CN106526295A - Self-calibration current comparator circuit - Google Patents
Self-calibration current comparator circuit Download PDFInfo
- Publication number
- CN106526295A CN106526295A CN201611215676.8A CN201611215676A CN106526295A CN 106526295 A CN106526295 A CN 106526295A CN 201611215676 A CN201611215676 A CN 201611215676A CN 106526295 A CN106526295 A CN 106526295A
- Authority
- CN
- China
- Prior art keywords
- voltage
- current
- threshold
- sensor
- amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003860 storage Methods 0.000 claims description 41
- 239000004065 semiconductor Substances 0.000 claims description 29
- 230000005611 electricity Effects 0.000 claims description 11
- 230000000694 effects Effects 0.000 claims description 5
- 230000003321 amplification Effects 0.000 claims description 4
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 abstract description 8
- 238000005259 measurement Methods 0.000 abstract description 5
- 230000006870 function Effects 0.000 abstract description 3
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
- 230000010354 integration Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000005355 Hall effect Effects 0.000 description 1
- 239000008280 blood Substances 0.000 description 1
- 210000004369 blood Anatomy 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
The invention provides a self-calibration current comparator circuit. The automatic elimination of possible comparator input offset and the error change generated by a current sensor in an operation is facilitated, and thus better detection precision and precise current measurement are realized well. Based on the self-calibration function of the invention, an MOS tube in a measured current path is fully utilized, with an MOS tube switch-on resistor as the current sensor, a smaller PCB area and high integration are realized. The self-calibration current comparator circuit is characterized in that the self-calibration current comparator circuit comprises the current sensor, an amplifier, a self-calibration threshold memory circuit and a comparator connected in order, and the output end of the comparator is connected to a system output end.
Description
Technical field
The present invention relates to precision current comparison circuit, particularly a kind of self calibration current comparison circuit, are conducive to disappearing automatically
Except possible comparator is input into the error change that imbalance and current sensor are produced in operation, so as to realize preferably detection essence
Degree and precision current are measured.Based on the self-calibration function of the present invention, be conducive to making full use of the metal-oxide-semiconductor on tested current path,
Using metal-oxide-semiconductor conducting resistance as current sensor, so as to realize less PCB surface product and higher integrated level.
Background technology
Current comparison circuit is widely used in the over-current detection for loading.In many applications, the over-current detection of electric current is to be
The key link of system safeguard protection.Because electric current is not easy directly to compare, it is common practice to by sensor (current sense
Device) electric current is converted into voltage after carry out detection comparison again.Middle low current (<Sensor 100Amp) often uses resistive sensing
Device, for example, the conducting resistance of precision resistance or metal-oxide-semiconductor.The sensor of high current often uses magnetoelectric transducer, for example, Hall
Effect device (Hall element) or transformator.In many applications that precision current compares, such as battery protecting circuit, electricity
Drive circuit etc., has a metal-oxide-semiconductor for being operated on off state on tested current path, thus conducting of the metal-oxide-semiconductor in conducting
Resistance Ron is just used as sensor, the electric current in measuring route.This method is avoided using extra accurate measurement electricity
Resistance, so as to avoid extra system power dissipation.As the precision and stability of sensor directly determines the precision of current detecting
And stability, and relatively low accuracy of detection can not only cause slight excessively stream missing inspection, and the available maximum current of system can be reduced
Scope, so as to reduce system effectiveness.Based on the current sensor of metal-oxide-semiconductor conducting resistance, certainty of measurement is subject to the grid electricity of metal-oxide-semiconductor
The impact of pressure, operating temperature and technique discreteness, certainty of measurement is often relatively low, therefore hinders metal-oxide-semiconductor conducting resistance Ron in essence
The utilization of resources in close current comparison circuit.
The content of the invention
The present invention is for defect or deficiency present in prior art, there is provided a kind of self calibration current comparison circuit, favorably
In the error change that possible comparator input imbalance and current sensor are produced in operation is eliminated automatically, so as to realize more preferably
Accuracy of detection and precision current measurement.Based on the self-calibration function of the present invention, be conducive to making full use of on tested current path
Metal-oxide-semiconductor, using metal-oxide-semiconductor conducting resistance as current sensor, so as to realize less PCB surface product and higher integrated level.
Technical solution of the present invention is as follows:
Self calibration current comparison circuit, it is characterised in that including the current sensor, amplifier, self calibration that are sequentially connected
Threshold memory circuit and comparator, the outfan connection system outfan of the comparator.
The current sensor has tested current input terminal, tested current output terminal and a sensor clock end, it is described from
Calibration threshold value storage circuit includes first threshold storage capacitance, Second Threshold storage capacitance, first switch device and second switch device,
First sensing voltage outfan of the current sensor connects the positive input of the amplifier, the current sensor
Second sensing voltage outfan connects the negative input of the amplifier, and the positive outfan of the amplifier connects described the
The left side port of one threshold value storage capacitance, the right side port of the first threshold storage capacitance are connected by the first switch device
External stability voltage end, the negative sense outfan of the amplifier connect the left side port of the Second Threshold storage capacitance, described
The right side port of Second Threshold storage capacitance connects external stability voltage end by the second switch device, and the first threshold is deposited
The right side port that storing up electricity is held connects the positive input of the comparator, the right side port connection of the Second Threshold storage capacitance
The negative input of the comparator.
The first switch device and second switch device are respectively provided with control end.
The control end of the first switch, the control end of the second switch and the sensor clock end are together connected to
Outer clock circuit.
The current sensor adopts metal-oxide-semiconductor conducting resistance sensor.
The metal-oxide-semiconductor is the metal-oxide-semiconductor on outside tested current path.
When sensor clock end is logic high, differential threshold electricity between the first sensing voltage and the second sensing voltage, is formed
Pressure, the differential threshold voltage are stored in first threshold storage capacitance and Second Threshold storage capacitance after amplifier amplifies described in
On, first switch device and second switch device are conducting state, and the outfan output result of the comparator is invalid.
The differential threshold voltage is the product of and metal-oxide-semiconductor conducting resistance in stabling current and the current sensor
Proportional value.
The first threshold storage capacitance and Second Threshold storage capacitance storage be the amplifier offset voltage and
The differential threshold voltage, voltage and institute that in relatively phase place, actually the product of tested electric current and metal-oxide-semiconductor conducting resistance is obtained
State differential threshold voltage to be compared, thus the effect of metal-oxide-semiconductor conducting resistance is eliminated, the offset voltage of amplifier when comparing
Subtract each other with the offset voltage stored in electric capacity during calibration, thus the offset voltage of amplifier is also eliminated.
When sensor clock end is logic low, the differential voltage direct ratio between the first sensing voltage and the second sensing voltage
In the tested electric current of input, first switch device and second switch device are cut-off state, the outfan output knot of the comparator
Fruit is effectively.
The differential threshold voltage and the offset voltage of the amplifier that the current sensor is produced is stored in threshold value electricity
Rong Zhong, the comparator in the comparison for subsequently carrying out, the imbalance stored in threshold value electric capacity by the offset voltage of the amplifier
Voltage compensation, it is achieved thereby that the threshold voltage stored in the current sensor output voltage and threshold value electric capacity is accurately compared
Compared with.
The technology of the present invention effect is as follows:The self calibration current comparison circuit of the present invention, by being stored using self calibration threshold value
Circuit, eliminates the error change that comparator input imbalance and current sensor are produced in operation, such as metal-oxide-semiconductor conducting resistance
The error brought of change, improve accuracy of detection.
Description of the drawings
Fig. 1 is the principle schematic diagram. for implementing self calibration current comparison circuit of the present invention.
Reference lists as follows:Tested electric current input line outside 1-;Tested current output line outside 2-;3- external clocks
Circuit connecting wire;The tested current input terminals of 4- (i.e. In+);The tested current output terminals of 5- (i.e. In-);6- current sensor clocks end
(i.e. CK);7-MOSFET sensors (i.e. Sensor);8- the first sensing voltage outfans (i.e. Out+);The second sensing voltages of 9- are defeated
Go out end (i.e. Out-);10- amplifiers (i.e. A1);11- first threshold storage capacitances (i.e. C+);12- Second Thresholds storage capacitance is (i.e.
C-);13- first switch devices (i.e. S+);14- external stability voltage ends;15- second switch devices (i.e. S-);16- comparators;17- systems
System outfan (i.e. out);18- constant current source input ports (i.e. Iref or stabling current Iref).
Specific embodiment
Below in conjunction with the accompanying drawings (Fig. 1) the present invention will be described.
Fig. 1 is the principle schematic diagram. for implementing self calibration current comparison circuit of the present invention.As shown in figure 1, self calibration is electric
Stream comparison circuit, including the current sensor 7, amplifier 10, self calibration Threshold memory circuit and the comparator 16 that are sequentially connected, institute
State the outfan connection system outfan 17 of comparator 16.The current sensor 7 has tested current input terminal 4 (for connecting
Connect outside tested electric current input line 1), tested current output terminal 5 (for connecting outside tested current output line 2) and during sensor
Clock end 6 (for connecting outer clock circuit connecting line 3), the self calibration Threshold memory circuit includes first threshold storage capacitance
11st, Second Threshold storage capacitance 12, first switch device 13 and second switch device 15, the first sensing electricity of the current sensor 7
Pressure outfan 8 connects the positive input (+) of the amplifier 10, the second sensing voltage outfan 9 of the current sensor 7
Connect the negative input (-) of the amplifier 10, positive outfan (+) the connection first threshold of the amplifier 10 is deposited
Storing up electricity holds 11 left side port, and the right side port of the first threshold storage capacitance 11 connects outer by the first switch device 13
Portion fixed voltage end 14, the negative sense outfan (-) of the amplifier 10 connect the left-hand end of the Second Threshold storage capacitance 15
Mouthful, the right side port of the Second Threshold storage capacitance 15 connects external stability voltage end 14 by the second switch device 15,
The right side port of the first threshold storage capacitance 11 connects the positive input (+) of the comparator 16, the Second Threshold
The right side port of storage capacitance connects the negative input (-) of the comparator.
The first switch device 13 and second switch device 15 are respectively provided with control end.The control end of the first switch device 13,
The control end of the second switch device 13 and the sensor clock end 6 are together connected to outer clock circuit (during by outside
Clock circuit connecting wire is 3).The current sensor 7 adopts metal-oxide-semiconductor conducting resistance sensor.The metal-oxide-semiconductor is outside tested electric current
Metal-oxide-semiconductor on path.When sensor clock end CK be logic high when, the first sensing voltage Out+ and the second sensing voltage Out- it
Between formed differential threshold voltage Vth1, the differential threshold voltage Vth1 described in amplifier 10 amplify after be stored in first threshold
In storage capacitance C+ and Second Threshold storage capacitance C-, first switch device 13 and second switch device 15 are conducting state, described
The outfan output result of comparator 16 is invalid.The differential threshold voltage Vth1 is one and stabling current Iref and the electricity
The proportional value of the product of metal-oxide-semiconductor conducting resistance Ron in flow sensor.First threshold storage capacitance C+ and Second Threshold are deposited
What storing up electricity held C- storages is the offset voltage and the differential threshold voltage Vth1 of the amplifier 10 (A1), in relatively phase place
The voltage and the differential threshold voltage Vth1 that actual tested electric current is obtained with the product of metal-oxide-semiconductor conducting resistance Ron is compared,
Thus the effect of metal-oxide-semiconductor conducting resistance Ron is eliminated, the offset voltage of amplifier 10 and electric capacity C+, C- when calibrating when comparing
The offset voltage of middle storage subtracts each other, thus the offset voltage of amplifier 10 (A1) is also eliminated.When sensor clock end CK is to patrol
When collecting low, the differential voltage between the first sensing voltage Out+ and the second sensing voltage Out- is proportional to the tested electric current of input,
First switch device 13 and second switch device 15 are cut-off state, and the outfan output result of the comparator 16 is effective.It is described
The differential threshold voltage and the offset voltage of the amplifier that current sensor is produced is stored in threshold value electric capacity, the comparison
Device in the comparison for subsequently carrying out, the offset compensation stored in threshold value electric capacity by the offset voltage of the amplifier, so as to
The threshold voltage stored in realizing the current sensor output voltage and threshold value electric capacity is accurately compared.
Self calibration current comparison circuit of the present invention, including current sensor Sensor, amplifier A1, threshold value storage capacitance C+
And C-, derailing switch S+ and S-, and comparator Comp etc..Outside tested electric current flows into In+ from 1, flows back out 2 from In-.When outside
Clock is from the 3 CK ends for being input to Sensor and the control end of derailing switch S+ and S-.When external clock is logic high, Sensor exists
Out+, Out- export a differential threshold voltage Vth1 and give amplifier A1, and the voltage is stored on C+, C- after A1 amplifications, S
+, S- it is in the conduction state, on the right side of C+, C-, port is connected on external signal i.e. external stability voltage 14 by S+, S-, is compared
The positive negative input of device Comp is connected on external signal i.e. external stability voltage 14 also by S+, S-.It is logic in external clock
When low, CK ends are logic low, and the differential voltage and input current that Sensor is exported in Out+, Out- be directly proportional, and proportionality coefficient is
K, A1 amplification is constant, and S+, S- are in off-state, and comparator input is the right side port of C+, C-.Comparator output is only in CK
Hold for logic low when be considered as just effective.The present invention produces sensor by above-mentioned connected mode and operation logic
The offset of differential threshold voltage and amplifier A1 is stored in electric capacity C+, C-.In the comparison for subsequently carrying out, the offset of A1
The offset compensation stored in electric capacity, it is achieved thereby that the threshold voltage stored in sensor output voltage and electric capacity carries out essence
Really compare.Self calibration current comparison circuit of the present invention has two working conditions.In first job state, sensor exports one
Threshold voltage, S+, S- conducting, comparator Comp outputs are considered as invalid.In second working condition, sensor output and input
The signal voltage that electric current is directly proportional, S+, S- cut-off, comparator Comp outputs are considered as effective.
There are two key points in the present invention, one is that Vth1 is one and (can be carried by external impressed current source with stabling current
For in such as Fig. 1,18) stabling current Iref is input into constant current source input port and metal-oxide-semiconductor conducting resistance by external current source
The proportional value of the product of Ron, two is that what is stored in electric capacity is the offset voltage of Vth1+ amplifier A1, the reality in relatively phase place
The voltage and Vth1 that the tested electric current * Ron in border are obtained is compared, thus the effect of Ron is eliminated.(amplify when comparing certainly
The offset voltage stored when the offset voltage of device and calibration subtracts each other, thus offset voltage is also eliminated).
It is hereby stated that, it is described above to contribute to skilled artisan understands that the invention, but not limit the present invention
The protection domain of creation.It is any equivalent described above, modification to be improved without departing from the invention flesh and blood
And/or the enforcement deleted numerous conforming to the principle of simplicity and carry out, each fall within the protection domain of the invention.
Claims (10)
1. self calibration current comparison circuit, it is characterised in that including the current sensor, amplifier, self calibration threshold that are sequentially connected
Value storage circuit and comparator, the outfan connection system outfan of the comparator.
2. self calibration current comparison circuit according to claim 1, it is characterised in that the current sensor has tested
Current input terminal, tested current output terminal and sensor clock end, the self calibration Threshold memory circuit include that first threshold is deposited
Storing up electricity appearance, Second Threshold storage capacitance, first switch device and second switch device, the first sensing voltage of the current sensor are defeated
Go out the positive input of the end connection amplifier, the second sensing voltage outfan of the current sensor connects the amplification
The negative input of device, the positive outfan of the amplifier connect the left side port of the first threshold storage capacitance, described
The right side port of first threshold storage capacitance connects external stability voltage end by the first switch device, the amplifier it is negative
Connect the left side port of the Second Threshold storage capacitance to outfan, the right side port of the Second Threshold storage capacitance passes through
The second switch device connects external stability voltage end, and the right side port of the first threshold storage capacitance connects the comparator
Positive input, the right side port of the Second Threshold storage capacitance connects the negative input of the comparator.
3. self calibration current comparison circuit according to claim 2, it is characterised in that the first switch device and second is opened
Close device and be respectively provided with control end.
4. self calibration current comparison circuit according to claim 2, it is characterised in that the control end of the first switch,
The control end of the second switch and the sensor clock end are together connected to outer clock circuit.
5. self calibration current comparison circuit according to claim 1, it is characterised in that the current sensor adopts MOS
Pipe conducting resistance sensor, the metal-oxide-semiconductor are the metal-oxide-semiconductor on outside tested current path.
6. self calibration current comparison circuit according to claim 2, it is characterised in that when sensor clock end is logic high
When, differential threshold voltage, amplification described in the differential threshold voltage Jing are formed between the first sensing voltage and the second sensing voltage
Device is stored in first threshold storage capacitance and Second Threshold storage capacitance after amplifying, and first switch device and second switch device are
Conducting state, the outfan output result of the comparator are invalid.
7. self calibration current comparison circuit according to claim 2, it is characterised in that the differential threshold voltage is
The value proportional to the product of metal-oxide-semiconductor conducting resistance in stabling current and the current sensor.
8. self calibration current comparison circuit according to claim 2, it is characterised in that the first threshold storage capacitance and
Second Threshold storage capacitance storage be the amplifier offset voltage and the differential threshold voltage, the reality in relatively phase place
The voltage and the differential threshold voltage that the product of the tested electric current in border and metal-oxide-semiconductor conducting resistance is obtained is compared, thus metal-oxide-semiconductor
The effect of conducting resistance is eliminated, the offset voltage phase stored in electric capacity when the offset voltage of amplifier and calibration when comparing
Subtract, thus the offset voltage of amplifier is also eliminated.
9. self calibration current comparison circuit according to claim 2, it is characterised in that when sensor clock end is logic low
When, the differential voltage between the first sensing voltage and the second sensing voltage is proportional to the tested electric current of input, first switch device and
Second switch device is cut-off state, and the outfan output result of the comparator is effective.
10. self calibration current comparison circuit according to claim 2, it is characterised in that what the current sensor was produced
The offset voltage of differential threshold voltage and the amplifier is stored in threshold value electric capacity, and the comparator is in the ratio for subsequently carrying out
In relatively, the offset compensation stored in threshold value electric capacity by the offset voltage of the amplifier, it is achieved thereby that the electric current is passed
The threshold voltage stored in sensor output voltage and threshold value electric capacity is accurately compared.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201611215676.8A CN106526295B (en) | 2016-12-26 | 2016-12-26 | Self calibration current comparison circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201611215676.8A CN106526295B (en) | 2016-12-26 | 2016-12-26 | Self calibration current comparison circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106526295A true CN106526295A (en) | 2017-03-22 |
CN106526295B CN106526295B (en) | 2019-05-21 |
Family
ID=58338766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201611215676.8A Active CN106526295B (en) | 2016-12-26 | 2016-12-26 | Self calibration current comparison circuit |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106526295B (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111175676A (en) * | 2020-01-23 | 2020-05-19 | 杭州士兰微电子股份有限公司 | Low-voltage sensor system and method of eliminating offset |
CN111610424A (en) * | 2019-02-26 | 2020-09-01 | 圣邦微电子(北京)股份有限公司 | Test circuit, test method and test device for operational amplifier |
CN113687125A (en) * | 2020-05-18 | 2021-11-23 | 广州汽车集团股份有限公司 | Offset voltage correction method and system for operational amplifier in current detection circuit |
CN114019415A (en) * | 2022-01-06 | 2022-02-08 | 宜矽源半导体南京有限公司 | Integrated short-circuit current detector with variable threshold, self-calibration and high precision |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06125228A (en) * | 1992-10-09 | 1994-05-06 | New Japan Radio Co Ltd | Offset voltage correction circuit |
CN1567723A (en) * | 2003-07-09 | 2005-01-19 | 上海华虹集成电路有限责任公司 | A CMOS voltage comparator |
CN202940794U (en) * | 2012-11-29 | 2013-05-15 | 哈尔滨理工大学 | Medium-speed high-precision analog voltage comparator |
CN104143818A (en) * | 2014-08-19 | 2014-11-12 | 圣邦微电子(北京)股份有限公司 | Device for preventing current limiting circuit from being adjusted excessively |
US9071265B1 (en) * | 2014-08-12 | 2015-06-30 | Freescale Semiconductor, Inc. | Successive approximation analog-to-digital converter with linearity error correction |
CN106059583A (en) * | 2016-05-20 | 2016-10-26 | 深圳芯智汇科技有限公司 | Comparator offset voltage calibration circuit and method |
CN106130557A (en) * | 2016-06-20 | 2016-11-16 | 中国电子科技集团公司第二十四研究所 | A kind of comparator imbalance voltage self-correcting circuit |
-
2016
- 2016-12-26 CN CN201611215676.8A patent/CN106526295B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06125228A (en) * | 1992-10-09 | 1994-05-06 | New Japan Radio Co Ltd | Offset voltage correction circuit |
CN1567723A (en) * | 2003-07-09 | 2005-01-19 | 上海华虹集成电路有限责任公司 | A CMOS voltage comparator |
CN202940794U (en) * | 2012-11-29 | 2013-05-15 | 哈尔滨理工大学 | Medium-speed high-precision analog voltage comparator |
US9071265B1 (en) * | 2014-08-12 | 2015-06-30 | Freescale Semiconductor, Inc. | Successive approximation analog-to-digital converter with linearity error correction |
CN104143818A (en) * | 2014-08-19 | 2014-11-12 | 圣邦微电子(北京)股份有限公司 | Device for preventing current limiting circuit from being adjusted excessively |
CN106059583A (en) * | 2016-05-20 | 2016-10-26 | 深圳芯智汇科技有限公司 | Comparator offset voltage calibration circuit and method |
CN106130557A (en) * | 2016-06-20 | 2016-11-16 | 中国电子科技集团公司第二十四研究所 | A kind of comparator imbalance voltage self-correcting circuit |
Non-Patent Citations (1)
Title |
---|
马洪涛 等: "《开关电源制作与调试》", 31 July 2014, 中国电力出版社 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111610424A (en) * | 2019-02-26 | 2020-09-01 | 圣邦微电子(北京)股份有限公司 | Test circuit, test method and test device for operational amplifier |
CN111175676A (en) * | 2020-01-23 | 2020-05-19 | 杭州士兰微电子股份有限公司 | Low-voltage sensor system and method of eliminating offset |
CN113687125A (en) * | 2020-05-18 | 2021-11-23 | 广州汽车集团股份有限公司 | Offset voltage correction method and system for operational amplifier in current detection circuit |
CN114019415A (en) * | 2022-01-06 | 2022-02-08 | 宜矽源半导体南京有限公司 | Integrated short-circuit current detector with variable threshold, self-calibration and high precision |
Also Published As
Publication number | Publication date |
---|---|
CN106526295B (en) | 2019-05-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI670490B (en) | Method of measuring integrated circuit resistance value of target resistor using excitation current and sensor interface integrated circuit for measuring or calibrating resistance value of target resistor using the same | |
CN106526295A (en) | Self-calibration current comparator circuit | |
WO2016179964A1 (en) | Detection circuit and detection method for high-side current | |
CN103383404B (en) | Current measurement circuit | |
CN103424580A (en) | Electronic load | |
JP2015169516A (en) | Inspection method of sensing device and sensing device of the same | |
CN204855009U (en) | Temperature detection circuit based on platinum thermal resistance | |
CN207281217U (en) | A kind of amplifier circuit of compatibility electric current and temperature detection | |
CN203177993U (en) | Temperature measuring circuit | |
CN203759112U (en) | High-frequency current detection circuit | |
CN109818586A (en) | A kind of current signal amplifier circuit, current signal detection circuit and detection method | |
CN214954041U (en) | Intelligent self-calibration current Hall sensor | |
CN102680112B (en) | Unit thermistor detector reading-out circuit manufactured in PCB (Printed Circuit Board) circuit manner | |
WO2021077589A1 (en) | Circuit and apparatus for measuring pulse-per-second signal time difference | |
CN205665382U (en) | Enlarged circuit that draws of difference mode signal | |
US20170288439A1 (en) | Signal processing circuit, coulomb counter circuit, and electronic device | |
CN204064496U (en) | A Highly Reliable and Accurate Temperature Measuring Circuit | |
CN111765982A (en) | High-precision temperature measurement control circuit | |
CN206594217U (en) | A kind of optocoupler current detection circuit | |
CN110231587A (en) | Detection circuit, method and the electric energy computation chip of bleeder circuit parameter | |
CN113155159B (en) | Bridge detector | |
CN104330186A (en) | Temperature detection circuit based on transformer isolation | |
CN209387064U (en) | A Universal Measuring Circuit for Temperature and Leakage | |
CN204514495U (en) | The temperature measurement circuit of platinum resistance thermometer sensor, PT100 | |
CN204575721U (en) | DC component detection circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information |
Inventor after: Lin Yijing Inventor after: Man Xuecheng Inventor before: Lin Yijing Inventor before: Man Xuecheng |
|
CB03 | Change of inventor or designer information | ||
GR01 | Patent grant | ||
GR01 | Patent grant |