CN110528003B - 一种涂层的复合制备方法 - Google Patents
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Abstract
本发明属真空镀膜技术领域,提供一种涂层的复合制备方法。所述复合制备方法涉及化学气相沉积(CVD)、等离子体浸没离子注入沉积(PIII&D)和原子层沉积(ALD)三部分。具体步骤包括:基底表面预处理后装炉,在真空和一定温度条件下,通入气体,在所述基底表面进行PIII&D涂层过程;调整真空和加热温度,依次通入前驱体、冲洗气体、第二前驱体、冲洗气体进行ALD涂层过程;调整加热温度打开偏压,通入两种前驱体的混合气体进行CVD涂层过程;重复所述CVD、PIII&D和ALD过程,依次制备三种技术交替沉积的多层结构。该复合制备方法可克服CVD涂层不够致密易发生扩散失效和ALD涂层沉积效率低的缺陷,获得不同领域内能长时间服役且具有高性能的复合涂层。
Description
技术领域
本发明属于真空镀膜技术领域,具体涉及一种涂层的复合制备方法。
背景技术
涂层是一种涂敷在物体表面对其起到一定防护作用的薄膜,真空涂层以其超薄、厚度均匀和较高的防护性能等被广泛应用在各个领域。真空涂层的制作方法一般包括化学气相沉积(CVD)、原子层沉积(ALD)和物理气相沉积(PVD)。CVD是涂层制备最常用的方法之一,其沉积速率较快,厚度均匀可控;ALD是一种基于有序、表面自饱和反应的沉积涂层的方法,它可以实现将物质以单原子膜形式一层一层地镀在基底表面。所沉积的涂层致密、连续、均匀且无孔洞,厚度可精确控制,是一种制备高性能涂层的有效方法;PVD用于涂层的制备,所沉积的涂层均匀致密。但是这些方法也存在着比较大的缺陷,CVD技术制备的涂层以柱状晶方式生长,不够致密,在某些比较恶劣环境下出现孔洞,容易发生渗透导致失效;ALD和PVD技术所制备的涂层虽然比较均匀致密,但是其沉积效率低下。
随着我国各类事业的不断进步和人类不断探索与发展,各种部件的功能不断更新,动力需求日益增大,因此对部件的防护涂层提出了更高的要求,使用传统单一的CVD、ALD和PVD涂层制备方法已不能满足新的要求。
发明内容
等离子体浸没离子注入沉积(PIII&D)技术作为PVD技术的一种,可以在被作用表面注入同种或异种元素,不仅能够改变表面能,提高涂层之间的结合力,还可以打断CVD涂层的柱状晶生长模式,起到防止涂层之间相互渗透作用。
本发明针对以上CVD法制备涂层所存在的涂层以柱状晶方式生长不够致密、某些恶劣条件下易形成孔洞而失效以及ALD方法制备涂层沉积效率太低的缺陷,提出了一种涂层的复合制备方法,该复合制备方法结合了CVD、ALD技术各自的优点,同时加入了PIII&D技术,通过三种方法交替沉积来克服单一方法制备涂层所存在的缺陷,制备服役于不同领域具有优良性能且高效的涂层,增加其使用寿命。
本发明提供的一种涂层的复合制备方法,包括如下组成部分:
PIII&D涂层、ALD涂层、n×多层复合涂层(CVD涂层+PIII&D涂层+ALD涂层)。
所述的PIII&D层位于基体-涂层和涂层-涂层之间。
所述的ALD涂层第一层应用于与基体材料结合,以后的每一层都是与其他涂层进行连接。
所述的CVD涂层上面沉积所述的ALD涂层时必须在中间加入PIII&D涂层。
本发明的一种涂层的复合制备方法,相对现有技术具有如下优点和积极效果:
(1)本发明的复合制备方法结合了CVD、ALD和PIII&D技术各自的优点,通过交替沉积工艺可克服单一方法制备涂层的不足之处,可获得沉积效率高、膜基结合力强、相对致密的涂层,从而可提高其性能和使用寿命。
(2)本发明利用CVD、PIII&D和ALD复合制备技术制备涂层的温度和真空度范围重叠,可统一设定一个参数进行不同方法交替沉积,制备操作过程简便,效率高。
附图说明
图1为本发明实施例中一种涂层的复合制备方法结构图。
图中:
1.基体材料;2.CVD涂层;3.PIII&D涂层;4.ALD涂层;5.多层复合涂层
具体实施方式
下面将结合附图和实施例对本发明作进一步的详细说明。
本发明的目的在于获得一种特殊环境条件下性能更高、服役时间更久的涂层。
本发明提供的一种涂层的复合制备方法,如图1所示,包括:基体材料1;CVD涂层2;PIII&D涂层3;ALD涂层4;多层涂层5(CVD涂层+PIII&D涂层+ALD涂层)
基体材料1通过PIII&D技术的作用在其表面或内部形成PIII&D涂层3;然后使用ALD技术在其上面制备一层ALD涂层4;接下来依次使用CVD、PIII&D和ALD技术制备相应涂层形成多层复合涂层5,重复该多层复合涂层5的制备过程直到达到目标厚度为止。
采用本发明的涂层的复合制备方法的工作过程如下:
对基底进行表面预处理后装炉,在真空和一定温度条件下,向真空室通入反应气体,经等离子体发生器生成等离子体后在高偏压作用下进行(PIII&D)涂层过程,在基底表面进行离子注入与沉积;PIII&D沉积完成后关闭反应气体和偏压,调整真空室的真空度和加热温度,经脉冲控制方式依次通入第一前驱体AB、冲洗气体、第二前驱体C、冲洗气体进行(ALD)涂层过程,在所述PIII&D涂层基础上进行原子层沉积。然后调整加热温度打开偏压,通入AB和C的混合气体进行(CVD)涂层过程。最后重复所述CVD、PIII&D和ALD涂层过程,制备CVD、PIII&D和ALD技术交替沉积的多层结构,直到达到目标厚度。
Claims (10)
1.一种涂层的复合制备方法,其特征在于:
结合了CVD、PIII&D和ALD三种涂层制备技术,具体过程为:在真空和一定温度条件下,向真空室通入反应气体,经等离子体发生器生成等离子体后在高偏压作用下进行PIII&D涂层过程,在基底表面进行离子注入与沉积;PIII&D沉积完成后关闭反应气体和偏压,调整真空室的真空度和加热温度,经脉冲控制方式依次通入第一前驱体AB、冲洗气体、第二前驱体C、冲洗气体进行ALD涂层过程,从而在所述PIII&D涂层基础上制备所述ALD涂层;然后调整加热温度打开偏压,通入AB和C的混合气体进行CVD涂层过程;在所述CVD涂层上进行PIII&D涂层过程;再在PIII&D涂层上形成ALD涂层;最后重复CVD、PIII&D和ALD涂层过程,制备CVD、PIII&D和ALD技术交替沉积的多层结构,直到达到目标厚度。
2.根据权利要求1所述的一种涂层的复合制备方法,其特征在于:所述PIII&D涂层沉积过程气压为10-4~100Pa。
3.根据权利要求2所述的一种涂层的复合制备方法,其特征在于:所述PIII&D涂层沉积过程加热温度为23℃~1000℃,上述23℃为常温。
4.根据权利要求3所述的一种涂层的复合制备方法,其特征在于:所述PIII&D涂层沉积过程反应气体为含目标涂层的化合物,其中目标元素为A,化合物为AB,B包括单元素和多种元素。
5.根据权利要求4所述的一种涂层的复合制备方法,其特征在于:所述PIII&D涂层沉积过程偏压大小为-10kV ~-10V。
6.根据权利要求5所述的一种涂层的复合制备方法,其特征在于:所述ALD涂层过程气压为10-3~1kPa。
7.根据权利要求6所述的一种涂层的复合制备方法,其特征在于:所述ALD涂层过程加热温度为23℃~1000℃,上述23℃为常温。
8.根据权利要求7所述的一种涂层的复合制备方法,其特征在于:所述ALD涂层过程冲洗气体为惰性气体。
9.根据权利要求8所述的一种涂层的复合制备方法,其特征在于:所述CVD涂层过程加热温度为23℃~1500℃,上述23℃为常温。
10.根据权利要求9所述的一种涂层的复合制备方法,其特征在于:所述CVD涂层过程偏压为-1000~-10V。
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CN113072063B (zh) * | 2020-07-10 | 2024-01-23 | 华南理工大学 | 基于氢储运设备内表面的阻氢涂层及制备方法 |
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