CN105791811B - A kind of three-dimensional test mark version and its design and forming method - Google Patents

Abstract

A three-dimensional test standard and its design and forming method, wherein the three-dimensional test standard includes a plurality of test standard layers arranged along the depth direction, each of the test standard layers has at least one test pattern, and any The test patterns of one test reticle layer and the test patterns of other test reticle layers are arranged along the depth direction without overlapping.

Description

A three-dimensional test standard plate and its design and forming method

technical field

The present invention relates to the field of optical system testing, in particular to a three-dimensional test standard plate and its method, wherein the test pattern provided by the three-dimensional test standard plate at different depths allows the camera device to be tested to move at least one step or even Without moving, images with different depth information can be obtained, so as to realize rapid testing and adjustment of the camera device.

Background technique

With the rapid development of technology, the high-tech industry represented by smart electronic equipment such as electronics and communication is rapidly rising, and occupies most of the high-end market of electronic equipment. In intelligent electronic equipment, the camera device, as an extended carrier of human visual organs, has become a core device and has been widely used, for example, in smart phones, personal digital assistants, tablet computers, notebook computers, PC terminals, Products such as vehicles, medical equipment, and monitoring equipment are all equipped with at least one camera device. The rapid development of these products has also created a booming camera device industry.

Further evolution of smart electronic devices and changes in consumer demand have also led to the development of camera devices towards miniaturization, miniaturization and high imaging quality. Quality imaging quality has become the direction of technical research.

The camera device itself is a very precise and complex device, which mainly includes a camera module part, an image sensor, and a motor for adjusting the positional relationship between the camera module part and the image sensor, such as a voice coil motor. In the manufacturing process of the camera device, the most important process is to install the camera module part and the image sensor in a matching manner relying on support elements such as mirror holders, so that there is a relatively stable relationship between the camera module part and the image sensor. location relationship. However, in the process of packaging the camera module part and the image sensor, due to the tilt of the image plane when the camera module part itself is imaged, there is a tilt tolerance between the components of the camera device, and due to the limitation of the accuracy of the packaging process, In the end, the light that records the image information received by the image sensor has a certain range of but not fixed inclination and offset with the image sensor itself, and finally causes the imaging quality of the entire optical system including the camera device to be seriously attenuated.

Therefore, before packaging the camera module part with the image sensor and other components, it is necessary to test and adjust the inclination between the image surface of the camera module part and the receiving surface of the image sensor. This process is mainly divided into two parts: testing and adjustment. process. The traditional methods of testing optical systems include front projection (the target uses transmission and reflection) and back projection (the target uses transmission). Change the relative position of the tested camera module part and the target board or image sensor, thereby obtaining the functional relationship between the imaging quality and the defocus curve, and then test the camera module part and the target board by calculating the focus position and tilt vector of each target position Or the relative inclination of the image sensor, and adjust according to the relative inclination. However, the existing devices for testing the optical system based on the above principles have great technical defects, so that the efficiency of testing and adjusting the camera device is seriously affected. Specifically, traditional equipment for testing camera devices needs to move parts step by step to describe the functional relationship between the complete imaging quality and the defocus curve, which takes a long time; in the process of testing the camera device, if The image plane of the camera module part has a large inclination angle. In order to collect a higher focus position of the target image, the camera module part needs to be moved for a greater distance. When the camera module part moves towards the image sensor, it may hit the traditional equipment The occurrence of mechanical parts or degumming, etc., leads to the failure of testing and correction; the traditional equipment is large in size and needs to occupy more space, so that the cost of testing the camera device is high.

Therefore, traditional equipment must not be widely used. Therefore, if it is possible to effectively test and adjust the camera device and greatly improve the image quality on the basis of reducing the volume and cost of traditional equipment, it becomes an urgent problem to be solved in the industry.

Contents of the invention

An object of the present invention is to provide a stereoscopic test standard plate and its method, wherein the test pattern provided by the stereoscopic test standard plate at different depths allows the camera device to be tested to move at least one step or even not to move. Images with different depth information are obtained to realize rapid testing and adjustment of the camera device.

An object of the present invention is to provide a stereoscopic test standard plate and its method, wherein when the stereoscopic test standard plate tests the imaging device, it only needs to move the imaging device at least once to obtain the The imaging quality of the device and the functional relationship of related data parameters, and then adjust the relative position and inclination of the camera module and image sensor of the camera device based on the functional relationship, thereby reducing the number of steps.

An object of the present invention is to provide a stereoscopic test standard plate and its method, wherein the stereoscopic test standard plate allows only one image to be taken, and can simultaneously analyze the focal length and image plane inclination of the imaging device, thereby, The corresponding data are obtained to support subsequent adjustments.

An object of the present invention is to provide a stereoscopic test standard and its method, wherein the stereoscopic test standard can provide different depth of scene, compared with the traditional test equipment, the stereoscopic test standard can make the test equipment The volume of the camera can be designed to be small enough, thereby saving the design margin due to the need to reserve the action space of the camera device, so as to reduce the volume of the test equipment as much as possible.

An object of the present invention is to provide a stereoscopic test standard plate and its method, wherein the stereoscopic test standard plate can meet the trend of miniaturization and miniaturization of the camera device, and at the same time solve the problem of adjusting the camera device The relative position of the image sensor and the image sensor causes it to touch the traditional process bottleneck problem caused by the bottom mechanism of the test equipment.

One object of the present invention is to provide a kind of three-dimensional test standard plate and its method, wherein said three-dimensional test standard plate can form at least one said test pattern on different planes and different positions on the same plane, thus, said imaging device can The test patterns at different depths of the three-dimensional test standard plate are collected in a static state, so as to analyze the resolution of the camera device subsequently.

An object of the present invention is to provide a stereoscopic test standard plate and its method, the stereoscopic test standard plate can be replaced according to different testing needs, and the specifications of the stereoscopic test standard plate can also be adjusted, thereby, convenient use.

An object of the present invention is to provide a three-dimensional test standard and its method, wherein the three-dimensional test standard includes any method that can realize depth information and ensure image contrast, such as transmission type, reflection type, projection type, and zoom type.

An object of the present invention is to provide a three-dimensional test standard plate and its method, wherein the test pattern of the three-dimensional test standard plate can include triangles, circles, ellipses, black and white line pairs, crosses or stars, etc. Any single or combined pattern can calculate the imaging quality of the imaging device, thereby facilitating the selection and preparation of the three-dimensional test standard plate.

An object of the present invention is to provide a three-dimensional test standard plate and its method. When the test pattern assists in the test of the camera device and analyzes its resolution, no more noise will be generated, thereby ensuring the accuracy of the test. the accuracy.

One object of the present invention is to provide a kind of three-dimensional test standard plate and its method, by combining the described three-dimensional test standard plate formed after the test patterns, more data reflecting the resolution of the imaging device can be obtained for subsequent use To ensure the smooth progress of the adjustment of the camera device.

An object of the present invention is to provide a stereoscopic test standard plate and its method. In the same field of view, when the test pattern of each layer is captured by the camera module of the camera device, the The image plane of the module will not interfere with each other, thus ensuring the reliability of the test results and the accuracy of the test.

An object of the present invention is to provide a three-dimensional test standard and its method. The three-dimensional test standard has a simple structure and low cost, and is suitable for large-scale production applications.

In order to achieve the above object, the present invention provides a three-dimensional test standard plate, the three-dimensional test standard plate includes a plurality of test standard plate layers arranged along the depth direction, each of the test standard plate layers has at least one test pattern, and any The test patterns of one test reticle layer and the test patterns of other test reticle layers are arranged along the depth direction without overlapping.

According to an example of the present invention, it is set that the back focus fitting accuracy parameter of an imaging device to be tested is a, the focal length parameter is EFL, the position parameter of setting the described three-dimensional test target plate is h, and the test target of any layer The position parameter of the plate layer is h _j , and the layer number parameter of the test target plate layer is j; wherein, the position of the three-dimensional test target plate satisfies the functional expression: a=-(EFL*(-h _j )/( EFL-h _j )-(EFL*(-h)/(EFL-h))).

According to an example of the present invention, the layer number parameter of the test standard plate layer is set as n, the tolerance parameter of the camera device is set as t, and the moving step parameter is s; wherein, the test standard plate layer The number of layers satisfies the function expression: n=f(t, a, s).

According to an example of the present invention, the layout parameter of setting described test pattern is d, any one described test pattern of any layer described test standard plate layer to the center distance of this layer described test standard plate layer is d _ij , setting the test field of view parameter of the camera device as F; wherein, the layout of the test pattern satisfies the functional expression: d _ij =f'(F, h _ij , EFL).

According to an example of the present invention, the size parameter of the test pattern is set as L, the size parameter of any one of the test patterns is L _ij , the parameter tolerance of the three-dimensional test standard plate is t′, and the medium refractive index parameter is n', the permissible speckle parameter of the software calculation is s', and the allowable range parameter of the test field of view of the camera device is set as △F; wherein, the size of the test pattern satisfies the functional expression: L _ij =f" (d _ij , ΔF, t', n', s').

According to an example of the present invention, the shape of the test pattern is selected from one or more combinations of square, triangle, circle, ellipse, cross, black and white line pairs, and star.

According to an example of the present invention, the three-dimensional test target plate has 2-100 layers of the test target plate, and each layer of the test target plate has 1-1000 test patterns. It should be understood by those skilled in the art that the specific numerical values of the number of layers and the number of test patterns here are only for example and not intended to limit the present invention.

According to an example of the present invention, the three-dimensional test standard plate is formed by one selected from a transmission type, a reflection type, a projection type, or a zoom imaging type.

According to an example of the present invention, the three-dimensional test standard plate further includes at least one carrying element, and the carrying elements are stacked and arranged at intervals; wherein, the carrying elements respectively form the test standard plate layer, and the test pattern selectively disposed or formed on the test target layer.

According to an example of the present invention, the carrying element is made of transparent material.

The present invention also provides a three-dimensional test standard plate, wherein the three-dimensional test standard plate has non-overlapping multi-layer test patterns arranged along the depth direction, and the test patterns on two adjacent layers are arranged at intervals from each other, thereby forming the Stereo test standard.

According to an example of the present invention, the three-dimensional test standard plate further includes at least one bearing element, and the bearing elements are superimposed and arranged at intervals; wherein, the bearing elements respectively form a test standard plate layer, and the test pattern is located at The test target layer.

According to an example of the present invention, the shape of the test pattern is selected from one or more combinations of square, triangle, circle, ellipse, cross, black and white line pairs, and star.

According to an example of the present invention, wherein the three-dimensional test target plate has 2-100 layers of the test target plate, and each layer of the test target plate has 1-1000 test patterns. It should be understood by those skilled in the art that the specific numerical values of the number of layers and the number of test patterns here are only for example and not intended to limit the present invention.

The present invention also provides a method for designing a three-dimensional test standard plate, characterized in that the method comprises the steps of:

(A) determine the position of the three-dimensional test standard plate by counting the parameters of the tested camera device; and

(B) Determining the number of layers of the three-dimensional test target plate layer and designing the layout of the test pattern of the test target plate layer according to the accuracy requirements of the camera device.

According to an example of the present invention, in the step (B), it further includes a step of: determining the size of the test pattern.

According to an example of the present invention, in described step (A), set the back focus fitting precision parameter of a camera device to be tested as a, the focal length parameter is EFL, the position parameter of setting described stereoscopic test standard plate is h, the position parameter of any layer of the test standard plate is h _j , the layer number parameter of the test standard plate layer is j; wherein, the position of the three-dimensional test standard plate satisfies the functional expression:

a=-(EFL*(-h _j )/(EFL-h _j )-(EFL*(-h)/(EFL-h))); wherein, according to the calculated value of h, the stereo The location of the test mark.

According to an example of the present invention, in the step (A), the layer number parameter of the test target plate layer is set as n, the tolerance parameter of the camera device is set as t, and the moving step parameter is s; Wherein, the number of layers of the test standard plate layer satisfies the functional expression: n=f(t, a, s); and the layout parameter of the test pattern is set as d, and the test standard plate layer of any layer The distance from any one of the test patterns to the center of the test plate layer of this layer is d _ij , and the test field of view parameter of the camera is set as F; wherein, the layout of the test pattern satisfies the functional expression: d _ij =f'(F, h _ij , EFL); wherein, according to the calculated values of n and d _ij , the number of layers of the test target plate layer and the layout of the test pattern are determined.

According to an example of the present invention, the size parameter of the test pattern is set as L, the size parameter of any one of the test patterns is L _ij , the parameter tolerance of the three-dimensional test standard plate is t′, and the medium refractive index parameter is n', the permissible speckle parameter of the software calculation is s', and the allowable range parameter of the test field of view of the camera device is set as △F; wherein, the size of the test pattern satisfies the functional expression: L _ij =f" (d _ij , ΔF, t', n', s'); wherein, the size of the test pattern is determined according to the calculated value of L _ij .

According to an example of the present invention, the shape of the test pattern is selected from one or more combinations of square, triangle, circle, ellipse, cross, black and white line pairs, and star.

The present invention also provides a method for forming a three-dimensional test standard plate, wherein the method includes the steps of:

(a) determining at least one predetermined area on a test target plate layer, and setting at least one test pattern in the predetermined area respectively; and

(b) a plurality of test standard layers are stacked, and the test pattern of the test standard layer is arranged in a dislocation manner with the test patterns of the other test standard layers, so as to form the three-dimensional test standard version.

According to an example of the present invention, in the step (b), the contrast between the test pattern and the test target layer is enhanced by irradiating light through the test target layer sequentially.

According to an example of the present invention, in the above method, a light source is arranged on the upper part of the three-dimensional test target plate, so that the light generated by the light source sequentially passes through the test target plate layer and radiates from top to bottom.

According to an example of the present invention, in the above method, at least one light source is arranged at the lower part of the three-dimensional test target plate, so that the light generated by the light source sequentially passes through the test target plate layer and radiates from bottom to top.

According to an example of the present invention, the light passing through the test target plate layer is uniform light.

The present invention provides a method for forming a three-dimensional test standard plate, wherein the method includes the steps of: arranging a projection source on a light radiation path of a light source, wherein when the light source generates light, the projection source can be It is assumed that non-overlapping multi-layer test patterns are formed along the depth direction in the space, and the test patterns on two adjacent layers are arranged at intervals to form the three-dimensional test standard plate.

According to an example of the present invention, the projection source is disposed between the light source and the predetermined space.

According to an example of the present invention, the projection source includes a plane standard plate and a zoom lens group, wherein the plane standard plate is arranged between the light source and the zoom lens group, so that the light generated by the light source , so that the information of the planar mark can be radiated to the preset space through the zoom lens group.

According to an example of the present invention, the planar standard plate further has at least one test target, wherein the test target is projected into the predetermined space through the zoom lens group to form the test pattern.

According to an example of the present invention, the shape of the test pattern is selected from one or more combinations of square, triangle, circle, ellipse, cross, black and white line pairs, and star.

Description of drawings

FIG. 1 is a schematic diagram of the relationship between a camera module and an image sensor of a camera device.

Fig. 2 is a schematic flowchart of the parameter determination process of the three-dimensional test standard plate according to the present invention.

Fig. 3 is a schematic layout diagram of a test pattern of any layer of the test standard layer according to the present invention.

4 to 6 are schematic diagrams of the first preferred embodiment of the three-dimensional test standard according to the present invention.

7 to 10 are respectively schematic diagrams of the second preferred embodiment of the stereoscopic test standard according to the present invention.

11 to 14 are schematic views of the third preferred embodiment of the three-dimensional test standard according to the present invention.

15 to 17 are schematic diagrams of the fourth preferred embodiment of the three-dimensional test standard according to the present invention.

Fig. 18 is a schematic flowchart of a design method of a three-dimensional test standard plate according to the present invention.

Fig. 19 is a schematic flow chart of the formation method of the three-dimensional test standard plate according to the present invention.

Detailed ways

The following description serves to disclose the present invention to enable those skilled in the art to carry out the present invention. The preferred embodiments described below are only examples, and those skilled in the art can devise other obvious variations. The basic principles of the present invention defined in the following description can be applied to other embodiments, variations, improvements, equivalents and other technical solutions without departing from the spirit and scope of the present invention.

In a preferred embodiment of the present invention, a camera module 11, an image sensor 12 and other necessary components form a camera device 10 through components such as a mirror base, and the camera module 11 and the image sensor 12 are During packaging, due to the image plane inclination of the camera module 11 when imaging, and the inclination tolerance between other components of the camera device 10 and the limitation of the accuracy of the packaging process, it is necessary to adjust the focal length of the camera device 10 and The image plane inclination of the camera module 11 and the image sensor 12 is tested to obtain corresponding data, and it is subsequently adjusted based on the data, thereby ensuring the camera device 10 after being packaged. Image quality. As shown in FIG. 1 , a situation of unadjusted mismatch between the camera module 11 and the image sensor 12 is shown. In this example, due to the mismatch between the camera module 11 and the image sensor 12 There is a slight inclination, so that the light of the object captured by the camera module 11 cannot be accurately received by the image sensor 12 , thus resulting in blurred imaging. Those skilled in the art should understand that the camera module 11 and the image sensor 12 also have other mismatches other than the example shown in FIG. 1 , for example, the image plane of the camera module 11 itself Tilt etc.

As shown in Fig. 3 to Fig. 16, the present invention aims to provide a stereoscopic test target plate to assist in testing the camera device 10, wherein the stereoscopic test target plate includes a plurality of The test target plate layer 20 has at least one test pattern 21 respectively, so that the test pattern 21 forms scene information of different depths. In the process of testing the camera device 10, the camera module 11 captures the light rays recorded with the information of the test pattern 21 at different depths, and is then received by the image sensor 12 for further photoelectric conversion, Thus, a signal carrying the relationship between the camera module 11 and the image sensor 12 is generated in the background and subsequently adjusted based on the signal.

It is worth mentioning that the relevant parameters of the stereoscopic test pattern need to be set based on the type of the imaging device 10, such as the number of layers of the test pattern layer 20 of the stereoscopic test pattern, the spacing, and The position of the three-dimensional test standard plate, the shape, size, position, density and so on of the test pattern 21 .

As shown in Figure 2, it is the design flow chart of the stereoscopic test standard plate, specifically, after the type of the imaging device 10 to be tested is determined, it is necessary to measure the relevant test parameters of the imaging device 10 , including parameters such as the test field of view, focal length, test distance, back focus fitting accuracy requirements of the imaging device 10 . In order to describe the relationship between the camera device 10 and the parameters of the three-dimensional test standard for convenience, the test field of view parameter of the camera device 10 is set as F, and the focal length parameter is EFL, and the back focus is simulated The fitting precision parameter is a, where the back focus fitting precision a is determined by the fitting requirement, and the fitting requirement depends on the requirement of software processing. Further set the test distance of the three-dimensional test standard plate as Z, wherein Z _j represents the test distance of the jth layer of the test standard plate layer 20, and the value range of j is j>=2, for example, Z ₁ represents The testing distance of the test standard plate layer 20 of the first layer, wherein the first layer refers to the test standard plate layer 20 that the stereo test standard plate is farthest away from the camera module ₁₁ , and Z1 is determined by the camera device The type of the camera device 10 is initially determined, that is, after the type of the camera device 10 to be tested is determined, the test distance of the first layer of the test target layer 20 is determined synchronously. Further, after the relevant parameters of the camera 10 are measured, based on the parameters, the position of the three-dimensional test standard and the number of layers of the test standard layer 20 can be calculated. Specifically, if the position parameter of the three-dimensional test standard plate is set as h, those skilled in the art should understand that the position parameter of any layer of the test standard plate layer 20 is h _j , for example, h _j represents The position of the test standard plate layer 20 in the jth layer, and the value range of j is j>=2; wherein, the functional expression of the position of the test standard plate satisfies: a=-(EFL*(-h _j )/(EFL-h _j )-(EFL*(-h)/(EFL-h))). Based on the above function expression, the position of the test reticle layer 20 of the three-dimensional test reticle can be determined by calculating the value of h.

Furthermore, set the number of layers parameter of the test standard layer 20 as n, and the tolerance parameter of the imaging device 10 as t, wherein the tolerance t of the imaging device 10 is determined by the manufacturing process, which includes but is not limited to the tested Tolerances such as the height, inclination, and offset of the imaging device 10; further setting the moving steps parameter of the imaging device 10 as s, it is worth mentioning that the measured moving steps of the imaging device 10 s>= 1, that is to say, in the process of testing the imaging device 10 by using the stereoscopic test standard plate, the corresponding parameter data can be obtained by moving the imaging device 10 at least once; wherein the test standard The functional expression of the layer number of the plate layer 20 satisfies: n=f(t, a, s). Based on the above function expression, the number of layers of the test target plate layer 20 can be determined by calculating the value of n.

Correspondingly, after determining the position of the three-dimensional test target plate and the layer number of the test target plate layer 20 , the shape, position and size of the test pattern 21 can be continuously determined. In some embodiments of the present invention, the shape of the test pattern 21 is not limited, and it can be selected from one or more of square, triangle, circle, ellipse, cross, black and white line pairs, and star graphics. combination of species. It is worth mentioning that the shape of the test pattern 21 can also be any other icon that can be used to calculate the imaging quality of the camera 10 , including physical icons and icons distinguished by color.

As an example, as shown in Figure 3, the layout parameter of the test pattern 21 of the three-dimensional test standard plate is set as d, wherein the layout parameter d of the test pattern 21 represents the density of the test pattern 21, therefore, The distance from any one of the test patterns 21 of any of the test standard layers 20 to the center of the test standard layer 20 of this layer is set as a parameter d _ij , wherein i represents that the test pattern 21 is located in the layer. The position on the test standard plate layer 20, j represents the number of layers of the test standard plate layer 20 in this layer, for example, d _ij represents the ith test pattern 21 of the test standard plate layer 20 in the jth layer Layout; wherein the functional expression of the layout of the test pattern 21 satisfies: d _ij =f'(F, h _ij , EFL), it is worth mentioning that the test field of view F is determined by the imaging device 10 to be tested , h _ij can be calculated and obtained through the functional expression of the position of the stereoscopic test plate. Based on the above functional expression, the layout of the test pattern 21 can be determined by calculating the value of _dij . That is to say, based on the above functional expression, the layout density of the test pattern 21 of the test reticle layer 20 can be determined. It is worth mentioning that, in some embodiments, all of the test reticle layer 20 The density of the test pattern 21 may be consistent or not.

Further, as shown in FIG. 3 , the size parameter of the test pattern 21 is set as L, correspondingly, the size parameter of any of the test patterns 21 is L _ij , wherein correspondingly L _ij represents the test pattern The distance from 21 to the central point of the test standard layer 20 in this layer is d _ij , for example, L _ij represents the size of the i-th test pattern 21 in the j-th layer of the test standard layer 20 . Further set the allowable range parameter of the test field of view span as △F, the production parameter tolerance of the three-dimensional test standard plate is t', the medium refractive index parameter of the three-dimensional test standard plate is n', and the software calculates the allowable diffuse spot The parameter is s', wherein the functional expression of the size of the test pattern 21 satisfies: L _ij =f"(d _ij , ΔF, t', n', s'). Based on the above functional expression, it can be calculated by The value of L _ij is used to determine the size of the test pattern 21.

It is worth mentioning that the process of calculating the size L _ij of the test pattern 21 is a process of balancing the parameters of the three-dimensional test standard plate and its manufacturing tolerances, and when the size L _ij of the test pattern 21 After the value is determined, the production tolerance of the three-dimensional test standard plate is simultaneously determined. It is also worth mentioning that, after the various parameters of the three-dimensional test template are determined, the three-dimensional test template shown can be made based on these parameters.

Correspondingly, as shown in FIG. 18, the present invention provides a method for designing a three-dimensional test standard plate, wherein the method includes the steps of:

(A) by counting the parameters of the camera device 10 under test, determine the position of the three-dimensional test standard plate; and

(B) According to the accuracy requirements of the camera device 10, determine the number of layers of the test target layer of the three-dimensional test target plate, and design the layout of the test pattern of the test target plate layer.

Specifically, in the step (A), after the type of the camera 10 to be tested is determined, it is first necessary to make statistics on the relevant parameters of the camera 10, including the Test field of view, focal length, back focus fitting accuracy and other parameters, those skilled in the art should understand that, according to different usage needs, other parameters of the camera 10 to be tested can also be further counted to obtain the The comprehensive parameter data of the camera device 10 is used to set up a better scheme of the stereoscopic test target plate.

Further, in the step (B), it further includes the step of: determining the size of the test pattern 21 .

Preferably, in the step (A), the back focus fitting accuracy parameter of the imaging device 10 to be tested is set as a, the focal length parameter is EFL, and the position parameter of the stereoscopic test target plate is set as h, The position parameter of any layer of the test standard plate layer 20 is h _j ; wherein, the position of the three-dimensional test standard plate satisfies the functional expression: a=-(EFL*(-h _j )/(EFL-h _j ) -(EFL*(-h)/(EFL-h))); Wherein, according to the calculated value of h, the position of the three-dimensional test target plate is determined.

Preferably, in the step (A), the number of layers parameter of the test standard layer 20 is set as n, the tolerance parameter of the imaging device 10 is set as t, and the number of moving steps is set as s; wherein, The number of layers of the test template layer 20 satisfies the functional expression: n=f(t, a, s); and the layout parameter of the test pattern 21 is set as d, and the test template layer 20 of any layer The distance from any one of the test patterns 21 to the center of the test plate layer 20 of this layer is d _ij , and the test field of view parameter of the imaging device 10 is set as F; wherein, the layout of the test pattern 21 satisfies Functional expression: d _ij =f'(F, h _ij , EFL); wherein, according to the calculated values of n and d _ij , the number of layers of the test template layer 20 and the number of layers of the test pattern 21 are determined layout.

Preferably, the size parameter of the test pattern 21 is set as L, the size parameter of any one of the test patterns 21 is L _ij , the parameter tolerance of the three-dimensional test standard plate is t', and the medium refractive index parameter is n' , the allowable speckle parameter for software calculation is s', and the allowable range parameter of the test field of view of the imaging device 100 is set as ΔF; wherein, the size of the test pattern 21 satisfies the functional expression: L _ij =f" (d _ij , ΔF, t′, n′, s′); wherein, the size of the test pattern 21 is determined according to the calculated value of L _ij .

Correspondingly, the test patterns 21 of any one layer of the test standard layer 20 and the test patterns 21 of the other layers of the test standard layer 20 are arranged in a non-overlapping manner along the depth direction, so that when the When the camera module 11 captures the test pattern 21 , the test pattern 21 close to the camera module 11 will not block the light transmitted by the test pattern 21 away from the camera module 11 . For example, in some specific embodiments of the present invention, the test pattern 21 of the test standard layer 20 is arranged in an inverted trapezoidal shape, that is, the closer the test pattern 21 is to the camera module 11 The distance from the center of the test standard layer 20 in this layer is smaller than the distance from the center of the test pattern 21 away from the camera module 11 to the center of the test standard layer 20 in this layer, and in this way, The test pattern 21 of the test target layer 20 can be captured by the camera module 11 to form an image with depth information.

That is to say, the three-dimensional test standard plate has multiple layers of the test patterns 21 arranged along the depth direction without overlapping, and the adjacent test patterns 21 are arranged at intervals from each other, thereby forming the three-dimensional test standard plate. That is to say, in some specific embodiments of the present invention, the test pattern layer 21 needs to be formed by a carrier carrying the test pattern 21; and in some other embodiments of the present invention, the test pattern 21 It can also be formed by projection.

Fig. 4, Fig. 5 and Fig. 6 are schematic diagrams of the three-dimensional test standard plate and its application process according to the first preferred embodiment of the present invention. The three-dimensional test standard plate includes the test standard plate layer 20 arranged along the depth direction, wherein the test standard plate layer 20 has at least one test pattern 21 respectively, and any one of the test standard plate layers 20 The test pattern 21 and the test pattern 21 of the other test target layer 20 are arranged along the depth direction without overlapping. Further, the test pattern 21 and the test target plate layer 20 have different physical characteristics, so that the test pattern 21 can be easily recognized and captured by the camera module 11, for example, the test pattern 21 and the test pattern 21 have different physical characteristics. The test reticle layer 20 may have different contrasts.

As preferably, described test standard plate layer 20 is formed by transparent material, like this, can reduce the medium refractive index of described test standard plate layer 20 as far as possible, thereby, the described test standard plate layer 20 of any layer All test patterns 21 can be identified and captured by the camera module 11 without distinction. That is to say, the test patterns 21 of any one layer of the test standard layer 20 can be captured by the camera module 11 through other test standard layers 20 without loss, so that the camera The device 10 is capable of obtaining an image of said stereoscopic test reticle with depth information.

As shown in Figure 4, the three-dimensional test standard plate adopts the principle of transmission to test the camera device 10, specifically, a light source 40 is arranged on the top of the three-dimensional test standard plate, that is to say, in When testing the imaging device 10, the stereoscopic test standard plate is located between the light source 40 and the camera module 10, so that the uniform light generated by the light source 40 can pass through the test standard plate sequentially. Layer 20, and then captured by the camera module 11. In this process, when the light source 40 passes through the test standard layer 20, the test pattern 21 of the test standard layer 20 and the layer of the test standard layer 20 can be increased in the same proportion. Therefore, the test pattern 21 can be recognized and captured by the camera module 11 more easily.

Figure 5 and Figure 6 are respectively the top view and the side view of the three-dimensional test standard plate, through these two views, those skilled in the art can easily understand the test pattern 21 of the test standard plate layer 20 Layout relationships such as position between.

Correspondingly, in the testing process in this way, the light source 40 is first allowed to generate uniform light, and these uniform light will pass through the test standard plate layer 20 in turn, and are used to enhance the test patterns 21 and The contrast between the test reticle layers 20. It is worth mentioning that when the light generated by the light source 40 passes through the test target plate layer 20, it plays the same role, that is, indiscriminately enhances the test target plate layer 20 and the test plate layer 20 of this layer. The contrast between the test patterns 21 of the standard layer 20. In this way, when the light is captured by the camera module 11 , the light carrying the information of the test pattern 21 can be accepted by the image sensor 12 for further photoelectric conversion.

Correspondingly, FIG. 7 to FIG. 10 are schematic diagrams of the three-dimensional test standard plate and its application process according to the second preferred embodiment of the present invention. The three-dimensional test standard plate includes the test standard plate layer 20A arranged along the depth direction, wherein the test pattern 21A of the test standard plate layer 20A is different from the test pattern 21A of the other test standard plate layer 20A They are arranged without overlapping along the depth direction. Further, the test pattern 21A has different physical characteristics from the test target plate layer 20A, so that the test pattern 21A can be easily recognized and captured by the camera module 11, for example, the test pattern 21A is different from the test pattern layer 20A. The test reticle layer 20A may have different contrasts.

Further, as shown in FIG. 7 , the three-dimensional test standard plate adopts the principle of reflection to test the camera device 10, specifically, at least one light source 40A is arranged at the lower part of the three-dimensional test standard plate, for example, In some specific embodiments of the present invention, the light source 40A can be provided at two or more locations, so that the light generated by the light source 40A can pass through the test standard plate layer 20A evenly. It can be understood that, when testing the camera device 10, the stereoscopic test target plate is located above the light source 40A and the camera module 11, and the light source 40A is arranged around the camera module 11. Those in the field should understand that the distance and positional relationship between the light source 40A and the camera module 11 can be adjusted based on different test requirements, which will not limit the content and scope of the present invention.

The light generated by the light source 40A can pass through the test target plate layer 20A uniformly and sequentially, so as to enhance the contrast between the test target plate layer 20A and the test pattern 21 of the test target plate layer 20A of this layer , so that the test pattern 21A can be more easily identified and captured by the camera module 11 .

Figure 8 and Figure 9 are respectively the top view and the side view of the three-dimensional test standard plate, through these two views, those skilled in the art can easily understand the test pattern 21A of the test standard plate layer 20A Layout relationships such as position between.

It is worth mentioning that the difference between this specific embodiment of the present invention shown in FIG. 7 and the embodiment of the present invention shown in FIG. 4 is that in the embodiment shown in FIG. 4 , the light source 40 produces The light rays are radiated from the upper part of the stereoscopic test standard plate to the lower part sequentially, and finally captured by the camera module 11; and in the embodiment shown in FIG. The lower part is sequentially irradiated to the upper part to enhance the contrast between the test target layer 20A and the test pattern 21A.

In some embodiments of the present invention, the test standard layer 20A can be made of solid material, and can also be formed in space by projection. For example, in the embodiment provided in FIG. 10, the three-dimensional test The standard plate may further include at least one bearing element 30A, the bearing elements 30A are superimposed and arranged at intervals, and the bearing elements 30A respectively form the test target plate layer 20A. It is worth mentioning that the distance between the bearing elements 30A determines the distance between the test standard plate layers 20A, and the material and thickness of the bearing elements 30A directly affect the medium refractive index of the three-dimensional test standard plate Therefore, when selecting the material and thickness of the bearing element 30A, it is necessary to consider the influence of the medium refractive index of the three-dimensional test standard on the three-dimensional test standard itself. What is more worth mentioning is that the carrying element 30A is made of a transparent material, so that when the three-dimensional test standard is used in a transmissive or reflective manner, all the test standard layer 20A All of the test patterns 21A can be identified and captured by the camera module 11 without distinction, thereby ensuring the accuracy of test results.

Further, the test patterns 21A may be arranged or formed on the bearing member 30A, so that the test patterns 21A that do not overlap in the depth direction are respectively arranged on the test target plate layer 20A. Specifically, in some embodiments, the test pattern 21A can be set on at least one preset area of the bearing element 30A, and the parameters such as the number, size and shape of the preset area are calculated according to the above-mentioned The functional expressions of the parameters of the test pattern 21A can be obtained by calculation, so that the characteristics of the test pattern 21A can be clearly distinguished from the characteristics of the bearing element 30A, so that the test pattern 21A can be described later. Camera module 11 identifies and captures.

In some other embodiments of the present invention, the preset position can be firstly determined on the bearing element 30A in the above-mentioned manner, and then the preset position of the bearing element 30A can be changed by means of physical or chemical treatment. The physical characteristics of the position, so that the physical characteristics of the predetermined area of the bearing element 30A are obviously different from those of other areas, so that the test pattern 21A is formed at the predetermined position. Certainly, those skilled in the art should understand that there may be other ways to form the test pattern 21A on the test standard layer 20A formed by the bearing element 30A.

Correspondingly, as shown in FIG. 19, the present invention also provides a method for forming a three-dimensional test standard plate, the method comprising the steps of:

(a) determining at least one predetermined area on a test target plate layer 20, and setting at least one test pattern 21 respectively in the predetermined area; and

(b) setting a plurality of said test standard plate layers 20 superimposedly, and making said test pattern 21 of said test standard plate layer 20 and said test patterns 21 of other test standard plate layers 20 arranged in a dislocation manner, to form the stereo test plate.

Preferably, in the step (b), the contrast between the test pattern 21 and the test target layer 20 is enhanced by irradiating light through the test target layer 20 in sequence.

Further, in the above method, a light source 50 is arranged on the upper part of the three-dimensional test standard plate, so that the light generated by the light source 50 sequentially passes through the test standard plate layer 20 and radiates from top to bottom.

Further, in the above method, at least one light source 50 is arranged at the lower part of the three-dimensional test standard, so that the light generated by the light source 50 sequentially passes through the test standard layer 20 and radiates from bottom to top. It is worth mentioning that the light passing through the test target plate layer 20 is uniform light. What is more worth mentioning is that the parameters such as the number, size and shape of the preset area can be obtained through calculation according to the above-mentioned function expression for calculating the parameters of the test pattern 21 .

As shown in Figures 11 to 14, the present invention adopts the principle of projection to form the three-dimensional test standard plate. Compared with the specific implementation of the present invention illustrated in Figure 4 and Figure 7, this specific embodiment of the present invention The embodiment is formed by projection, which uses air as the medium to form the test standard layer 20 and the test pattern 21 respectively, that is to say, in this embodiment, the three-dimensional test standard plate may not need all The bearing element 30 is used to bear the test pattern 21 .

As an example, as shown in FIG. 11 , the three-dimensional test standard plate includes a light source 40B and a projection source 50B, wherein the projection source 50B is set on the radiation path of the light source 40B, that is, the light source 40B The generated light is irradiated by the projection source 50B, so that an image with depth information can be generated in a preset space for subsequent testing of the camera device 10B.

Correspondingly, the present invention can also provide a method for forming a three-dimensional test standard plate, the method includes the step of: setting the projection source 50B on the path radiated by the light generated by the light source 40B, wherein when the light source 40B When light is generated, the projection source 50B can project in the predetermined space a multi-layer test pattern 21B arranged along the depth direction and not overlapping, and the test patterns 21B on two adjacent layers are arranged at intervals from each other, thereby forming The test standard. As shown in FIG. 12 , the light source 40B and the projection source 50B are respectively arranged on the sides of the preset space for forming the three-dimensional test standard plate, and the projection source 50B is located at the light source 40B and the preset space, so that the light radiated by the light source 40B can project the information of the projection source 50B into the preset space to form the three-dimensional with multiple layers of the test standard plate layer 20B Test standard.

In this embodiment, when the camera device 10 is tested by testing equipment, the test pattern 21B of the three-dimensional test standard plate is formed in the preset space, which uses air as a medium layer, therefore, Reduce the influence of the refractive index of the medium layer on the test results as much as possible, so as to ensure the test accuracy, and another beneficial result brought about by forming the three-dimensional test standard in a projection mode is the volume of the three-dimensional test standard can be further reduced.

Figure 13 and Figure 14 are the top view and the side view of the three-dimensional test standard plate formed by projection respectively, through these two views, those skilled in the art can easily understand the layout of the test pattern 21 such as the position relation.

As shown in Fig. 15, Fig. 16 and Fig. 17, the imaging device 10 is tested using the principle of zooming. In this embodiment of the present invention, the stereoscopic test standard plate includes a light source 40C and a projection source 50C , wherein the projection source 50C is set on the radiation path of the light source 40C, that is to say, the light generated by the light source 40C can be radiated through the projection source 50C, thus, in the preset space, it is possible to generate images for subsequent testing of the imaging device 10 .

As an example, as shown in FIG. 15 , the light source 40C and the projection source 50C are respectively arranged on the upper part of the preset space for forming the stereoscopic test standard, and the projection source 50C is located in the Between the light source 40C and the reserved space, so that the light radiated by the light source 40C can project the information of the projection source 50C into the reserved space to form the test plate layer 20C having multiple layers. The three-dimensional test standard plate.

Further, the projection source 50C also includes a plane standard plate 51C and a zoom lens group 52C, wherein the plane standard plate 51C is arranged between the light source 40C and the zoom lens group 52C, and the plane standard plate 51C can The standard plate 51C further has at least one test target 511C, so that the light radiated by the light source 40C can pass the test target 511C through the zoom lens group 52C to form the three-dimensional test target plate in the reserved space. It is worth mentioning that the parameters such as the size, position and quantity of the test target 511C can be set based on the different requirements of the three-dimensional test standard.

Figure 16 and Figure 17 are the top view and side view of the three-dimensional test standard formed by projection respectively, through these two views, those skilled in the art can easily understand the layout of the test pattern 21C such as the position relation.

It is worth mentioning that when the imaging device 10 is tested by the stereoscopic test standard plate, the imaging quality of the stereoscopic test standard plate can be tested by OTF (Optical Transfer Function, MTF). (Modulation Transfer Function, Modulation Transfer Function), SFR (Spatial Frequency Response, Spatial Frequency Response), or one or more of CTF (Contrast Transfer Function, Contrast Transfer Function), etc., can characterize the resolution of the imaging device 10 evaluation method. Of course, those skilled in the art should understand that in this process, the imaging quality of the camera 10 can also be evaluated and tested by other evaluation methods.

It should be understood by those skilled in the art that the embodiments of the present invention shown in the foregoing description and drawings are only examples and do not limit the present invention. The objects of the present invention have been fully and effectively accomplished. The functions and structural principles of the present invention have been shown and described in the embodiments, and the embodiments of the present invention may have any deformation or modification without departing from the principles.

Claims (26)

1. a kind of three-dimensional test standard plate, it is characterized in that, comprise a plurality of test standard plate layers arranged along depth direction, described test standard plate layer has at least one test pattern respectively, and any one described test standard plate layer The test pattern and the test pattern of the other test target layer are arranged along the depth direction without overlapping; Wherein it is set that the back focus fitting accuracy parameter of a camera device to be tested is a, and the focal length parameter is EFL, and the position parameter of setting the stereoscopic test standard plate is h, and the position parameter of the test standard plate layer described in any layer is h _j , the layer number parameter of the test target plate layer is j; wherein, the position of the three-dimensional test target plate satisfies the functional expression: a=-(EFL*(-h _j )/(EFL-h _j )- (EFL*(-h)/(EFL-h))). 2. The three-dimensional test standard plate as claimed in claim 1, wherein setting the number of layers parameter of the test standard plate layer is n, setting the tolerance parameter of the camera is t, and the number of moving steps parameter is s; wherein , the number of layers of the test standard layer satisfies the function expression: n=f(t, a, s). 3. three-dimensional test standard plate as claimed in claim 2, wherein the layout parameter of setting described test pattern is d, any described test pattern of any layer described test standard plate layer to this layer described test mark The center distance of the plate layer is d _ij , wherein further setting the position parameter of the test pattern on the test standard layer of the layer is i, the layer number parameter of the test standard layer of the layer is j, and the set The test field of view parameter of the camera device is F; wherein, the layout of the test pattern satisfies the functional expression: d _ij =f'(F, h _ij , EFL). 4. stereoscopic test standard plate as claimed in claim 3, wherein the size parameter of setting described test pattern is L, the size parameter of any one described test pattern is L _ij , the parameter tolerance of described stereoscopic test standard plate is t', the refractive index parameter of the medium is n', the permissible speckle parameter for software calculation is s', and the allowable range parameter of the test field of view of the camera device is set as ΔF; wherein, the size of the test pattern satisfies the function Expression: L _ij =f"(d _ij , ΔF, t', n', s'). 5. The three-dimensional test standard plate as claimed in any one of claims 1 to 4, wherein the shape of the test pattern is selected from one of square, triangle, circle, ellipse, crosshairs, black and white line pairs, and star one or a combination of several. 6. The three-dimensional test standard plate as claimed in any one of claims 1 to 4, wherein the three-dimensional test standard plate has 2-100 layers of the test standard plate layer, and each layer of the test standard plate layer has a thickness of 1-1000 layers. the test pattern. 7. The three-dimensional test standard according to any one of claims 1 to 4, wherein the three-dimensional test standard is formed in one of transmission, reflection, projection and zoom imaging. 8. The three-dimensional test standard plate as claimed in any one of claims 1 to 4, wherein the three-dimensional test standard plate further comprises at least one load-bearing element, and the load-bearing elements are overlapped and arranged at intervals; wherein the load-bearing element The test target plate layers are formed respectively, and the test patterns are selectively arranged or formed on the test target plate layers. 9. The stereoscopic test target of claim 8, wherein the carrier element is made of a transparent material. 10. A three-dimensional test standard plate, characterized in that, the three-dimensional test standard plate has multilayer test patterns arranged along the depth direction and non-overlapping, and the test patterns of adjacent two layers are arranged at intervals from each other, thereby forming the The three-dimensional test standard plate; wherein the three-dimensional test standard plate also includes at least one bearing element, the bearing elements are stacked and arranged at intervals; wherein the bearing elements respectively form a test standard plate layer, and the test pattern is located at the The test standard plate layer is described; wherein the back focus fitting accuracy parameter of an imaging device to be tested is set as a, the focal length parameter is EFL, the position parameter of the three-dimensional test standard plate is set as h, and the test mark of any layer The position parameter of the plate layer is h _j , and the layer number parameter of the test target plate layer is j; wherein, the position of the three-dimensional test target plate satisfies the functional expression: a=-(EFL*(-h _j )/( EFL-h _j )-(EFL*(-h)/(EFL-h))). 11. The three-dimensional test standard plate as claimed in claim 10, wherein the shape of the test pattern is selected from one or more of square, triangle, circle, ellipse, crosshairs, black and white line pairs, and star combination. 12. The three-dimensional test standard plate as claimed in claim 10, wherein the three-dimensional test standard plate has 2-100 layers of the test standard plate layer, and each layer of the test standard plate layer has 1-1000 described test patterns . 13. A design method for a three-dimensional test standard plate, characterized in that the method comprises the steps of: (A) determine the position of the three-dimensional test standard plate by counting the parameters of the tested camera device; and (B) according to the accuracy requirements of the imaging device, determine the number of layers of the test target layer of the three-dimensional test target plate and design the layout of the test pattern of the test target plate layer; wherein the three-dimensional test target plate includes A plurality of the test standard layers arranged along the depth direction, the test standard layers respectively have at least one of the test patterns, and the test patterns of any one of the test standard layers are different from the other test patterns. The test patterns of the standard plate layer are arranged without overlapping along the depth direction; Wherein in said step (B), further comprising the steps of: determining the size of said test pattern; Wherein in described step (A), setting the back focus fitting accuracy parameter of a camera device to be tested is a, and the focal length parameter is EFL, and the position parameter of setting described three-dimensional test target plate is h, and any layer The position parameter of the test standard plate layer is h _j , and the layer number parameter of the test standard plate layer is j; wherein, the position of the three-dimensional test standard plate satisfies the function expression: a=-(EFL*(-h _j )/(EFL-h _j )-(EFL*(-h)/(EFL-h))); Wherein, according to the calculated value of h, the position of the three-dimensional test target plate is determined. 14. The design method as claimed in claim 13, wherein in said step (A), setting the number of layers parameter of said test plate layer is n, setting the tolerance parameter of said camera is t, moving The number of steps parameter is s; wherein, the number of layers of the test standard layer satisfies the function expression: n=f(t, a, s); and The layout parameter of the test pattern is set as d, and the distance from any one of the test patterns of any layer of the test standard layer to the center of the test standard layer of this layer is d _ij , wherein the test pattern is further set The positional parameter of pattern on the described test standard plate layer of this layer is i, and the layer number parameter of the described test standard plate layer of this layer is j, and the test field of view parameter of setting described imaging device is F; Wherein, described The layout of the test pattern satisfies the function expression: d _ij =f'(F, h _ij , EFL); Wherein, according to the calculated values of n and d _ij , the number of layers of the test standard layer and the layout of the test pattern are determined. 15. design method as claimed in claim 14, wherein the size parameter of setting described test pattern is L, the size parameter of any one described test pattern is L _ij , the parameter tolerance of described three-dimensional test standard plate is t' , the refractive index parameter of the medium is n', the permissible speckle parameter for software calculation is s', and the permissible range parameter of the test field of view of the camera device is set as ΔF; wherein, the size of the test pattern satisfies the function expression : L _ij ＝f”(d _ij , △F, t', n', s'); Wherein, the size of the test pattern is determined according to the calculated value of L _ij . 16. The design method according to claim 15, wherein the shape of the test pattern is selected from one or a combination of squares, triangles, circles, ellipses, crosshairs, pairs of black and white lines, and stars. 17. A method for forming a three-dimensional test standard plate, characterized in that, the method comprises the steps of: (a) determining at least one predetermined area on a test target plate layer, and setting at least one test pattern in the predetermined area respectively; and (b) a plurality of said test standard layers are stacked, and the test pattern of said test standard layer is arranged in a dislocation manner with said test patterns of other said test standard layers, so as to form said A three-dimensional test standard plate, and the test patterns of any one of the test standard plate layers of the three-dimensional test standard plate do not overlap with the test patterns of other test standard plate layers along the depth direction; Wherein it is set that the back focus fitting accuracy parameter of a camera device to be tested is a, and the focal length parameter is EFL, and the position parameter of setting the stereoscopic test standard plate is h, and the position parameter of the test standard plate layer described in any layer is h _j , the layer number parameter of the test target plate layer is j; wherein, the position of the three-dimensional test target plate satisfies the functional expression: a=-(EFL*(-h _j )/(EFL-h _j )- (EFL*(-h)/(EFL-h))). 18. The method as claimed in claim 17, wherein in the step (b), the light is sequentially irradiated through the test target plate layer to enhance the relationship between the test pattern and the test target plate layer of the layer. contrast. 19. The method as claimed in claim 18, in said method, a light source is arranged on the top of said three-dimensional test standard plate, so that the light produced by said light source passes through said test standard plate layer from top to bottom radiation. 20. The method as claimed in claim 18, in said method, at least one light source is arranged on the bottom of said three-dimensional test standard plate, so that the light produced by said light source passes through said test standard plate layer from bottom to top radiation. 21. The method of any one of claims 18 to 20, wherein the light passing through the test target layer is uniform light. 22. A method for forming a three-dimensional test standard plate, characterized in that the method comprises the steps of: arranging a projection source on a light radiation path of a light source, wherein when the light source generates light, the projection source can be Non-overlapping multi-layer test patterns are formed along the depth direction in a predetermined space, and the test patterns on two adjacent layers are arranged at intervals to form the three-dimensional test standard plate; Wherein, the back focus fitting accuracy parameter of a camera device to be tested is set to be a, the focal length parameter is EFL, the position parameter of the three-dimensional test standard plate is set to be h, and the position parameter of any layer of the test pattern is h _j , the layer number parameter of the test standard plate layer is j; wherein, the position of the three-dimensional test standard plate satisfies the function expression: a=-(EFL*(-h _j )/(EFL-h _j )-(EFL *(-h)/(EFL-h))). 23. The forming method according to claim 22, wherein the projection source is disposed between the light source and the predetermined space. 24. The forming method as claimed in claim 22, wherein the projection source comprises a flat target plate and a zoom lens group, wherein the flat target plate is arranged between the light source and the zoom lens group, so that The light generated by the light source can radiate the information of the planar standard plate to the preset space through the zoom lens group. 25. The forming method according to claim 24, wherein the planar standard plate further has at least one test target, wherein the test target is projected to the preset space through the zoom lens group to form the test target pattern. 26. The forming method according to claim 22, wherein the shape of the test pattern is selected from one or a combination of squares, triangles, circles, ellipses, crosshairs, pairs of black and white lines, and stars.