[go: up one dir, main page]

CN1052094C - serially accessed memory device - Google Patents

serially accessed memory device Download PDF

Info

Publication number
CN1052094C
CN1052094C CN94106176A CN94106176A CN1052094C CN 1052094 C CN1052094 C CN 1052094C CN 94106176 A CN94106176 A CN 94106176A CN 94106176 A CN94106176 A CN 94106176A CN 1052094 C CN1052094 C CN 1052094C
Authority
CN
China
Prior art keywords
signal
address
input end
clock pulse
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN94106176A
Other languages
Chinese (zh)
Other versions
CN1112717A (en
Inventor
林京元
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Winbond Electronics Corp
Original Assignee
Winbond Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Winbond Electronics Corp filed Critical Winbond Electronics Corp
Priority to CN94106176A priority Critical patent/CN1052094C/en
Publication of CN1112717A publication Critical patent/CN1112717A/en
Application granted granted Critical
Publication of CN1052094C publication Critical patent/CN1052094C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Static Random-Access Memory (AREA)
  • Dram (AREA)

Abstract

本发明提供的串行存取的存储器装置,具有一第一数据端及一存储单元阵列,该存储单元阵列具有多数个地址。串行存取存储装置包括一移位寄存器、一地址解码电路。响应一地址时钟脉冲信号,移位寄存器将一存贮器串行存取操作的第一个地址值予以贮存。地址解码电路、响应一存取控制信号、第一个地址值、地址时钟脉冲信号及一时钟脉冲信号,以串行方式存取所述多数个地址内的值。

The serial access memory device provided by the present invention has a first data terminal and a memory cell array, and the memory cell array has a plurality of addresses. The serial access memory device includes a shift register and an address decoding circuit. In response to an address clock pulse signal, the shift register stores the first address value of a memory serial access operation. The address decoding circuit, in response to an access control signal, the first address value, the address clock pulse signal and a clock pulse signal, accesses the values in the plurality of addresses in a serial manner.

Description

串行存取的存贮器装置serially accessed memory device

本发明涉及一种存贮器装置,尤指一种串行存取的集成电路存储器装置。The invention relates to a memory device, especially a serial access integrated circuit memory device.

为了满足最近多媒体电脑系统的需求,集成电路存贮装置近来已被用于贮存大量数据,例如语音或影像数据。语音或影像数据具有数据连续的特性,换言之,这类数据,大多数情形下,是以时序方式(sequentially)或串行(serially)方式存取的。In order to meet the demands of recent multimedia computer systems, integrated circuit storage devices have recently been used to store large amounts of data, such as audio or video data. Voice or video data has the characteristic of data continuity. In other words, this type of data is accessed sequentially or serially in most cases.

传统的有关技术,有两种方式处理数字式语音贮存。第一种方式采用芯片将语音控制器与语音存贮器整合在一集成电路内。这种方式的设计缺乏系统兼容性。比如说,12英寸语音录放系统所需的最少存储器容量与6英寸所需的并不相同。在这种情况下,虽然芯片内的控制器部分仍能满足使用者的需求,却因存储器本身容量不足,而必须更换整个芯片。There are two ways to deal with digital voice storage in traditional related technologies. The first way uses a chip to integrate the voice controller and voice memory into an integrated circuit. This design lacks system compatibility. For example, the minimum memory capacity required for a 12-inch voice recording and playback system is not the same as that required for a 6-inch system. In this case, although the controller part in the chip can still meet the needs of users, the entire chip must be replaced due to insufficient capacity of the memory itself.

第二种方式采用两个芯片的方案,如图1所示。第一芯片13负责语音控制功能,而第二芯片11负责语音贮存功能。这种方式显然比第一种方式有兼容性。但这一方式仍有许多缺点。第一个缺点是需要太多的输出/入脚(pins)。以256K的静态存贮器(SRAM)为例,所须的接口脚至少包括A0~A14地址线,D0~D7数据线,存储器读(RD)及写(WR)控制线,芯片选择(CS)线,Vdd及Vss线。第二个缺点是存储器扩展的可行性。当需要从256K扩展至1M时,芯片11需要增加两条地址线A15及A16。第三个缺点是第一芯片13的输入/入脚的需求。因存储器芯片11被存取时控制器13须知道何时到达该存贮器的终点,因而控制器13需要至少一条选择信号线M1、M2,根据M1、M2的输入值控制器13知道此时所采用存储器11的容量。The second method adopts a solution of two chips, as shown in FIG. 1 . The first chip 13 is in charge of the voice control function, while the second chip 11 is in charge of the voice storage function. This method is obviously more compatible than the first method. But this approach still has many disadvantages. The first disadvantage is that too many output/input pins are required. Taking 256K static memory (SRAM) as an example, the required interface pins include at least A0~A14 address lines, D0~D7 data lines, memory read (RD) and write (WR) control lines, chip select (CS) line, Vdd and Vss lines. A second disadvantage is the possibility of memory expansion. When expanding from 256K to 1M, the chip 11 needs to add two address lines A15 and A16. A third disadvantage is the I/O pin requirement of the first chip 13 . When the memory chip 11 is accessed, the controller 13 must know when the end point of the memory is reached, so the controller 13 needs at least one selection signal line M1, M2. According to the input value of M1, M2, the controller 13 knows The capacity of the memory 11 used.

为了克服上述现有技术的缺点,本发明的第一个目的是提供一串行存取存贮器,其所须的输出/入脚比现有技术的管脚数少。In order to overcome the above-mentioned disadvantages of the prior art, it is a first object of the present invention to provide a serial access memory which requires fewer I/O pins than the prior art.

本发明的第二个目的,是提供一串行存取存贮器,其只须一数据线、一地址时钟脉冲线、一时钟脉冲线以及一存取控制线便可进行串行式存取。The second object of the present invention is to provide a serial access memory, which only needs one data line, one address clock pulse line, one clock pulse line and one access control line to perform serial access .

本发明的第三个目的,是提供一串行存取存贮器,其输出/入脚的数目是与其存储器容量无关。A third object of the present invention is to provide a serial access memory whose number of I/O pins is independent of its memory capacity.

本发明的第四个目的,是提供一串行存取存贮器,对此存贮器进行串行式存取时,只须由控制器取得存贮器存取的第一个地址值。The fourth object of the present invention is to provide a serial access memory. When performing serial access to this memory, only the first address value of the memory access needs to be obtained by the controller.

为达到本发明的目的,本发明中的串行式存取存贮器装置,具有一第一数据端及一存贮单元阵列,该存贮单元阵列具有多数个地址,此存贮装置包含:To achieve the purpose of the present invention, the serial access memory device among the present invention has a first data terminal and a memory cell array, the memory cell array has a plurality of addresses, and the memory device includes:

一移位寄存器,其响应一地址时钟脉冲信号,将存贮器装置一串行存取动作的第一个地址值贮存,此移位寄存器具一第一输入端与所述第一数据端连结;A shift register, which responds to an address clock pulse signal, stores the first address value of a serial access operation of the memory device, and the shift register has a first input terminal connected to the first data terminal ;

一地址解码电路,其响应一存取控制信号、所述第一地址值、所述地址时钟脉冲信号及一时钟脉冲信号,对所述存贮单元阵列内的多数个地址进行串行存取动作。An address decoding circuit, which responds to an access control signal, the first address value, the address clock signal and a clock signal, and performs serial access operations on a plurality of addresses in the storage cell array .

图示的摘要说明:Graphical summary description:

图1是现有技术的语音录放系统的示意图。FIG. 1 is a schematic diagram of a voice recording and playback system in the prior art.

图2是本发明中的一语音录放系统的示意图。Fig. 2 is a schematic diagram of a voice recording and playback system in the present invention.

图3是本发明中存贮器存取时第一个地址值的移位时序图。Fig. 3 is a shift sequence diagram of the first address value during memory access in the present invention.

图4是本发明中串行存取存贮器的详细功能方框图。Fig. 4 is a detailed functional block diagram of the serial access memory in the present invention.

图5是本发明进行存贮器写入的相关信号时序图。FIG. 5 is a timing diagram of related signals for memory writing in the present invention.

图6是图4中边缘检测器的详细电图图。FIG. 6 is a detailed electrical diagram of the edge detector in FIG. 4. FIG.

图7是写入信号及读出信号的产生电路图。FIG. 7 is a circuit diagram for generating a write signal and a read signal.

图8是本发明的第二实施例的详细功能方块图。FIG. 8 is a detailed functional block diagram of the second embodiment of the present invention.

图9是图8中置“0”电路的详细电路图。FIG. 9 is a detailed circuit diagram of the “0” setting circuit in FIG. 8 .

图10是图9中信号的时序图。FIG. 10 is a timing diagram of the signals in FIG. 9 .

图11是同时具有置“0”功能以及边缘检测功能的另一电路图。Fig. 11 is another circuit diagram having both the function of setting "0" and the function of edge detection.

如图2所示,本发明的串行存取存贮装置21是与一语录放控制器23连结。其间的接口包含一时钟脉冲线(CLK)230、一地址时钟脉冲(ADD CLK)210、一双向数据线(DATA)220、一存贮器读写(WR/RD)线240、一芯片选择(CS)线250以及存贮器终点(EOM)线260。存贮器读/写线240是用于存贮器存取控制。As shown in FIG. 2 , the serial access storage device 21 of the present invention is connected with a voice recording and playback controller 23 . The interface therebetween comprises a clock pulse line (CLK) 230, an address clock pulse (ADD CLK) 210, a bidirectional data line (DATA) 220, a memory read/write (WR/RD) line 240, a chip select ( CS) line 250 and end of memory (EOM) line 260. Memory read/write lines 240 are used for memory access control.

存储器装置21具有多数个地址,其内的值可经由数据线220被串行存取。存储器装置21的数据输入端(DATA)在一第一时段以串行方式将存贮器装置的一串行存取动作的第一个地址值输入,并在一剩余时段以串行方式使一数据移位。存贮器存取时第一个地址值在数据线220上移位的时序如图3所示。The memory device 21 has a plurality of addresses, and the values therein can be accessed serially via the data line 220 . The data input terminal (DATA) of the memory device 21 inputs the first address value of a serial access operation of the memory device in a first period in a serial manner, and makes an address value in a serial manner in a remaining period of time. Data shift. The time sequence of shifting the first address value on the data line 220 during memory access is shown in FIG. 3 .

如图4所示,存贮器装置21具有一移位寄存器42,其响应一地址时钟脉冲信号210,将存储器装置一串行存取动作的第一个地址值贮存。此移位寄存器具一第一输入端与第一数据端(DATA)连结。存贮器装置21具有一地址解码电路44,其响应读出(READ)信号242、写入(WRITE)信号241、第一地址值信号421及地址时钟脉冲信号210,对存贮器单元阵列46内的多数个地址进行串行存取动作。读信号242、写信号241两者与时钟脉冲信号230及存贮器读/写控制信号240有关,其详细关系在后面有详细描述,如图7所示。As shown in FIG. 4 , the memory device 21 has a shift register 42 which responds to an address clock pulse signal 210 to store the first address value of a serial access operation of the memory device. The shift register has a first input end connected with a first data end (DATA). Memory device 21 has an address decoding circuit 44, which responds to read (READ) signal 242, write (WRITE) signal 241, first address value signal 421 and address clock pulse signal 210, to memory cell array 46 Several addresses in the serial access operation. Both the read signal 242 and the write signal 241 are related to the clock pulse signal 230 and the memory read/write control signal 240 , and the detailed relationship will be described in detail later, as shown in FIG. 7 .

移位寄存器42具有N个数据寄存器420,它们互相串接构成此移位寄存器42。N个数据寄存器中的每一个具有一数据输出端(Q)、一时钟脉冲输入端(CLK)及一数据输入端(D),第一个数据寄存器的数据输入端为移位寄存器42的第一输入端并与数据输入端(DATA)连结。每一数据寄存器420的时钟脉冲端输入地址时钟脉冲信号210。The shift register 42 has N data registers 420 which are connected in series to form the shift register 42 . Each of the N data registers has a data output terminal (Q), a clock pulse input terminal (CLK) and a data input terminal (D), and the data input terminal of the first data register is the first data input terminal of the shift register 42 An input terminal is connected with the data input terminal (DATA). The address clock pulse signal 210 is input to the clock pulse terminal of each data register 420 .

地址解码电路44具有一地址锁存/计数器442,它具有N个输入端,每一输入端与一对应数据寄存器420的数据输出端(Q)连结,以便响应一装入(Load)信号448,将第一地址值锁存,并响应一增量(increment)信号446将存取地址值逐次增加。地址解码电路44具有一EOM端,它在此存储单元阵列46的最后一个地址被存取时,输出一存贮器终点(End of Memory)信号260。Address decoding circuit 44 has an address latch/counter 442, and it has N input ends, and each input end is connected with the data output end (Q) of a corresponding data register 420, so that respond to a loading (Load) signal 448, The first address value is latched, and the access address value is increased step by step in response to an increment signal 446 . The address decoding circuit 44 has an EOM terminal, and when the last address of the memory cell array 46 is accessed, it outputs a memory end (End of Memory) signal 260.

地址解码电路44进一步包含一边缘检测器444,其响应存取控制信号240、时钟脉冲信号230以及地址时钟脉冲信号210,以便产生装入信号448及增量信号446。The address decoding circuit 44 further includes an edge detector 444 responsive to the access control signal 240 , the clock signal 230 and the address clock signal 210 to generate a load signal 448 and an increment signal 446 .

串行式存取存贮器装置21具有一数据缓冲器48分别与数据输入端(DATA)及存贮单元阵列46连结,并响应存取控制信号240及时钟脉冲信号230,以串行方式使所述数据移位。The serial access memory device 21 has a data buffer 48 which is connected with the data input terminal (DATA) and the memory cell array 46 respectively, and responds to the access control signal 240 and the clock pulse signal 230, and is used in a serial manner. The data is shifted.

本发明将存储器写入动作时的信号时序示于图5,由其中可知当最后一存储地址内的值被存取时,存贮器终点(End of Memory)信号260动作(asserted)。图5的信号中,当存取控制信号240在控制器23作用下变为高电平时,为存储器写入动作,而存取信号240在控制器23作用下变为低电平时,存储器读出动作。The present invention shows the signal sequence when writing the memory into Figure 5, from which it can be seen that when the value in the last memory address is accessed, the memory end (End of Memory) signal 260 is activated (asserted). In the signal of FIG. 5, when the access control signal 240 becomes high level under the action of the controller 23, it is a memory write operation, and when the access signal 240 becomes low level under the action of the controller 23, the memory read action.

在图6中,示出了边缘检测器444的一实施例。它具有一与非门60、一第一或非门62、一第二或非门64、一非门66、一延迟电路67及一与门68。与非门60有两个输入端分输入一读信号242及一写信号241,并有一个输出端产生增量信号446。第一或非门62,具有一第一输入端、一第二输入端及一第一输出端。第一输入端输入增量信号446。第二或非门64具有一第三输入端、一第四输入端及一第二输出端。第三输入端输入地址时钟脉冲信号210,第四输入端与第一或非门62的第一输出端连结,而第二输出端与第一或非门62的第二输入端连结并产生一第二输出信号641。非门66,具有一第五输入端及一第三输出端,第五输入端与第二或非门64的第二输出端连结,而第三输出端产生一第三输出信号661。与门68,响应第二输出信号641及第三输出信号661,产生装入信号448。In FIG. 6, an embodiment of the edge detector 444 is shown. It has a NAND gate 60 , a first NOR gate 62 , a second NOR gate 64 , a NOT gate 66 , a delay circuit 67 and an AND gate 68 . The NAND gate 60 has two input terminals for inputting a read signal 242 and a write signal 241 , and has an output terminal for generating an incremental signal 446 . The first NOR gate 62 has a first input terminal, a second input terminal and a first output terminal. The first input terminal inputs an incremental signal 446 . The second NOR gate 64 has a third input terminal, a fourth input terminal and a second output terminal. The third input terminal inputs the address clock pulse signal 210, the fourth input terminal is connected with the first output terminal of the first NOR gate 62, and the second output terminal is connected with the second input terminal of the first NOR gate 62 and generates a The second output signal 641 . The NOT gate 66 has a fifth input terminal and a third output terminal, the fifth input terminal is connected to the second output terminal of the second NOR gate 64 , and the third output terminal generates a third output signal 661 . The AND gate 68 generates a load signal 448 in response to the second output signal 641 and the third output signal 661 .

由图7可知,写入信号241是由时钟脉冲信号230及存贮器存取控制信号240作与非(NAND)操作所产生。而读出信号242是由时钟脉冲信号230及存贮器存取控制信号240的非值作与非操作而产生。It can be seen from FIG. 7 that the write signal 241 is generated by the NAND operation of the clock signal 230 and the memory access control signal 240 . The read signal 242 is generated by the NAND operation of the clock pulse signal 230 and the memory access control signal 240 .

由上述发明第一实施例的说明可知,本案有下列优点:As can be seen from the description of the first embodiment of the above-mentioned invention, this case has the following advantages:

第一,一根数据(DATA)线220及一根地址时钟脉冲线210足够用来对存储单元阵列46进行串行式存取,且速度不会太慢。First, one data (DATA) line 220 and one address clock pulse line 210 are sufficient for serial access to the memory cell array 46, and the speed is not too slow.

第二,控制器23及存贮装置21间的接口信号线全部不须更改,不管存贮装置21的容量大小,如256K或1M等等。Second, all the interface signal lines between the controller 23 and the storage device 21 do not need to be changed, regardless of the capacity of the storage device 21, such as 256K or 1M or the like.

第三,在存贮装置21内的地址锁存/计数器442会在存储器全部存入数据时输出一信号260至控制器23。因而就不须选择信号M1、M2告之所使用存储器的容量。Thirdly, the address latch/counter 442 in the storage device 21 outputs a signal 260 to the controller 23 when all data is stored in the memory. Therefore, there is no need for selection signals M1, M2 to inform the capacity of the memory used.

第四,不同形式或容量的存储装置21都可与相同的控制器23配合,且不须对存储器21本身或控制器23作任何修正。Fourth, storage devices 21 of different forms or capacities can cooperate with the same controller 23 without any modification to the storage device 21 itself or the controller 23 .

本发明第一实施例的存储器装置21不能处理可变字长地址是其唯一的缺点。The inability of the memory device 21 of the first embodiment of the present invention to handle variable word length addresses is its only disadvantage.

因为存储器装置21一旦制造完成后,其内数据寄存器420的数目就已固定。例如对1M的静态存取存储器(SRAM)而言,有20个数据寄存器420。地址时钟脉冲信号210必须有20个时钟脉冲才能正确对存贮单元阵列46进行存取。如果控制器23在地址时钟脉冲线210上送出超过20个时钟脉冲,则移位寄存器420就只能保留最后的20个值。因而,其存取动作受限于存贮器21本身的容量。反之,如控制器23送出少于20个时钟脉冲,则因移位寄存器42内一些较高位元(higher bits)的剩留值的影响,存取的第一个地址值将产生错误。因此为克服这个小小缺点,本发明再提供如图8所示的第二实施例。Because once the memory device 21 is manufactured, the number of data registers 420 therein is fixed. For example, for a 1M static access memory (SRAM), there are 20 data registers 420 . The address clock signal 210 must have 20 clock pulses to access the memory cell array 46 correctly. If the controller 23 sends more than 20 clock pulses on the address clock pulse line 210, then the shift register 420 can only hold the last 20 values. Therefore, its access action is limited by the capacity of the memory 21 itself. On the contrary, if the controller 23 sends less than 20 clock pulses, the first address value to be accessed will generate an error due to the influence of the remaining values of some higher bits in the shift register 42 . Therefore, in order to overcome this small shortcoming, the present invention further provides a second embodiment as shown in FIG. 8 .

第二实施例,如图8所示,与第一实施例有相同的移位寄存器42、地址锁存/计数器442、存储单元阵列46、边缘检测器444、数据缓冲器48。这些元件的功能及动作方式都与第一实施例所描述的相同,可参考第一实施例中相关的叙述,在此不再赘述。The second embodiment, as shown in FIG. 8 , has the same shift register 42 , address latch/counter 442 , memory cell array 46 , edge detector 444 , and data buffer 48 as the first embodiment. The functions and operation modes of these components are the same as those described in the first embodiment, and reference may be made to the relevant descriptions in the first embodiment, and details are not repeated here.

在图8中的置“0”电路450响应地址时钟脉冲信号210、读信号242或写信号241,产生一置“0”信号452使移位寄存器42置“0”。置“0”电路450的较佳实施例示于图9中。The "0" setting circuit 450 in FIG. 8 responds to the address clock pulse signal 210, the read signal 242 or the write signal 241, and generates a "0" setting signal 452 to set the shift register 42 to "0". A preferred embodiment of a set "0" circuit 450 is shown in FIG.

如图9所示,置“0”电路450具有一与非门90、一第一或非门92、一第二或非门94、一非门96、一延迟电路97及一或非门98。与非门90具有两个输入端分别输入一读信号242及一写信号241,并具一输出端。第一或非门92具一第一输入端、一第二输入端及一第一输出端。第一输入端与非门90的输出端连结。第二或非门94具有一第三输入端、第四输入端及一第二输出端。第三输入端输入地址时钟脉冲信号210,而第四输入端与第一或非门92的第一输出端连结,第二输出端与第一或非门92的第二输入端连结并产生一第二输出信号941。非门96,具一第五输入端及一第三输出端,第五输入端与第二或非门94的第二输出端连结,而第三输出端产生一第三输出信号961。或非门98,响应第二输出信号941及第三输出信号961,产生置“0”信号452。As shown in Figure 9, setting "0" circuit 450 has a NAND gate 90, a first NOR gate 92, a second NOR gate 94, a NOT gate 96, a delay circuit 97 and a NOR gate 98 . The NAND gate 90 has two input terminals respectively input a read signal 242 and a write signal 241 , and has an output terminal. The first NOR gate 92 has a first input terminal, a second input terminal and a first output terminal. The first input terminal is connected with the output terminal of the NOT gate 90 . The second NOR gate 94 has a third input terminal, a fourth input terminal and a second output terminal. The third input terminal inputs the address clock pulse signal 210, and the fourth input terminal is connected with the first output terminal of the first NOR gate 92, and the second output terminal is connected with the second input terminal of the first NOR gate 92 and generates a Second output signal 941 . The NOT gate 96 has a fifth input terminal and a third output terminal, the fifth input terminal is connected with the second output terminal of the second NOR gate 94 , and the third output terminal generates a third output signal 961 . The NOR gate 98 generates a “0” signal 452 in response to the second output signal 941 and the third output signal 961 .

图9中信号的时序关系在图10中示出。同样地,写信号241、读信号242由图7的电路所产生。The timing relationship of the signals in FIG. 9 is shown in FIG. 10 . Similarly, the write signal 241 and the read signal 242 are generated by the circuit in FIG. 7 .

因在上一次读信号242或写信号241被取消(deasserted)后的第一个地址时钟脉冲信号210处产生一动作置“0”信号452,移位寄存器42于是被置“0”,以便正确地贮存接下来由数据线220在时钟脉冲作用下读入(clocking)的第一个地址值。如果这个地址值的数目少于数据寄存器420的数目,也不会有错误发生。Because the first address clock pulse signal 210 after the last read signal 242 or write signal 241 was deasserted (deasserted), an action is set to a "0" signal 452, and the shift register 42 is then set to "0", so that the correct ground stores the first address value that is clocked in by the data line 220 next. If the number of address values is less than the number of data registers 420, no error will occur.

Claims (10)

1, a kind of memory device of serial access has one first data terminal and a memory cell array, and this memory cell array has most addresses; With a shift register, its response is stored first address value of a memory device one serial access action from an address clock pulse signal of control device, and this shift LD utensil one first input end and described first data terminal link, it is characterized in that, also comprise:
One address decoding circuitry, its response is carried out the serial access action from an access control signal of control device, described first address value, described address clock pulse signal and a clock pulse signal from control device to most addresses in the described memory cell array.
2, memory device as claimed in claim 1 wherein also comprises:
One data input pin was imported first address value of memory device one serial access action with serial mode in one first period, and transmitted data in a residue period in a tandem mode;
One data buffer, it links with data input pin and memory cell array respectively, and responds a described access control signal and a described clock pulse signal, transmits described data with serial mode.
3, a kind of serial access memory device with variable address word length ability has one first data terminal and a memory cell array, and this memory cell array has most addresses;
With a shift register, it responds an address clock pulse signal from control device, and first address value of a memory device one serial access action is stored, and this shift LD utensil one first input end and described first data terminal link, it is characterized in that, also comprise:
One address decoding circuitry, its response one access control signal from control device, described first address value, described address clock pulse signal and a time clock signal carry out the serial access action to most addresses in the described memory cell array; And
One reset circuit, it responds described access control signal, described clock pulse signal and described address clock pulse signal, produces a reset signal so that described shift register reset.
4, memory device as claimed in claim 2 further comprises:
One shift register, it responds a described address clock pulse signal, and first address value of memory device one serial access action is stored, and this shift LD utensil one first input end and described first data terminal link;
One address decoding circuitry, it responds a described access control signal, described first address value, described address clock pulse signal and a described clock pulse signal, and the serial access action is carried out in most addresses in the described memory cell array.
5, as claim 1 or 3 or 4 described memory devices, wherein this shift register has the mutual serial connection of N data register to constitute described shift register, each data register in N data register has an output terminal (Q), a time clock input end (CLK) and a data input pin (D), the data input pin (D) of first data register in N data register is the first input end of shift register, and the clock pulse input terminal of each data register is imported described address clock pulse signal.
6, memory device as claimed in claim 5, wherein this address decoding circuitry comprises one address latch/counter, it has N input end, each input end links with the data input pin (Q) of a corresponding data register, its response one signal of packing into latchs described first address value, and its response one increment signal is with the increase one by one of access address value.
7, memory device as claimed in claim 1, wherein this address decoding circuitry has EOM end, and its value in a FA final address of this memory cell array is exported a memory terminal point (End of Memory) signal during by access.
8, memory device as claimed in claim 6, wherein this address decoding circuitry further comprises:
One edge detecting device, its input end are imported described access control signal, described address clock pulse signal and described clock pulse signal respectively, export described signal and the increment signal of packing into.
9, memory device as claimed in claim 8, wherein edge detector comprises:
One Sheffer stroke gate, its tool two input ends are imported one respectively and are read (read) signal and and write (write) signal, and tool one output terminal is exported described increment signal;
One first rejection gate, its tool one first input end, one second input end and one first output terminal, first input end is imported described increment signal;
One second rejection gate, its tool 1 the 3rd input end, a four-input terminal and one second output terminal, the 3rd input end is imported described address clock pulse signal, first output terminal of the four-input terminal and first rejection gate links, and second input end binding of second output terminal and first rejection gate is also exported one second output signal;
One not gate, its tool 1 the 5th input end and one the 3rd output terminal, second output terminal of the 5th input end and second rejection gate links, and the 3rd output terminal is exported one the 3rd output signal;
One with the door, its input end is imported described second, third output signal respectively, exports the described signal of packing into.
10, memory device as claimed in claim 3, wherein the reset circuit comprises:
One Sheffer stroke gate, its tool two input ends are imported one respectively and are read (read) signal and and write (write) signal, and tool one output terminal;
One first rejection gate, its tool one first input end, one second input end and one first output terminal, the output terminal of first input end and Sheffer stroke gate is connected;
One second rejection gate, its tool 1 the 3rd input end, a four-input terminal and one second output terminal, the 3rd input end is imported described address clock pulse signal, first output terminal of the four-input terminal and first rejection gate links, and second input end binding of second output terminal and first rejection gate is also exported one second output signal;
One not gate, its tool 1 the 5th input end and one the 3rd output terminal, second output terminal of the 5th input end and second rejection gate links, and the 3rd output terminal is exported one the 3rd output signal;
One rejection gate, its two input end is imported described second, third output signal respectively, exports described reset signal.
CN94106176A 1994-05-21 1994-05-21 serially accessed memory device Expired - Fee Related CN1052094C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN94106176A CN1052094C (en) 1994-05-21 1994-05-21 serially accessed memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN94106176A CN1052094C (en) 1994-05-21 1994-05-21 serially accessed memory device

Publications (2)

Publication Number Publication Date
CN1112717A CN1112717A (en) 1995-11-29
CN1052094C true CN1052094C (en) 2000-05-03

Family

ID=5032422

Family Applications (1)

Application Number Title Priority Date Filing Date
CN94106176A Expired - Fee Related CN1052094C (en) 1994-05-21 1994-05-21 serially accessed memory device

Country Status (1)

Country Link
CN (1) CN1052094C (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4314702B2 (en) 1998-11-26 2009-08-19 セイコーエプソン株式会社 Printing apparatus, writing method, and printer
EP1606822B1 (en) * 2003-03-19 2011-10-26 Nxp B.V. Universal memory device having a profile storage unit
TWM607216U (en) * 2020-10-13 2021-02-01 眾智光電科技股份有限公司 Infrared temperature sensor
CN114967570B (en) * 2022-07-27 2022-11-11 深圳市汤诚科技有限公司 Programmable control circuit structure and control method for I2C slave machine address

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0031950A2 (en) * 1979-12-27 1981-07-15 Nec Corporation Memory device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0031950A2 (en) * 1979-12-27 1981-07-15 Nec Corporation Memory device

Also Published As

Publication number Publication date
CN1112717A (en) 1995-11-29

Similar Documents

Publication Publication Date Title
US6034891A (en) Multi-state flash memory defect management
US7212426B2 (en) Flash memory system capable of inputting/outputting sector data at random
US4667330A (en) Semiconductor memory device
US6901001B2 (en) Ferroelectric memory input/output apparatus
US6353910B1 (en) Method and apparatus for implementing error correction coding (ECC) in a dynamic random access memory utilizing vertical ECC storage
US7257668B2 (en) Method and system for enhancing the endurance of memory cells
CN1759448A (en) Low-voltage sense amplifier and method
US5533194A (en) Hardware-assisted high speed memory test apparatus and method
JPH01138694A (en) Memory device
JP2669303B2 (en) Semiconductor memory with bit error correction function
US6201756B1 (en) Semiconductor memory device and write data masking method thereof
CN1052094C (en) serially accessed memory device
US6216180B1 (en) Method and apparatus for a nonvolatile memory interface for burst read operations
JPH0642313B2 (en) Semiconductor memory
US4922457A (en) Serial access memory system provided with improved cascade buffer circuit
US4905242A (en) Pipelined error detection and correction apparatus with programmable address trap
JPS59119597A (en) Semiconductor storage device
KR900008517A (en) Dynamic semiconductor memory device and its functional test device and test method
US6282622B1 (en) System, method, and program for detecting and assuring DRAM arrays
WO1991007754A1 (en) Read-while-write-memory
CN1119815C (en) One-chip clock synchronized memory device
CN1542841A (en) Memory circuit
van de Goor et al. Functional test for shifting-type FIFOs
KR100221073B1 (en) Synchronous semiconductor memory device
JPH0479098A (en) Semiconductor storage device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20000503