[go: up one dir, main page]

CN104851899B - Image sensor package structure and its method for packing - Google Patents

Image sensor package structure and its method for packing Download PDF

Info

Publication number
CN104851899B
CN104851899B CN201510256439.5A CN201510256439A CN104851899B CN 104851899 B CN104851899 B CN 104851899B CN 201510256439 A CN201510256439 A CN 201510256439A CN 104851899 B CN104851899 B CN 104851899B
Authority
CN
China
Prior art keywords
nanometer
lines
line group
line
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510256439.5A
Other languages
Chinese (zh)
Other versions
CN104851899A (en
Inventor
王之奇
喻琼
王蔚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
China Wafer Level CSP Co Ltd
Original Assignee
China Wafer Level CSP Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by China Wafer Level CSP Co Ltd filed Critical China Wafer Level CSP Co Ltd
Priority to CN201510256439.5A priority Critical patent/CN104851899B/en
Publication of CN104851899A publication Critical patent/CN104851899A/en
Application granted granted Critical
Publication of CN104851899B publication Critical patent/CN104851899B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

A kind of image sensor package structure and its method for packing.Wherein, described image sensor encapsulating structure includes:Imaging sensor, has functional surfaces and the back side, and the functional surfaces have photosensitive region and non-photo-sensing region, have pixel cell on the photosensitive region;Cavity wall, it is fixedly connected with the functional surfaces, the cavity wall has through hole, and the photosensitive region is exposed by the through hole, and the functional surfaces seal one of port of the through hole;Transparency carrier, has relative first surface and second surface, and the second surface seals another port of the through hole;Nanometer lines, positioned at least one of which surface of the first surface and second surface, or positioned at film, and the film is located at least one of which surface of the first surface and second surface.Described image sensor encapsulating structure can obtain the image with 3D information by Polaroid.

Description

Image sensor package structure and its method for packing
Technical field
The present invention relates to field of image sensors, more particularly to a kind of image sensor package structure and its method for packing.
Background technology
Perception of the people to surrounding environment is always by acquisitions such as vision, the sense of hearing, tactile and the sense of taste, and simulation true to nature is again Reveal these when participating in the cintest to feel, be one of important subject of modern science and technology.By stereophonic sound system, people are acoustically can be with Live sensation is experienced, sterophonic technique has had evolved to higher technical merit at present.And 3D (three-dimensional/three-dimensional) vision skill Art, it is also necessary to technological break-through.3D vision techniques include 3D rendering and 3D videos.
3D imagings are formed by visual difference, i.e., different images is seen by right and left eyes, is reappeared in human brain, and then Realize 3D sensation.As shown in figure 1,10 be display screen, 01 and 02 are the eyes of people, and 11 be the stereopsis being perceived out.
In general, 3D imagings are realized by aberration formula, polarization type and active-shutter.Aberration formula is by red blue filter coating So that the color of image that right and left eyes are seen is not used to realize 3D imaging effects;Polarization type is by laterally longitudinal polarizer, makes a left side The direction of propagation difference of the image light that right eye is seen realizes 3D imaging effects;Active-shutter is by controlling right and left eyes to see The time difference of image realizes 3D imaging effects.
3D rendering can be divided into by viewing tool type and visually observe two types.There is polarization type by viewing tool 3D rendering, red green colour filter 3D rendering etc., due to being limited by viewing tool, so practical application is also inconvenient.It is adapted to meat The 3D rendering of eye observation has Lenticular screen image, microlens array image and hologram image.Lenticular screen image and micro- Lens array image, using one layer of optical lens film is covered on the pattern of various visual angles information is printed with, realize each Viewing-angle information Light is spatially separated from, and forms 3D observing effects, but is limited by the size (hundreds of micron dimensions) of optical texture, so figure As coarse, manufacturing cost is also higher.
Laser holography can also realize 3D stereograms, and traditional hologram image technology is from laser the 1960s Rapid development is obtained after appearance, its Basic Mechanism is using optical interference method while records the amplitude and phase of Object light wave. Because the light wave of holographic reconstructed image remains whole amplitudes of original Object light wave and the information of phase, reproduction image has with the original Identical 3D characteristics, it is a kind of real 3D rendering, the microstructure of hologram image is small submicrometer structure, is had The characteristic of diffraction light, so hologram image is a kind of without ink image, color solid information can be showed, mould pressing technology can be with The batch duplicating of this image is realized, it is achieved thereby that low manufacturing cost, the hologram image of plane has successfully realized batch The business application of change.However, due to more than traditional 3D hologram images mastering process step and complicated, production environment condition is severe Carve, limit the application of this stereo-picture, the case of commercial applications is very few, by this Three-dimensional holographic technology numeral Change, avoid some uppity factors so that this image can make under the conditions of industrialized, be this image development Inevitable requirement, will also produce huge commercial value.
Crystal wafer chip dimension encapsulation (Wafer Level Chip Size Packaging, WLCSP) technology is to full wafer Wafer cuts to obtain the technology of single finished product chip again after being packaged test, the chip size after encapsulation and nude film complete one Cause.Crystal wafer chip dimension encapsulation technology has thoroughly overturned conventional package such as ceramic leadless chip carrier (Ceramic Leadless Chip Carrier), organic leadless chip carrier (Organic Leadless Chip Carrier) sum The pattern of code-phase machine modular, market increasingly light to microelectronic product, small, short, thinning and low priceization requirement are complied with.Through wafer Chip size after the encapsulation of level chip scale package technology, which has reached, to be highly miniaturized, and chip cost is with the reduction of chip size Increase with wafer size and significantly reduce.Crystal wafer chip dimension encapsulation technology be IC can be designed, wafer manufacture, encapsulation The technology that test, substrate manufacture integrate, is the focus in current encapsulation field and the trend of future development.
Three-dimensional imaging refers to a kind of imaging method for showing scenery three dimensions.Generally by producing two width different points of view Image, respectively watched by corresponding eyes, with Boris DVE.Shooting instrument has standard type stereocamera, also has single-lens Stereoscopic adapter is assembled on camera.Ordinary camera can also be shot with the method moved left and right.Shadow obtained by three-dimensional imaging As subsequently stereoscopic display can be carried out by corresponding 3D display device, corresponding image in kind can also be fabricated to.
However, in the prior art, single image sensor package structure does not possess the function of obtaining 3D information.
The content of the invention
The present invention solves the problems, such as to be to provide a kind of image sensor package structure and preparation method thereof, to realize using single One image sensor package structure is to obtain the image with 3D information.
To solve the above problems, the present invention provides a kind of image sensor package structure, including:
Imaging sensor, has functional surfaces and the back side, and the functional surfaces have photosensitive region and non-photo-sensing region, the sense There is pixel cell on light region;
Cavity wall, it is fixedly connected with the functional surfaces, the cavity wall has through hole, and the photosensitive region is by the through hole Exposure, the functional surfaces seal one of port of the through hole;
Transparency carrier, has relative first surface and second surface, and the second surface seals the another of the through hole Individual port;
Nanometer lines, positioned at least one of which surface of the first surface and second surface, or positioned at film, and The film is located at least one of which surface of the first surface and second surface.
Optionally, the nanometer lines includes multiple first nanometer of line group and multiple second nanometer of line group, and described first receives Rice line group has first nanometer of line of multiple tracks, and second nanometer of line group has second nanometer of line of multiple tracks, first nanometer of line edge First is axially extending, and second nanometer of line is axially extending along second, and described first axially axially intersects with described second.
Optionally, first nanometer of line group and second nanometer of line group are arranged in array, with a line and same row In, first nanometer of line group and second nanometer of line group are arranged alternately.
Optionally, the first surface has first nanometer of lines, and the second surface has second nanometer of lines, described First nanometer of line group of second nanometer of lines described in first nanometer of line group face of first nanometer of lines, described first Second nanometer of line group of second nanometer of lines described in second nanometer of line group face of nanometer lines.
Optionally, the first surface has the first film, and the second surface has the second film, the first film With first nanometer of lines, second film has second nanometer of lines, described first nanometer of first nanometer of lines First nanometer of line group of second nanometer of lines described in line group face, second nanometer of line group of first nanometer of lines Second nanometer of line group of second nanometer of lines described in face.
Optionally, the area of first nanometer of lines be more than or equal to second nanometer of lines area, described second The area of nanometer lines is more than or equal to the area of the photosensitive region.
Optionally, the nanometer lines includes multiple nanometers of line groups, each nanometer line group include it is multiple be parallel to each other receive Meter Wen, the nanometer lines of different nanometer line groups is along axially different extension.
To solve the above problems, the present invention provides a kind of method for packing of image sensor package structure, including:
Transparency carrier is provided, the transparency carrier has relative first surface and second surface;
Cavity wall is provided, the cavity wall has through hole;
Wafer is provided, the wafer has multiple images sensor unit, and described image sensor unit has between each other There is Cutting Road, each described image sensor unit has functional surfaces and the back side, and the functional surfaces have photosensitive region and non-sense Light region, there is pixel cell on the photosensitive region;
The cavity wall is fixed on the functional surfaces of described image sensor unit, the photosensitive region is described Through hole exposes, and makes one of port of the functional surfaces sealing through hole;
The transparency carrier is fixed on the cavity wall, and makes another of the second surface sealing through hole Port;
Nanometer lines, the nanometer lines are made at least one of which surface of the first surface and second surface The first surface and second surface are directly produced on, or the nanometer lines is produced on film surface, and the film It is arranged at least one of which surface of the first surface and second surface;
The wafer and the cavity wall are cut along the Cutting Road.
Optionally, the nanometer lines bag is made at least one of which surface of the first surface and second surface Include:
The film is made at least one of which surface of the first surface and second surface;
Photoetching is carried out to the film, forms the nanometer lines.
Optionally, the light is carried out to the film using mask-free photolithography direct write equipment or nano graph lithographic equipment Carve.
Optionally, the nanometer lines includes multiple first nanometer of line group and multiple second nanometer of line group, and described first receives Rice line group has first nanometer of line of multiple tracks, and second nanometer of line group has second nanometer of line of multiple tracks, first nanometer of line edge First is axially extending, and second nanometer of line is axially extending along second, and described first axially axially intersects with second.
Optionally, first nanometer of line group and second nanometer of line group are arranged in array, with a line and same row In, first nanometer of line group and second nanometer of line group are arranged alternately.
Optionally, first nanometer of lines is formed in the first surface, second nanometer of lines is formed in the second surface, First nanometer of line group of second nanometer of lines, described described in first nanometer of line group face of first nanometer of lines Second nanometer of line group of second nanometer of lines described in second nanometer of line group face of first nanometer of lines.
Optionally, the first surface formed the first film, the second surface formed the second film, described first Film has first nanometer of lines, and second film has second nanometer of lines, and described the first of first nanometer of lines First nanometer of line group of second nanometer of lines described in nanometer line group face, described second nanometer of first nanometer of lines Second nanometer of line group of second nanometer of lines described in line group face.
Optionally, the area of first nanometer of lines be more than or equal to second nanometer of lines area, described second The area of nanometer lines is more than or equal to the area of the photosensitive region.
Optionally, the nanometer lines includes multiple nanometers of line groups, each nanometer line group include it is multiple be parallel to each other receive Meter Wen, the nanometer lines of different nanometer line groups is along axially different extension.
Compared with prior art, technical scheme has advantages below:
In technical scheme, because image sensor package structure has the nanometer line on film Road, nanometer lines include multiple nanometers of line groups, therefore, before ambient enters the pixel cell of imaging sensor, by not It is divided into the light in different polarization direction with nanometer line group, is then just received and converted by the pixel cell, now, equivalent to The Polaroid image for just obtaining multiple different angles, and the information of multiple images presses the distribution mode phase of different nanometer line groups It should be distributed in an image, so that the image that the pixel cell obtains has 3D information.
Brief description of the drawings
Fig. 1 is the 3D image-forming principle schematic diagrames of display screen;
Fig. 2 is the image sensor package structural representation that the embodiment of the present invention is provided;
Fig. 3 is film overlooking the structure diagram in image sensor package structure shown in Fig. 2;
Fig. 4 to Fig. 8 is the method for packing schematic diagram for the image sensor package structure that the embodiment of the present invention is provided.
Embodiment
As described in background, in the prior art, single image sensor package structure, which does not possess, obtains 3D information Function, i.e., single image sensor package structure is Polaroid to be only capable of obtaining the image with 2D image informations.
Therefore, the present invention proposes a kind of image sensor package structure.After general conventional images sensor-packaging structure Imaging effect is common 2D images, and the present invention proposes to be formed nanometer lines on photosensitive region, image sensor package structure, Acted on by " light splitting " of nanometer lines, the pixel cell of image sensor package structure is obtained the light of different angle, from And reaching the Polaroid purpose for obtaining 3D information, i.e. described image sensor encapsulating structure can just be obtained by Polaroid There must be the image of 3D information.
It is understandable to enable the above objects, features and advantages of the present invention to become apparent, below in conjunction with the accompanying drawings to the present invention Specific embodiment be described in detail.
The embodiment of the present invention provides a kind of image sensor package structure, incorporated by reference to referring to figs. 2 and 3.
Fig. 2 is refer to, described image sensor encapsulating structure includes imaging sensor 200, and imaging sensor 200 has work( Energy face 200A and back side 200B, functional surfaces 200A have photosensitive region (not marking) and non-photo-sensing region (not marking).The sense Do not distinctly displayed between light region and non-photo-sensing region, but there is pixel cell (not shown), the pixel on photosensitive region Being made on unit has microlens structure 202, and therefore, the functional surfaces 200A regions in Fig. 2 corresponding to microlens structure 202 are described Photosensitive region.It should be noted that in the present embodiment, described image sensor encapsulating structure can be imaging sensor wafer scale Chip scale package structure.
In the present embodiment, imaging sensor 200 can be cmos image sensor, wherein, the pixel cell can wrap The structures such as color film layer (not shown) and photodiode (not shown) are included, the color film layer is located on the photodiode, micro- Lens arrangement 202 is located in color film layer.The MOS coordinated with the photodiode is could be formed with inside imaging sensor 200 Pipe, floating diffusion region, amplifying circuit and corresponding interconnection structure etc..These semiconductor devices and structure one side and the photoelectricity Diode electrically connects, and to handle photosignal caused by photodiode, is on the other hand electrically connected with weld pad 201.Weldering Pad 201 is used for subsequently through metal level 203 and welding resisting layer 204, by the internal circuit configuration of imaging sensor 200 and external projection 205 are electrically connected.
In other embodiments, imaging sensor 200 can also be ccd image sensor.
Please continue to refer to Fig. 2, described image sensor encapsulating structure also includes cavity wall 210, cavity wall 210 and functional surfaces 200A is fixedly connected.Cavity wall 210 has through hole 211 (incorporated by reference to reference to figure 5 and Fig. 6), and photosensitive region is exposed by through hole 211, Functional surfaces 200A seals one of port of through hole 211.The region that functional surfaces 200A fixes with cavity wall 210 is also to be above-mentioned non- A part for photosensitive region.
In the present embodiment, the material of cavity wall 210 can be ceramic material, organic material, glass material or silicon materials.
Please continue to refer to Fig. 2, described image sensor encapsulating structure also includes transparency carrier 220, and transparency carrier 220 has Relative first surface 220A and second surface 220B, second surface 220B seal another port of through hole 211.
In the present embodiment, transparency carrier 220 and imaging sensor 200 seal cavity wall 210 in centre, so that will be hollow The through hole 211 of wall 210, which seals, turns into cavity 250, and the sub-translucent structure of pixel cell and its top is exposed by cavity 250.
In the present embodiment, transparency carrier 220 can be glass substrate or plastic base.
Please continue to refer to Fig. 2, described image sensor encapsulating structure also includes nanometer lines, and the nanometer lines is positioned at thin On film 240, and film 240 is located at the first surface 220A of transparency carrier 220.
In the present embodiment, film 240 is specifically as follows organic film.The nanometer lines can pass through photoetching or other sides Method is produced on film 240.
Fig. 3 is refer to, shows the plan structure of film 240.In the present embodiment, the nanometer lines includes multiple first Nanometer line group 241 and multiple second nanometer of line group 242, first nanometer of line group 241 have first nanometer of line 2411 of multiple tracks, and second receives Rice line group 242 has second nanometer of line 2421 of multiple tracks, and first nanometer of line 2411 along first is axially extending, second nanometer of edge of line 2421 Second is axially extending, and first is axially axially vertical with second.Also, in the present embodiment, first nanometer of line group 241 and second nanometer Line group 242 is arranged in array, and with a line and in same row, first nanometer of line group 241 and second nanometer of line group 242 are alternately arranged Cloth.
In other embodiments, first can also be axially axially non-perpendicular intersect with second.
The wave-length coverage of visible ray is usually 380nm to 780nm, therefore, first nanometer of line and second nanometer of line Width can be using relative set as twice of corresponding visible wavelength, one times, half and a quarter equal in width, so as to realize Diffraction to visible ray, ensure that different nanometer line groups receive the light of different angle, allow light to be converted into difference in other words The polarization light of angle.
In the image sensor package structure that the present embodiment is provided, due to the nanometer line on film Road, nanometer lines include multiple first nanometer of line group 241 and multiple second nanometer of line group 242, and therefore, ambient enters image Before the pixel cell of sensor 200, different polarization direction is divided into by first nanometer of line group 241 and second nanometer of line group 242 Light, then just received and converted by the pixel cell, now, two different angles are just obtained equivalent to Polaroid Image, and the information of two images is accordingly distributed by the distribution mode of first nanometer of line group 241 and second nanometer of line group 242 In an image, equivalent to (i.e. piece image is with two different angles with 3D information for the image that the pixel cell obtains Spend the information of image).
After the image with 3D information is obtained, then after corresponding display processing, it is possible to achieve 3D rendering is shown.Institute It both can be to be shown using corresponding tridimensional electronic display device or will accordingly have 3D information to state display processing The 3D rendering realized into solid images of image making show.
It should be noted that in other embodiments, when nanometer lines includes multiple nanometers of line groups, ambient enters figure As sensor the pixel cell before, the light in different polarization direction is divided into by different nanometer line groups, then just by the picture Plain unit is received and converted, now, equivalent to the Polaroid image for just obtaining multiple different angles, and multiple images Information is accordingly distributed in an image by the distribution mode of different nanometer line groups, so that the image that the pixel cell obtains With 3D information.
In other embodiments, the film with nanometer lines can also may be used positioned at the second surface 220B of transparency carrier 220 To be provided with the film simultaneously on the first surface 220A and second surface 220B of transparency carrier 220, on the film With the nanometer lines.
In other embodiments, nanometer lines can directly be produced on the first surface 220A or second of transparency carrier 220 Surface 220B, or directly it is produced on the first surface 220A and second surface 220B of transparency carrier 220.First nanometer of lines Area is more than or equal to the area of second nanometer of lines, and the area of second nanometer of lines is more than or equal to the area of photosensitive region.
In other embodiments, first surface 220A has first nanometer of lines, and second surface 220B has second nanometer of line Road, first nanometer of line group of first nanometer of line group second nanometer of lines of face of first nanometer of lines, the of first nanometer of lines Second nanometer of line group of two nanometers of line group second nanometer of lines of face.
In other embodiments, first surface 220A has the first film, and second surface 220B has the second film, and first is thin Film has first nanometer of lines, and the second film has second nanometer of lines, first nanometer of line group face of first nanometer of lines First nanometer of line group of two nanometers of lines, second nanometer of second nanometer of line group second nanometer of lines of face of first nanometer of lines Line group.
In the case where above two has first nanometer of lines and second nanometer of lines, due to the of first nanometer of lines First nanometer of line group of one nanometer of line group second nanometer of lines of face, and second nanometer of line group face second of first nanometer of lines Second nanometer of line group of nanometer lines, thus, light can reach the pixel cell by corresponding nanometer line, also, by After different light pass through nanometer line, it is recorded in different pixel cells, therefore, the image finally given has preferable 3D information.
In other embodiments, when first surface 220A has first nanometer of lines, and second surface 220B has first to receive During rice lines, the area of first nanometer of lines can also be controlled to be more than or equal to the area of second nanometer of lines, second nanometer of lines Area be more than or equal to photosensitive region area.In this case, the light that whole pixel cells receives can be ensured Line all passes through first nanometer of lines and second nanometer of lines, so as to ensure the whole of the formed whole image pixel cell Include complete 3D information.
In other embodiments, nanometer lines includes multiple nanometers of line groups, and each nanometer line group includes multiple be parallel to each other Nanometer line, the nanometer lines of different nanometer line groups is along axially different extension.In this case, the group number of nanometer line group can be two More than, such as three, four or more than five.When the group number of nanometer line group is three, using this image sensor package The piece image that structure collects can have the information of three width different angle images, when the group number of nanometer line group is four, The piece image collected using this image sensor package structure can have the information of four width different angle images, that is, Say, with, the group number increase of nanometer line group, the 3D information that corresponding piece image can have is abundanter, but due to the picture Plain unit number is typically certain, if the group number of nanometer line group is more, also results in corresponding each angular image information content Reduction.
The embodiment of the present invention also provides a kind of method for packing of image sensor package structure, to form above-described embodiment institute The image sensor package structure of offer, therefore, incorporated by reference to reference to figure 4 to Fig. 8, and Fig. 2 and Fig. 3.It should be noted that this In embodiment, the method for packing of described image sensor encapsulating structure can be imaging sensor crystal wafer chip dimension encapsulation knot The method for packing of structure.
It refer to Fig. 4, there is provided transparency carrier 220, transparency carrier 220 have relative first surface 220A and second surface 220B。
It refer to Fig. 5 and Fig. 6, there is provided cavity wall 210, cavity wall 210 have through hole 211.Wherein, Fig. 5 is cavity wall 210 Cut-away view, Fig. 6 be cavity wall 210 top view.
In the present embodiment, cavity wall 210 can be formed according to the difference of material using distinct methods, also, the through hole 211 can together form with the entity part of cavity wall 210, can also after entity part is formed, the methods of passing through etching shape Into through hole 211.
It refer to Fig. 7, there is provided there is multiple images sensor unit 200a, Fig. 7 to show described in two for wafer, the wafer Image sensor cell 200a, neighboring image sensors unit 200a have Cutting Road (not shown) between each other, and in Fig. 7 Separated between described image sensor unit 200a with dotted line, dotted line position corresponds to the Cutting Road position.Fig. 4 into Fig. 6, with And in Fig. 8, the Cutting Road that each dotted line is also corresponded between two adjacent images sensor unit 200a.
In the present embodiment, each image sensor cell 200a has functional surfaces 200A and back side 200B, functional surfaces 200A With photosensitive region and non-photo-sensing region, there is the pixel cell on the photosensitive region, image sensor cell 200a's More structures and property refer to the corresponding contents of imaging sensor 200 in previous embodiment.
Fig. 8 is refer to, cavity wall 210 is fixed on image sensor cell 200a functional surfaces 200A, photosensitive region Exposed by through hole 211, and make one of port of functional surfaces 200A sealing through holes 211.
In the present embodiment, cavity wall 210 can be fixed on to image sensor cell 200a function by method of attaching On the 200A of face.In other embodiments, cavity wall 210 can also be fixed on by image by ultrasonic bonding or Reflow Soldering welding and passed On sensor cell 200a functional surfaces 200A.
Please after with reference to figure 8, transparency carrier 220 is fixed on cavity wall 210, and second surface 220B is sealed through hole 211 another port.
In the present embodiment, transparency carrier 220 and imaging sensor 200 seal cavity wall 210 in centre, so that will be hollow The through hole 211 of wall 210, which seals, turns into cavity 250, and the sub-translucent structure of pixel cell and its top is exposed by cavity 250.
In the present embodiment, transparency carrier 220 can be fixed on cavity wall 210 by method of attaching, for example with purple Both outer optic-solidified adhesive bondings.
Please continue to refer to Fig. 8, film 240 is set on first surface 220A, and nanometer lines is formed on film 240, Will the nanometer lines be produced on first surface 220A.
In the present embodiment, film 240 can be directly fitted on first surface 220A by optical cement.
In the present embodiment, it be able to can include in the process of first surface 220A upper making nanometer lines:In the first table Film 240 is set on the 220A of face, and photoetching is carried out to film 240, forms the nanometer lines.Also, can be with the present embodiment Photoetching is carried out to film 240 using mask-free photolithography direct write equipment or nano graph lithographic equipment, so as to be formed as shown in Figure 3 Nanometer lines.
In the present embodiment, the nanometer lines on film 240 includes multiple first nanometer of line group 241 and multiple second nanometer of line Group 242, first nanometer of line group 241 has first nanometer of line 2411 of multiple tracks, and second nanometer of line group 242 has second nanometer of line of multiple tracks 2421, first nanometer of line 2411 along first is axially extending, and second nanometer of line 2421 along second is axially extending, the first axial direction and second It is axially vertical.First nanometer of line group 241 and second nanometer of line group 242 are arranged in array, and with a line and in same row, first receives Rice line group 241 and second nanometer of line group 242 are arranged alternately.
Please continue to refer to Fig. 8, along Cutting Road cutting crystal wafer and cavity wall 210, the image sensor package knot finally given Structure refer to Fig. 2, wherein, image sensor cell 200a turns into single imaging sensor 200 after being cut separation, such as Fig. 2 It is shown.
It should be noted that in other embodiments, the wafer and cavity wall 210, then fixation hollow wall can be first fixed 210 and transparency carrier 220.The present invention is not limited their permanent order.
It should be noted that the method for packing can also include:The wafer is thinned;The non-photo-sensing region With weld pad 201, the groove that bottom is the weld pad 201 is formed in the wafer rear 200B;In the table of the recess sidewall Face forms insulating barrier (not shown);Full metal is filled in the groove or in groove surfaces deposited metal, to form metal 203 (in groove surfaces deposited metal, metal level 203 can be not filled with completely described groove) of layer;In the gold of the back side 200B Belong to and welding resisting layer 204 is formed on layer 203;External projection 205 is formed in the outer surface of welding resisting layer 204.
In other embodiments, the nanometer lines only can also be made in second surface 220B, or can be in the first table A nanometer lines is made on the 220A of face and on second surface 220B simultaneously.Also, the nanometer lines can be produced on film, Film is arranged on the first surface 220A or second surface 220B by bonding or other methods again, can also directly be passed through The method of photoetching or etching is directly produced on the first surface 220A or second surface 220B.
In other embodiments, first nanometer of lines is formed in first surface 220A, forming second in second surface 220B receives Rice lines, first nanometer of line group of first nanometer of line group second nanometer of lines of face of first nanometer of lines, first nanometer of lines Second nanometer of line group second nanometer of lines of face second nanometer of line group.
In other embodiments, the first film is formed in first surface 220A, the second film is formed in second surface 220B, the One film has first nanometer of lines, and the second film has second nanometer of lines, and first nanometer of line group of first nanometer of lines is just To first nanometer of line group of second nanometer of lines, the second of second nanometer of line group second nanometer of lines of face of first nanometer of lines Nanometer line group.
In other embodiments, when first surface 220A has first nanometer of lines, and second surface 220B receives in the presence of second During rice lines, it may be such that the area of first nanometer of lines is more than or equal to the area of second nanometer of lines, the face of second nanometer of lines Area of the product more than or equal to photosensitive region.
In other embodiments, nanometer lines can include multiple nanometers of line groups, and each nanometer line group includes multiple mutually flat Capable nanometer line, the nanometer lines of different nanometer line groups is along axially different extension.
The method for packing that the present embodiment is provided can form the image sensor package structure that above-described embodiment is provided, Described image sensor encapsulating structure can obtain the image with 3D information by Polaroid.
Although present disclosure is as above, the present invention is not limited to this.Any those skilled in the art, this is not being departed from In the spirit and scope of invention, it can make various changes or modifications, therefore protection scope of the present invention should be with claim institute The scope of restriction is defined.

Claims (14)

  1. A kind of 1. image sensor package structure, it is characterised in that including:
    Imaging sensor, has functional surfaces and the back side, and the functional surfaces have photosensitive region and non-photo-sensing region, the photosensitive area There is pixel cell on domain;
    Cavity wall, it is fixedly connected with the functional surfaces, the cavity wall has a through hole, and the photosensitive region is sudden and violent by the through hole Dew, the functional surfaces seal one of port of the through hole;
    Transparency carrier, has relative first surface and second surface, and the second surface seals another end of the through hole Mouthful;
    Nanometer lines, positioned at least one of which surface of the first surface and second surface, or positioned at film, and it is described Film is located at least one of which surface of the first surface and second surface;
    Wherein, the nanometer lines includes multiple first nanometer of line group and multiple second nanometer of line group, first nanometer of line group With first nanometer of line of multiple tracks, second nanometer of line group has second nanometer of line of multiple tracks, and first nanometer of line is along first axle To extension, second nanometer of line is axially extending along second, and described first axially axially intersects with described second.
  2. 2. image sensor package structure as claimed in claim 1, it is characterised in that first nanometer of line group and described Two nanometers of line groups are arranged in array, and with a line and in same row, first nanometer of line group and second nanometer of line group are equal It is arranged alternately.
  3. 3. image sensor package structure as claimed in claim 2, it is characterised in that the first surface has first nanometer Lines, the second surface have second nanometer of lines, described in first nanometer of line group face of first nanometer of lines First nanometer of line group of second nanometer of lines, second described in second nanometer of line group face of first nanometer of lines Second nanometer of line group of nanometer lines.
  4. 4. image sensor package structure as claimed in claim 2, it is characterised in that the first surface is thin with first Film, the second surface have the second film, and the first film has first nanometer of lines, and second film has second Nanometer lines, described first nanometer of second nanometer of lines described in first nanometer of line group face of first nanometer of lines Line group, second nanometer of line of second nanometer of lines described in second nanometer of line group face of first nanometer of lines Group.
  5. 5. the image sensor package structure as described in claim 3 or 4, it is characterised in that the face of first nanometer of lines Product is more than or equal to the area of second nanometer of lines, and the area of second nanometer of lines is more than or equal to the photosensitive region Area.
  6. 6. image sensor package structure as claimed in claim 1, it is characterised in that the nanometer lines includes multiple nanometers Line group, each nanometer line group include multiple nanometer lines being parallel to each other, and the nanometer lines of different nanometer line groups is along axially different extension.
  7. A kind of 7. method for packing of image sensor package structure, it is characterised in that including:
    Transparency carrier is provided, the transparency carrier has relative first surface and second surface;
    Cavity wall is provided, the cavity wall has through hole;
    Wafer is provided, the wafer has multiple images sensor unit, and described image sensor unit has between each other to be cut Cut, each described image sensor unit has functional surfaces and the back side, and the functional surfaces have photosensitive region and non-photo-sensing area Domain, there is pixel cell on the photosensitive region;
    The cavity wall is fixed on the functional surfaces of described image sensor unit, the photosensitive region is by the through hole Exposure, and make one of port of the functional surfaces sealing through hole;
    The transparency carrier is fixed on the cavity wall, and makes another end of the second surface sealing through hole Mouthful;
    Nanometer lines is made at least one of which surface of the first surface and second surface, the nanometer lines is direct The first surface and second surface are produced on, or the nanometer lines is produced on film surface, and the film is set In at least one of which surface of the first surface and second surface;Wherein, the nanometer lines includes multiple first nanometers Line group and multiple second nanometer of line group, first nanometer of line group have first nanometer of line of multiple tracks, second nanometer of line group tool There is second nanometer of line of multiple tracks, first nanometer of line is axially extending along first, and second nanometer of line is axially extending along second, institute First is stated axially with second axially to intersect;
    The wafer and the cavity wall are cut along the Cutting Road.
  8. 8. the method for packing of image sensor package structure as claimed in claim 7, it is characterised in that in the first surface Include with the nanometer lines is made at least one of which surface of second surface:
    The film is made at least one of which surface of the first surface and second surface;
    Photoetching is carried out to the film, forms the nanometer lines.
  9. 9. the method for packing of image sensor package structure as claimed in claim 8, it is characterised in that using mask-free photolithography Direct write equipment or nano graph lithographic equipment carry out the photoetching to the film.
  10. 10. the method for packing of image sensor package structure as claimed in claim 7, it is characterised in that described first nanometer Line group and second nanometer of line group are arranged in array, with a line and in same row, first nanometer of line group and described the Two nanometers of line groups are arranged alternately.
  11. 11. the method for packing of image sensor package structure as claimed in claim 10, it is characterised in that in first table Face formed first nanometer of lines, the second surface formed second nanometer of lines, described the first of first nanometer of lines First nanometer of line group of second nanometer of lines described in nanometer line group face, described second nanometer of first nanometer of lines Second nanometer of line group of second nanometer of lines described in line group face.
  12. 12. the method for packing of image sensor package structure as claimed in claim 10, it is characterised in that in first table Face forms the first film, and the second film is formed in the second surface, and the first film has first nanometer of lines, and described the Two films have second nanometer of lines, second nanometer of lines described in first nanometer of line group face of first nanometer of lines First nanometer of line group, the institute of second nanometer of lines described in second nanometer of line group face of first nanometer of lines State second nanometer of line group.
  13. 13. the method for packing of the image sensor package structure as described in claim 11 or 12, it is characterised in that described first The area of nanometer lines is more than or equal to the area of second nanometer of lines, and the area of second nanometer of lines is more than or equal to institute State the area of photosensitive region.
  14. 14. the method for packing of image sensor package structure as claimed in claim 7, it is characterised in that the nanometer lines Including multiple nanometers of line groups, each nanometer line group includes multiple nanometer lines being parallel to each other, the nanometer line edge of different nanometer line groups Axially different extension.
CN201510256439.5A 2015-05-19 2015-05-19 Image sensor package structure and its method for packing Active CN104851899B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510256439.5A CN104851899B (en) 2015-05-19 2015-05-19 Image sensor package structure and its method for packing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510256439.5A CN104851899B (en) 2015-05-19 2015-05-19 Image sensor package structure and its method for packing

Publications (2)

Publication Number Publication Date
CN104851899A CN104851899A (en) 2015-08-19
CN104851899B true CN104851899B (en) 2018-01-19

Family

ID=53851408

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510256439.5A Active CN104851899B (en) 2015-05-19 2015-05-19 Image sensor package structure and its method for packing

Country Status (1)

Country Link
CN (1) CN104851899B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107301392B (en) * 2017-06-20 2020-12-04 华天科技(昆山)电子有限公司 Wafer-level image acquisition device
CN110783317A (en) * 2019-10-11 2020-02-11 安徽国晶微电子有限公司 Photosensitive chip packaging structure

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102024833A (en) * 2009-09-17 2011-04-20 法国原子能及替代能源委员会 3d imaging device, manufacturing method thereof and 3d imaging system
CN102402106A (en) * 2010-09-07 2012-04-04 索尼公司 Solid-state imaging element, solid-state imaging device, solid-state imaging apparatus, and method for producing polarizing element
CN102412256A (en) * 2011-10-28 2012-04-11 格科微电子(上海)有限公司 Packaged image sensor, formation method thereof and method for reducing flare phenomenon of packaged image sensor
DE102012204183A1 (en) * 2011-03-16 2012-09-20 Ifm Electronic Gmbh Image sensor for three dimensional operating camera, has photosensitive layer with upstream outer layer, where photosensitive layer is made up of multiple pixels
CN103579265A (en) * 2012-07-26 2014-02-12 奥普蒂兹公司 Integrated image sensor package with liquid crystal lens
CN103617998A (en) * 2013-11-22 2014-03-05 深港产学研基地 Three-dimensional CMOS digital image sensor
CN204809223U (en) * 2015-05-19 2015-11-25 苏州晶方半导体科技股份有限公司 Image sensor packaging structure

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102024833A (en) * 2009-09-17 2011-04-20 法国原子能及替代能源委员会 3d imaging device, manufacturing method thereof and 3d imaging system
CN102402106A (en) * 2010-09-07 2012-04-04 索尼公司 Solid-state imaging element, solid-state imaging device, solid-state imaging apparatus, and method for producing polarizing element
DE102012204183A1 (en) * 2011-03-16 2012-09-20 Ifm Electronic Gmbh Image sensor for three dimensional operating camera, has photosensitive layer with upstream outer layer, where photosensitive layer is made up of multiple pixels
CN102412256A (en) * 2011-10-28 2012-04-11 格科微电子(上海)有限公司 Packaged image sensor, formation method thereof and method for reducing flare phenomenon of packaged image sensor
CN103579265A (en) * 2012-07-26 2014-02-12 奥普蒂兹公司 Integrated image sensor package with liquid crystal lens
CN103617998A (en) * 2013-11-22 2014-03-05 深港产学研基地 Three-dimensional CMOS digital image sensor
CN204809223U (en) * 2015-05-19 2015-11-25 苏州晶方半导体科技股份有限公司 Image sensor packaging structure

Also Published As

Publication number Publication date
CN104851899A (en) 2015-08-19

Similar Documents

Publication Publication Date Title
JP5840607B2 (en) Method and apparatus for generating three-dimensional image information
JP5879549B2 (en) Light field imaging apparatus and image processing apparatus
TWI454792B (en) Device for displaying and sensing images
CN102484721B (en) Four-channel color filter array pattern
EP2957099B1 (en) Plenoptic imaging device
JP5454424B2 (en) Imaging method
CN102342115B (en) Three-dimensional image capture device
CN103168272B (en) Depth estimation camera head and photographing element
CN102948141B (en) Image capture apparatus and image-capturing method
US20120229688A1 (en) Image pickup apparatus
CN105487239A (en) Directive color filter and naked eye 3D display device
TW201812370A (en) Coverless glass array camera with separate shaded camera
CN102209254A (en) One-dimensional integrated imaging method and device
WO2013021542A1 (en) Three-dimensional image pickup apparatus
CN204809223U (en) Image sensor packaging structure
CN104851899B (en) Image sensor package structure and its method for packing
WO2018113082A1 (en) 3d panoramic photographing system and method
JPWO2012157209A1 (en) Three-dimensional imaging device, imaging device, light transmission unit, and image processing device
TWI738259B (en) Combined light-field camera and high resolution camera modules and method using wafer-level integration process
JP6008298B2 (en) Image processing apparatus, imaging apparatus, image processing method, and program
JP6367803B2 (en) Method for the description of object points in object space and combinations for its implementation
JP2013102322A (en) Imaging apparatus and imaging method
TW201445978A (en) Method of providing a correct 3D image for a viewer at different viewing angles
CN105390515A (en) Image sensor
CN101506982B (en) Charge coupled device for obtaining a 3-dimensional digital image

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
EXSB Decision made by sipo to initiate substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant