CN111575652A - Vacuum coating equipment and vacuum coating method - Google Patents
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/228—Gas flow assisted PVD deposition
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
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- Chemical Kinetics & Catalysis (AREA)
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- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
技术领域technical field
本发明涉及一种薄膜制备设备和制备方法,特别是涉及一种提高薄膜硬度等机械性能的设备及工艺,应用于物理气相沉积技术领域。The invention relates to a film preparation device and a preparation method, in particular to a device and a process for improving mechanical properties such as film hardness, which are applied to the technical field of physical vapor deposition.
背景技术Background technique
薄膜的研究依赖于薄膜的制备装备及技术,高质量的薄膜有利于薄膜物理的研究和薄膜器件应用的发展。随着激光技术、微波技术和离子束技术的应用,人们发展了多种薄膜制备技术和方法。The research of thin films depends on the preparation equipment and technology of thin films. High-quality thin films are beneficial to the research of thin film physics and the development of thin film device applications. With the application of laser technology, microwave technology and ion beam technology, a variety of thin film preparation technologies and methods have been developed.
薄膜制备技术分为两类,第一类是PVD,即物理气相沉积,包括真空蒸镀法,磁控溅射法、离子镀等。真空蒸镀基本原理是在真空条件下,使金属、金属合金或化合物蒸发,然后沉积在基体表面上,蒸发的方法常用电阻加热,高频感应加热,电子束、激光束、离子束高能轰击镀料,使蒸发成气相,然后沉积在基体表面。磁控溅射基本原理是充氩(Ar)气的真空条件下,使氩气进行辉光放电,这时氩(Ar)原子电离成氩离子(Ar+),氩离子在电场力的作用下,加速轰击以镀料制作的阴极靶材,靶材会被溅射出来而沉积到工件表面。如果采用直流辉光放电,称直流(Qc)溅射,射频(RF)辉光放电引起的称射频溅射。磁控(M)辉光放电引起的称磁控溅射。电弧等离子体镀膜基本原理是在真空条件下,用引弧针引弧,使真空金壁(阳极)和镀材(阴极)之间进行弧光放电,阴极表面快速移动着多个阴极弧斑,不断迅速蒸发甚至“升华”镀料,使之电离成以镀料为主要成分的电弧等离子体,并能迅速将镀料沉积于基体。因为有多弧斑,所以也称多弧蒸发离化过程。离子镀基本原理是在真空条件下,采用某种等离子体电离技术,使镀料原子部分电离成离子,同时产生许多高能量的中性原子,在被镀基体上加负偏压。这样在深度负偏压的作用下,离子沉积于基体表面形成薄膜。物理气相沉积技术工艺过程简单,对环境改善,无污染,耗材少,成膜均匀致密,与基体的结合力强。该技术广泛应用于航空航天、电子、光学、机械、建筑、轻工、冶金、材料等领域,可制备具有耐磨、耐腐蚀、装饰、导电、绝缘、光导、压电、磁性、润滑、超导等特性的膜层。The thin film preparation technology is divided into two categories, the first category is PVD, namely physical vapor deposition, including vacuum evaporation method, magnetron sputtering method, ion plating and so on. The basic principle of vacuum evaporation is to evaporate metals, metal alloys or compounds under vacuum conditions, and then deposit them on the surface of the substrate. The evaporation methods are commonly used resistance heating, high-frequency induction heating, electron beam, laser beam, ion beam high-energy bombardment plating The material is evaporated into a gas phase and then deposited on the surface of the substrate. The basic principle of magnetron sputtering is to make argon gas glow discharge under vacuum conditions filled with argon (Ar) gas. At this time, argon (Ar) atoms are ionized into argon ions (Ar + ), and argon ions are under the action of electric field force. , to accelerate the bombardment of the cathode target made of plating material, the target material will be sputtered and deposited on the surface of the workpiece. If DC glow discharge is used, it is called direct current (Qc) sputtering, and radio frequency (RF) glow discharge is called radio frequency sputtering. Magnetron (M) glow discharge caused by magnetron sputtering. The basic principle of arc plasma coating is to use an arc ignition needle to strike the arc under vacuum conditions, so that arc discharge is carried out between the vacuum gold wall (anode) and the plating material (cathode), and multiple cathode arc spots move rapidly on the cathode surface. Quickly evaporate or even "sublime" the plating material, ionize it into an arc plasma with the plating material as the main component, and quickly deposit the plating material on the substrate. Because there are many arc spots, it is also called multi-arc evaporation ionization process. The basic principle of ion plating is to use a certain plasma ionization technology under vacuum conditions to partially ionize the atoms of the plating material into ions, and at the same time generate many high-energy neutral atoms , which are negatively biased on the substrate to be plated. In this way, under the action of a deep negative bias, ions are deposited on the surface of the substrate to form a thin film. The physical vapor deposition technology has a simple process, improved environment, no pollution, less consumables, uniform and dense film formation, and strong bonding force with the substrate. This technology is widely used in aerospace, electronics, optics, machinery, construction, light industry, metallurgy, materials and other fields. A film with properties such as conductivity.
第二类是CVD,即化学气相沉积,包括金属有机化合物化学气相沉积(MOCVD),它是把反应物质全部以有机金属化合物的气体分子形式,用HZ气作载带气体送到反应室,进行热分解反应而形成化合物半导体的一种新技术。由于它用控制气体流最的方法,容易改变化合物的组成及掺杂浓度,同时所用的设备比较简单,生长速度快,周期短,而且有可能进行批量生产。在半导体器件工艺中开始应用和受到重视;等离子体增强化学气相沉积(PECVD),该方法可在较低温度下形成固体膜。例如在一个反应室内将基体材料置于阴极上,通入反应气体至较低气压(1~600Pa),基体保持一定温度,以某种方式产生辉光放电,基体表面附近气体电离,反应气体得到活化,同时基体表面产生阴极溅射,从而提高了表面活性。在表面上不仅存在着通常的热化学反应,还存在着复杂的等离子体化学反应。沉积膜就是在这两种化学反应的共同作用下形成的。激发辉光放电的方法主要有:射频激发,直流高压激发,脉冲激发和微波激发;溶胶-凝胶(sol-gel)工艺,就是用含高化学活性组分的化合物作前驱体,在液相下将这些原料均匀混合,并进行水解、缩合化学反应,在溶液中形成稳定的透明溶胶体系,溶胶经陈化胶粒间缓慢聚合,形成三维网络结构的凝胶,凝胶网络间充满了失去流动性的溶剂,形成凝胶。凝胶经过干燥、烧结固化制备出具有纳米结构的材料。The second type is CVD, that is, chemical vapor deposition, including metal organic compound chemical vapor deposition (MOCVD), which is to send all the reaction substances in the form of gas molecules of organic metal compounds, and use HZ gas as a carrier gas to send them to the reaction chamber. A new technology for the formation of compound semiconductors through thermal decomposition reactions. Because it uses the best method to control the gas flow, it is easy to change the composition and doping concentration of the compound, and the equipment used is relatively simple, the growth speed is fast, the cycle is short, and it is possible to carry out mass production. Beginning of application and attention in semiconductor device processing; Plasma Enhanced Chemical Vapor Deposition (PECVD), which can form solid films at lower temperatures. For example, the matrix material is placed on the cathode in a reaction chamber, the reaction gas is introduced to a lower pressure (1-600Pa), the matrix is kept at a certain temperature, and a glow discharge is generated in a certain way, the gas near the surface of the matrix is ionized, and the reaction gas is obtained. activation, and at the same time cathode sputtering occurs on the surface of the substrate, thereby improving the surface activity. There are not only the usual thermochemical reactions on the surface, but also complex plasma chemical reactions. The deposited film is formed under the combined action of these two chemical reactions. The methods of exciting glow discharge mainly include: radio frequency excitation, DC high voltage excitation, pulse excitation and microwave excitation; sol-gel process, which is to use compounds containing highly chemically active components as precursors, in liquid phase. These raw materials are uniformly mixed, and undergo hydrolysis and condensation chemical reactions to form a stable transparent sol system in the solution. The sol is slowly polymerized between the aged colloidal particles to form a gel with a three-dimensional network structure. A fluid solvent that forms a gel. The gel is dried, sintered and solidified to prepare a nanostructured material.
但是在现实生产中,由于富勒烯本身的特性,以固态形式存在的只有富勒烯粉体或者其衍生物,而且由于现有工艺的限制,无法得到理想的连续膜形态,这就需要一种新型、经济的装备及镀膜工艺来满足这种需求。对于粉体材料一般使用真空蒸镀法来成膜,真空蒸镀法的适用性比较广,而且成本较低,符合生产制备的基本条件。但是蒸镀法有以下缺点:However, in actual production, due to the characteristics of fullerene itself, only fullerene powder or its derivatives exist in solid form, and due to the limitation of the existing technology, the ideal continuous film shape cannot be obtained, which requires a A new and economical equipment and coating process to meet this demand. For powder materials, the vacuum evaporation method is generally used to form a film. The vacuum evaporation method has wide applicability and low cost, which meets the basic conditions of production and preparation. However, the evaporation method has the following disadvantages:
(1)蒸发的分子能量很低,导致薄膜质量低下,薄膜表面缺陷较多;(1) The molecular energy of evaporation is very low, resulting in low film quality and many surface defects;
(2)蒸镀的膜中心点厚,四周薄;(2) The center point of the evaporated film is thick and the surrounding area is thin;
(3)蒸镀不适应大规模的生产;(3) Evaporation is not suitable for large-scale production;
(4)相比于溅射,需要的真空度更高。(4) Compared with sputtering, the required vacuum degree is higher.
因此,设计了一款新型设备及配套工艺来解决上述缺点成为亟待解决的技术问题。Therefore, designing a new type of equipment and supporting process to solve the above shortcomings has become an urgent technical problem to be solved.
发明内容SUMMARY OF THE INVENTION
为了解决现有技术问题,本发明的目的在于克服已有技术存在的不足,提供一种真空镀膜设备及真空镀膜方法,利用压力差提高镀膜分子动能,并采用真空室内排气通路的优化,来提高薄膜的机械性能,解决分子能量低的问题。In order to solve the problems of the prior art, the object of the present invention is to overcome the deficiencies of the prior art, and to provide a vacuum coating equipment and a vacuum coating method, which utilizes the pressure difference to improve the kinetic energy of the coating molecules, and adopts the optimization of the exhaust passage in the vacuum chamber to reduce Improve the mechanical properties of the film and solve the problem of low molecular energy.
为达到上述发明创造目的,本发明采用如下技术方案:In order to achieve the above-mentioned purpose of invention and creation, the present invention adopts the following technical solutions:
一种真空镀膜设备,包括镀膜真空室、蒸发源、样品台、加热源、抽气系统,样品台设置于镀膜真空室中,加热源向镀膜真空室输出热量,进而调控样品台和设置于样品台上的基板的温度;还设置一个与镀膜真空室连通的小真空室,将蒸发源设置于小真空室中,抽气系统包括机械泵和分子泵,机械泵通过粗抽阀分别与镀膜真空室和小真空室连接,分子泵通过高阀分别与镀膜真空室和小真空室连接,形成管阀系统;在小真空室壁上开有小孔,使小孔朝向镀膜真空室设置的样品台上的基板表面;小真空室内部放置镀膜材料作为蒸发源,首先利用抽气系统将镀膜真空室和小真空室均排气至高真空;当镀膜材料开始蒸发时,利用小真空室的通气孔向小真空室通入工作气体,将小真空室内的压力从高真空变为低真空,从而在大小两个真空室内之间形成压力差,给镀膜分子提供了从小真空室壁上小孔喷射而出进入镀膜真空室的定向动能。A vacuum coating equipment includes a coating vacuum chamber, an evaporation source, a sample stage, a heating source, and an air extraction system. The sample stage is arranged in the coating vacuum chamber, and the heating source outputs heat to the coating vacuum chamber, thereby regulating the sample stage and setting on the sample. The temperature of the substrate on the stage; a small vacuum chamber connected with the coating vacuum chamber is also set, and the evaporation source is set in the small vacuum chamber. The pumping system includes a mechanical pump and a molecular pump. The vacuum chamber is connected to the small vacuum chamber, and the molecular pump is connected to the coating vacuum chamber and the small vacuum chamber respectively through the high valve to form a tube valve system; a small hole is opened on the wall of the small vacuum chamber, so that the small hole faces the sample stage set in the coating vacuum chamber The coating material is placed inside the small vacuum chamber as the evaporation source. First, the coating vacuum chamber and the small vacuum chamber are exhausted to high vacuum by the air extraction system; The working gas is introduced into the small vacuum chamber, and the pressure in the small vacuum chamber is changed from high vacuum to low vacuum, thus forming a pressure difference between the two vacuum chambers, providing the coating molecules to spray out from the small holes on the wall of the small vacuum chamber. Directional kinetic energy entering the coating vacuum chamber.
作为本发明优选的技术方案,在镀膜真空室内还设置射频线圈,射频线圈安装在在小真空室壁上小孔和镀膜真空室设置的样品台上的基板之间位置处,射频电源为射频线圈通电;样品台还连接偏压电源;射频电源控制等离子体的密度,偏压电源能控制等离子体的方向;在清洗阶段,利用射频电源离化工作气体,使工作气体分子变成带电粒子,然后偏压电源让带电粒子做定向运动,轰击基板表面,对基板进行清洗;在蒸发镀膜阶段,射频电源离化镀膜分子,增加其能量,偏压电源使镀膜分子定向运动,提高其动能;从而利用射频电源与偏压电源的组合来辅助沉积。As a preferred technical solution of the present invention, a radio frequency coil is also arranged in the coating vacuum chamber, and the radio frequency coil is installed at the position between the small hole on the wall of the small vacuum chamber and the substrate on the sample stage set in the coating vacuum chamber, and the radio frequency power source is the radio frequency coil. Power on; the sample stage is also connected to a bias power supply; the radio frequency power supply controls the density of the plasma, and the bias power supply can control the direction of the plasma; in the cleaning stage, the radio frequency power supply is used to ionize the working gas, so that the working gas molecules become charged particles, and then The bias power supply makes the charged particles move in a directional motion, bombards the surface of the substrate, and cleans the substrate; in the evaporation coating stage, the radio frequency power supply ionizes the coating molecules to increase their energy, and the bias power supply makes the coating molecules move in a directional motion to increase their kinetic energy; thus using A combination of RF power and bias power is used to assist deposition.
作为本发明优选的技术方案,在机械泵和分子泵之间设置前置连接管路,并在前置连接管路上设置前置阀,前置连接管路的一端与机械泵和粗抽阀之间的管路连接,前置连接管路的另一端与分子泵和高阀之间的管路连接,形成多路抽气系统。As a preferred technical solution of the present invention, a pre-connecting pipeline is set between the mechanical pump and the molecular pump, and a pre-valve is set on the pre-connecting pipeline, and one end of the pre-connecting pipeline is connected to the mechanical pump and the rough valve. The other end of the pre-connecting pipeline is connected with the pipeline between the molecular pump and the high valve to form a multi-channel pumping system.
作为本发明优选的技术方案,在镀膜真空室中还设置挡板,挡板围绕小真空室壁上小孔和样品台之间的工作气体射流路径区域进行设置。As a preferred technical solution of the present invention, a baffle is also arranged in the coating vacuum chamber, and the baffle is arranged around the working gas jet path area between the small hole on the wall of the small vacuum chamber and the sample stage.
作为本发明优选的技术方案,镀膜真空室和小真空室之间串联或者嵌套组合连通。As a preferred technical solution of the present invention, the coating vacuum chamber and the small vacuum chamber are connected in series or in a nested combination.
作为本发明优选的技术方案,抽气系统在基板后方顺着镀膜粒子的定向运动方向抽气,保持气体流动方向的压力差。As a preferred technical solution of the present invention, the air pumping system draws air behind the substrate along the directional movement direction of the coating particles to maintain the pressure difference in the gas flow direction.
作为本发明优选的技术方案,样品台由大样品台和小样品台活动连接组合而成,大样品台进行公转,小样品台随着大样品台进行公转的同时进行自转,大样品台和小样品台的转速能进行调节。As a preferred technical solution of the present invention, the sample stage is formed by a combination of a large sample stage and a small sample stage. The rotational speed of the sample stage can be adjusted.
一种真空镀膜方法,采用本发明真空镀膜设备,包括如下步骤:A vacuum coating method, using the vacuum coating equipment of the present invention, comprises the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的基板放入丙酮、乙醇、去离子水中超声清洗各至少10分钟,然后用氮气吹干;Put the pre-cleaned substrate into acetone, ethanol, and deionized water for ultrasonic cleaning for at least 10 minutes each, and then blow dry with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置样品台上,将样品台和负偏压电源相连;Place the cleaned substrate on the sample stage, and connect the sample stage to the negative bias power supply;
c.装入制备材料:c. Loading preparation materials:
将镀膜材料装入蒸发舟中,然后一并放入小真空室内;Put the coating material into the evaporation boat, and then put it into a small vacuum chamber together;
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将两个真空腔抽至高真空,打开蒸发电流,并调节射频功率、偏压、气体流量、温度工艺参数,进行真空镀膜;Turn on the pumping system, pump the two vacuum chambers to high vacuum, turn on the evaporation current, and adjust the RF power, bias voltage, gas flow, temperature process parameters, and carry out vacuum coating;
在清洗阶段,利用射频电源离化工作气体,使工作气体分子变成带电粒子,然后偏压电源让带电粒子做定向运动,轰击基板表面,对基板进行清洗;In the cleaning stage, the working gas is ionized by the radio frequency power supply, so that the working gas molecules become charged particles, and then the bias power supply makes the charged particles move in a direction, bombarding the surface of the substrate, and cleaning the substrate;
在蒸发镀膜阶段,当镀膜材料开始蒸发时,向小真空室通入工作气体,将小真空室内的压力从高真空变为低真空,从而在大小两个真空室内之间形成压力差,给镀膜分子提供了从小真空室进入镀膜真空室的定向动能,并利用射频电源与偏压电源的组合来辅助沉积,在基板上沉积镀膜;In the evaporation coating stage, when the coating material starts to evaporate, the working gas is introduced into the small vacuum chamber to change the pressure in the small vacuum chamber from high vacuum to low vacuum, thereby forming a pressure difference between the large and small vacuum chambers, giving the coating film Molecules provide directional kinetic energy from the small vacuum chamber into the coating vacuum chamber, and use a combination of RF power and bias power to assist deposition to deposit the coating on the substrate;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process.
作为本发明优选的技术方案,在步骤d中,根据工作气体、镀膜分子的不同来确定工艺参数。As a preferred technical solution of the present invention, in step d, process parameters are determined according to differences in working gas and coating molecules.
本发明与现有技术相比较,具有如下显而易见的突出实质性特点和显著优点:Compared with the prior art, the present invention has the following obvious outstanding substantive features and significant advantages:
1.本发明通过利用压力差提高镀膜分子或原子动能,从而提高薄膜机械性能;本发明的利用两个相连的真空室之间的压力差提供给镀膜分子额外的定向动能,必要时还可利用射频电源与偏压电源的组合来辅助沉积;1. The present invention improves the mechanical properties of the film by utilizing the pressure difference to increase the kinetic energy of the coating molecules or atoms; the present invention utilizes the pressure difference between two connected vacuum chambers to provide additional directional kinetic energy to the coating molecules, which can also be used if necessary. A combination of RF power and bias power to assist deposition;
2.本发明提供了一种通过附加定向分子或原子动能,来提高薄膜的硬度来优化真空薄膜的机械性能的新方法,本发明有望为提高真空薄膜力学性能提供新的途径;2. The present invention provides a new method for improving the hardness of the film to optimize the mechanical properties of the vacuum film by adding directed molecular or atomic kinetic energy, and the present invention is expected to provide a new approach for improving the mechanical properties of the vacuum film;
3.本发明设备结构紧凑,方法简单,成本低廉,易于实现,适合推广运用。3. The device of the present invention has compact structure, simple method, low cost, easy realization, and is suitable for popularization and application.
附图说明Description of drawings
图1为本发明实施例一真空镀膜设备结构原理示意图。FIG. 1 is a schematic diagram of the structural principle of a vacuum coating equipment according to an embodiment of the present invention.
具体实施方式Detailed ways
为了使本技术领域的人员更好地理解本发明方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清查、完整地描述。显然,所描述的实施例仅仅是本发明的一部分实施案例,而非全部实施案例。基于本发明中的实施例,本领域普通技术人员在没有做过创造性劳动前提下所获得的所有其他实施例,都应当属于本发明的保护范围。In order for those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be checked and fully described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some implementation cases of the present invention, but not all implementation cases. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
以下结合具体的实施例子对上述方案做进一步说明,本发明的优选实施例详述如下:The above scheme will be further described below in conjunction with specific embodiments, and preferred embodiments of the present invention are described in detail as follows:
实施例一:Example 1:
在本实施例中,如图1所示,一种真空镀膜设备,包括镀膜真空室1、蒸发源3、样品台5、加热源6、抽气系统,样品台5设置于镀膜真空室1中,加热源6向镀膜真空室1输出热量,进而调控样品台5和设置于样品台5上的基板的温度;还设置一个与镀膜真空室1连通的小真空室2,镀膜真空室1和小真空室2之间嵌套组合连通,将小真空室2设置于镀膜真空室1内部;将蒸发源3设置于小真空室2中,抽气系统包括机械泵10和分子泵11,机械泵10通过粗抽阀12分别与镀膜真空室1和小真空室2连接,分子泵11通过高阀9分别与镀膜真空室1和小真空室2连接,形成管阀系统;在小真空室2壁上开有小孔,使小孔朝向镀膜真空室1设置的样品台5上的基板表面;小真空室内部放置镀膜材料作为蒸发源3,首先利用抽气系统将镀膜真空室1和小真空室2均排气至高真空;当镀膜材料开始蒸发时,利用小真空室2的通气孔8向小真空室2通入工作气体,将小真空室2内的压力从高真空变为低真空,从而在大小两个真空室内之间形成压力差,给镀膜分子提供了从小真空室2壁上小孔喷射而出进入镀膜真空室1的定向动能。本实施例利用压力差提高镀膜分子动能,进行真空室内排气通路的优化,为了解决分子能量低的问题,来提高薄膜的机械性能。本实施例使一大一小两个真空室之间嵌套组装连接,小真空室2内部放置镀膜材料,小真空室2壁上开有小孔。最初,大小两个真空室内均排气至高真空。当镀膜材料开始蒸发时,小真空室内从高真空变为低真空,从而在大小两个真空室内之间形成压力差,给镀膜分子提供了从小孔喷射而出的定向动能。In this embodiment, as shown in FIG. 1 , a vacuum coating equipment includes a coating vacuum chamber 1 , an
在本实施例中,如图1所示,在镀膜真空室1内还设置射频线圈4,射频线圈4安装在在小真空室2壁上小孔和镀膜真空室1设置的样品台5上的基板之间位置处,射频电源为射频线圈4通电;样品台5还连接偏压电源;射频电源控制等离子体的密度,偏压电源能控制等离子体的方向;在清洗阶段,利用射频电源离化工作气体,使工作气体分子变成带电粒子,然后偏压电源让带电粒子做定向运动,轰击基板表面,对基板进行清洗;在蒸发镀膜阶段,射频电源离化镀膜分子,增加其能量,偏压电源使镀膜分子定向运动,提高其动能;从而利用射频电源与偏压电源的组合来辅助沉积。本实施例利用射频电源与偏压电源的组合来辅助沉积在此系统里,所用的电源为射频电源和偏压电源而非常规的单一射频电源,射频电源能控制等离子体的密度,偏压电源能控制等离子体的方向,两者结合以达到优异的效果。In this embodiment, as shown in FIG. 1 , a
在本实施例中,如图1所示,在机械泵10和分子泵11之间设置前置连接管路,并在前置连接管路上设置前置阀13,前置连接管路的一端与机械泵10和粗抽阀12之间的管路连接,前置连接管路的另一端与分子泵11和高阀9之间的管路连接,形成多路抽气系统。In this embodiment, as shown in FIG. 1 , a pre-connecting pipeline is set between the
在本实施例中,如图1所示,在镀膜真空室1中还设置挡板7,挡板7围绕小真空室2壁上小孔和样品台5之间的工作气体射流路径区域进行设置。In this embodiment, as shown in FIG. 1 , a
在本实施例中,如图1所示,抽气系统操作如下:In this embodiment, as shown in Figure 1, the air extraction system operates as follows:
第一步:机械泵10预热,打开预阀,将两个真空室抽至低真空;Step 1: The
第二步:关闭预阀,打开高阀9和分子泵11,将两个真空室抽至高真空,最高可抽至1×10-4pa。The second step: close the pre-valve, open the
在本实施例中,如图1所示,一种真空镀膜方法,采用本实施例真空镀膜设备,包括如下步骤:In this embodiment, as shown in FIG. 1 , a vacuum coating method, using the vacuum coating equipment of this embodiment, includes the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的硅片作为基板,放入丙酮、乙醇、去离子水中超声清洗各10分钟,然后用氮气吹干;Use the pre-cleaned silicon wafer as a substrate, put it into acetone, ethanol, and deionized water for ultrasonic cleaning for 10 minutes each, and then dry it with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置转移至镀膜真空室1中,并设置于样品台5上,将样品台5和负偏压电源相连;The cleaned substrate is placed and transferred to the coating vacuum chamber 1, and is set on the
c.装入制备材料:c. Loading preparation materials:
将富勒烯粉体装入蒸发舟,并固定,然后一并放入小真空室2内;The fullerene powder is loaded into the evaporation boat, fixed, and then put into the
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将两个真空腔抽至高真空,并加热至200℃,直至腔内真空小于3.0×10-3Pa;打开蒸发电流;关闭高阀,腔内通入氩气真空到达2Pa时关闭氩气,开启射频电源,功率为50W,起辉后同时打开高阀以及氩气,再打开偏压大小为50V,清洗10分钟;清洗完毕后关闭射频偏压电源,调节蒸发电流为120A,镀膜时间为10分钟;Turn on the pumping system, pump the two vacuum chambers to high vacuum, and heat them to 200°C until the vacuum in the chamber is less than 3.0×10 -3 Pa; turn on the evaporation current; close the high valve, and pass argon into the chamber when the vacuum reaches 2Pa Turn off the argon gas, turn on the RF power supply, the power is 50W, open the high valve and the argon gas at the same time after ignition, turn on the bias voltage to 50V, and clean for 10 minutes; after cleaning, turn off the RF bias power supply and adjust the evaporation current to 120A, The coating time is 10 minutes;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process.
在本实施例中,通过调节射频功率、偏压、气体流量、温度工艺参数,进行真空镀膜;在清洗阶段,利用射频电源离化工作气体,使工作气体分子变成带电粒子,然后偏压电源让带电粒子做定向运动,轰击基板表面,对基板进行清洗;在蒸发镀膜阶段,当镀膜材料开始蒸发时,向小真空室2通入工作气体,将小真空室2内的压力从高真空变为低真空,从而在大小两个真空室内之间形成压力差,给镀膜分子提供了从小真空室2进入镀膜真空室1的定向动能,并利用射频电源与偏压电源的组合来辅助沉积,在基板上沉积镀膜。本实施例采用压力差法制备的富勒烯薄膜的硬度为513HV。In this embodiment, vacuum coating is performed by adjusting the process parameters of radio frequency power, bias voltage, gas flow rate, and temperature; in the cleaning stage, the working gas is ionized by the radio frequency power supply, so that the working gas molecules become charged particles, and then the power supply is biased. Let the charged particles do directional movement, bombard the surface of the substrate, and clean the substrate; in the evaporation coating stage, when the coating material begins to evaporate, the working gas is introduced into the
对比例一:Comparative example 1:
在本实施例中,一种真空镀膜方法,包括如下步骤:In this embodiment, a vacuum coating method includes the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的硅片作为基板,放入丙酮、乙醇、去离子水中超声清洗各10分钟,然后用氮气吹干;Use the pre-cleaned silicon wafer as a substrate, put it into acetone, ethanol, and deionized water for ultrasonic cleaning for 10 minutes each, and then dry it with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置转移至普通镀膜真空室中,并设置于样品台上,将样品台和负偏压电源相连;Transfer the cleaned substrate to a common coating vacuum chamber, set it on the sample stage, and connect the sample stage to the negative bias power supply;
c.装入制备材料:c. Loading preparation materials:
将富勒烯粉体装入蒸发舟,并固定,然后一并放入普通镀膜真空室内;Load the fullerene powder into the evaporation boat, fix it, and then put it into the ordinary coating vacuum chamber together;
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将真空腔抽至高真空,并加热至200℃,直至腔内真空小于3.0×10-3Pa;打开蒸发电流,关闭高阀,腔内通入氩气真空到达2Pa时关闭氩气,开启射频电源,功率为50W,起辉后同时打开高阀以及氩气,再打开偏压大小为50V,清洗10分钟;清洗完毕后关闭射频偏压电源,调节蒸发电流为120A,镀膜时间为10分钟;Turn on the pumping system, pump the vacuum chamber to a high vacuum, and heat it to 200 °C until the vacuum in the chamber is less than 3.0×10 -3 Pa; turn on the evaporation current, close the high valve, and pass argon into the chamber when the vacuum reaches 2Pa and close the argon gas, turn on the RF power supply, the power is 50W, open the high valve and argon gas at the same time after ignition, turn on the bias voltage to 50V, and clean for 10 minutes; after cleaning, turn off the RF bias power supply, adjust the evaporation current to 120A, and the coating time for 10 minutes;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。本对比例方法制备的富勒烯薄膜的硬度为144.3HV。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process. The hardness of the fullerene film prepared by the method of this comparative example is 144.3HV.
实施例二:Embodiment 2:
本实施例与实施例一基本相同,特别之处在于:This embodiment is basically the same as the first embodiment, and the special features are:
在本实施例中,一种真空镀膜方法,采用本实施例一真空镀膜设备,包括如下步骤:In this embodiment, a vacuum coating method, using a vacuum coating device of this embodiment, includes the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的硅片或硬质合金板作为基板,放入丙酮、乙醇、去离子水中超声清洗各10分钟,然后用氮气吹干;Use the pre-cleaned silicon wafer or hard alloy plate as the substrate, put it into acetone, ethanol, and deionized water for ultrasonic cleaning for 10 minutes each, and then dry it with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置转移至镀膜真空室1中,并设置于样品台5上,将样品台5和负偏压电源相连;The cleaned substrate is placed and transferred to the coating vacuum chamber 1, and is set on the
c.装入制备材料:c. Loading preparation materials:
将清洗后的样品转移至小真空室2,将富勒烯粉体装入蒸发舟,并固定,然后一并放入小真空室2内;Transfer the cleaned sample to the
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将两个真空腔抽至高真空,并加热至200℃,直至腔内真空小于3.0×10-3Pa;打开蒸发电流;关闭高阀,腔内通入氩气真空到达2Pa时关闭氩气,开启射频电源,功率为50W,起辉后同时打开高阀以及氩气,再打开偏压大小为50V,清洗10分钟;清洗完毕后将射频电源调至20W,偏压调至150V,开启蒸发电流为130A,维持气压在5.5×10-2pa,镀膜时间为10分钟;Turn on the pumping system, pump the two vacuum chambers to high vacuum, and heat them to 200°C until the vacuum in the chamber is less than 3.0×10 -3 Pa; turn on the evaporation current; close the high valve, and pass argon into the chamber when the vacuum reaches 2Pa Turn off the argon gas, turn on the RF power supply, the power is 50W, open the high valve and the argon gas at the same time after ignition, turn on the bias voltage to 50V, and clean for 10 minutes; after cleaning, adjust the RF power supply to 20W, and the bias voltage to 150V , the evaporation current is 130A, the air pressure is maintained at 5.5×10 -2 Pa, and the coating time is 10 minutes;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。本实施例工艺的制备的薄膜在硅片上的硬度为1900HV,在硬质合金上的硬度为2900HV。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process. The hardness of the film prepared by the process of this embodiment is 1900HV on the silicon wafer and 2900HV on the cemented carbide.
实施例三:Embodiment three:
本实施例与前述实施例基本相同,特别之处在于:This embodiment is basically the same as the previous embodiment, and the special features are:
在本实施例中,一种真空镀膜方法,采用本实施例一真空镀膜设备,包括如下步骤:In this embodiment, a vacuum coating method, using a vacuum coating device of this embodiment, includes the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的蓝宝石基底作为基板,放入丙酮、乙醇、去离子水中超声清洗各10分钟,然后用氮气吹干;Using the pre-cleaned sapphire substrate as a substrate, put it into acetone, ethanol, and deionized water for ultrasonic cleaning for 10 minutes each, and then dry it with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置转移至镀膜真空室1中,并设置于样品台5上,将样品台5和负偏压电源相连;The cleaned substrate is placed and transferred to the coating vacuum chamber 1, and is set on the
c.装入制备材料:c. Loading preparation materials:
将清洗后的样品转移至小真空室2,将富勒烯粉体装入蒸发舟,并固定,然后一并放入小真空室2内;Transfer the cleaned sample to the
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将两个真空腔抽至高真空,并加热至200℃,直至腔内真空小于3.0×10-3Pa;打开蒸发电流;关闭高阀,腔内通入氩气真空到达2Pa时关闭氩气,开启射频电源,功率为50W,起辉后同时打开高阀以及氩气,再打开偏压大小为50V,清洗10分钟;清洗完毕后将射频电源调至30W,偏压调至120V,开启蒸发电流为130A,维持气压在5.5×10-2pa,镀膜时间为10分钟;Turn on the pumping system, pump the two vacuum chambers to high vacuum, and heat them to 200°C until the vacuum in the chamber is less than 3.0×10 -3 Pa; turn on the evaporation current; close the high valve, and pass argon into the chamber when the vacuum reaches 2Pa Turn off the argon gas, turn on the RF power supply, the power is 50W, open the high valve and the argon gas at the same time after ignition, turn on the bias voltage to 50V, and clean for 10 minutes; after cleaning, adjust the RF power supply to 30W, and the bias voltage to 120V , the evaporation current is 130A, the air pressure is maintained at 5.5×10 -2 Pa, and the coating time is 10 minutes;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。本实施例工艺的制备的制备的薄膜在蓝宝石基底上的硬度为3800HV。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process. The hardness of the thin film prepared by the process of this example on the sapphire substrate is 3800HV.
由对比例一、实施例一~实施例三的对比可知,对比例一的真空镀膜设备采用普通真空室,未搭建小真空室,而实施例一真空镀膜设备采用搭建小真空室的真空镀膜设备,在几乎相同的真空镀膜工艺条件下,利用实施例一真空镀膜设备制备的富勒烯薄膜的硬度比利用对比例一的普通真空镀膜设备制备的富勒烯薄膜的硬度提高了2.56倍,提高薄膜的机械性能非常显著。实施例二由于在偏压的条件下进行辅助沉积,利用实施例二真空镀膜设备和偏压辅助镀膜制备的富勒烯薄膜的硬度比利用对比例一的普通真空镀膜设备制备的富勒烯薄膜的硬度提高了12.17倍,提高薄膜的机械性能非常显著。实施例二和实施例三还由于采用了硬质合金、蓝宝石基底作为基板,通过双真空室、偏压辅助镀膜以及选择不同的基底,实现了薄膜的机械性能显著提高。It can be seen from the comparison of Comparative Example 1 and Example 1 to Example 3 that the vacuum coating equipment of Comparative Example 1 adopts a common vacuum chamber without building a small vacuum chamber, while the vacuum coating equipment of Example 1 adopts a vacuum coating equipment that builds a small vacuum chamber. , under almost the same vacuum coating process conditions, the hardness of the fullerene film prepared by using the vacuum coating equipment of Example 1 is 2.56 times higher than that of the fullerene film prepared by using the ordinary vacuum coating equipment of Comparative Example 1. The mechanical properties of the films are remarkable.
实施例四:Embodiment 4:
本实施例与前述实施例基本相同,特别之处在于:This embodiment is basically the same as the previous embodiment, and the special features are:
在本实施例中,在本实施例中,一种真空镀膜方法,采用本实施例一真空镀膜设备,包括如下步骤:In this embodiment, in this embodiment, a vacuum coating method, using a vacuum coating device in this embodiment, includes the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的硅片作为基板,放入丙酮、乙醇、去离子水中超声清洗各10分钟,然后用氮气吹干;Use the pre-cleaned silicon wafer as a substrate, put it into acetone, ethanol, and deionized water for ultrasonic cleaning for 10 minutes each, and then dry it with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置转移至镀膜真空室1中,并设置于样品台5上,将样品台5和负偏压电源相连;The cleaned substrate is placed and transferred to the coating vacuum chamber 1, and is set on the
c.装入制备材料:c. Loading preparation materials:
将铝丝装入蒸发舟,并固定,然后一并放入小真空室2内;Put the aluminum wire into the evaporation boat, fix it, and then put it into the
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将两个真空腔抽至高真空,并加热至200℃,直至腔内真空小于3.0×10-3Pa;打开蒸发电流;关闭高阀,腔内通入氩气真空到达2Pa时关闭氩气,开启射频电源,功率为50W,起辉后同时打开高阀以及氩气,再打开偏压大小为50V,清洗10分钟;清洗完毕后关闭射频偏压电源,调节蒸发电流为130A,镀膜时间为10分钟;Turn on the pumping system, pump the two vacuum chambers to high vacuum, and heat them to 200°C until the vacuum in the chamber is less than 3.0×10 -3 Pa; turn on the evaporation current; close the high valve, and pass argon into the chamber when the vacuum reaches 2Pa Turn off the argon gas, turn on the RF power supply, the power is 50W, open the high valve and the argon gas at the same time after ignition, turn on the bias voltage to 50V, and clean for 10 minutes; after cleaning, turn off the RF bias power supply and adjust the evaporation current to 130A, The coating time is 10 minutes;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。本实施例工艺方法制备出的铝薄膜电阻率为8.481x10-8Ωm。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process. The resistivity of the aluminum thin film prepared by the process method in this embodiment is 8.481×10 -8 Ωm.
对比例二:Comparative example two:
在本实施例中,一种真空镀膜方法,包括如下步骤:In this embodiment, a vacuum coating method includes the following steps:
a.清洗基底:a. Cleaning the substrate:
将预先清洁后的硅片作为基板,放入丙酮、乙醇、去离子水中超声清洗各10分钟,然后用氮气吹干;Use the pre-cleaned silicon wafer as a substrate, put it into acetone, ethanol, and deionized water for ultrasonic cleaning for 10 minutes each, and then dry it with nitrogen;
b.放置基板:b. Place the substrate:
将清洗后的基板放置转移至普通镀膜真空室中,并设置于样品台上,将样品台和负偏压电源相连;Transfer the cleaned substrate to a common coating vacuum chamber, set it on the sample stage, and connect the sample stage to the negative bias power supply;
c.装入制备材料:c. Loading preparation materials:
将铝丝装入蒸发舟,并固定,然后一并放入普通镀膜真空室内;Put the aluminum wire into the evaporation boat, fix it, and then put it into the ordinary coating vacuum chamber together;
d.抽真空镀膜:d. Vacuum coating:
开启抽气系统,将真空腔抽至高真空,并加热至200℃,直至腔内真空小于3.0×10-3Pa;打开蒸发电流,关闭高阀,腔内通入氩气真空到达2Pa时关闭氩气,开启射频电源,功率为50W,起辉后同时打开高阀以及氩气,再打开偏压大小为50V,清洗10分钟;清洗完毕后关闭射频偏压电源,调节蒸发电流为130A,镀膜时间为10分钟;Turn on the pumping system, pump the vacuum chamber to a high vacuum, and heat it to 200 °C until the vacuum in the chamber is less than 3.0×10 -3 Pa; turn on the evaporation current, close the high valve, and pass argon into the chamber when the vacuum reaches 2Pa and close the argon gas, turn on the RF power supply, the power is 50W, open the high valve and argon gas at the same time after ignition, turn on the bias voltage to 50V, and clean for 10 minutes; after cleaning, turn off the RF bias power supply, adjust the evaporation current to 130A, and the coating time for 10 minutes;
e.退火:e. Annealing:
在高真空状态下,使基板上沉积的镀膜自然冷却;In a high vacuum state, the coating film deposited on the substrate is cooled naturally;
f.重复上述镀膜步骤d和步骤e至少一次,直至镀膜的厚度满足需求,从而完成真空镀膜过程。本对比例工艺方法制备出的铝薄膜电阻率为9.535x10-8Ωm。f. Repeat the above-mentioned coating step d and step e at least once until the thickness of the coating film meets the requirements, thereby completing the vacuum coating process. The resistivity of the aluminum thin film prepared by the process method of this comparative example is 9.535×10 -8 Ωm.
由对比例二、实施例四的对比可知,对比例二的真空镀膜设备采用普通真空室,未搭建小真空室,而实施例四真空镀膜设备采用搭建小真空室的真空镀膜设备,在几乎相同的真空镀膜工艺条件下,利用实施例四真空镀膜设备制备的铝薄膜的电阻率比利用对比例二的普通真空镀膜设备制备的铝薄膜的电阻率降低了11.05%,在提高薄膜的机械性能的同时,还提高了薄膜的电学性能,从而使薄膜的综合性能获得优化。From the comparison between Comparative Example 2 and Example 4, it can be seen that the vacuum coating equipment of Comparative Example 2 adopts an ordinary vacuum chamber without building a small vacuum chamber, while the vacuum coating equipment of Example 4 adopts a vacuum coating equipment that builds a small vacuum chamber, which is almost the same. Under the same vacuum coating process conditions, the resistivity of the aluminum thin film prepared by using the vacuum coating equipment of Example 4 is 11.05% lower than that of the aluminum thin film prepared by using the ordinary vacuum coating equipment of Comparative Example 2. At the same time, the electrical properties of the film are also improved, thereby optimizing the overall performance of the film.
实施例五:Embodiment 5:
本实施例与前述实施例基本相同,特别之处在于:This embodiment is basically the same as the previous embodiment, and the special features are:
在本实施例中,镀膜真空室1和小真空室2之间串联组合连通。本实施例采用两个真空室之间串联,包括第一真空室和第二真空室,第一真空室为小真空室,第二真空室为相对较大真空室,在第一真空室内部放置镀膜材料,并在第一真空室壁上开有小孔。最初,将两个真空室内均排气至高真空。当镀膜材料开始蒸发时,将第一真空室内从高真空变为低真空,从而在两个真空室内之间形成压力差,给镀膜分子提供了从小孔喷射而出的定向动能。In this embodiment, the coating vacuum chamber 1 and the
实施例六:Embodiment 6:
本实施例与前述实施例基本相同,特别之处在于:This embodiment is basically the same as the previous embodiment, and the special features are:
在本实施例中,抽气系统在基板后方顺着镀膜粒子的定向运动方向抽气,保持气体流动方向的压力差。由于分子泵11的抽速很快,抽气通道的设置会影响真空室内镀膜分子的浓度分布,进而影响薄膜沉积。因此优化了真空室内的排气通路,具体为抽气系统在基板后方顺着镀膜粒子的定向运动方向抽气,保持气体流动方向的压力差。In the present embodiment, the air pumping system draws air behind the substrate along the directional movement direction of the coating particles to maintain the pressure difference in the gas flow direction. Since the pumping speed of the
实施例七:Embodiment 7:
本实施例与前述实施例基本相同,特别之处在于:This embodiment is basically the same as the previous embodiment, and the special features are:
在本实施例中,样品台5由大样品台和小样品台活动连接组合而成,大样品台进行公转,小样品台随着大样品台进行公转的同时进行自转,大样品台和小样品台的转速能进行调节。本和实施例解决了大规模生产以及膜厚不均匀的问题,设计了新的样品台,大样品台中有小样品台,大样品台可以公转,小样品台随着公转的同时,可以进行自转,转速可以调节,制备的薄膜厚度就会更加均匀。In this embodiment, the
实施例八:Embodiment 8:
本实施例与前述实施例基本相同,特别之处在于:This embodiment is basically the same as the previous embodiment, and the special features are:
在本实施例中,真空镀膜方法,在步骤d中进行抽真空镀膜时,根据工作气体、镀膜分子的不同来确定工艺参数。本实施例通过利用压力差提高镀膜分子或原子动能,从而提高薄膜机械性能,还进一步通过工作气体、镀膜分子的不同来确定工艺参数。本发明利用两个相连的真空室之间的压力差提供给镀膜分子额外的定向动能,必要时还可以利用射频电源与偏压电源的组合来辅助沉积。提供了通过附加定向分子或原子动能来提高薄膜的硬度来优化真空薄膜的机械性能的新方法,这一发明有望为提高真空薄膜力学性能提供新的途径。In this embodiment, in the vacuum coating method, when vacuum coating is performed in step d, the process parameters are determined according to the difference of working gas and coating molecules. In this embodiment, the pressure difference is used to increase the kinetic energy of the coating molecules or atoms, thereby improving the mechanical properties of the thin film, and the process parameters are further determined by the difference between the working gas and the coating molecules. The present invention utilizes the pressure difference between two connected vacuum chambers to provide additional directional kinetic energy to coating molecules, and can also utilize a combination of radio frequency power and bias power to assist deposition when necessary. It provides a new method to optimize the mechanical properties of vacuum thin films by adding oriented molecular or atomic kinetic energy to increase the hardness of the thin films. This invention is expected to provide a new way to improve the mechanical properties of vacuum thin films.
上面对本发明实施例结合附图进行了说明,但本发明不限于上述实施例,还可根据本发明的发明创造的目的做出多种变化,凡依据本发明技术方案的精神实质和原理下做的改变、修饰、替代、组合或简化,均应为等效的置换方式,只要符合本发明的发明目的,只要不背离本发明真空镀膜设备及真空镀膜方法的技术原理和发明构思,都属于本发明的保护范围。The embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to the above-mentioned embodiments, and various changes can be made according to the purpose of the invention and creation of the present invention. Changes, modifications, substitutions, combinations or simplifications should be equivalent replacement methods, as long as they meet the purpose of the present invention, as long as they do not deviate from the technical principles and inventive concepts of the vacuum coating equipment and vacuum coating method of the present invention, all belong to the present invention. the scope of protection of the invention.
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112430805A (en) * | 2020-11-23 | 2021-03-02 | 中国科学院光电技术研究所 | Vacuum control system of atomic layer deposition coating machine |
CN112680700A (en) * | 2020-12-04 | 2021-04-20 | 安徽工业大学 | Device and method for preparing electron beam-assisted carbon-based super-lubricating solid film |
CN117507436A (en) * | 2023-12-25 | 2024-02-06 | 创隆实业(深圳)有限公司 | Film forming device and process adopting radio frequency laying assisted film forming and high frequency pulse bias |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6086963A (en) * | 1996-02-14 | 2000-07-11 | Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. | Method and device for control of a vacuum vaporization process |
CN1894763A (en) * | 2003-12-12 | 2007-01-10 | 山米奎普公司 | Method and apparatus for extracting ions from an ion source for use in ion implantation |
US20110006038A1 (en) * | 2009-07-13 | 2011-01-13 | Michael Charles Kutney | Plasma processing chamber with enhanced gas delivery |
CN103789738A (en) * | 2014-01-15 | 2014-05-14 | 盐城工学院 | WO3 Cluster Beam Deposition System and Method for Using It to Prepare WO3 Thin Films |
-
2020
- 2020-04-02 CN CN202010254973.3A patent/CN111575652A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6086963A (en) * | 1996-02-14 | 2000-07-11 | Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. | Method and device for control of a vacuum vaporization process |
CN1894763A (en) * | 2003-12-12 | 2007-01-10 | 山米奎普公司 | Method and apparatus for extracting ions from an ion source for use in ion implantation |
US20110006038A1 (en) * | 2009-07-13 | 2011-01-13 | Michael Charles Kutney | Plasma processing chamber with enhanced gas delivery |
CN103789738A (en) * | 2014-01-15 | 2014-05-14 | 盐城工学院 | WO3 Cluster Beam Deposition System and Method for Using It to Prepare WO3 Thin Films |
Non-Patent Citations (1)
Title |
---|
姜银方: "《现代表面工程技术》", 31 January 2006, 化学工业出版社 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112430805A (en) * | 2020-11-23 | 2021-03-02 | 中国科学院光电技术研究所 | Vacuum control system of atomic layer deposition coating machine |
CN112680700A (en) * | 2020-12-04 | 2021-04-20 | 安徽工业大学 | Device and method for preparing electron beam-assisted carbon-based super-lubricating solid film |
CN117507436A (en) * | 2023-12-25 | 2024-02-06 | 创隆实业(深圳)有限公司 | Film forming device and process adopting radio frequency laying assisted film forming and high frequency pulse bias |
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