CN110752177A - Reflective flip chip bonding machine and chip bonding method - Google Patents
Reflective flip chip bonding machine and chip bonding method Download PDFInfo
- Publication number
- CN110752177A CN110752177A CN201910963693.7A CN201910963693A CN110752177A CN 110752177 A CN110752177 A CN 110752177A CN 201910963693 A CN201910963693 A CN 201910963693A CN 110752177 A CN110752177 A CN 110752177A
- Authority
- CN
- China
- Prior art keywords
- chip
- adsorption device
- chip bonding
- bonding machine
- flip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000001179 sorption measurement Methods 0.000 claims description 51
- 238000006073 displacement reaction Methods 0.000 claims description 9
- 238000010438 heat treatment Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 abstract description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000001459 lithography Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
Abstract
本发明公开了一种反射式倒装芯片键合机及芯片键合方法,能够提升对准以及键合精度,降低了芯片工艺的复杂度。该反射式倒装芯片键合机,包括:用于安装上芯片的上吸附装置;用于安装下芯片的下吸附装置;设置在下吸附装置上的通孔;红外发光二极管;沿红外发光二极管的红外光光路方向设置的分束器;与分束器的出射光连接并正对通孔设置的物镜;与分束器反射光对接的工业相机;与工业相机连接的显示器。本发明观测装置结构简单,无需在两个芯片间插入其他复杂的光学系统来进行观测,大大降低了制造复杂度和成本,并且,大大降低了误差,提高了键合精度。
The invention discloses a reflective flip-chip bonding machine and a chip bonding method, which can improve alignment and bonding accuracy and reduce the complexity of chip technology. The reflective flip-chip bonding machine includes: an upper suction device for installing an upper chip; a lower suction device for installing a lower chip; a through hole arranged on the lower suction device; an infrared light emitting diode; A beam splitter arranged in the direction of the infrared light path; an objective lens connected to the outgoing light of the beam splitter and facing the through hole; an industrial camera connected to the reflected light of the beam splitter; a display connected to the industrial camera. The observation device of the present invention has a simple structure, does not need to insert other complex optical systems between two chips for observation, greatly reduces the manufacturing complexity and cost, and greatly reduces errors and improves the bonding accuracy.
Description
技术领域technical field
本发明涉及芯片键合技术领域,具体涉及一种反射式倒装芯片键合机及芯片键合方法。The invention relates to the technical field of chip bonding, in particular to a reflective flip-chip bonding machine and a chip bonding method.
背景技术Background technique
芯片键合是指将两片长有器件的芯片清洗后,在一定条件下通过某种方式(如加热,施加压力等)贴合到一起,使两片芯片结合成为一个整体。此过程中涉及到一个很重要的步骤——芯片对准。目前市面上的倒装芯片键合装置的对准多为用可见光分别照射需要键合的上下两块芯片,通过芯片上的对准图案来进行两个芯片的相对距离测量,根据相对距离进行移动并对准。此方法在对准阶段需要将两个待键合的芯片分开,以在两芯片中间插入观测装置,观测完毕后再将两芯片距离拉近键合。Chip bonding means that after cleaning two chips with devices, they are bonded together under certain conditions by a certain method (such as heating, applying pressure, etc.), so that the two chips are combined into a whole. A very important step is involved in this process - chip alignment. At present, the alignment of flip-chip bonding devices on the market is mostly to irradiate the upper and lower chips to be bonded with visible light, and measure the relative distance of the two chips through the alignment pattern on the chips, and move according to the relative distance. and align. In this method, two chips to be bonded need to be separated in the alignment stage, so that an observation device is inserted between the two chips, and after the observation is completed, the distance between the two chips is shortened and bonded.
现有的技术方案中,两个芯片分别是两个需要对准的芯片的一部分标记。在两个芯片中插入全反镜使得光线返回至相机已获得芯片标记图案,后续进行对准处理。这样的结构既复杂又由于键合过程不能实时观测,而难以保证两芯片在靠近过程中是否保持水平距离不变,精度上很难进行提升。倒装键合机由于需要观测芯片表面的对准标记,传统的键合机需要在观测时翻转芯片以便于观测或者在两片需贴合的芯片中插入观测装置。例如,增大了系统误差和位移误差。In the existing technical solution, the two chips are respectively part of the marks of the two chips that need to be aligned. Inserting all-reflecting mirrors in the two chips makes the light return to the camera to obtain the chip marking pattern, and the subsequent alignment process is performed. Such a structure is complex and because the bonding process cannot be observed in real time, it is difficult to ensure that the horizontal distance between the two chips remains unchanged during the approaching process, and it is difficult to improve the accuracy. Since the flip-chip bonding machine needs to observe the alignment marks on the surface of the chip, the traditional bonding machine needs to turn the chip during observation to facilitate observation or insert an observation device into the two chips to be bonded. For example, systematic errors and displacement errors are increased.
发明内容SUMMARY OF THE INVENTION
本发明提供了一种反射式倒装芯片键合机及芯片键合方法,能够提升对准以及键合精度,降低了芯片工艺的复杂度。The present invention provides a reflective flip-chip bonding machine and a chip bonding method, which can improve alignment and bonding precision and reduce the complexity of chip technology.
一种反射式倒装芯片键合机,包括:A reflective flip-chip bonding machine, comprising:
用于安装上芯片的上吸附装置;The upper adsorption device used to install the upper chip;
用于安装下芯片的下吸附装置;A lower adsorption device for installing the lower chip;
设置在所述下吸附装置上的通孔;a through hole arranged on the lower adsorption device;
用于发射红外光的红外发光二极管;Infrared light-emitting diodes for emitting infrared light;
沿所述红外发光二极管的红外光光路方向设置的分束器;a beam splitter arranged along the direction of the infrared light path of the infrared light emitting diode;
与所述分束器的出射光连接并正对所述通孔设置的物镜;an objective lens connected to the outgoing light of the beam splitter and facing the through hole;
与所述分束器反射光对接的工业相机;an industrial camera docked with the reflected light from the beam splitter;
与所述工业相机连接的显示器。A display connected to the industrial camera.
本发明中,红外发光二极管发出红外光,先通过分束器,然后通过物镜,再通过通孔,照射至芯片表面,反射回来的光通过物镜,分束器反射至工业相机,通过数据线传至显示器,观测装置结构简单,无需在两个芯片间插入其他复杂的光学系统来进行观测,大大降低了制造复杂度和成本。由于特殊的光路设计,光线从下方穿透下芯片照射至上芯片表面,所以上芯片无需双面光刻,也无需抛光,即对上芯片的底部没有工艺要求,减少了对上芯片的工艺限制和工艺复杂度,大大扩展了设备适用对象。In the present invention, the infrared light-emitting diode emits infrared light, which first passes through the beam splitter, then passes through the objective lens, and then passes through the through hole, and irradiates the surface of the chip. The reflected light passes through the objective lens, and the beam splitter is reflected to the industrial camera and transmitted through the data line As far as the display is concerned, the observation device has a simple structure, and does not need to insert other complex optical systems between the two chips for observation, which greatly reduces the manufacturing complexity and cost. Due to the special optical path design, the light penetrates the lower chip from below and irradiates the surface of the upper chip, so the upper chip does not need double-sided lithography and polishing, that is, there is no process requirement for the bottom of the upper chip, which reduces the process restrictions on the upper chip and The complexity of the process greatly expands the applicable objects of the equipment.
所述的上芯片和下芯片都是相对的概念,表明键合需要两个芯片,所述的上吸附装置和下吸附装置也是相对的改变,表明有两个相对设置的吸附装置。也可写成,用于安装第一芯片的第一吸附装置;用于安装第二芯片的第二吸附装置。The upper chip and the lower chip are relative concepts, indicating that two chips are required for bonding, and the upper adsorption device and the lower adsorption device are also relatively changed, indicating that there are two oppositely arranged adsorption devices. It can also be written as, the first adsorption device for installing the first chip; the second adsorption device for installing the second chip.
所述的上吸附装置和下吸附装置相对设置并相互配合。即所述的第一吸附装置和第二吸附装置相对设置并相互配合。The upper adsorption device and the lower adsorption device are arranged opposite to each other and cooperate with each other. That is to say, the first adsorption device and the second adsorption device are arranged opposite to each other and cooperate with each other.
所述的上吸附装置连接有三维移动装置,具体为上吸附装置支撑架。上吸附装置可随着可水平和垂直移动的支撑架的移动而移动。The upper adsorption device is connected with a three-dimensional moving device, specifically a support frame of the upper adsorption device. The upper suction device can move with the movement of the horizontally and vertically movable support frame.
所述的下吸附装置连接有三维移动装置,具体为下吸附装置支撑架。同理下吸附装置可随着可水平和垂直移动的支撑架的移动而移动。The lower adsorption device is connected with a three-dimensional moving device, specifically a lower adsorption device support frame. In the same way, the adsorption device can move with the movement of the horizontally and vertically movable support frame.
所述的下吸附装置连接有温控装置,可为芯片键合提供相应的工作温度。The lower adsorption device is connected with a temperature control device, which can provide a corresponding working temperature for chip bonding.
通孔能够让光线通过,让红外光的入射以及芯片表面发射光通过。The through hole allows light to pass through, allowing the incidence of infrared light and the light emitted from the chip surface to pass through.
分束器用于让所述红外发光二极管发射的红外光顺利通过并将反射光分束反射到工业相机。The beam splitter is used to allow the infrared light emitted by the infrared light-emitting diode to pass through smoothly and to split the reflected light to the industrial camera.
所述的红外发光二极管与所述分束器之间设置有反射镜。红外发光二极管发出红外光,先通过反射镜和分束器,然后通过物镜,再通过通孔,照射至芯片表面,反射回来的光通过物镜,分束器反射至工业相机,通过数据线传至显示器。A reflector is arranged between the infrared light-emitting diode and the beam splitter. The infrared light-emitting diode emits infrared light, first through the reflector and beam splitter, then through the objective lens, and then through the through hole, irradiating the surface of the chip, the reflected light passes through the objective lens, the beam splitter is reflected to the industrial camera, and is transmitted to the monitor.
所述的反射镜采用45°反射结构,所述的反射镜设置在反射镜位移台上。The reflection mirror adopts a 45° reflection structure, and the reflection mirror is arranged on the reflection mirror displacement stage.
所述的工业相机设置在工业相机位移台上。The industrial camera is set on the industrial camera displacement stage.
一种倒装芯片键合方法,采用本发明反射式倒装芯片键合机,包括以下步骤:A flip-chip bonding method, using the reflective flip-chip bonding machine of the present invention, includes the following steps:
步骤一:分别将所需键合的上芯片和下芯片用上吸附装置和下吸附装置固定住;Step 1: respectively fix the upper chip and the lower chip to be bonded with the upper adsorption device and the lower adsorption device;
步骤二:调节上吸附装置支撑架和下吸附装置支撑架使得两芯片靠近且显示器上能够清楚看见两个芯片上的标记图案;Step 2: Adjust the upper adsorption device support frame and the lower adsorption device support frame so that the two chips are close to each other and the marking patterns on the two chips can be clearly seen on the display;
步骤三:根据标记图案来改变上芯片的位置,直至上芯片的标记图案和下芯片的标记图案对准;Step 3: Change the position of the upper chip according to the marking pattern, until the marking pattern of the upper chip and the marking pattern of the lower chip are aligned;
步骤四:打开温控装置的加热功能,调节下吸附装置支撑架使上芯片压在下芯片上,完成键合。Step 4: Turn on the heating function of the temperature control device, adjust the support frame of the lower adsorption device so that the upper chip is pressed on the lower chip, and the bonding is completed.
与现有技术相比,本发明具有如下优点:Compared with the prior art, the present invention has the following advantages:
一、观测装置结构简单,无需在两个芯片间插入其他复杂的光学系统来进行观测,大大降低了制造复杂度和成本。1. The structure of the observation device is simple, and there is no need to insert other complex optical systems between the two chips for observation, which greatly reduces the manufacturing complexity and cost.
二、由于对准过程上下芯片距离无限接近,利用这种特殊的对准方式,可以达到键合和对准的一体性。不同于传统键合机的先对准再键合,本发明不需要再进行观测装置的移动和上下芯片大行程位移,对准后可直接键合,实现了对准和键合的同步性。大大降低了误差,提高了键合精度。2. Since the distance between the upper and lower chips during the alignment process is infinitely close, the integration of bonding and alignment can be achieved by using this special alignment method. Different from the traditional bonding machine that aligns first and then bonds, the present invention does not need to move the observation device and the large stroke displacement of the upper and lower chips, and can be directly bonded after alignment, realizing the synchronization of alignment and bonding. The error is greatly reduced and the bonding accuracy is improved.
三、由于特殊的光路设计,光线从下方穿透下芯片照射至上芯片表面,所以上芯片无需双面光刻,也无需抛光,即对上芯片的底部没有工艺要求,减少了对上芯片的工艺限制和工艺复杂度,大大扩展了设备适用对象。3. Due to the special optical path design, the light penetrates the lower chip from below to irradiate the surface of the upper chip, so the upper chip does not need double-sided lithography, nor does it need to be polished, that is, there is no process requirement for the bottom of the upper chip, which reduces the process of the upper chip. Restrictions and process complexity greatly expand the applicable objects of the equipment.
附图说明Description of drawings
图1为本发明反射式倒装芯片键合机的结构示意图;1 is a schematic structural diagram of a reflective flip-chip bonding machine of the present invention;
图2为本发明倒装芯片键合方法的流程示意图。FIG. 2 is a schematic flowchart of the flip-chip bonding method of the present invention.
具体实施方式Detailed ways
如图1所示,一种反射式倒装芯片键合机,包括:用于安装上芯片2的上吸附装置1;与上吸附装置1配合用于安装下芯片3的下吸附装置4;设置在下吸附装置4上的通孔14;用于发射红外光的红外发光二极管10;用于让红外发光二极管10发射的红外光顺利通过并且将发射光反射的分束器8;与分束器8连接并正对通孔14设置的物镜7;与物镜7对接的工业相机9;与工业相机9连接的显示器12。工业相机9设置在位移台15上。红外发光二极管10与分束器8之间设置有反射镜11。As shown in FIG. 1 , a reflective flip-chip bonding machine includes: an upper adsorption device 1 for installing an upper chip 2; a lower adsorption device 4 for installing a lower chip 3 in cooperation with the upper adsorption device 1; The through
上吸附装置1连接有三维移动装置,具体为支撑架13,上吸附装置1可随着可水平和垂直移动的支撑架13的移动而移动。The upper adsorption device 1 is connected with a three-dimensional moving device, specifically a
下吸附装置4连接有三维移动装置,具体为支撑架6。同理下吸附装置4可随着可水平和垂直移动的支撑架6的移动而移动。The lower adsorption device 4 is connected with a three-dimensional moving device, specifically a
下吸附装置4连接有温控装置5,可为芯片键合提供相应的工作温度。The lower adsorption device 4 is connected with a temperature control device 5, which can provide a corresponding working temperature for chip bonding.
如图1所示,反射式倒装芯片键合机,需要键合的两个芯片,上芯片2和下芯片3分别通过上吸附装置1和下吸附装置4固定。下吸附装置4连接了温控装置5,可为芯片键合提供相应的工作温度。上吸附装置1可随着可水平和垂直移动的支撑架13的移动而移动。同理下吸附装置4可随着可水平和垂直移动的支撑架6的移动而移动。支撑架13和支撑架6的下方放置显微装置(包括红外发光二极管10、反射镜11、分束器8、物镜7、工业相机9和显示器12)。红外发光二极管10发射的光线先通过反射镜11,再通过分束器8,然后通过物镜7,最后通过通孔14照射至芯片上。反射回来的像通过物镜7,分束器8反射至工业相机9,通过数据线传至显示器12。为方便调节视场范围,在反射镜11和工业相机9下方分别安装可以水平垂直移动的位移台16和位移台15。As shown in FIG. 1 , in the reflective flip-chip bonding machine, two chips to be bonded, the upper chip 2 and the lower chip 3 are respectively fixed by the upper adsorption device 1 and the lower adsorption device 4 . The lower adsorption device 4 is connected to the temperature control device 5, which can provide a corresponding working temperature for chip bonding. The upper adsorption device 1 can move with the movement of the horizontally and vertically
反射镜11可以任意调节反射角度,在上述实例中,采用的是45°反射,根据实际需要可以采用其他反射结构。The reflection angle of the mirror 11 can be adjusted arbitrarily. In the above example, 45° reflection is adopted, and other reflection structures can be adopted according to actual needs.
下吸附装置4采用的是成本低的铜材料,中间打通孔14以通光。也可以采用其他导热材料来加工。The lower adsorption device 4 is made of low-cost copper material, and a through
本实例还提供了一种倒装芯片键合方法。请结合参考图,倒装芯片键合方法包括以下步骤,请同时参考图1和图2以便理解:This example also provides a flip-chip bonding method. Please refer to the figure, the flip-chip bonding method includes the following steps, please refer to Figure 1 and Figure 2 at the same time for understanding:
步骤一:分别将所需键合的上芯片2和下芯片3用上吸附装置1和下吸附装置4固定住。Step 1: Fix the upper chip 2 and the lower chip 3 to be bonded with the upper adsorption device 1 and the lower adsorption device 4 respectively.
步骤二:调节支撑架6和支撑架13使得两芯片无限靠近且显示器12上可以清楚看见两个芯片上的标记图案。Step 2: Adjust the
步骤三:根据标记图案来改变上芯片2的位置,直至上芯片2的标记图案和下芯片3的标记图案对准。Step 3: Change the position of the upper chip 2 according to the marking pattern until the marking pattern of the upper chip 2 and the marking pattern of the lower chip 3 are aligned.
步骤四:打开温控装置5的加热功能,调节支撑架13使上芯片2压在下芯片3上,完成键合。Step 4: Turn on the heating function of the temperature control device 5, adjust the
本发明是采用红外光源的特殊的光路设计,红外光具有穿透芯片的能力,因此无需翻转芯片或插入观测装置,只需要直接观察就行,大大减小了系统误差,并且由于无需反转或大幅移动芯片,因此,位移误差无限接近于0,误差在15nm左右(根据使用的自动位移平台的位移误差而定)预计键合精度在200nm左右。因此,大大降低了误差,提高了键合精度。The invention adopts the special optical path design of the infrared light source, and the infrared light has the ability to penetrate the chip, so there is no need to flip the chip or insert the observation device, and only need to observe directly, which greatly reduces the system error, and because there is no need to reverse or significantly Moving the chip, therefore, the displacement error is infinitely close to 0, and the error is around 15nm (depending on the displacement error of the automatic displacement platform used). The estimated bonding accuracy is around 200nm. Therefore, the error is greatly reduced and the bonding accuracy is improved.
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910963693.7A CN110752177A (en) | 2019-10-11 | 2019-10-11 | Reflective flip chip bonding machine and chip bonding method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910963693.7A CN110752177A (en) | 2019-10-11 | 2019-10-11 | Reflective flip chip bonding machine and chip bonding method |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110752177A true CN110752177A (en) | 2020-02-04 |
Family
ID=69278024
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910963693.7A Pending CN110752177A (en) | 2019-10-11 | 2019-10-11 | Reflective flip chip bonding machine and chip bonding method |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110752177A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111584415A (en) * | 2020-06-22 | 2020-08-25 | 中国科学院长春光学精密机械与物理研究所 | An alignment system for wafer bonding |
CN113327879A (en) * | 2021-05-14 | 2021-08-31 | 长江存储科技有限责任公司 | Chuck adjusting device and method and wafer bonding device and method |
CN114695229A (en) * | 2022-03-31 | 2022-07-01 | 深圳市联得自动化装备股份有限公司 | Bonding alignment device, flip chip bonding machine and bonding method |
WO2023133956A1 (en) * | 2022-01-11 | 2023-07-20 | 长鑫存储技术有限公司 | Wafer bonding device and wafer bonding method |
US12315839B2 (en) | 2022-01-11 | 2025-05-27 | Changxin Memory Technologies, Inc. | Wafer bonding device and wafer bonding method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1264493A (en) * | 1997-06-18 | 2000-08-23 | 微机器人系统公司 | Method and apparatus for chip placement |
CN1853320A (en) * | 2003-09-22 | 2006-10-25 | 株式会社村田制作所 | Method and device for installing light emitting element |
CN108172527A (en) * | 2017-12-28 | 2018-06-15 | 长春长光精密仪器集团有限公司 | A kind of Systems for optical inspection |
CN109932829A (en) * | 2019-04-10 | 2019-06-25 | 武汉锐科光纤激光技术股份有限公司 | A lens positioning device and method |
-
2019
- 2019-10-11 CN CN201910963693.7A patent/CN110752177A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1264493A (en) * | 1997-06-18 | 2000-08-23 | 微机器人系统公司 | Method and apparatus for chip placement |
CN1853320A (en) * | 2003-09-22 | 2006-10-25 | 株式会社村田制作所 | Method and device for installing light emitting element |
CN108172527A (en) * | 2017-12-28 | 2018-06-15 | 长春长光精密仪器集团有限公司 | A kind of Systems for optical inspection |
CN109932829A (en) * | 2019-04-10 | 2019-06-25 | 武汉锐科光纤激光技术股份有限公司 | A lens positioning device and method |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111584415A (en) * | 2020-06-22 | 2020-08-25 | 中国科学院长春光学精密机械与物理研究所 | An alignment system for wafer bonding |
CN113327879A (en) * | 2021-05-14 | 2021-08-31 | 长江存储科技有限责任公司 | Chuck adjusting device and method and wafer bonding device and method |
WO2023133956A1 (en) * | 2022-01-11 | 2023-07-20 | 长鑫存储技术有限公司 | Wafer bonding device and wafer bonding method |
US12315839B2 (en) | 2022-01-11 | 2025-05-27 | Changxin Memory Technologies, Inc. | Wafer bonding device and wafer bonding method |
CN114695229A (en) * | 2022-03-31 | 2022-07-01 | 深圳市联得自动化装备股份有限公司 | Bonding alignment device, flip chip bonding machine and bonding method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN110752177A (en) | Reflective flip chip bonding machine and chip bonding method | |
US11955454B2 (en) | Wafer bonding apparatus and method | |
TWI610762B (en) | Processing device | |
WO2023070283A1 (en) | Wafer bonding device and method | |
TW201812975A (en) | Method and device for aligning substrates | |
KR102255607B1 (en) | Bonding device and method for detecting the height of the object to be bonded | |
TWI700515B (en) | Apparatus for mounting components on a substrate | |
US20170154864A1 (en) | Bonding apparatus and method of estimating position of landing point of bonding tool | |
KR102132594B1 (en) | Bonding device | |
CN107664833B (en) | Machine vision system for aligning substrate and aligning device | |
CN109906029A (en) | Electronic component mounting apparatus and electronic component mounting method | |
CN110739257B (en) | Operation method of micro laser system for aligning chip and substrate and fine leveling | |
JP5288411B2 (en) | Alignment device | |
CN112558244B (en) | Method and device for flip coupling of optical chip | |
US3388848A (en) | Alignment and bonding device and method | |
CN110854054B (en) | Collimation light path structure for adjusting parallelism of chip sucker and substrate sucker | |
CN110752164B (en) | Microscopic laser system for chip and substrate alignment and fine leveling | |
TWI741448B (en) | Laser device with synchronous optical path delay | |
JP2013235907A (en) | Bonding apparatus | |
KR101170963B1 (en) | Table for transmission illumination | |
CN111238399A (en) | Multi-view three-dimensional measuring device | |
CN109516682A (en) | Scribing equipment | |
US20220208720A1 (en) | Substrate bonding apparatus and substrate bonding method | |
US10813227B2 (en) | Component mounter and mounting board manufacturing method | |
TWI656322B (en) | Fluorescence microscope and substrate inspection device with fluorescent microscope |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200204 |
|
RJ01 | Rejection of invention patent application after publication |