CN105618882A - Packaging method for soldered joint - Google Patents
Packaging method for soldered joint Download PDFInfo
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- CN105618882A CN105618882A CN201610130316.1A CN201610130316A CN105618882A CN 105618882 A CN105618882 A CN 105618882A CN 201610130316 A CN201610130316 A CN 201610130316A CN 105618882 A CN105618882 A CN 105618882A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
- B23K1/206—Cleaning
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Abstract
本发明公开了一种钎焊接头的封装方法,用于解决现有封装方法钎焊接头强度差的技术问题。技术方案是在电子元器件铜板表面采用激光器加工出正四棱柱状微结构沟槽,对预制的微结构沟槽进行清洗,使用Sn-Ag-Cu钎料对铜板光滑表面和微结构沟槽表面分别进行润湿实验,测试其润湿角;观察Sn-Ag-Cu钎料在不同微结构下的填充及溶蚀情况;以Sn-Ag-Cu为钎料,在预制微结构沟槽的铜板上实施钎焊。由于铜板表面正四棱柱状微结构沟槽的存在,使Sn-Ag-Cu钎料在铜板表面的润湿角从背景技术的59.2°降低至26.3°,促进了钎焊接头的冶金结合,钎焊接头的强度从背景技术的72.4±3.8MPa提升至85±4.5MPa。
The invention discloses a packaging method of a brazing joint, which is used for solving the technical problem of poor strength of the brazing joint in the prior packaging method. The technical solution is to use a laser to process regular quadrangular prism-shaped microstructure grooves on the surface of the copper plate of electronic components, clean the prefabricated microstructure grooves, and use Sn-Ag-Cu solder to separate the smooth surface of the copper plate and the surface of the microstructure grooves. Carry out wetting experiments to test the wetting angle; observe the filling and dissolution of Sn-Ag-Cu solder under different microstructures; use Sn-Ag-Cu as the solder to implement on the copper plate with prefabricated microstructure grooves Brazing. Due to the existence of regular quadrangular columnar microstructure grooves on the surface of the copper plate, the wetting angle of the Sn-Ag-Cu solder on the surface of the copper plate is reduced from 59.2° in the background technology to 26.3°, which promotes the metallurgical bonding of the brazed joint, brazing The strength of the joint is increased from 72.4±3.8MPa in the background technology to 85±4.5MPa.
Description
技术领域technical field
本发明涉及一种封装方法,特别涉及一种钎焊接头的封装方法。The invention relates to a packaging method, in particular to a packaging method for brazed joints.
背景技术Background technique
随着科技的进步以及对铅元素危害性的重视,电子产品逐渐实行无铅化,因而对钎料等互连材料提出了新的要求,传统钎焊材料如Sn-Pb二元共晶合金,虽然具有可焊性好、性能优良、成本优良等特点,正在逐步被无铅钎料所取代。在所有已应用的无铅钎料中,由于Sn-Ag-Cu钎料具有优越的可靠性和与电子零部件良好的相容性,被认为是最有发展前景的无铅钎料合金体系之一。但是,Sn-Ag-Cu钎料的润湿铺展能力比Sn-Pb钎料差,且铺展的控制性较差,这使得精密的电子器件中易产生脱钎、漏钎、溢钎等缺陷。With the advancement of science and technology and the emphasis on the hazards of lead elements, electronic products are gradually becoming lead-free, so new requirements are put forward for interconnect materials such as solder. Traditional solder materials such as Sn-Pb binary eutectic alloys, Although it has the characteristics of good solderability, excellent performance, and excellent cost, it is gradually being replaced by lead-free solder. Among all the lead-free solders that have been applied, Sn-Ag-Cu solder is considered to be one of the most promising lead-free solder alloy systems due to its superior reliability and good compatibility with electronic components. one. However, the wetting and spreading ability of Sn-Ag-Cu solder is worse than that of Sn-Pb solder, and the controllability of spreading is poor, which makes it easy to produce defects such as de-soldering, missing soldering and overflowing soldering in precision electronic devices.
铜具有良好的热电导性、低的热膨胀系数、良好的钎焊性和耐蚀性、良好的成型性能、较低的成本等优势,所以电子元器件中大部分引脚接头和引线框架都采取铜制造。然而,Sn-Ag-Cu钎料在铜板表面的润湿角为59.2°,并且钎焊接头的强度为72.4±3.8MPa。为了解决Sn-Ag-Cu钎料在钎焊过程中润湿和铺展的问题,文献“D.QYu,JZhao,LWang.Improvementonthemicrostructurestability,mechanicalandwettingpropertiesofSn–Ag–Culead-freesolderwiththeadditionofrareearthelements[J].Journalofalloysandcompounds,2004,376(1):170-175.”公开了一种封装方法。该方法通过向Sn-Ag-Cu钎料中添加稀土元素,一定程度地解决了Sn-Ag-Cu钎料的润湿问题,但接头处产生金属间化合物,增加接头界面处的缺陷,对提高钎焊接头的精度及性能,减少接头尺度都具有较不利的影响。Copper has good thermal and electrical conductivity, low thermal expansion coefficient, good brazing and corrosion resistance, good formability, low cost and other advantages, so most of the pin joints and lead frames in electronic components are used Made of copper. However, the wetting angle of the Sn-Ag-Cu solder on the surface of the copper plate is 59.2°, and the strength of the brazed joint is 72.4±3.8MPa. In order to solve the problem of wetting and spreading of Sn-Ag-Cu solder in the brazing process, the literature "D.QYu, JZhao, LWang. Improvement on the microstructure stability, mechanical and wetting properties of Sn-Ag-Culead-free solder with the addition of rare earth elements [J]. 1): 170-175." discloses a packaging method. This method solves the wetting problem of Sn-Ag-Cu solder to a certain extent by adding rare earth elements to the Sn-Ag-Cu solder, but intermetallic compounds are generated at the joint, which increases the defects at the joint interface, which is harmful to the improvement The accuracy and performance of the brazed joint, reducing the size of the joint has a more adverse effect.
发明内容Contents of the invention
为了克服现有封装方法钎焊接头强度差的不足,本发明提供一种钎焊接头的封装方法。该方法在电子元器件铜板表面采用激光器加工出高度和宽度尺寸均为20±2μm的正四棱柱状微结构沟槽,对预制的微结构沟槽进行酸洗和超声清洗,使用Sn-Ag-Cu钎料对铜板光滑表面和微结构沟槽表面分别进行润湿实验,测试其润湿角;在光镜下观察Sn-Ag-Cu钎料在不同微结构下的填充情况以及微结构的溶蚀情况;以Sn-Ag-Cu为钎料,在预制微结构沟槽的铜板上实施钎焊。由于电子元器件铜板表面正四棱柱状微结构沟槽的存在,使Sn-Ag-Cu钎料在铜板表面的润湿角从背景技术的59.2o降低至26.3o,促进了钎焊接头的冶金结合,钎焊接头的强度从背景技术的72.4±3.8MPa提升至85±4.5MPa。In order to overcome the disadvantage of poor soldering joint strength in the existing packaging method, the invention provides a packaging method for the soldering joint. In this method, lasers are used to process square prism-shaped microstructure grooves with a height and width of 20±2 μm on the surface of copper plates of electronic components, and pickling and ultrasonic cleaning are performed on the prefabricated microstructure grooves, using Sn-Ag-Cu The wetting test of the solder on the smooth surface of the copper plate and the grooved surface of the microstructure was carried out to test the wetting angle; the filling situation of the Sn-Ag-Cu solder in different microstructures and the dissolution of the microstructure were observed under the light microscope ; Using Sn-Ag-Cu as solder, brazing is carried out on the copper plate with prefabricated microstructure grooves. Due to the existence of square prism-shaped microstructure grooves on the surface of the copper plate of electronic components, the wetting angle of the Sn-Ag-Cu solder on the surface of the copper plate is reduced from 59.2° in the background technology to 26.3°, which promotes the metallurgical bonding of the brazing joint , the strength of the brazed joint is increased from 72.4±3.8MPa in the background technology to 85±4.5MPa.
本发明解决其技术问题所采用的技术方案:一种钎焊接头的封装方法,其特点是包括以下步骤:The technical solution adopted by the present invention to solve the technical problem: a method for encapsulating a brazed joint, which is characterized in that it includes the following steps:
步骤一、用SiC砂纸将电子元器件铜板表面打磨并抛光,然后使用超声清洗并烘干,使用飞秒激光器在铜板表面加工形状为正四棱柱状的微结构,其宽度和高度均为20±2μm,四棱柱之间的沟槽宽度分别为10~40μm。Step 1. Use SiC sandpaper to grind and polish the surface of the copper plate of electronic components, then use ultrasonic cleaning and drying, and use a femtosecond laser to process a microstructure in the shape of a regular prism on the surface of the copper plate, with a width and height of 20±2μm , the groove widths between the quadrangular prisms are respectively 10-40 μm.
步骤二、将预制好正四棱柱状微结构的铜板放入浓度为30%的HNO3中超声清洗1~2min,以去除表面污物与油污,然后用清水清洗,再用无水乙醇吸水并吹干待用。Step 2. Put the prefabricated copper plate with regular quadrangular prism microstructure into 30% HNO 3 and ultrasonically clean it for 1 to 2 minutes to remove surface dirt and oil, then wash it with clean water, and then use absolute ethanol to absorb water and blow it. Dry and set aside.
步骤三、在O2C润湿角测量系统中,将直径为0.6mm的Sn-Ag-Cu钎料焊球,在无水乙醇中超声清洗10~12min去除表面杂质与油污,将经过处理的Sn-Ag-Cu钎料焊球放置在不同尺寸的微结构表面中心,启动视频记录系统后以40~50℃/min的加热速率快速升温至钎焊温度,保温5~6min后以40~50℃/min的降温速率快速降温,记录整个融化润湿过程的视频资料,选取润湿开始与结束时刻进行截图,量取润湿角。Step 3. In the O2C wetting angle measurement system, ultrasonically clean the Sn-Ag-Cu solder ball with a diameter of 0.6mm in absolute ethanol for 10-12min to remove surface impurities and oil stains, and the treated Sn-Ag-Cu Ag-Cu solder balls are placed in the center of the microstructure surface of different sizes. After starting the video recording system, the heating rate is rapidly raised to the brazing temperature at a heating rate of 40-50 °C/min. The cooling rate of min is used to quickly cool down, record the video data of the entire melting and wetting process, select the wetting start and end time to take screenshots, and measure the wetting angle.
步骤四、以Sn-Ag-Cu为钎料,在预制微结构的铜板上实施钎焊,钎焊在320~330℃保温5~7min。Step 4: Using Sn-Ag-Cu as solder, brazing is carried out on the copper plate with prefabricated microstructure, and brazing is carried out at 320-330° C. for 5-7 minutes.
本发明的有益效果是:该方法在电子元器件铜板表面采用激光器加工出高度和宽度尺寸均为20±2μm的正四棱柱状微结构沟槽,对预制的微结构沟槽进行酸洗和超声清洗,使用Sn-Ag-Cu钎料对铜板光滑表面和微结构沟槽表面分别进行润湿实验,测试其润湿角;在光镜下观察Sn-Ag-Cu钎料在不同微结构下的填充情况以及微结构的溶蚀情况;以Sn-Ag-Cu为钎料,在预制微结构沟槽的铜板上实施钎焊。由于电子元器件铜板表面正四棱柱状微结构沟槽的存在,使Sn-Ag-Cu钎料在铜板表面的润湿角从背景技术的59.2°降低至26.3°,促进了钎焊接头的冶金结合,钎焊接头的强度从背景技术的72.4±3.8MPa提升至85±4.5MPa。The beneficial effects of the present invention are: the method adopts a laser to process regular quadrangular columnar microstructure grooves with a height and width of 20±2 μm on the surface of the copper plate of electronic components, and pickling and ultrasonic cleaning the prefabricated microstructure grooves , using Sn-Ag-Cu solder to conduct wetting experiments on the smooth surface of the copper plate and the grooved surface of the microstructure, and test the wetting angle; observe the filling of Sn-Ag-Cu solder under different microstructures under a light microscope situation and the dissolution of the microstructure; using Sn-Ag-Cu as the solder, brazing is carried out on the copper plate with the prefabricated microstructure groove. Due to the existence of square prism microstructure grooves on the surface of the copper plate of electronic components, the wetting angle of the Sn-Ag-Cu solder on the surface of the copper plate is reduced from 59.2° in the background technology to 26.3°, which promotes the metallurgical bonding of the brazing joint , the strength of the brazed joint is increased from 72.4±3.8MPa in the background technology to 85±4.5MPa.
下面结合附图和具体实施方式对本发明作详细说明。The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
附图说明Description of drawings
图1是本发明钎焊接头的封装方法中采用飞秒激光器在铜板表面上加工的微结构不同沟槽宽度的光镜照片。图1(a)沟槽宽度10μm,图1(b)沟槽宽度20μm,图1(c)沟槽宽度30μm,图1(d)沟槽宽度40μm。Fig. 1 is an optical microscope photo of microstructures with different groove widths processed by a femtosecond laser on the surface of a copper plate in the packaging method of a brazed joint according to the present invention. Figure 1(a) groove width is 10 μm, Figure 1(b) groove width is 20 μm, Figure 1(c) groove width is 30 μm, Figure 1(d) groove width is 40 μm.
图2是本发明钎焊接头的封装方法中不同尺寸微结构的润湿角照片。图2(a)光滑表面,图2(b)沟槽宽度10μm,图2(c)沟槽宽度20μm,图2(d)沟槽宽度30μm,图2(e)沟槽宽度40μm。Fig. 2 is a photograph of the wetting angle of microstructures of different sizes in the packaging method of the soldered joint of the present invention. Figure 2(a) smooth surface, Figure 2(b) groove width 10 μm, Figure 2(c) groove width 20 μm, Figure 2(d) groove width 30 μm, Figure 2(e) groove width 40 μm.
图3是本发明钎焊接头的封装方法中润湿角与微结构沟槽宽度的变化曲线。Fig. 3 is a variation curve of the wetting angle and the microstructure groove width in the packaging method of the soldered joint of the present invention.
图4是本发明钎焊接头的封装方法中微结构表面溶蚀后的照片。图4(a)沟槽宽度10μm,图4(b)沟槽宽度20μm,图4(c)沟槽宽度30μm,图4(d)沟槽宽度40μm。Fig. 4 is a photo of the surface of the microstructure after dissolution in the encapsulation method of the soldered joint of the present invention. Figure 4(a) has a groove width of 10 μm, Figure 4(b) has a groove width of 20 μm, Figure 4(c) has a groove width of 30 μm, and Figure 4(d) has a groove width of 40 μm.
具体实施方式detailed description
参照图1-4。本发明钎焊接头的封装方法具体步骤如下:Refer to Figure 1-4. The specific steps of the packaging method of the brazed joint of the present invention are as follows:
步骤一、用SiC砂纸将电子元器件铜板表面打磨并抛光,然后使用超声清洗并烘干,并使用飞秒激光器(型号HSGQ-20W)在铜板表面加工形状为正四棱柱状的微结构,其宽度和高度均为20±2μm,四棱柱之间的沟槽宽度分别为10μm、20μm、30μm和40μm。Step 1. Use SiC sandpaper to grind and polish the surface of the copper plate of electronic components, then use ultrasonic cleaning and drying, and use a femtosecond laser (model HSGQ-20W) to process a microstructure in the shape of a regular square prism on the surface of the copper plate, the width of which is and the heights are both 20±2 μm, and the groove widths between the quadrangular prisms are 10 μm, 20 μm, 30 μm and 40 μm, respectively.
步骤二、表面微结构精密度极高,故不能对其进行打磨或抛光等操作。对预制表面微结构的润湿试样在浓度为30%的HNO3中超声清洗1~2min,以去除表面污物与油污,然后用清水清洗,再用无水乙醇吸水并吹干待用。Step 2: The precision of the surface microstructure is extremely high, so operations such as grinding or polishing cannot be performed on it. Wet samples with prefabricated surface microstructures were ultrasonically cleaned in 30% HNO 3 for 1 to 2 minutes to remove surface dirt and oil, then washed with water, then absorbed with absolute ethanol and dried for use.
步骤三、在光镜下观察微结构的加工情况并测定其尺寸,验证其满足实验精度要求。Step 3: Observing the processing condition of the microstructure under a light microscope and measuring its size to verify that it meets the experimental precision requirements.
步骤四、在O2C润湿角测量系统中,使用直径为0.6mm的Sn-Ag-Cu钎料焊球,实验前在无水乙醇中超声清洗10~12min去除表面杂质与油污,将钎料球放置在不同尺寸的微结构表面中心,启动视频记录系统后以40~50℃/min的加热速率快速升温至钎焊温度,保温5~6min后以40~50℃/min的降温速率快速降温至合适温度,记录整个融化润湿过程的视频资料,选取润湿开始与结束时刻进行截图,量取润湿角。Step 4. In the O2C wetting angle measurement system, use Sn-Ag-Cu solder balls with a diameter of 0.6 mm. Before the experiment, ultrasonically clean them in absolute ethanol for 10-12 minutes to remove surface impurities and oil stains. Placed in the center of microstructure surfaces of different sizes, start the video recording system and quickly heat up to the brazing temperature at a heating rate of 40-50°C/min, and then quickly cool down to the brazing temperature at a cooling rate of 40-50°C/min after holding for 5-6 minutes. At a suitable temperature, record the video data of the entire melting and wetting process, select the wetting start and end time to take screenshots, and measure the wetting angle.
步骤五、将润湿试样沿垂直于润湿界面且平行于沟槽方向切开,镶嵌成金相试样,在光镜下观察到微结构轻微溶蚀,钎料可以很好地填充界面微结构。Step 5. Cut the wetted sample along the direction perpendicular to the wetted interface and parallel to the groove, and inlay it into a metallographic sample. It is observed under the light microscope that the microstructure is slightly eroded, and the solder can well fill the microstructure of the interface. structure.
步骤六、分析试验结果,验证微结构对Sn-Ag-Cu钎料在母材表面润湿和铺展的影响,通过润湿实验,验证了微结构可以将Sn-Ag-Cu钎料在紫铜表面的润湿角从58.2o降低到26.3°,论证了微结构可以促进钎料在母材表面的润湿和铺展。Step 6. Analyze the test results to verify the influence of the microstructure on the wetting and spreading of the Sn-Ag-Cu solder on the surface of the base metal. Through the wetting experiment, it is verified that the microstructure can spread the Sn-Ag-Cu solder on the surface of the copper The wetting angle decreased from 58.2o to 26.3°, demonstrating that the microstructure can promote the wetting and spreading of the solder on the surface of the base metal.
步骤七、以Sn-Ag-Cu为钎料,在预制微结构的铜板上实施钎焊,钎焊实验在320~330℃保温5~7min,采用无铅技术应用参考标准中的“无铅钎料的焊点拉伸及剪切试验方法”对焊接接头强度进行测试,接头强度从72.4±3.8MPa提高到85±4.5MPa,接头强度提高了20%。Step 7. Using Sn-Ag-Cu as solder, perform brazing on the copper plate with prefabricated microstructure. The brazing experiment is kept at 320-330°C for 5-7 minutes, and the "lead-free brazing" in the reference standard of lead-free technology is used. "Solder joint tension and shear test method of material" to test the strength of the welded joint, the joint strength increased from 72.4±3.8MPa to 85±4.5MPa, and the joint strength increased by 20%.
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Cited By (3)
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CN108637481A (en) * | 2018-03-21 | 2018-10-12 | 重庆材料研究院有限公司 | Improve the Laser Surface Treatment method of soldered fitting performance |
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