CN109655872A - Fast measurement of radon device and method - Google Patents
Fast measurement of radon device and method Download PDFInfo
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- CN109655872A CN109655872A CN201910086442.5A CN201910086442A CN109655872A CN 109655872 A CN109655872 A CN 109655872A CN 201910086442 A CN201910086442 A CN 201910086442A CN 109655872 A CN109655872 A CN 109655872A
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- radon
- crystal layer
- scintillation crystal
- particle
- measuring chamber
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- 229910052704 radon Inorganic materials 0.000 title claims abstract description 103
- SYUHGPGVQRZVTB-UHFFFAOYSA-N radon atom Chemical compound [Rn] SYUHGPGVQRZVTB-UHFFFAOYSA-N 0.000 title claims abstract description 103
- 238000005259 measurement Methods 0.000 title claims abstract description 43
- 238000000034 method Methods 0.000 title claims abstract description 20
- 239000013078 crystal Substances 0.000 claims abstract description 55
- LBDSXVIYZYSRII-IGMARMGPSA-N alpha-particle Chemical compound [4He+2] LBDSXVIYZYSRII-IGMARMGPSA-N 0.000 claims abstract description 39
- 230000002093 peripheral effect Effects 0.000 claims abstract description 30
- 239000013307 optical fiber Substances 0.000 claims abstract description 24
- 239000002245 particle Substances 0.000 claims abstract description 12
- 238000001514 detection method Methods 0.000 claims abstract description 9
- 230000005686 electrostatic field Effects 0.000 claims abstract description 8
- 239000004020 conductor Substances 0.000 claims abstract description 7
- 230000009471 action Effects 0.000 claims abstract description 6
- 238000006243 chemical reaction Methods 0.000 claims abstract description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 19
- 229910052710 silicon Inorganic materials 0.000 claims description 19
- 239000010703 silicon Substances 0.000 claims description 19
- 239000000835 fiber Substances 0.000 claims description 10
- 238000012360 testing method Methods 0.000 claims description 6
- 239000011521 glass Substances 0.000 claims description 4
- 239000005083 Zinc sulfide Substances 0.000 claims description 3
- 238000005070 sampling Methods 0.000 claims description 3
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 claims description 3
- 230000000694 effects Effects 0.000 claims 1
- 230000005684 electric field Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000005855 radiation Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 4
- 230000005622 photoelectricity Effects 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000005253 gamme decay Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000000700 radioactive tracer Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/167—Measuring radioactive content of objects, e.g. contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
Fast measurement of radon device and method, it is related to nuclear radiation detection technical field, the measuring chamber of fast measurement of radon device includes shell and scintillation crystal layer, wavelength shift optical fiber is laid between shell and scintillation crystal layer, the front end of shell is equipped with air inlet, and the rear end of shell is equipped with exhaust outlet, axis made of a conductor is equipped in the inner cavity of measuring chamber, the negative high voltage of 1kv is applied more than on axis, so that222Rn decays the positively charged daughter of the first generation of generation in measuring chamber inner cavity218On the outer peripheral surface that Po is adsorbed to axis under the action of electrostatic field, simultaneously222Rn decay in measuring chamber inner cavity generation α particle hit scintillation crystal layer generate flash of light, wavelength shift optical fiber collects the flash of light that scintillation crystal layer generates, it is screened and is counted by electronics read-out system completion particle energy after photoelectric conversion, radon consistence is finally determined according to α particle counting and radon consistence relationship.The α particle generated the present invention is based on radon decay accurately measures radon consistence, realizes the rapid survey of radon consistence.
Description
Technical field
The present invention relates to nuclear radiation detection technical field, in particular to a kind of fast measurement of radon device and method.
Background technique
With the development of science and technology, the measurement method of radon and instrument are also improved and are improved continuous.Further investigate radon
Measuring principle and measurement method can in the fields such as Radon monitor and protection, tracer application new method and new industrial research mention
For theoretical basis and technological means, there is great scientific meaning and practical value.The monitoring of recent radon is to new field and water
Flat extension, proposes some new methods and develops corresponding new instrument, but come with some shortcomings, be left to be desired and change
Into the especially measurement to some variation radon consistences (when such as radon release rate), it is desirable to be able to the change of quick response radon consistence
Change.
The most basic foundation of radon measurement is to determine when α, β, gamma decay occurs by radon to dose of radiation contribution.Electrostatic at present
The variation of radon consistence can be responded quickly by collecting alpha energy spectrum method, and measuring principle is the generated by the decay of electrostatic collection radon
The positively charged daughter of a generation218The α particle that Po decay generates carrys out the radon consistence of the anti-amount of supposition, surveys as a kind of traditional radon consistence
Amount mode, measuring speed still need to be further increased.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of more existing electrostatic collection alpha energy spectrum methods of measuring speed to survey faster
Radon device.Based on above-mentioned survey radon device, the present invention also provides a kind of fast measurement of radon methods.
In order to solve the above-mentioned technical problem, the present invention uses following scheme: fast measurement of radon device, it is characterised in that: including
Measuring chamber, electronics read-out system and photomultiplier tube or silicon photoelectric multiplier；
The measuring chamber includes shell and the scintillation crystal layer positioned at case inside, in the shell and scintillation crystal layer
Between be laid with wavelength shift optical fiber, the front end of the shell is equipped with air inlet, and the rear end of the shell is equipped with exhaust outlet, it is described into
Port connects air inlet pipeline, and the exhaust outlet connects gas exhaust piping, and the air inlet pipeline is equipped with daughter filter, in the survey
Measure and be equipped with axis made of conductor in the inner cavity of room, the end of the wavelength shift optical fiber be connected to photomultiplier tube or
Silicon photoelectric multiplier, the photomultiplier tube or silicon photoelectric multiplier connect electronics read-out system, apply on the axis
The negative high voltage in 1kv is increased, so that222Rn decays the positively charged daughter of the first generation of generation in measuring chamber inner cavity218Po
On the outer peripheral surface for being adsorbed to axis under the action of electrostatic field, simultaneously222Rn decays the α particle of generation in measuring chamber inner cavity
It hits scintillation crystal layer and generates flash of light, the wavelength shift optical fiber collects the flash of light that scintillation crystal layer generates, passes through photomultiplier transit
Pipe or silicon photoelectric multiplier complete photoelectric conversion, then are screened and counted by electronics read-out system completion particle energy, obtain α
Particle counting finally determines radon consistence according to the relationship of α particle counting and radon consistence.
Wherein, the entire inner peripheral surface of the scintillation crystal layer covering shell, the axis outer peripheral surface is away from scintillation crystal layer
Distance is greater than 8.5cm.
Further, multiple diameters are additionally provided in the inner cavity of the measuring chamber, and equal cylindrical body, relative diameter be not larger
Cylindrical body cover outside the lesser cylindrical body of relative diameter, the axis is threaded through in the smallest cylindrical body of diameter, the cylinder
Shape body and axis are coaxially disposed, between the axis and diameter minimum cylindrical body, between two neighboring cylindrical body and diameter
Annular collection chamber is respectively formed between maximum cylindrical body and shell, the inlet end of each annular collection chamber is communicated with air inlet, often
The exhaust end of a annular collection chamber is communicated with exhaust outlet；
The cylindrical body includes ontology made of conductor and the scintillation crystal layer for covering the entire inner peripheral surface of ontology, described
Also wavelength shift optical fiber is laid between ontology and scintillation crystal layer, the end of all wavelengths shifted fiber is connected to photomultiplier transit
Pipe or silicon photoelectric multiplier, apply negative high voltage on all ontologies, so that222Rn declines in all annular collection chambers
Sell of one's property the positively charged daughter of the raw first generation218Po is adsorbed on the outer peripheral surface of ontology and axis under the action of electrostatic field, simultaneously222Decay in all annular collection chambers α particle of generation of Rn hits corresponding scintillation crystal layer and generates flash of light, by corresponding
Wavelength shift optical fiber collects the flash of light that scintillation crystal layer generates, then completes photoelectricity through photomultiplier tube or silicon photoelectric multiplier and turn
It changes, is then screened and counted by electronics read-out system completion particle energy, α particle counting is obtained, finally according to α particle counting
Radon consistence is determined with the relationship of radon consistence.
Wherein, the ring width of all annular collection chambers is all larger than 8.5cm.
Further, cylindrical shape egative film made of transparent organic glass, institute are equipped at the back side of all scintillation crystal layers
It states and is equipped with cylinder-shaped reflector plate on the outside of cylinder-shaped egative film, the cylindrical shape egative film is close to scintillation crystal layer, the circle
The inner peripheral surface of the corresponding ontology for being close to shell and cylindrical body of tubular reflector plate, the cylinder-shaped egative film outer peripheral surface and
The inner peripheral surface of cylinder-shaped reflector plate is equipped with fiber orientation slot, and the wavelength shift optical fiber is laid on cylinder-shaped egative film and cylinder
Between shape reflector plate and it is fixed in fiber orientation slot.
Wherein, the negative high voltage value applied on the axis is greater than the negative high voltage value applied on the smallest ontology of diameter；?
In two adjacent ontologies, the negative high voltage value applied on the ontology of inside is negative greater than what is applied on the ontology in outside
High-voltage value.
Preferably, the scintillation crystal layer is ag zinc sulphide layer.
As another aspect of the present invention, a kind of fast measurement of radon method detects radon consistence using above-mentioned fast measurement of radon device；
Enter air containing radon in measuring chamber inner cavity after daughter filter with certain flow rate by sampling pump, according to electricity
Son learns the α particle counting that read-out system obtains and calculates radon consistence in the following manner:
CR=K η V Δ NR(T) (1)；
CRFor test environment radon consistence, Δ NRIndicate the α total number of particles of radon decay, K is to survey radon calibration factor, and η indicates detection
Efficiency, V indicate measurement building volume；
The α particle that radon decay generates can't be all detected, the α population Δ N being detectedR(T0) '=η V Δ NR
(T0), (1) formula can turn to:
CR=K Δ NR(T)′ (2)；
In conjunction with above-mentioned formula (1) and (2) test environment can be calculated according to the α particle counting that electronics read-out system obtains
Radon consistence.
The present invention is based on alpha energy spectrum methods and static collection to survey radon, the fluorescent lifetime of scintillation crystal layer is short, luminous efficiency is high,
Detection efficient for heavy charged particle is almost 100%, much less responsive to gamma-rays, therefore can be used to measure α particle.With
The prior art is compared, and the present invention is improved in Principle and method of measurement, and it is empty containing radon to first pass through the filtering of daughter filter
Radon daughter in gas, then in measuring chamber by electrostatic field by radon decay generate positively charged daughter collect axis (and
Ontology) on outer peripheral surface, so that the α particle that only radon decay generates can be got on scintillation crystal layer and be detected, avoid son
Influence of the α particle that body decay generates to measurement result, which will not improve the background count of measurement, due to the present invention
It is the measurement that the α particle generated based on radon decay realizes radon consistence, measurement process time-consuming is shorter, can be realized faster survey
Amount.In addition, the present invention is by being arranged scintillation crystal layer in measurement chamber interior walls and being laid with wavelength shift light at the scintillation crystal layer back side
Fibre can so realize the inner wall for allowing searching surface to be paved with entire measuring chamber, so that statistic fluctuation is small, detectivity
It also can be higher.
Detailed description of the invention
Fig. 1 is the overall structure diagram of measuring chamber in embodiment 1；
Fig. 2 is the overall structure diagram of measuring chamber in embodiment 2；
Fig. 3 is the schematic diagram of internal structure of measuring chamber shown in Fig. 1；
Fig. 4 is the schematic diagram of internal structure of measuring chamber shown in Fig. 2；
Fig. 5 is the partial enlarged view at the position A in Fig. 3；
Fig. 6 is the partial enlarged view at the position A in Fig. 4；
Fig. 7 is the decay curve figure of radon and its short life daughter；
In figure:
1 --- measuring chamber 2 --- scintillation crystal layer 3 --- wavelength shift optical fiber
4 --- axis 5 --- cylinder-shaped egative film 6 --- cylinder-shaped reflector plates
7 --- cylindrical body 1a --- shell 1b --- air inlets
1c --- exhaust outlet 1d --- annular collection chamber 7a --- ontology.
Specific embodiment
The improvements of the present invention compared with the existing technology are more fully understood for the ease of those skilled in the art, are tied below
Closing drawings and examples, the invention will be further described.
It needs to illustrate in advance, it will be understood by those skilled in the art that " fast measurement of radon " of the present invention is more traditional quiet
Electric collecting formula is surveyed for radon mode, and the survey radon mode as involved by the present invention is shorter compared with conventional electrostatic collection type survey radon process time-consuming,
It can be realized radon consistence faster to measure, therefore claim " fast measurement of radon ", " fast measurement of radon " word is simultaneously asked there is no meaning is unclear
Topic, will not cause those skilled in the art to occur deviation in understanding.
Embodiment 1:
A kind of fast measurement of radon device, including measuring chamber 1, electronics read-out system and photomultiplier tube or silicon photoelectricity times
Increase device (electronics read-out system, photomultiplier tube and silicon photoelectric multiplier are the prior art, and structure is not shown in the accompanying drawings)；
The structure of measuring chamber 1 is as shown in Fig. 1,3,5 comprising shell 1a and the scintillation crystal layer 2 on the inside of shell 1a, in shell
Wavelength shift optical fiber 3 is laid between body 1a and scintillation crystal layer 2, the front end of shell 1a is equipped with air inlet 1b, the rear end of shell 1a
Equipped with exhaust outlet 1c, air inlet 1b connection air inlet pipeline, exhaust outlet 1c connection gas exhaust piping, air inlet pipeline is equipped with daughter filtering
Device (air inlet pipeline, gas exhaust piping and daughter filter are the prior art, and structure is not shown in the accompanying drawings), in measuring chamber 1
Axis 4 made of a conductor is equipped in inner cavity, the end of wavelength shift optical fiber 3 is connected to photomultiplier tube or silicon photoelectricity times
Increase device, photomultiplier tube or silicon photoelectric multiplier connect electronics read-out system, the negative height of 1kv are applied more than on axis 4
Pressure, so that222Rn decays the positively charged daughter of the first generation of generation in 1 inner cavity of measuring chamber218Effect of the Po in electrostatic field
Under be adsorbed on the outer peripheral surface of axis 4, simultaneously222Rn decay in 1 inner cavity of measuring chamber generation α particle hit scintillation crystal
Layer 2 generates flash of light, and wavelength shift optical fiber 3 collects the flash of light that scintillation crystal layer 2 generates, and passes through photomultiplier tube or silicon photoelectricity times
Increase device and complete photoelectric conversion, then screened and counted by electronics read-out system completion particle energy, obtains α particle counting, finally
Radon consistence is determined according to the relationship of α particle counting and radon consistence.
When practical application, to better ensure that detection efficient, detectivity and accuracy of measurement, in addition to allowing scintillation crystal
Layer 2 covers outside the entire inner peripheral surface of shell 1a, and distance of 4 outer peripheral surface of axis away from scintillation crystal layer 2 is more preferably greater than 8.5cm.Wherein,
Scintillation crystal layer 2 is preferably ag zinc sulphide layer.
Furthermore it is possible to which the cylindrical shape egative film 5 made of the back side of scintillation crystal layer 2 setting transparent organic glass, cylinder-shaped
Cylinder-shaped reflector plate 6 is arranged in the outside of egative film 5, and cylinder-shaped egative film 5 is close to scintillation crystal layer 2, and cylinder-shaped reflector plate 6 is tight
Shell 1a is touched, is equipped with fiber orientation slot on the outer peripheral surface of cylinder-shaped egative film 5 and the inner peripheral surface of cylinder-shaped reflector plate 6,
Wavelength shift optical fiber 3 is laid between cylinder-shaped egative film 5 and cylinder-shaped reflector plate 6 and is fixed in fiber orientation slot.
Above-mentioned fast measurement of radon device is based on alpha energy spectrum method and static collection and surveys radon, the fluorescent lifetime of scintillation crystal layer 2 is short,
Luminous efficiency height is almost 100% for the detection efficient of heavy charged particle, much less responsive to gamma-rays, therefore can be used to
Measure α particle.Compared with prior art, above-mentioned survey radon device is improved in Principle and method of measurement, first pass through into
The radon daughter in daughter filter filtering air containing radon on air pipe, is then decayed radon by electrostatic field in measuring chamber 1
The positively charged daughter generated is collected on 4 outer peripheral surface of axis, so that the α particle that only radon decay generates can get to scintillation crystal layer
It is detected on 2, avoids influence of the α particle of daughter disintegration generation to measurement result, which will not improve survey
The background count of amount.From figure 7 it can be seen that directly survey radon is faster than surveying daughter, due to above-mentioned for measuring radon consistence
Surveying radon device is the measurement that the α particle generated based on radon decay is directly realized by radon consistence, and measurement process time-consuming is shorter, so as to
It is enough to realize faster measurement.In addition, the present embodiment is by being arranged scintillation crystal layer 2 in 1 inner wall of measuring chamber and in scintillation crystal
2 back side of layer are laid with wavelength shift optical fiber 3, can so realize the inner wall for allowing searching surface to be paved with entire measuring chamber 1, make
Statistic fluctuation it is small, detectivity also can be higher.
Embodiment 2:
Compared with Example 1, the present embodiment mainly changes in the structure of measuring chamber 1, as shown in Fig. 2,4 and 6,
Multiple diameters not equal cylindrical body 7 is additionally provided in the inner cavity of measuring chamber 1,7 sets of the biggish cylindrical body of relative diameter is in relative diameter
Outside lesser cylindrical body 7, axis 4 is threaded through in the smallest cylindrical body 7 of diameter, and cylindrical body 7 and axis 4 are coaxially disposed, in
Between axis 4 and diameter minimum cylindrical body 7, between two neighboring cylindrical body 7 and between diameter maximum cylindrical body 7 and shell 1a
Annular collection chamber 1d is formed, the inlet end of each annular collection chamber 1d is communicated with air inlet 1b, each annular collection chamber 1d's
Exhaust end is communicated with exhaust outlet 1c.
Cylindrical body 7 includes ontology 7a made of conductor and the scintillation crystal layer 2 for covering the entire inner peripheral surface of ontology 7a, at this
Also wavelength shift optical fiber 3 is laid between body 7a and scintillation crystal layer 2, the end of wavelength shift optical fiber 3 is connected to photomultiplier transit
Pipe or silicon photoelectric multiplier, apply negative high voltage on all ontology 7a, so that222Rn is in all annular collection chamber 1d
The positively charged daughter of the first generation that interior decay generates218Po is adsorbed the outer peripheral surface of ontology 7a and axis 4 under the action of electrostatic field
On, simultaneously222Decay in all annular collection chamber 1d α particle of generation of Rn hits corresponding scintillation crystal layer 2 and generates flash of light,
The flash of light that scintillation crystal layer 2 generates is collected by corresponding wavelength shift optical fiber 3, then through photomultiplier tube or silicon photomultiplier transit
Device completes photoelectric conversion, is then screened and is counted by electronics read-out system completion particle energy, obtains α particle counting, finally
Radon consistence is determined according to the relationship of α particle counting and radon consistence.
When practical application, to better ensure that detection efficient, detectivity and accuracy of measurement, in addition to allowing scintillation crystal
Layer 2 covers outside the entire inner peripheral surface of shell 1a and ontology 7a, and the ring widthes of all annular collection chambers is more preferably greater than 8.5cm.
In addition, in the same manner as in Example 1, the present embodiment is equipped with transparent organic glass at the back side of all scintillation crystal layers 2
Manufactured cylindrical shape egative film 5, the outside of these cylinder-shaped egative films 5 also are provided with cylinder-shaped reflector plate 6, and cylinder-shaped egative film 5 is close to
Corresponding scintillation crystal layer 2, the cylinder-shaped reflector plate 6 being arranged in these cylindrical bodies 7 is close to the inner peripheral surface of ontology 7a, with
As embodiment 1, optical fiber also is provided on the outer peripheral surface of these cylinder-shaped egative films 5 and the inner peripheral surface of cylinder-shaped reflector plate 6
Locating slot, corresponding wavelength shift optical fiber 3 are laid between cylinder-shaped egative film 5 and cylinder-shaped reflector plate 6 and are fixed on light
In fine locating slot.In addition, the negative high voltage value applied on axis is greater than the negative high voltage value applied on the smallest ontology of diameter,
In two adjacent ontologies, the negative high voltage value applied on the ontology of inside is negative greater than what is applied on the ontology in outside
High-voltage value.
The method that fast measurement of radon device carries out fast measurement of radon shown in Examples 1 and 2 is described below:
First passing through sampling pump makes air containing radon enter survey after daughter filter with certain flow rate (such as Q=3L/min)
It measures in indoor chamber, the α particle counting obtained according to electronics read-out system simultaneously calculates radon consistence in the following manner:
CR=K η V Δ NR(T) (1)；
CRFor test environment radon consistence, Δ NRIndicate the α total number of particles of radon decay, K is to survey radon calibration factor, and η indicates detection
Efficiency, V indicate measurement building volume；
The α population Δ N that all can't be detected due to the α particle that radon decay generates, and be detectedR(T0) '=
ηVΔNR(T0), then (1) formula can turn to:
CR=K Δ NR(T)′ (2)；
In conjunction with above-mentioned formula (1) and (2) test environment can be calculated according to the α particle counting that electronics read-out system obtains
Radon consistence.
Above-described embodiment is the preferable implementation of the present invention, and in addition to this, the present invention can be realized with other way,
Do not depart from the technical program design under the premise of it is any obviously replace it is within the scope of the present invention.
In order to allow those of ordinary skill in the art more easily to understand the improvements of the present invention compared with the existing technology, this
Some attached drawings of invention and description have been simplified, and for the sake of clarity, present specification is omitted some other members
Element, the element that those of ordinary skill in the art should be aware that these are omitted also may make up the contents of the present invention.
Claims (8)
1. fast measurement of radon device, it is characterised in that: including measuring chamber, electronics read-out system and photomultiplier tube or silicon light
Electric multiplier；
The measuring chamber includes shell and the scintillation crystal layer positioned at case inside, between the shell and scintillation crystal layer
It is laid with wavelength shift optical fiber, the front end of the shell is equipped with air inlet, and the rear end of the shell is equipped with exhaust outlet, the air inlet
Air inlet pipeline is connected, the exhaust outlet connects gas exhaust piping, and the air inlet pipeline is equipped with daughter filter, in the measuring chamber
Inner cavity in be equipped with axis made of conductor, the end of the wavelength shift optical fiber is connected to photomultiplier tube or silicon light
Electric multiplier, the photomultiplier tube or silicon photoelectric multiplier connect electronics read-out system, apply on the axis big
In the negative high voltage of 1kv, so that222Rn decays the positively charged daughter of the first generation of generation in measuring chamber inner cavity218Po is quiet
It is adsorbed under the action of electric field on the outer peripheral surface of axis, simultaneously222Rn decay in measuring chamber inner cavity generation α particle hit
Scintillation crystal layer generates flash of light, and the wavelength shift optical fiber collects the flash of light that scintillation crystal layer generates, by photomultiplier tube or
Person's silicon photoelectric multiplier completes photoelectric conversion, then is screened and counted by electronics read-out system completion particle energy, obtains α particle
It counts, radon consistence is finally determined according to the relationship of α particle counting and radon consistence.
2. fast measurement of radon device according to claim 1, it is characterised in that: the scintillation crystal layer covers the entire of shell
Inner peripheral surface, the distance of the axis outer peripheral surface away from scintillation crystal layer are greater than 8.5cm.
3. fast measurement of radon device according to claim 2, it is characterised in that: be additionally provided in the inner cavity of the measuring chamber more
Equal cylindrical body, the biggish cylindrical body of relative diameter do not cover outside the lesser cylindrical body of relative diameter a diameter, the axis
It is threaded through in the smallest cylindrical body of diameter, the cylindrical body and axis are coaxially disposed, in the axis and diameter minimum cylindrical body
Between, annular collection chamber, each annular are respectively formed between two neighboring cylindrical body and between diameter maximum cylindrical body and shell
The inlet end of collecting chamber is communicated with air inlet, and the exhaust end of each annular collection chamber is communicated with exhaust outlet；
The cylindrical body includes ontology made of conductor and the scintillation crystal layer for covering the entire inner peripheral surface of ontology, in the ontology
Also be laid with wavelength shift optical fiber between scintillation crystal layer, the end of all wavelengths shifted fiber be connected to photomultiplier tube or
Person's silicon photoelectric multiplier, applies negative high voltage on all ontologies, so that222Rn decays production in all annular collection chambers
The positively charged daughter of the raw first generation218Po is adsorbed on the outer peripheral surface of ontology and axis under the action of electrostatic field, simultaneously222Rn exists
The α particle that decay generates in all annular collection chambers hits corresponding scintillation crystal layer and generates flash of light, passes through corresponding wavelength position
Shifting fiber collects the flash of light that scintillation crystal layer generates, then completes photoelectric conversion through photomultiplier tube or silicon photoelectric multiplier, so
It is screened and is counted by electronics read-out system completion particle energy afterwards, α particle counting is obtained, finally according to α particle counting and radon
The relationship of concentration determines radon consistence.
4. fast measurement of radon device according to claim 3, it is characterised in that: the ring width of all annular collection chambers is all larger than
8.5cm。
5. fast measurement of radon device according to claim 1 or 3, it is characterised in that: equal at the back side of all scintillation crystal layers
Equipped with cylindrical shape egative film made of transparent organic glass, cylinder-shaped reflector plate, institute are equipped on the outside of the cylindrical shape egative film
It states cylinder-shaped egative film and is close to scintillation crystal layer, the corresponding ontology for being close to shell and cylindrical body of cylindrical shape reflector plate
Inner peripheral surface is equipped with fiber orientation slot, institute on the outer peripheral surface of the cylinder-shaped egative film and the inner peripheral surface of cylinder-shaped reflector plate
Wavelength shift optical fiber is stated to be laid between cylinder-shaped egative film and cylinder-shaped reflector plate and be fixed in fiber orientation slot.
6. fast measurement of radon device according to claim 3, it is characterised in that: the negative high voltage value applied on the axis is greater than
The negative high voltage value applied on the smallest ontology of diameter；In two adjacent ontologies, what is applied on the ontology of inside is negative
High-voltage value is greater than the negative high voltage value applied on the ontology in outside.
7. fast measurement of radon device described in any one of -6 according to claim 1, it is characterised in that: the scintillation crystal layer is
Ag zinc sulphide layer.
8. fast measurement of radon method, it is characterised in that: detected using fast measurement of radon device described in any one of claim 1-7
Radon consistence；
Enter air containing radon in measuring chamber inner cavity after daughter filter with certain flow rate by sampling pump, according to electronics
α particle counting that read-out system obtains simultaneously calculates radon consistence in the following manner:
CR=K η V Δ NR(T) (1)；
CRFor test environment radon consistence, Δ NRIndicate the α total number of particles of radon decay, K is to survey radon calibration factor, and η indicates detection effect
Rate, V indicate measurement building volume；
The α particle that radon decay generates can't be all detected, the α population Δ N being detectedR(T0) '=η V Δ NR(T0),
(1) formula can turn to:
CR=K Δ NR(T)′ (2)；
It is dense test environment radon can be calculated according to the α particle counting that electronics read-out system obtains in conjunction with above-mentioned formula (1) and (2)
Degree.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910086442.5A CN109655872B (en) | 2019-01-29 | 2019-01-29 | Device and method for rapidly measuring radon |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910086442.5A CN109655872B (en) | 2019-01-29 | 2019-01-29 | Device and method for rapidly measuring radon |
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| CN109655872A true CN109655872A (en) | 2019-04-19 |
| CN109655872B CN109655872B (en) | 2020-05-26 |
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| CN201910086442.5A Expired - Fee Related CN109655872B (en) | 2019-01-29 | 2019-01-29 | Device and method for rapidly measuring radon |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115453603A (en) * | 2022-09-13 | 2022-12-09 | 中国科学院高能物理研究所 | A liquid scintillator radon measuring detector and radon concentration measuring method |
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| CN85107800A (en) * | 1985-10-23 | 1986-07-23 | 成都地质学院 | Radon and daughter detection device thereof and method of work in the earth |
| DE4200308A1 (en) * | 1992-01-09 | 1993-07-15 | Heinz Dr Rer Nat Gast | Measuring chamber for determining alpha activity of radon gas in carrier gas esp. air - has detector producing measurement signal for detecting alpha particles produced with radon conversion in chamber and unit for producing electric field. |
| WO2010070697A1 (en) * | 2008-12-19 | 2010-06-24 | Tommasino Pier Mattia | Four sampling-elements, termed quatrefoil, for the collection of radon, its decay products, and other airborne radionuclides |
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| CN202362462U (en) * | 2011-11-14 | 2012-08-01 | 石家庄经济学院 | Exhaust type continuous radon gas detector |
| CN105425267A (en) * | 2015-11-06 | 2016-03-23 | 南华大学 | System and method for measuring evolution rate of radon |
| CN108646286A (en) * | 2018-06-01 | 2018-10-12 | 衡阳师范学院 | A kind of reference unit and method of continuous reliable regulation and control precipitation rate of radon |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN85107800A (en) * | 1985-10-23 | 1986-07-23 | 成都地质学院 | Radon and daughter detection device thereof and method of work in the earth |
| DE4200308A1 (en) * | 1992-01-09 | 1993-07-15 | Heinz Dr Rer Nat Gast | Measuring chamber for determining alpha activity of radon gas in carrier gas esp. air - has detector producing measurement signal for detecting alpha particles produced with radon conversion in chamber and unit for producing electric field. |
| WO2010070697A1 (en) * | 2008-12-19 | 2010-06-24 | Tommasino Pier Mattia | Four sampling-elements, termed quatrefoil, for the collection of radon, its decay products, and other airborne radionuclides |
| CN201666954U (en) * | 2010-02-11 | 2010-12-08 | 杨怀元 | Radon synchroballistic type tritium in the air continuous monitoring instrument |
| CN202362462U (en) * | 2011-11-14 | 2012-08-01 | 石家庄经济学院 | Exhaust type continuous radon gas detector |
| CN105425267A (en) * | 2015-11-06 | 2016-03-23 | 南华大学 | System and method for measuring evolution rate of radon |
| CN108646286A (en) * | 2018-06-01 | 2018-10-12 | 衡阳师范学院 | A kind of reference unit and method of continuous reliable regulation and control precipitation rate of radon |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115453603A (en) * | 2022-09-13 | 2022-12-09 | 中国科学院高能物理研究所 | A liquid scintillator radon measuring detector and radon concentration measuring method |
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