CN108802603B

CN108802603B - Tester for indicating test current of electronic ballast by multiple groups of LEDs

Info

Publication number: CN108802603B
Application number: CN201810774531.4A
Authority: CN
Inventors: 刘贻有
Original assignee: Individual
Current assignee: Individual
Priority date: 2018-07-01
Filing date: 2018-07-01
Publication date: 2021-05-14
Anticipated expiration: 2038-07-01
Also published as: CN108802603A

Abstract

The invention discloses a tester for indicating test current of an electronic ballast by using a plurality of groups of LEDs, which consists of an incandescent lamp current limiting circuit, an anti-interference circuit, a circuit for indicating negative half-cycle overcurrent current by the LEDs, a circuit for indicating positive half-cycle overcurrent current by the LEDs, a circuit for indicating negative half-cycle rated current by the LEDs, a circuit for indicating positive half-cycle rated current by the LEDs, a circuit for joint indication and a circuit for indicating test current by 5 grouped LEDs; the working state of the electronic ballast is judged by detecting the working current of the electronic ballast, the main test object is an electronic ballast board card with a jumper wire at the position of connecting the fluorescent lamp tube, the test and maintenance of the fluorescent lamp tube can be avoided, the test current can give an audible and visual alarm in the case of the unlighted overcurrent state of an incandescent lamp, the test current is represented as a good product by the light emitting of an LED when the positive half cycle and the negative half cycle are rated currents, the brightness, the quantity, the frequency and the like of the LED in each group can reflect different test currents, faults can be quickly found out in the bad product, and the test and maintenance efficiency is improved. The testing instrument is simple in principle, easy to manufacture and practical in function.

Description

Tester for indicating test current of electronic ballast by multiple groups of LEDs

Technical Field

The invention relates to the field of electronic ballast testing and maintenance, in particular to a circuit structure of an electronic ballast tester.

Background

The electronic ballast tester generally uses electronic current meter, etc. to display current, power factor, etc., but because of the problems of sampling, etc., it is difficult to quickly and stably display current, most of them are used for finished product test, the current meter has little effect on the board card test and maintenance of the assembly line, the tester on the common assembly line is only a power supply pen with incandescent lamp current-limiting, the mains supply supplies power to the tested electronic ballast board card by the incandescent lamp current-limiting of the tester, the electronic ballast can light the fluorescent lamp tube to indicate good product, when testing the board card, one hand holds the power supply pen, the other hand holds the test pen of the fluorescent lamp tube, one of the power supply pen and the lamp tube test pen is easy to be in poor contact to cause misjudgment, thus influencing the test efficiency, according to the brightness of the incandescent lamp and the measurement and judgment of the fault position of the defective product by using a universal meter, the fault position is difficult to judge quickly and accurately, the material loss is high, and the production efficiency is low.

Disclosure of Invention

The invention provides a tester for indicating the test current of an electronic ballast by using a plurality of groups of LEDs (light emitting diodes), which aims to mainly test an electronic ballast board card with a jumper wire at the position connected with a fluorescent lamp tube, represents different working state currents of the electronic ballast by using different light-emitting combinations of a plurality of groups of LEDs (light emitting diodes) and incandescent lamps, can quickly judge whether the electronic ballast board card is a good product or not, can quickly determine the fault problem of the electronic ballast board card, can quickly test and maintain the electronic ballast board card without using a fluorescent lamp tube test pen, can test and maintain the electronic ballast board card with the jumper wire at the position connected with the fluorescent lamp tube by one hand, and can weld and maintain the electronic ballast board card by the other hand by using a soldering iron, thereby improving the test and maintenance efficiency.

In order to solve the technical problem, the invention provides a tester for indicating the test current of an electronic ballast by using a plurality of groups of LEDs, which comprises an incandescent lamp current limiting circuit, an anti-interference circuit, a circuit for indicating a negative half-cycle overcurrent current by using the LEDs, a circuit for indicating a positive half-cycle overcurrent current by using the LEDs, a circuit for indicating a negative half-cycle rated current by using the LEDs, a circuit for indicating a positive half-cycle rated current by using the LEDs, a circuit for joint indication and a circuit for indicating the test current by using 5 groups of LEDs.

The incandescent lamp current limiting circuit supplies current by using an incandescent lamp, and mains supply supplies power to the indicating circuit of the tester and supplies power for a test object after the current of the incandescent lamp is limited, so that the element is prevented from being damaged by large current when the test object fails; the anti-interference circuit is connected with the incandescent lamp current limiting circuit and is provided with an inductance-capacitance filter circuit for filtering the interference of the power grid power supply and preventing the interference of the power grid power supply; the LED uses a white light emitting diode; the positive half cycle refers to a positive half cycle when a live wire (L) input by commercial power (220V) is positive and a zero line (N) is negative, and a negative half cycle when the live wire (L) is negative and the zero line (N) is positive; the circuit for indicating the current is provided with a triode to amplify and drive an LED to emit light to indicate the current through voltage drop generated by the current flowing through the resistor, and the LED is powered by a wide input voltage power supply.

The circuit for indicating the negative half cycle overcurrent current by the LED is connected with the anti-interference circuit, is provided with a circuit for detecting and indicating the negative half cycle overcurrent and is used for realizing overcurrent indication of the negative half cycle current; the circuit for indicating the positive half cycle overcurrent current by the LED is connected with the anti-interference circuit, is provided with a circuit for detecting and indicating the positive half cycle overcurrent and is used for realizing the overcurrent indication of the positive half cycle current; the circuit for indicating the negative half cycle rated current by the LED is connected with the circuit for indicating the negative half cycle overcurrent current by the LED, and is provided with a circuit for detecting and indicating the negative half cycle rated current and used for indicating the rated current of the negative half cycle current; the circuit for indicating the positive half-cycle rated current by the LED is connected with the circuit for indicating the positive half-cycle overcurrent current by the LED, and is provided with a circuit for detecting and indicating the positive half-cycle rated current for realizing the indication of the positive half-cycle rated current; the circuit for indicating the rated current of the negative (positive) half cycle by the LED is used for judging whether the electronic ballast works in a half-wave rectification fault state indicated by the rated current of only the negative half cycle or the positive half cycle or works in a good product indicating state indicated by the rated current of both the negative half cycle and the positive half cycle.

The combined indicating circuit is provided with a circuit for indicating overcurrent current by audible and visual alarm and a circuit for indicating rated current by an LED. The circuit for indicating overcurrent current by the acousto-optic alarm is provided with an LED and a buzzer for acousto-optic alarm; the circuit of the LED indicating rated current is provided with an extension line to lead the LED out to a power supply test pen of the output end to emit light for indicating good products; the combined indicating circuit is respectively connected with the LED circuit for indicating the negative half-cycle overcurrent, the LED circuit for indicating the positive half-cycle overcurrent, the LED circuit for indicating the negative half-cycle rated current and the LED circuit for indicating the positive half-cycle rated current, and is used for realizing the sound-light alarm indication when the detected electronic ballast works in the overcurrent state that an incandescent lamp is not bright and the LED luminescence indication when the detected electronic ballast works in the negative half-cycle and the positive half-cycle which are both rated currents.

The circuit of the 5 grouped LEDs for indicating the test current is respectively connected with the circuit of the LED for indicating the negative half cycle rated current and the circuit of the LED for indicating the positive half cycle rated current, wherein the 5 grouped LEDs comprise a first LED, a second LED, a third LED, a fourth LED and a fifth LED, the circuit of the third LED and the fifth LED for indicating the test current supplied by the negative half cycle half-wave rectifier switch power supply is used for indicating the test current of the tested object and detecting whether the negative half cycle voltage is in voltage loss or not; the circuit comprises a second LED indicating test current circuit and a fourth LED indicating test current circuit which are powered by a positive half-cycle half-wave rectification switch power supply and are used for indicating the test current of a tested object and detecting whether positive half-cycle voltage is in voltage loss or not; the circuit comprises a circuit for indicating test current by a first LED (light emitting diode) powered by a negative half-cycle half-wave rectification step-down power supply, and is used for indicating the test current of a tested object and detecting whether negative half-cycle voltage is in voltage loss; the first LED, the third LED and the fifth LED which are powered by commercial power negative half cycle current are in one group, and the second LED and the fourth LED which are powered by commercial power positive half cycle current are in one group; when the incandescent lamp is not on, the number of the 5 grouped LEDs is increased along with the increase of the current until the incandescent lamp is fully on, and when the incandescent lamp is on, the number of the 5 grouped LEDs is decreased along with the increase of the current until the incandescent lamp is fully off. The on or off of each group of LEDs, the number of LED flickers, the brightness of the LED flickers and the frequency of the LED flickers can reflect different test currents, and defective products can be quickly judged according to different states of the LEDs during testing.

Compared with the prior art, the invention has the beneficial effects that: the invention provides a tester for indicating test current of an electronic ballast by using a plurality of groups of LEDs, when a jumper wire is arranged at the position where a test electronic ballast board is clamped with a lamp tube.

Firstly, testing a test pen of a fluorescent lamp tube can be avoided;

secondly, when the current is rated current, the LED emits light to indicate that the electronic ballast board to be tested is good;

thirdly, when the current is in an overcurrent state, the sound and light alarm can be carried out, so that the damage to elements during the test can be avoided as much as possible, and the burning of the elements during the aging test of the electronic ballast working in the overcurrent state is reduced;

the brightness, the quantity and the frequency of the on-off and LED flickering of each group of LEDs in the fourth and the multiple groups of LEDs reflect different test currents, and defective products can quickly find out fault parts;

fifthly, when some faults are difficult to judge whether the faults are in the series resonance circuit or the half-bridge inverter circuit, the external series resonance circuit is tested, and whether the faults are in the series resonance circuit or the half-bridge inverter circuit can be quickly judged according to the change of the LED.

The five main functions can greatly improve the testing and maintaining efficiency and reduce the loss.

Drawings

FIG. 1 is a block diagram of the electrical circuit framework of the tester of the present invention for indicating test current of an electronic ballast with multiple sets of LEDs.

Fig. 2 is a schematic circuit diagram of the main test and repair object of the present invention, i.e., an electronic ballast.

Detailed Description

The technical solutions of the present invention are further described in detail with reference to the accompanying drawings and specific embodiments, which are only illustrative of the present invention and are not intended to limit the present invention.

As shown in figure 1, the tester for indicating the test current of the electronic ballast by using a plurality of groups of LEDs comprises an incandescent lamp current limiting and anti-interference circuit, a circuit for indicating the negative half-cycle overcurrent current by an LED (LED), a circuit for indicating the positive half-cycle overcurrent current by an LED (LED), a circuit for indicating the negative half-cycle rated current by an LED (LED), a circuit for indicating the positive half-cycle rated current by an LED (LED), a circuit for jointly indicating, and a circuit for indicating the test current by 5 groups of LEDs.

The incandescent lamp current limiting circuit supplies current by using an incandescent lamp, and mains supply supplies power to the indicating circuit of the tester and supplies power for a test object after the current of the incandescent lamp is limited, so that the element is prevented from being damaged due to large current when the test object fails; the anti-interference circuit is connected with the incandescent lamp current limiting circuit and is provided with an inductance-capacitance filter circuit for filtering the interference of the power grid power supply and preventing the interference of the power grid power supply; the LED uses a white light emitting diode; the positive half cycle refers to a positive half cycle when a live wire (L) input by commercial power (220V) is positive and a zero line (N) is negative, and a negative half cycle when the live wire (L) is negative and the zero line (N) is positive; the circuit for indicating the current is provided with a triode to amplify and drive an LED to emit light to indicate the current through voltage drop generated by the current flowing through the resistor, and the LED is powered by a wide input voltage power supply.

The circuit for indicating the negative half cycle overcurrent current by the LED (LED) is connected with the anti-interference circuit, and is provided with a circuit for detecting and indicating the negative half cycle overcurrent so as to realize the overcurrent indication of the negative half cycle current; the circuit for indicating the positive half-cycle overcurrent current by the LED (LED ninthly) is connected with the anti-interference circuit, and is provided with a circuit for detecting and indicating the positive half-cycle overcurrent, so as to realize the overcurrent indication of the positive half-cycle current; the circuit for indicating the negative half-cycle rated current by the LED (seventh); the circuit for indicating the positive half-cycle rated current by the LED (LED) is connected with the circuit for indicating the positive half-cycle overcurrent by the LED (LED ninthly), and is provided with a circuit for detecting and indicating the positive half-cycle rated current for realizing the indication of the positive half-cycle rated current; the circuit for indicating the rated current of the negative (positive) half cycle by the LED is used for judging whether the electronic ballast works in a half-wave rectification fault state indicated by the rated current of only the negative half cycle or the positive half cycle or works in a good product indicating state indicated by the rated current of both the negative half cycle and the positive half cycle.

The combined indicating circuit is provided with a circuit for indicating overcurrent current by audible and visual alarm and a circuit for indicating rated current by an LED (LED). The circuit for indicating overcurrent current by sound-light alarm is provided with an LED

And a buzzer for sound and light alarm; the circuit of the LED (R) indicates rated current is provided with an extension line to lead the LED (R) to the power supply test pen of the output end to emit light for indicating good product; the combined indicating circuit is respectively connected with a circuit for indicating the negative half-cycle overcurrent by an LED (LED), a circuit for indicating the positive half-cycle overcurrent by an LED (LED), a circuit for indicating the negative half-cycle rated current by an LED (LED), and a circuit for indicating the positive half-cycle rated current by an LED (LED), so as to realize the acousto-optic alarm indication when the detected electronic ballast works in the overcurrent state that an incandescent lamp is not bright, and the LED (LED) (R) luminescence good product indication when the detected electronic ballast works in the negative half-cycle and the positive half-cycle both at rated current.

The circuit for indicating the test current by the 5 grouped LEDs is respectively connected with the circuit for indicating the negative half-cycle rated current by the LEDs and the circuit for indicating the positive half-cycle rated current by the LEDs, wherein the 5 grouped LEDs comprise a first LED, a second LED, a third LED, a fourth LED and a fifth LED. The circuit is provided with a third LED (c) and a fifth LED (c) for indicating test current supplied by a negative half-cycle half-wave rectification switching power supply, and is used for indicating the test current of a tested object and detecting whether negative half-cycle voltage is in voltage loss or not; the circuit is provided with a second LED (light emitting diode) (LED) and a fourth LED (LED) for indicating test current, which are powered by a positive half-cycle half-wave rectification switching power supply, and is used for indicating the test current of a tested object and detecting whether positive half-cycle voltage is in voltage loss or not; the circuit is provided with a circuit for indicating test current by a first LED (light emitting diode) (I) powered by a negative half-cycle half-wave rectification step-down power supply, and is used for indicating the test current of a tested object and detecting whether negative half-cycle voltage is in voltage loss or not; the LED power supply system comprises a power supply, a first LED (LED), a third LED (LED) and a fifth LED (LED), wherein the first LED (LED), the third LED (LED) and the fifth LED (LED) are powered by commercial power negative half-cycle current and the second LED (LED) and the fourth LED (LED) are powered by commercial power positive half-cycle current; when the voltage of the negative half cycle or the positive half cycle is lost due to the testing of the diode and the like, one of the LED (first), the LED (third) and the LED (fifth) group or the LED (second) and the LED (fourth) group is not bright; when the incandescent lamp is not on, the number of the 5 grouped LEDs is increased along with the increase of the current until the incandescent lamp is fully on, and when the incandescent lamp is on, the number of the 5 grouped LEDs is decreased along with the increase of the current until the incandescent lamp is fully off.

The design idea of the tester for indicating the test current of the electronic ballast by using a plurality of groups of LEDs in the circuit is as follows: when the good electronic ballast board is connected with the fluorescent lamp tube, a jumper wire is arranged at the position of the good electronic ballast board, the starting current which can be maintained for 1 to 3 seconds is tested by electrifying under the current limiting of the incandescent lamp, the triode cannot be broken down and damaged when the short-time test which is less than 1 second is not connected with the fluorescent lamp tube, the starting current is taken as the rated current of the electronic ballast, the LED emits light to be used as the good product indication, the different lighting and extinguishing combination of a plurality of groups of LEDs and the incandescent lamp is used for indicating other common faults, and the voltage drop of the current flowing through the resistor during the electrifying test is amplified by the triode to drive the LED to indicate the. The testing speed is improved, and the defective products can quickly judge the fault parts. The power supply of the LED uses a half-wave rectification switching power supply, the switching power supply has no undervoltage protection circuit, and the switching power supply can work at AC20V to AC240V with wide input voltage half-wave rectification. The output voltage is DC 5V-DC 15V according to actual needs, and the power supply voltage from the LED (light emitting diode) to the LED (light emitting diode) is gradually reduced, so that the LED power supply voltage is reduced along with the reduction of the voltage of the test pen voltage along with the increase of the current after the current of the test object is large, and the light emitting quantity of the LED is reduced. When the current is rated current or overcurrent during testing, the circuit for indicating the overcurrent current and the rated current starts to work for indicating, thereby reducing the generation of circuit faults and prolonging the service life of the circuit.

Fig. 2 is a schematic circuit diagram of an electronic ballast, which is also a test and maintenance object of the present invention, and includes a rectifier filter circuit, a half-bridge inverter circuit, a series resonant circuit, etc. FU is a fuse, D1 to D4 are rectifier diodes, Q1 and Q2 are switching tubes, L, C5 and a filament FL form a series resonance circuit, L1 is a magnetic ring, R1 and R3 are starting resistors, and fig. 2 is used for assisting in explaining the working process of the tester.

The common working state of the electronic ballast board card when being electrified is indicated by a combination of multiple groups of LED on-off and incandescent lamp on-off for explaining the working process of the tester and for quickly testing and judging faults of the electronic ballast board card, the current measured when the electronic ballast board cards with different power supply voltages, incandescent lamps with different powers and different powers are electrified is different, some current is pulse current, effective value or average value current is greatly different due to the value measured by different instruments, so the current values listed below are only used as comparison references, the listed current is only used for more conveniently explaining the working principle that the luminous quantity of the LED of the tester is changed along with the change of the current, and the like, the electronic ballast lamp connecting lamp tubes in the following test examples are connected by jumper wires, R1 uses 470K omega resistor, R3 uses K omega resistor, Q1 and Q2 use triodes with the model of 13002, and Q2, L used an inductance of 6mH and the incandescent lamp of the tester used a 60 watt incandescent lamp.

The electronic ballast board card is tested by the tester, and the following test examples are provided: in a test example, when the electronic ballast board card fails to be R1 or R3 is open, an LED (light emitting diode) of a tester (i) gradually turns dark from light to indicate the charging process of C1 and C2 and the existence of leakage current; in a test example, when the failure of an electronic ballast board card is Q1, R2 open circuit and the like, which cause Q1 not to work, LEDs (light, light and flicker) of a tester are bright, LEDs (dark and flicker) indicate that Q1 does not work, which causes the electronic ballast board card to work in a weak oscillation state, and the electronic ballast board card is oscillated at intervals, so that the LEDs (light, light and flicker) of the tester are enabled to flicker; in a test example, when the fault of the electronic ballast board card is a C5 short circuit, the current is about 5mA, and the LEDs of the tester are bright, bright and dark, which indicates that the electronic ballast board card works in a low-frequency oscillation state of small current; in one test case, the electronic ballastThe failure of the current device board card is about 10mA of current when C3 breaks down, LEDs (first, second and third) of the tester are bright, LEDs (second) of the tester are dark, and LEDs (second) of the tester are dark, so that the resistance values of two ends of C3 are reduced and the current is increased when C3, R1 and Q1 hit pins or break down, and the like, and the Q2 can be damaged by overheat breakdown due to long-term test; in a test example, the board card of the electronic ballast has a fault of about 20mA current when any one of diodes D1-D4 is in an open circuit, LED 0 or LED 1 of the tester is bright, and LEDs 2, 3, c and c2 flicker to indicate that the electronic ballast works in a half-wave rectification power supply fault state; in a test example, when the fault of an electronic ballast board card is C1 or C2, the current is about 10mA when the electronic ballast board card is opened, LEDs (6) and (7) of a tester are not lighted, but the LEDs (9), (0), (1) and (6) flash to indicate that the board card works in an interval oscillation state with the frequency lower than the normal frequency; in a test example, the current is about 70mA when the electronic ballast board is good, the test time is less than 1 second, the breakdown damage of Q1 and Q2 cannot be caused, LEDs of the tester are bright, 8 are bright, and LEDs 3, 4, 5 and four are bright, so that the starting current state of the electronic ballast when the electronic ballast works without being connected with a fluorescent tube is taken as the rated current of the good; in a test example, when the board card of the electronic ballast has a fault of C1 or C2 short circuit or an inductor L has a multiple turn-to-turn short circuit, the current is more than 75mA, LEDs of the tester are bright (i.e., the LEDs are bright) (i.e., the LEDs are,

The lighting and buzzer sounding indicates that the board card works in an overcurrent state; in a test example, when the board card of the electronic ballast has a fault that any one of the diodes D1-D4 is short-circuited, one of the LEDs (the group II, the group III) or the group III (the group IV) of the LEDs (the group IV) 0, the group IV 2 and the group IV 4 of the tester is bright, and the fact that an incandescent lamp is bright indicates that a positive half cycle or a negative half cycle is short-circuited due to the fault of a test object; in a test example, the board card fault of the electronic ballast is that the current is about 200mA when the positive and negative polarities of C1 and C2 are inserted reversely, an incandescent lamp of the tester is bright, and LEDs (light emitting diodes) (5, 1, 7, 3 and 5) indicate that the circuit current is large due to the insertion of the positive and negative polarities of C1 and C2, but the power supply voltages of the LEDs (first, 6, third, 8 and fifth) are not subjected to voltage loss; in a test example, when the board card of the electronic ballast fails to be in thermal breakdown at Q1 and Q2, the current is about 220mA, an incandescent lamp of the tester is turned on, and the LEDs (the first light indicator, the second light indicator, the third light indicator and the fourth light indicator) indicate that the Q1 and the Q2 are in thermal breakdown to cause electricityThe current is large, and the power supply voltage of the LED (light emitting diode) is in voltage loss; in a test example, the board card faults of the electronic ballast are that the current is about 240mA when the C3 short circuit and the Q2 thermal breakdown occur, an incandescent lamp of the tester is turned on, and the LEDs (i), (ii) and (iii) are turned on to indicate that the test current is large and the power supply voltages of the LEDs (i 0) and (i 1) are in voltage loss; in a test example, when the electronic ballast board card has a fault that both C1 and C2 touch the feet and are short-circuited, the current is about 260mA, an incandescent lamp of a tester is bright and an LED (light emitting diode) is dark, which indicates that the current is large due to the short circuit at the rectifying and filtering part of the electronic ballast board card to be tested, the power supply voltage of the LED (light emitting diode) is low, and the power supply voltages of the LED (light emitting diode); in one test example, when the incoming line of the electronic ballast board card is short-circuited, the incandescent lamp of the tester is turned on and the LEDs are turned off all the time during the test to indicate that the incoming line of the power supply of the test object is short-circuited.

The following test examples are provided for determining whether a circuit or an element in an electronic ballast board card is normal or not by using the tester, and using the tester circuit in the circuit: in one test case, the circuit is not connected with other elements in series, an incandescent lamp of the tester is turned on, and the LED is completely turned off, so that the circuit is not broken; in one test example, only inductors are connected in series in a circuit loop of a tested circuit, incandescent lamps of a tester are bright, LEDs (light emitting diodes) are bright, and the tester shows that the circuit is not broken and the inductors are not short-circuited or open-circuited; in one test case, only the inductors are connected in series in the circuit loop, and the incandescent lamp of the tester is turned on and the LED is completely turned off to indicate that the inductors are short-circuited.

The tester is used for measuring C4 in an electronic ballast circuit, and when the measuring time is less than 1 second, the components are not easy to be damaged even if a circuit fails, and the following test examples are provided: in a test example, when a triode, a diode, a resistor and the like in a C4 loop are normal, an incandescent lamp of a tester is on, and LEDs (light emitting diode) and LED (light emitting diode) are on; in a test example, when R4 and the like in a C4 loop are open, the same result as that of the single test of C4 is obtained, an incandescent lamp of a tester is turned on, and LEDs (first, second, third and fourth) are turned on to show that elements in the C4 loop are open, so that the test result is the same as that of the single test of C4; in a test example, when a triode Q2 or a diode D5 in a C4 loop is open, an incandescent lamp of a tester is bright, LEDs (first) and (second) are bright, and LEDs (third) or (fourth) are bright to indicate that Q2 or D5 is open; in one test example, when the two legs of C4 were shorted, the incandescent lamp of the tester was on and the LED was off.

The collector and the emitter of the triode are tested in the circuit of the electronic ballast by the tester, the output end of the live wire (L) is connected with the collector, the output end of the zero wire (N) is connected with the emitter, and the groups of the LED on and off are different when the LED is reversely connected for testing, so that the tester has the following test examples: in a test example, the electronic ballast board is good, an incandescent lamp of the tester flashes when testing Q2, and LEDs (light) indicate that the LEDs (light) do not flash when measuring the negative half-cycle short circuit voltage loss when measuring the triode (light); in a test example, the electronic ballast board is good, when testing Q1, an incandescent lamp of the tester is flashing, LEDs are bright, and the LEDs are flashing, which indicates that the LEDs are not bright in the first, third and fifth stages caused by negative half-cycle short circuit and voltage loss when testing the triode, and the voltage applied when testing Q1 can also make the electronic ballast oscillate at intervals to cause the LEDs of the tester to flash; in a test example, the short circuit between B, E poles of Q1 and the open circuit of R2 in the electronic ballast board card cause the fault that Q1 does not work, and the voltage applied when testing Q1 can also make the electronic ballast oscillate at intervals to cause the LED of the tester to flicker; in a test example, when R1 and R3 in an electronic ballast board circuit are inserted with resistors with small resistance values in a staggered mode for R2, Q1 and Q2 work abnormally or Q1 and Q2 break down thermally, an LED of a tester is dark when the Q1 or Q2 is tested, and an incandescent lamp is bright to indicate that Q1 and Q2 work abnormally or the current is large due to thermal breakdown; in a test example, when the electronic ballast board circuit has faults such as open circuit of Q1 or Q2 or D5, incandescent lamps and LEDs of the tester will change correspondingly.

In the partial test of testing the electronic ballast board card by using the tester, the part of the electronic ballast board card only has the fault board card of the first light LED and the second light LED, the tester tests L, Q1, Q2, C4 and the like without finding faults, the alternating voltage grade of the multimeter can be used for measuring the midpoint voltage output by the half-bridge inverter circuit, namely the voltage from the output end of L1-2 to the L section of the inductor, the alternating voltage grade of the multimeter needs to be connected with a series resonant circuit in parallel to be used as a dummy load for measuring the midpoint voltage, and the fault is judged to be in the half-bridge inverter circuit or the series resonant circuit, and the test example comprises the: in one test example, a tester is used for supplying power, and a multimeter alternating voltage is used for testing the rectified and filtered voltage of the electronic ballast and is used as a reference voltage VCC. In a test example, when a tester supplies power, and a multimeter alternating voltage gear measures a midpoint voltage, the tester changes from the first LED and the second LED to the first LED, the second LED, the third LED and the fourth LED, which indicate that a fault exists in a series resonant circuit, after the tester is powered on, two test pens of the multimeter are used for testing the series resonant circuit, the tester changes from the first LED and the second LED to the first LED, the second LED, the third LED and the fourth LED which reflect the fault, and when the tester measures C5 by using a universal test pen, the first LED and the second LED which change into the first LED, the second LED, the third LED and the fourth LED which can judge that the C5 fails or is out of welding after eliminating an inductive short circuit; in a test example, a fault that Q1 does not work is caused by an open circuit between B, E poles of Q1, an open circuit between C, E poles of Q1 or a short circuit between B, E poles of Q1 in an electronic ballast board card, and the like, when a midpoint voltage is measured by using a multimeter alternating voltage level after the electronic ballast board is powered on, an LED (light emitting diode) of a tester (light emitting diode) turns on and flashes (light emitting diode) to indicate that the electronic ballast oscillates at intervals, and the voltage value is about 1/3 VCC; in a test example, when the midpoint voltage is measured by using a multimeter alternating voltage gear after power-on, the voltage is about 1/10VCC, the midpoint voltage is measured after short circuit C4, LEDs (first, second, third and fourth) of the tester are turned on into LEDs (first, second, third and fourth), and the LEDs (first, second, third and fourth) are kept unchanged after the multimeter pen is removed, so that the C4 is indicated to be invalid; in a test example, a tester supplies power to an electronic ballast board card, the alternating voltage of a multimeter is used for measuring the midpoint voltage of about 1/10VCC, the midpoint voltage is measured after the alternating voltage of the multimeter is short-circuited C4, LEDs (light emitting diodes) of the tester are unchanged, the midpoint voltage is about 1/2VCC, and the fault mainly is the inductance problem of a magnetic ring L1; in a test example, after power-on or after short circuit C4, when the midpoint voltage is measured to be other voltages by using a multimeter AC voltage range, the fault location can be quickly searched according to the working principle of the electronic ballast.

In a preferred embodiment, the circuits for the tester LED (r) -ninthly to indicate current are provided with potentiometer adjustments to accommodate electronic ballasts of different powers.

In a preferred embodiment, the overcurrent indication only needs a positive half cycle or negative half cycle overcurrent detection and indication circuit to meet the indication requirement.

In a preferred embodiment, a simplified tester only comprising a current limiting circuit, an anti-interference circuit and a rated current indicating circuit is used as a power supply circuit, the power supply output end of the tester only comprising the current limiting circuit, the anti-interference circuit and the rated current indicating circuit is connected with a plurality of solid-state relays controlled by a single chip microcomputer, each solid-state relay is contacted with one electronic ballast board in an entire plate to be tested placed on a test frame through a telescopic thimble clamp to supply power, the solid-state relays are controlled by the single chip microcomputer to supply power one by one, the single chip microcomputer detects the state of a rated current indicating LED (light emitting diode) while supplying power one by one for judging whether the tested object is good or not and outputting an indication, and the testing efficiency can be further.

Although the present invention has been described with reference to the accompanying drawings, the present invention is not limited to the above embodiments, which are only illustrative and not restrictive, and those skilled in the art can make many modifications without departing from the spirit of the present invention, and these modifications are within the scope of the present invention.

Claims

1. The utility model provides a tester with multiunit LED instruction electronic ballast test current which characterized in that: the LED detection circuit comprises an incandescent lamp current limiting circuit, an anti-interference circuit, a circuit for indicating negative half cycle overcurrent current by an LED, a circuit for indicating positive half cycle overcurrent current by an LED, a circuit for indicating negative half cycle rated current by an LED, a circuit for indicating positive half cycle rated current by an LED, a circuit for joint indication and a circuit for indicating test current by 5 grouped LEDs;

the incandescent lamp current limiting circuit supplies current by using an incandescent lamp, and mains supply supplies power to the indicating circuit of the tester and supplies power for a test object after the current of the incandescent lamp is limited, so that the element is prevented from being damaged by large current when the test object fails; the anti-interference circuit is connected with the incandescent lamp current limiting circuit and is provided with an inductance-capacitance filter circuit for filtering the interference of the power grid power supply and preventing the interference of the power grid power supply; the LED uses a white light emitting diode; the positive half cycle refers to a positive half cycle when a live wire and a zero line input by 220V of commercial power are positive and negative, and a negative half cycle when the live wire and the zero line are positive; the LED indicates a circuit of negative half-cycle overcurrent current, the LED indicates a circuit of positive half-cycle overcurrent current, the LED indicates a circuit of negative half-cycle rated current, the LED indicates a circuit of positive half-cycle rated current, the combined indicating circuit and the 5 grouped LEDs indicate a circuit of test current, a voltage drop generated by current flowing through a resistor is amplified by a triode to drive the LED to emit light to indicate the current, the power supply of the LED uses a half-wave rectification switching power supply, and the switching power supply working at input voltage from AC20V to AC240V is used;

the circuit for indicating the negative half cycle overcurrent current by the LED is connected with the anti-interference circuit, is provided with a circuit for detecting and indicating the negative half cycle overcurrent and is used for realizing overcurrent indication of the negative half cycle current; the circuit for indicating the positive half cycle overcurrent current by the LED is connected with the anti-interference circuit, is provided with a circuit for detecting and indicating the positive half cycle overcurrent and is used for realizing the overcurrent indication of the positive half cycle current; the circuit for indicating the negative half cycle rated current by the LED is connected with the circuit for indicating the negative half cycle overcurrent current by the LED, and is provided with a circuit for detecting and indicating the negative half cycle rated current and used for indicating the rated current of the negative half cycle current; the circuit for indicating the positive half-cycle rated current by the LED is connected with the circuit for indicating the positive half-cycle overcurrent current by the LED, and is provided with a circuit for detecting and indicating the positive half-cycle rated current for realizing the indication of the positive half-cycle rated current; the circuit for indicating the negative half-cycle rated current or the positive half-cycle rated current by the LED is used for judging whether the electronic ballast works in a half-wave rectification fault state only indicated by the negative half-cycle rated current or the positive half-cycle rated current or a good product indicating state with rated current indication both in the negative half-cycle and the positive half-cycle;

the combined indicating circuit is provided with a circuit for indicating overcurrent current by audible and visual alarm and a circuit for indicating rated current by an LED; the circuit for indicating overcurrent current by the acousto-optic alarm is provided with an LED and a buzzer for acousto-optic alarm; the circuit of the LED indicating rated current is provided with an extension line to lead the LED out to a power supply test pen of the output end to emit light for indicating good products; the circuit of the combined indication is respectively connected with the circuit of the LED indicating the negative half-cycle overcurrent current, the circuit of the LED indicating the positive half-cycle overcurrent current, the circuit of the LED indicating the negative half-cycle rated current and the circuit of the LED indicating the positive half-cycle rated current, so as to realize the sound and light alarm indication when the tested electronic ballast works in the overcurrent state that the incandescent lamp is not bright and the LED luminescence indication when the tested electronic ballast works in the negative half-cycle and the positive half-cycle which are both rated currents;

the circuit of the 5 grouped LEDs for indicating the test current is respectively connected with the circuit of the LED for indicating the negative half cycle rated current and the circuit of the LED for indicating the positive half cycle rated current, wherein the 5 grouped LEDs comprise a first LED, a second LED, a third LED, a fourth LED and a fifth LED, the circuit of the third LED and the fifth LED for indicating the test current supplied by the negative half cycle half-wave rectifier switch power supply is used for indicating the test current of the tested object and detecting whether the negative half cycle voltage is in voltage loss or not; the circuit comprises a second LED indicating test current circuit and a fourth LED indicating test current circuit which are powered by a positive half-cycle half-wave rectification switch power supply and are used for indicating the test current of a tested object and detecting whether positive half-cycle voltage is in voltage loss or not; the circuit comprises a circuit for indicating test current by a first LED (light emitting diode) powered by a negative half-cycle half-wave rectification step-down power supply, and is used for indicating the test current of a tested object and detecting whether negative half-cycle voltage is in voltage loss; the first LED, the third LED and the fifth LED which are powered by commercial power negative half cycle current are in one group, and the second LED and the fourth LED which are powered by commercial power positive half cycle current are in one group; testing the electronic ballast, wherein when the incandescent lamp is not on, the luminous quantity of the 5 grouped LEDs is increased along with the increase of the current until the incandescent lamp is fully on, and when the incandescent lamp is on, the luminous quantity of the 5 grouped LEDs is reduced along with the increase of the current until the incandescent lamp is fully off; the on or off of each group of LEDs, the number of LED flickers, the brightness of the LED flickers and the frequency of the LED flickers can reflect different test currents, and defective products can be quickly judged according to different states of the LEDs during testing.