CN108107383A - A kind of linear anisotropic magnetoresistive sensor and preparation method thereof - Google Patents
A kind of linear anisotropic magnetoresistive sensor and preparation method thereof Download PDFInfo
- Publication number
- CN108107383A CN108107383A CN201711390326.XA CN201711390326A CN108107383A CN 108107383 A CN108107383 A CN 108107383A CN 201711390326 A CN201711390326 A CN 201711390326A CN 108107383 A CN108107383 A CN 108107383A
- Authority
- CN
- China
- Prior art keywords
- conductive layer
- magnetoresistive
- substrate
- strips
- linear anisotropic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002360 preparation method Methods 0.000 title claims abstract 4
- 239000000758 substrate Substances 0.000 claims abstract 8
- 239000010410 layer Substances 0.000 claims 13
- 239000011241 protective layer Substances 0.000 claims 2
- 238000000151 deposition Methods 0.000 claims 1
- 238000001755 magnetron sputter deposition Methods 0.000 claims 1
- 238000000206 photolithography Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract 2
- 239000000696 magnetic material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
Abstract
Description
技术领域technical field
本发明属于磁性材料与元器件技术领域,具体为一种线性各向异性磁阻传感器及其制备方法。The invention belongs to the technical field of magnetic materials and components, in particular to a linear anisotropic magnetoresistance sensor and a preparation method thereof.
背景技术Background technique
各向异性磁阻效应(AMR,Anisotropic Magnetoresistance)是指在磁性材料中(如NiFe、CoFe、Co等),当磁性材料的磁矩与电流的夹角发生变化时,材料的电阻也随之变化的现象。各向异性磁阻的大小R满足:R=R0+ΔRcos2θ,其中,R0是零磁场下的电阻值;ΔR是各向异性磁阻最大变化值;θ是电流方向与磁性层磁化方向的夹角。线性各向异性磁阻传感器是基于各向异性磁阻效应,利用特定制备条件下磁性材料磁矩取向随外磁场大小变化呈线性,在固定电流大小和方向的前提下,利用磁矩与电流间夹角的线性变化实现对磁场大小的测量。线性各向异性磁阻传感器的结构简单,制备工艺也不复杂,成本较低,是目前磁性传感器家族中的重要一员。Anisotropic magnetoresistance effect (AMR, Anisotropic Magnetoresistance) means that in magnetic materials (such as NiFe, CoFe, Co, etc.), when the angle between the magnetic moment of the magnetic material and the current changes, the resistance of the material also changes. The phenomenon. The size R of the anisotropic magnetoresistance satisfies: R=R 0 +ΔRcos2θ, wherein, R 0 is the resistance value under zero magnetic field; ΔR is the maximum change value of the anisotropic magnetoresistance; θ is the relationship between the current direction and the magnetization direction of the magnetic layer angle. The linear anisotropic magnetoresistive sensor is based on the anisotropic magnetoresistance effect. Under specific preparation conditions, the orientation of the magnetic moment of the magnetic material changes linearly with the magnitude of the external magnetic field. The linear change of the included angle realizes the measurement of the magnitude of the magnetic field. The structure of the linear anisotropic magnetoresistive sensor is simple, the preparation process is not complicated, and the cost is low. It is an important member of the current magnetic sensor family.
线性各向异性磁阻传感器一般选用长条形磁性材料,在制备过程中使材料的磁矩沿长轴方向排列,测试时在长轴方向施加电流,短轴方向施加外磁场,测量磁阻随外磁场的变化。当没有电流偏置的时候,磁阻随外磁场的变化在零点附近是非线性的。目前通常将磁阻条沉积成惠斯通电桥的形状,然后在磁阻条上沉积导电层的方式,引导磁阻条上的电流偏置一定角度,让电流方向与磁化方向的夹角θ有一个初始值,通常为30°至60°,使得磁阻条的电阻变化在零磁场附近呈线性输出,实现线性各向异性磁阻传感器的功能。其结构如图1、图2所示。Linear anisotropic magnetoresistive sensors generally use strip-shaped magnetic materials. During the preparation process, the magnetic moments of the materials are arranged along the long axis direction. During the test, a current is applied in the long axis direction and an external magnetic field is applied in the short axis direction. changes in the external magnetic field. When there is no current bias, the change of reluctance with external magnetic field is nonlinear around zero. At present, the magnetoresistive strips are usually deposited in the shape of a Wheatstone bridge, and then a conductive layer is deposited on the magnetoresistive strips to guide the current on the magnetoresistive strips to a certain angle, so that the angle θ between the current direction and the magnetization direction has An initial value, usually 30° to 60°, makes the resistance change of the magnetoresistive strip output linearly near the zero magnetic field, realizing the function of a linear anisotropic magnetoresistive sensor. Its structure is shown in Figure 1 and Figure 2.
然而导电层沉积在磁阻条上面,需要足够的厚度,一般为200nm及以上,才能有良好的电流偏置效果。但是当导电层较厚的时候,导电层与磁阻条的粘附性比较低,易脱落,且导电层内部应力较大。传感器在退火时,较厚的导电层更容易出现形变,形状不可控。另一方面,当传感器工作时,表面无导电层的磁阻条中流过的电流是按设计方向偏置的,但是表面有导电层的磁阻条中的电流是没有按设计方向偏置的,这两部分磁阻条中的电流方向不一致,从而降低了传感器输出信号随磁场变化的线性度,也增加了输出信号的噪音。However, the conductive layer deposited on the magnetoresistive strip needs to have a sufficient thickness, generally 200nm or more, in order to have a good current bias effect. However, when the conductive layer is thicker, the adhesion between the conductive layer and the magnetoresistive strip is relatively low, and it is easy to fall off, and the internal stress of the conductive layer is relatively large. When the sensor is annealed, the thicker conductive layer is more prone to deformation and the shape is uncontrollable. On the other hand, when the sensor is working, the current flowing in the magnetoresistive strip without a conductive layer on the surface is biased in the designed direction, but the current in the magnetoresistive strip with a conductive layer on the surface is not biased in the designed direction, The directions of the currents in the two parts of the magnetoresistive strips are inconsistent, thereby reducing the linearity of the sensor output signal changing with the magnetic field and increasing the noise of the output signal.
综上,线性各向异性磁阻传感器通过导电层在磁阻条上方的方式来实现电流偏置,存在导电层薄膜较厚,输出信号有噪音等问题。因此,若能从制备线性各向异性磁阻传感器的导电层工艺及结构入手,提供一种导电层更薄,结构更稳定,电流偏置效果更明显清新,且输出信号噪音更少的方式,将有利于线性各向异性磁阻传感器的发展及应用领域。To sum up, the linear anisotropic magnetoresistive sensor realizes the current bias through the way that the conductive layer is above the magnetoresistive strip, but there are problems such as thick conductive layer film and noise in the output signal. Therefore, if we can start with the process and structure of the conductive layer for preparing the linear anisotropic magnetoresistive sensor, we can provide a method with a thinner conductive layer, a more stable structure, a clearer current bias effect, and less noise in the output signal. It will be beneficial to the development and application field of the linear anisotropic magnetoresistive sensor.
发明内容Contents of the invention
针对上述存在问题或不足,为实现线性各向异性磁阻传感器在保证电流偏置效果的前提下,导电层更薄和输出信号噪音更少的技术问题;本发明提供了一种线性各向异性磁阻传感器及其制备方法。本发明采用将导电层嵌入磁阻条的方式,实现电流偏置;其磁阻部分设计如图3所示,将导电层设置在间断的磁阻条之间(结构示意图如图4),达到减小导电层厚度,提高电流偏置效率,降低传感器输出信号噪音的目的。In view of the above existing problems or deficiencies, in order to realize the technical problems of the linear anisotropic magnetoresistive sensor under the premise of ensuring the current bias effect, the conductive layer is thinner and the output signal noise is less; the present invention provides a linear anisotropic magnetoresistive sensor. Magnetoresistive sensor and its preparation method. The present invention adopts the method of embedding the conductive layer into the magnetoresistive strips to realize the current bias; the design of the magnetoresistance part is as shown in Figure 3, and the conductive layer is arranged between the intermittent magnetoresistive strips (the schematic diagram of the structure is shown in Figure 4), to achieve The purpose of reducing the thickness of the conductive layer, improving the current bias efficiency, and reducing the noise of the sensor output signal.
该线性各向异性磁阻传感器包括:基片、导电层和磁阻条。The linear anisotropic magnetoresistance sensor includes: a substrate, a conductive layer and a magnetoresistance strip.
基片用于承载导电层和磁阻条,且不导电。The substrate is used to carry the conductive layer and the magnetoresistive strips, and is non-conductive.
所述磁阻条为相互不连通的N个平行四边形,导电层为相互不连通的N-1~N+1个平行四边形,磁阻条与导电层互相交错平铺设置于基片上同一水平面,磁阻条通过嵌入的导电层实现电连通,N≥3。The magnetic resistance strips are N parallelograms that are not connected to each other, the conductive layer is N-1 to N+1 parallelograms that are not connected to each other, and the magnetic resistance strips and the conductive layer are arranged on the same horizontal plane on the substrate in an interlaced manner. The magnetoresistive strips are electrically connected through the embedded conductive layer, N≥3.
进一步的,所述导电层选用N+1个,即互相交错平铺设置的导电层和磁阻两端首尾位置均为导电层。Further, N+1 conductive layers are selected, that is, the conductive layers arranged in a staggered and tiled manner and both ends of the magnetoresistance are conductive layers.
进一步的,还包括覆盖在导电层和磁阻条表面的保护层。Further, it also includes a protective layer covering the surfaces of the conductive layer and the magnetoresistive strips.
其制备方法,包括以下步骤:Its preparation method comprises the following steps:
步骤1:在绝缘基片上采用光刻工艺曝光出间断的N个平行四边形磁阻条图案。Step 1: Exposing N discontinuous parallelogram magnetoresistive strip patterns on the insulating substrate by using a photolithography process.
步骤2:在步骤1处理之后的基片上采用磁控溅射工艺沉积磁阻条。Step 2: Depositing magnetoresistive strips on the substrate treated in step 1 by using a magnetron sputtering process.
步骤3:在步骤2处理之后的基片非磁阻条位置填充N-1~N+1个平行四边导电层,通过导电层使相邻磁阻条之间实现电连通。Step 3: Filling N-1 to N+1 parallelogram conductive layers at the positions of the non-magnetoresistive strips of the substrate after the treatment in step 2, and electrically connecting adjacent magnetoresistive strips through the conductive layers.
进一步的,步骤3处理之后基片的上表面还镀有一层保护磁阻层和导电层的保护层。Further, after the treatment in step 3, the upper surface of the substrate is plated with a protective layer for protecting the magnetoresistive layer and the conductive layer.
本发明将偏置电流的导电层以嵌入的方式制作在磁阻条间,使所有磁阻部分的电流方向相同且清晰,明显降低输出电信号的噪音;在磁阻部分运动的电流方向垂直于导电层和磁阻部分的交界面,实现电流偏置作用。嵌入在磁阻条中的导电层不需要较大的厚度来实现改变电流方向的作用,仅需要保持各磁阻条之间的电连通即可清晰准确地改变电流方向,因此导电层的厚度没有要求,进而大大降低了整个器件的厚度,提高了结构稳定性。传感器工作时的电流全部以预设的方向通过磁阻部分,以预设的方向通过导电层,电流方向明确且互不影响,降低信号噪音,提高传感器测试性能。In the present invention, the conductive layer of the bias current is made between the magnetoresistive strips in an embedded manner, so that the current directions of all the magnetoresistance parts are the same and clear, and the noise of the output electrical signal is obviously reduced; the direction of the current moving in the magnetoresistance part is perpendicular to The interface between the conductive layer and the magnetoresistive part realizes the current biasing effect. The conductive layer embedded in the magneto-resistive strips does not need a large thickness to achieve the function of changing the direction of the current. It only needs to maintain the electrical connection between the magneto-resistive strips to clearly and accurately change the direction of the current. Therefore, the thickness of the conductive layer has no requirements, thereby greatly reducing the thickness of the entire device and improving structural stability. When the sensor is working, all the current passes through the magnetoresistive part in a preset direction, and passes through the conductive layer in a preset direction. The current direction is clear and independent of each other, reducing signal noise and improving sensor test performance.
综上所述,本发明在保证电流偏置效果的前提下,实现了导电层更薄和输出信号噪音更少。In summary, the present invention achieves a thinner conductive layer and less noise in the output signal under the premise of ensuring the current bias effect.
附图说明Description of drawings
图1为现有线性各向异性磁阻传感器的剖面示意图;FIG. 1 is a schematic cross-sectional view of an existing linear anisotropic magnetoresistive sensor;
图2为现有线性各向异性磁阻传感器的俯视示意图;2 is a schematic top view of an existing linear anisotropic magnetoresistive sensor;
图3为实施例的间断的磁阻条结构示意图;Fig. 3 is the schematic structural diagram of the discontinuous magnetoresistive strip of the embodiment;
图4为实施例嵌入了导电层后的磁阻条结构示意图;Fig. 4 is a schematic diagram of the structure of the magnetoresistive strip after the conductive layer is embedded in the embodiment;
图5为实施例制备的线性各向异性磁阻传感器剖面示意图;Fig. 5 is the schematic cross-sectional view of the linear anisotropic magnetoresistive sensor prepared by the embodiment;
图6为实施例中电流在磁阻条和导电层上的运动情况示意图;Fig. 6 is a schematic diagram of the movement of current on the magnetoresistive strip and the conductive layer in the embodiment;
图7为实施例中传感器工作的输出电压随磁场变化图。Fig. 7 is a diagram showing the variation of the output voltage of the sensor with the magnetic field in the embodiment.
具体实施方式Detailed ways
下面结合附图和实施例,详述本发明的技术方案。The technical scheme of the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.
步骤1:在硅基片上采用光刻工艺曝光出总长度为7.2um间断的长条形磁阻条图案,每个磁阻条宽度为5nm,间隙为5nm。Step 1: On the silicon substrate, a pattern of elongated magnetoresistive strips with a total length of 7.2um and discontinuous strips is exposed by a photolithography process, each magnetoresistive strip has a width of 5nm and a gap of 5nm.
步骤2:在步骤1处理之后的基片上采用磁控溅射工艺依次沉积厚度5nmTa、12nmNiFe和2nmTa。然后将其浸泡于去胶液中,待去掉光刻胶后,取出样品,即得到间断的长条形磁阻条。Step 2: Deposit 5nmTa, 12nmNiFe and 2nmTa in sequence on the substrate treated in step 1 by magnetron sputtering process. Then it is soaked in the glue removing solution, and after the photoresist is removed, the sample is taken out to obtain discontinuous elongated magnetoresistive strips.
步骤3:在步骤2处理之后的基片上采用光刻工艺和电子束蒸发工艺填充20nm的Al导电层在非磁阻条位置,通过导电层使磁阻条之间实现电连通。该步骤沉积的Al导电层也可以用于线性各向异性磁阻传感器单元中的电极部分。Step 3: On the substrate processed in step 2, a 20nm Al conductive layer is filled at the position of the non-magnetoresistive strips by using a photolithography process and an electron beam evaporation process, and the magnetoresistive strips are electrically connected through the conductive layer. The Al conductive layer deposited in this step can also be used for the electrode part in the linear anisotropic magnetoresistive sensor unit.
步骤4:在步骤3处理之后的基片上表面镀一层SiO2保护层,保护磁阻层和导电层的机械稳定性和抗氧化等,得到所述线性各向异性磁阻传感器,其剖面示意如图5所示。Step 4: coat the upper surface of the substrate after step 3 with a protective layer of SiO to protect the mechanical stability and oxidation resistance of the magnetoresistive layer and the conductive layer, etc., to obtain the linear anisotropic magnetoresistive sensor, and its cross-section is schematic As shown in Figure 5.
使用软件COMSOL仿真出本实施例的电流在磁阻条和导电层上的运动情况。箭头方向表示该处的电流方向。可以看出在磁阻条上的电流方向垂直于导电层与磁阻条的交界面,很好的实现了偏置效果,如图6所示;Use the software COMSOL to simulate the movement of the current on the magnetoresistive strip and the conductive layer in this embodiment. The direction of the arrow indicates the current direction at this point. It can be seen that the current direction on the magnetoresistive strip is perpendicular to the interface between the conductive layer and the magnetoresistive strip, and the bias effect is well realized, as shown in Figure 6;
本实施例制备的线性各向异性磁阻传感器测试结果如图7所示。可以看出在±10Oe的磁场范围内,传感器输出信号为良好的线性关系,很好的实现了线性各向异性磁阻传感器的功能。The test results of the linear anisotropic magnetoresistive sensor prepared in this embodiment are shown in FIG. 7 . It can be seen that within the magnetic field range of ±10Oe, the output signal of the sensor has a good linear relationship, and the function of the linear anisotropic magnetoresistive sensor is well realized.
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711390326.XA CN108107383A (en) | 2017-12-21 | 2017-12-21 | A kind of linear anisotropic magnetoresistive sensor and preparation method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711390326.XA CN108107383A (en) | 2017-12-21 | 2017-12-21 | A kind of linear anisotropic magnetoresistive sensor and preparation method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
CN108107383A true CN108107383A (en) | 2018-06-01 |
Family
ID=62210756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201711390326.XA Pending CN108107383A (en) | 2017-12-21 | 2017-12-21 | A kind of linear anisotropic magnetoresistive sensor and preparation method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108107383A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109599484A (en) * | 2018-10-26 | 2019-04-09 | 西安科汇电子科技有限公司 | A kind of sensor structure and preparation method thereof based on amr effect |
CN112051523A (en) * | 2019-06-05 | 2020-12-08 | 爱盛科技股份有限公司 | Magnetic field sensing device |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6266218B1 (en) * | 1999-10-28 | 2001-07-24 | International Business Machines Corporation | Magnetic sensors having antiferromagnetically exchange-coupled layers for longitudinal biasing |
WO2003046594A1 (en) * | 2001-11-27 | 2003-06-05 | Koninklijke Philips Electronics N.V. | Sensor arrangement |
WO2009157991A1 (en) * | 2008-06-23 | 2009-12-30 | Magic Technologies, Inc. | Highly sensitive amr bridge for gear tooth sensor |
CN104422908A (en) * | 2013-09-06 | 2015-03-18 | 上海矽睿科技有限公司 | Preparation process of magnetic sensation device |
CN104868051A (en) * | 2015-03-27 | 2015-08-26 | 上海矽睿科技有限公司 | High-sensitivity magnetic sensing device and preparation method thereof |
CN105098059A (en) * | 2014-05-22 | 2015-11-25 | 宇能电科技股份有限公司 | Anisotropic magnetoresistive element and method of manufacturing the same |
CN205861754U (en) * | 2016-07-08 | 2017-01-04 | 江苏多维科技有限公司 | A kind of anisotropic magnetoresistance current sensor without set and resetting means |
-
2017
- 2017-12-21 CN CN201711390326.XA patent/CN108107383A/en active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6266218B1 (en) * | 1999-10-28 | 2001-07-24 | International Business Machines Corporation | Magnetic sensors having antiferromagnetically exchange-coupled layers for longitudinal biasing |
WO2003046594A1 (en) * | 2001-11-27 | 2003-06-05 | Koninklijke Philips Electronics N.V. | Sensor arrangement |
WO2009157991A1 (en) * | 2008-06-23 | 2009-12-30 | Magic Technologies, Inc. | Highly sensitive amr bridge for gear tooth sensor |
CN104422908A (en) * | 2013-09-06 | 2015-03-18 | 上海矽睿科技有限公司 | Preparation process of magnetic sensation device |
CN105098059A (en) * | 2014-05-22 | 2015-11-25 | 宇能电科技股份有限公司 | Anisotropic magnetoresistive element and method of manufacturing the same |
CN104868051A (en) * | 2015-03-27 | 2015-08-26 | 上海矽睿科技有限公司 | High-sensitivity magnetic sensing device and preparation method thereof |
CN205861754U (en) * | 2016-07-08 | 2017-01-04 | 江苏多维科技有限公司 | A kind of anisotropic magnetoresistance current sensor without set and resetting means |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109599484A (en) * | 2018-10-26 | 2019-04-09 | 西安科汇电子科技有限公司 | A kind of sensor structure and preparation method thereof based on amr effect |
CN112051523A (en) * | 2019-06-05 | 2020-12-08 | 爱盛科技股份有限公司 | Magnetic field sensing device |
CN112051523B (en) * | 2019-06-05 | 2023-06-23 | 爱盛科技股份有限公司 | Magnetic field sensing device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP2696209B1 (en) | Single-chip push-pull bridge-type magnetic field sensor | |
CN107894575A (en) | Magneto-resistance effect element and its manufacture method and position detecting device | |
CN102540112B (en) | Single chip pull-push bridge type magnetic field sensor | |
CN101672903B (en) | Preparation method of Wheatstone bridge type spin valve magnetic sensor | |
CN102590768A (en) | Magneto-resistance magnetic field gradient sensor | |
CN105866715B (en) | A kind of preparation method of linear anisotropic magnetoresistive sensor | |
CN104900801A (en) | Anti-ferromagnetic pinning AMR (Anisotropic Magneto Resistance) sensor | |
WO2012142915A1 (en) | Single-chip reference full-bridge magnetic field sensor | |
JP2015524065A (en) | Magnetoresistive gear sensor | |
CN105005010B (en) | A kind of low-power consumption magnetoresistive transducer based on LTCC technology and preparation method thereof | |
WO2017173992A1 (en) | Anisotropic magnetoresistance (amr) sensor not requiring set/reset device | |
CN206362470U (en) | A kind of high insulation resistance of resistance to 500V sputtered film sensing element | |
WO2018006879A1 (en) | Anisotropic magnetic resistance and current sensor without setting and resetting apparatus | |
WO2007065377A1 (en) | An integrate planar sensor for detecting weak magnetic field on three dimensional directions and a manufacturing method thereof | |
CN109669149A (en) | A kind of linear anisotropic magnetic resistance sensor and its implementation | |
CN110197872A (en) | Adjustable anisotropic magnetoresistance sensor of measurement range and preparation method thereof | |
CN110212085A (en) | Adjustable giant magnetoresistance sensor of measurement range and preparation method thereof | |
CN109888088A (en) | A magnetoresistive sensor structure and its manufacturing method | |
CN108107383A (en) | A kind of linear anisotropic magnetoresistive sensor and preparation method thereof | |
RU2436200C1 (en) | Magnetoresistive sensor | |
CN109346597B (en) | A kind of preparation method of self-biased anisotropic magnetoresistance sensing unit | |
CN108807211B (en) | Device for measuring magnetic resistance of two-dimensional semiconductor material and manufacturing method thereof | |
CN1356559A (en) | Tester with magnetic tunnel junction and magnetioelectric resistance material for 3D weak magnetic field | |
CN113866691B (en) | Tunneling magneto-resistance sensor and preparation method and using method thereof | |
CN206038743U (en) | Single -chip magneto resistor current sensor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180601 |
|
RJ01 | Rejection of invention patent application after publication |