CN108215523A - Mark bogey and marking machine - Google Patents
Mark bogey and marking machine Download PDFInfo
- Publication number
- CN108215523A CN108215523A CN201810043587.2A CN201810043587A CN108215523A CN 108215523 A CN108215523 A CN 108215523A CN 201810043587 A CN201810043587 A CN 201810043587A CN 108215523 A CN108215523 A CN 108215523A
- Authority
- CN
- China
- Prior art keywords
- mark
- microscope carrier
- bogey
- locating piece
- glass substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J3/00—Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed
- B41J3/407—Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed for marking on special material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J11/00—Devices or arrangements of selective printing mechanisms, e.g. ink-jet printers or thermal printers, for supporting or handling copy material in sheet or web form
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
The present invention relates to a kind of mark bogey and marking machines.The mark bogey includes：Microscope carrier, the positioning device around the microscope carrier, the positioning device include pedestal, locating piece and Locating driver structure, wherein the locating piece is set higher than the microscope carrier；The Locating driver structure drives the relatively described microscope carrier of locating piece to move up and down in the vertical direction.According to an embodiment of the invention, it can be by the way that positioning device be set as liftable structure, so that when being positioned to the glass substrate, the locating piece of the positioning device, which is in, adjusts height, be conducive to the positioning of glass substrate, certainly for warpage or the glass substrate of the softer more difficult positioning of grade, also can effectively be positioned.
Description
Technical field
The present invention relates to display technology field more particularly to a kind of mark bogeys and marking machine.
Background technology
In display technology field, mark is often referred to using marking equipment (such as marking machine) in glass substrate, display base
The mark operation of the identification codes such as the enterprising style of writing word of the substrates such as plate, picture.When carrying out mark operation, it is necessary first to which substrate is carried out
Positioning, so that mark operation can carry out qualified position on substrate.Used by substrate being positioned in the relevant technologies
Base positioner is not that ideal effect is attained by the positioning of all substrates, for example, substrate warp or it is softer when, then
It is not accurate enough to be easy to cause substrate positioning, so as to influence the qualification rate of mark.
Invention content
The present invention provides mark bogey and marking machine, to solve the deficiency in the relevant technologies.
It is according to embodiments of the present invention in a first aspect, a kind of mark bogey is provided, including microscope carrier, set on the microscope carrier
The positioning device of surrounding；The positioning device includes pedestal, locating piece and Locating driver structure, wherein the locating piece is higher than institute
State microscope carrier setting；The Locating driver structure drives the relatively described microscope carrier of locating piece to move up and down in the vertical direction.
In one embodiment, the Locating driver structure is telescopic cylinder.
In one embodiment, described device further includes control unit；When the glass substrate quilt being placed on the microscope carrier
During adjustment, described control unit controls the locating piece of the positioning device to be raised up to adjustment height, after adjustment described in control
The locating piece of positioning device drops to elemental height.
In one embodiment, the positioning device further includes adjustment structure, the adjustment structure control positioning dress
It puts and makees forward and backward, left or right movement in the horizontal direction.
In one embodiment, the microscope carrier includes microscope carrier main part and microscope carrier lifting unit；Or described device further includes control
Make the Linear slide platform cylinder that the microscope carrier lifting unit moves up and down in the vertical direction.
In one embodiment, described device further includes the air blowing knot for adjusting glass substrate position on the microscope carrier
Structure.
In one embodiment, the pumping that described device is further included for the glass substrate to be located on the microscope carrier is true
Hollow structure.
Second aspect according to embodiments of the present invention provides a kind of marking machine, including be used for mark mark unit and
Above-mentioned mark bogey.
In one embodiment, the marking machine further includes the guide rail coordinated with the microscope carrier；The mark bogey
The lower section for being moved to mark unit after the glass substrate is positioned by guide rail carries out mark.
In one embodiment, the marking machine further includes the edge exposure unit set higher than the microscope carrier.
According to above-described embodiment it is found that by the way that positioning device is set as liftable structure so as to the glass base
When plate is positioned, the locating piece of the positioning device, which is in, adjusts height, is conducive to the positioning of glass substrate, certainly for sticking up
The glass substrate of the more difficult positioning of bent or softer grade, also can effectively be positioned.So as to improve the qualification rate of glass substrate mark.
In addition, after being positioned to glass substrate, by the near elemental height of locating piece, it is ensured that mark bogey in movement
It will not mutually be touched between other devices because of the height of positioning device in the process.
It should be understood that above general description and following detailed description are only exemplary and explanatory, not
It can the limitation present invention.
Description of the drawings
Attached drawing herein is incorporated into specification and forms the part of this specification, shows the implementation for meeting the present invention
Example, and be used to explain the principle of the present invention together with specification.
Fig. 1 is the side structure schematic diagram of a kind of mark bogey shown according to embodiments of the present invention；
Fig. 2 is the partial structural diagram that the locating piece of mark bogey shown in Fig. 1 rises to adjustment height；
Fig. 3 is that the locating piece of mark bogey shown in Fig. 1 drops to the partial structural diagram of elemental height；
Fig. 4 to Fig. 9 is the process schematic of the positioning glass substrate of mark bogey；
Figure 10 is the side structure schematic diagram of a kind of marking machine shown according to embodiments of the present invention；
Figure 11 is the partial structural diagram at a visual angle of marking machine shown in Figure 10.
Specific embodiment
Here exemplary embodiment will be illustrated in detail, example is illustrated in the accompanying drawings.Following description is related to
During attached drawing, unless otherwise indicated, the same numbers in different attached drawings represent the same or similar element.Following exemplary embodiment
Described in embodiment do not represent and the consistent all embodiments of the present invention.On the contrary, they be only with it is such as appended
The example of the consistent device and method of some aspects being described in detail in claims, of the invention.
Fig. 1 is the structure diagram of a kind of mark bogey 100 shown according to embodiments of the present invention.The mark carries
Device can be applied to the mark in substrates such as glass substrate, display base plates.
The mark bogey 100 includes microscope carrier 10, multiple positioning devices 20 around the microscope carrier.
The positioning device 20 includes pedestal 201, locating piece 202 and Locating driver structure (not shown).The pedestal 201
Setting is connect with the side of the microscope carrier 10.One end of the Locating driver structure is set to locating piece 202, and the other end is set to
Pedestal 201.The locating piece 202 is set on the pedestal 201, so that the locating piece 202 is set higher than the microscope carrier 10
It puts.When the mark bogey 100 needs to position the glass substrate, described in the Locating driver structure driving
Locating piece 202 can relatively described microscope carrier 10 move up and down in the vertical direction.
The shape of the locating piece 202 can be cylinder, cuboid etc..The size and shape of the locating piece 202 can
It is configured according to concrete application environment, the application does not limit this.Positioning device 20 in the mark bogey 100
Number be more than or equal to 3 such as 4,5,6,7,8 ... etc..The number of the positioning device 20 can be according to concrete application ring
Border is configured, for example can be set according to the size and shape of microscope carrier or the size of glass substrate to be positioned and shape etc.
It puts.In one embodiment, the upper surface of microscope carrier 10 is rectangle, and microscope carrier 10 includes four sides 1012,1013,1014 and 1015,
The number of positioning device 20 is 4 (can combine Fig. 9).For ease of distinguishing, the locating piece of 4 positioning devices 20 is respectively
202a, 202b, 202c and 202d.4 positioning device 20 can connect setting with four sides of the microscope carrier 10 respectively.It is fixed
Position part 202a, 202b, 202c and 202d and the correspondence of side 1012,1013,1014 and 1015 are as shown in Figure 9.Optionally,
4 positioning device 20 can be respectively arranged at the centre position of each side, naturally it is also possible to be set to other positions of each side
It puts.So that when being positioned to glass substrate, it can be using wherein one or two side of the microscope carrier 10 as true edge, tool
Body sees below associated description.
In some embodiments, the Locating driver structure is telescopic cylinder.Certainly, in further embodiments, it is described
Locating driver structure is alternatively other kinds of driving cylinder, such as Linear slide platform cylinder etc..The Locating driver structure can root
It is set according to concrete application environment, the application does not limit this.
Further, the mark bogey 100 further includes control unit (not shown).When being placed on the microscope carrier 10
On glass substrate 30 when being adjusted, it is high that described control unit controls the locating piece 202 of the positioning device 20 to be raised up to adjustment
Degree, and the locating piece 202 of the positioning device 20 is controlled to drop to elemental height after adjustment.In the specific implementation, institute
It states control unit and realizes the lifting for controlling the locating piece 202 by controlling the Locating driver structure, so as to make locating piece
202 are adjusted to adjustment height or elemental height.
After the adjustment highly refers to the rise of locating piece 202, the locating piece 202 is higher by 10 upper surface of microscope carrier
1011 height, such as distance 222 of the upper surface 2021 of the locating piece 202 away from 10 upper surface 1011 of microscope carrier.And institute
When stating elemental height and referring to the locating piece 202 and do not rise, the locating piece 202 is higher by the height of the microscope carrier upper surface 1011,
Such as distance 221 of the upper surface 2021 of the locating piece 202 away from 10 upper surface 1011 of microscope carrier.Optionally, the positioning
The ranging from 5mm to 20mm of the adjustment height of part 202, the ranging from 1mm to 3mm of the elemental height of the locating piece 202.One
In a little alternative embodiments, the adjustment height of the locating piece 202 is 10mm, and the elemental height of the locating piece 202 (can for 2mm
With reference to Fig. 2 and Fig. 3).Certainly, the adjustment height and elemental height are alternatively other numerical value.Specifically it is described adjustment height and
Elemental height can be configured according to application environment, and the application does not limit this.
Further, the positioning device 20 further includes adjustment structure (not shown), and the adjustment structure control is described fixed
Position device 20 moves in the horizontal direction to forward and backward, left or right.Certainly, the adjustment structure also can control the positioning device
20 make the movement except other directions forward and backward, in addition to left and right (i.e. to the several directions of forward and backward, left and right in the horizontal direction
Combinations of directions moves).Specifically, forward and backward, the left and right of 20 moving direction of positioning device can refer to corresponding side in Fig. 1
To mark.
In some embodiments, the microscope carrier 10 includes microscope carrier main part 101 and microscope carrier lifting unit 102.The microscope carrier liter
Drop portion 102 can be the shapes such as cylinder, cuboid.Size (length, width, height), the shape of the microscope carrier lifting unit 102
Shape and 102 raised height of microscope carrier lifting unit can be configured according to concrete application environment, and the application does not limit this.Into one
Step, the mark bogey 100 further includes the load that the microscope carrier lifting unit 102 is controlled to move up and down in the vertical direction
Platform driving structure, such as Linear slide platform cylinder.Wherein, the microscope carrier driving structure can also be controlled by above-mentioned control unit.
Certainly, in further embodiments, the microscope carrier 10 can be only microscope carrier main body, wherein, the microscope carrier main body 101 can do lifting fortune
It is dynamic, so as to bearing glass substrate.
Further, the mark bogey 100 further includes to adjust glass substrate 30 in the position of the microscope carrier 10
The blowing structure (not shown) put.The use of the blowing structure also helps the cleaning of the glass substrate 30 and microscope carrier 10,
And be conducive to the glass substrate 30 after the completion of mark and detached with the microscope carrier 10.
Further, the mark bogey 100 further includes the glass substrate 30 being located in the microscope carrier
On Vacuuming structure (not shown).After the locating piece 202 positions glass substrate 30, the Vacuuming structure is taken out
Vacuum, so that the lower surface of the glass substrate 30 is adsorbed in the upper surface 1011 of the microscope carrier 10, it is described to further fix
Glass substrate 30.
Further, the mark bogey 100 further includes the pipeline configuration 105 being set in microscope carrier main body 101, institute
It states pipeline configuration 105 and includes multiple pipelines.Above-mentioned blowing structure and Vacuuming structure can be by pipeline configurations 105 to the load
The glass substrate 30 of 10 upper surface 1011 of platform is blown or is vacuumized.It should be noted that the blowing structure and pumping are true
Hollow structure also can be controlled by above-mentioned control unit.
Following combination Fig. 4 to Fig. 9, the process positioned to the mark bogey 100 to glass substrate 30 carry out
Explanation.When needing to carry out mark to glass substrate, described control unit sends to the microscope carrier driving structure and rises the load
The control signal of platform lifting unit 102, the microscope carrier driving structure drive the microscope carrier to lift after the control signal is received
Portion 102 rises from inside the microscope carrier, and glass substrate 30 is placed on the microscope carrier lifting unit 102 (with reference to Fig. 4).Into
And the microscope carrier lifting unit 102 declines, until the glass substrate 30 is placed in the microscope carrier main body 101.At the same time, it is described
Control unit control positioning drive unit drives the locating piece 202 to be raised up to adjustment height.It is placed in glass substrate 30 described
After in microscope carrier main body 101, described control unit starts the blowing structure.The blowing structure passes through the pipeline configuration
105 pairs of glass substrates 30 are blown (with reference to Fig. 5).After blowing structure blows to glass substrate 30, the adjusting
The movement (with reference to Fig. 6 and Fig. 7) of locating piece 202 described in structural adjustment in the horizontal direction, to be carried out to the glass substrate 30
Adjustment positioning.And after adjustment positions, stop the blowing structure and blow, and then (knot is vacuumized using Vacuuming structure
Close Fig. 8) so that the lower surface of the glass substrate 30 is bonded with the upper surface 1011 of the microscope carrier 10.Certainly it can also blow
While depressed structure blows to glass substrate 30, the movement of adjustment structure adjustment locating piece 202 in the horizontal direction.In addition,
While vacuumizing work, described control unit control positioning drive unit drives the locating piece 202 to decline, and is down to initial
Highly.So as to the movement of follow-up mark load bearing unit.Certainly, it can also be controlled after Vacuuming structure carries out vacuumizing completion
Positioning drive unit drives the locating piece 202 to decline.The application is not construed as limiting this, can be set according to concrete application environment
It puts.
It should be noted that described control unit control positioning drive unit drives the action that the locating piece 202 rises,
It also can only be needed to protect while the microscope carrier lifting unit 102 rises or declines before the microscope carrier lifting unit 102 rise
It demonstrate,proves and the locating piece 202 is risen into adjustment height before adjustment structure adjusts the movement of the locating piece 202 in the horizontal direction
Degree.
Specifically, when being adjusted positioning to glass substrate 30, can implement as follows, it is false with reference to Fig. 9
Such as side, adjustment structure first adjust the corresponding locating piece 202a and 202b of true edge on the basis of 10 side 1012 and 1013 of microscope carrier,
Locating piece 202a and 202b are moved respectively to the side of glass substrate 30 301 and 302, until locating piece 202a and 202b distinguish
It is bonded with the side 301 and 302 of the glass substrate 30.If some 10 upper surface of offset microscope carrier, 1011 centre positions of glass substrate
When, the locating piece 202a and 202b can push the side 301 and 302 of glass substrate 30 to 10 upper surface 1011 of microscope carrier respectively
It moves in centre position.Later, locating piece 202a and 202b and glass substrate 30 remain stationary as, and adjustment structure adjusts locating piece
303 and 304 displacement of side of the difference glass substrate 30 of 202c and 202d, until the locating piece 202c and 202d respectively with institute
The side 303 and 304 for stating glass substrate 30 is bonded.It should be noted that by adjustment structure to the glass substrate 30 into
During row positioning, the blowing structure can always blow to the lower surface (not shown) of the glass substrate 30, so that glass
Substrate 30 and the contact force of the microscope carrier 10 are sufficiently small, so as to reduce or avoid the friction between glass substrate 30 and microscope carrier, have
Conducive to the abrasion of reduction glass substrate 30, and be conducive to the adjusting of the glass substrate 30.
The advantageous effect of the present embodiment is：By the way that positioning device is set as liftable structure so as to the glass
When substrate is positioned, the locating piece of the positioning device, which is in, adjusts height, is conducive to the positioning of glass substrate.For warpage
Or the glass substrate of the softer more difficult positioning of grade, also can effectively it be positioned.Be conducive to improve the accuracy of glass substrate positioning, from
And improve the qualification rate of glass substrate mark.In addition, after being positioned to glass substrate, by the near initial height of locating piece
Degree, it is ensured that mark bogey will not touch in moving process because of the height of positioning device between other devices
It touches.
In addition, the present invention also provides a kind of marking machines.The marking machine is included for the mark unit 40 of mark and above-mentioned
Mark bogey 100 (Figure 10 and Figure 11 can be combined).
Further, the marking machine further includes the guide rail 50 coordinated with the microscope carrier 10.Correspondingly, the marking machine is also
Including the track driving structure coordinated with guide rail 50, for the mark bogey 100 to be driven to be moved on guide rail 50.So that
After the mark bogey 100 positions the glass substrate 30, mark unit 40 is moved to along direction 70 by guide rail 50
Lower section carry out mark.
Further, the marking machine further includes the edge exposure unit 60 set higher than the microscope carrier 10.
After the mark bogey 100 completes glass substrate positioning.The mark bogey 100 is described
Right-to-left moves under the action of guide rail 50, after 60 lower section of exposing unit, reaches the lower section of the mark unit 40.It is logical
The upper surface of microscope carrier 10 and the distance 611 of 60 lower end of exposing unit are less than 10mm in Chang Suoshu marks bogey 100, than
Such as distance is 5mm.And the locating piece 202 of above-mentioned mark bogey 100 can drop after being positioned to the glass substrate
Extremely it is less than 5mm hereinafter, such as 2mm.
The advantageous effect of the present embodiment is：By the way that positioning device is set as liftable structure, carried out to glass substrate
After positioning, the locating piece of positioning device is down to elemental height, it is ensured that mark bogey is moved to mark unit
In the process, the devices such as edge exposure unit will not be encountered, i.e., while the accuracy for improving glass substrate positioning, ensure that and beat
Mark safety of the bogey in moving process.
In the present invention, term " first ", " second " are only used for description purpose, and it is not intended that instruction or hint are opposite
Importance.Term " multiple " refers to two or more, unless otherwise restricted clearly.Unless otherwise noted, "front", "rear",
The similar word such as "left", "right", " under " and/or " on " is not limited to a position or one kind only to facilitate explanation
Spatial orientation.
Those skilled in the art will readily occur to the present invention its after considering specification and putting into practice disclosure disclosed herein
Its embodiment.The present invention is directed to cover the present invention any variations, uses, or adaptations, these modifications, purposes or
Person's adaptive change follows the general principle of the present invention and including undocumented common knowledge in the art of the invention
Or conventional techniques.Description and embodiments are considered only as illustratively, and true scope and spirit of the invention are by following
Claim is pointed out.
It should be understood that the invention is not limited in the precision architecture for being described above and being shown in the drawings, and
And various modifications and changes may be made without departing from the scope thereof.The scope of the present invention is only limited by appended claim.
Claims (10)
1. a kind of mark bogey, multiple positioning devices including microscope carrier, around the microscope carrier, it is characterised in that：Institute
It states positioning device and includes pedestal, locating piece and Locating driver structure, wherein the locating piece is set higher than the microscope carrier；It is described fixed
Position driving structure drives the relatively described microscope carrier of locating piece to move up and down in the vertical direction.
2. mark bogey according to claim 1, which is characterized in that the Locating driver structure is telescopic cylinder.
3. mark bogey according to claim 1, which is characterized in that described device further includes control unit；When putting
It puts when the glass substrate on the microscope carrier is adjusted, described control unit controls the locating piece of the positioning device to be raised up to tune
Whole height controls the locating piece of the positioning device to drop to elemental height after adjustment.
4. mark bogey according to claim 1, which is characterized in that the positioning device further includes adjustment structure,
The adjustment structure controls the positioning device to make forward and backward, left or right movement in the horizontal direction.
5. mark bogey according to claim 1, which is characterized in that the microscope carrier includes microscope carrier main part and carries
Platform lifting unit；Or described device further includes the microscope carrier driving knot that the microscope carrier lifting unit is controlled to move up and down in the vertical direction
Structure.
6. mark bogey according to claim 1, which is characterized in that described device further includes to adjust glass base
The blowing structure of plate position on the microscope carrier.
7. mark bogey according to claim 1, which is characterized in that described device is further included for by the glass
Substrate is located in the Vacuuming structure on the microscope carrier.
8. a kind of marking machine, which is characterized in that including being used for the mark unit of mark and as described in 1 to 7 any one of power
Mark bogey.
9. marking machine according to claim 8, which is characterized in that the marking machine is further included leads with what the microscope carrier coordinated
Rail；The mark bogey is moved to mark unit by guide rail lower section after the glass substrate is positioned carries out mark.
10. marking machine according to claim 8, which is characterized in that the marking machine is further included to be set higher than the microscope carrier
Edge exposure unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810043587.2A CN108215523B (en) | 2018-01-17 | 2018-01-17 | Mark bogey and marking machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810043587.2A CN108215523B (en) | 2018-01-17 | 2018-01-17 | Mark bogey and marking machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108215523A true CN108215523A (en) | 2018-06-29 |
| CN108215523B CN108215523B (en) | 2019-06-11 |
Family
ID=62641295
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810043587.2A Expired - Fee Related CN108215523B (en) | 2018-01-17 | 2018-01-17 | Mark bogey and marking machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108215523B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1785673A (en) * | 2004-12-08 | 2006-06-14 | 精工爱普生株式会社 | Liquid droplet ejection device, liquid droplet ejection method, electro-optical device and manufacturing method of electro-optical device |
| CN204977837U (en) * | 2015-07-22 | 2016-01-20 | 郑州乐彩科技股份有限公司 | Character spouts seal machine and rotatory rectifying system thereof |
| US20170341425A1 (en) * | 2016-05-25 | 2017-11-30 | Electronics For Imaging, Inc. | Multiple zone printer vacuum tables, systems and methods |
-
2018
- 2018-01-17 CN CN201810043587.2A patent/CN108215523B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1785673A (en) * | 2004-12-08 | 2006-06-14 | 精工爱普生株式会社 | Liquid droplet ejection device, liquid droplet ejection method, electro-optical device and manufacturing method of electro-optical device |
| CN204977837U (en) * | 2015-07-22 | 2016-01-20 | 郑州乐彩科技股份有限公司 | Character spouts seal machine and rotatory rectifying system thereof |
| US20170341425A1 (en) * | 2016-05-25 | 2017-11-30 | Electronics For Imaging, Inc. | Multiple zone printer vacuum tables, systems and methods |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108215523B (en) | 2019-06-11 |
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Granted publication date: 20190611 Termination date: 20220117 |