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CN106098913B - 一种提高白光led试配比测试效率的方法 - Google Patents

一种提高白光led试配比测试效率的方法 Download PDF

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CN106098913B
CN106098913B CN201610495801.9A CN201610495801A CN106098913B CN 106098913 B CN106098913 B CN 106098913B CN 201610495801 A CN201610495801 A CN 201610495801A CN 106098913 B CN106098913 B CN 106098913B
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led chip
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CN106098913A (zh
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冯云龙
荘世任
朱富斌
唐双文
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SHENZHEN RUNLITE TECHNOLOGY Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/85Packages
    • H10H20/852Encapsulations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/85Packages
    • H10H20/851Wavelength conversion means
    • H10H20/8511Wavelength conversion means characterised by their material, e.g. binder
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48257Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item

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  • General Physics & Mathematics (AREA)
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Abstract

本发明公开了一种提高白光LED试配比测试效率的方法,包括步骤:用胶水将LED芯片固定在支架顶端的碗杯中;在LED芯片与支架之间焊接导线,使LED芯片与支架电连接;将配置好的荧光胶涂覆在LED芯片上;用绝缘物将支架的正极引脚和负极引脚固定,并将所述正极引脚和负极引脚从支架中切下;对得到的LED半成品进行光色测试。在涂覆荧光胶后,通过绝缘物将支架的正极引脚和负极引脚固定,而后直接进行光色测试,测试荧光胶中荧光粉与胶水的配比是否合适,省去了后续的封胶工序,节省了时间和成本,提高了白光LED产品的生产效率。

Description

一种提高白光LED试配比测试效率的方法
技术领域
本发明涉及LED生产制造领域,尤其涉及一种提高白光LED试配比测试效率的方法。
背景技术
现有的插件白光LED产品,通常采用将黄色荧光粉涂覆在蓝光LED芯片上的方法制作而成,先将黄色荧光粉和硅胶混合在一起,通过点胶机点在LED芯片上,由于荧光粉颗粒的沉积作用,在点粉工艺过程中,硅胶和黄光荧光粉的比例会不断地发生变化,同样的点胶量点出的白光LED器件会产生较大的色差,严重影响产品的质量。因此,需在每次批量生产前,或者批量生产的过程中,对荧光粉和硅胶的比例进行测试,得到符合要求的比例(配比)之后,才能按这个比例进行批量生产。
在测试荧光粉和硅胶的比例(即,试配比测试)时,通常是取小部分物料进行生产,在走完全部的生产工艺流程后(固晶—>焊线-->点粉--->封胶----->切脚),即,生产出少部分LED成品之后,才进行光色测试,测试LED成品的各项参数是否符合规格要求,只有在测试合格后,才能采用此次使用的比例进行批量生产。这样一个试配比测试的过程,花费的时间很长、影响产线的生产效率,而且物料成本也较高。
因此,现有技术还有待于改进和发展。
发明内容
鉴于上述现有技术的不足,本发明的目的在于提供一种提高白光LED试配比测试效率的方法,可有效的提高白光LED产品的生产效率。
本发明的技术方案如下:
一种提高白光LED试配比测试效率的方法,所述方法包括如下步骤:
A、用胶水将LED芯片固定在支架顶端的碗杯中;
B、在LED芯片与支架之间焊接导线,使LED芯片与支架电连接;
C、将配置好的荧光胶涂覆在LED芯片上;
D、用绝缘物将支架的正极引脚和负极引脚固定,并将所述正极引脚和负极引脚从支架中切下;
E、对步骤D得到的LED半成品进行光色测试。
所述提高白光LED试配比测试效率的方法中,所述步骤A-E用于白光LED生产线上的首件测试。
所述提高白光LED试配比测试效率的方法中,所述步骤C之后,还包括步骤C1、固化所述荧光胶。
所述提高白光LED试配比测试效率的方法中,所述步骤E之后,还包括步骤:
F、步骤D得到的LED半成品检测合格后,开始批量生产,重复步骤A-C;
G、用外封硅胶将LED芯片和电极密封并固化后,完成LED芯片的封装。
所述提高白光LED试配比测试效率的方法中,所述绝缘物为起绝缘和固定作用的环氧树脂。
所述提高白光LED试配比测试效率的方法中,所述绝缘物为绝缘胶。
有益效果:本发明中提供一种提高白光LED试配比测试效率的方法,包括步骤:用胶水将LED芯片固定在支架顶端的碗杯中;在LED芯片与支架之间焊接导线,使LED芯片与支架电连接;将配置好的荧光胶涂覆在LED芯片上;用绝缘物将支架的正极引脚和负极引脚固定,并将所述正极引脚和负极引脚从支架中切下;对得到的LED半成品进行光色测试。在涂覆荧光胶后,通过绝缘物将支架的正极引脚和负极引脚固定,而后直接进行光色测试,测试荧光胶中荧光粉与胶水的配比是否合适,省去了后续的封胶工序,节省了时间和成本,提高了白光LED产品的生产效率。
附图说明
图1为本发明所述提高白光LED试配比测试效率的方法的方法流程图。
图2为本发明所述提高白光LED试配比测试效率的方法中,支架的结构图。
图3为本发明所述提高白光LED试配比测试效率的方法中,支架的碗杯的结构图。
图4为本发明所述提高白光LED试配比测试效率的方法中,LED半成品的结构图。
图5为本发明所述提高白光LED试配比测试效率的方法中,LED成品的结构图。
具体实施方式
本发明提供一种提高白光LED试配比测试效率的方法,为使本发明的目的、技术方案及效果更加清楚、明确,以下对本发明进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本发明,并不用于限定本发明。
请参见图1,图1为本发明所述提高白光LED试配比测试效率的方法的流程图。如图1所示,所述提高白光LED试配比测试效率的方法包括:
S10、固晶:用胶水将LED芯片20固定在支架10顶端的碗杯110中,如图2和图3所示。
S20、焊线:在LED芯片20与支架10之间焊接导线30,使LED芯片20与支架10电连接。优选的,所述导线30为金线。
S30、点粉:将配置好的荧光胶涂覆在LED芯片上。具体的,将荧光粉和硅胶(也可采用环氧胶)按预定比例进行配置并混合搅拌,得到荧光胶,将荧光胶注入支架的碗杯110中。在步骤S30之后,还包括步骤S31、烘烤:通过烘烤来固化所述荧光胶。
S40、用绝缘物40将支架10的正极引脚120和负极引脚130固定,并将所述正极引脚120和负极引脚130从支架10中切下,使正极引脚120和负极引脚130分离,不至于短路,得到的半成品如图4所示。通过绝缘物40固定了支架的正负极,使得图4所示的半成品可以直接进行光色测试,而无需对LED芯片进行封胶,节省了大量的时间和胶水,提高了生产效率,节省了生产成本。本实施例中,所述绝缘物40为起绝缘和固定作用的环氧树脂,采用滴胶的形式固定正负极,工序简单效果好,所述环氧树脂速烤10~15min即可烤干,花费时间很少。进一步的,所述环氧树脂为绝缘胶。当然,在其他实施例中,所述绝缘物40还可以是绝缘的非金属(非导电类)夹具,通过夹具夹持固定正负极,也可以实现本发明的效果。
S50、对步骤S40得到的LED半成品进行光色测试。具体的,由于在步骤S40中对支架10进行了切脚,得到图4所示的半成品,即,得到正极引脚120和负极引脚130分开的LED半成品。由于仅用作测试,无需进入产线的切脚工序,测试人员人工切脚即可,实际上也节省了切脚工序的时间,提高了生产效率。对LED半成品进行光色测试,测试LED半成品的各项光学参数(如亮度、波长或色坐标等)以及电学参数(顺向电压、开路、短路等测试项目),根据测试结果判断是否合格,若测试合格,则说明荧光粉和硅胶的预定比例符合要求,试配比测试完成。所述步骤S10-S50用于白光LED生产线上的首件测试和/或抽检测试,换而言之,经过上述步骤后,得到了符合要求的荧光粉与硅胶的预定比例,完成了首件测试,产线即可进行批量生产,这一过程较传统的过程节省了封胶工序,极大的提高了生产效率。
进一步的,所述步骤S50之后,还包括步骤:
S60、步骤S40得到的LED半成品检测合格后,开始批量生产,重复步骤S10-S30。
S70、封胶:用外封硅胶将LED芯片和电极密封并固化后,完成LED芯片的封装。所述步骤S70具体包括:
S710、粘胶:配置好胶水后,抽真空,对碗杯110粘胶。利用粘胶,将可能于灌胶时易产生的杯内气泡预先去除。
S720、喷离模剂:在用来生产LED的胶体形状的模条上喷离模剂。
S730、灌胶:将脱泡完成之后的树脂胶灌注入模条的模穴内。
S740、插支架:将支架插入所述模穴内,短烤预硬化。
S750、离模:长烤使树脂胶硬化,并离模。
S760、对支架进行切脚,得到最终的成品,如图5所示。
应当理解的是,本发明的应用不限于上述的举例,对本领域普通技术人员来说,可以根据上述说明加以改进或变换,所有这些改进和变换都应属于本发明所附权利要求的保护范围。

Claims (3)

1.一种提高白光LED试配比测试效率的方法,其特征在于,所述方法包括如下步骤:
A、用胶水将LED芯片固定在支架顶端的碗杯中;
B、在LED芯片与支架之间焊接导线,使LED芯片与支架电连接;
C、将配置好的荧光胶涂覆在LED芯片上;
D、用绝缘物将支架的正极引脚和负极引脚固定,并将所述正极引脚和负极引脚从支架中切下,采用滴胶的形式固定正负极;
E、对步骤D得到的LED半成品进行光色测试;
所述步骤A-E用于白光LED生产线上的首件测试;
所述步骤C之后,还包括步骤C1、固化所述荧光胶;
所述步骤E之后,还包括步骤:
F、步骤D得到的LED半成品检测合格后,开始批量生产,重复步骤A-C;
G、用外封硅胶将LED芯片和电极密封并固化后,完成LED芯片的封装;
所述LED半成品直接进行光色测试,省去了LED芯片的封胶工序,提高了生产效率。
2.根据权利要求1所述提高白光LED试配比测试效率的方法,其特征在于,所述绝缘物为起绝缘和固定作用的环氧树脂。
3.根据权利要求1所述提高白光LED试配比测试效率的方法,其特征在于,所述绝缘物为绝缘胶。
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CN103441206A (zh) * 2013-08-22 2013-12-11 中山市光圣半导体科技有限责任公司 一种提高白光led器件颜色一致性的方法

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