CN105353222B - 基于一次性薄膜电极的多样化集成阻抗检测装置 - Google Patents
基于一次性薄膜电极的多样化集成阻抗检测装置 Download PDFInfo
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- CN105353222B CN105353222B CN201510624712.5A CN201510624712A CN105353222B CN 105353222 B CN105353222 B CN 105353222B CN 201510624712 A CN201510624712 A CN 201510624712A CN 105353222 B CN105353222 B CN 105353222B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/22—Measuring resistance of fluids
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CN201510624712.5A CN105353222B (zh) | 2015-09-25 | 2015-09-25 | 基于一次性薄膜电极的多样化集成阻抗检测装置 |
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CN201510624712.5A CN105353222B (zh) | 2015-09-25 | 2015-09-25 | 基于一次性薄膜电极的多样化集成阻抗检测装置 |
Publications (2)
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CN105353222A CN105353222A (zh) | 2016-02-24 |
CN105353222B true CN105353222B (zh) | 2018-07-17 |
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CN201510624712.5A Expired - Fee Related CN105353222B (zh) | 2015-09-25 | 2015-09-25 | 基于一次性薄膜电极的多样化集成阻抗检测装置 |
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Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN112198341A (zh) * | 2020-10-10 | 2021-01-08 | 珠海格力新元电子有限公司 | 薄膜金属镀层电阻测试触头及测试系统 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4831324A (en) * | 1986-03-20 | 1989-05-16 | Hitachi, Ltd. | Method and apparatus for analyzing the electrode inpedance |
DE10156203C1 (de) * | 2001-11-15 | 2003-04-03 | Hermann Scheck | Verfahren und Vorrichtung zur Prüfung der Leitfähigkeit einer Flüssigkeit auf Veränderung |
CN101799495A (zh) * | 2010-03-25 | 2010-08-11 | 上海交通大学 | 柔性薄膜微电极阵列的阻抗自动测试系统 |
CN101958390A (zh) * | 2010-08-13 | 2011-01-26 | 李刚 | 发光芯片封装结构 |
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2015
- 2015-09-25 CN CN201510624712.5A patent/CN105353222B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4831324A (en) * | 1986-03-20 | 1989-05-16 | Hitachi, Ltd. | Method and apparatus for analyzing the electrode inpedance |
DE10156203C1 (de) * | 2001-11-15 | 2003-04-03 | Hermann Scheck | Verfahren und Vorrichtung zur Prüfung der Leitfähigkeit einer Flüssigkeit auf Veränderung |
CN101799495A (zh) * | 2010-03-25 | 2010-08-11 | 上海交通大学 | 柔性薄膜微电极阵列的阻抗自动测试系统 |
CN101958390A (zh) * | 2010-08-13 | 2011-01-26 | 李刚 | 发光芯片封装结构 |
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Effective date of registration: 20220516 Address after: 210000 floor 5, export processing zone complex building, No. 6-3, Xingzhi Road, Nanjing Economic and Technological Development Zone, Jiangsu Province Patentee after: Nanjing Xingang Technology Industry Service Co.,Ltd. Address before: Room 101-1, Zijin Xingang (southwest) science and innovation base, No. 12, Xingke Road, Nanjing Economic and Technological Development Zone, Jiangsu 210038 Patentee before: NANJING JIANQIAO XINGANG TECHNOLOGY DEVELOPMENT Co.,Ltd. |
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