CN110008075A - A kind of chip adjustment method and device - Google Patents
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Abstract
本文公布了一种本发明实施例提供了一种芯片调试方法及装置,包括:在进入DEBUG模式之后,接收串行输入的寄存器的地址信号;根据所述寄存器地址信号,读取相应寄存器的值;将所述寄存器的值串行输出。本申请能够以尽可能少的代价调试芯片内部全部关键信号和寄存器。
This paper discloses an embodiment of the present invention and provides a chip debugging method and device, including: after entering the DEBUG mode, receiving an address signal of a serially input register; reading the value of the corresponding register according to the register address signal ; Serially output the value of the register. The present application can debug all the key signals and registers inside the chip with as little cost as possible.
Description
技术领域technical field
本发明涉及芯片设计技术领域,具体涉及一种芯片调试方法及装置。The invention relates to the technical field of chip design, in particular to a chip debugging method and device.
背景技术Background technique
相关技术中,芯片对内部信号的DEBUG技术,主要是针对CPU及其附属模块数据进行DEBUG,例如联合测试工作组(JTAG,Joint Test Action Group)调试,TRACE调试,,通过将CPU指令或者数据通过特殊定义的接口直接或者存储后再导出,从而达到DEBUG目的,但在死机发生时,此方法就有一定的局限性,无法对芯片内关键信号和关键寄存器进行读操作,而关键信号的值能有助于调试人员对死机原因的判断。In the related art, the DEBUG technology of the chip's internal signal is mainly to debug the data of the CPU and its affiliated modules, such as joint test work group (JTAG, Joint Test Action Group) debugging, TRACE debugging, by passing the CPU instructions or data through. The specially defined interface is directly or stored and then exported, so as to achieve the purpose of DEBUG, but when the crash occurs, this method has certain limitations, and it cannot read the key signals and key registers in the chip, and the value of the key signal can be It is helpful for debugging personnel to judge the cause of the crash.
因此,如何在死机时进行DEBUG的过程中读取芯片内关键信号值和寄存器值以供调试人员查看,是亟待解决的技术问题。Therefore, how to read key signal values and register values in the chip for viewing by debuggers during the DEBUG process when the machine crashes is a technical problem to be solved urgently.
发明内容SUMMARY OF THE INVENTION
为了解决上述技术问题,本发明实施例提供了一种芯片调试方法及装置,能够以尽可能少的代价调试芯片内部全部关键信号和寄存器。In order to solve the above technical problems, the embodiments of the present invention provide a chip debugging method and device, which can debug all key signals and registers inside the chip with as little cost as possible.
本发明实施例提供了如下技术方案:The embodiment of the present invention provides the following technical solutions:
一种芯片调试方法,包括:A chip debugging method, comprising:
在进入DEBUG模式之后,接收串行输入的寄存器的地址信号;After entering DEBUG mode, receive the address signal of the serially input register;
根据所述寄存器地址信号,读取相应寄存器的值;According to the register address signal, read the value of the corresponding register;
将所述寄存器的值串行输出。The value of the register is serially output.
其中,所述根据所述寄存器地址信号,读取相应寄存器的值,包括:解码所述寄存器地址信号,确定相应寄存器所属的模块,并向所述寄存器所属的模块读取所述寄存器的值。The reading the value of the corresponding register according to the register address signal includes: decoding the register address signal, determining the module to which the corresponding register belongs, and reading the value of the register from the module to which the register belongs.
其中,所述方法还包括:所述读取所述寄存器的值之后,执行并转串操作。Wherein, the method further includes: performing a parallel-to-serial operation after reading the value of the register.
其中,通过预先定义的DEBUG_ADDR管脚将所述寄存器的值串行输出。The value of the register is serially output through the predefined DEBUG_ADDR pin.
其中,所述方法还包括如下之一:Wherein, the method also includes one of the following:
将DEBUG_EN管脚置为高,以进入所述DEBUG模式;Set the DEBUG_EN pin high to enter the DEBUG mode;
将所述寄存器的值串行输出之后,将所述DEBUG_EN管脚置为低,以退出所述DEBUG模式。After the value of the register is serially output, the DEBUG_EN pin is set low to exit the DEBUG mode.
一种芯片调试装置,包括:A chip debugging device, comprising:
解码模块,用于在进入DEBUG模式之后,接收串行输入的寄存器的地址信号,根据所述寄存器地址信号,读取相应寄存器的值;The decoding module is used to receive the address signal of the serially input register after entering the DEBUG mode, and read the value of the corresponding register according to the register address signal;
输出模块,用于将所述寄存器的值串行输出。The output module is used for serially outputting the value of the register.
其中,还包括:转换模块;所述解码模块,具体用于接收串行输入的寄存器地址信号,解码所述寄存器地址信号,确定相应寄存器所属的模块,并向所述寄存器所属的模块中的转换模块发送读操作指令;所述转换模块,用于接收来自所述解码模块的读操作指令,读取相应寄存器的值并将所述寄存器的值进行并转串操作。It also includes: a conversion module; the decoding module is specifically configured to receive a serially input register address signal, decode the register address signal, determine the module to which the corresponding register belongs, and convert the module to the module to which the register belongs. The module sends a read operation instruction; the conversion module is configured to receive the read operation instruction from the decoding module, read the value of the corresponding register, and perform a parallel-to-serial operation on the value of the register.
其中,所述输出模块,至少包括:预先定义的DEBUG_ADDR管脚。Wherein, the output module includes at least: a predefined DEBUG_ADDR pin.
其中,还包括:DEBUG_EN管脚,用于在置为高时指示已进入DEBUG模式。Among them, it also includes: DEBUG_EN pin, which is used to indicate that DEBUG mode has been entered when it is set to high.
一种芯片,包括:A chip that includes:
存储有芯片调试程序的存储器;The memory that stores the chip debugging program;
处理器,配置为执行所述芯片调试程序以执行上述芯片调试方法的操作。The processor is configured to execute the chip debugging program to perform the operations of the above-mentioned chip debugging method.
一种计算机可读存储介质,所述计算机可读存储介质上存储有芯片调试程序,所述芯片调试程序被处理器执行时实现上述芯片调试方法的步骤。A computer-readable storage medium stores a chip debugging program on the computer-readable storage medium, and when the chip debugging program is executed by a processor, implements the steps of the above-mentioned chip debugging method.
本发明实施例可通过简单的逻辑和较少的管脚实现DEBUG全芯片的目的,即以尽可能少的代价实现了调试芯片内部全部关键信号和寄存器的目的,同时还达到了节省管脚的效果,加快了调试进度。The embodiment of the present invention can realize the purpose of DEBUG whole chip through simple logic and fewer pins, that is, the purpose of debugging all key signals and registers inside the chip can be realized at the least cost, and meanwhile, the purpose of saving pins is also achieved. The effect is to speed up the debugging progress.
本发明的其它特征和优点将在随后的说明书中阐述,并且,部分地从说明书中变得显而易见,或者通过实施本发明而了解。本发明的目的和其他优点可通过在说明书、权利要求书以及附图中所特别指出的结构来实现和获得。Other features and advantages of the present invention will be set forth in the description which follows, and in part will be apparent from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention may be realized and attained by the structure particularly pointed out in the description, claims and drawings.
附图说明Description of drawings
附图用来提供对本发明技术方案的进一步理解,并且构成说明书的一部分,与本申请的实施例一起用于解释本发明的技术方案,并不构成对本发明技术方案的限制。The accompanying drawings are used to provide a further understanding of the technical solutions of the present invention, and constitute a part of the specification. They are used to explain the technical solutions of the present invention together with the embodiments of the present application, and do not limit the technical solutions of the present invention.
图1为本发明实施例芯片调试方法的流程示意图;FIG. 1 is a schematic flowchart of a chip debugging method according to an embodiment of the present invention;
图2为本发明实施例芯片调试装置的结构示意图;FIG. 2 is a schematic structural diagram of a chip debugging device according to an embodiment of the present invention;
图3为本发明实施例中芯片的示例性结构示意图;3 is a schematic diagram of an exemplary structure of a chip in an embodiment of the present invention;
图4为图3所示芯片中解码模块的功能示意图;4 is a functional schematic diagram of a decoding module in the chip shown in FIG. 3;
图5为图3所示芯片中转换模块的功能示意图;Fig. 5 is the functional schematic diagram of the conversion module in the chip shown in Fig. 3;
图6为本发明实施例芯片调试方法的示例性实现流程图。FIG. 6 is an exemplary implementation flowchart of a chip debugging method according to an embodiment of the present invention.
具体实施方式Detailed ways
为使本发明的目的、技术方案和优点更加清楚明白,下文中将结合附图对本发明的实施例进行详细说明。需要说明的是,在不冲突的情况下,本申请中的实施例及实施例中的特征可以相互任意组合。In order to make the objectives, technical solutions and advantages of the present invention clearer, the embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be noted that, the embodiments in the present application and the features in the embodiments may be arbitrarily combined with each other if there is no conflict.
在附图的流程图示出的步骤可以在诸如一组计算机可执行指令的计算机系统中执行。并且,虽然在流程图中示出了逻辑顺序,但是在某些情况下,可以以不同于此处的顺序执行所示出或描述的步骤。The steps shown in the flowcharts of the figures may be performed in a computer system, such as a set of computer-executable instructions. Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that herein.
目前芯片设计中,DEBUG是非常重要的一环设计,关系到芯片的调试进度,进而影响产品的上市进度。DEBUG的执行方法如果不合理,花费的人力时间成本不可估量。相关技术的类似技术方案局限性较大相关技术中,芯片的调试是利用CPU自带的DEBUG功能,从JTAG到TRACE,但这些方案需要高度复杂且面积较大的模块,也需要芯片设计工程师和调试工程师较长时间的学习理解与应用,而且在芯片死机时,能调试的范围也极其有限,JTAG调试甚至不起作用。因此,不管是芯片面积成本,后续调试的人力成本都很高。In the current chip design, DEBUG is a very important part of the design, which is related to the debugging progress of the chip, which in turn affects the progress of the product launch. If the execution method of DEBUG is unreasonable, the cost of human time and time will be immeasurable. Similar technical solutions in related technologies are more limited. In related technologies, the debugging of the chip is to use the DEBUG function that comes with the CPU, from JTAG to TRACE, but these solutions require highly complex and large-area modules, and also require chip design engineers and Debugging engineers have a long time to learn, understand and apply, and when the chip crashes, the scope of debugging is extremely limited, and JTAG debugging does not even work. Therefore, regardless of the cost of chip area, the labor cost of subsequent debugging is very high.
针对相关技术的上述技术问题,本申请提供了如下的技术方案。本申请的技术方案通过简单的逻辑和较少的管脚,即可达到DEBUG全芯片寄存器和关键信号的目的。In view of the above technical problems of the related art, the present application provides the following technical solutions. The technical solution of the present application can achieve the purpose of DEBUG full-chip registers and key signals through simple logic and fewer pins.
下面对本申请技术方案的实现方式进行详细说明。The implementation manner of the technical solution of the present application will be described in detail below.
实施例一Example 1
如图1所示,提供一种芯片调试方法,其特征在于,包括:As shown in FIG. 1, a chip debugging method is provided, which is characterized in that:
步骤101,在进入DEBUG模式之后,接收串行输入的寄存器的地址信号;Step 101, after entering the DEBUG mode, receive the address signal of the serially input register;
步骤102,根据所述寄存器地址信号,读取相应寄存器的值;Step 102, according to the register address signal, read the value of the corresponding register;
步骤103,将所述寄存器的值串行输出,使得观测设备(比如,示波器)收到所述寄存器的值并进行展示(比如,通过波形来展示所述寄存器的值),以便调试人员进行观测。Step 103: Serially output the value of the register, so that the observation device (eg, an oscilloscope) receives the value of the register and displays it (eg, displays the value of the register through a waveform), so that the debugger can observe .
这里,寄存器为预调试的寄存器,寄存器地址信号是指该预调试的寄存器的地址信号。Here, the register is a pre-debugged register, and the register address signal refers to the address signal of the pre-debugged register.
本实施例中,通过专用的两个调试管脚,同时芯片内容增加简单的逻辑,与所有AMBA总线接口的IP模块相连接,通过使能管脚的控制,从管脚输入观测的地址,模块寄存器即可通过连接模块将寄存器值读出,同时转成串行数据输出至管脚,可通过示波器进行观测。这样,在芯片死机、CPU无法访问时,通过本实施例的方法依然可以快速访问内部寄存器,抓取关键信号的值,快速定位故障,从而达到DEBUG全芯片寄存器和关键信号的目的。由此可知,本实施例可通过简单的逻辑和较少的管脚实现DEBUG全芯片的目的,即以尽可能少的代价实现了调试芯片内部全部关键信号和寄存器的目的,同时还达到了节省管脚的效果,加快了调试进度。In this embodiment, two dedicated debug pins are used, and simple logic is added to the content of the chip, which is connected to all IP modules of the AMBA bus interface. The register value can be read out through the connection module, and at the same time converted into serial data and output to the pin, which can be observed by the oscilloscope. In this way, when the chip crashes and the CPU cannot be accessed, the method of this embodiment can still quickly access internal registers, capture the value of key signals, and quickly locate faults, thereby achieving the purpose of DEBUG full-chip registers and key signals. It can be seen from this that this embodiment can realize the purpose of DEBUG full-chip through simple logic and fewer pins, that is, the purpose of debugging all key signals and registers inside the chip can be realized at the least possible cost, and at the same time, the purpose of saving The effect of the pins speeds up the debugging progress.
本实施例中,所述根据所述寄存器地址信号,读取相应寄存器的值,可以包括:解码所述寄存器地址信号,确定相应寄存器所属的模块,并向所述寄存器所属的模块读取所述寄存器的值。In this embodiment, reading the value of the corresponding register according to the register address signal may include: decoding the register address signal, determining the module to which the corresponding register belongs, and reading the value of the corresponding register from the module to which the register belongs. the value of the register.
本实施例中,所述方法还可以包括:所述读取所述寄存器的值之后,执行并转串操作。In this embodiment, the method may further include: performing a parallel-to-serial operation after reading the value of the register.
本实施例中,通过预先定义的DEBUG_ADDR管脚将所述寄存器的值串行输出。In this embodiment, the value of the register is serially output through the predefined DEBUG_ADDR pin.
本实施例中,还可以包括如下之一或两项:1)将DEBUG_EN管脚置为高,以进入所述DEBUG模式;2)将所述寄存器的值串行输出之后,将所述DEBUG_EN管脚置为低,以退出所述DEBUG模式。In this embodiment, one or both of the following may also be included: 1) set the DEBUG_EN pin to high to enter the DEBUG mode; 2) after serially outputting the value of the register, connect the DEBUG_EN pin to the high pin low to exit the DEBUG mode.
实施例二Embodiment 2
一种芯片调试装置,如图2所示,可以包括:A chip debugging device, as shown in Figure 2, may include:
解码模块21,用于在进入DEBUG模式之后,接收串行输入的寄存器的地址信号,根据所述寄存器地址信号,读取相应寄存器的值;The decoding module 21 is used to receive the address signal of the serially input register after entering the DEBUG mode, and read the value of the corresponding register according to the register address signal;
输出模块22,用于将所述寄存器的值串行输出。The output module 22 is used for serially outputting the value of the register.
本实施例中,上述芯片调试装置还可以包括:转换模块23;所述解码模块21,具体可用于接收串行输入的寄存器地址信号,解码所述寄存器地址信号,确定相应寄存器所属的模块,并向所述寄存器所属的模块中的转换模块发送读操作指令;所述转换模块23,可用于接收来自所述解码模块的读操作指令,读取相应寄存器的值并将所述寄存器的值进行并转串操作。In this embodiment, the above-mentioned chip debugging device may further include: a conversion module 23; the decoding module 21 can be specifically configured to receive a serially input register address signal, decode the register address signal, determine the module to which the corresponding register belongs, and Send a read operation instruction to the conversion module in the module to which the register belongs; the conversion module 23 can be used to receive the read operation instruction from the decoding module, read the value of the corresponding register and compare the value of the register. String operation.
本实施例中,所述输出模块22,至少可以包括:预先定义的DEBUG_ADDR管脚。换言之,通过该预先定义的DEBUG_ADDR管脚将所述寄存器的值串行输出。In this embodiment, the output module 22 may at least include: a predefined DEBUG_ADDR pin. In other words, the value of the register is serially output through the pre-defined DEBUG_ADDR pin.
本实施例中,上述装置还可以包括:DEBUG_EN管脚,用于在置为高时指示已进入DEBUG模式。此外,DEBUG_EN管脚,还可用于在置为低时指示已退出DEBUG模式。In this embodiment, the above apparatus may further include: a DEBUG_EN pin, which is used to indicate that the DEBUG mode has been entered when it is set to high. In addition, the DEBUG_EN pin can be used to indicate that DEBUG mode has been exited when asserted low.
本实施例中的其他技术细节参照实施例一。For other technical details in this embodiment, refer to Embodiment 1.
实施例三Embodiment 3
一种芯片,包括:A chip that includes:
存储有芯片调试程序的存储器;The memory that stores the chip debugging program;
处理器,配置为执行所述芯片调试程序以执行实施例一所述芯片调试方法的操作。A processor configured to execute the chip debugging program to perform the operations of the chip debugging method of the first embodiment.
本实施例中的其他技术细节参照实施例一。For other technical details in this embodiment, refer to Embodiment 1.
实施例四Embodiment 4
一种计算机可读存储介质,所述计算机可读存储介质上存储有芯片调试程序,所述芯片调试程序被处理器执行时实现实施例一所述芯片调试方法的的步骤。A computer-readable storage medium stores a chip debugging program on the computer-readable storage medium, and when the chip debugging program is executed by a processor, implements the steps of the chip debugging method in the first embodiment.
本实施例中的其他技术细节参照实施例一。For other technical details in this embodiment, refer to Embodiment 1.
下面对上述各实施例的示例性实现方式进行详细说明。需要说明的是,下文各实例可任意结合。并且,在实际应用中,上述各实施例还可以有其他的实现方式,下文实例中各流程、执行过程等也可以根据实际应用的需要进行调整。Exemplary implementations of the above embodiments will be described in detail below. It should be noted that the following examples can be arbitrarily combined. Moreover, in practical applications, the above embodiments may also have other implementation manners, and each process, execution process, etc. in the following examples may also be adjusted according to the needs of practical applications.
实例1Example 1
如图3所示,为一芯片的示例性结构示意图。如图3所示,芯片中设置有解码模块、以及与芯片中原有模块(模块1、……、模块n)一一连接的转换模块。其中,如图4所示,解码模块负责地址解码、串行地址输入、模块选择、以及数据串行输出,如图5所示,各个转换模块分别负责将其所连接模块的串行地址信号转为AMBA总线读接口、AMBA总线读数据转串行数据信号。转换模块中还包括控制子模块,该控制子模块负责转换模块的时序控制。具体的,控制子模块用于控制转换模块按照如下时序执行相应操作:操作读地址,再获取数据,再输出至管脚。As shown in FIG. 3 , it is a schematic diagram of an exemplary structure of a chip. As shown in FIG. 3 , the chip is provided with a decoding module and a conversion module connected with the original modules (module 1, . . . , module n) in the chip one by one. Among them, as shown in Figure 4, the decoding module is responsible for address decoding, serial address input, module selection, and data serial output. As shown in Figure 5, each conversion module is responsible for converting the serial address signal of the module it is connected to. For AMBA bus read interface, AMBA bus read data to serial data signal. The conversion module also includes a control sub-module, which is responsible for the timing control of the conversion module. Specifically, the control sub-module is used to control the conversion module to perform corresponding operations according to the following sequence: operate the read address, then acquire the data, and then output it to the pin.
如图6所示,为芯片调试的示例性实现流程。As shown in FIG. 6 , it is an exemplary implementation flow of chip debugging.
如图6所示,芯片调试的示例性执行流程可以包括:As shown in Figure 6, an exemplary execution flow of chip debugging may include:
步骤601,置DEBUG_EN管脚为高,表示芯片处于DEBUG模式,内部转换模块会自动将预调试的IP模块与原AMBA总线断开,使模块直接与转换模块相连接;Step 601, set the DEBUG_EN pin to high, indicating that the chip is in DEBUG mode, and the internal conversion module will automatically disconnect the pre-debugged IP module from the original AMBA bus, so that the module is directly connected to the conversion module;
步骤602,从DEBUG_ADDR管脚向芯片内串行输入的32比特寄存器地址信号;Step 602, from the DEBUG_ADDR pin to the serially input 32-bit register address signal in the chip;
步骤603,解码模块对串行输入的32比特寄存器地址信号进行解码,根据寄存器地址确定要访问哪一个模块的寄存器,选择该模块连接的转换模块执行读操作。Step 603: The decoding module decodes the serially input 32-bit register address signal, determines which module's register to access according to the register address, and selects the conversion module connected to the module to perform the read operation.
本申请中,将关键信号分配到寄存器中,以便通过寄存器地址能直接访问并读取该关键信号的信号值。In this application, the key signal is allocated to the register, so that the signal value of the key signal can be directly accessed and read through the register address.
步骤604,转换模块将读出相应寄存器的值且进行并转串的操作,并将相应的串行数据信号返回给解码模块;Step 604, the conversion module will read out the value of the corresponding register and perform the parallel-to-serial operation, and return the corresponding serial data signal to the decoding module;
步骤605,解码模块接收上述寄存器返回的串行数据信号,将相应的数据即寄存器的值串行输出至管脚,调试人员即可通过示波器观察到该寄存器的值。考虑到可观测性,解码模块可以将寄存器的值通过一定格式的编码进行跳变输出,以防止连续0或连续1引起的观测不便,也可以重复多次输出。In step 605, the decoding module receives the serial data signal returned by the above-mentioned register, and serially outputs the corresponding data, that is, the value of the register to the pin, and the debugger can observe the value of the register through the oscilloscope. Taking into account the observability, the decoding module can output the value of the register by jumping through a certain format of coding to prevent the observation inconvenience caused by continuous 0 or continuous 1, and can also repeat the output multiple times.
本领域普通技术人员可以理解上述方法中的全部或部分步骤可通过程序来指令相关硬件(例如处理器)完成,所述程序可以存储于计算机可读存储介质中,如只读存储器、磁盘或光盘等。可选地,上述实施例的全部或部分步骤也可以使用一个或多个集成电路来实现。相应地,上述实施例中的各模块/单元可以采用硬件的形式实现,例如通过集成电路来实现其相应功能,也可以采用软件功能模块的形式实现,例如通过处理器执行存储于存储器中的程序/指令来实现其相应功能。本申请不限制于任何特定形式的硬件和软件的结合。Those of ordinary skill in the art can understand that all or part of the steps in the above method can be completed by instructing relevant hardware (such as a processor) through a program, and the program can be stored in a computer-readable storage medium, such as a read-only memory, a magnetic disk or an optical disk Wait. Optionally, all or part of the steps in the above embodiments may also be implemented using one or more integrated circuits. Correspondingly, each module/unit in the above-mentioned embodiments can be implemented in the form of hardware, for example, an integrated circuit to implement its corresponding function, or it can be implemented in the form of a software function module, for example, a program stored in a memory is executed by a processor. / directive to implement its corresponding function. The present application is not limited to any particular form of combination of hardware and software.
以上显示和描述了本申请的基本原理和主要特征和本申请的优点。本申请不受上述实施例的限制,上述实施例和说明书中描述的只是说明本申请的原理,在不脱离本申请精神和范围的前提下,本申请还会有各种变化和改进,这些变化和改进都落入要求保护的本申请范围内。The above shows and describes the basic principles and main features of the present application and the advantages of the present application. The present application is not limited by the above-mentioned embodiments. The above-mentioned embodiments and descriptions only describe the principles of the present application. Without departing from the spirit and scope of the present application, the present application will also have various changes and improvements. These changes and improvements are within the scope of the claimed application.
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