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CN106526295A - Self-calibration current comparator circuit - Google Patents

Self-calibration current comparator circuit Download PDF

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Publication number
CN106526295A
CN106526295A CN201611215676.8A CN201611215676A CN106526295A CN 106526295 A CN106526295 A CN 106526295A CN 201611215676 A CN201611215676 A CN 201611215676A CN 106526295 A CN106526295 A CN 106526295A
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China
Prior art keywords
voltage
current
threshold
sensor
amplifier
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CN201611215676.8A
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CN106526295B (en
Inventor
林毅竟
满雪城
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SG Micro Beijing Co Ltd
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SG Micro Beijing Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

The invention provides a self-calibration current comparator circuit. The automatic elimination of possible comparator input offset and the error change generated by a current sensor in an operation is facilitated, and thus better detection precision and precise current measurement are realized well. Based on the self-calibration function of the invention, an MOS tube in a measured current path is fully utilized, with an MOS tube switch-on resistor as the current sensor, a smaller PCB area and high integration are realized. The self-calibration current comparator circuit is characterized in that the self-calibration current comparator circuit comprises the current sensor, an amplifier, a self-calibration threshold memory circuit and a comparator connected in order, and the output end of the comparator is connected to a system output end.

Description

Self calibration current comparison circuit
Technical field
The present invention relates to precision current comparison circuit, particularly a kind of self calibration current comparison circuit, are conducive to disappearing automatically Except possible comparator is input into the error change that imbalance and current sensor are produced in operation, so as to realize preferably detection essence Degree and precision current are measured.Based on the self-calibration function of the present invention, be conducive to making full use of the metal-oxide-semiconductor on tested current path, Using metal-oxide-semiconductor conducting resistance as current sensor, so as to realize less PCB surface product and higher integrated level.
Background technology
Current comparison circuit is widely used in the over-current detection for loading.In many applications, the over-current detection of electric current is to be The key link of system safeguard protection.Because electric current is not easy directly to compare, it is common practice to by sensor (current sense Device) electric current is converted into voltage after carry out detection comparison again.Middle low current (<Sensor 100Amp) often uses resistive sensing Device, for example, the conducting resistance of precision resistance or metal-oxide-semiconductor.The sensor of high current often uses magnetoelectric transducer, for example, Hall Effect device (Hall element) or transformator.In many applications that precision current compares, such as battery protecting circuit, electricity Drive circuit etc., has a metal-oxide-semiconductor for being operated on off state on tested current path, thus conducting of the metal-oxide-semiconductor in conducting Resistance Ron is just used as sensor, the electric current in measuring route.This method is avoided using extra accurate measurement electricity Resistance, so as to avoid extra system power dissipation.As the precision and stability of sensor directly determines the precision of current detecting And stability, and relatively low accuracy of detection can not only cause slight excessively stream missing inspection, and the available maximum current of system can be reduced Scope, so as to reduce system effectiveness.Based on the current sensor of metal-oxide-semiconductor conducting resistance, certainty of measurement is subject to the grid electricity of metal-oxide-semiconductor The impact of pressure, operating temperature and technique discreteness, certainty of measurement is often relatively low, therefore hinders metal-oxide-semiconductor conducting resistance Ron in essence The utilization of resources in close current comparison circuit.
The content of the invention
The present invention is for defect or deficiency present in prior art, there is provided a kind of self calibration current comparison circuit, favorably In the error change that possible comparator input imbalance and current sensor are produced in operation is eliminated automatically, so as to realize more preferably Accuracy of detection and precision current measurement.Based on the self-calibration function of the present invention, be conducive to making full use of on tested current path Metal-oxide-semiconductor, using metal-oxide-semiconductor conducting resistance as current sensor, so as to realize less PCB surface product and higher integrated level.
Technical solution of the present invention is as follows:
Self calibration current comparison circuit, it is characterised in that including the current sensor, amplifier, self calibration that are sequentially connected Threshold memory circuit and comparator, the outfan connection system outfan of the comparator.
The current sensor has tested current input terminal, tested current output terminal and a sensor clock end, it is described from Calibration threshold value storage circuit includes first threshold storage capacitance, Second Threshold storage capacitance, first switch device and second switch device, First sensing voltage outfan of the current sensor connects the positive input of the amplifier, the current sensor Second sensing voltage outfan connects the negative input of the amplifier, and the positive outfan of the amplifier connects described the The left side port of one threshold value storage capacitance, the right side port of the first threshold storage capacitance are connected by the first switch device External stability voltage end, the negative sense outfan of the amplifier connect the left side port of the Second Threshold storage capacitance, described The right side port of Second Threshold storage capacitance connects external stability voltage end by the second switch device, and the first threshold is deposited The right side port that storing up electricity is held connects the positive input of the comparator, the right side port connection of the Second Threshold storage capacitance The negative input of the comparator.
The first switch device and second switch device are respectively provided with control end.
The control end of the first switch, the control end of the second switch and the sensor clock end are together connected to Outer clock circuit.
The current sensor adopts metal-oxide-semiconductor conducting resistance sensor.
The metal-oxide-semiconductor is the metal-oxide-semiconductor on outside tested current path.
When sensor clock end is logic high, differential threshold electricity between the first sensing voltage and the second sensing voltage, is formed Pressure, the differential threshold voltage are stored in first threshold storage capacitance and Second Threshold storage capacitance after amplifier amplifies described in On, first switch device and second switch device are conducting state, and the outfan output result of the comparator is invalid.
The differential threshold voltage is the product of and metal-oxide-semiconductor conducting resistance in stabling current and the current sensor Proportional value.
The first threshold storage capacitance and Second Threshold storage capacitance storage be the amplifier offset voltage and The differential threshold voltage, voltage and institute that in relatively phase place, actually the product of tested electric current and metal-oxide-semiconductor conducting resistance is obtained State differential threshold voltage to be compared, thus the effect of metal-oxide-semiconductor conducting resistance is eliminated, the offset voltage of amplifier when comparing Subtract each other with the offset voltage stored in electric capacity during calibration, thus the offset voltage of amplifier is also eliminated.
When sensor clock end is logic low, the differential voltage direct ratio between the first sensing voltage and the second sensing voltage In the tested electric current of input, first switch device and second switch device are cut-off state, the outfan output knot of the comparator Fruit is effectively.
The differential threshold voltage and the offset voltage of the amplifier that the current sensor is produced is stored in threshold value electricity Rong Zhong, the comparator in the comparison for subsequently carrying out, the imbalance stored in threshold value electric capacity by the offset voltage of the amplifier Voltage compensation, it is achieved thereby that the threshold voltage stored in the current sensor output voltage and threshold value electric capacity is accurately compared Compared with.
The technology of the present invention effect is as follows:The self calibration current comparison circuit of the present invention, by being stored using self calibration threshold value Circuit, eliminates the error change that comparator input imbalance and current sensor are produced in operation, such as metal-oxide-semiconductor conducting resistance The error brought of change, improve accuracy of detection.
Description of the drawings
Fig. 1 is the principle schematic diagram. for implementing self calibration current comparison circuit of the present invention.
Reference lists as follows:Tested electric current input line outside 1-;Tested current output line outside 2-;3- external clocks Circuit connecting wire;The tested current input terminals of 4- (i.e. In+);The tested current output terminals of 5- (i.e. In-);6- current sensor clocks end (i.e. CK);7-MOSFET sensors (i.e. Sensor);8- the first sensing voltage outfans (i.e. Out+);The second sensing voltages of 9- are defeated Go out end (i.e. Out-);10- amplifiers (i.e. A1);11- first threshold storage capacitances (i.e. C+);12- Second Thresholds storage capacitance is (i.e. C-);13- first switch devices (i.e. S+);14- external stability voltage ends;15- second switch devices (i.e. S-);16- comparators;17- systems System outfan (i.e. out);18- constant current source input ports (i.e. Iref or stabling current Iref).
Specific embodiment
Below in conjunction with the accompanying drawings (Fig. 1) the present invention will be described.
Fig. 1 is the principle schematic diagram. for implementing self calibration current comparison circuit of the present invention.As shown in figure 1, self calibration is electric Stream comparison circuit, including the current sensor 7, amplifier 10, self calibration Threshold memory circuit and the comparator 16 that are sequentially connected, institute State the outfan connection system outfan 17 of comparator 16.The current sensor 7 has tested current input terminal 4 (for connecting Connect outside tested electric current input line 1), tested current output terminal 5 (for connecting outside tested current output line 2) and during sensor Clock end 6 (for connecting outer clock circuit connecting line 3), the self calibration Threshold memory circuit includes first threshold storage capacitance 11st, Second Threshold storage capacitance 12, first switch device 13 and second switch device 15, the first sensing electricity of the current sensor 7 Pressure outfan 8 connects the positive input (+) of the amplifier 10, the second sensing voltage outfan 9 of the current sensor 7 Connect the negative input (-) of the amplifier 10, positive outfan (+) the connection first threshold of the amplifier 10 is deposited Storing up electricity holds 11 left side port, and the right side port of the first threshold storage capacitance 11 connects outer by the first switch device 13 Portion fixed voltage end 14, the negative sense outfan (-) of the amplifier 10 connect the left-hand end of the Second Threshold storage capacitance 15 Mouthful, the right side port of the Second Threshold storage capacitance 15 connects external stability voltage end 14 by the second switch device 15, The right side port of the first threshold storage capacitance 11 connects the positive input (+) of the comparator 16, the Second Threshold The right side port of storage capacitance connects the negative input (-) of the comparator.
The first switch device 13 and second switch device 15 are respectively provided with control end.The control end of the first switch device 13, The control end of the second switch device 13 and the sensor clock end 6 are together connected to outer clock circuit (during by outside Clock circuit connecting wire is 3).The current sensor 7 adopts metal-oxide-semiconductor conducting resistance sensor.The metal-oxide-semiconductor is outside tested electric current Metal-oxide-semiconductor on path.When sensor clock end CK be logic high when, the first sensing voltage Out+ and the second sensing voltage Out- it Between formed differential threshold voltage Vth1, the differential threshold voltage Vth1 described in amplifier 10 amplify after be stored in first threshold In storage capacitance C+ and Second Threshold storage capacitance C-, first switch device 13 and second switch device 15 are conducting state, described The outfan output result of comparator 16 is invalid.The differential threshold voltage Vth1 is one and stabling current Iref and the electricity The proportional value of the product of metal-oxide-semiconductor conducting resistance Ron in flow sensor.First threshold storage capacitance C+ and Second Threshold are deposited What storing up electricity held C- storages is the offset voltage and the differential threshold voltage Vth1 of the amplifier 10 (A1), in relatively phase place The voltage and the differential threshold voltage Vth1 that actual tested electric current is obtained with the product of metal-oxide-semiconductor conducting resistance Ron is compared, Thus the effect of metal-oxide-semiconductor conducting resistance Ron is eliminated, the offset voltage of amplifier 10 and electric capacity C+, C- when calibrating when comparing The offset voltage of middle storage subtracts each other, thus the offset voltage of amplifier 10 (A1) is also eliminated.When sensor clock end CK is to patrol When collecting low, the differential voltage between the first sensing voltage Out+ and the second sensing voltage Out- is proportional to the tested electric current of input, First switch device 13 and second switch device 15 are cut-off state, and the outfan output result of the comparator 16 is effective.It is described The differential threshold voltage and the offset voltage of the amplifier that current sensor is produced is stored in threshold value electric capacity, the comparison Device in the comparison for subsequently carrying out, the offset compensation stored in threshold value electric capacity by the offset voltage of the amplifier, so as to The threshold voltage stored in realizing the current sensor output voltage and threshold value electric capacity is accurately compared.
Self calibration current comparison circuit of the present invention, including current sensor Sensor, amplifier A1, threshold value storage capacitance C+ And C-, derailing switch S+ and S-, and comparator Comp etc..Outside tested electric current flows into In+ from 1, flows back out 2 from In-.When outside Clock is from the 3 CK ends for being input to Sensor and the control end of derailing switch S+ and S-.When external clock is logic high, Sensor exists Out+, Out- export a differential threshold voltage Vth1 and give amplifier A1, and the voltage is stored on C+, C- after A1 amplifications, S +, S- it is in the conduction state, on the right side of C+, C-, port is connected on external signal i.e. external stability voltage 14 by S+, S-, is compared The positive negative input of device Comp is connected on external signal i.e. external stability voltage 14 also by S+, S-.It is logic in external clock When low, CK ends are logic low, and the differential voltage and input current that Sensor is exported in Out+, Out- be directly proportional, and proportionality coefficient is K, A1 amplification is constant, and S+, S- are in off-state, and comparator input is the right side port of C+, C-.Comparator output is only in CK Hold for logic low when be considered as just effective.The present invention produces sensor by above-mentioned connected mode and operation logic The offset of differential threshold voltage and amplifier A1 is stored in electric capacity C+, C-.In the comparison for subsequently carrying out, the offset of A1 The offset compensation stored in electric capacity, it is achieved thereby that the threshold voltage stored in sensor output voltage and electric capacity carries out essence Really compare.Self calibration current comparison circuit of the present invention has two working conditions.In first job state, sensor exports one Threshold voltage, S+, S- conducting, comparator Comp outputs are considered as invalid.In second working condition, sensor output and input The signal voltage that electric current is directly proportional, S+, S- cut-off, comparator Comp outputs are considered as effective.
There are two key points in the present invention, one is that Vth1 is one and (can be carried by external impressed current source with stabling current For in such as Fig. 1,18) stabling current Iref is input into constant current source input port and metal-oxide-semiconductor conducting resistance by external current source The proportional value of the product of Ron, two is that what is stored in electric capacity is the offset voltage of Vth1+ amplifier A1, the reality in relatively phase place The voltage and Vth1 that the tested electric current * Ron in border are obtained is compared, thus the effect of Ron is eliminated.(amplify when comparing certainly The offset voltage stored when the offset voltage of device and calibration subtracts each other, thus offset voltage is also eliminated).
It is hereby stated that, it is described above to contribute to skilled artisan understands that the invention, but not limit the present invention The protection domain of creation.It is any equivalent described above, modification to be improved without departing from the invention flesh and blood And/or the enforcement deleted numerous conforming to the principle of simplicity and carry out, each fall within the protection domain of the invention.

Claims (10)

1. self calibration current comparison circuit, it is characterised in that including the current sensor, amplifier, self calibration threshold that are sequentially connected Value storage circuit and comparator, the outfan connection system outfan of the comparator.
2. self calibration current comparison circuit according to claim 1, it is characterised in that the current sensor has tested Current input terminal, tested current output terminal and sensor clock end, the self calibration Threshold memory circuit include that first threshold is deposited Storing up electricity appearance, Second Threshold storage capacitance, first switch device and second switch device, the first sensing voltage of the current sensor are defeated Go out the positive input of the end connection amplifier, the second sensing voltage outfan of the current sensor connects the amplification The negative input of device, the positive outfan of the amplifier connect the left side port of the first threshold storage capacitance, described The right side port of first threshold storage capacitance connects external stability voltage end by the first switch device, the amplifier it is negative Connect the left side port of the Second Threshold storage capacitance to outfan, the right side port of the Second Threshold storage capacitance passes through The second switch device connects external stability voltage end, and the right side port of the first threshold storage capacitance connects the comparator Positive input, the right side port of the Second Threshold storage capacitance connects the negative input of the comparator.
3. self calibration current comparison circuit according to claim 2, it is characterised in that the first switch device and second is opened Close device and be respectively provided with control end.
4. self calibration current comparison circuit according to claim 2, it is characterised in that the control end of the first switch, The control end of the second switch and the sensor clock end are together connected to outer clock circuit.
5. self calibration current comparison circuit according to claim 1, it is characterised in that the current sensor adopts MOS Pipe conducting resistance sensor, the metal-oxide-semiconductor are the metal-oxide-semiconductor on outside tested current path.
6. self calibration current comparison circuit according to claim 2, it is characterised in that when sensor clock end is logic high When, differential threshold voltage, amplification described in the differential threshold voltage Jing are formed between the first sensing voltage and the second sensing voltage Device is stored in first threshold storage capacitance and Second Threshold storage capacitance after amplifying, and first switch device and second switch device are Conducting state, the outfan output result of the comparator are invalid.
7. self calibration current comparison circuit according to claim 2, it is characterised in that the differential threshold voltage is The value proportional to the product of metal-oxide-semiconductor conducting resistance in stabling current and the current sensor.
8. self calibration current comparison circuit according to claim 2, it is characterised in that the first threshold storage capacitance and Second Threshold storage capacitance storage be the amplifier offset voltage and the differential threshold voltage, the reality in relatively phase place The voltage and the differential threshold voltage that the product of the tested electric current in border and metal-oxide-semiconductor conducting resistance is obtained is compared, thus metal-oxide-semiconductor The effect of conducting resistance is eliminated, the offset voltage phase stored in electric capacity when the offset voltage of amplifier and calibration when comparing Subtract, thus the offset voltage of amplifier is also eliminated.
9. self calibration current comparison circuit according to claim 2, it is characterised in that when sensor clock end is logic low When, the differential voltage between the first sensing voltage and the second sensing voltage is proportional to the tested electric current of input, first switch device and Second switch device is cut-off state, and the outfan output result of the comparator is effective.
10. self calibration current comparison circuit according to claim 2, it is characterised in that what the current sensor was produced The offset voltage of differential threshold voltage and the amplifier is stored in threshold value electric capacity, and the comparator is in the ratio for subsequently carrying out In relatively, the offset compensation stored in threshold value electric capacity by the offset voltage of the amplifier, it is achieved thereby that the electric current is passed The threshold voltage stored in sensor output voltage and threshold value electric capacity is accurately compared.
CN201611215676.8A 2016-12-26 2016-12-26 Self calibration current comparison circuit Active CN106526295B (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111175676A (en) * 2020-01-23 2020-05-19 杭州士兰微电子股份有限公司 Low-voltage sensor system and method of eliminating offset
CN111610424A (en) * 2019-02-26 2020-09-01 圣邦微电子(北京)股份有限公司 Test circuit, test method and test device for operational amplifier
CN113687125A (en) * 2020-05-18 2021-11-23 广州汽车集团股份有限公司 Offset voltage correction method and system for operational amplifier in current detection circuit
CN114019415A (en) * 2022-01-06 2022-02-08 宜矽源半导体南京有限公司 Integrated short-circuit current detector with variable threshold, self-calibration and high precision

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111610424A (en) * 2019-02-26 2020-09-01 圣邦微电子(北京)股份有限公司 Test circuit, test method and test device for operational amplifier
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CN113687125A (en) * 2020-05-18 2021-11-23 广州汽车集团股份有限公司 Offset voltage correction method and system for operational amplifier in current detection circuit
CN114019415A (en) * 2022-01-06 2022-02-08 宜矽源半导体南京有限公司 Integrated short-circuit current detector with variable threshold, self-calibration and high precision

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