CN108172663B - A packaging method and packaging structure of a ZnMgO solar-blind ultraviolet detector - Google Patents
A packaging method and packaging structure of a ZnMgO solar-blind ultraviolet detector Download PDFInfo
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- H10F71/125—The active layers comprising only Group II-VI materials, e.g. CdS, ZnS or CdTe
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- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
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Abstract
本申请提供一种ZnMgO日盲紫外探测器的封装方法及封装结构,通过将ZnMgO日盲紫外探测器芯片固定在底座上,再由金属丝将叉指电极引出作为ZnMgO日盲紫外探测器封装结构的针脚,然后通过可透过紫外线的封装胶对ZnMgO日盲紫外探测器芯片进行封装,并采用环氧树脂对裸露的金属丝以及连接部分进行封装,从而形成完整的ZnMgO日盲紫外探测器封装结构,以便于在实验室之外的区域进行使用,扩展了ZnMgO日盲紫外探测器芯片的使用范围,使得ZnMgO日盲紫外探测器芯片更加实用化。当器件暴露在大气中使用时,性能参数稳定。同时引出的针脚使得器件可以即插即用,克服了未封装的芯片只能在实验室测试的弱点。
This application provides a packaging method and packaging structure of a ZnMgO solar-blind ultraviolet detector. The chip of the ZnMgO solar-blind ultraviolet detector is fixed on the base, and the interdigitated electrodes are led out by metal wires as the packaging structure of the ZnMgO solar-blind ultraviolet detector. Then package the ZnMgO solar-blind UV detector chip with UV-permeable packaging glue, and use epoxy resin to package the exposed metal wires and connecting parts to form a complete ZnMgO solar-blind UV detector package The structure is convenient for use in areas outside the laboratory, and the application range of the ZnMgO solar-blind ultraviolet detector chip is expanded, making the ZnMgO solar-blind ultraviolet detector chip more practical. The performance parameters are stable when the device is used exposed to the atmosphere. The pins drawn out at the same time make the device plug and play, overcoming the weakness that unpackaged chips can only be tested in the laboratory.
Description
技术领域technical field
本发明属于半导体光电探测器制作技术领域,尤其涉及一种ZnMgO日盲紫外探测器的封装方法及封装结构。The invention belongs to the technical field of semiconductor photodetector manufacture, and in particular relates to a packaging method and packaging structure of a ZnMgO solar-blind ultraviolet detector.
背景技术Background technique
紫外探测技术可用于军事通信、导弹尾焰探测、火灾预警、环境监测、生物效应等方面,无论在军事上还是在民用上都有广泛的应用。由于大气层的强烈吸收,使得太阳辐射中波长低于280nm的紫外线在地表几乎不存在,这一紫外波段被形象地称为日盲波段。工作在这一波段的日盲紫外探测器不受太阳辐射的干扰,具有更高的灵敏度,在弱信号探测方面具有突出的优势。Ultraviolet detection technology can be used in military communications, missile tail flame detection, fire early warning, environmental monitoring, biological effects, etc., and has a wide range of applications in both military and civilian applications. Due to the strong absorption of the atmosphere, ultraviolet rays with a wavelength below 280nm in solar radiation are almost non-existent on the surface of the earth. This ultraviolet band is vividly called the solar blind band. The solar-blind ultraviolet detector working in this band is not interfered by solar radiation, has higher sensitivity, and has outstanding advantages in weak signal detection.
目前,己投入商用的紫外探测器主要有硅探测器、光电倍增管和半导体探测器。硅基紫外光电管需要附带滤光片,光电倍增管则需要在高电压下工作,而且体积笨重、效率低、易损坏且成本较高,对于实际应用有一定的局限性。相对硅探测器和光电倍增管来说,由于半导体材料具有携带方便、造价低、响应度高等优点而备受关注。At present, the ultraviolet detectors that have been put into commercial use mainly include silicon detectors, photomultiplier tubes and semiconductor detectors. Silicon-based ultraviolet photocells need to be accompanied by filters, and photomultiplier tubes need to work at high voltages, and they are bulky, low in efficiency, easy to damage, and high in cost, which has certain limitations for practical applications. Compared with silicon detectors and photomultiplier tubes, semiconductor materials have attracted much attention because of their advantages such as portability, low cost, and high responsivity.
目前研究较多的半导体材料主要有III-V族的合金AlGaN和II-VI族的合金ZnMgO。目前GaN通过掺入铝能把能带调宽到日盲区,并制作成MSM和p-n等结构的探测器。但是AlGaN的生长温度高,而且高铝组份的合金结晶质量差。ZnMgO由于具有宽的带隙调节范围(从3.37eV到7.8eV)、强的抗辐射能力、高的电子饱和漂移速度、匹配的单晶衬底(ZnO和MgO)、容易合成、无毒无害、资源丰富和环境友好等优势,是制备宽禁带紫外探测器的候选材料之一。At present, the semiconductor materials that have been studied more mainly include the alloy AlGaN of the III-V group and the alloy ZnMgO of the II-VI group. At present, GaN can widen the energy band to the solar blind zone by doping aluminum, and make detectors with structures such as MSM and p-n. However, the growth temperature of AlGaN is high, and the crystal quality of the alloy with high aluminum composition is poor. ZnMgO has a wide bandgap adjustment range (from 3.37eV to 7.8eV), strong radiation resistance, high electron saturation drift velocity, matching single crystal substrate (ZnO and MgO), easy synthesis, non-toxic and harmless , abundant resources and environmental friendliness, it is one of the candidate materials for the preparation of wide bandgap ultraviolet detectors.
现有技术中已经实现了多个高性能紫外探测器的制备,但是目前紫外探测器基板上都还只是芯片,仅能用于实验室中进行参数测试,没有经过封装,无法实现广泛应用。因此,封装技术是制约ZnMgO日盲紫外探测器走向实用化的一道障碍。Many high-performance ultraviolet detectors have been prepared in the prior art, but at present, there are only chips on the substrate of ultraviolet detectors, which can only be used for parameter testing in the laboratory, and cannot be widely used without packaging. Therefore, packaging technology is an obstacle restricting the practical application of ZnMgO solar-blind UV detectors.
发明内容Contents of the invention
有鉴于此,本发明提供一种ZnMgO日盲紫外探测器的封装方法及封装结构,以解决现有技术中ZnMgO日盲紫外探测器芯片无法实用化的问题。In view of this, the present invention provides a packaging method and packaging structure of a ZnMgO solar-blind ultraviolet detector to solve the problem that ZnMgO solar-blind ultraviolet detector chips cannot be practically used in the prior art.
为实现上述目的,本发明提供如下技术方案:To achieve the above object, the present invention provides the following technical solutions:
一种ZnMgO日盲紫外探测器的封装方法,包括:A method for encapsulating a ZnMgO solar-blind ultraviolet detector, comprising:
提供底座、ZnMgO日盲紫外探测器芯片、两根金属丝、环氧树脂和封装胶,所述底座包括相对设置的第一表面和第二表面,以及连接所述第一表面和所述第二表面的侧面;所述ZnMgO日盲紫外探测器芯片包括衬底、ZnMgO层、叉指电极结构和两个铟粒;所述封装胶为可透过紫外线的封装胶;A base, a ZnMgO solar-blind ultraviolet detector chip, two metal wires, epoxy resin and encapsulation glue are provided, the base includes a first surface and a second surface oppositely arranged, and the first surface and the second surface are connected The side of the surface; the ZnMgO sun-blind ultraviolet detector chip includes a substrate, a ZnMgO layer, an interdigitated electrode structure and two indium particles; the packaging glue is a packaging glue that can pass through ultraviolet rays;
将所述ZnMgO日盲紫外探测器芯片固定在所述底座的第一表面;Fixing the ZnMgO solar-blind ultraviolet detector chip on the first surface of the base;
在所述底座上制作贯穿所述侧面和所述第一表面的通孔;making a through hole through the side surface and the first surface on the base;
将两根所述金属丝穿过所述通孔,所述金属丝的第一端凸出于所述第一表面,所述金属丝的第二端凸出于所述侧面;passing two metal wires through the through hole, the first ends of the metal wires protrude from the first surface, and the second ends of the metal wires protrude from the side;
将两根所述金属丝的第一端的端部分别连接至一个所述铟粒,所述金属丝的第二端作为所述ZnMgO日盲紫外探测器的针脚,其中,所述金属丝的第一端的非端部架空在所述ZnMgO日盲紫外探测器芯片和所述底座的上方;The ends of the first ends of the two metal wires are respectively connected to one of the indium grains, and the second ends of the metal wires are used as pins of the ZnMgO solar-blind ultraviolet detector, wherein the metal wires The non-end portion of the first end is overhead above the ZnMgO solar-blind ultraviolet detector chip and the base;
在所述金属丝的第一端的非端部处点所述环氧树脂,所述环氧树脂覆盖位于所述第一表面背离所述第二表面一侧的金属丝、以及所述第一表面上的通孔口;Dot the epoxy resin at the non-end of the first end of the metal wire, the epoxy resin covers the metal wire on the side of the first surface away from the second surface, and the first through-hole openings on the surface;
采用所述封装胶覆盖所述ZnMgO日盲紫外探测器芯片的叉指电极结构的叉指电极。The interdigitated electrodes of the interdigitated electrode structure of the ZnMgO solar-blind ultraviolet detector chip are covered with the packaging glue.
优选地,所述在所述底座上制作贯穿所述侧面和所述第一表面的通孔,具体包括:Preferably, the making a through hole on the base through the side surface and the first surface specifically includes:
使用钻头在所述底座上的第一表面打出两个第一孔,所述第一孔的轴线垂直于所述第一表面;using a drill to drill two first holes on the first surface of the base, the axes of the first holes are perpendicular to the first surface;
使用钻头在所述底座的侧面打出两个第二孔,所述第二孔的轴线垂直于所述侧面;drilling two second holes on the side of the base with a drill bit, the axes of the second holes being perpendicular to the side;
且所述两个第二孔与所述两个第一孔一一对应连通,形成两个通孔。And the two second holes communicate with the two first holes one by one to form two through holes.
优选地,所述将两根所述金属丝穿过所述通孔,具体包括:Preferably, passing the two metal wires through the through hole specifically includes:
将一根所述金属丝穿过一个所述第一孔与所述第二孔连通的通孔;passing one of said metal wires through a through hole through which said first hole communicates with said second hole;
将另一根所述金属丝穿过另一个所述第一孔与所述第二孔连通的通孔。Passing another said metal wire through another through hole in which said first hole communicates with said second hole.
优选地,所述将两根所述金属丝的第一端的端部分别连接至一个所述铟粒,具体包括:Preferably, the connecting the ends of the first ends of the two metal wires to one of the indium particles respectively includes:
分别将一根所述金属丝的第一端的端部按压至一个所述铟粒上,所述金属丝的第一端的非端部位置架空在所述ZnMgO日盲紫外探测器芯片和所述底座的上方;Press the end of the first end of one of the metal wires onto one of the indium grains, and the non-end position of the first end of the metal wire is suspended between the ZnMgO solar-blind ultraviolet detector chip and the above the base;
使用导电胶点在所述金属丝与所述铟粒的接触位置;using conductive glue dots on the contact position between the metal wire and the indium particles;
将所述底座、所述ZnMgO日盲紫外探测器芯片、两根所述金属丝和所述导电胶放置在烘箱中,采用50℃-200℃的温度烘烤2小时-48小时,包括端点值。Place the base, the ZnMgO solar-blind ultraviolet detector chip, the two metal wires and the conductive glue in an oven, and bake at a temperature of 50°C-200°C for 2 hours-48 hours, including endpoint values .
优选地,所述采用所述封装胶覆盖所述ZnMgO日盲紫外探测器芯片的叉指电极结构的叉指电极,具体包括:Preferably, the interdigitated electrode of the interdigitated electrode structure of the ZnMgO sun-blind ultraviolet detector chip covered with the encapsulant specifically includes:
在所述ZnMgO日盲紫外探测器芯片的叉指区域涂抹所述封装胶;Apply the encapsulation glue on the interdigitated area of the ZnMgO sun-blind ultraviolet detector chip;
放置在烘箱中,采用50℃-200℃的温度烘烤2小时-48小时,包括端点值。Place in an oven and bake at a temperature of 50°C to 200°C for 2 hours to 48 hours, including endpoints.
优选地,所述将所述ZnMgO日盲紫外探测器芯片固定在所述底座的第一表面,具体包括:Preferably, the fixing the ZnMgO solar-blind ultraviolet detector chip on the first surface of the base specifically includes:
采用胶合剂将所述ZnMgO日盲紫外探测器芯片粘在所述底座的第一表面。The ZnMgO solar-blind ultraviolet detector chip is adhered to the first surface of the base by adhesive.
优选地,所述提供衬底和ZnMgO日盲紫外探测器芯片中,提供ZnMgO日盲紫外探测器芯片具体包括:Preferably, in the providing the substrate and the ZnMgO solar-blind ultraviolet detector chip, providing the ZnMgO solar-blind ultraviolet detector chip specifically includes:
提供衬底;provide the substrate;
在所述衬底的一个表面外延生长一层ZnMgO;growing a layer of ZnMgO epitaxially on one surface of the substrate;
蒸镀金属电极;Evaporated metal electrodes;
光刻所述金属电极,形成两个叉指电极结构,所述叉指电极结构包括多个平行排列的叉指电极和与所述叉指电极垂直,并连接多个所述叉指电极的连接部;Photoetching the metal electrode to form two interdigital electrode structures, the interdigital electrode structure includes a plurality of interdigital electrodes arranged in parallel and a connection perpendicular to the interdigital electrodes and connecting the plurality of interdigital electrodes department;
在两个所述叉指电极结构的连接部上分别制作形成一个铟粒。An indium grain is formed on the connecting portion of the two interdigitated electrode structures respectively.
本发明还提供一种ZnMgO日盲紫外探测器封装结构,应用上面任意一项所述的封装方法形成,所述ZnMgO日盲紫外探测器封装结构包括:The present invention also provides a packaging structure of a ZnMgO solar-blind ultraviolet detector, which is formed by applying any of the packaging methods described above. The packaging structure of the ZnMgO solar-blind ultraviolet detector includes:
底座,所述底座包括相对设置的第一表面和第二表面,以及连接所述第一表面和所述第二表面的侧面,所述底座还包括贯穿所述侧面和所述第一表面的通孔;A base, the base includes a first surface and a second surface opposite to each other, and a side surface connecting the first surface and the second surface, and the base also includes a passage through the side surface and the first surface hole;
固定在所述底座的第一表面上的ZnMgO日盲紫外探测器芯片,所述ZnMgO日盲紫外探测器芯片包括衬底、ZnMgO层、叉指电极结构和两个铟粒;A ZnMgO solar-blind ultraviolet detector chip fixed on the first surface of the base, the ZnMgO solar-blind ultraviolet detector chip comprising a substrate, a ZnMgO layer, an interdigitated electrode structure and two indium particles;
两根金属丝,每根所述金属丝穿过所述通孔,端部与一个所述铟粒电性连接,非端部位置架空在所述ZnMgO日盲紫外探测器芯片和所述底座的上方;Two metal wires, each of the metal wires passes through the through hole, and the end is electrically connected to one of the indium grains, and the non-end position is suspended between the ZnMgO solar-blind ultraviolet detector chip and the base above;
环氧树脂,所述环氧树脂覆盖位于所述第一表面背离所述第二表面一侧的金属丝、以及所述第一表面上的通孔口;Epoxy resin, the epoxy resin covering the metal wire on the side of the first surface away from the second surface and the through hole on the first surface;
可透过紫外线的封装胶,所述封装胶覆盖所述ZnMgO日盲紫外探测器芯片、位于所述第一表面背离所述第二表面一侧的金属丝、以及所述第一表面上的通孔口。An ultraviolet-permeable encapsulation glue, the encapsulation glue covers the ZnMgO solar-blind ultraviolet detector chip, the metal wire on the side of the first surface away from the second surface, and the through-hole on the first surface. orifice.
优选地,所述金属丝为铝丝、金丝、银丝、不锈钢丝、铜丝、镍丝、铁丝中的一种。Preferably, the metal wire is one of aluminum wire, gold wire, silver wire, stainless steel wire, copper wire, nickel wire, and iron wire.
优选地,所述封装胶为有机硅胶。Preferably, the packaging glue is organic silica gel.
经由上述的技术方案可知,本发明提供的ZnMgO日盲紫外探测器的封装方法及封装结构,通过将ZnMgO日盲紫外探测器芯片固定在底座上,再由金属丝将叉指电极引出作为ZnMgO日盲紫外探测器封装结构的针脚,然后通过可透过紫外线的封装胶对ZnMgO日盲紫外探测器芯片封装,采用环氧树脂对裸露的金属丝以及连接部分进行封装,从而形成完整的ZnMgO日盲紫外探测器封装结构,以便于在实验室之外的区域进行使用,扩展了ZnMgO日盲紫外探测器芯片的使用范围,使得ZnMgO日盲紫外探测器芯片更加实用化。It can be seen from the above-mentioned technical scheme that the packaging method and packaging structure of the ZnMgO solar-blind ultraviolet detector provided by the present invention is to fix the ZnMgO solar-blind ultraviolet detector chip on the base, and then lead the interdigitated electrodes out by the metal wire as the ZnMgO solar-blind ultraviolet detector chip. The pins of the blind UV detector packaging structure are then packaged with the ZnMgO solar-blind UV detector chip through the UV-permeable packaging glue, and the exposed metal wires and connecting parts are packaged with epoxy resin to form a complete ZnMgO solar-blind The packaging structure of the ultraviolet detector is convenient for use in areas other than the laboratory, and expands the application range of the ZnMgO solar-blind ultraviolet detector chip, making the ZnMgO solar-blind ultraviolet detector chip more practical.
本发明提供的封装方法,工艺简单,反应过程容易控制,可以方便快捷的制备封装好的ZnMgO日盲紫外探测器件,当器件暴露在大气中使用时,性能参数稳定。同时引出的针脚使得器件可以即插即用,克服了未封装的芯片只能在实验室测试的弱点,为器件走向实用化奠定了基础。The encapsulation method provided by the invention has simple process and easy control of the reaction process, and can conveniently and quickly prepare a packaged ZnMgO sun-blind ultraviolet detection device. When the device is exposed to the atmosphere, the performance parameters are stable. The pins drawn out at the same time make the device plug-and-play, overcome the weakness that unpackaged chips can only be tested in the laboratory, and lay the foundation for the device to be practical.
附图说明Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据提供的附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only It is an embodiment of the present invention, and those skilled in the art can also obtain other drawings according to the provided drawings without creative work.
图1为本发明实施例提供的一种ZnMgO日盲紫外探测器封装方法流程图;Fig. 1 is the flowchart of a kind of ZnMgO sun-blind ultraviolet detector packaging method provided by the embodiment of the present invention;
图2-图4为本发明实施例提供的ZnMgO日盲紫外探测器芯片制备流程示意图;Figure 2-Figure 4 is a schematic diagram of the preparation process of the ZnMgO solar-blind ultraviolet detector chip provided by the embodiment of the present invention;
图5为本发明实施例提供的ZnMgO日盲紫外探测器芯片叉指电极示意图;5 is a schematic diagram of the interdigitated electrodes of the ZnMgO sun-blind ultraviolet detector chip provided by the embodiment of the present invention;
图6为本发明实施例提供的封装过程中有机玻璃板钻孔示意图;Fig. 6 is a schematic diagram of drilling a plexiglass plate during the packaging process provided by the embodiment of the present invention;
图7为本发明实施例提供的封装过程中有机玻璃板钻孔截面图;Fig. 7 is a cross-sectional view of drilling a plexiglass plate during the packaging process provided by the embodiment of the present invention;
图8为本发明实施例提供的封装过程中铝丝引线示意图;8 is a schematic diagram of aluminum wire leads in the packaging process provided by the embodiment of the present invention;
图9为图8对应的截面图;Fig. 9 is a sectional view corresponding to Fig. 8;
图10为本发明实施例提供的封装过程中涂银胶示意图;Fig. 10 is a schematic diagram of coating silver glue in the encapsulation process provided by the embodiment of the present invention;
图11为图10对应的截面图;Figure 11 is a cross-sectional view corresponding to Figure 10;
图12为本发明实施例提供的封装过程中涂环氧树脂示意图;Figure 12 is a schematic diagram of coating epoxy resin during the packaging process provided by the embodiment of the present invention;
图13为图12对应的截面图;Figure 13 is a cross-sectional view corresponding to Figure 12;
图14为本发明实施例提供的封装过程中涂封装胶示意图;Fig. 14 is a schematic diagram of coating encapsulation glue during the encapsulation process provided by the embodiment of the present invention;
图15为图14对应的截面图;Fig. 15 is a sectional view corresponding to Fig. 14;
图16为本发明实施例提供的封装好的ZnMgO日盲紫外探测器的电流-电压(I-V)曲线;Fig. 16 is the current-voltage (I-V) curve of the packaged ZnMgO solar-blind ultraviolet detector provided by the embodiment of the present invention;
图17为本发明实施例提供的封装好的ZnMgO日盲紫外探测器的光响应度曲线;Figure 17 is the photoresponsivity curve of the packaged ZnMgO solar-blind ultraviolet detector provided by the embodiment of the present invention;
图18为本发明实施例提供的封装好的ZnMgO日盲紫外探测器的响应时间曲线。Fig. 18 is the response time curve of the packaged ZnMgO solar-blind ultraviolet detector provided by the embodiment of the present invention.
具体实施方式Detailed ways
正如背景技术部分所述,现有技术中ZnMgO日盲紫外探测器主要应用在实验室内,基本都只是芯片阶段,还没有封装结构,无法进行广泛使用。As mentioned in the background technology section, the ZnMgO solar-blind ultraviolet detectors in the prior art are mainly used in laboratories, basically only in the chip stage, and there is no packaging structure, so they cannot be widely used.
现有技术中已经有一些电子器件封装方法,大多是使用金丝球焊技术,将芯片上的电极与外壳上的针脚使用金丝引线键合。然后在金属外壳上盖上石英片。There are already some electronic device packaging methods in the prior art, most of which use gold wire ball bonding technology to bond the electrodes on the chip and the pins on the shell with gold wires. Then cover the metal case with a quartz plate.
发明人发现,这种方法虽然被广泛使用,但是也存在一定的问题。第一,该方法对于焊接仪器和焊接技术有一定的要求。第二,对于芯片上金电极的牢固程度和厚度也有要求,如果金电极不够牢固或者太薄,那么在金丝球焊过程中,有可能使得金电极剥落。第三,使用金属外壳和石英片,价格偏高,不利于成本控制。第四,器件遭受到较严重的震动冲击后,金丝有可能断裂或者脱焊,使得器件失效。The inventors found that although this method is widely used, there are certain problems. First, this method has certain requirements for welding equipment and welding technology. Second, there are also requirements for the firmness and thickness of the gold electrodes on the chip. If the gold electrodes are not strong enough or are too thin, the gold electrodes may peel off during the gold wire ball bonding process. Third, the use of metal shells and quartz plates is expensive, which is not conducive to cost control. Fourth, after the device is subjected to severe vibration and shock, the gold wire may be broken or desoldered, making the device invalid.
基于此,本发明提供一种ZnMgO日盲紫外探测器的封装方法,包括:Based on this, the present invention provides a method for encapsulating a ZnMgO solar-blind ultraviolet detector, comprising:
提供底座、ZnMgO日盲紫外探测器芯片、两根金属丝、环氧树脂和封装胶,所述底座包括相对设置的第一表面和第二表面,以及连接所述第一表面和所述第二表面的侧面;所述ZnMgO日盲紫外探测器芯片包括衬底、ZnMgO层、叉指电极结构和两个铟粒;所述封装胶为可透过紫外线的封装胶;A base, a ZnMgO solar-blind ultraviolet detector chip, two metal wires, epoxy resin and encapsulation glue are provided, the base includes a first surface and a second surface oppositely arranged, and the first surface and the second surface are connected The side of the surface; the ZnMgO sun-blind ultraviolet detector chip includes a substrate, a ZnMgO layer, an interdigitated electrode structure and two indium particles; the packaging glue is a packaging glue that can pass through ultraviolet rays;
将所述ZnMgO日盲紫外探测器芯片固定在所述底座的第一表面;Fixing the ZnMgO solar-blind ultraviolet detector chip on the first surface of the base;
在所述底座上制作贯穿所述侧面和所述第一表面的通孔;making a through hole through the side surface and the first surface on the base;
将两根所述金属丝穿过所述通孔,所述金属丝的第一端凸出于所述第一表面,所述金属丝的第二端凸出于所述侧面;passing two metal wires through the through hole, the first ends of the metal wires protrude from the first surface, and the second ends of the metal wires protrude from the side;
将两根所述金属丝的第一端的端部分别连接至一个所述铟粒,所述金属丝的第二端作为所述ZnMgO日盲紫外探测器的针脚,其中,所述金属丝的第一端的非端部架空在所述ZnMgO日盲紫外探测器芯片和所述底座的上方;The ends of the first ends of the two metal wires are respectively connected to one of the indium grains, and the second ends of the metal wires are used as pins of the ZnMgO solar-blind ultraviolet detector, wherein the metal wires The non-end portion of the first end is overhead above the ZnMgO solar-blind ultraviolet detector chip and the base;
在所述金属丝的第一端的非端部处点所述环氧树脂,所述环氧树脂覆盖位于所述第一表面背离所述第二表面一侧的金属丝、以及所述第一表面上的通孔口;Dot the epoxy resin at the non-end of the first end of the metal wire, the epoxy resin covers the metal wire on the side of the first surface away from the second surface, and the first through-hole openings on the surface;
采用所述封装胶覆盖所述ZnMgO日盲紫外探测器芯片的叉指电极结构的叉指电极。The interdigitated electrodes of the interdigitated electrode structure of the ZnMgO solar-blind ultraviolet detector chip are covered with the packaging glue.
本发明提供的ZnMgO日盲紫外探测器封装方法,通过将ZnMgO日盲紫外探测器芯片固定在底座上,再由金属丝将叉指电极引出作为ZnMgO日盲紫外探测器封装结构的针脚,然后通过可透过紫外线的封装胶对ZnMgO日盲紫外探测器芯片进行封装,再采用环氧树脂对裸露的金属丝以及连接部分进行封装,从而形成完整的ZnMgO日盲紫外探测器封装结构,以便于在实验室之外的区域进行使用,扩展了ZnMgO日盲紫外探测器芯片的使用范围,使得ZnMgO日盲紫外探测器芯片更加实用化。The packaging method of the ZnMgO solar-blind ultraviolet detector provided by the present invention is to fix the chip of the ZnMgO solar-blind ultraviolet detector on the base, and then lead the interdigitated electrodes by metal wires as pins of the packaging structure of the ZnMgO solar-blind ultraviolet detector, and then pass The ZnMgO solar-blind ultraviolet detector chip can be encapsulated with ultraviolet-ray-permeable packaging glue, and then the exposed metal wire and the connecting part are encapsulated with epoxy resin to form a complete ZnMgO solar-blind ultraviolet detector packaging structure, which is convenient for use in The use in areas outside the laboratory expands the scope of use of the ZnMgO solar-blind ultraviolet detector chip, making the ZnMgO solar-blind ultraviolet detector chip more practical.
另外,本发明用料便宜,方法简单,同时直接用铝丝引线,不需要金丝引线键合,克服了现有技术中采用金丝球焊技术方法的上述问题。In addition, the present invention has cheap materials and simple method, and at the same time directly uses aluminum wires as wires without gold wire bonding, which overcomes the above-mentioned problems in the prior art of using gold wire ball bonding technology.
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
请参见图1所示,为本发明实施例提供的一种ZnMgO日盲紫外探测器的封装方法,包括:Please refer to Fig. 1 for a packaging method of a ZnMgO solar-blind ultraviolet detector provided by an embodiment of the present invention, including:
S101:提供底座、ZnMgO日盲紫外探测器芯片、两根金属丝、环氧树脂和封装胶,所述底座包括相对设置的第一表面和第二表面,以及连接所述第一表面和所述第二表面的侧面;所述ZnMgO日盲紫外探测器芯片包括衬底、ZnMgO层、叉指电极结构和两个铟粒;所述封装胶为可透过紫外线的封装胶;S101: Provide a base, a ZnMgO solar-blind ultraviolet detector chip, two metal wires, epoxy resin, and packaging glue, the base includes a first surface and a second surface that are oppositely arranged, and connect the first surface and the The side of the second surface; the ZnMgO sun-blind ultraviolet detector chip includes a substrate, a ZnMgO layer, an interdigitated electrode structure and two indium particles; the packaging glue is a packaging glue that can pass through ultraviolet rays;
本实施例中不限定所述ZnMgO日盲紫外探测器芯片的制作方法,可选的,请结合图2-图4所示,包括:提供衬底1;在衬底1的一个表面外延生长一层ZnMgO 2;蒸镀金属电极;光刻金属电极,形成两个叉指电极结构3,叉指电极结构3包括多个平行排列的叉指电极31和与叉指电极垂直,并连接多个叉指电极的连接部32;在两个叉指电极结构的连接部上分别制作形成一个铟粒4。The manufacturing method of the ZnMgO solar-blind ultraviolet detector chip is not limited in this embodiment. Optionally, please refer to FIG. 2-FIG. 4, including: providing a substrate 1; layer ZnMgO 2; vapor-deposited metal electrodes; photolithographic metal electrodes to form two interdigital electrode structures 3, the interdigital electrode structure 3 includes a plurality of interdigital electrodes 31 arranged in parallel and perpendicular to the interdigital electrodes, and connects a plurality of interdigital electrodes The connection portion 32 of the finger electrodes; one indium particle 4 is respectively formed on the connection portion of the two interdigital electrode structures.
需要说明的是,本实施例中不限定所述衬底的具体材料,可选地,所述衬底为蓝宝石衬底。本实施例中不限定所述ZnMgO日盲紫外探测器芯片的具体工艺步骤,可选的,在衬底1表面生长ZnMgO层时,采用分子束外延设备生长ZnMgO薄膜材料。蒸镀金属电极,主要通过热蒸发工艺蒸镀5nm-300nm厚的金电极,优选为50nm厚。在本发明的其他实施例中,生长ZnMgO层的工艺还可以是磁控溅射或金属有机化合物化学气相沉积(MOCVD)等,本实施例中对此不做限定。It should be noted that the specific material of the substrate is not limited in this embodiment, and optionally, the substrate is a sapphire substrate. The specific process steps of the ZnMgO sun-blind ultraviolet detector chip are not limited in this embodiment. Optionally, when growing a ZnMgO layer on the surface of the substrate 1, a molecular beam epitaxy device is used to grow a ZnMgO thin film material. Evaporating the metal electrode is mainly evaporating a 5nm-300nm thick gold electrode through a thermal evaporation process, preferably 50nm thick. In other embodiments of the present invention, the process for growing the ZnMgO layer may also be magnetron sputtering or metal organic compound chemical vapor deposition (MOCVD), etc., which are not limited in this embodiment.
通过光刻所述金电极,得到叉指电极,需要说明的是,本实施例中不限定ZnMgO日盲紫外探测器芯片的具体尺寸和叉指电极的具体尺寸,可选的,如图5所示,为叉指电极的尺寸和具体参数,叉指电极的指间距D可以为2μm-10μm,叉指的对数G为10对-25对,叉指的长度L为0.5mm-2mm,叉指的宽度W为2μm-10μm,更加具体的,叉指电极的指间距D可以为5μm,叉指的对数G为10对,叉指的长度L为0.5mm,叉指的宽度W为5μm。最后,通过在叉指电极的连接部上按压铟粒4得到MSM(金属-半导体-金属)结构的ZnMgO日盲紫外探测器芯片。The interdigitated electrodes are obtained by photoetching the gold electrodes. It should be noted that the specific size of the ZnMgO sun-blind ultraviolet detector chip and the specific dimensions of the interdigitated electrodes are not limited in this embodiment. Optionally, as shown in FIG. 5 Indicates the size and specific parameters of the interdigitated electrodes. The finger spacing D of the interdigitated electrodes can be 2 μm-10 μm, the logarithm G of the interdigitated fingers is 10 pairs-25 pairs, and the length L of the interdigitated fingers is 0.5mm-2mm. The width W of the finger is 2 μm-10 μm. More specifically, the interdigital electrode spacing D can be 5 μm, the logarithm G of the interdigital fingers is 10 pairs, the length L of the interdigital fingers is 0.5 mm, and the width W of the interdigital fingers is 5 μm. . Finally, a ZnMgO sun-blind ultraviolet detector chip with an MSM (metal-semiconductor-metal) structure is obtained by pressing indium grains 4 on the connecting portion of the interdigitated electrodes.
本实施例中不限定底座的具体材质,只要能够起到封装且绝缘的作用即可,可选的,所述底座为有机玻璃板、木板或橡胶板等绝缘板材,本实施例中优选地所述底座为有机玻璃板。为了配合上述ZnMgO日盲紫外探测器芯片的尺寸,本实施例中提供的所述底座的具体尺寸如图6所示,底座5的长L1可以是5mm-50mm;宽W1可以是5mm-50mm和厚H1可以是1mm-10mm,本实施例中,底座5的长宽厚分别是20mm、20mm、3mm。In this embodiment, the specific material of the base is not limited, as long as it can play the role of packaging and insulation. Optionally, the base is an insulating plate such as a plexiglass plate, a wooden board or a rubber plate. In this embodiment, the preferred The base is a plexiglass plate. In order to cooperate with the size of the above-mentioned ZnMgO solar-blind ultraviolet detector chip, the specific size of the base provided in this embodiment is as shown in Figure 6, the length L1 of the base 5 can be 5mm-50mm; the width W1 can be 5mm-50mm and The thickness H1 may be 1 mm-10 mm. In this embodiment, the length, width and thickness of the base 5 are 20 mm, 20 mm, and 3 mm, respectively.
S102:将所述ZnMgO日盲紫外探测器芯片固定在所述底座的第一表面;S102: fixing the ZnMgO solar-blind ultraviolet detector chip on the first surface of the base;
本实施例中,所述将所述ZnMgO日盲紫外探测器芯片固定在所述底座的第一表面,具体包括:采用胶合剂将所述ZnMgO日盲紫外探测器芯片粘在所述底座的第一表面。In this embodiment, the fixing the ZnMgO solar-blind ultraviolet detector chip on the first surface of the base specifically includes: using an adhesive to glue the ZnMgO solar-blind ultraviolet detector chip on the first surface of the base a surface.
需要说明的是,本实施例中不限定所述胶合剂具体为什么形式,只要能够将ZnMgO日盲紫外探测器芯片固定在所述底座的表面即可。可选的,所述胶合剂可以是环氧树脂、AB胶等,在本发明的一些实施例中,还可以采用胶带将所述ZnMgO日盲紫外探测器芯片固定在所述底座的表面。It should be noted that the specific form of the adhesive is not limited in this embodiment, as long as the ZnMgO solar-blind ultraviolet detector chip can be fixed on the surface of the base. Optionally, the adhesive may be epoxy resin, AB glue, etc. In some embodiments of the present invention, adhesive tape may also be used to fix the ZnMgO solar-blind ultraviolet detector chip on the surface of the base.
S103:在所述底座上制作贯穿所述侧面和所述第一表面的通孔;S103: Making a through hole penetrating through the side surface and the first surface on the base;
请继续参见图6,在底座上制作贯穿侧面和第一表面的通孔,具体包括:使用钻头在底座上的第一表面打出两个第一孔51,第一孔51的轴线垂直于第一表面;使用钻头在底座的侧面打出两个第二孔52,第二孔52的轴线垂直于侧面;且两个第二孔52与两个第一孔51一一对应连通,形成两个通孔。具体地,在有机玻璃板5的侧面使用直径D2为0.1mm-5mm的钻头打出两个孔。然后在第一表面打两个直径D1为0.1mm-5mm的孔,第一表面上的两个孔与侧面打的两个孔的底部相连接,形成通孔,如图7所示,为所述通孔的截面示意图。需要说明的是,第一表面上的第一孔和侧面上的第二孔的打孔顺序可以倒换,本实施例中对此不做限定。Please continue to refer to FIG. 6 , making through holes through the side and the first surface on the base, specifically including: using a drill to drill two first holes 51 on the first surface of the base, and the axes of the first holes 51 are perpendicular to the first surface; use a drill to drill two second holes 52 on the side of the base, the axis of the second hole 52 is perpendicular to the side; and the two second holes 52 communicate with the two first holes 51 one by one to form two through holes . Specifically, two holes are drilled on the side of the plexiglass plate 5 using a drill with a diameter D2 of 0.1 mm-5 mm. Then punch two holes with a diameter D1 of 0.1mm-5mm on the first surface, the two holes on the first surface are connected with the bottoms of the two holes punched on the side to form through holes, as shown in Figure 7, for all Schematic cross-sectional view of the through-hole. It should be noted that the drilling order of the first holes on the first surface and the second holes on the side can be reversed, which is not limited in this embodiment.
S104:将两根所述金属丝穿过所述通孔,所述金属丝的第一端凸出于所述第一表面,所述金属丝的第二端凸出于所述侧面;S104: Pass the two metal wires through the through hole, the first end of the metal wire protrudes from the first surface, and the second end of the metal wire protrudes from the side surface;
本实施例中不限定所述将两根所述金属丝穿过所述通孔的穿孔方式,可以使金属丝先通过有机玻璃板5上的第一表面的第一孔,再通过有机玻璃板5上侧面上的第二孔,本实施例中可选的,金属丝先通过侧面上的第二孔,再通过第一表面上的第一孔,也即,将金属丝沿侧面的孔穿入,再从第一表面的孔穿出,如图8所示和图9所示,将一根所述金属丝61穿过一个所述第一孔与所述第二孔连通的通孔;将另一根所述金属丝62穿过另一个所述第一孔与所述第二孔连通的通孔。In the present embodiment, the perforation method of passing the two metal wires through the through holes is not limited, and the metal wire can first pass through the first hole on the first surface of the organic glass plate 5, and then pass through the organic glass plate. 5. The second hole on the upper side, optional in this embodiment, the metal wire first passes through the second hole on the side, and then passes through the first hole on the first surface, that is, the metal wire is passed through the hole along the side In, and then pass out from the hole on the first surface, as shown in Figure 8 and Figure 9, one of the metal wires 61 is passed through a through hole in which the first hole communicates with the second hole; Pass the other metal wire 62 through another through hole in which the first hole communicates with the second hole.
需要说明的是,所述金属丝的直径小于所述通孔的直径,所述金属丝的直径可选的为0.1mm-4mm;本实施例中对所述金属丝的材质不做限定,只要能够起到导电的作用即可,可选的,所述金属丝可以是铝丝、还可以是金丝、银丝、不锈钢丝、铜丝、镍丝、铁丝等导电金属丝。It should be noted that the diameter of the metal wire is smaller than the diameter of the through hole, and the diameter of the metal wire is optionally 0.1mm-4mm; the material of the metal wire is not limited in this embodiment, as long as It only needs to be able to conduct electricity. Optionally, the metal wire can be aluminum wire, gold wire, silver wire, stainless steel wire, copper wire, nickel wire, iron wire or other conductive metal wire.
需要说明的是,本实施例中步骤S102、步骤S103与步骤S104的顺序可以交换,也即在底座上打孔以及穿金属丝可以放在固定ZnMgO日盲紫外探测器步骤之前,本实施例中对此不做限定。It should be noted that the order of step S102, step S103 and step S104 in this embodiment can be exchanged, that is, punching holes on the base and threading metal wires can be placed before the step of fixing the ZnMgO sun-blind ultraviolet detector. There is no limit to this.
S105:将两根所述金属丝的第一端的端部分别连接至一个所述铟粒,所述金属丝的第二端作为所述ZnMgO日盲紫外探测器的针脚,其中,所述金属丝的第一端的非端部架空在所述ZnMgO日盲紫外探测器芯片和所述底座的上方;S105: Connect the ends of the first ends of the two metal wires to one of the indium grains respectively, and the second ends of the metal wires serve as pins of the ZnMgO solar-blind ultraviolet detector, wherein the metal The non-end of the first end of the wire is overhead above the ZnMgO solar-blind ultraviolet detector chip and the base;
所述将两根所述金属丝的第一端的端部分别连接至一个所述铟粒,具体包括:分别将一根所述金属丝的第一端的端部按压至一个所述铟粒上,所述金属丝的第一端的非端部位置架空在所述ZnMgO日盲紫外探测器芯片和所述底座的上方;如图8中的虚线箭头方向所示,可选的,在本实施例中可以使用钳子将所述金属丝掰弯曲,然后压住芯片上的铟粒,需要说明的是,本实施例中金属丝的第一端不全部压在芯片上,而是弯曲出一段弧形,只有尖端处压住芯片上的铟粒,具体结构可以参见图10和图11所示;使用导电胶点在所述金属丝与所述铟粒的接触位置;将所述底座、所述ZnMgO日盲紫外探测器芯片、两根所述金属丝和所述导电胶放置在烘箱中,采用50℃-200℃的温度烘烤2小时-48小时,包括端点值。The connecting the ends of the first ends of the two metal wires to one of the indium particles respectively includes: respectively pressing the ends of the first ends of one of the metal wires to one of the indium particles Above, the non-end position of the first end of the metal wire is overhead above the ZnMgO solar-blind ultraviolet detector chip and the base; as shown in the direction of the dotted arrow in Figure 8, optional, in this In the embodiment, pliers can be used to break and bend the metal wire, and then press the indium grain on the chip. It should be noted that, in this embodiment, the first end of the metal wire is not all pressed on the chip, but bent out of a section arc shape, only the tip presses the indium particles on the chip, and the specific structure can be seen in Figure 10 and Figure 11; use conductive glue dots on the contact position between the metal wire and the indium particles; place the base, the The ZnMgO solar-blind ultraviolet detector chip, the two metal wires and the conductive adhesive are placed in an oven, and baked at a temperature of 50°C-200°C for 2 hours-48 hours, including endpoint values.
需要说明的是,本实施例中不限定所述导电胶的具体材质,可选的所述导电胶为银胶。请参见图10和图11,示出了银胶的涂抹区域,仅在铟粒和金属丝接触位置进行涂银胶7。It should be noted that the specific material of the conductive glue is not limited in this embodiment, and the conductive glue is optionally silver glue. Please refer to FIG. 10 and FIG. 11 , which show the area where the silver glue is applied, and the silver glue 7 is only applied at the contact position between the indium particles and the metal wire.
S106:在所述金属丝的第一端的非端部处点所述环氧树脂,所述环氧树脂覆盖位于所述第一表面背离所述第二表面一侧的金属丝、以及所述第一表面上的通孔口;S106: Put the epoxy resin on the non-end of the first end of the metal wire, the epoxy resin covers the metal wire on the side of the first surface away from the second surface, and the a through-hole opening on the first surface;
由于ZnMgO日盲紫外探测器是用来探测日盲紫外段光波,若大面积覆盖环氧树脂,则对日盲紫外线吸收较强,影响探测器的使用,因此,本实施例中仅在金属线裸露区域覆盖环氧树脂,如图12和图3所示,使用环氧树脂9点在金属丝和绝缘底座的连接处,同时使用环氧树脂9点在金属丝的弯曲处,使得环氧树脂自然滑落到金属丝与芯片的连接处,同时严格控制环氧树脂的加入量,避免环氧树脂流到芯片的叉指区域,50℃-200℃烘箱烘烤2小时-48小时。Since the ZnMgO solar-blind ultraviolet detector is used to detect solar-blind ultraviolet light waves, if a large area is covered with epoxy resin, it will absorb solar-blind ultraviolet rays strongly, which will affect the use of the detector. Therefore, in this embodiment, only metal wires The exposed area is covered with epoxy resin, as shown in Figure 12 and Figure 3, use 9 points of epoxy resin at the connection between the wire and the insulating base, and at the same time use 9 points of epoxy resin at the bend of the wire, so that the epoxy resin Naturally slide down to the connection between the metal wire and the chip, and strictly control the amount of epoxy resin added to prevent the epoxy resin from flowing to the finger area of the chip. Bake in an oven at 50°C-200°C for 2 hours to 48 hours.
S107:采用所述封装胶覆盖所述ZnMgO日盲紫外探测器芯片的叉指电极结构的叉指电极。S107: Cover the interdigitated electrodes of the interdigitated electrode structure of the ZnMgO solar-blind ultraviolet detector chip with the packaging glue.
本实施例中,采用封装胶封装的具体包括:在所述ZnMgO日盲紫外探测器芯片的叉指区域涂抹所述封装胶;放置在烘箱中,采用50℃-200℃的温度烘烤2小时-48小时,包括端点值。In this embodiment, encapsulation with encapsulation glue specifically includes: applying the encapsulation glue on the interdigital area of the ZnMgO sun-blind ultraviolet detector chip; placing it in an oven and baking at a temperature of 50°C-200°C for 2 hours -48 hours, including endpoint values.
由于环氧树脂已经覆盖一部分金属,本实施例中封装胶只需要封装芯片区域即可,为方便加工,可选的,可以将封装胶覆盖较多区域如图14中虚线所示A区域,只要能够形成绝缘覆盖电性连接部分即可。参见图15所示,封装胶8覆盖了所述ZnMgO日盲紫外探测器芯片的叉指区域,以对所述ZnMgO日盲紫外探测器芯片的叉指区域进行保护,形成绝缘层。Since the epoxy resin has already covered a part of the metal, the encapsulation adhesive in this embodiment only needs to encapsulate the chip area. For the convenience of processing, it is optional to cover more areas with the encapsulation adhesive as shown in the dotted line in Figure 14. Area A, as long as It is sufficient that an insulating covering electrical connection portion can be formed. As shown in FIG. 15 , the encapsulation glue 8 covers the interdigital region of the ZnMgO solar-blind ultraviolet detector chip, so as to protect the interdigital region of the ZnMgO solar-blind ultraviolet detector chip and form an insulating layer.
需要说明的是,所述封装胶为能够透过紫外线的封装胶,以避免对紫外线过多吸收,影响ZnMgO日盲紫外探测器的性能。本实施例中可选的,所述封装胶为有机硅胶,在本发明其他实施例中还可以是其他紫外线透过率较高的封装胶。本发明实施例中使用可以透过紫外光的有机硅胶进行封装,起到密封芯片和固定金属丝的作用,最终得到封装好的ZnMgO日盲紫外探测器件。It should be noted that the encapsulation glue is an encapsulation glue that can pass through ultraviolet rays, so as to avoid excessive absorption of ultraviolet rays and affect the performance of the ZnMgO solar-blind ultraviolet detector. Optionally in this embodiment, the encapsulating glue is organic silica gel, and in other embodiments of the present invention, it may also be other encapsulating glue with higher ultraviolet transmittance. In the embodiment of the present invention, organic silica gel that can transmit ultraviolet light is used for packaging, which plays the role of sealing the chip and fixing the metal wire, and finally a packaged ZnMgO solar-blind ultraviolet detection device is obtained.
本发明提供的封装方法工艺简单,反应过程容易控制,可以方便快捷的制备封装好的ZnMgO日盲紫外探测器件,当器件暴露在大气中使用时,性能参数稳定。同时引出的针脚使得器件可以即插即用,克服了未封装的芯片只能在实验室测试的弱点,为器件走向实用化奠定了基础。The encapsulation method provided by the invention has a simple process, and the reaction process is easy to control, and a packaged ZnMgO sun-blind ultraviolet detection device can be prepared conveniently and quickly. When the device is exposed to the atmosphere, the performance parameters are stable. The pins drawn out at the same time make the device plug-and-play, overcome the weakness that unpackaged chips can only be tested in the laboratory, and lay the foundation for the device to be practical.
本发明实施例中还提供一种ZnMgO日盲紫外探测器封装结构,采用上述ZnMgO日盲紫外探测器封装方法制作形成,可以参见图14和图15,所述封装结构,包括:The embodiment of the present invention also provides a ZnMgO solar-blind ultraviolet detector packaging structure, which is formed by the above-mentioned ZnMgO solar-blind ultraviolet detector packaging method, as shown in Figure 14 and Figure 15. The packaging structure includes:
底座5,所述底座5包括相对设置的第一表面和第二表面,以及连接所述第一表面和所述第二表面的侧面,所述底座5还包括贯穿所述侧面和所述第一表面的通孔(51、52);A base 5, the base 5 includes a first surface and a second surface oppositely arranged, and a side connecting the first surface and the second surface, and the base 5 also includes a Surface through holes (51, 52);
固定在所述底座5的第一表面上的ZnMgO日盲紫外探测器芯片10,所述ZnMgO日盲紫外探测器芯片包括衬底、ZnMgO日盲层、叉指电极结构和两个铟粒4;A ZnMgO solar-blind ultraviolet detector chip 10 fixed on the first surface of the base 5, the ZnMgO solar-blind ultraviolet detector chip comprising a substrate, a ZnMgO solar-blind layer, an interdigitated electrode structure and two indium particles 4;
两根金属丝(61、62),每根所述金属丝(61、62)穿过所述通孔(51、52),端部与一个铟粒4电性连接,非端部位置架空在ZnMgO日盲紫外探测器芯片10和底座5的上方;Two metal wires (61, 62), each of the metal wires (61, 62) passes through the through hole (51, 52), and the end is electrically connected to an indium grain 4, and the non-end position is overhead ZnMgO sun-blind ultraviolet detector chip 10 and the top of base 5;
环氧树脂9,所述环氧树脂9覆盖位于所述第一表面背离所述第二表面一侧的金属丝61、以及所述第一表面上的通孔口,也即第一通孔51的通孔口;Epoxy resin 9, the epoxy resin 9 covers the metal wire 61 on the side of the first surface away from the second surface, and the through hole on the first surface, that is, the first through hole 51 the through hole;
可透过紫外线的封装胶8,所述封装胶8覆盖所述ZnMgO日盲紫外探测器芯片的叉指区域。An ultraviolet-permeable encapsulation glue 8, the encapsulation glue 8 covers the interdigitated area of the ZnMgO solar-blind ultraviolet detector chip.
本实施例中不限定所述金属丝的材质和所述封装胶的材质,可选的,所述金属丝为金丝、银丝、不锈钢丝、铜丝、镍丝、铁丝中的一种。所述封装胶为有机硅胶。In this embodiment, the material of the metal wire and the material of the packaging glue are not limited. Optionally, the metal wire is one of gold wire, silver wire, stainless steel wire, copper wire, nickel wire, and iron wire. The encapsulating glue is organic silica gel.
发明人经过使用带紫外增强氙灯和锁相放大器的光响应测试系统来测定ZnMgO日盲紫外探测器封装结构的光响应特征曲线、使用半导体分析仪测试ZnMgO日盲紫外探测器封装结构的暗电流,使用激光光源和示波器测试器件的响应时间。The inventor measures the photoresponse characteristic curve of the ZnMgO solar-blind ultraviolet detector packaging structure by using a photoresponse testing system with a UV-enhanced xenon lamp and a lock-in amplifier, and uses a semiconductor analyzer to test the dark current of the ZnMgO solar-blind ultraviolet detector packaging structure. The response time of the device was tested using a laser light source and an oscilloscope.
得到ZnMgO日盲紫外探测器封装结构的如下参数:The following parameters of the packaging structure of the ZnMgO solar-blind ultraviolet detector are obtained:
如图16所示,为封装好的ZnMgO日盲紫外探测器的电流-电压(I-V)曲线,从该曲线中可以看出,在10V偏压时,封装好的器件的暗电流为0.7pA。当反复弯曲和拉拽ZnMgO日盲紫外探测器封装结构的针脚以及对ZnMgO日盲紫外探测器封装结构进行较强的震动冲击后,再继续测量,发现测量的参数没有发生变化,在10V偏压时,对应的暗电流仍为0.7pA。As shown in Figure 16, it is the current-voltage (I-V) curve of the packaged ZnMgO solar-blind ultraviolet detector. It can be seen from the curve that the dark current of the packaged device is 0.7pA when the bias voltage is 10V. After repeatedly bending and pulling the pins of the packaging structure of the ZnMgO solar-blind ultraviolet detector and performing strong shocks on the packaging structure of the ZnMgO solar-blind ultraviolet detector, the measurement was continued and it was found that the measured parameters did not change. , the corresponding dark current is still 0.7pA.
如图17所示,为封装好的ZnMgO日盲紫外探测器在10V电压工作条件时的光响应度曲线,从该曲线中可以看出,在10V偏压时,封装好的器件的峰值响应度是3.75A/W。当反复弯曲和拉拽器件的针脚以及对器件进行较强的震动冲击后,再继续测量,发现测量的参数没有发生变化。As shown in Figure 17, it is the photoresponsivity curve of the packaged ZnMgO solar-blind ultraviolet detector under the working condition of 10V voltage. From this curve, it can be seen that the peak responsivity of the packaged device is at 10V bias It is 3.75A/W. After repeatedly bending and pulling the pins of the device and subjecting the device to a strong vibration shock, the measurement was continued, and it was found that the measured parameters did not change.
如图18所示,为封装好的ZnMgO日盲紫外探测器在10V电压工作条件时的响应时间曲线(所述响应时间为假定紫外光关闭时的电流是X安培,那么当电流从0.9X安培降低到0.1X安培时所历经的时间),从该曲线中可以看出,在10V偏压时,封装好的器件的响应时间4.6毫秒,也即图中t2-t1的时间。当反复弯曲和拉拽器件的针脚以及对器件进行较强的震动冲击后,再继续测量,发现测量的参数没有发生变化。As shown in Figure 18, it is the response time curve of the packaged ZnMgO solar-blind ultraviolet detector under 10V voltage operating conditions (the response time is that the current when the ultraviolet light is turned off is X amperes, then when the current is from 0.9X amperes It can be seen from the curve that when the bias voltage is 10V, the response time of the packaged device is 4.6 milliseconds, which is the time of t2-t1 in the figure. After repeatedly bending and pulling the pins of the device and subjecting the device to a strong vibration shock, the measurement was continued, and it was found that the measured parameters did not change.
综合以上,可以证明,本发明提供的ZnMgO日盲紫外探测器封装结构具有较好的性能和稳定性。Based on the above, it can be proved that the packaging structure of the ZnMgO solar-blind ultraviolet detector provided by the present invention has better performance and stability.
本发明提供的ZnMgO日盲紫外探测器的封装方法及封装结构,通过将ZnMgO日盲紫外探测器芯片固定在底座上,再由金属丝将叉指电极引出作为ZnMgO日盲紫外探测器封装结构的针脚,然后通过可透过紫外线的封装胶对ZnMgO日盲紫外探测器芯片,采用环氧树脂对裸露的金属丝以及连接部分进行封装,从而形成完整的ZnMgO日盲紫外探测器封装结构,以便于在实验室之外的区域进行使用,扩展了ZnMgO日盲紫外探测器芯片的使用范围,使得ZnMgO日盲紫外探测器芯片更加实用化。The packaging method and packaging structure of the ZnMgO solar-blind ultraviolet detector provided by the present invention, by fixing the ZnMgO solar-blind ultraviolet detector chip on the base, and then leading the interdigitated electrodes by metal wires as the packaging structure of the ZnMgO solar-blind ultraviolet detector pins, and then the ZnMgO solar-blind ultraviolet detector chip is packaged with an ultraviolet-permeable packaging glue, and the exposed metal wire and the connecting part are packaged with epoxy resin, thereby forming a complete ZnMgO solar-blind ultraviolet detector packaging structure, so that The use in areas outside the laboratory expands the application range of the ZnMgO solar-blind ultraviolet detector chip, making the ZnMgO solar-blind ultraviolet detector chip more practical.
本发明提供的ZnMgO日盲紫外探测器的封装方法及封装结构的另一显著进步在于使用的材料价格便宜,方法简单,不需要金丝引线键合,克服了传统封装方法存在的问题。同时将密封芯片的封装胶和固定芯片的环氧树脂分开,避免了单独使用封装胶造成的器件响应度下降的问题。Another remarkable progress of the packaging method and packaging structure of the ZnMgO solar-blind ultraviolet detector provided by the present invention is that the materials used are cheap, the method is simple, and gold wire bonding is not required, which overcomes the problems existing in the traditional packaging method. At the same time, the encapsulation glue for sealing the chip is separated from the epoxy resin for fixing the chip, so as to avoid the problem that the device responsivity decreases caused by using the encapsulation glue alone.
需要说明的是,本说明书中的各个实施例均采用递进的方式描述,每个实施例重点说明的都是与其他实施例的不同之处,各个实施例之间相同相似的部分互相参见即可。It should be noted that each embodiment in this specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. For the same and similar parts in each embodiment, refer to each other, that is, Can.
对所公开的实施例的上述说明,使本领域专业技术人员能够实现或使用本发明。对这些实施例的多种修改对本领域的专业技术人员来说将是显而易见的,本文中所定义的一般原理可以在不脱离本发明的精神或范围的情况下,在其它实施例中实现。因此,本发明将不会被限制于本文所示的这些实施例,而是要符合与本文所公开的原理和新颖特点相一致的最宽的范围。The above description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention will not be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
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CN111244202A (en) * | 2020-03-19 | 2020-06-05 | 中国科学院长春光学精密机械与物理研究所 | ZnMgO ultraviolet detector and preparation method thereof |
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