CN109444978B - Millimeter wave/terahertz wave imaging device and method for detecting human body or article - Google Patents
Millimeter wave/terahertz wave imaging device and method for detecting human body or article Download PDFInfo
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- CN109444978B CN109444978B CN201811654175.9A CN201811654175A CN109444978B CN 109444978 B CN109444978 B CN 109444978B CN 201811654175 A CN201811654175 A CN 201811654175A CN 109444978 B CN109444978 B CN 109444978B
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- 238000003384 imaging method Methods 0.000 title claims abstract description 72
- 238000000034 method Methods 0.000 title claims description 22
- 238000001514 detection method Methods 0.000 claims abstract description 48
- 238000012545 processing Methods 0.000 claims description 32
- 230000003068 static effect Effects 0.000 claims description 11
- 230000003287 optical effect Effects 0.000 claims description 10
- 238000012634 optical imaging Methods 0.000 claims description 10
- 230000005855 radiation Effects 0.000 claims description 10
- 230000010355 oscillation Effects 0.000 claims description 7
- 230000002269 spontaneous effect Effects 0.000 claims description 7
- 230000000007 visual effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 7
- 238000005070 sampling Methods 0.000 description 7
- 238000012360 testing method Methods 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000013011 mating Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
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- 239000002360 explosive Substances 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/005—Prospecting or detecting by optical means operating with millimetre waves, e.g. measuring the black losey radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
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Abstract
The imaging device comprises a quasi-optical component and a millimeter wave/terahertz wave detector array, wherein the quasi-optical component is suitable for respectively reflecting and converging beams spontaneously radiated or reflected by n detected objects to the millimeter wave/terahertz wave detector array, n is more than or equal to 2, the quasi-optical component comprises reflecting plates, n detected objects are arranged at intervals around the reflecting plates, and the reflecting plates can rotate around a vertical axis to respectively receive and reflect the beams from the parts of the n detected objects, which are positioned at different horizontal positions of a field of view; and a millimeter wave/terahertz wave detector array adapted to receive the beam from the quasi-optical assembly. The imaging device can image n detected objects positioned at different positions in the circumferential direction of the reflecting plate, so that the detection efficiency is improved, and the imaging device is simple to control and low in cost.
Description
Technical Field
The present disclosure relates to the field of imaging technologies, and in particular, to a millimeter wave/terahertz wave imaging apparatus and a method for detecting a human body or an article using the same.
Background
In the increasingly severe situation of the current domestic and foreign anti-terrorist situation, terrorists carry dangerous articles such as cutters, guns, explosives and the like with themselves in a hidden mode to form a serious threat to public safety. The human body security inspection technology based on passive millimeter wave/terahertz wave has the unique advantages that imaging is achieved through millimeter wave/terahertz wave radiation of a detection target, active radiation is not needed, security inspection is conducted on a human body, and detection of hidden dangerous objects is achieved through penetrating capacity of millimeter wave/terahertz wave. However, the existing millimeter wave/terahertz wave imaging apparatus is low in efficiency.
Disclosure of Invention
The present disclosure is directed to solving at least one of the above-mentioned problems and disadvantages of the prior art.
According to an embodiment of one aspect of the present disclosure, there is provided a millimeter wave/terahertz wave imaging apparatus including a quasi-optical assembly and a millimeter wave/terahertz wave detector array,
the quasi-optical component is suitable for respectively reflecting and converging millimeter wave/terahertz wave spontaneously radiated or reflected by n detected objects to the millimeter wave/terahertz wave detector array, wherein n is more than or equal to 2, the quasi-optical component comprises reflecting plates, n detected objects are arranged at intervals around the reflecting plates, and the reflecting plates can rotate around vertical axes of the reflecting plates so as to respectively receive and reflect millimeter wave/terahertz wave from parts of the n detected objects, which are positioned at different horizontal positions of a visual field; and
The millimeter wave/terahertz wave detector array is adapted to receive millimeter wave/terahertz waves from the quasi-optical assembly.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes a housing, the quasi-optical component and the millimeter wave/terahertz wave detector array are located in the housing, and windows through which each of the millimeter waves/terahertz waves spontaneously radiate or are reflected back from the object to be detected pass are respectively provided on circumferential side walls of the housing.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes a rotation mechanism adapted to drive the reflection plate to rotate about a vertical axis thereof, the rotation mechanism including:
the door-shaped frame comprises a base part and vertical parts respectively connected with two ends of the base part, and the reflecting plate is at least partially arranged in the door-shaped frame; and
and the rotary driving device is connected with the door-shaped frame and is suitable for driving the door-shaped frame to rotate around the vertical axis so as to drive the reflecting plate to rotate around the vertical axis.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes a pitching oscillation mechanism adapted to drive the reflection plate to pitch and oscillate.
In some embodiments, the pitch swing mechanism comprises:
the crank connecting rod mechanism is characterized in that a crank of the crank connecting rod mechanism is connected with the reflecting plate and is rotationally connected with the vertical part of the door-shaped frame, and a connecting rod of the crank connecting rod mechanism is slidably connected with the door-shaped frame so as to drive the crank to rotate through sliding of the connecting rod relative to the door-shaped frame and further drive the reflecting plate to swing in a pitching mode;
and the pitching swinging driving device is suitable for driving the sliding motion of the connecting rod relative to the door-shaped frame.
In some embodiments, the crank employs a semicircular plate, and a diameter portion of the semicircular plate is connected to the reflecting plate.
In some embodiments, a detector platform adapted to mount the millimeter wave/terahertz wave detector array is also included within the housing.
In some embodiments, the optical assembly further comprises a focusing lens adapted to focus millimeter wave/terahertz waves from the reflective plate, the focusing lens being located between the reflective plate and the millimeter wave/terahertz wave detector array along the path of the light beam.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes a lens holder adapted to mount the focusing lens, the lens holder being disposed above the detector platform.
In some embodiments, the plurality of detectors in the millimeter wave/terahertz wave detector array are in linear distribution or double-row staggered arrangement.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes:
a data processing device connected with the millimeter wave/terahertz wave detector array to respectively receive image data for n detected objects from the millimeter wave/terahertz wave detector array and generate millimeter wave/terahertz wave images; and
and the display device is connected with the data processing device and is used for receiving and displaying millimeter wave/terahertz wave images from the data processing device.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes a calibration source on an object plane of the quasi-optical assembly, the data processing device receives calibration data for the calibration source from the millimeter wave/terahertz wave detector array, and updates millimeter wave/terahertz wave image data of n of the inspected objects based on the calibration data.
In some embodiments, a length direction of the calibration source is parallel to the vertical axis of the reflective plate, and a length of the calibration source is equal to or greater than a field of view size of the millimeter wave/terahertz wave detector array in a direction parallel to the vertical axis.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes an optical imaging device adapted to acquire optical images of n examined objects, the optical imaging device being connected with the display device.
In some embodiments, the display device includes a display screen including a first display area adapted to display the millimeter wave/terahertz wave image and a second display area adapted to display an optical image captured by the optical imaging device.
In some embodiments, the millimeter wave/terahertz wave imaging apparatus further includes an alarm device connected to the data processing device such that an alarm indicating the existence of a suspicious item in the millimeter wave/terahertz wave image is issued when the data processing device recognizes the suspicious item in the millimeter wave/terahertz wave image.
In some embodiments, 8.gtoreq.n.gtoreq.2.
According to another aspect of the present disclosure, there is also provided a method for detecting a human body or an article using the above millimeter wave/terahertz wave imaging apparatus, including the steps of:
s1: driving the reflecting plate to rotate around a vertical axis so that the reflecting plate sequentially rotates to a 1 st detection area to an n detection area, and respectively receiving image data about a 1 st detected object to an n detected object through a millimeter wave/terahertz wave detector array;
S2: transmitting image data for the 1 st to nth objects to be inspected obtained by the millimeter wave/terahertz wave detector array to a data processing device; and
s3: and respectively reconstructing image data of the 1 st to nth objects by using the data processing device to generate millimeter wave/terahertz wave images of the 1 st to nth objects.
In some embodiments, in step S1, in the ith detection zone, every certain angle of rotation of the reflective plate about the vertical axis, the pitching mechanism drives the reflective plate to oscillate N in the vertical direction v The beam which is spontaneously radiated or reflected back by the part of the ith detected object positioned at different vertical positions of the visual field is reflected in sequence, and the reflecting plate is driven by the rotating mechanism to rotate around the vertical axis by N h And reflecting partial spontaneous radiation or reflected beams of the ith detected object positioned at different horizontal positions of the view field in sequence, wherein n is more than or equal to i and more than or equal to 1.
In some embodiments, in step S1, the reflecting plate oscillates a number N of times required for reflection of the vertical range of the field of view in which the i-th subject is located v By the following meter And (3) calculating:
wherein [ (formula) represents an upward rounding);
l is the distance from the center of the field of view to the center of the reflecting plate;
H 0 a static field of view for the detector arrangement;
θ m the field angle corresponding to the field vertical range H corresponding to the ith detection area.
In some embodiments, the number of rotations N required to complete the reflection of the field of view horizontal range in which the ith inspected object is located h Calculated by the following formula:
wherein [ (formula) represents an upward rounding);
v is the horizontal range of the field of view corresponding to the ith detection area;
d is the center-to-center spacing of two adjacent detectors;
L 1 is the object distance;
L 2 is the image distance.
In some embodiments, the method further comprises the steps of:
receiving calibration data about a calibration source through the millimeter wave/terahertz wave detector array when the reflection plate rotates to a calibration area;
updating the received image data of the 1 st to nth subjects based on the received calibration data of the calibration source.
In some embodiments, updating the received image data of the inspected object based on the received calibration data of the calibration source comprises the steps of:
calculating the average value of the multiple measurement output voltages of all channels of the millimeter wave/terahertz wave detector array in the calibration area
The data after the calibration of the detection area of each channel is the data V collected by the detection area of each channel i Subtracting the average valueThen divided by the gain scaling factor a for each channel i 。
In some embodiments, updating the received image data of the inspected object based on the received calibration data of the calibration source comprises the steps of:
measuring the voltage value V of air by using the millimeter wave/terahertz wave detector array air (i) I epsilon 1, number of channels]And calculates the average voltage value of the air of all channels
Setting the temperature of the calibration source to have a difference value with the temperature of the air, and measuring the voltage value V of the calibration source by using the millimeter wave/terahertz wave detector array ca1 (i) I epsilon 1, number of channels]And calculates the average voltage value of the calibration sources of all channelsAnd the gain scaling factor a for each channel is calculated by the following equation i And offset scaling factor b i ：
The data after calibration of the detection area of each channel is thatWhere V is the absolute value of i Data acquired for the detection zone of each channel.
In some embodiments, the method further comprises step S4: after millimeter wave/terahertz wave images of the 1 st to nth objects are generated, whether the 1 st to nth objects carry suspicious objects or not and the positions of the suspicious objects are identified and the result is output.
According to the millimeter wave/terahertz wave imaging apparatus and the method for detecting a human body or an article according to the various embodiments of the present disclosure, the reflection plate is driven to rotate around the vertical axis so as to image a plurality of detected objects located at circumferentially different positions of the reflection plate, so that the detection efficiency is improved, the control is simple, the cost is low, and in addition, the device has a simple structure and a small occupied space.
Drawings
Fig. 1 is a schematic structural view of a millimeter wave/terahertz wave imaging apparatus according to an embodiment of the present disclosure;
FIG. 2 is a timing diagram of acquisition of rotating image data of a reflective plate according to an exemplary embodiment shown in FIG. 1;
fig. 3 is a schematic diagram of a millimeter wave/terahertz wave imaging apparatus according to the present disclosure;
fig. 4 is a schematic structural view of a millimeter wave/terahertz wave imaging apparatus according to still another embodiment of the present disclosure;
fig. 5 is a side view of the millimeter wave/terahertz wave imaging apparatus shown in fig. 4;
fig. 6 is a schematic structural view of a millimeter wave/terahertz wave imaging apparatus according to another embodiment of the present disclosure;
FIG. 7 is a schematic illustration of one manner of mating the rotational and pitching motion of a reflector plate according to one embodiment of the present disclosure;
FIG. 8 is a schematic illustration of another mating pattern of rotational and pitching movements of a reflector plate according to one embodiment of the present disclosure;
FIG. 9 is a schematic diagram of a display area of a display device according to one embodiment of the present disclosure;
fig. 10 is a flowchart of a method of detecting a human body or an article using a millimeter wave/terahertz wave imaging apparatus according to the present disclosure;
FIG. 11 is a schematic illustration of reflector pitching and vertical extent of the field of view, according to one embodiment of the present disclosure;
FIG. 12 is a schematic diagram of lens imaging;
FIG. 13 shows temperature sensitivity versus integration time;
fig. 14 is a schematic operation diagram of a millimeter wave/terahertz wave imaging apparatus according to one embodiment of the disclosure;
fig. 15 is a schematic operation diagram of a millimeter wave/terahertz wave imaging apparatus according to another embodiment of the disclosure; and
fig. 16 is an operational schematic diagram of a millimeter wave/terahertz wave imaging apparatus according to still another embodiment of the disclosure.
Detailed Description
While the present disclosure will be fully described with reference to the accompanying drawings, which contain preferred embodiments of the present disclosure, it is to be understood before this description that one of ordinary skill in the art can modify the disclosure described herein while achieving the technical effects of the present disclosure. Accordingly, it is to be understood that the foregoing description is a broad disclosure by those having ordinary skill in the art, and is not intended to limit the exemplary embodiments described in the present disclosure.
Furthermore, in the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. In other instances, well-known structures and devices are shown in the drawings in order to simplify the drawings.
Fig. 1 schematically illustrates a millimeter wave/terahertz wave imaging apparatus according to an exemplary embodiment of the present disclosure. As shown, the millimeter wave/terahertz wave imaging apparatus includes a quasi-optical assembly and a millimeter wave/terahertz wave detector array 2. The quasi-optical assembly is suitable for reflecting and converging beams spontaneously radiated by the 4 detected objects 31A, 31B, 31C and 31D to the millimeter wave/terahertz wave detector array 2, and comprises an elliptical reflecting plate 1 and a focusing lens 4, wherein the 4 detected objects 31A, 31B, 31C and 31D are arranged at intervals around the reflecting plate 1, and the reflecting plate 1 can rotate around the vertical axis thereof to respectively receive and reflect millimeter wave/terahertz waves from parts of the 4 detected objects 31A, 31B, 31C and 31D which are positioned at different horizontal positions of a field of view; the focusing lens 4 is adapted to collect millimeter wave/terahertz wave from the reflection plate 1. The millimeter wave/terahertz wave detector array 2 is adapted to receive millimeter wave/terahertz waves reflected and converged by the quasi-optical assembly, as shown in fig. 3.
In use, the reflecting plate 1 is driven to rotate, image data about the first object 31A is received through the millimeter wave/terahertz wave detector array 2 when the reflecting plate 1 is rotated to the first detection area, image data about the second object 31B is received through the millimeter wave/terahertz wave detector array 2 when the reflecting plate 1 is rotated to the second detection area, image data about the third object 31C is received through the millimeter wave/terahertz wave detector array 2 when the reflecting plate 1 is rotated to the third detection area, and image data about the fourth object 31D is received through the millimeter wave/terahertz wave detector array 2 when the reflecting plate 1 is rotated to the fourth detection area, as shown in fig. 2. The millimeter wave/terahertz wave imaging apparatus according to the embodiment of the present disclosure simultaneously images 4 inspected objects 31A, 31B, 31C, 31D located at different positions in the circumferential direction of the reflection plate 1 by rotating the reflection plate 1 about its vertical axis, thus improving detection efficiency, and is simple in control, low in cost, and in addition, the apparatus is simple in structure and small in occupied space.
In this embodiment, the horizontal direction of the reflection plate 1 facing the first detection area is 0 ° angle of view, the horizontal direction facing the second detection area is 90 ° angle of view, the horizontal direction facing the third detection area is 180 ° angle of view, and the horizontal direction facing the fourth detection area is 270 ° angle of view during rotation. One rotation of the reflection plate 1, a timing chart as shown in fig. 2 is obtained. Wherein θ is 1 For the angle of view corresponding to the first detection region, θ 2 For the angle of view corresponding to the second detection region, θ 3 For the angle of view corresponding to the third detection region, θ 4 It should be noted that, although the 4 objects to be inspected are shown in the above embodiments to be located at the angles of view of 0 °, 90 °, 180 °, and 270 °, respectively, those skilled in the art will understand that in other embodiments of the present disclosure, other numbers of objects to be inspected may be used, such as three, five, six, eight, etc. The location of each subject may also vary.
Further, although the beam in this embodiment is a millimeter wave or terahertz wave spontaneously radiated by the object 31A, 31B, 31C, 31D, it will be understood by those skilled in the art that the beam may be a millimeter wave/terahertz wave irradiated to the object 31A, 31B, 31C, 31D and reflected back through the object 31A, 31B, 31C, 31D.
As shown in fig. 4 and 5, in an exemplary embodiment, the millimeter wave/terahertz wave imaging apparatus further includes a housing 10, in which a quasi-optical assembly and a millimeter wave/terahertz wave detector array 2 are located, a first window through which millimeter wave/terahertz waves spontaneously radiated by the first object under test 31A pass, a second window through which millimeter wave/terahertz waves spontaneously radiated by the second object under test 31B pass, a third window through which millimeter wave/terahertz waves spontaneously radiated by the third object under test 31C pass, and a fourth window through which millimeter wave/terahertz waves spontaneously radiated by the fourth object under test 31D pass are provided on circumferential side walls of the housing 10, respectively.
As shown in fig. 1, 4 and 5, in an exemplary embodiment, the millimeter wave/terahertz wave imaging apparatus further includes a rotation mechanism 6 adapted to drive the reflection plate 1 to rotate about a vertical axis. The rotating mechanism includes a door frame 61 and a driving device 62 (e.g., a driving motor), the door frame 61 includes a base portion and vertical portions respectively connected to both ends of the base portion, and the reflection plate 1 is at least partially disposed inside the door frame 61; the driving means 62 is connected to the gate frame 61 and adapted to drive the gate frame 61 to rotate continuously about the vertical axis at a certain speed, for example 1 to 24 rpm, thereby rotating the reflecting plate 1 about the vertical axis.
As shown in fig. 1, 4 and 5, in an exemplary embodiment, the millimeter wave/terahertz wave imaging apparatus further includes a pitching mechanism 7 adapted to drive the reflection plate 1 to pitch-swing in the vertical direction, so that when the reflection plate 1 is driven by the rotation mechanism 6 to rotate by a certain angle, the pitching mechanism 7 drives the reflection plate 1 to pitch-swing in the vertical direction one or more times, so that the reflection plate 1 reflects part of the spontaneous radiation beam of the object 31 to be inspected located at different vertical positions of the field of view 3.
As shown in fig. 4 and 5, in an exemplary embodiment, the pitching swinging mechanism 7 includes a crank link mechanism, a crank of which adopts a semicircular plate 71, a diameter portion of the semicircular plate 71 is connected with the reflecting plate 1, and centers of the semicircular plates 71 are rotatably connected with vertical portions of the door-shaped frame 61 respectively through rotary shafts 73; the connecting rod 72 of the crank-connecting rod mechanism is slidably connected with the vertical part of the portal frame 61, so that the semicircular plate 71 is driven to rotate through the sliding of the connecting rod 72 relative to the portal frame 61, and then the pitching swing of the reflecting plate 1 is driven, so that the angle between the reflecting plate 1 and the vertical direction is adjusted, the reflection of partial spontaneous radiation beams of the detected object 31 at different vertical positions of the field of view 3 is realized, and the data acquisition of the field of view 3 in the vertical direction is completed. The pitching mechanism 7 further comprises a pitching driving means, such as an actuator, adapted to drive the sliding movement of the link 72 and the door frame 61. It should be noted that in some other embodiments of the present disclosure, the pitching mechanism further includes a pitching locking mechanism 75 adapted to keep the reflective plate 1 relatively fixed to the door-type frame 61, so that pitching of the reflective plate 1 relative to the door-type frame 61 is prevented when pitching of the reflective plate 1 is not required, as shown in fig. 6.
As shown in fig. 5, in an exemplary embodiment, a cylindrical guide 74 is provided on the door frame 61, and a link 72 of a crank link mechanism is slidably fitted in the guide 74, so that sliding of the link 72 with respect to the door frame 61 can be ensured.
As shown in fig. 4 and 5, in one exemplary embodiment, the imaging device further comprises a detector platform 8 adapted to mount the millimeter wave/terahertz wave detector array 2.
As shown in fig. 4 and 5, in an exemplary embodiment, the imaging device further comprises a lens holder 9 adapted to mount the focusing lens 4, the lens holder 9 being fixed to the detector platform 8.
As shown in fig. 1, 3-6, in some exemplary embodiments, a focusing lens 4 is located between the reflective plate 1 and the millimeter wave/terahertz wave detector array 2 along the path of the beam. It should be noted that, in other embodiments of the present disclosure, the focusing lens 4 may be disposed between the reflecting plate 1 and the object 31, that is, millimeter waves or terahertz waves spontaneously radiated by the object 31 pass through the focusing lens 4 and then are reflected by the reflecting plate 1 to the detector array 2 and received by the detector array 2.
In an exemplary embodiment, the millimeter wave/terahertz wave detector arrays 2 are arranged in a double-row staggered arrangement (as shown in fig. 15), and the arrangement direction of each row is parallel to the normal direction of the field of view. The number of detectors in the millimeter wave/terahertz wave detector array 2 is determined according to the required field size and the required resolution, and the size of the detectors is determined according to the wavelength, the processing technology, the required sampling density and the like. It should be noted that, in other embodiments of the present disclosure, the detector array 2 may also be linearly distributed (as shown in fig. 14), with the arrangement direction also being parallel to the normal of the field of view.
The manner of cooperation of the rotational motion and the pitching oscillation may take the form of an "N" shape or a serpentine shape within the field of view for each subject. As shown in fig. 7, the characteristic of the "N" shape is: the starting point of pitching is always at the bottom (or can be the top) of the field of view 3, the pitching is reflected from bottom to top (or from top to bottom), after one row of pitching is reflected, the detector array 2 returns to the initial pitch angle, and the pitching process is repeated again after the horizontal direction rotates to the next angle. As shown in FIG. 8, the serpentine shape is characterized by two adjacent rows of pitch tracks that are connected end to end, saving time for returning to zero relative to the "N" shape.
In one embodiment of the present disclosure, the imaging apparatus may further include a data processing device (not shown). The data processing device is connected wirelessly or by wire to the detector array 2 to receive image data acquired for the object 3 to be examined from the detector array 2 and to generate a millimeter wave/terahertz wave image. The imaging apparatus may further include a display device connected to the data processing device for receiving and displaying the millimeter wave/terahertz wave image from the data processing device.
As shown in fig. 2, in an exemplary embodiment, the millimeter wave/terahertz wave imaging apparatus further includes a calibration source 5, the calibration source 5 being located within the housing 10 and on the object plane of the quasi-optical assembly such that when the reflection plate 1 is rotated to the calibration area, calibration data about the calibration source 5 is received by the millimeter wave/terahertz wave detector array 2, the data processing device receives the calibration data of the calibration source received by the millimeter wave/terahertz wave detector array, and updates the image data of the 4 inspected objects in real time based on the calibration data. Since the calibration source 5 is enclosed inside the housing 1, the millimeter wave/terahertz wave imaging apparatus is made more stable and reliable than the calibration with remote air. The calibration source 5 may be, for example, a wave-absorbing material with an emissivity close to 1, such as plastic, foam, etc. In addition, the calibration source 5 may also be a black body, a semiconductor refrigerator, or the like.
In this embodiment, the calibration source 5 is centered at a 135 field angle, θ c In order to calibrate the field angle corresponding to the area, the beam radiated by the calibration source 5 can be reflected to the millimeter wave/terahertz wave detector array 2 through the reflecting plate 1, so that the calibration of the complete receiving channel comprising the focusing lens 4 and the detector can be realized, and the consistency of the channel is further ensured. However, it should be noted that the position of the center of the calibration source 5 may be an angle of view of other angles, for example, 60 °, 75 °, or the like, as long as the millimeter wave/terahertz wave detector array 2 receives the calibration data of the calibration source 5 and the image data of the object 31 to be inspected without interfering with each other, and furthermore, the millimeter wave/terahertz wave detector array 2 may directly receive the beam radiated from the calibration source 5 without being reflected to the millimeter wave/terahertz wave detector array 2 via the reflection plate 1.
By nyquist sampling law, an image can be completely restored with at least two sampling points within a half-power beamwidth. The arrangement direction of the millimeter wave/terahertz wave detector array 2 in this embodiment is parallel to the normal line of the field of view and parallel to the horizontal plane to sample the field of view in the horizontal direction, and the arrangement density of the millimeter wave/terahertz wave detector array 2 determines the sampling density. The image formed by the millimeter wave imaging system is actually a gray image, and when the space sampling rate of the image does not reach the Nyquist sampling requirement (undersampling), the image of the target scene can still be imaged, but the imaging effect is relatively poor. In order to compensate for pixel loss caused by undersampling, an interpolation algorithm can be adopted to increase data density in the later signal processing.
In an exemplary embodiment, the length direction of the calibration source 5 is parallel to the vertical axis of the reflecting plate 1, the length of the calibration source 5 is equal to or greater than the field size of the millimeter wave/terahertz wave detector array 2 in the direction parallel to the vertical axis, and the width of the calibration source 5 is 10 times the antenna beam width of the millimeter wave/terahertz wave detector. However, it should be noted that, as will be understood by those skilled in the art, the width of the calibration source 5 may be 1 or 2 times or other times the antenna beam width of the millimeter wave/terahertz wave detector.
In an exemplary embodiment, the millimeter wave/terahertz wave imaging apparatus further includes an angular displacement measurement mechanism, such as a photoelectric encoder, that detects in real time the angular displacement of the rotation of the reflection plate 1 about the vertical axis, so as to accurately calculate the posture of the reflection plate 1, which can considerably reduce the difficulty in developing the control algorithm and the imaging algorithm.
In one exemplary embodiment, the imaging apparatus may further include a display device connected to the data processing device for receiving and displaying the millimeter wave/terahertz wave image from the data processing device.
In one embodiment, the millimeter wave/terahertz wave imaging apparatus further includes an optical imaging device adapted to collect optical images of the 4 objects under test 31A, 31B, 31C, 31D, the optical imaging device being connected to a display device, the optical imaging device being capable of realizing real-time imaging of visible light, giving image information of the objects under test 31A, 31B, 31C, 31D for collation with millimeter wave/terahertz wave images for reference by a user.
In an exemplary embodiment, not shown, the display device includes a display screen including a first display area adapted to display the millimeter wave/terahertz wave image of each of the objects under examination 31A, 31B, 31C, 31D and a second display area adapted to display the optical image of each of the objects under examination acquired by the optical imaging device, so that a user can compare the optical image acquired by the optical imaging device with the millimeter wave/terahertz wave image.
In an exemplary embodiment, which is not shown, the millimeter wave/terahertz wave imaging apparatus further includes an alarm device connected to the data processing device, so that when suspicious objects in the millimeter wave/terahertz wave image of a certain or some objects to be inspected are identified, for example, an alarm such as an alarm lamp is turned on below the millimeter wave/terahertz wave image corresponding to the objects to be inspected, as shown in fig. 9, it should be noted that an alarm manner of sound prompt may also be adopted.
In an exemplary embodiment, the data acquisition and processing device may be used to generate and send control signals to the rotation mechanism 6 and the pitch and yaw mechanism 7 to drive the movement of the reflective plate 1. In another exemplary embodiment, the image forming apparatus may also include a control device independent from the data processing device.
As shown in fig. 10, the present disclosure further provides a method for detecting a human body or an article using a millimeter wave/terahertz wave imaging apparatus, including the steps of:
s1: driving the reflection plate 1 to rotate around the vertical axis so that the reflection plate sequentially rotates to the 1 st detection area to the 4 th detection area, and respectively receiving image data about the 1 st to 4 th inspected objects 31A, 31B, 31C, 31D through the millimeter wave/terahertz wave detector array;
s2: transmitting image data for the 1 st to 4 th objects 31A, 31B, 31C, 31D obtained by the millimeter wave/terahertz wave detector array to a data processing apparatus;
s3: image data of the 1 st to 4 th objects to be inspected are reconstructed by a data processing device to generate millimeter wave/terahertz wave images of the 1 st to 4 th objects to be inspected, respectively.
The method can simultaneously carry out omnibearing imaging and detection on 4 detected objects 31A, 31B, 31C and 31D, wherein the detected object 31 can be a human body or an article.
In an exemplary embodiment, in step S1, in the ith (4. Gtoreq.i.gtoreq.1) detection zone, every time the reflection plate 1 rotates a certain angle around the vertical axis, the pitching swinging mechanism drives the reflection plate 1 to swing N in the vertical direction v The rotation mechanism 6 drives the reflecting plate 1 to rotate around the vertical axis by N to sequentially reflect partial spontaneous radiation or reflected beams of the ith detected object (such as 31A) positioned at different vertical positions of the field of view h And then to reflect the part of the spontaneous radiation or reflected beam of the ith examined object (e.g. 31A) at a different horizontal position in the field of view 3.
Fig. 11 shows a schematic view of the pitching and vertical extent of the field of view of the reflection plate 1. As shown in fig. 11, the static field of view of the detector array 2 is H 0 The horizontal distance from the center of the field of view 3 to the center of the reflecting plate 1 is L, and assuming that the vertical field of view range of the detection area is H, the field angle corresponding to the vertical field of view range H is θ m . The reflecting plate 1 swings theta, and the corresponding view field angle changes by 2 theta, so the view field angle corresponding to the vertical view field range H is theta m The swing angle of the corresponding reflection plate 1 is theta m /2。
Wherein, in step S1, the reflecting plate 1 completes the number of times N of wobbling required for reflection of the vertical range of the field of view in which the object 31A is located v Calculated by the following formula:
wherein [ (formula) represents an upward rounding);
l is the distance from the center of the field of view 3 to the center of the reflecting plate 1;
H 0 a static field of view for the detector arrangement 2;
θ m The field angle corresponding to the vertical field range H corresponding to the ith detection area.
Assuming that the number of detectors is N, and the center distance d between two adjacent detectors, the maximum offset distance y of the detectors m Then
From this, the static field of view H of the detector array 2 can be calculated 0 . As shown in fig. 12, the static field of view H of the detector array 2 0 Distance from object L 1 Image distance L 2 It is required to satisfy the following relation
In step S1, the number of rotations N required to complete reflection of the horizontal range of the field of view in which the object 31A is located h Calculated by the following formula:
wherein [ (formula) represents an upward rounding);
v is the horizontal range of the field of view corresponding to the ith detection area;
d is the center-to-center spacing of two adjacent detectors;
L 1 is the object distance;
L 2 is the image distance.
Similarly, the above calculation method is equally applicable to other detection areas.
The angle at which the rotation mechanism 6 drives the reflective plate 1 in the horizontal direction for each rotation should be determined according to the static field of view of the detector array 2 in the horizontal direction. Likewise, the angle at which the pitch-and-roll mechanism 7 is rolled should be determined based on the static field of view of the detector array in the vertical direction.
In an exemplary embodiment, the method further comprises the following step before step S3: when the reflection plate 1 is rotated to the calibration area, calibration data about the calibration source 5 is received through the millimeter wave/terahertz wave detector array 2; and updates the received image data of the 1 st subject to the 4 th subject based on the received calibration data of the calibration source 5.
Detected output voltage V out The corresponding antenna temperature is T A Which should satisfy the following relationship,
T A ＝(V out -b)/a (5)
where a is the gain scaling factor,
b is the offset scaling factor.
Accordingly, updating the received image data of the object under test 31A, 31B, 31C, 31D based on the calibration data of the calibration source 5 includes correction of the offset calibration coefficient B and correction of the gain calibration coefficient a.
The radiation brightness temperature of the calibration source 5 and its surroundings can be regarded as uniform in the calibration area, i.e. the antenna temperature T of all channels A Is consistent. When the channels are completely consistent, the focal plane array receives the output V of the channels out And if the outputs are inconsistent, the gain scaling coefficient parameter a and the offset scaling coefficient b of each channel are required to be adjusted, so that the outputs of all channels are consistent, and the consistency adjustment of the channels is realized. The gain scaling parameter a reflects the total gain and equivalent bandwidth of the channel, which has been carefully adjusted during channel tuning, and the gain scaling coefficients a for each channel can be considered approximately equal, so that during use channel calibration is accomplished by adjusting the offset scaling coefficient b.
In an exemplary embodiment, updating the received image data of the object under examination 31 in real time based on the received calibration data of the calibration source 5 mainly comprises correcting the offset scaling factor b in real time, comprising the steps of:
A1: all channels of the millimeter wave/terahertz wave detector array are calculatedAverage value of multiple measured output voltages of the calibration area
A2: the data after the calibration of the detection area of each channel is the data V collected by the detection area of each channel i Subtracting the average valueThen divided by the gain scaling factor a for each channel i 。
The method can carry out integral calibration on the receiving channel array of the focal plane array system, and the calibration algorithm only needs simple operation, consumes little time and can realize real-time calibration; channel consistency calibration is performed for each image.
When the apparatus is operated for a long period of time or used in place of replacement, the gain scaling factor a of each channel is often changed due to deterioration of the system performance caused by drift of the system temperature. The gain scaling factor a and offset scaling factor b of the channel are required to be adjusted at this time, and the method specifically comprises the following steps of
B1: measuring the voltage value V of air by using the millimeter wave/terahertz wave detector array air (i) I epsilon 1, number of channels]And calculates the average voltage value of the air of all channels
B2: setting the temperature of the calibration source to have a difference value with the temperature of the air, and measuring the voltage value V of the calibration source by using the millimeter wave/terahertz wave detector array ca1 (i) I epsilon 1, number of channels]And calculates the average voltage value of the calibration sources of all channelsAnd the gain scaling factor a for each channel is calculated by the following equation i And offset scaling factor b i ：
B3: the data after calibration of the detection area of each channel is thatWhere V is the absolute value of i Data acquired for the detection zone of each channel.
The data processing device acquires data twice in each 3dB beam azimuth, so that in the embodiment shown in fig. 1, at least 10 acquired data are obtained per channel in the calibration area. The output voltage data of the calibration area and the output voltage data of the detection area are both stored in the same data table of the data processing device.
The height direction sampling density is determined by the beam dwell time, and the reflective plate 1 outputs one image by one rotation. Assuming an angular resolution of θ for the detector res The number of the included 3dB beams of one turn of the reflecting plate 1 is
n＝360°/θ res (8)
Assuming that the imaging rate requirement is mHz, the average dwell time τ in the height direction for each sampled beam d Is that
At an imaging distance of 3000mm from the system, the angular resolution θ res For example, when the object resolution is δ=30mm and the imaging rate is 8Hz, the number of beams in the rotation direction can be found to be about 632, and the residence time of each beam is τ d =125 ms/632=198 μs. The rotation mechanism 6 controls the reflective plate 1 to move at a uniform speed, so that its rotational angular velocity ω=16pi rad/s.
FIG. 13 shows a typical detector temperature sensitivity versus integration time. When the integration time is selected to be 200us, the corresponding temperature sensitivity is 0.2K. In order to obtain a good signal-to-noise ratio, the temperature sensitivity is required to be less than or equal to 0.5K. The millimeter wave/terahertz wave imaging apparatus can meet this requirement.
As an exemplary embodiment, the method may further include S4: after millimeter wave/terahertz wave images of the 1 st to 4 th objects are generated, whether the 1 st to 4 th objects carry suspicious objects or not and the positions of the suspicious objects are identified and the result is output.
In the above steps, the identification of the suspicious object and the position thereof can be performed by a method of automatic identification by a computer or manual identification or a combination of the two methods. The result output may be achieved by, for example, displaying a conclusion marked with whether the suspicious object is directly displayed on the display device, or the detection result may be directly printed or transmitted.
The security check personnel executing the detection can confirm whether the human body or the article has suspicious objects and the positions of the suspicious objects according to the detection result given in the step S4, and can check by manual detection.
As shown in FIG. 14, in an exemplary embodiment, the number N of detectors is 20 and arranged in a row, the center-to-center distance d between two adjacent detectors is 7mm, and the maximum offset distance y m 7cm. Object distance L 1 3.5m, image distance L 2 At 0.7m, the static field of view H can be calculated according to equation (3) 0 70cm. To accomplish a reflection of a vertical range H of the field of view of 2m, the number of required oscillations is 3, respectively "upper pitch angle θ Upper part "" pitch middle angle θ In (a) Sum pitch angle θ Lower part(s) ". The number of rotations N required for a horizontal field of view of 1m h At least 29, ultimately resulting in a field of view distribution as shown in fig. 14.
As shown in FIG. 15, in an exemplary embodiment, the number N of detectors is 40, and the detectors are arranged in a staggered manner in two rows, the center-to-center distance d between two adjacent detectors in each row is 14mm, and the maximum offset distance y m Is 14cm. Object distance L 1 3.5m, image distance L 2 At 0.7m, the static field of view H can be calculated according to equation (3) 0 =90 cm. To accomplish a reflection of a vertical range H of the field of view of 1.8m, the number of required oscillations is 2, respectively "upper pitch angle θ Upper part Sum pitch angle θ Lower part(s) "; the number of rotations N required for a horizontal field of view of 1m h At least 15, ultimately resulting in a field of view distribution as shown in fig. 15.
As shown in FIG. 16, in an exemplary embodiment, the number N of detectors is 60, and the detectors are arranged in a row, the center-to-center distance d between two adjacent detectors in each row is 7mm, and the maximum offset distance y m 21cm. Object distance L 1 3.5m, image distance L 2 At 0.7m, the static field of view H can be calculated according to equation (7) 0 =210 cm. In order to complete the reflection of the vertical range H of the view field of 2m, the reflecting plate does not need to perform pitching oscillation, and when the view field in the horizontal direction is 1m, the number of times N of rotation required for the horizontal range of the view field of 1m h At least 29, ultimately resulting in a field of view distribution as shown in fig. 16.
Those skilled in the art will appreciate that the embodiments described above are exemplary and that modifications may be made by those skilled in the art, and that the structures described in the various embodiments may be freely combined without conflict in terms of structure or principle.
Having described the preferred embodiments of the present disclosure in detail, those skilled in the art will readily appreciate that various changes and modifications may be made without departing from the scope and spirit of the following claims, and that the present disclosure is not limited to the implementations of the exemplary embodiments set forth in the specification.
Claims (20)
1. A millimeter wave/terahertz wave imaging device, which comprises a quasi-optical component and a millimeter wave/terahertz wave detector array,
the quasi-optical component is suitable for respectively reflecting and converging millimeter wave/terahertz wave spontaneously radiated or reflected by 4 detected objects to the millimeter wave/terahertz wave detector array, and comprises reflecting plates, wherein the 4 detected objects are arranged at intervals around the reflecting plates, and the reflecting plates can rotate around vertical axes of the reflecting plates so as to respectively receive and reflect millimeter wave/terahertz wave from parts of the 4 detected objects, which are positioned at different horizontal positions of a visual field;
the millimeter-wave/terahertz-wave detector array is adapted to receive millimeter-wave/terahertz waves from the quasi-optical assembly,
a housing, the quasi-optical assembly and the millimeter wave/terahertz wave detector array being located within the housing,
a data processing device connected with the millimeter wave/terahertz wave detector array to respectively receive image data for 4 detected objects from the millimeter wave/terahertz wave detector array and generate millimeter wave/terahertz wave images; and
a calibration source located within the housing and on an object plane of the quasi-optical assembly, the calibration source being located between two adjacent inspected objects in a rotational direction of the reflective plate,
The data processing device receives calibration data for the calibration source from the millimeter wave/terahertz wave detector array, and updates millimeter wave/terahertz wave image data of 4 detected objects based on the calibration data.
2. The millimeter wave/terahertz wave imaging apparatus according to claim 1, wherein windows through which each of the detected objects spontaneously radiates or reflects back millimeter wave/terahertz wave pass are provided on circumferential side walls of the housing, respectively.
3. The millimeter wave/terahertz wave imaging apparatus according to claim 2, further comprising a rotation mechanism adapted to drive the reflection plate to rotate about a vertical axis thereof, the rotation mechanism comprising:
the door-shaped frame comprises a base part and vertical parts respectively connected with two ends of the base part, and the reflecting plate is at least partially arranged in the door-shaped frame; and
and the rotary driving device is connected with the door-shaped frame and is suitable for driving the door-shaped frame to rotate around the vertical axis so as to drive the reflecting plate to rotate around the vertical axis.
4. The millimeter wave/terahertz wave imaging apparatus according to claim 3, further comprising a pitching mechanism adapted to drive the reflection plate to pitch and swing.
5. The millimeter wave/terahertz wave imaging apparatus according to claim 4, wherein the pitching oscillation mechanism comprises:
the crank connecting rod mechanism is characterized in that a crank of the crank connecting rod mechanism is connected with the reflecting plate and is rotationally connected with the vertical part of the door-shaped frame, and a connecting rod of the crank connecting rod mechanism is slidably connected with the door-shaped frame so as to drive the crank to rotate through sliding of the connecting rod relative to the door-shaped frame and further drive the reflecting plate to swing in a pitching mode;
and the pitching swinging driving device is suitable for driving the sliding motion of the connecting rod relative to the door-shaped frame.
6. The millimeter wave/terahertz wave imaging apparatus as set forth in claim 5, wherein the crank employs a semicircular plate whose diameter portion is connected to the reflection plate.
7. The millimeter wave/terahertz wave imaging device of claim 2, wherein a detector platform adapted to mount the millimeter wave/terahertz wave detector array is further included within the housing.
8. The millimeter wave/terahertz wave imaging device of claim 7, wherein the optical assembly further includes a focusing lens adapted to converge millimeter wave/terahertz waves from the reflecting plate, the focusing lens being located between the reflecting plate and the millimeter wave/terahertz wave detector array along a path of a light beam.
9. The millimeter wave/terahertz wave imaging apparatus as set forth in claim 8, further comprising a lens holder adapted to mount the focusing lens, the lens holder being disposed above the detector stage.
10. The millimeter wave/terahertz wave imaging device of any one of claims 1 to 7, wherein a plurality of detectors in the millimeter wave/terahertz wave detector array are in a linear distribution or a double-row staggered arrangement.
11. The millimeter wave/terahertz wave imaging device according to any one of claims 1 to 7, wherein further comprising:
and the display device is connected with the data processing device and is used for receiving and displaying millimeter wave/terahertz wave images from the data processing device.
12. The millimeter wave/terahertz wave imaging apparatus according to claim 11, wherein a length direction of the calibration source is parallel to the vertical axis of the reflection plate, and a length of the calibration source is equal to or greater than a field size of the millimeter wave/terahertz wave detector array in a direction parallel to the vertical axis.
13. The millimeter wave/terahertz wave imaging apparatus according to claim 11, further comprising an optical imaging device adapted to acquire optical images of 4 subjects, the optical imaging device being connected to the display device.
14. The millimeter wave/terahertz wave imaging apparatus according to claim 13, wherein the display device includes a display screen including a first display area adapted to display the millimeter wave/terahertz wave image and a second display area adapted to display an optical image acquired by the optical image pickup device.
15. The millimeter wave/terahertz wave imaging apparatus as set forth in claim 11, further comprising an alarm device connected to the data processing device so that an alarm indicating the presence of a suspicious item in the millimeter wave/terahertz wave image is issued when the data processing device recognizes the suspicious item in the millimeter wave/terahertz wave image.
16. A method of detecting a human body or an article using the millimeter wave/terahertz wave imaging apparatus according to any one of claims 1 to 15, comprising the steps of:
s1: driving the reflecting plate to rotate around the vertical axis of the reflecting plate so that the reflecting plate sequentially rotates to a 1 st detection area to a 4 th detection area, and respectively receiving image data about a 1 st detected object to a 4 th detected object through a millimeter wave/terahertz wave detector array;
s2: transmitting image data for the 1 st to 4 th objects to be inspected obtained by the millimeter wave/terahertz wave detector array to a data processing device; and
S3: reconstructing image data of the 1 st to 4 th objects to generate millimeter wave/terahertz wave images of the 1 st to 4 th objects respectively using the data processing apparatus,
wherein when the reflection plate rotates to a calibration area, calibration data about a calibration source is received through the millimeter wave/terahertz wave detector array, wherein the calibration area is located between two adjacent detection areas in a rotation direction of the reflection plate;
updating the received image data of the 1 st to 4 th subjects based on the received calibration data of the calibration source.
17. The method of claim 16, wherein in step S1, in an ith detection zone, every rotation of the reflective plate about the vertical axis by a certain angle, a pitching oscillation mechanism drives the reflective plate to oscillate N in a vertical direction v Next, to sequentially aim at the ith detected objectPart of spontaneous radiation or reflected beams located at different vertical positions of the field of view are reflected, and a rotating mechanism drives the reflecting plate to rotate around the vertical axis by N h And reflecting partial spontaneous radiation or reflected beams of the ith detected object positioned at different horizontal positions of the view field in sequence, wherein, i is more than or equal to 4 and more than or equal to 1.
18. The method according to claim 17, wherein in step S1, the reflecting plate is swung for a number of times N required for completing reflection of a vertical range of a field of view in which the i-th subject is located v Calculated by the following formula:
wherein [ (formula) represents an upward rounding);
l is the distance from the center of the field of view to the center of the reflecting plate;
H 0 a static field of view for the detector arrangement;
θ m the field angle corresponding to the field vertical range H corresponding to the ith detection area.
19. The method of claim 18, wherein the number of rotations N required to complete reflection of the field of view horizontal range in which the i-th subject is located h Calculated by the following formula:
wherein [ (formula) represents an upward rounding);
v is the horizontal range of the field of view corresponding to the ith detection area;
d is the center-to-center spacing of two adjacent detectors;
L 1 is the object distance;
L 2 is the image distance.
20. The method according to any one of claims 17 to 19, further comprising step S4: after millimeter wave/terahertz wave images of the 1 st to 4 th objects are generated, whether the 1 st to 4 th objects carry suspicious objects or not and the positions of the suspicious objects are identified and the result is output.
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| CN111025423B (en) * | 2019-12-28 | 2022-07-29 | 北京无线电计量测试研究所 | Calibration system and method of active millimeter wave real-time three-dimensional imaging security inspection system |
| CN113126176B (en) * | 2019-12-30 | 2022-06-10 | 清华大学 | Terahertz wave security inspection system and method |
| CN115389449A (en) * | 2022-08-25 | 2022-11-25 | 上海亨临光电科技有限公司 | A Compensation Control Method and Special System for Terahertz Detector Zero Shift |
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