CN109975585A - A kind of mounting structure of test device, testing needle and testing needle - Google Patents

Abstract

The application provides a kind of test device, the mounting structure of testing needle and testing needle, the test device includes multiple testing needles and test fixture, and it is opened up on the test fixture multiple for assembling the pilot hole of the multiple testing needle, wherein, further include: fixed plate, and multiple one end for the testing needle are opened up in the fixed plate and are passed through and mounting hole corresponding with the pilot hole, the fixed plate is used to multiple testing needles being fixed on the test fixture, test device provided by the present application, improve packing density of the testing needle on test fixture, reduce testing cost when the highly dense distribution of RFSW device on circuit board, improve the installation and removal efficiency of testing needle, to solve the problems, such as that packing density of the existing RF testing needle on test fixture is small and testing cost is caused to increase.

Description

A test device, a test needle and an installation structure of the test needle

technical field

The present application relates to the field of test equipment, and in particular, to a test device, a test pin and a test pin mounting structure.

Background technique

A radio frequency (Radio Frequency, referred to as: RF) test pin is a device used to electrically connect a test instrument to a device on the motherboard. : RFSW) device and the test instrument are connected to perform power calibration and test of the RF signal, wherein, when the RF test is aimed at the RFSW device test, it is often necessary to fix the RF test pin on the test fixture.

At present, the way of fixing the RF test pin on the test fixture is as follows: using a flange to fix the RF test pin on the test fixture, specifically, each RF test pin is fixed on the test fixture through a set of flanges.

However, due to the large size of the flange, the number of RF test pins that can be installed on the test fixture is limited, that is, the installation density of the RF test pins is reduced, so that when there are many RFSW devices on the circuit board, it is often necessary to divide the test. (That is, at least two stations are required to complete the test), thereby increasing the test cost.

SUMMARY OF THE INVENTION

The present application provides a test device, a test pin and a test pin installation structure, which achieves the purpose of increasing the installation density of the test pin on the test fixture, reduces the number of test stations, and reduces the test cost, thereby solving the problem of existing RF tests. There is a problem that the mounting density of the pins on the test fixture is small and the test cost is increased.

The present application provides a test device, which includes a plurality of test pins and a test fixture, and the test fixture is provided with a plurality of assembly holes for assembling the plurality of test pins, and further includes:

a fixing plate, and a plurality of mounting holes through which one end of the test pin can pass through and corresponding to the mounting hole are defined on the fixing plate, and the fixing plate is used for fixing a plurality of the test pins on the on the test fixture.

The test device provided by the present application includes a plurality of test pins and a test fixture, and the test fixture is provided with a plurality of assembly holes for assembling the plurality of test pins, and also includes a fixing plate, and the fixing plate is A plurality of mounting holes through which one end of the test pin can pass through and corresponding to the mounting hole are provided on the fixing plate, and the fixing plate is used to fix a plurality of the test pins on the test fixture, so that a plurality of test The pins can be fixed on the test fixture at the same time through the fixing plate. Since there is no flange between adjacent test pins, the interval between adjacent test pins can be greatly reduced, so that the number of test pins that can be installed per unit area of the test fixture is Increase, the installation density of the test pins on the test fixture increases, thus avoiding the problem that the distance between adjacent test pins is large when the flange is used to fix the test pins, resulting in a small installation density of test pins on the test fixture. When the installation density of the test needles on the test fixture increases, when there are many RFSW devices on the circuit board, the test device provided by the present application can complete the test on the RFSW devices on the circuit board at one time, thus avoiding the need for division testing. Therefore, the test cost is greatly reduced, and multiple test pins can be fixed at the same time by using the fixing plate, which greatly improves the installation and removal efficiency of the test pins on the test fixture. Therefore, the test device provided by the present application improves the test pin The mounting density on the test fixture reduces the test cost when RFSW devices are densely distributed on the circuit board, improves the installation and removal efficiency of the test pins, and solves the problem of the low installation density of the existing RF test pins on the test fixture. the issue of increased costs.

In a possible implementation manner of the first aspect, the test needle has a limit portion, the test needle has a limit portion, and the limit portion is used to cooperate with the fixing plate to realize the The limit of the test pin, or the limit part is used to cooperate with the assembly hole to realize the limit of the test pin, or the limit part is used to cooperate with the fixing plate and the assembly hole to realize the limit Limits for the test pins.

In a possible implementation of the first aspect, the limiting portion includes an upper limiting end face and a lower limiting end face, the upper limiting end face is used for cooperating with the fixing plate to achieve position limiting, and the lower limiting end face is used for In order to cooperate with the assembling hole or the test fixture to realize the limit.

In a possible implementation manner of the first aspect, the test needle includes a needle body, needle heads located at two ends of the needle body, respectively, and a connector that can pass through the mounting hole, and the needle head and the needle body The lower limit end face is formed between one end of the needle body, and the upper limit end face is formed between the joint and the other end of the needle body.

In a possible implementation manner of the first aspect, the mounting hole includes a first mounting hole and a second mounting hole through which the needle can pass outward, and the first mounting hole and the second mounting hole A step for limiting the lower limit end face is formed at the connection of the assembly holes, and the fixing plate is used for limiting the upper limit end face, so that the plurality of test pins are fixed on the test pin through the fixing plate on the fixture.

In a possible implementation manner of the first aspect, the length of the first mounting hole is greater than the length of the second mounting hole, so that the step is formed close to the bottom end of the mounting hole.

In a possible implementation manner of the first aspect, the length of the first mounting hole is smaller than the length of the second mounting hole, so that the step is formed near the top of the mounting hole.

In a possible implementation manner of the first aspect, the assembly hole is a straight hole through which the needle body or the needle head can pass.

In a possible implementation of the first aspect, the assembly hole is a straight hole through which the needle can pass, and the lower limit end face abuts against the outer edge of the assembly hole to realize the test a needle limit, the fixing plate is matched with the upper limit end surface to fix the plurality of test needles on the test fixture.

In a possible implementation manner of the first aspect, the mounting hole is a straight hole through which the needle body can pass, and the fixing plate includes an upper fixing plate and a lower fixing plate, the upper fixing plate and The lower fixing plate is respectively limited with the lower limit end face and the upper limit end face to fix both ends of the test needle on the test fixture.

In a possible implementation manner of the first aspect, the diameter of the mounting hole opened on the upper fixing plate is greater than or equal to the outer diameter of the joint, so that the joint passes through all the holes on the upper fixing plate. the mounting hole;

The diameter of the mounting hole opened on the lower fixing plate is greater than or equal to the outer diameter of the needle.

In a possible implementation manner of the first aspect, it further includes: a floating member, the floating member is located between the fixing plate and the upper limit end surface, so that the test needle is fixed on the test fixture Then you can float up a preset distance.

In a possible implementation manner of the first aspect, the floating member is a spring, a sponge or a flexible member.

In a possible implementation manner of the first aspect, the fixing plate is snap-connected with the test fixture or fastened with a fastener to fix the plurality of test pins on the test fixture.

In a possible implementation of the first aspect, the fastener is a screw.

The present application also provides an installation structure for a test pin, including a test fixture, wherein a plurality of assembly holes for assembling a plurality of test pins are opened on the test fixture, which further includes:

a fixing plate, and the fixing plate is provided with a plurality of mounting holes through which one end of the test pin can pass through and corresponding to the mounting hole, the fixing plate is used for fixing a plurality of the test pins on the on the test fixture.

The mounting structure of the test pin provided by the present application further includes a fixing plate, and the fixing plate is provided with a plurality of mounting holes through which one end of the test pin can pass and corresponding to the mounting hole. The plate is used to fix a plurality of the test pins on the test fixture, so that the plurality of test pins can be fixed on the test fixture at the same time through the fixing plate. Since there is no flange between adjacent test pins, adjacent test pins are The spacing between the pins can be greatly reduced, which increases the number of test pins that can be installed per unit area of the test fixture, and increases the installation density of test pins on the test fixture, thus avoiding adjacent tests when using flanges to fix test pins. The gap between the pins is large, which causes the problem that the installation density of the test pins on the test fixture is small. When the installation density of the test pins on the test fixture increases, so that when there are many RFSW devices on the circuit board, this application provides The test device can complete the test of the RFSW device on the circuit board at one time, which avoids the problem of sub-station testing, thereby greatly reducing the test cost, and when multiple test pins are fixed with a fixed plate, it greatly improves the test pin. The installation and disassembly efficiency on the fixture, therefore, the installation structure of the test pins provided by the present application improves the installation density of the test pins on the test fixture, reduces the test cost when the RFSW devices are distributed in high density on the circuit board, and improves the test pin The installation and disassembly efficiency is improved, thereby solving the problem of increasing the test cost caused by the low installation density of the existing RF test pins on the test fixture.

In a possible implementation manner of the second aspect, a step for limiting the position of the position-limiting portion provided on the test needle is provided in the assembly hole.

In a possible implementation manner of the second aspect, the mounting hole includes a first mounting hole and the second mounting hole through which one end of the test pin can pass outward, and the first mounting hole The step is formed at the connection with the second assembly hole.

In a possible implementation manner of the second aspect, the length of the first mounting hole is greater than the length of the second mounting hole, so that the step is formed close to the bottom end of the mounting hole.

In a possible implementation manner of the second aspect, the length of the first mounting hole is smaller than the length of the second mounting hole, so that the step is formed near the top of the mounting hole.

In a possible implementation manner of the second aspect, the assembly hole is a straight hole through which the needle of the test needle can pass, and the limiting portion on the test needle abuts on the top of the assembly hole at the outer edge.

In a possible implementation manner of the second aspect, the assembly hole is a straight hole through which the needle body of the test needle can pass, and the fixing plate includes an upper fixing plate and a lower fixing plate, the upper fixing plate The fixing plate and the lower fixing plate are respectively matched with the two limiting end surfaces of the limiting portion to fix both ends of the test pin on the test fixture.

In a possible implementation manner of the second aspect, the diameter of the mounting hole opened on the upper fixing plate is greater than or equal to the outer diameter of the connector of the test pin, so that the connector passes through the upper fixing plate the mounting holes on the

The diameter of the mounting hole opened on the lower fixing plate is greater than or equal to the outer diameter of the needle of the test needle.

In a possible implementation manner of the second aspect, it further includes: a floating member, the floating member is located between the fixing plate and the limiting portion of the test needle, so that the test needle is in the test position After being fixed on the fixture, it can float up a preset distance.

In a possible implementation manner of the second aspect, the floating member is a spring, a sponge or a flexible member.

In a possible implementation manner of the second aspect, the fixing plate is snap-connected with the test fixture or fastened with a fastener to fix the plurality of test pins on the test fixture.

The fasteners are screws.

The present application also provides a test pin for being mounted on the above-mentioned mounting structure to test a device on a circuit board, wherein the test pin is provided with a limit portion, and the limit portion is used for connecting with the test pin. The fixing plate in the installation structure cooperates to realize the position limit of the test pin, or the limit part is used to cooperate with the assembly hole on the test fixture in the installation structure to realize the position limit of the test pin, Alternatively, the limiting portion is used for cooperating with the fixing plate and the mounting hole to realize the limiting of the test pins, so that the fixing plate fixes a plurality of the test pins on the test fixture.

In the test needle provided by the present application, a limit portion is provided on the test needle, and the limit portion is matched with the fixing plate in the installation structure, or with the assembly hole on the test fixture in the installation structure, or Cooperate with the fixing plate and the assembly hole to limit the test pins, so that the fixing plate can fix a plurality of the test pins on the test fixture, so that the plurality of test pins can be simultaneously fixed on the test fixture through the fixing plate. On the test fixture, since there is no flange between adjacent test pins, the interval between adjacent test pins can be greatly reduced, which increases the number of test pins that can be installed per unit area of the test fixture, and the test pins are on the test fixture. The mounting density of the test pin is increased, thus avoiding the problem that the distance between adjacent test pins is large when the flange is used to fix the test pin, which causes the test pin to be installed on the test fixture with a small density. When the test pin is installed on the test fixture When the density increases, when there are many RFSW devices on the circuit board, the fixed multiple test pins can complete the test on the RFSW devices on the circuit board at one time, which avoids the problem of sub-station testing, thus greatly reducing the test cost. , and when multiple test pins are fixed with a fixing plate, the installation and removal efficiency of the test pins on the test fixture is greatly improved. Therefore, the test pins provided in the present application achieve the purpose of high-density installation on the test fixture, reducing the cost of The test cost when the RFSW devices are distributed in high density on the circuit board improves the installation and removal efficiency of the test pins, thereby solving the problem of increasing the test cost caused by the low installation density of the existing RF test pins on the test fixture.

In a possible implementation of the third aspect, the limiting portion includes an upper limiting end face and a lower limiting end face, the upper limiting end face is used for cooperating with the fixing plate to achieve position limiting, and the lower limiting end face is used for The limit is achieved by cooperating with the steps provided in the assembling holes or with the test fixture.

In a possible implementation manner of the third aspect, the limit portion includes an upper limit end face and a lower limit end face, the test needle includes a needle body, and needles and connectors located at both ends of the needle body, respectively, and the The lower limit end surface is formed between the needle head and one end of the needle body, and the upper limit end surface is formed between the joint and the other end of the needle body.

These and other aspects, implementations, and advantages of exemplary embodiments will become apparent from the embodiments described hereinafter, taken in conjunction with the accompanying drawings. It should be understood, however, that the description and drawings are for illustration only and do not serve as definitions of limitations to the present application, see the appended claims for details. Other aspects and advantages of the present application will be set forth in the following description, and in part will be apparent from the description, or learned by practice of the present application. Furthermore, the various aspects and advantages of the present application may be realized and attained by means of the instrumentalities and combinations particularly pointed out in the appended claims.

Description of drawings

FIG. 1a is a schematic top-view structural diagram of a test device provided in Embodiment 1 of the present application;

FIG. 1b is a schematic cross-sectional structure diagram of a test device provided in Embodiment 1 of the present application;

1c is a schematic cross-sectional structure diagram of a test fixture in a test device provided in Embodiment 1 of the present application;

1d is a schematic structural diagram of a test needle in a test device provided in Embodiment 1 of the present application;

Fig. 1e is another cross-sectional structural schematic diagram of the test device provided in the first embodiment of the present application;

1f is a schematic cross-sectional structure diagram of a fixed plate in a test device provided in Embodiment 1 of the present application;

2a is a schematic cross-sectional structure diagram of a test fixture in a test device provided in Embodiment 2 of the present application;

2b is a schematic cross-sectional structure diagram of the test device provided in the second embodiment of the present application;

3a is a schematic structural diagram of a test needle in a test device provided in Embodiment 3 of the present application;

3b is a schematic cross-sectional structure diagram of a test fixture in a test device provided in Embodiment 3 of the present application;

3c is a schematic cross-sectional structure diagram of the test device provided in Embodiment 3 of the present application;

3d is another cross-sectional structural schematic diagram of the test device provided in Embodiment 3 of the present application;

4a is a schematic cross-sectional structure diagram of a test fixture in a test device provided in Embodiment 4 of the present application;

4b is a schematic cross-sectional structure diagram of the lower fixing plate installed on the test fixture in the test device provided in the fourth embodiment of the present application;

4c is a schematic cross-sectional structure diagram of the test device provided in Embodiment 4 of the present application;

FIG. 4d is another cross-sectional structural schematic diagram of the testing device provided in the fourth embodiment of the present application.

Description of reference numbers:

10-Test fixture; 11-Assembly hole; 111-First assembly hole; 112-Second assembly hole; 12-Step;

20-test pin; 21-connector; 22-pin body; 23-pin head; 221-upper end face;

222-lower limit end 22a-limiter; 30-fixed plate; 301-upper fixed plate; 302-lower fixed surface; plate;

31- Fasteners; 32- Mounting holes; 321- Lower steps; 40- Floating parts.

Detailed ways

Fig. 1a is a schematic top view of the structure of the test device provided by the first embodiment of the present application, Fig. 1b is a schematic cross-sectional structure of the test device provided by the first embodiment of the present application, and Fig. 1c is the test fixture in the test device provided by the first embodiment of the present application. Schematic diagram of the cross-sectional structure, FIG. 1d is a schematic structural diagram of the test needle in the test device provided by the first embodiment of the present application, FIG. 1e is another cross-sectional structural schematic diagram of the test device provided by the first embodiment of the present application, and FIG. 1f is the first embodiment of the present application. A schematic diagram of the cross-sectional structure of the fixed plate in the test device provided.

As mentioned in the background art, there is a problem that the density of the test needles on the test fixture is low in the existing test device. The inventor found that the reason for this problem is: when the existing test needles are fixed on the test fixture, The test pins are fixed on the test fixture with flanges, so that each test pin is fixed with a flange, and the size of the flange is large, resulting in a large interval between two adjacent test pins, which causes the test fixture to be The number of test pins that can be installed is reduced, and the installation density of test pins on the test fixture is small. In this way, during the test process, when there are many RFSW devices on the circuit board (for example, when 5G arrives, the RFSW devices on the circuit board need a high-density layout), Due to the limited number of test pins, some RFSW devices are often tested first, and then the remaining RFSW devices are tested at another station after the test.

Therefore, in order to solve the above problems, in this embodiment, referring to FIGS. 1a-1f, the test device provided in this embodiment includes: a plurality of test pins 20 and a test fixture 10, wherein the test pins 20 may specifically be an RF test pin 20, the test fixture 10 is used to fix the test pin 20 during the test, so that the test pin 20 can test the device on the circuit board, wherein, in order to assemble the test pin 20 on the test fixture 10, specifically, test The fixture 10 is provided with a plurality of mounting holes 11 for mounting a plurality of test pins 20 , wherein each mounting hole 11 corresponds to mounting a test pin 20 . The mounting density on the test pin 20, specifically, further includes: a fixing plate 30, on which a plurality of mounting holes 32 through which one end of the test needle 20 can pass and corresponding to the mounting hole 11 are formed, that is, in this embodiment, as shown in the figure As shown in 1f, a plurality of mounting holes 32 are opened on the fixing plate 30. The mounting holes 32 correspond to the mounting holes 11, and one end of the test pin 20 can pass through the mounting hole 32. Fitted into each mounting hole 11, and then aligning and inserting each mounting hole 32 on the fixing plate 30 with one end of the plurality of test pins 20, and finally fixing the fixing plate 30 and the test fixture 10, the fixing plate 30 and the test After the fixture 10 is fixed, the plurality of test pins 20 are fixed on the test fixture 10 .

Therefore, in this embodiment, the fixing plate 30 is provided with mounting holes 32 corresponding to the test pins 20 , so that the purpose of fixing the plurality of test pins 20 at the same time is achieved, which is different from each test in the prior art. Compared with the use of one flange to fix the needles 20, in this embodiment, a plurality of test needles 20 can be fixed at the same time through the fixing plate 30, so that there is no flange between the adjacent test needles 20, so there is no flange between the test needles 20. The interval between the test fixtures 10 can be greatly reduced, so that the number of test pins 20 that can be installed per unit area of the test fixture 10 is increased, and the installation density of the test pins 20 on the test fixture 10 is increased, so that when 5G arrives, the RFSW devices on the circuit board In the case of high-density layout, the test device provided in this embodiment can complete the test on the RFSW device on the circuit board at one time, thus avoiding the problem of sub-station testing, thereby greatly reducing the test cost, so the test device provided in this embodiment improves the performance of the test. The mounting density of the test pins 20 on the test fixture 10 can meet the test requirements for the high-density layout of RFSW devices on the circuit board.

At the same time, in this embodiment, a plurality of test pins 20 can be fixed on the test fixture 10 at one time through the fixing plate 30 , while in the prior art, each test pin 20 needs a flange for fixing, so that the test fixture 10 is installed on the test fixture 10 When there are multiple test pins 20, the required installation time is longer. Correspondingly, when removing the test pin 20, the flange of each test pin 20 needs to be disassembled, and the disassembly time is long. Multiple test pins 20 can be fixed at the same time. When disassembling, the multiple test pins 20 can be disassembled only by disassembling the fixing member, and the efficiency of installation and disassembly is greatly improved.

In this embodiment, as shown in FIG. 1 b , the fixing plate 30 is located on the upward side of the test fixture 10 . When the fixing plate 30 and the test fixture 10 are fixed, the fixing plate 30 is specifically pressed against the test needle 20 to Fix the test pins 20 on the test fixture 10, and at the same time, in this embodiment, as shown in 1a, the fixing board 30 fixes the four test pins 20 on the test fixture 10, so that when four RFSW devices are arranged on the circuit board , the test of four RFSW devices can be completed at one time, which avoids the phenomenon that the test is divided into two positions in the prior art. The number of 20 includes, but is not limited to, the four shown in FIG. 1a, and may also be more than four.

Wherein, in this embodiment, when the test pin 20 is fixed on the test fixture 10, one end of the test pin 20 needs to pass through the assembly hole 11 of the test fixture 10 to test the devices on the circuit board, and the other end of the test pin 20 needs to pass through the assembly hole 11 of the test fixture 10. One end needs to pass through the mounting hole 32 of the fixing plate 30 and be electrically connected to the radio frequency tester through the RF line. In this way, during the test, the structure obtained by the test pin 20 testing the devices on the circuit board is transmitted to the radio frequency tester, and the radio frequency tester is passed. Obtain test results for the device.

Therefore, the test device provided in this embodiment includes a plurality of test pins 20 and a test fixture 10, and the test fixture 10 is provided with a plurality of mounting holes 11 for assembling the plurality of test pins 20, and also includes a fixing plate 30, And the fixing plate 30 is provided with a plurality of mounting holes 32 through which one end of the test pin 20 can pass through and corresponding to the mounting hole 11 . The pins 20 can be simultaneously fixed on the test fixture 10 through the fixing plate 30. Since there is no flange between adjacent test pins 20, the interval between adjacent test pins 20 can be greatly reduced, so that the unit area of the test fixture 10 is reduced. The number of test pins 20 that can be installed is increased, and the installation density of test pins 20 on the test fixture 10 is increased, thereby avoiding the large gap between adjacent test pins 20 when flanges are used to fix test pins 20. 20. The problem of low mounting density on the test fixture 10, when the mounting density of the test pins 20 on the test fixture 10 increases, so that when there are many RFSW devices on the circuit board, the test device provided by the present application can be used for one test. The RFSW device on the circuit board is tested, which avoids the problem of sub-station testing, thereby greatly reducing the test cost. Moreover, when multiple test pins 20 are fixed by the fixing plate 30, the test pin 20 on the test fixture 10 is greatly improved. The installation and disassembly efficiency, therefore, the test device provided by the present application improves the installation density of the test pins 20 on the test fixture 10, reduces the test cost when the RFSW devices are distributed in high density on the circuit board, and improves the installation and efficiency of the test pins 20. The disassembly efficiency is improved, thereby solving the problem that the existing RF test needles 20 have a low installation density on the test fixture 10 and increase the test cost.

In this embodiment, one end of the test needle 20 is the connector 21 and the other end is the needle head 23. When the fixing plate 30 fixes the plurality of test needles 20 on the test fixture 10, specifically, the test needle 20 has a limit portion. 22a, the limiting portion 22a is specifically located between the connector 21 of the test pin 20 and the needle head 23, and the limiting portion 22a is used for cooperating with the fixing plate 30 to limit the test pin 20 (see Fig. The positioning portion 22a is used to cooperate with the mounting hole 11 to realize the limit of the test needle 20 (refer to Fig. 2b below for details), or, the limiting portion 22a is used to cooperate with the fixing plate 30 and the mounting hole 11 to realize the test. The limit of the needle 20 (as shown in Fig. 1b).

In this embodiment, as shown in FIG. 1d, the limiting portion 22a includes an upper limiting end face 221 and a lower limiting end face 222. The upper limiting end face 221 is used for cooperating with the fixing plate 30 to achieve position limit, and the lower limiting end face 222 is used for connecting with the assembly hole 11 or the test fixture 10 cooperate to realize the limit.

In this embodiment, when the limiting portion 22a and the mounting hole 11 are limited, specifically, as shown in FIG. 1c , the mounting hole 11 includes a first mounting hole 111 and a second mounting hole through which the needle 23 can pass outwards. hole 112, and the connection between the first assembly hole 111 and the second assembly hole 112 forms a step 12 for limiting the position of the lower limit end face 222, that is, a step 12 is formed on the inner wall of the assembly hole 11, and the step 12 is used for the test pin 20. The upper and lower limit end surfaces 222 are used to limit the position, and the fixing plate 30 is used to limit the upper limit end surface 221, so that a plurality of test pins 20 are fixed on the test fixture 10 through the fixing plate 30. During installation, the details are shown in FIG. 1b. , the needle head 23 of the test needle 20 passes through the second assembly hole 112 outwards, the lower limit end surface 222 abuts on the step 12 so that the test needle 20 cannot continue to move downward, and then the fixing plate 30 is pressed against the top surface of the test fixture 10 Since the width of the mounting hole 32 is smaller than the width of the limiting portion 22a, the edge of the mounting hole 32 on the fixing plate 30 limits the upper limit end face 221 to prevent the test needle 20 from moving upward, and finally the fixing plate 30 and the test fixture 10 After fixing, the plurality of test pins 20 are fixed on the test fixture 10 .

In this embodiment, as shown in FIG. 1c, the length L1 of the first assembly hole 111 is smaller than the length L2 of the second assembly hole 112, so that the step 12 formed between the first assembly hole 111 and the second assembly hole 112 is close to the assembly hole 11, in this embodiment, since the step 12 is close to the top of the assembly hole 11, in the manufacturing process, the second assembly hole 112 can be made first, and then the opening at the top of the second assembly hole 112 can be enlarged. That is, the step 12 can be formed on the inner wall of the mounting hole 11 , so that the step 12 can be easily formed on the inner wall of the mounting hole 11 .

Among them, in this embodiment, in order to achieve the purpose that the test needle 20 can adapt to the alignment tolerance of the test device during the test process, in this embodiment, after the test needle 20 is fixed on the test fixture 10, the test needle 20 is in During the test, there is a certain amount of floating. Specifically, as shown in Figure 1e, it also includes: a floating member 40. The floating member 40 is located between the fixing plate 30 and the upper limit end face 221, so that the floating member 40 makes the test pin 20 in the test fixture. After the 10 is fixed, it can be floated upward by a preset distance, so that during the test process, when the test needle 20 is subjected to an upward force, the test needle 20 will float upward for a certain distance, so that the test needle 20 can adapt to the alignment tolerance of the test device. In the embodiment, as shown in FIG. 1e, when the floating member 40 is installed, a space for the floating member 40 to be installed is reserved in the first assembly hole 111, that is, when the limiting portion 22a of the test pin 20 is installed in the first assembly hole 111. After the hole 111 is inserted, there is a certain space between the upper limit end surface 221 and the top surface of the test fixture 10, and the floating member 40 is installed in this space. Therefore, in this embodiment, the thickness of the limiter is smaller than that of the first assembly hole 111. , so that both the floating member 40 and the limiting member can be located in the first assembly hole 111 .

Wherein, in this embodiment, the floating member 40 can be specifically sleeved on the joint 21. When the fixing plate 30 is fixed, the floating member 40 is limited between the fixing plate 30 and the upper limit end face 221, and the test needle 20 is subjected to the upward action. When the force is applied, the test needle 20 moves upward, and the floating member 40 is compressed. When the external force is removed, the test needle 20 is driven to move downward by the elastic force of the floating member 40 itself. When the fixing plate 30 is fixed, the other end of the floating member 40 abuts on the back of the fixing plate 30. It should be noted that after the fixing plate 30 is fixed with the test fixture 10, it is necessary to ensure that the floating member 40 has a certain Elasticity, that is, the floating member 40 can also be compressed, which ensures that the test needle 20 can be floated upward for a certain interval subsequently.

Wherein, in this embodiment, the floating member 40 may be a spring, a sponge or a flexible member, for example, the floating member 40 is a spring, or the floating member 40 is a sponge, or a flexible member that can expand and contract the floating member 40, such as a floating member 40 may be a silica gel block.

In this embodiment, when the fixing plate 30 fixes the plurality of test pins 20 on the test fixture 10 , the fixing plate 30 needs to be fixed with the test fixture 10 . In this embodiment, the connection between the fixing plate 30 and the test fixture 10 It can be fixed by a snap connection or a fastener 31. As shown in FIG. 1e, the fixing plate 30 and the test fixture 10 are fixed by a fastener 31. The fastener 31 can be a screw. The fixing plate 30 and the test fixture 10 are fixed together, wherein the purpose of fixing the plurality of test pins 20 on the test fixture 10 is achieved during the fixing process of the fixing plate 30, or in this embodiment, the fixing plate 30 may be provided with a card. The test fixture 10 is provided with a buckle position that is engaged with the engaging piece. In this way, when fixing, the fixing plate 30 can be directly engaged with the test fixture 10. When disassembling, the engaging piece on the fixing plate 30 is removed from the test fixture Pull out from the fixture 10, so that the test needle 20 can be taken out from the assembly hole 11. It should be noted that, in this embodiment, the connection between the fixing plate 30 and the test fixture 10 includes but is not limited to the above two fixing methods, the fixing plate The 30 and the test fixture 10 can also be fixed by other detachable and washable methods. For example, the fixing plate 30 and the test fixture 10 can be locked together by a locking member, and the locking member can be unlocked to complete the removal during disassembly.

Embodiment 2

FIG. 2 a is a schematic cross-sectional structure diagram of a test fixture in the test device provided in the second embodiment of the present application, and FIG. 2 b is a cross-sectional structure schematic diagram of the test device provided in the second embodiment of the present application.

The difference between this embodiment and the above-mentioned embodiment is: in this embodiment, as shown in FIGS. 2a-2b, the assembly hole 11 is a straight hole through which the needle 23 can pass, that is, in this embodiment, the inner wall of the assembly hole 11 is on the inner wall of the assembly hole 11. There is no step 12, the inner wall of the assembly hole 11 is a straight cylindrical inner wall, wherein the size of the assembly hole 11 matches the size of the needle 23, the size of the limit part 22a is larger than the size of the assembly hole 11, the limit part 22a and the assembly hole 11 Specifically, as shown in Fig. 2b, during installation, the needle 23 protrudes outward through the assembly hole 11, and the lower limit end face 222 of the limit portion 22a abuts against the outer edge of the top end of the assembly hole 11 (ie, the test. The top surface area of the fixture 10 connected to the inner wall of the assembly hole 11), the outer edge of the assembly hole 11 blocks the lower limit end face 222 of the limit part 22a, so that the test needle 20 cannot move downward, that is, this embodiment In this embodiment, the lower limit end surface 222 cooperates with the top surface of the test fixture 10 to limit the test pin 20. In this embodiment, the connector 21 passes through the mounting hole 32 on the fixing plate 30, and the fixing plate 30 is pressed against the upper limit end surface 221. The upper limit end face 221 of the limiting portion 22a is limited by the fixing plate 30. After the fixing plate 30 is fixed with the test fixture 10, the fixing plate 30 exerts a downward force on the upper limit end face 221 so that the test needle 20 is fixed and cannot be fixed. Move up and down, and finally the plurality of test pins 20 are fixed on the test fixture 10 under the fixing action of the fixing plate 30 . Therefore, in this embodiment, the upper limit end face 221 and the lower limit end face 222 of the limiting portion 22 a are respectively connected to the test fixture 10 . Cooperate with the fixing plate 30 to realize the limit of the test needle 20 .

Therefore, in this embodiment, the fixing plate 30 and the test fixture 10 cooperate with the limiting portion 22a on the test pin 20, so that the purpose of fixing the plurality of test pins 20 on the test fixture 10 by the fixing board 30 is realized, and the test pin 20 is improved. The installation density on the test fixture 10 facilitates the testing of the high-density layout of the test devices on the circuit board, avoids the problem of sub-station testing, and reduces the testing cost.

Among them, in this embodiment, in order to realize the alignment tolerance of the test needle 20 that can be adapted to the test device during the test process, in this embodiment, after the test needle 20 is fixed on the test fixture 10, the test needle 20 is in the test process. It has a certain amount of floating, specifically, as shown in FIG. 2 b , it also includes: a floating piece 40 , the floating piece 40 is located between the fixing plate 30 and the upper limit end surface 221 , so that the test pin 20 can float upward after being fixed on the test fixture 10 The preset distance, so that during the test process, when the test needle 20 is subjected to an upward force, the test needle 20 floats upward for a certain distance, so that the test needle 20 can adapt to the alignment tolerance of the test device. In this embodiment, as shown in Figure 2b As shown, since the limiting portion 22 a is located outside the mounting hole 11 , the floating member 40 is also located in the mounting hole 11 and between the fixing plate 30 and the upper limiting end surface 221 .

Wherein, in this embodiment, the floating member 40 can be specifically sleeved on the joint 21. When the fixing plate 30 is fixed, the floating member 40 is limited between the fixing plate 30 and the upper limit end face 221, and the test needle 20 is subjected to the upward action. When the force is applied, the test needle 20 moves upward, and the floating member 40 is compressed. When the external force is removed, the test needle 20 is driven to move downward by the elastic force of the floating member 40 itself. When the fixing plate 30 is fixed, the other end of the floating member 40 abuts on the back of the fixing plate 30. It should be noted that after the fixing plate 30 is fixed with the test fixture 10, it is necessary to ensure that the floating member 40 has a certain Elasticity, that is, the floating member 40 can also be compressed, which ensures that the test needle 20 can be floated upward for a certain interval subsequently.

Wherein, in this embodiment, the floating member 40 may be a spring, a sponge or a flexible member, for example, the floating member 40 is a spring, or the floating member 40 is a sponge, or a flexible member that can expand and contract the floating member 40, such as a floating member 40 can be quick for silicone.

Embodiment 3

3a is a schematic structural diagram of a test needle in a test device provided in Embodiment 3 of the present application, FIG. 3b is a cross-sectional structural schematic diagram of a test fixture in a test device provided in Embodiment 3 of the present application, and FIG. 3c is a test provided by Embodiment 3 of the present application. A schematic cross-sectional structure diagram of the device, FIG. 3d is another cross-sectional structure schematic diagram of the testing device provided in the third embodiment of the present application.

The difference between this embodiment and the above-mentioned embodiment is: in this embodiment, as shown in FIGS. 3a-3d , the test needle 20 includes a needle body 22 , needle heads 23 located at both ends of the needle body 22 , and connectors that can pass through the mounting holes 32 . 21, that is, in this embodiment, the connector 21 can pass through the mounting hole 32 of the fixing plate 30, and a lower limit end face 222 is formed between the needle 23 and one end of the needle body 22, and the other end of the connector 21 and the needle body 22 is formed. The upper limit end face 221 is formed between them, that is, in this embodiment, the needle body 22 can be used as the limit part 22a, so the width of the needle body 22 is larger than that of the connector 21 and the needle head 23, forming a test needle 20 with small ends and a thick middle, wherein, The upper limit end face 221 is used for cooperating with the fixing plate 30 to realize the position limit, and the lower limit end face 222 is used to limit the position with the step 12 in the assembly hole 11 . Specifically, as shown in FIG. 3d , the first assembly hole in the assembly hole 11 A step 12 is formed between 111 and the second assembly hole 112. During installation, as shown in FIG. 3c, the test needle 20 is first assembled into the assembly hole 11, wherein the needle 23 protrudes from the second assembly hole 112, and the lower limit The end surface 222 abuts against the step 12 and cannot move downward. The entire needle body 22 is located in the first assembly hole 111 , the upper limit end surface 221 is not lower than the top surface of the test fixture 10 , and the fixing plate 30 limits the upper limit end surface 221 , after the fixing plate 30 is fixed, the plurality of test pins 20 are fixed on the test fixture 10 .

Therefore, in this embodiment, the fixing plate 30 and the steps 12 in the mounting holes 11 on the test fixture 10 cooperate with the upper and lower limit end faces 222 of the test pins 20, so that 30 pieces of the fixing board and multiple test pins 20 are fixed on the test fixture. The purpose of 10 is to improve the installation density of the test pins 20 on the test fixture 10, thereby facilitating the testing of the high-density layout of the test devices on the circuit board, avoiding the problem of sub-station testing, and reducing the testing cost.

Wherein, in this embodiment, as shown in FIG. 3b, the length of the first assembly hole 111 is greater than the length of the second assembly hole 112, and the step 12 formed in this way is close to the bottom end of the assembly hole 11, so that the length of the needle body 22 can be reduced. It is set longer, and the width of the needle body 22 is larger than that of the connector 21 and the needle head 23, so that the entire structure of the test needle 20 formed in this way has greater strength and is not easy to bend when the external force is large.

Wherein, in this embodiment, as shown in FIG. 3d , it further includes: a floating member 40 , the floating member 40 is located between the fixing plate 30 and the upper limit end surface 221 , so that the test pin 20 is fixed on the test fixture 10 by the floating member 40 Afterwards, it can be floated upward by a preset distance. In this way, during the test process, when the test needle 20 is subjected to an upward force, the test needle 20 floats upward for a certain distance, so that the test needle 20 can adapt to the alignment tolerance of the test device. In this embodiment 3d, when the floating member 40 is installed, a space for the installation of the floating member 40 is reserved in the first assembly hole 111, that is, when the limiting portion 22a of the test pin 20 is installed in the first assembly hole 111 Then, there is a certain space between the upper limit end surface 221 and the top surface of the test fixture 10, and the floating member 40 is installed in this space. Therefore, in this embodiment, the length of the needle body 22 is smaller than the length of the first assembly hole 111, In this way, both the floating member 40 and the needle body 22 can be located in the first assembling hole 111 .

Wherein, in this embodiment, the floating member 40 can be specifically sleeved on the joint 21. When the fixing plate 30 is fixed, the floating member 40 is limited between the fixing plate 30 and the upper limit end face 221, and the test needle 20 is subjected to the upward action. When the force is applied, the test needle 20 moves upward, and the floating member 40 is compressed. When the external force is removed, the test needle 20 is driven to move downward by the elastic force of the floating member 40 itself. When the fixing plate 30 is fixed, the other end of the floating member 40 abuts on the back of the fixing plate 30. It should be noted that after the fixing plate 30 is fixed with the test fixture 10, it is necessary to ensure that the floating member 40 has a certain Elasticity, that is, the floating member 40 can also be compressed, which ensures that the test needle 20 can be floated upward for a certain interval subsequently.

Wherein, in this embodiment, the floating member 40 may be a spring, a sponge or a flexible member, for example, the floating member 40 is a spring, or the floating member 40 is a sponge, or a flexible member that can expand and contract the floating member 40, such as a floating member 40 can be quick for silicone.

Embodiment 4

4b is a schematic cross-sectional structure diagram of the test device provided in the fourth embodiment of the present application, and the lower fixing plate is installed on the test fixture, FIG. 4c is a cross-sectional structure schematic diagram of the test device provided by the fourth embodiment of the present application, and FIG. 4d is an embodiment of the present application. 4. Still another cross-sectional structure diagram of the test device provided.

The difference between this embodiment and the above-mentioned embodiment is: in this embodiment, as shown in FIG. 4a, the assembly hole 11 is a straight hole through which the needle body 22 can pass, that is, in this embodiment, no steps are formed in the assembly hole 11 12. The assembly hole 11 needs to allow the needle body 22 to pass through. In order to fix the test needle 20 on the test fixture 10, specifically, as shown in FIG. 4c, the fixing plate 30 includes an upper fixing plate 301 and a lower fixing plate 302, wherein , the upper fixing plate 301 and the lower fixing plate 302 are located on the top surface and the bottom surface of the test fixture 10 respectively, and the upper fixing plate 301 and the lower fixing plate 302 are respectively connected with the upper limit end surface 221 and the lower limit end surface 222 and the limit to connect the test pin 20 Both ends are fixed on the test fixture 10 , that is, in this embodiment, the lower limit end surface 222 is also used for cooperating with the lower fixing plate 302 to realize the limit. Wherein, in this embodiment, the upper fixing plate 301 and the lower fixing plate 302 are both provided with installation holes 32 , wherein the installation holes 32 on the upper fixing plate 301 can be used for the connectors 21 to pass through, that is, the installation holes on the upper fixing plate 301 The hole diameter of 32 is greater than or equal to the outer diameter of the joint 21, and the mounting hole 32 on the lower fixing plate 302 can allow the needle head 23 to pass through, that is, the hole diameter of the mounting hole 32 on the lower fixing plate 302 is greater than or equal to the outer diameter of the needle head 23. The upper limit end face 221 and the lower limit end face 222 are limited. In this embodiment, the mounting holes 32 on the upper fixing plate 301 and the lower fixing plate 302 are both smaller than the mounting holes 11. When installing in this way, as shown in Figure 4b, firstly The lower fixing plate 302 is fixed on the bottom surface of the test fixture 10. Since the mounting hole 32 on the lower fixing plate 302 is smaller than the mounting hole 11, a lower limit is formed between the mounting hole 32 of the lower fixing plate 302 and the bottom end of the mounting hole 11. The lower step 321 is limited by the end face 222, and then the test needle 20 is assembled into the assembly, wherein the needle body 22 is located in the assembly hole 11, the lower limit end face 222 abuts against the lower step 321 and cannot move downward, and then the upper fixing plate 301 is fixed on the top surface of the test fixture 10. As shown in FIG. 4c, the upper fixing plate 301 limits the upper limit end surface 221. After the upper fixing plate 301 is fixed with the test fixture 10, a plurality of test pins 20 are fixed on the test fixture. 10 on.

Therefore, in this embodiment, the two fixing plates 30 are used to fix the two ends of the plurality of test pins 20 respectively, so that the plurality of test pins 20 are fixed on the test fixture 10 , thus avoiding the mounting holes 11 of the test fixture 10 . Steps 12 are formed inside, so that the setting of the mounting holes 11 on the test fixture 10 is more convenient.

Wherein, in this embodiment, as shown in FIG. 4d , it further includes: a floating member 40 , the floating member 40 is located between the upper fixing plate 301 and the upper limit end surface 221 , so that the test needle 20 is placed on the test fixture 10 by the floating member 40 . After being fixed, it can be floated upward by a preset distance, so that during the test process, when the test needle 20 is subjected to an upward force, the test needle 20 can float upward for a certain distance, so that the test needle 20 can adapt to the alignment tolerance of the test device. This embodiment 4d, when the floating member 40 is installed, a space for the floating member 40 to be installed is reserved in the first assembly hole 111, that is, when the limiting portion 22a of the test pin 20 is installed in the first assembly hole 111 There is a certain space between the upper end surface 221 and the top surface of the test fixture 10, and the floating member 40 is installed in this space. Therefore, in this embodiment, the length of the needle body 22 is smaller than the length of the first assembly hole 111. , so that both the floating member 40 and the needle body 22 can be located in the first assembly hole 111. It should be noted that in this embodiment, the floating member 40 can also be located outside the first assembly hole 111, that is, when the needle body 22 is in the first assembly hole 111. When the length is the same as that of the mounting hole 11 , the floating piece 40 cannot be installed in the first mounting hole 111 , and the floating piece 40 can be located outside the first mounting hole 111 and in the gap between the upper fixing plate 301 and the upper limit end surface 221 middle.

Wherein, in this embodiment, the installation method and material of the floating member 40 may refer to the above-mentioned embodiment for details, which will not be repeated in this embodiment.

Embodiment 5

This embodiment provides an installation structure for a test needle. During testing, the test needle is installed on the installation structure for testing. Specifically, FIGS. 1a and 1b are schematic diagrams of the test needle being installed on the installation structure. The installation structure specifically includes a test fixture. 10. The test fixture 10 is provided with a plurality of assembly holes 11 for assembling a plurality of test pins 20, wherein each assembly hole 11 is correspondingly assembled with a test pin 20. Moreover, in this embodiment, in order to increase the test pin 20 in The installation density on the test fixture 10, specifically, the installation structure further includes: a fixing plate 30, and the fixing plate 30 is provided with a plurality of installation holes 32 through which one end of the test needle 20 can pass and corresponding to the assembly hole 11, that is, the present embodiment In the example, as shown in Fig. 1f, a plurality of mounting holes 32 are opened on the fixing plate 30, the mounting holes 32 correspond to the mounting holes 11, and one end of the test pin 20 can pass through the mounting holes 32. The test pins 20 are assembled into the mounting holes 11 respectively, then each mounting hole 32 on the fixing plate 30 is aligned with one end of the plurality of test pins 20 and inserted, and finally the fixing plate 30 and the test fixture 10 are fixed. After the fixing plate 30 is fixed to the test fixture 10 , the plurality of test pins 20 are fixed on the test fixture 10 .

In this embodiment, the fixing plate 30 is provided with mounting holes 32 corresponding to the test pins 20 , so as to realize the purpose of simultaneously fixing a plurality of test pins 20 , which is different from each test pin 20 in the prior art. Compared with fixing with one flange, in this embodiment, multiple test pins 20 can be fixed at the same time through the fixing plate 30 . In this way, since there is no flange between adjacent test pins 20, the interval between test pins 20 is limited. It can be greatly reduced, so that the number of test pins 20 that can be installed per unit area of the test fixture 10 is increased, and the installation density of the test pins 20 on the test fixture 10 is increased, so that when 5G arrives, the RFSW devices on the circuit board are arranged in high density. At the same time, the test device provided in this embodiment can complete the test on the RFSW device on the circuit board at one time, which avoids the problem of sub-station testing, thereby greatly reducing the test cost. Therefore, the test device provided in this embodiment improves the test needle. The mounting density of 20 on the test fixture 10 can meet the test requirements of high-density layout of RFSW devices on the circuit board.

At the same time, in this embodiment, a plurality of test pins 20 can be fixed on the test fixture 10 at one time through the fixing plate 30 , while in the prior art, each test pin 20 needs a flange for fixing, so that the test fixture 10 is installed on the test fixture 10 When there are multiple test pins 20, the required installation time is longer. Correspondingly, when removing the test pin 20, the flange of each test pin 20 needs to be disassembled, and the disassembly time is long. Multiple test pins 20 can be fixed at the same time. When disassembling, the multiple test pins 20 can be disassembled only by disassembling the fixing member, and the efficiency of installation and disassembly is greatly improved.

In this embodiment, as shown in FIG. 1 b , the fixing plate 30 is located on the upward side of the test fixture 10 . When the fixing plate 30 and the test fixture 10 are fixed, the fixing plate 30 is specifically pressed against the test needle 20 to Fix the test pins 20 on the test fixture 10, and at the same time, in this embodiment, as shown in 1a, the fixing board 30 fixes the four test pins 20 on the test fixture 10, so that when four RFSW devices are arranged on the circuit board , the test of four RFSW devices can be completed at one time, which avoids the phenomenon that the test is divided into two positions in the prior art. The number of 20 includes, but is not limited to, the four shown in FIG. 1a, and may also be more than four.

Wherein, in this embodiment, when the test pin 20 is fixed on the test fixture 10, one end of the test pin 20 needs to pass through the assembly hole 11 of the test fixture 10 to test the devices on the circuit board, and the other end of the test pin 20 needs to pass through the assembly hole 11 of the test fixture 10. One end needs to pass through the mounting hole 32 of the fixing plate 30 and be electrically connected to the radio frequency tester through the RF line. In this way, during the test, the structure obtained by the test pin 20 testing the devices on the circuit board is transmitted to the radio frequency tester, and the radio frequency tester is passed. Obtain test results for the device.

Therefore, the mounting structure of the test needle provided in this embodiment further includes a fixing plate 30, and the fixing plate 30 is provided with a plurality of mounting holes 32 through which one end of the test needle 20 can pass and corresponding to the mounting hole 11. 30 is used to fix a plurality of test pins 20 on the test fixture 10, so that the plurality of test pins 20 can be simultaneously fixed on the test fixture 10 through the fixing plate 30. Since there is no flange between adjacent test pins 20, the adjacent test pins 20 are adjacent to each other. The interval between the test pins 20 can be greatly reduced, so that the number of test pins 20 that can be installed in a unit area of the test fixture 10 is increased, and the installation density of the test pins 20 on the test fixture 10 is increased, thereby avoiding the use of flange fixing. When testing the pins 20, the interval between adjacent test pins 20 is relatively large, which causes the problem that the installation density of the test pins 20 on the test fixture 10 is small. When the installation density of the test pins 20 on the test fixture 10 increases, so When there are many RFSW devices on the circuit board, the test device provided by the present application can complete the test on the RFSW devices on the circuit board at one time, thus avoiding the problem of sub-station testing, thereby greatly reducing the test cost, and the multiple test pins 20 When the fixing plate 30 is used for fixing, the installation and removal efficiency of the test pins 20 on the test fixture 10 is greatly improved. Therefore, the installation structure of the test pins provided by the present application improves the installation density of the test pins 20 on the test fixture 10. The test cost is reduced when the RFSW devices are distributed in high density on the circuit board, and the installation and disassembly efficiency of the test pins 20 is improved, thereby solving the problem of increasing the test cost caused by the low installation density of the existing RF test pins 20 on the test fixture 10 .

In this embodiment, one end of the test needle 20 is the connector 21 and the other end is the needle head 23. When the fixing plate 30 fixes the plurality of test needles 20 on the test fixture 10, specifically, the test needle 20 has a limit portion. 22a, the limiting portion 22a is specifically located between the connector 21 of the test pin 20 and the needle head 23. In order to cooperate with the limiting portion 22a to realize the limiting of the test pin 20, in this embodiment, the assembly hole 11 is provided with the The step 12 matched with the limiting portion 22a, wherein, in this embodiment, the step 12 may specifically be a protrusion provided on the inner wall of the assembly hole 11, or in this embodiment, as shown in FIG. 1c, the assembly hole 11 includes a first The assembly hole 111 and the second assembly hole 112 through which the needle head 23 can pass outward, and a step 12 is formed at the connection between the first assembly hole 111 and the second assembly hole 112 , and the step 12 is used to adjust the lower limit of the test needle 20 The position end face 222 is used to limit the position, and the fixing plate 30 is used to limit the position of the upper position end face 221, so that the plurality of test pins 20 are fixed on the test fixture 10 through the fixing plate 30. During installation, as shown in FIG. The needle head 23 of 20 passes through the second assembly hole 112 outward, and the lower limit end surface 222 abuts on the step 12 so that the test needle 20 cannot continue to move downward, and then the fixing plate 30 is pressed against the top surface of the test fixture 10. The width of the mounting hole 32 is smaller than the width of the limiting portion 22a, so the edge of the mounting hole 32 on the fixing plate 30 limits the upper limit end face 221 to prevent the test needle 20 from moving upward. Finally, after the fixing plate 30 and the test fixture 10 are fixed, A plurality of test pins 20 are fixed on the test fixture 10 .

In this embodiment, as shown in FIG. 1c, the length L1 of the first assembly hole 111 is smaller than the length L2 of the second assembly hole 112, so that the step 12 formed between the first assembly hole 111 and the second assembly hole 112 is close to the assembly hole 11, in this embodiment, since the step 12 is close to the top of the assembly hole 11, in the manufacturing process, the second assembly hole 112 can be made first, and then the opening at the top of the second assembly hole 112 can be enlarged. That is, the step 12 can be formed on the inner wall of the mounting hole 11 , so that the step 12 can be easily formed on the inner wall of the mounting hole 11 .

Wherein, in this embodiment, as shown in FIG. 3b, the length of the first assembly hole 111 is greater than the length of the second assembly hole 112, and the step 12 formed in this way is close to the bottom end of the assembly hole 11, so that the length of the needle body 22 can be reduced. It is set longer, and the width of the needle body 22 is larger than that of the connector 21 and the needle head 23, so that the entire structure of the test needle 20 formed in this way has greater strength and is not easy to bend when the external force is large.

Among them, in this embodiment, in order to achieve the purpose that the test needle 20 can adapt to the alignment tolerance of the test device during the test process, in this embodiment, after the test needle 20 is fixed on the test fixture 10, the test needle 20 is in During the test, there is a certain amount of floating. Specifically, as shown in Figure 1e, it also includes: a floating member 40. The floating member 40 is located between the fixing plate 30 and the upper limit end face 221, so that the floating member 40 makes the test pin 20 in the test fixture. After the 10 is fixed, it can be floated upward by a preset distance, so that during the test process, when the test needle 20 is subjected to an upward force, the test needle 20 will float upward for a certain distance, so that the test needle 20 can adapt to the alignment tolerance of the test device. In the embodiment, as shown in FIG. 1e, when the floating member 40 is installed, a space for the floating member 40 to be installed is reserved in the first assembly hole 111, that is, when the limiting portion 22a of the test pin 20 is installed in the first assembly hole 111. After the hole 111 is inserted, there is a certain space between the upper limit end surface 221 and the top surface of the test fixture 10, and the floating member 40 is installed in this space. Therefore, in this embodiment, the thickness of the limiter is smaller than that of the first assembly hole 111. , so that both the floating member 40 and the limiting member can be located in the first assembly hole 111 .

Wherein, in this embodiment, the floating member 40 can be specifically sleeved on the joint 21. When the fixing plate 30 is fixed, the floating member 40 is limited between the fixing plate 30 and the upper limit end face 221, and the test needle 20 is subjected to the upward action. When the force is applied, the test needle 20 moves upward, and the floating member 40 is compressed. When the external force is removed, the test needle 20 is driven to move downward by the elastic force of the floating member 40 itself. When the fixing plate 30 is fixed, the other end of the floating member 40 abuts on the back of the fixing plate 30. It should be noted that after the fixing plate 30 is fixed with the test fixture 10, it is necessary to ensure that the floating member 40 has a certain Elasticity, that is, the floating member 40 can also be compressed, which ensures that the test needle 20 can be floated upward for a certain interval subsequently.

Wherein, in this embodiment, the floating member 40 may be a spring, a sponge or a flexible member, for example, the floating member 40 is a spring, or the floating member 40 is a sponge, or a flexible member that can expand and contract the floating member 40, such as a floating member 40 can be quick for silicone.

In this embodiment, when the fixing plate 30 fixes the plurality of test pins 20 on the test fixture 10 , the fixing plate 30 needs to be fixed with the test fixture 10 . In this embodiment, the connection between the fixing plate 30 and the test fixture 10 It can be fixed by a snap connection or a fastener 31. As shown in FIG. 1e, the fixing plate 30 and the test fixture 10 are fixed by a fastener 31. The fastener 31 can be a screw. The fixing plate 30 and the test fixture 10 are fixed together, wherein the purpose of fixing the plurality of test pins 20 on the test fixture 10 is achieved during the fixing process of the fixing plate 30, or in this embodiment, the fixing plate 30 may be provided with a card. The test fixture 10 is provided with a buckle position that is engaged with the engaging piece. In this way, when fixing, the fixing plate 30 can be directly engaged with the test fixture 10. When disassembling, the engaging piece on the fixing plate 30 is removed from the test fixture Pull out from the fixture 10, so that the test needle 20 can be taken out from the assembly hole 11. It should be noted that, in this embodiment, the connection between the fixing plate 30 and the test fixture 10 includes but is not limited to the above two fixing methods, the fixing plate The 30 and the test fixture 10 can also be fixed by other detachable and washable methods. For example, the fixing plate 30 and the test fixture 10 can be locked together by a locking member, and the locking member can be unlocked to complete the removal during disassembly.

As shown in Figures 2a-2b, the assembly hole 11 is a straight hole through which the needle 23 can pass, that is, in this embodiment, there is no step 12 on the inner wall of the assembly hole 11, and the inner wall of the assembly hole 11 is a straight cylindrical inner wall, wherein, The size of the assembly hole 11 matches the size of the needle 23, the size of the limiter 22a is larger than the size of the assembly hole 11, and the limit method between the limiter 22a and the assembly hole 11 is shown in Figure 2b. The needle head 23 protrudes outward through the assembly hole 11 , the lower limit end surface 222 of the limiting portion 22a is clamped against the outer edge of the top end of the assembly hole 11 , and the outer edge of the assembly hole 11 touches the lower limit end surface 222 of the limiting portion 22a. When the test pin 20 cannot move downward, the connector 21 passes through the mounting hole 32 on the fixing plate 30, the fixing plate 30 is pressed on the upper limit end surface 221, and the fixing plate 30 is opposite to the upper limit end surface 221 of the limit part 22a. After the fixing plate 30 and the test fixture 10 are fixed, the fixing plate 30 exerts a downward force on the upper limit end face 221 so that the test needles 20 are fixed and cannot move up and down, and finally a plurality of test needles 20 are fixed on the fixing plate 30 Therefore, in this embodiment, the upper limit end face 221 and the lower limit end face 222 of the limiting portion 22a cooperate with the test jig 10 and the fixing plate 30 to limit the position of the test needle 20 respectively.

In this embodiment, as shown in FIG. 4a , the assembly hole 11 is a straight hole through which the needle body 22 can pass. That is, in this embodiment, the step 12 is not formed in the assembly hole 11 , and the assembly hole 11 needs to be used for the needle body 22 Through, in order to fix the test pin 20 on the test fixture 10, specifically, as shown in FIG. 4c, the fixing board 30 includes an upper fixing board 301 and a lower fixing board 302, wherein the upper fixing board 301 and the lower fixing board 302 are respectively Located on the top and bottom surfaces of the test fixture 10, the upper fixing plate 301 and the lower fixing plate 302 are respectively limited to the lower limit end surface 222 and the upper limit end surface 221 to fix both ends of the test needle 20 on the test fixture 10, wherein the present In the embodiment, both the upper fixing plate 301 and the lower fixing plate 302 are provided with mounting holes 32 , wherein the mounting holes 32 on the upper fixing The hole diameter is greater than or equal to the outer diameter of the joint 21, and the mounting hole 32 on the lower fixing plate 302 can allow the needle 23 to pass through, that is, the hole diameter of the mounting hole 32 on the lower fixing plate 302 is greater than or equal to the outer diameter of the needle 23. The positioning end surface 221 and the lower limiting end surface 222 are limited. In this embodiment, the size of the mounting holes 32 on the upper fixing plate 301 and the lower fixing plate 302 is smaller than the size of the mounting hole 11 . For example, the diameter of the mounting hole 32 is smaller than that of the mounting hole 11 . When installing in this way, as shown in Figure 4b, firstly fix the lower fixing plate 302 on the bottom surface of the test fixture 10. Since the mounting holes 32 on the lower fixing plate 302 are smaller than the mounting holes 11, the mounting holes of the lower fixing plate 302 A lower step 321 is formed between 32 and the bottom end of the assembly hole 11 to limit the position of the lower limit end surface 222, and then the test needle 20 is assembled into the assembly, wherein the needle body 22 is located in the assembly hole 11, and the lower limit end surface 222 is pressed against the bottom. The step 321 cannot move downward, and then the upper fixing plate 301 is fixed on the top surface of the test fixture 10. As shown in FIG. 4c, the upper fixing plate 301 limits the upper limit end face 221, and the upper fixing plate 301 and the test fixture After fixing 10 , the plurality of test pins 20 are fixed on the test fixture 10 .

Therefore, in this embodiment, the two fixing plates 30 are used to fix the two ends of the plurality of test pins 20 respectively, so that the plurality of test pins 20 are fixed on the test fixture 10 , thus avoiding the mounting holes 11 of the test fixture 10 . Steps 12 are formed inside, so that the setting of the mounting holes 11 on the test fixture 10 is more convenient.

Embodiment 6

This embodiment provides a test needle. The structure of the test needle can be referred to as shown in FIG. 1d. During the test, the test needle is installed in the above-mentioned installation structure. Among them, the test pin 20 is provided with a limit portion 22a, which is used to cooperate with the fixing plate 30 to realize the limit of the test pin 20 (see Fig. 4c below for details), or the limit portion 22a is used for assembling with The hole 11 cooperates with the test pin 20 to limit the position (see Fig. 2b below for details), or the limit portion 22a is used to cooperate with the fixing plate 30 and the mounting hole 11 to realize the limit of the test pin 20 (eg 1b), so that the fixing plate 30 fixes the plurality of test pins 20 on the test fixture 10, that is, the test pins 20 provided in this embodiment, through the fixing plate 30 in the installation structure, the test pins 20 are fixed on the test fixture 10. increased installation density.

In the test needle provided by the present application, the test needle 20 is provided with a limit portion 22a, and the limit portion is used to cooperate with the fixing plate 30 in the installation structure and/or the assembly hole on the test fixture 10 in the installation structure, so that the The fixing plate 30 fixes a plurality of test pins on the test fixture 10, so that the plurality of test pins can be fixed on the test fixture 10 through the fixing plate 30. Since there is no flange between adjacent test pins, the adjacent test pins are separated from each other. The interval between the test fixtures can be greatly reduced, so that the number of test pins that can be installed per unit area of the test fixture 10 is increased, and the installation density of test pins on the test fixture 10 is increased, thereby avoiding adjacent tests when the flange is used to fix the test pins. The gap between the pins is large, which causes the problem that the installation density of the test pins on the test fixture 10 is small. When the installation density of the test pins on the test fixture 10 increases, when there are many RFSW devices on the circuit board, the fixed The multiple test pins can complete the test of the RFSW device on the circuit board at one time, which avoids the problem of sub-station testing, thereby greatly reducing the test cost, and when multiple test pins are fixed by the fixing plate 30, the test is greatly improved. The installation and removal efficiency of the needle on the test fixture 10, therefore, the test needle provided by the present application achieves the purpose of high-density installation on the test fixture 10, reduces the test cost when the RFSW devices are distributed in high density on the circuit board, and improves the The installation and removal efficiency of the test pins solves the problem that the existing RF test pins are installed on the test fixture 10 due to the low installation density and increase the test cost.

In this embodiment, as shown in FIG. 1d, the limiting portion 22a includes an upper limiting end face 221 and a lower limiting end face 222, the upper limiting end face 221 is used for cooperating with the fixing plate 30 to realize the position limit, and the lower limiting end face 222 is used for connecting with the test fixture The step 12 in the mounting hole 11 on the 10 or the test fixture 10 cooperates to realize the limit.

As shown in FIG. 3 a , the test needle 20 includes a needle body 22 , needle heads 23 located at both ends of the needle body 22 , and a connector 21 that can pass through the mounting hole 32 , that is, in this embodiment, the connector 21 can pass through the mounting hole of the fixing plate 30 . 32, and a lower limit end face 222 is formed between the needle 23 and one end of the needle body 22, and an upper limit end face 221 is formed between the joint 21 and the other end of the needle body 22, that is, in this embodiment, the needle body 22 can be used as Limiting portion 22a, so the width of the needle body 22 is larger than that of the connector 21 and the needle head 23, forming a test needle 20 with small ends and a thick middle, wherein the upper limit end face 221 is used to cooperate with the fixing plate 30 to realize the limit, and the lower limit end face 222 is used to cooperate with the step 12 in the assembly hole 11 to realize the limit. Specifically, as shown in FIG. 3d, a step 12 is formed between the first assembly hole 111 and the second assembly hole 112 in the assembly hole 11. During installation, As shown in FIG. 3c, the test needle 20 is first assembled into the assembly hole 11, wherein the needle head 23 protrudes out from the second assembly hole 112, and the lower limit end face 222 abuts on the step 12 and cannot move downward, and the entire needle body 22 is located in the first assembly hole 111 , the fixing plate 30 limits the upper limit end surface 221 , and after the fixing plate 30 is fixed, the plurality of test pins 20 are fixed on the test fixture 10 .

Alternatively, in this embodiment, as shown in FIG. 2 b , the lower limit end surface 222 abuts against the outer edge of the top end of the assembly hole 11 , that is, the lower limit end surface 222 cooperates with the top end of the test fixture 10 to realize the limit, and the top end of the assembly hole 11 is outside The edge blocks the lower limit end face 222 of the limit portion 22a, so that the test needle 20 cannot move downward, the connector 21 passes through the mounting hole 32 on the fixing plate 30, the fixing plate 30 is pressed on the upper limit end face 221, and is fixed. The plate 30 limits the upper limit end face 221 of the limiting portion 22a. After the fixing plate 30 is fixed with the test fixture 10, the fixing plate 30 exerts a downward force on the upper limit end face 221 so that the test needle 20 is fixed and cannot move up and down. Finally, the plurality of test pins 20 are fixed on the test fixture 10 under the fixing action of the fixing plate 30. Therefore, in this embodiment, the upper limit end face 221 and the lower limit end face 222 of the limiting portion 22a are respectively connected with the test fixture 10 and the fixing plate. 30 cooperates to realize the limit of the test needle 20 .

In this embodiment, other cooperation relationships between the test needle 20 , the fixing plate 30 and the test fixture 10 can be specifically described in the above-mentioned first and second embodiments, which will not be repeated in this embodiment.

In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it may be a fixed connection or an intermediate connection. The medium is indirectly connected, which can be the internal communication of two elements or the interaction relationship between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific situations.

In the description of this application, it should be understood that the terms "upper", "lower", "front", "rear", "vertical", "horizontal", "top", "bottom", "inner", The orientation or positional relationship indicated by "outside" is based on the orientation or positional relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, It is constructed and operated in a particular orientation and therefore should not be construed as a limitation of the present application. In the description of this application, "plurality" means two or more, unless it is precisely and specifically specified otherwise.

The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of this application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It is to be understood that the data so used may be interchanged under appropriate circumstances such that the embodiments of the application described herein can, for example, be practiced in sequences other than those illustrated or described herein. Furthermore, the terms "comprising" and "having" and any variations thereof, are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those expressly listed Rather, those steps or units may include other steps or units not expressly listed or inherent to these processes, methods, products or devices.

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions described in the foregoing embodiments can still be modified, or some or all of the technical features thereof can be equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the technical solutions of the embodiments of the present application. scope.

Claims (23)

1. a kind of test device, including multiple testing needles and test fixture, and opened up on the test fixture multiple for assembling The pilot hole of the multiple testing needle, which is characterized in that further include:

Fixed plate, and open up multiple one end for the testing needle in the fixed plate and pass through and corresponding with the pilot hole Mounting hole, the fixed plate are used to multiple testing needles being fixed on the test fixture.

2. test device according to claim 1, which is characterized in that have limiting section, the limit on the testing needle Portion is used to realize with fixed plate cooperation and is used to match with the pilot hole to the limit of the testing needle or the limiting section It closes and realizes to the limit of the testing needle or the limiting section for cooperating realization pair with the fixed plate and the pilot hole The limit of the testing needle.

3. test device according to claim 2, which is characterized in that the limiting section includes upper limit end face and lower limit End face, the upper limit end face, which is used to cooperate with the fixed plate, realizes limit, and the lower limit end face is used for and the assembly Hole cooperates realization limit with the test fixture.

4. test device according to claim 3, which is characterized in that the testing needle includes the needle body and is located at institute It states the syringe needle at needle body both ends and may pass through the connector of the mounting hole, and form institute between the syringe needle and one end of the needle body Lower limit end face is stated, forms the upper limit end face between the connector and the other end of the needle body.

5. test device according to claim 4, which is characterized in that the pilot hole is including the first pilot hole and for institute The second pilot hole that syringe needle is pierced by outward is stated, and the junction of first pilot hole and second pilot hole is formed to described The step of lower limit end face limit, the fixed plate is used to limit the upper limit end face, so that the multiple testing needle is logical The fixed plate is crossed to be fixed on the test fixture.

6. test device according to claim 5, which is characterized in that the length of first pilot hole is greater than described second The length of pilot hole, so that the step is formed close to the bottom end of the pilot hole, alternatively,

The length of first pilot hole is less than the length of second pilot hole, so that the step is close to the pilot hole Top is formed.

7. test device according to claim 4, which is characterized in that the pilot hole is for the needle body or described The straight hole that syringe needle passes through.

8. test device according to claim 7, which is characterized in that the pilot hole is straight to pass through for the syringe needle Hole, and the outer edge of the lower limit end face and the pilot hole offsets to realize and limit to the testing needle, the fixed plate Cooperate with the upper limit end face the multiple testing needle to be fixed on the test fixture.

9. test device according to claim 7, which is characterized in that the pilot hole is straight to pass through for the needle body Hole, and the fixed plate includes upper mounted plate and bottom plate, fixed plate and the bottom plate respectively with it is described under End face and upper limit end face limit are limited so that the both ends of the testing needle to be fixed on the test fixture.

10. according to any test device of claim 3-9, which is characterized in that further include: floating part, the floating part Between the fixed plate and the upper limit end face, so that can be upward after the testing needle is fixed on the test fixture Floating pre-determined distance.

11. test device according to claim 10, which is characterized in that the floating part is spring, sponge or flexible piece.

12. a kind of mounting structure of testing needle, including test fixture, opened up on test fixture multiple for assembling multiple testing needles Pilot hole, which is characterized in that further include:

Fixed plate, and the one end for opening up for the testing needle in the fixed plate passes through and corresponding with the pilot hole multiple Mounting hole, the fixed plate are used to multiple testing needles being fixed on the test fixture.

13. mounting structure according to claim 12, which is characterized in that be equipped in the pilot hole for the test The step that the limiting section being arranged on needle is limited.

14. mounting structure according to claim 13, which is characterized in that the pilot hole include the first pilot hole and for The second pilot hole that one end of the testing needle is pierced by outward, and the junction of first pilot hole and second pilot hole Form the step.

15. mounting structure according to claim 14, which is characterized in that the length of first pilot hole is greater than described the The length of two pilot holes, so that the step is formed close to the bottom end of the pilot hole, alternatively,

The length of first pilot hole is less than the length of second pilot hole, so that the step is close to the pilot hole Top is formed.

16. mounting structure according to claim 12, which is characterized in that the pilot hole is the needle for the testing needle The straight hole that head passes through, and the limiting section support on the testing needle is in the top outer edge of the pilot hole.

17. mounting structure according to claim 16, which is characterized in that the pilot hole is the needle for the testing needle The straight hole worn, and the fixed plate includes upper mounted plate and bottom plate, fixed plate and the bottom plate divide Do not cooperate with two limit end faces of the limiting section the both ends of the testing needle to be fixed on the test fixture.

18. any mounting structure of 2-17 according to claim 1, which is characterized in that further include: floating part, the floating Part is between the fixed plate and the limiting section of the testing needle, so that after the testing needle is fixed on the test fixture Can be floated pre-determined distance upwards.

19. mounting structure according to claim 18, which is characterized in that the floating part is spring, sponge or flexible piece.

20. any mounting structure of 2-19 according to claim 1, which is characterized in that the fixed plate by with the survey Examination fixture is connected together or fastener is fastenedly connected so that the multiple testing needle to be fixed on the test fixture.

21. a kind of testing needle, for being mounted on any mounting structure of the claims 12-20 to circuit board Device tested, which is characterized in that the testing needle be equipped with limiting section, the limiting section be used for and the mounting structure In fixed plate cooperation realize and the limit of the testing needle or the limiting section be used for and test clip in the mounting structure Pilot hole cooperation on tool, which is realized, is used for and the fixed plate and the dress limit of the testing needle or the limiting section The limit to the testing needle is realized in distribution cooperation, so that multiple testing needles are fixed on the test clip by the fixed plate On tool.

22. testing needle according to claim 21, which is characterized in that the limiting section includes upper limit end face and lower limit End face, the upper limit end face, which is used to cooperate with the fixed plate, realizes limit, and the lower limit end face is used for and the assembly The step that is arranged in hole cooperates with the test fixture and realizes limit.

23. testing needle according to claim 22, which is characterized in that the testing needle includes the needle body and is located at institute The syringe needle and connector at needle body both ends are stated, and forms the lower limit end face between the syringe needle and one end of the needle body, it is described The upper limit end face is formed between connector and the other end of the needle body.