[go: up one dir, main page]

CN110429139A - Binary channels LTPS thin film transistor (TFT) - Google Patents

Binary channels LTPS thin film transistor (TFT) Download PDF

Info

Publication number
CN110429139A
CN110429139A CN201910532402.9A CN201910532402A CN110429139A CN 110429139 A CN110429139 A CN 110429139A CN 201910532402 A CN201910532402 A CN 201910532402A CN 110429139 A CN110429139 A CN 110429139A
Authority
CN
China
Prior art keywords
electrode
semiconductor channel
channel layer
layer
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910532402.9A
Other languages
Chinese (zh)
Inventor
曹尚操
刘汉龙
李长晔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujian Huajiacai Co Ltd
Original Assignee
Fujian Huajiacai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujian Huajiacai Co Ltd filed Critical Fujian Huajiacai Co Ltd
Priority to CN201910532402.9A priority Critical patent/CN110429139A/en
Publication of CN110429139A publication Critical patent/CN110429139A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6757Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/674Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743Silicon
    • H10D30/6745Polycrystalline or microcrystalline silicon

Landscapes

  • Thin Film Transistor (AREA)

Abstract

一种双通道LTPS薄膜晶体管,包括第一SD电极、第二SD电极、第一半导体通道层、第二半导体通道层;所述第一SD电极通过第一半导体通道层与第二SD电极导通,所述第一SD电极还通过第二半导体通道层与第二SD电极导通,第一SD电极与第二SD电极不接触,第一半导体通道层与第二半导体通道层不接触,在薄膜晶体管的至少一个截平面中,第一SD电极、第二SD电极、第一半导体通道层、第二半导体通道层将层间介质层包围在其中。上述技术方案通过设计双通路的半导体通道层,不仅保证了薄膜晶体管的使用安全性,更有效地提高了氧化物薄膜晶体管的电子迁移效率,提高了半导体薄膜晶体管的开态电流。

A dual-channel LTPS thin film transistor, comprising a first SD electrode, a second SD electrode, a first semiconductor channel layer, and a second semiconductor channel layer; the first SD electrode conducts with the second SD electrode through the first semiconductor channel layer , the first SD electrode is also connected to the second SD electrode through the second semiconductor channel layer, the first SD electrode is not in contact with the second SD electrode, the first semiconductor channel layer is not in contact with the second semiconductor channel layer, and the thin film In at least one sectional plane of the transistor, the first SD electrode, the second SD electrode, the first semiconductor channel layer, and the second semiconductor channel layer surround the interlayer dielectric layer. The above technical solution not only ensures the safety of the thin film transistor by designing a double-channel semiconductor channel layer, but also more effectively improves the electron migration efficiency of the oxide thin film transistor and increases the on-state current of the semiconductor thin film transistor.

Description

双通道LTPS薄膜晶体管Dual Channel LTPS Thin Film Transistor

技术领域technical field

本发明涉及液晶面板设计领域,尤其涉及一种双电流通路的LTPS薄膜晶体管架构。The invention relates to the field of liquid crystal panel design, in particular to an LTPS thin film transistor architecture with dual current paths.

背景技术Background technique

TFT(Thin Film Transistor)是薄膜晶体管的缩写。TFT式显示屏是各类笔记本电脑和台式机上的主流显示设备,该类显示屏上的每个液晶像素点都是由集成在像素点后面的薄膜晶体管来驱动,因此TFT式显示屏也是一类有源矩阵液晶显示设备。是最好的LCD彩色显示器之一,TFT式显示器具有高响应度、高亮度、高对比度等优点,其显示效果接近CRT式显示器。TFT (Thin Film Transistor) is the abbreviation of thin film transistor. TFT display is the mainstream display device on various notebook computers and desktops. Each liquid crystal pixel on this type of display is driven by a thin film transistor integrated behind the pixel, so TFT display is also a type of Active-matrix liquid crystal display devices. It is one of the best LCD color displays. TFT display has the advantages of high responsiveness, high brightness, high contrast, etc., and its display effect is close to that of CRT display.

同时,TFT式屏幕也普遍应用于中高端彩屏手机中,分65536色、16万色,1600万色三种,其显示效果非常出色。At the same time, TFT screens are also widely used in mid-to-high-end color screen mobile phones. There are three types: 65536 colors, 160,000 colors, and 16 million colors. The display effect is very good.

TFT是指液晶显示器上的每一液晶像素点都是由集成在其后的薄膜晶体管来驱动。从而可以做到高速度高亮度高对比度显示屏幕信息,TFT-LCD(薄膜晶体管液晶显示器)是多数液晶显示器的一种。LCD和OLED Demux设计目前收到越来越多的显示厂商的关注,因为其有以下优点:1.IC输出pin数目减少,IC成本下降;2.IC输出pin数目减少,有利于降低fanout拉线高度,从而有利于下边框窄边框panel设计。TFT means that each liquid crystal pixel on the liquid crystal display is driven by a thin film transistor integrated behind it. In this way, high-speed, high-brightness and high-contrast display screen information can be achieved. TFT-LCD (thin film transistor liquid crystal display) is a kind of most liquid crystal displays. LCD and OLED Demux designs are currently receiving more and more attention from display manufacturers, because they have the following advantages: 1. The number of IC output pins is reduced, and the cost of IC is reduced; 2. The number of IC output pins is reduced, which is conducive to reducing the height of fanout cables , which is beneficial to the panel design with a narrow border on the lower border.

低温多晶硅技术LTPS(Low Temperature Poly-silicon)最初是日本北美的技术企业为了降低Note-PC显示屏的能耗,令Note-PC显得更薄更轻而研发的技术,采用demux设计的panel往往集中在LTPS制程的基础上,原因是LTPS的载流子的迁移率较高,满足demux设计对TFT的要求。但是随着手机屏占比要求越来越高,需要panel的下border越来越小,这要求demux高度进一步降低,demux高度的降低要求demux TFT器件有更高的开态电流;这样才能进一步降低TFT的size,从而缩小demux的宽度。Low temperature polysilicon technology LTPS (Low Temperature Poly-silicon) was originally developed by Japanese and North American technology companies in order to reduce the energy consumption of the Note-PC display and make the Note-PC appear thinner and lighter. Panels designed with demux are often concentrated On the basis of the LTPS process, the reason is that the carrier mobility of LTPS is relatively high, which meets the requirements of demux design for TFT. However, as the screen-to-body ratio requirements of mobile phones are getting higher and higher, the lower border of the panel is required to be smaller and smaller, which requires a further reduction in the height of the demux, and the reduction in the height of the demux requires a higher on-state current of the demux TFT device; in this way, it can be further reduced The size of the TFT, thereby reducing the width of the demux.

本发明提出了一种适用于demux TFT器件及结构,采用该种结构的器件可将开态电流提高一倍;进而可缩小demux TFT的size。The invention proposes a device and structure suitable for demux TFT. The device adopting the structure can double the on-state current; furthermore, the size of the demux TFT can be reduced.

发明内容Contents of the invention

为此,需要提供一种能够提高电子迁移率的LTPS相关晶体管,For this reason, there is a need to provide an LTPS-related transistor capable of improving electron mobility,

为实现上述目的,发明人提供了一种双通道LTPS薄膜晶体管,包括第一SD电极、第二SD电极、第一半导体通道层、第二半导体通道层;In order to achieve the above object, the inventor provides a dual-channel LTPS thin film transistor, including a first SD electrode, a second SD electrode, a first semiconductor channel layer, and a second semiconductor channel layer;

所述第一SD电极通过第一半导体通道层与第二SD电极导通,所述第一SD电极还通过第二半导体通道层与第二SD电极导通,第一SD电极与第二SD电极不接触,第一半导体通道层与第二半导体通道层不接触,The first SD electrode conducts with the second SD electrode through the first semiconductor channel layer, and the first SD electrode also conducts with the second SD electrode through the second semiconductor channel layer, and the first SD electrode and the second SD electrode No contact, the first semiconductor channel layer is not in contact with the second semiconductor channel layer,

在薄膜晶体管的至少一个截平面中,第一SD电极、第二SD电极、第一半导体通道层、第二半导体通道层将层间介质层包围在其中。In at least one sectional plane of the thin film transistor, the first SD electrode, the second SD electrode, the first semiconductor channel layer, and the second semiconductor channel layer surround the interlayer dielectric layer therein.

进一步地,所述截平面包括基层、第一栅极层、第一绝缘层、第一半导体通道层、第一SD电极、第二SD电极、第二半导体通道层、层间介质层、第二绝缘层、第二栅极层。Further, the sectional plane includes a base layer, a first gate layer, a first insulating layer, a first semiconductor channel layer, a first SD electrode, a second SD electrode, a second semiconductor channel layer, an interlayer dielectric layer, a second insulating layer, second gate layer.

具体地,所述半导体通道层为磷-硅半导体通道层。Specifically, the semiconductor channel layer is a phosphorus-silicon semiconductor channel layer.

区别于现有技术,上述技术方案通过设计双通路的半导体通道层,不仅保证了薄膜晶体管的使用安全性,更有效地提高了氧化物薄膜晶体管的电子迁移效率,提高了半导体薄膜晶体管的开态电流。Different from the existing technology, the above technical solution not only ensures the safety of the thin film transistor by designing a double-channel semiconductor channel layer, but also more effectively improves the electron migration efficiency of the oxide thin film transistor, and improves the on-state of the semiconductor thin film transistor. current.

附图说明Description of drawings

图1为具体实施方式所述的面板下边框各模块示意图;Fig. 1 is a schematic diagram of each module of the lower frame of the panel described in the specific embodiment;

图2为具体实施方式所述的传统的bottom gate LTPS TFT横截面结构示意图;Fig. 2 is the traditional bottom gate LTPS TFT cross-sectional structure schematic diagram described in the specific embodiment;

图3为具体实施方式所述的双通道LTPS结构及制程简图;Fig. 3 is a schematic diagram of the dual-channel LTPS structure and manufacturing process described in the specific embodiment;

图4为具体实施方式所述的双通道LTPS结构开态示意图;Fig. 4 is a schematic diagram of the open state of the dual-channel LTPS structure described in the specific embodiment;

图5为具体实施方式所述的双通道LTPS器件应用例。FIG. 5 is an application example of the dual-channel LTPS device described in the specific embodiment.

具体实施方式Detailed ways

为详细说明技术方案的技术内容、构造特征、所实现目的及效果,以下结合具体实施例并配合附图详予说明。In order to explain in detail the technical content, structural features, achieved goals and effects of the technical solution, the following will be described in detail in conjunction with specific embodiments and accompanying drawings.

这里请先看图1,为现有技术中的面板下边框各模块的示意图,下边框中主要包括以下模块:FPC、IC、fanout和demux模块,其中FPC、IC和fanout规格取决于panel的分辨率、制程和选型。Demux高度主要取决于demux TFT的开态电流。图2是传统的bottom gate LTPS结构的TFT示意图以及process。这种传统方案的缺陷就在于电子迁移率不高,基于上述原理可以想见Demux的高度无法有效缩小。Please look at Figure 1 here, which is a schematic diagram of the modules in the lower border of the panel in the prior art. The lower border mainly includes the following modules: FPC, IC, fanout and demux modules, where the specifications of FPC, IC and fanout depend on the resolution of the panel rate, process and selection. Demux height mainly depends on the on-state current of demux TFT. Figure 2 is a TFT schematic diagram and process of the traditional bottom gate LTPS structure. The disadvantage of this traditional solution is that the electron mobility is not high. Based on the above principle, it can be imagined that the height of the Demux cannot be effectively reduced.

本方案提供了一种双通道LTPS薄膜晶体管,如图3所示,图3我们可以包括左侧的第一SD电极、右侧设置的第二SD电极、中部偏下的第一半导体通道层、中部片上的第二半导体通道层;This solution provides a dual-channel LTPS thin film transistor, as shown in Figure 3, in Figure 3 we can include the first SD electrode on the left, the second SD electrode on the right, the first semiconductor channel layer in the lower middle, a second semiconducting channel layer on the middle slice;

所述第一SD电极通过第一半导体通道层与第二SD电极导通或连通,意即第一SD电极-第一半导体通道层-第二SD电极间存在供电子迁移的通路。所述第一SD电极还通过第二半导体通道层与第二SD电极导通或连通,意即第一SD电极-第二半导体通道层-第二SD电极间存在供电子迁移的通路。第一SD电极与第二SD电极不接触,第一半导体通道层与第二半导体通道层不接触,同时在薄膜晶体管的至少一个截平面中,第一SD电极、第二SD电极、第一半导体通道层、第二半导体通道层将层间介质层ILD(Interlayer Dielectric)的部分包围在其中ILD能够防止第一、第二半导体通道之间出现短路的情况。通过上述方案,本发明完成了双通道的LTPS薄膜晶体管的设计,提高了电子迁移率,在面板设计中采用该型晶体管就能够减小边框的厚度。The first SD electrode is conducted or communicated with the second SD electrode through the first semiconductor channel layer, which means that there is a path for electron migration between the first SD electrode-the first semiconductor channel layer-the second SD electrode. The first SD electrode is also conducted or communicated with the second SD electrode through the second semiconductor channel layer, which means that there is a path for electron migration between the first SD electrode-the second semiconductor channel layer-the second SD electrode. The first SD electrode is not in contact with the second SD electrode, and the first semiconductor channel layer is not in contact with the second semiconductor channel layer. At the same time, in at least one section plane of the thin film transistor, the first SD electrode, the second SD electrode, the first semiconductor channel layer The channel layer and the second semiconductor channel layer enclose a portion of an interlayer dielectric layer ILD (Interlayer Dielectric), and the ILD can prevent a short circuit between the first and second semiconductor channels. Through the above solution, the present invention completes the design of a dual-channel LTPS thin film transistor, improves electron mobility, and uses this type of transistor in panel design to reduce the thickness of the frame.

在其他一些如图3所示实施例中,所述截平面包括基层(图中glass层,也可采用其他材料如陶瓷等),位于基层之上的GI层(第一绝缘层)和第一栅极层gate、在其上设置的第一半导体通道层(图中P-Si层,也可以根据情况设计成PN型半导体等),第一SD电极、第二SD电极,第一电极和第二电极与第二半导体通道层的接触部分向下延伸,第一电极和第二电极的向下延伸部通过P空隙层与第一半导体通道层连接。第一半导体通道层和第二半导体介质层之间为层间介质层ILD,ILD还设置于SD电极与第一绝缘层之间。截面图中为第二绝缘层GI、第二绝缘层的上表面还设计有第二栅极层gate。In some other embodiments as shown in Figure 3, the section plane includes a base layer (glass layer in the figure, other materials such as ceramics can also be used), a GI layer (first insulating layer) and a first insulating layer located on the base layer. The gate layer gate, the first semiconductor channel layer arranged thereon (the P-Si layer in the figure can also be designed as a PN type semiconductor, etc. according to the situation), the first SD electrode, the second SD electrode, the first electrode and the second The contact portion of the second electrode and the second semiconductor channel layer extends downwards, and the downward extensions of the first electrode and the second electrode are connected with the first semiconductor channel layer through the P-gap layer. Between the first semiconductor channel layer and the second semiconductor medium layer is an interlayer dielectric layer ILD, and the ILD is also arranged between the SD electrode and the first insulating layer. The cross-sectional view is the second insulating layer GI, and the upper surface of the second insulating layer is also designed with a second gate layer gate.

在图3所示的实施例中还简要说明了该些层次之间的mask制程。依序分为如下步骤,准备buffer基层,第一遮罩(mask)为第一栅极层,第二遮罩为硅磷半导体P-Si,第三遮罩为P空穴层P+,第四遮罩为硅磷半导体P-Si作为第二半导体通道层,第五遮罩为氮空穴层N+,六层遮罩为电极层,第七层遮罩为gate第二栅极层。当第二栅极上gate高电位时,上channel被导通,同时第一栅极下gate此时要求为低电位,下channel被导通,上下双channel同时导通;导通电流加倍。上述方案定义了采用这种dual channel器件的基本process,共需10步制程和7道光罩。In the embodiment shown in FIG. 3 , the mask process between these levels is also briefly described. It is divided into the following steps in order to prepare the buffer base layer. The first mask is the first gate layer, the second mask is the silicon-phosphorus semiconductor P-Si, the third mask is the P-hole layer P+, and the fourth mask is the P-hole layer P+. The mask is the silicon-phosphorus semiconductor P-Si as the second semiconductor channel layer, the fifth mask is the nitrogen hole layer N+, the sixth mask is the electrode layer, and the seventh mask is the second gate layer of the gate. When the gate on the second gate has a high potential, the upper channel is turned on, and at the same time, the lower gate of the first gate is required to be at a low potential at this time, the lower channel is turned on, and the upper and lower channels are turned on at the same time; the conduction current doubles. The above scheme defines the basic process of using this dual channel device, which requires a total of 10 steps and 7 masks.

图4为本发明的dual channel LTPS开态示意和原理图,由于是dual channel,故相对与图1的器件结构,采用这种dual channel结构的器件TFT开态电流会增加一倍。Fig. 4 is a schematic and schematic diagram of the dual channel LTPS open state of the present invention. Since it is a dual channel, compared with the device structure in Fig. 1, the TFT open state current of the device adopting this dual channel structure will be doubled.

图5给出了一个本发明的实际应用例,如可以将本发明器件结构应用于1To3demux设计的电路原理图。我们可以设计其中的demux_CK和demux_XCK相位相反,就能够达到合理使用本发明方案的高开态电流的晶体管的目的,应用此方案的Demux能够有更薄的设计,最终减少了面板的边框厚度。FIG. 5 shows a practical application example of the present invention, such as a schematic diagram of a circuit in which the device structure of the present invention can be applied to 1To3demux design. We can design the phases of demux_CK and demux_XCK to be opposite, so as to achieve the purpose of reasonably using the transistor with high on-state current of the solution of the present invention, and the Demux using this solution can have a thinner design, and finally reduce the frame thickness of the panel.

需要说明的是,尽管在本文中已经对上述各实施例进行了描述,但并非因此限制本发明的专利保护范围。因此,基于本发明的创新理念,对本文所述实施例进行的变更和修改,或利用本发明说明书及附图内容所作的等效结构或等效流程变换,直接或间接地将以上技术方案运用在其他相关的技术领域,均包括在本发明的专利保护范围之内。It should be noted that although the foregoing embodiments have been described herein, the scope of protection of the present invention is not limited thereby. Therefore, based on the innovative concept of the present invention, the changes and modifications made to the embodiments described herein, or the equivalent structure or equivalent process conversion made by using the description of the present invention and the contents of the accompanying drawings, directly or indirectly apply the above technical solutions In other related technical fields, all are included in the patent protection scope of the present invention.

Claims (3)

1. a kind of binary channels LTPS thin film transistor (TFT), which is characterized in that led including the first SD electrode, the 2nd SD electrode, the first half Body channel layer, the second semiconductor channel layer;
For the first SD electrode by the first semiconductor channel layer and the 2nd SD electrode conduction, the first SD electrode also passes through the Two semiconductor channel layers and the 2nd SD electrode conduction, the first SD electrode are not contacted with the 2nd SD electrode, the first semiconductor channel layer It is not contacted with the second semiconductor channel layer,
In at least one cutting plane of thin film transistor (TFT), the first SD electrode, the 2nd SD electrode, the first semiconductor channel layer, Two semiconductor channel layers surround interlayer dielectric layer wherein.
2. binary channels LTPS thin film transistor (TFT) according to claim 1, which is characterized in that the cutting plane include base, First grid layer, the first insulating layer, the first semiconductor channel layer, the first SD electrode, the 2nd SD electrode, the second channel semiconductor Layer, interlayer dielectric layer, second insulating layer, second grid layer.
3. binary channels LTPS thin film transistor (TFT) according to claim 1, which is characterized in that the semiconductor channel layer is Phosphorus-silicon semiconductor channel layer.
CN201910532402.9A 2019-06-19 2019-06-19 Binary channels LTPS thin film transistor (TFT) Pending CN110429139A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910532402.9A CN110429139A (en) 2019-06-19 2019-06-19 Binary channels LTPS thin film transistor (TFT)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910532402.9A CN110429139A (en) 2019-06-19 2019-06-19 Binary channels LTPS thin film transistor (TFT)

Publications (1)

Publication Number Publication Date
CN110429139A true CN110429139A (en) 2019-11-08

Family

ID=68408726

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910532402.9A Pending CN110429139A (en) 2019-06-19 2019-06-19 Binary channels LTPS thin film transistor (TFT)

Country Status (1)

Country Link
CN (1) CN110429139A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140291669A1 (en) * 2013-03-29 2014-10-02 Lg Display Co., Ltd. Thin-Film Transistor, Method for Manufacturing the Same and Display Device Comprising the Same
US20160149052A1 (en) * 2014-11-25 2016-05-26 Samsung Display Co., Ltd Thin film transistor, organic light-emitting diode display including the same, and manufacturing method thereof
CN105810744A (en) * 2014-12-30 2016-07-27 昆山国显光电有限公司 Film transistor and manufacture method for the same
KR20160120838A (en) * 2015-04-08 2016-10-19 삼성디스플레이 주식회사 Thin film transistor display panel and manufacturing method thereof
CN106252362A (en) * 2016-08-31 2016-12-21 深圳市华星光电技术有限公司 A kind of array base palte and preparation method thereof
CN108269855A (en) * 2016-12-30 2018-07-10 乐金显示有限公司 It drives thin film transistor (TFT) and uses its organic light-emitting display device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140291669A1 (en) * 2013-03-29 2014-10-02 Lg Display Co., Ltd. Thin-Film Transistor, Method for Manufacturing the Same and Display Device Comprising the Same
US20160149052A1 (en) * 2014-11-25 2016-05-26 Samsung Display Co., Ltd Thin film transistor, organic light-emitting diode display including the same, and manufacturing method thereof
CN105810744A (en) * 2014-12-30 2016-07-27 昆山国显光电有限公司 Film transistor and manufacture method for the same
KR20160120838A (en) * 2015-04-08 2016-10-19 삼성디스플레이 주식회사 Thin film transistor display panel and manufacturing method thereof
CN106252362A (en) * 2016-08-31 2016-12-21 深圳市华星光电技术有限公司 A kind of array base palte and preparation method thereof
CN108269855A (en) * 2016-12-30 2018-07-10 乐金显示有限公司 It drives thin film transistor (TFT) and uses its organic light-emitting display device

Similar Documents

Publication Publication Date Title
JP7430213B2 (en) display device
JP2022166856A (en) Display device
CN102820319B (en) Oxide thin film transistor and manufacture method thereof
CN103869568B (en) Array base palte for narrow frame type liquid crystal indicator and its manufacture method
JP5770796B2 (en) Liquid crystal display device
CN106876412A (en) A kind of array base palte and preparation method
CN104749806B (en) A kind of array base palte, display panel and display device
US20170023836A1 (en) Boa liquid crystal display panel and manufacturing method thereof
CN101320181A (en) Display device and manufacturing method thereof
WO2022166745A1 (en) Array substrate and display panel
CN103594476A (en) Thin film transistor substrate, method for manufacturing the same and organic light emitting device using the same
CN105448933A (en) Array substrate used in liquid crystal panel and manufacture method
CN111146212B (en) Semiconductor substrate
US10032808B2 (en) TFT substrate manufacturing method
CN113809099A (en) Array substrate and display panel
JP2010204600A (en) Electrooptical device and manufacturing method therefor
CN106252364A (en) The manufacture method of a kind of GOA array base palte and GOA array base palte
CN110176464A (en) Array substrate and preparation method thereof and display device
CN105140298B (en) Thin film transistor (TFT) and array substrate
US8704220B2 (en) Active device
CN100426528C (en) Thin film transistor, fabrication method thereof, liquid crystal display panel device having the same, and fabrication method thereof
CN110429139A (en) Binary channels LTPS thin film transistor (TFT)
KR102052741B1 (en) Liquid crystal display device
CN206774547U (en) Thin-film transistor structure, circuit structure, display base plate and display device
CN113299666B (en) Display panel, driving method thereof and display device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20191108

RJ01 Rejection of invention patent application after publication