitting result. This result shows a typical Raman peak of a DLC film, and the sub-peak result shows an ID/ IG result of 0.55 . It is illustrated that the method of this embodiment can also be used to deposit doped DLC.
实施例6Example 6
一、清洗待镀工件:将待镀工件(单晶硅)置于酒精中,超声清洗10min,取出后用热空气吹干,置于真空室9内的转架2的工件托盘16上,随后将真空室9抽至真空度小于5×10- 3Pa;1. Cleaning the workpiece to be plated: The workpiece to be plated (single crystal silicon) is placed in alcohol, ultrasonically cleaned for 10 minutes, taken out and dried with hot air, placed on the
二、对待镀工件进行Ar离子轰击清洗:在真空室9里通入Ar气,流量为300sccm,保持真空室9气压为0.5Pa,转架2上接通偏压电源10,脉冲偏压值设定为-200V,占空比为75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,电流设定为60A,在第一石墨阴极弧1-1与第一阳极3-1之间,在第二石墨阴极弧1-2与第二阳极3-2之间建立起放电回路;工件清洗时间为40min;2. Carry out Ar ion bombardment cleaning on the workpiece to be plated: Ar gas is introduced into the
三、过渡层沉积:关闭第一高脉冲电源4-1和第二高脉冲电源4-2,然后向真空室9内通入Ar,流量为300sccm,维持真空室9气压为0.4Pa;保持偏压电源10的偏压值为-200V;开启第一直流电源6-1和第二直流电源6-2,放电电流为直流80A,在第一金属阴极5-1与真空室9之间,第二金属阴极5-2和真空室9之间建立起放电,沉积时间为15min,制备Cr过渡层;然后关闭Ar,同时向真空室9内通入N2,流量为125sccm,维持真空室9气压为1.0Pa;调整偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为30min,制备CrN过渡层;向真空室9内通入N2与C2H2,流量分别为125sccm和35sccm,维持真空室9的气压为1.0Pa,保持偏压电源10的偏压值为-70V,保持第一直流电源6-1和第二直流电源6-2的放电电流为直流80A,沉积时间为20min,制备CrCN过渡层;向真空室9内通入C2H2,流量为50sccm,维持真空室9气压为0.5Pa;调整偏压电源10的偏压值为-150V,调整第一直流电源6-1和第二直流电源6-2的放电电流为直流70A,沉积时间为15min,制备Cr-C过渡层;其中第一金属阴极5-1和第二金属阴极5-2均为AlCr;3. Deposition of transition layer: Turn off the first high pulse power supply 4-1 and the second high pulse power supply 4-2, then pass Ar into the
四、石墨阴极弧增强辉光放电制备DLC:向真空室9内通入氩气与C2H2,流量分别为75sccm和75sccm,维持气压在0.5Pa,调整偏压电源10的偏压值为200V,占空比75%;开启第一高脉冲电源4-1和第二高脉冲电源4-2的直流端,直流端电流为75A,在第一石墨阴极弧1-1与第一阳极3-1之间、在第二石墨阴极弧1-2与第二阳极3-2建立起放电回路;调整第一直流电源6-1和第二直流电源6-2的放电电流为65A,进行金属掺杂DLC的制备,Cr-DLC的沉积时间60min,完成石墨阴极弧增强辉光放电制备DLC。4. Preparation of DLC by graphite cathode arc enhanced glow discharge: Pour argon gas and C 2 H 2 into the
实施例1-6所用的石墨阴极弧增强辉光放电沉积DLC的装置包括真空室9、转架2、偏压电源10、第一石墨阴极弧1-1、第二石墨阴极弧1-2、第一金属阴极5-1、第二金属阴极5-2、第一阳极3-1、第二阳极3-2、第一高脉冲电源4-1、第二高脉冲电源4-2、第一直流电源6-1和第二直流电源6-2;真空室9底部开有进气口7;转架2位于真空室9底部圆心处,转架2与真空室9转动连接,沿圆周方向在真空室9壁上均匀设有四个法兰,四个法兰分别固定连接第一石墨阴极弧1-1、第一金属阴极5-1、第二石墨阴极弧1-2和第二金属阴极5-2;第一石墨阴极弧1-1和第二石墨阴极弧1-2与转架2之间均设有挡板8,挡板8两端与真空室9内壁留有间隙;第一石墨阴极弧1-1和第二石墨阴极弧1-2为相对设置,第一金属阴极5-1和第二金属阴极5-2为相对设置;第一石墨阴极弧1-1和第一金属阴极5-1之间设有第一阳极3-1、第二石墨阴极弧1-2和第二金属阴极5-2之间设有第二阳极3-2;第一阳极3-1和第二阳极3-2均由基座和阳极本体组成,阳极本体与基座固定连接,真空室9上开有阳极通孔,阳极基座通过阳极通孔插接在真空室9上,阳极本体位于真空室9内部;第一石墨阴极弧1-1和第一阳极3-1之间连有第一高脉冲电源4-1、第二石墨阴极弧1-2和第二阳极3-2之间连有第二高脉冲电源4-2;第一金属阴极5-1和真空室9之间连有第一直流电源6-1,第二金属阴极5-2和真空室9之间连有第二直流电源6-2;转架2和真空室9之间连有偏压电源10。本实施方式中开有两个进气口7,其中一个进气口7的进气管的管口位于第一石墨阴极弧1-1和第一阳极3-1之间,管口与第一石墨阴极弧1-1的距离为5-18cm;另一个进气口7的进气管的管口位于第二石墨阴极弧1-2和第二阳极3-2之间,管口与第二石墨阴极弧1-2的距离为5-18cm。The graphite cathode arc enhanced glow discharge deposition DLC device used in Examples 1-6 includes a
其中所述转架2为行星转架,行星转架包括转轴11、链条托盘12、链条13、齿轮14、转盘15、旋转杆17、工件托盘16、聚四氟乙烯绝缘套18和聚四氟乙烯垫块19,链条托盘12固定设置在真空室9底部,链条13固定于链条托盘12上表面,转轴11顶端设有转盘;旋转杆17通过轴承与转盘15连接,旋转杆17底端设有齿轮14,齿轮14与链条13啮合,旋转杆17上套设工件托盘16;行星转架通过聚四氟乙烯绝缘套18和聚四氟乙烯垫块19与真空室绝缘。The turret 2 is a planetary turret, and the planetary turret includes a
对比实施例为通入Ar将气压维持在0.5Pa,Cr弧电流为70A,偏压电源电压和占空比分别调整到950V和75%,清洗时间10min,进行金属离子清洗;通入Ar将气压维持在0.5Pa,石墨阴极弧固定60A,同时将石墨弧前端挡板关闭,偏压电源设定为-200V,持续时间15min,进行Ar离子清洗;通入Ar将气压维持在0.4Pa,Cr弧固定80A,偏压电源设定为-200V,持续时间15min,沉积Cr过渡层;通入N2将气压稳定在1.0Pa,Cr弧固定80A,偏压电源设定为-70V,持续时间45min,沉积CrN过渡层;通入N2和乙炔的混合气体,Cr弧固定80A,流量比例为N2:C2H2=100:15(sccm),气压1.0Pa,偏压电源设定为-70V,沉积时间20min,沉积CrCN过渡层;利用Cr阴极弧增强辉光放电制备DLC,通入氩气和乙炔混合气,流量比例为Ar:C2H2=75:100(sccm),Cr阴极弧,电流为直流55A,复合脉冲端平均电流为20A,脉冲频率200Hz,频率为320μs,脉冲电流为300A,气压0.5Pa,偏压电源设定为-150V,沉积时间30min。In the comparative example, the gas pressure was maintained at 0.5Pa by feeding Ar, the Cr arc current was 70A, the bias power supply voltage and duty ratio were adjusted to 950V and 75%, respectively, and the cleaning time was 10min, and metal ion cleaning was performed; Maintained at 0.5Pa, the graphite cathode arc was fixed at 60A, at the same time, the front-end baffle of the graphite arc was closed, the bias power supply was set to -200V, and the duration was 15min, and Ar ion cleaning was performed; Fix 80A, set the bias power supply to -200V, last for 15min, deposit a Cr transition layer; pass N2 to stabilize the air pressure at 1.0Pa, fix the Cr arc at 80A, set the bias power supply to -70V, last for 45min, deposit CrN transition layer; a mixed gas of N2 and acetylene was introduced, the Cr arc was fixed at 80A, the flow ratio was N2 :C2H2=100: 15 (sccm), the air pressure was 1.0Pa, the bias power was set to -70V, and the deposition was performed. Time 20min, deposit CrCN transition layer; use Cr cathode arc to enhance glow discharge to prepare DLC, pass argon and acetylene gas mixture, the flow ratio is Ar:C2H2=75:100 (sccm), Cr cathode arc, the current is DC 55A , the average current of the composite pulse terminal is 20A, the pulse frequency is 200Hz, the frequency is 320μs, the pulse current is 300A, the air pressure is 0.5Pa, the bias power supply is set to -150V, and the deposition time is 30min.
图11为本实施例DLC的EDS测试图片;图12为本实施例的EDS成分分析结果;Cr阴极弧增强辉光放电制备DLC表面元素比例如表1所示。Figure 11 is the EDS test picture of the DLC of this embodiment; Figure 12 is the EDS composition analysis result of this embodiment; the surface element ratio of DLC prepared by Cr cathode arc enhanced glow discharge is shown in Table 1.
表1Table 1
由此可知,Cr阴极弧增强辉光放电制备的DLC中有Cr的存在,产生了元素Cr的污染。It can be seen that there is Cr in the DLC prepared by Cr cathode arc enhanced glow discharge, resulting in the pollution of element Cr.
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