CN110345870B - A five-degree-of-freedom error measuring device for a precision linear displacement stage - Google Patents
A five-degree-of-freedom error measuring device for a precision linear displacement stage Download PDFInfo
- Publication number
- CN110345870B CN110345870B CN201910734340.XA CN201910734340A CN110345870B CN 110345870 B CN110345870 B CN 110345870B CN 201910734340 A CN201910734340 A CN 201910734340A CN 110345870 B CN110345870 B CN 110345870B
- Authority
- CN
- China
- Prior art keywords
- degree
- linear displacement
- error measuring
- freedom error
- measuring unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M13/00—Testing of machine parts
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
本发明公开一种精密直线位移台的五自由度误差测量装置,包括精密直线位移台、五自由度误差测量单元(1)和垂直反射镜(2),所述垂直反射镜(2)放置于五自由度误差测量单元(1)相互垂直的凹陷处;所述五自由度误差测量单元(1)包括三自由度误差测量单元一(101)和三自由度误差测量单元二(102),所述三自由度误差测量单元一(101)和三自由度误差测量单元二(102)通过连接件(103)固定连接;所述垂直反射镜(2)包括方箱(201),所述方箱(201)的侧面上粘接有相互垂直的平面反射镜一(202)和平面反射镜二(203);所述五自由度误差测量单元(1)与精密直线位移台的滑台固定连接,所述精密直线位移台的基座与垂直反射镜(2)固定连接。
The invention discloses a five-degree-of-freedom error measuring device for a precision linear displacement stage, comprising a precise linear displacement platform, a five-degree-of-freedom error measuring unit (1) and a vertical reflector (2), the vertical reflector (2) being placed on the The five-degree-of-freedom error measuring unit (1) is in a mutually perpendicular depression; the five-degree-of-freedom error measuring unit (1) includes a three-degree-of-freedom error measuring unit one (101) and a three-degree-of-freedom error measuring unit two (102), so The three-degree-of-freedom error measuring unit one (101) and the three-degree-of-freedom error measuring unit two (102) are fixedly connected through a connector (103); the vertical reflector (2) includes a square box (201), and the square box The side of (201) is bonded with a plane mirror one (202) and a plane mirror two (203) that are perpendicular to each other; the five-degree-of-freedom error measuring unit (1) is fixedly connected to the sliding table of the precision linear displacement stage, The base of the precision linear displacement stage is fixedly connected with the vertical reflection mirror (2).
Description
技术领域technical field
本发明属于精密测量领域,尤其涉及一种精密直线位移台的五自由度误差测量装置。The invention belongs to the field of precision measurement, in particular to a five-degree-of-freedom error measurement device of a precision linear displacement table.
背景技术Background technique
高精度机床、三坐标测量机、影像仪等高端精密设备的运动机构大多数是由精密直线位移台构成。由于零件加工、装配等误差因素存在,将导致精密直线位移台在运动过程中存在着运动误差(偏摆、俯仰、滚转、水平方向直线度误差和竖直方向直线度误差),上述误差将直接影响精密直线位移台的运动精度,进一步影响高精度机床、三坐标测量机、影像仪等高端精密设备的精度。目前,针对精密直线位移台的运动误差测量多采用激光干涉仪和激光自准直仪等测量仪器进行测量,且每次仅能测量1~2个误差量,价格昂贵。Gao等人利用衍射光栅作为反光元件,提出了一种3自由度角度运动误差测量方法。Huang等人提出了一种直线位移台的4自由度运动误差测量方法。Liu等人利用几何光学和激光干涉仪组合方法搭建了一种长直线位移台的6自由度误差测量系统。上述几种方法存在着难以集成到精密直线位移台上问题。因此,亟需提出一种低成本且便于集成到精密直线位移台上的5自由度运动误差实时测量方法。Most of the motion mechanisms of high-precision machine tools, CMMs, video cameras and other high-end precision equipment are composed of precision linear displacement stages. Due to the existence of error factors such as parts processing and assembly, there will be motion errors (yaw, pitch, roll, horizontal straightness error and vertical straightness error) during the movement of the precision linear stage. The above errors will be It directly affects the motion accuracy of the precision linear displacement stage, and further affects the accuracy of high-end precision equipment such as high-precision machine tools, CMMs, and imagers. At present, the motion error measurement of the precision linear stage is mostly measured by measuring instruments such as laser interferometer and laser autocollimator, and only 1~2 errors can be measured each time, which is expensive. Gao et al. proposed a 3-DOF angular motion error measurement method using diffraction gratings as reflective elements. Huang et al. proposed a 4-DOF motion error measurement method for a linear stage. Liu et al. used a combination of geometric optics and laser interferometer to build a 6-DOF error measurement system for a long linear stage. The above methods have the problem that it is difficult to integrate into the precision linear displacement stage. Therefore, there is an urgent need to propose a low-cost and easy-to-integrate 5-DOF real-time error measurement method on a precision linear stage.
发明内容SUMMARY OF THE INVENTION
本发明的目的是为了解决这一问题,解决了现有技术无法集成到精密直线位移台上的技术问题,提供一种低成本且便于集成到精密直线位移台的五自由度误差测量装置。The purpose of the present invention is to solve this problem, solve the technical problem that the prior art cannot be integrated into a precision linear displacement stage, and provide a five-degree-of-freedom error measuring device that is low-cost and easy to integrate into a precise linear displacement stage.
为实现上述发明目的,本发明的技术方案是:In order to realize the above-mentioned purpose of the invention, the technical scheme of the present invention is:
一种精密直线位移台的五自由度误差测量装置,包括精密直线位移台、五自由度误差测量单元1和垂直反射镜2,其特征在于,所述垂直反射镜2放置于五自由度误差测量单元1相互垂直的凹陷处;所述五自由度误差测量单元1包括所述三自由度误差测量单元一101和所述三自由度误差测量单元二102,所述三自由度误差测量单元一101和所述三自由度误差测量单元二102以相互垂直方式通过连接件103固定连接;所述垂直反射镜2包括方箱201,所述方箱201靠近三自由度误差测量单元一101的侧面上粘接有平面反射镜一202,所述方箱201靠近三自由度误差测量单元二102的侧面上粘接有平面反射镜二203,所述平面反射镜一202与平面反射镜二203相互垂直;所述五自由度误差测量单元1与精密直线位移台的滑台进行固定连接,所述精密直线位移台的基座与垂直反射镜2进行固定连接,实现精密直线位移台的滚转、偏摆、俯仰、水平方向的直线度误差和竖直方向的直线度误差实时测量。A five-degree-of-freedom error measurement device for a precision linear displacement stage, comprising a precise linear displacement platform, a five-degree-of-freedom error measurement unit 1 and a
优选地,所述连接件103为两个连续垂直弯曲的直板。Preferably, the connecting
优选地,所述方箱201为带有倒角箱体,由殷钢材质制成。Preferably, the
优选地,所述三自由度误差测量单元包括安装在箱体内的激光模组4、偏振分光镜5、反射镜6、两个探测模组7和3,所述偏振分光镜5和探测模组3依次设置于箱体的光线入口处,所述偏振分光镜5两侧各固定设置有激光模组4、反射镜6,所述激光模组4、偏振分光镜5和探测模组3之间内设置有探测模组7;所述激光模组4、偏振分光镜5和探测模组7构成激光自准直光路,分别能够实现精密直线位移台绕X轴的角度误差测量和绕Z轴的角度误差量;所述激光模组4、反射镜6和探测模组3构成激光三角法光路,能够实现精密直线位移台在Y轴方向上的直线度误差测量;当3自由度误差测量单元安装在XOZ面内时,能够实现精密直线位移台绕Y轴的角度误差测量和在Z轴方向的直线度误差测量。Preferably, the three-degree-of-freedom error measurement unit includes a
与现有技术相比较,本发明的有益效果是:Compared with the prior art, the beneficial effects of the present invention are:
本发明精密直线位移台的五自由度误差测量装置所采用的材料和制造装置成本远低于传统测量仪器设备。本发明相比于传统测量仪器设备而言,便于集成到精密机床、坐标测量机等高端设备上,能够实现精密直线位移台的五自由度误差实时测量并进行实时补偿。The materials and manufacturing device costs used by the five-degree-of-freedom error measuring device of the precision linear displacement stage of the present invention are far lower than those of traditional measuring instruments. Compared with traditional measuring instruments, the present invention is easy to integrate into high-end equipment such as precision machine tools and coordinate measuring machines, and can realize real-time measurement and real-time compensation of the five-degree-of-freedom error of the precision linear displacement table.
附图说明Description of drawings
此处的附图被并入说明书中并构成本说明书的一部分,示出了符合本发明的实施例,并与说明书一起用于解释本发明的原理。The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description serve to explain the principles of the invention.
图1 为本发明精密直线位移台的五自由度误差测量装置的结构示意图。FIG. 1 is a schematic structural diagram of a five-degree-of-freedom error measuring device for a precision linear displacement stage of the present invention.
图2 为本发明精密直线位移台的五自由度误差测量装置的3自由度误差测量装置的示意图。FIG. 2 is a schematic diagram of a three-degree-of-freedom error measuring device of the five-degree-of-freedom error measuring device of the precision linear displacement stage of the present invention.
具体实施方式Detailed ways
下面将结合附图对本发明实施例中的技术方案进行清楚、完整地描述。The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.
如图1、2所示,一种精密直线位移台的五自由度误差测量装置,包括精密直线位移台、五自由度误差测量单元1和垂直反射镜2,所述垂直反射镜2放置于五自由度误差测量单元1相互垂直的凹陷处;所述五自由度误差测量单元1包括所述三自由度误差测量单元一101和所述三自由度误差测量单元二102,所述三自由度误差测量单元一101和所述三自由度误差测量单元二102以相互垂直方式通过连接件103固定连接;所述连接件103为两个连续垂直弯曲的直板。所述垂直反射镜2包括方箱201,所述方箱201为带有倒角箱体,由殷钢材质制成。所述方箱201靠近三自由度误差测量单元一101的侧面上粘接有平面反射镜一202,所述方箱201靠近三自由度误差测量单元二102的侧面上粘接有平面反射镜二203,所述平面反射镜一202与平面反射镜二203相互垂直;当使用时,所述五自由度误差测量单元1与精密直线位移台的滑台进行固定连接,所述精密直线位移台的基座与垂直反射镜2进行固定连接,实现精密直线位移台的滚转、偏摆、俯仰、水平方向的直线度误差和竖直方向的直线度误差实时测量。As shown in Figures 1 and 2, a five-degree-of-freedom error measurement device for a precision linear displacement stage includes a precision linear displacement platform, a five-degree-of-freedom error measurement unit 1 and a
所述三自由度误差测量单元包括安装在箱体内的激光模组4、偏振分光镜5、反射镜6、两个探测模组7和3,所述偏振分光镜5和探测模组3依次设置于箱体的光线入口处,所述偏振分光镜5两侧各固定设置有激光模组4、反射镜6,所述激光模组4、偏振分光镜5和探测模组3之间内设置有探测模组7;所述激光模组4、偏振分光镜5和探测模组7构成激光自准直光路,分别能够实现精密直线位移台绕X轴的角度误差测量和绕Z轴的角度误差量;所述激光模组4、反射镜6和探测模组3构成激光三角法光路,能够实现精密直线位移台在Y轴方向上的直线度误差测量;当3自由度误差测量单元安装在XOZ面内时,能够实现精密直线位移台绕Y轴的角度误差测量和在Z轴方向的直线度误差测量。The three-degree-of-freedom error measurement unit includes a
以上所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The above-described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910734340.XA CN110345870B (en) | 2019-08-09 | 2019-08-09 | A five-degree-of-freedom error measuring device for a precision linear displacement stage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910734340.XA CN110345870B (en) | 2019-08-09 | 2019-08-09 | A five-degree-of-freedom error measuring device for a precision linear displacement stage |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110345870A CN110345870A (en) | 2019-10-18 |
CN110345870B true CN110345870B (en) | 2020-12-04 |
Family
ID=68184425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910734340.XA Active CN110345870B (en) | 2019-08-09 | 2019-08-09 | A five-degree-of-freedom error measuring device for a precision linear displacement stage |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110345870B (en) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61132804A (en) * | 1984-12-02 | 1986-06-20 | Anritsu Corp | X-y stage |
JPH07218220A (en) * | 1994-01-31 | 1995-08-18 | Agency Of Ind Science & Technol | High-speed tracking laser interferometer |
EP0983481B1 (en) * | 1997-07-08 | 2001-10-24 | Etec Systems, Inc. | Two piece mirror arrangement for interferometrically controlled stage |
JP2002328007A (en) * | 2001-05-01 | 2002-11-15 | Nikon Corp | Stage position measurement method, exposure method and apparatus, and device manufacturing method |
CN101419044A (en) * | 2008-09-19 | 2009-04-29 | 合肥工业大学 | Micron-nano grade three-dimensional measurement '331' system and measurement method thereof |
CN100510965C (en) * | 2003-04-17 | 2009-07-08 | Asml荷兰有限公司 | Panel printing device and device manufacturing method |
CN106052570A (en) * | 2016-08-11 | 2016-10-26 | 中国计量科学研究院 | Nanometer-displacement-bench six-degree-of-freedom calibrating device |
CN106595480A (en) * | 2016-12-09 | 2017-04-26 | 北京交通大学 | Laser measurement system used for measuring rotating-shaft six-degree-of-freedom geometric error and method thereof |
CN107091608A (en) * | 2017-05-31 | 2017-08-25 | 天津大学 | A kind of five degree of freedom measurement method of parameters based on primary standard of curved surface part |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55429A (en) * | 1978-06-19 | 1980-01-05 | Toshiba Corp | Length meter using laser beam |
US5940180A (en) * | 1994-10-11 | 1999-08-17 | Giddings & Lewis | Laser interferometer measurement system for use with machine tools |
JP3450580B2 (en) * | 1996-03-26 | 2003-09-29 | キヤノン株式会社 | Exposure apparatus and exposure method |
CN101240999B (en) * | 2008-03-14 | 2011-10-05 | 中国人民解放军国防科学技术大学 | An interferometric device and method for a large optical plane |
CN108801146A (en) * | 2018-08-30 | 2018-11-13 | 天津大学 | A kind of lathe five degree of freedom error measuring means and error model method for building up |
-
2019
- 2019-08-09 CN CN201910734340.XA patent/CN110345870B/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61132804A (en) * | 1984-12-02 | 1986-06-20 | Anritsu Corp | X-y stage |
JPH07218220A (en) * | 1994-01-31 | 1995-08-18 | Agency Of Ind Science & Technol | High-speed tracking laser interferometer |
EP0983481B1 (en) * | 1997-07-08 | 2001-10-24 | Etec Systems, Inc. | Two piece mirror arrangement for interferometrically controlled stage |
JP2002328007A (en) * | 2001-05-01 | 2002-11-15 | Nikon Corp | Stage position measurement method, exposure method and apparatus, and device manufacturing method |
CN100510965C (en) * | 2003-04-17 | 2009-07-08 | Asml荷兰有限公司 | Panel printing device and device manufacturing method |
CN101419044A (en) * | 2008-09-19 | 2009-04-29 | 合肥工业大学 | Micron-nano grade three-dimensional measurement '331' system and measurement method thereof |
CN106052570A (en) * | 2016-08-11 | 2016-10-26 | 中国计量科学研究院 | Nanometer-displacement-bench six-degree-of-freedom calibrating device |
CN106595480A (en) * | 2016-12-09 | 2017-04-26 | 北京交通大学 | Laser measurement system used for measuring rotating-shaft six-degree-of-freedom geometric error and method thereof |
CN107091608A (en) * | 2017-05-31 | 2017-08-25 | 天津大学 | A kind of five degree of freedom measurement method of parameters based on primary standard of curved surface part |
Non-Patent Citations (1)
Title |
---|
Direct instantaneous 2-D imaging for photoacoustic waves by ultrashort single pulse interferometry;YangLu等;《Optics and Lasers in Engineering》;20191030;第121卷;全文 * |
Also Published As
Publication number | Publication date |
---|---|
CN110345870A (en) | 2019-10-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6801085B2 (en) | Methods and equipment for aligning boards | |
CN108362221B (en) | Nano-precision detection method and device for free-form surface morphology | |
CN101571374A (en) | Error detecting system of minitype high accuracy three coordinate measuring machine | |
CN112596259B (en) | A high-precision off-axis aspheric mirror optical axis extraction method and system | |
Siewert et al. | The nanometer optical component measuring machine | |
CN103278110A (en) | Compensation method for coupling error of guide rail | |
CN102004027B (en) | Laser two-coordinate device | |
CN103235419A (en) | Accurate off-line shaft fixing device and method of wedge-shaped lens disassembly and assembly unit | |
CN110455226B (en) | Calibration system and method for laser collimation transceiving integrated straightness measurement | |
CN113310434B (en) | Method for measuring perpendicularity of two-dimensional linear motion platform | |
CN103134428B (en) | A kind of distributed plane six-freedom degree pose fast precise measurement method | |
CN105371754B (en) | A kind of measuring method that ladder corner reflector laser interferometer is cascaded using wavelength amendment type multiple beam | |
CN110345870B (en) | A five-degree-of-freedom error measuring device for a precision linear displacement stage | |
CN118089703B (en) | High-precision non-contact six-degree-of-freedom parallel-connection mechanism space pose measuring device | |
CN113091653B (en) | Device and method for measuring angle freedom degree error of linear guide rail based on pentaprism | |
CN110666592B (en) | Receiving-transmitting split five-degree-of-freedom measuring device and method with optical path drift compensation | |
CN109520443B (en) | A roll angle measurement method based on composite surface reference parts | |
CN112525082B (en) | Device and method for simultaneously detecting positioning accuracy and straightness of linear displacement table | |
TWI630975B (en) | Active error compensation platform | |
CN114858096B (en) | A horizontal optical path transfer goniometer and its measurement method | |
JP2024137175A (en) | Measuring device using multi-axis laser interferometer | |
CN116772747A (en) | A method for monitoring verticality error during the gluing process of flat mirrors | |
CN113091652B (en) | A measuring system and method with roll angle self-correction function | |
CN105157560B (en) | A kind of three-freedom degree precision laser detector | |
JP2021044573A (en) | Method and device for aligning board |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |