CN108089073B - Measuring tool and method for switching state of device to be measured - Google Patents

Abstract

The present invention discloses a measuring fixture and a method for switching the state of a device under test. A measuring fixture has a first connection port, a second connection port and a control module. The first connection port is used to receive a first power signal and a second power signal from a power module of the device under test. The second connection port is used to receive a second power signal from a control unit of the device under test. The control module is used to determine the device operation state of the device under test based on the first power signal and the second power signal. The control module further determines the measurement operation state based on a measurement instruction. The device operation state is one of a first state and a second state. The measurement operation state is one of a first state and a second state. When the device operation state is different from the measurement operation state, the control module controls the device under test to switch the device operation state to the other of the first state and the second state.

Description

Measuring jig and method for switching state of device to be measured

technical field

The invention relates to a measuring jig and a method for switching the state of a device to be measured, in particular to a measuring jig that is controlled according to the state of electric energy and a method for switching the state of the device to be measured.

Background technique

Therefore, when manufacturers design electronic components, they usually test the operation status of the electronic components to know whether the electronic components operate normally as designed, so as to ensure that the electronic components manufactured or shipped later are usable and free of defects. Taking the motherboard test as an example, in order to test the electrical condition of the motherboard, it is necessary to test the motherboard at least during power-on and operation. The power-on state is, for example, a state in which power is supplied to the motherboard, but the motherboard is not powered on. The operating state is, for example, a state in which power is supplied to the motherboard and the motherboard is powered on.

However, as far as the current testing process of the maintenance department is concerned, it still relies heavily on manual inspection of various test items. As for the motherboard, when changing different measurement items, it is often necessary to switch the power state, such as switching from the power-on state to the operating state, or from the operating state to the power-on state. When such a procedure is performed manually, it is not only cumbersome and inefficient, but also may cause damage to the device under test or the test board when there is a mistake.

SUMMARY OF THE INVENTION

The present invention is to provide a measuring jig and a method for switching the state of the device to be tested, so as to overcome the above-mentioned problems of inefficiency and error-proneness in manual testing.

The measuring fixture disclosed in the present invention has a first connecting port, a second connecting port and a control module. The control module is electrically connected to the first connection port and the second connection port. The first connection port is used for pluggably connecting the power module of the device under test. The first connection port is also used for receiving the first power signal and the second power signal. The second connection port is used for pluggably connecting the control unit of the device under test. The control module is used for judging the device operation state of the device under test according to the voltage level of the first power supply signal and the voltage level of the second power supply signal. The control module further determines the measurement operation state according to the measurement command. The device operating state is one of the first state and the second state. The measurement operation state is one of the first state and the second state. When the device operation state is different from the measurement operation state, the control module controls the device under test to switch the device operation state to the other one of the first state and the second state.

In the control method of the measuring fixture disclosed in the present invention, the method for switching the state of the device to be tested is to measure the voltage level of the first power signal from the first power pin of the device to be tested. And, the voltage level of the second power signal is measured from the second power pin of the device under test. Next, the device operation state of the device under test is determined according to the voltage level of the first power supply signal and the voltage level of the second power supply signal. The device operating state is one of the first state and the second state. Moreover, the measurement operation state is determined according to the measurement command. The measurement operation state is one of the first state and the second state. Then, when the measurement operation state is different from the device operation state, the device operation state is switched to the other one of the first state and the second state. When the measurement operation state is the same as the device operation state, the device operation state is maintained.

In view of the above, the present invention provides a measurement jig and a method for switching the state of the device to be measured. For the measurement jig, the measurement jig is used to determine the device operation state of the device to be measured, and to measure the state of the device to be measured. The fixture is used to determine the measurement operation state indicated by the test command. When the device operation state is different from the measurement operation state, the measurement fixture controls the device under test to switch the operation state of the device to test the relevant measurement items of the device under test. . Therefore, the measurement jig can automatically switch the power state of the device under test selectively according to the test finger, thereby realizing an automatic test solution.

The above description of the present disclosure and the following description of the embodiments are used to demonstrate and explain the spirit and principle of the present invention, and provide further explanation of the scope of the patent application of the present invention.

Description of drawings

FIG. 1 is a functional block diagram of a measuring jig according to an embodiment of the present invention.

FIG. 2 is a functional block diagram of a measuring jig according to another embodiment of the present invention.

FIG. 3 is a functional block diagram of a measuring jig according to a further embodiment of the present invention.

FIG. 4 is a schematic top view of the measuring jig shown in FIG. 3 according to the present invention.

FIG. 5 is a method flowchart of a method for switching the state of a device under test according to an embodiment of the present invention.

Description of reference numbers:

100, 400, 700 measuring fixture

101, 401, 701 first port

103, 403, 703 second port

105, 405, 705 control modules

407, 707 third port

409, 709 switching device, jumper group

411, 711 power port

702 substrate

713 fourth port

715 switch unit

717 Universal Asynchronous Receiver Transmitter

200 devices under test

201 Power Module

203 Control Unit

501, 502 external power supply

Detailed ways

The detailed features and advantages of the present invention are described in detail below in the embodiments, the content of which is sufficient to enable any person skilled in the relevant art to understand the technical content of the present invention and implement accordingly, and according to the contents disclosed in this specification, claims and drawings, The objects and advantages associated with the present invention can be readily understood by any person skilled in the relevant art. The following examples are intended to further illustrate the point of the present invention in detail, but do not limit the scope of the present invention in any point of view.

Please refer to FIG. 1 . FIG. 1 is a functional block diagram of a measuring jig according to an embodiment of the present invention. As shown in FIG. 1 , the measurement jig 100 has a first connection port 101 , a second connection port 103 and a control module 105 . The first connection port 101 is used for pluggable connection to the power module 201 of the device under test 200 . The second connection port 103 is used for pluggably connecting to the control unit 203 of the device under test 200 . The power module 201 is, for example, used to refer to at least one pin in the power transmission port of the device under test 200 for receiving power from the external power source 501 . Correspondingly, the specification of the first connection port 101 corresponds to the specification of the power transmission port, which is not limited herein. The control unit 203 is, for example, a central processing unit (CPU), a microcontroller (micro controller, MCU), an application-specific integrated circuit (ASIC), or other similar components with computing functions. is not restricted. The second connection port 103 is, for example, a Video Graphics Array (VGA), or the second connection port 103 and the first connection port 101 can also be integrated into a custom connector. The above is only an example, but not limited thereto.

The first connection port 101 is used for receiving the first power signal. More specifically, the device under test 200 obtains AC power or DC power from the external power source 501 via the power module 201 , for example, and converts the obtained power into a plurality of voltage signals suitable for the internal circuit specifications of the device under test 200 . The first power signal is one of the plurality of voltage signals, and the second power signal is the other of the plurality of voltage signals. In other words, the first power supply signal and the second power supply signal have different voltage levels, respectively. In one embodiment, the first power signal is, for example, a standby power supply, that is, regardless of whether the device under test 200 is powered on or not, when the device under test 200 is electrically connected to the external power source 501 , the power module 201 will be based on the external power source 501 . The supplied electrical energy generates a first power signal. At this time, the first power supply signal is at a relatively high voltage level. When the device under test 200 is electrically connected to the external power source 501 and the device under test 200 is powered on, the power module 201 generates a second power signal according to the power provided by the external power source 501 . At this time, the second power supply signal is at a relatively high voltage level. In one embodiment, the relative high voltage level of the first power signal is 5 volts (volt, V), and the relative high voltage level of the second power signal is 3.3 volts.

The control module 105 is used for determining the device operation state of the device under test 200 according to the voltage level of the first power supply signal and the voltage level of the second power supply signal. The device operating state is one of the first state and the second state. In one embodiment, the first state is, for example, a power-on state, and the second state is, for example, a power-on state. The power-on state, for example, refers to a state in which the device under test 200 is electrically connected to the external power source 501 and the device under test 200 is not powered on. operational status.

When the voltage level of the first power signal is a relatively high voltage level and the voltage level of the second power signal is a relatively low voltage level, the device operating state is the first state. When the voltage level of the first power signal is a relatively high voltage level and the voltage level of the second power signal is a relatively high voltage level, the device operating state is the second state. The control module 105 is, for example, a central processing unit (CPU), a microcontroller (MCU), an application-specific integrated circuit (ASIC), or a similar component with computing functions.

On the other hand, the control module 105 further determines the measurement operation state according to the measurement command. The measurement command is, for example, obtained by the control module 105 from another external control device. In another embodiment, the measurement jig 100 has, for example, a non-volatile memory. The non-volatile memory can be set independently and electrically connected to the control module 105, or the non-volatile memory can be set in the control module 105. in module 105. An automated test program is stored in the non-volatile memory. When the measurement jig 100 is activated, the automated test program is executed to generate the measurement command. The above is only an example, but not limited thereto. The measurement operation state is one of the first state and the second state. Specifically, the test command is used to perform an electrical test on the device under test 200, so it may be necessary to make the device under test 200 in or into a power-on state or a power-on state. Therefore, the test command contains test-related information, and it includes the electrical state of the device under test 200 required for the related test, that is, the first state or the second state.

When the device operation state is different from the measurement operation state, the control module 105 controls the device under test 200 to switch the device operation state to the other one of the first state and the second state. That is to say, when the device operating state is the first state (power-on state) and the measurement operating state is the second state (power-on state), the control module 105 controls the device under test 200 to switch the device operating state to the second state , so that the device under test 200 is suitable for testing according to the current test instruction. When the device operating state is the second state (power-on state) and the measurement operating state is the second state (power-on state), the control module 105 controls the device under test 200 to switch the device operating state to the first state, so that the The device under test 200 is suitable for testing according to the current test instruction.

In another embodiment, the control module 105 is further configured to determine whether the device operation state is the third state, and the control module 105 is further configured to determine whether the measurement operation state is the third state. The third state is used to refer to the power-off state. When the control module 105 determines that both the device operation state and the measurement operation state are in the third state, the control module 105 controls the measurement fixture to execute at least one test item corresponding to the third state on the device under test 200 . That is to say, in addition to controlling the device under test 200 to switch between the power-on state (the first state) and the power-on state (the second state) according to the test command, the control module 105 can also determine the test to be performed. Whether the device 200 is in a power-off state or switch the device under test 200 to a power-off state, and perform a corresponding test.

Please refer to FIG. 2 , which is a functional block diagram of a measuring jig according to another embodiment of the present invention. In the embodiment shown in FIG. 2 , the measurement jig 400 has a first connection port 401 , a second connection port 403 and a control module 405 . The connection relationship and related actions of the connection port 401 , the second connection port 403 and the control module 405 relative to the first connection port 101 , the second connection port 103 and the control module 105 in FIG. 1 are similar to each other, and the relevant details are not described here. Repeat.

In the embodiment shown in FIG. 2 , the measuring fixture 400 further has a third connection port 407 , a switching device 409 and a power connection port 411 . The switching device 409 is electrically connected to the control module 405 , the third connection port 407 and the power connection port 411 . Wherein, the third connection port 407 is used for pluggable and electrically connected to the corresponding connection port of the device under test 200, and when the third connection port 407 is electrically connected to the corresponding connection port of the device under test 200, it is further connected through the corresponding connection port of the device under test 200 The connection port is electrically connected to the power module 201 and the control unit 203 of the device under test 200 . The power connection port 411 is used for pluggable electrical connection with the external power source 502 . The external power source 502 is, for example, commercial power or direct current, and the external power source 502 may be the same as or different from the external power source 501 . The power connection port 411 is used to obtain power from the external power source 502 .

The third connection port 407 is used to obtain power from the power module 201 , and the third connection port 407 is used to transmit data with the control unit 203 . The third connection port 407 is, for example, a connection port realized according to the relevant specifications of various generations of universal serial bus (USB), or other transmission ports that can be used to transmit power and data at the same time.

The switching device 409 may be a jumper set or a switch, and the following description will take the jumper set as an example, and the jumper set 409 will be referred to as the following. However, those skilled in the art can deduce the function and operation of the switch by analogy, and details are omitted here. When the jumper set 409 is in the first connection state, the measuring jig 400 obtains power from an external power source. When the jumper set 409 is in the second connection state, the measuring fixture 400 obtains power from the third connection port 407 . The first connection state is different from the second connection state. In more detail, the jumper set 409 has, for example, a jumper base and a jumper member, and the jumper base has at least a first pin, a second pin and a third pin. The first pin of the jumper holder is electrically connected to the third connection port 407 , the second pin of the jumper holder is electrically connected to the control module 405 , and the third pin of the jumper holder is electrically connected to the power connection port 411 . The jumper is used for electrically connecting two of the first pin, the second pin and the third pin. When the jumper element is electrically connected to the first pin and the second pin, the current path between the third connection port 407 and the control module 405 is conducted. When the jumper is electrically connected to the second pin and the third pin, the current path between the control module 405 and the power connection port 411 is conducted. Therefore, when the jumper element is electrically connected to the first pin and the second pin, the measuring fixture 400 obtains power from the third connection port 407 . When the jumper element is electrically connected to the second pin and the third pin, the measuring fixture 400 obtains power from the power connection port 411 .

Please refer to FIG. 3 , which is a functional block diagram of a measuring jig according to another embodiment of the present invention. In the embodiment shown in FIG. 3 , the measurement fixture 700 has a first connection port 701 , a second connection port 703 , a third connection port 707 , a control module 705 , a jumper set 709 and a power connection port 711 . The connection relationship and related actions of the first connection port 701 , the second connection port 703 , the third connection port 707 , the control module 705 , the jumper set 709 and the power connection port 711 are similar to the first connection shown in FIG. 2 The port 401 , the second connection port 403 , the third connection port 407 , the control module 405 , the jumper set 409 and the power connection port 411 will not be repeated here. Compared with the embodiment shown in FIG. 2 , the embodiment shown in FIG. 3 has a fourth connection port 713 . The fourth connection port 713 is electrically connected to the control module 705 and the second connection port 703 . The fourth connection port 713 is used to electrically connect to the control unit 203 of the device under test 200 via the second connection port 703 . In one embodiment, the fourth connection port 713 is, for example, an integrated circuit bus (Inter-Integrated Circuit, I ² C), and the fourth connection port 713 communicates with the fourth connection port 713 via a Universal Asynchronous Receiver/Transmitter (UART). The two connection ports 703 communicate with each other to communicate with the device under test 200 . In a practical application, the user can indirectly control the device under test 200 through the fourth connection port 713 . In one embodiment, the user can further write the relevant test command into the aforementioned non-volatile memory via the fourth connection port 713 to change the test program.

In addition, in the embodiment shown in FIG. 3 , the measurement jig 700 further has a switch unit 715 , and the switch unit 715 is electrically connected to the control module 705 . The switch unit 715 is used to selectively enable or disable the energy measuring tool 700 . The switch unit 715 is, for example, a push-button switch or a knob-type switch.

Please refer to FIG. 4 , which is a schematic top view of the measuring jig shown in FIG. 3 according to the present invention. FIG. 4 shows a relative layout of the components of the measuring jig 700 on the substrate 702 of the measuring jig 700 , but how to arrange the components on the substrate 702 of the measuring jig 700 is not the same as this. limit. The element 717 is, for example, the aforementioned universal asynchronous transceiver.

Please refer to FIG. 5 . FIG. 5 is a flowchart of a method for switching the state of the device under test according to an embodiment of the present invention. In step S101, the voltage level of the first power signal is measured from the first power pin of the device under test. And in step S103, the voltage level of the second power signal is measured from the second power pin of the device under test. In step S105, the device operation state of the device under test is determined according to the voltage level of the first power signal and the voltage level of the second power signal, and the device operation state is one of the first state and the second state. Next, in step S107, the measurement operation state is determined according to the measurement command, and the measurement operation state is one of the first state and the second state. And in step S109, when the measurement operation state is different from the device operation state, the device operation state is switched to the other one of the first state and the second state. Then in step S111, when the measurement operation state is the same as the device operation state, the device operation state is maintained.

In view of the above, the present invention provides a measurement jig and a method for switching the state of the device to be measured. For the measurement jig, the measurement jig is used to determine the device operation state of the device to be measured, and to measure the state of the device to be measured. The fixture is used to determine the measurement operation state indicated by the test command. When the device operation state is different from the measurement operation state, the measurement fixture controls the device under test to switch the operation state of the device to test the relevant measurement items of the device under test. . Therefore, the measurement jig can automatically switch the power state of the device under test selectively according to the test finger, thereby realizing an automatic test solution. In addition, the measurement jig has a variety of different connection ports to transmit power and data with the device under test. Through the communication between the measuring jig and the device to be tested, the user can make timely changes during the test process through the measuring jig, or obtain the relevant information of the device to be tested to understand the details of the testing process, so that More flexible in measurement.

Although the present invention is disclosed in the foregoing embodiments, it is not intended to limit the present invention. All changes and modifications made without departing from the spirit and scope of the present invention belong to the scope of patent protection of the present invention. For the scope of protection defined by the present invention, please refer to the appended claims.

Claims (10)

1. A kind of measurement tool, characterized by, comprising:

a first connection port for connecting a power module of a device under test in a pluggable manner, the first connection port being used for receiving a first power signal and a second power signal;

a second connection port for connecting a control unit of the device under test in a pluggable manner; and

a control module electrically connected to the first connection port and the second connection port for determining a device operation status of the device under test according to the voltage level of the first power signal and the voltage level of the second power signal, the control module further determining a measurement operation status according to a measurement instruction, the device operation status being one of a first status and a second status, the measurement operation status being one of the first status and the second status, and when the device operation status is not the same as the measurement operation status, the control module controls the device under test to switch the device operation status to be the other of the first status and the second status.

2. The measurement tool of claim 1 further comprising a power port for electrically connecting to an external power source to obtain power from the external power source.

3. The measuring tool of claim 2 further comprising a third connecting port, the third connecting port is electrically connected to the control module, the third connecting port is used to electrically connect the power module of the dut and the control unit of the dut, the third connecting port is used to obtain power from the power module, and the third connecting port is used to transmit data with the control unit.

4. The measuring tool of claim 3 further comprising a switching device electrically connecting the third port, the control module and the power port, wherein the measuring tool is powered from the external power source when the switching device is in a first connection state, and the measuring tool is powered from the third port when the switching device is in a second connection state, the first connection state being different from the second connection state.

5. The measurement tool of any one of claims 1 to 4, further comprising a switch unit electrically connected to the control module, the switch unit being configured to selectively enable or disable the measurement tool.

6. The measurement tool of any one of claims 1 to 4, further comprising a fourth connection port electrically connecting the control module and the second connection port, the fourth connection port being used to electrically connect the control module of the device under test via the second connection port, the measurement tool transmitting data or clock signals with the control module via the fourth connection port.

7. The measurement tool of any one of claims 1 to 4, wherein the control module is further configured to determine whether the device operating status is a third status, and the control module is configured to determine whether the measurement operating status is the third status, and when the control module determines that the device operating status and the measurement operating status are both the third status, the control module controls the measurement tool to execute at least one test item corresponding to the third status on the device under test.

8. A method for switching a state of a device under test, comprising:

measuring a voltage level of a first power supply signal from a first power supply pin of a device to be measured;

measuring a voltage level of a second power supply signal from a second power supply pin of the device to be tested;

judging a device operation state of the device to be tested according to the voltage level of the first power signal and the voltage level of the second power signal, wherein the device operation state is one of a first state and a second state;

determining a measurement operating state according to a measurement instruction, wherein the measurement operating state is one of the first state and the second state;

switching the device operating state to be the other one of the first state and the second state when the measurement operating state is different from the device operating state; and

when the measuring operation state is the same as the device operation state, the device operation state is maintained.

9. The method of claim 8, further comprising:

judging whether the operation state of the device is a third state;

judging whether the measurement operation state is the third state; and

when the device operation state and the measurement operation state are both judged to be the third state, a measurement tool is controlled to execute at least one test item corresponding to the third state on the device to be tested.

10. The method of claim 8, wherein switching the device operating state between the first state and the second state is performed after a predetermined time delay when the measurement operating state is different from the device operating state.

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