CN104571240B - A kind of High Precision Bandgap Reference - Google Patents
A kind of High Precision Bandgap Reference Download PDFInfo
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Abstract
一种高精度带隙基准电压源。它由运算放大器OP,多个PMOS管PM与多个NMOS管NM及多个PNP三极管Q以及若干个电阻R连接组成,采用在正负温度区间内分别实行温度补偿的方法,分别在电阻和三极管上用NMOS管分流电流实现这一目的,通过在运算放大器OP和电源VCC之间引入负反馈以提高带隙基准电压源的电压抑制比,从而是带隙基准电压源获得高精度基准电压;在‑40‑120℃温度范围内具有8.20ppm/℃以下的温度系数和在低频下具83.0dB的电源电压抑制比,可广泛用于要求提供高精度参考电位的民用或军用集成电路中。
A high precision bandgap voltage reference. It consists of an operational amplifier OP, a plurality of PMOS transistors PM connected with a plurality of NMOS transistors NM, a plurality of PNP transistors Q, and several resistors R. It adopts the method of implementing temperature compensation in the positive and negative temperature ranges respectively. The NMOS tube is used to shunt the current to achieve this purpose, and the voltage rejection ratio of the bandgap reference voltage source is improved by introducing negative feedback between the operational amplifier OP and the power supply VCC, so that the bandgap reference voltage source can obtain a high-precision reference voltage; in It has a temperature coefficient below 8.20ppm/℃ in the temperature range of ‑40‑120℃ and a power supply voltage rejection ratio of 83.0dB at low frequencies. It can be widely used in civilian or military integrated circuits that require high-precision reference potentials.
Description
技术领域: Technical field:
本发明属于集成电路中的带隙基准电压源领域。 The invention belongs to the field of bandgap reference voltage sources in integrated circuits.
背景技术: Background technique:
带隙基准电压源是诸多芯片的重要组成电路之一,在需要高精度参考电位的场合有很多应用,比如:比较器、ADC和DAC等,其性能的好坏对芯片性能有很大影响。衡量带隙基准电压源性能的主要指标是温度系数和电源电压抑制比,随着技术的发展和应用的更加苛刻,带隙基准电压源的高精度性能指标要求越来越高。 The bandgap reference voltage source is one of the important components of many chips. It has many applications where high-precision reference potentials are required, such as comparators, ADCs, and DACs. Its performance has a great impact on chip performance. The main indicators to measure the performance of the bandgap reference voltage source are the temperature coefficient and the power supply voltage rejection ratio. With the development of technology and more stringent applications, the high-precision performance indicators of the bandgap reference voltage source are getting higher and higher.
现有的传统带隙基准电压源的电路结构如图2所示,它多采用一阶温度补偿方式,它是由第八PMOS管PM8、第九PMOS管PM9、第十PMOS管PM10、运算放大器OP1、第五PNP三级管Q5、第六PNP三级管Q6、第七PNP三级管Q7、第五电阻R5、第六电阻R6以及电源VCC1和接地端GND1、基准电压输出端Vref1连接成带隙基准电压源。这种结构很难在民用(-20-85℃)和军用(-40-120℃)的应用场合下达到10ppm/℃以下的温度系数,并且其电源电压抑制比特性也不理想。 The circuit structure of the existing traditional bandgap reference voltage source is shown in Figure 2. It mostly adopts the first-order temperature compensation method. It is composed of the eighth PMOS transistor PM8, the ninth PMOS transistor PM9, the tenth PMOS transistor PM10, and the operational amplifier. OP1, the fifth PNP triode Q5, the sixth PNP triode Q6, the seventh PNP triode Q7, the fifth resistor R5, the sixth resistor R6, the power supply VCC1, the ground terminal GND1, and the reference voltage output terminal Vref1 are connected to form Band Gap Voltage Reference. This structure is difficult to achieve a temperature coefficient below 10ppm/°C in civil (-20-85°C) and military (-40-120°C) applications, and its power supply voltage rejection ratio is not ideal.
发明内容: Invention content:
为了克服现有传统带隙基准电压源的温度系数和电源电压抑制比不能满足高精度应用场合要求的不足之处,本发明提出了一种高精度带隙准电压源,参见附图1,它由正温度系数产生电路1、正温度系数补偿电压产生电路2、基准电压输出电路3连接构成;由运算放大器OP、第一PMOS管PM1、第二PMOS管PM2、第三PMOS管PM3、第一NMOS管NM1、第一PNP三级管Q1、第二PNP三级管Q2、第一电阻R1、第二电阻R2、电源VCC、接地GND连接成正温度系数电流产生电路1;第四PMOS管PM4、第五PMOS管PM5、第二NMOS管NM2、第三NMOS管NM3、第三PNP三级管Q3、第三电阻R3连接成正温度系数补偿电流产生电路2;由第六PMOS管PM6、第七PMOS管PM7、第四NMOS管NM4、第五NMOS管NM5、第四个PNP三级管Q4、、第四电阻R4、基准电压输出端Vref连接成基准电压输出电路;上述三个电路之间的连接是:第一PMOS管PM1至第七PMOS管PM7的电源供接至电源VCC;第三PMOS管PM3至第七PMOS管PM7的栅极相共接;第一PNP三级管Q1至第四个PNP三级管Q4的基极、发射极相共接;正温度系数补偿电流产生电路中的第五PMOS管PM5的漏极与第二NMOS管NM2的栅极及第二电阻R2的共接点连接至基准电路输出电路3中的第四NMOS管NM4的栅极。 In order to overcome the shortcomings that the temperature coefficient and power supply voltage rejection ratio of the existing traditional bandgap reference voltage source cannot meet the requirements of high-precision applications, the present invention proposes a high-precision bandgap quasi-voltage source, see accompanying drawing 1, it It consists of a positive temperature coefficient generation circuit 1, a positive temperature coefficient compensation voltage generation circuit 2, and a reference voltage output circuit 3; it consists of an operational amplifier OP, a first PMOS transistor PM1, a second PMOS transistor PM2, a third PMOS transistor PM3, and a first The NMOS transistor NM1, the first PNP triode Q1, the second PNP triode Q2, the first resistor R1, the second resistor R2, the power supply VCC, and the ground GND are connected to form a positive temperature coefficient current generation circuit 1; the fourth PMOS transistor PM4, The fifth PMOS transistor PM5, the second NMOS transistor NM2, the third NMOS transistor NM3, the third PNP transistor Q3, and the third resistor R3 are connected to form a positive temperature coefficient compensation current generating circuit 2; the sixth PMOS transistor PM6, the seventh PMOS transistor The tube PM7, the fourth NMOS tube NM4, the fifth NMOS tube NM5, the fourth PNP triode Q4, the fourth resistor R4, and the reference voltage output terminal Vref are connected to form a reference voltage output circuit; the connection between the above three circuits Yes: the power supply of the first PMOS transistor PM1 to the seventh PMOS transistor PM7 is connected to the power supply VCC; the gates of the third PMOS transistor PM3 to the seventh PMOS transistor PM7 are connected in common; the first PNP transistor Q1 to the fourth The base and emitter of the PNP transistor Q4 are connected in common; the drain of the fifth PMOS transistor PM5 in the positive temperature coefficient compensation current generating circuit is connected to the common point of the gate of the second NMOS transistor NM2 and the second resistor R2 To the gate of the fourth NMOS transistor NM4 in the output circuit 3 of the reference circuit.
本发明一种高精度带隙基准电压源的优点是提高了电源电压抑制比,改善了温度系数,适用于高精度要求的场合。 The advantages of the high-precision bandgap reference voltage source of the present invention are that the power supply voltage rejection ratio is improved, the temperature coefficient is improved, and it is suitable for occasions requiring high precision.
附图说明: Description of drawings:
图1是本发明一种高精度带隙基准电压源电路结构图 Fig. 1 is a kind of high precision bandgap reference voltage source circuit structural diagram of the present invention
图2是现有技术传统的带隙基准电压源电路结构图 Fig. 2 is a circuit structure diagram of a conventional bandgap reference voltage source in the prior art
具体实施例:发明结合具体实施例参见附图进一步说明如下: Specific embodiments: the invention is further described as follows with reference to the accompanying drawings in conjunction with specific embodiments:
一种高精度带隙基准电压源电路结构如图1所示,它由如下几部分构成:由正温度系数电流产生电路1、正温度系数补偿电压产生电路2以及基准输出支路电路3组成。 A circuit structure of a high-precision bandgap reference voltage source is shown in Figure 1. It consists of the following parts: a positive temperature coefficient current generation circuit 1, a positive temperature coefficient compensation voltage generation circuit 2, and a reference output branch circuit 3.
正温度系数电流产生电路1由运算放大器OP,第一PMOS管PM1、第二PMOS管PM2,第一NMOS管NM1,第一PNP三极管Q1、第二PNP三极管Q2和第一电阻R1、第二电阻R2连接构成;第一PNP管Q1和第二PNP管Q2的基级均接地,以二极管方式连接,运放通过负反馈作用使A、B两点的电位相等,在第一电阻R1上产生正温度系数电压,进而产生正温度系数电流通过PMOS电流镜复制到其他支路做温度补偿之用;为了改善传统带隙基准源电源电压抑制比的不足,引入了第一NMOS管NM1和第一PMOS管PM1构成的有源负载反相放大器和第二电阻R2构成的负反馈环路来抑制电源电压的波动的影响;第一NMOS管NM1的栅极接在运算放大器OP的输出端,漏极接在第一PMOS管PM1的漏极,第一PMOS管PM1管的栅、漏共极连接于PMOS管电流镜对PM2、PM3的栅极,第二电阻R2接在第一电阻R1 和第二PMOS管PM2之间;该反馈环路的工作机理如下:当电源电压发生了改变,比如电源电压增大时,这回会引起PMOS电流镜支路的电流也增大,而A点的电位变化会因第一电阻R1的存在而大于B点,运算放大器的输出会因此而下降第一NMOS管NM1和第一PMOS管PM1组成的反相放大器之后会使第一PM1和第三PM3管的栅极电位随之升高,栅源电压的下降使支路电流也减小,实现了电源电压波动的负反馈过程,同时其强度也由于第二电阻R2的引入而变得可以灵活调节,避免了出现负反馈强度过强或过弱的问题,以上措施大大提高了带隙基准源的电源电压抑制比。 The positive temperature coefficient current generating circuit 1 is composed of an operational amplifier OP, a first PMOS transistor PM1, a second PMOS transistor PM2, a first NMOS transistor NM1, a first PNP transistor Q1, a second PNP transistor Q2, a first resistor R1, and a second resistor R2 is connected; the base stages of the first PNP transistor Q1 and the second PNP transistor Q2 are both grounded and connected in a diode manner. The operational amplifier makes the potentials of A and B points equal through negative feedback, and a positive voltage is generated on the first resistor R1. The temperature coefficient voltage, and then the positive temperature coefficient current is copied to other branches through the PMOS current mirror for temperature compensation; in order to improve the deficiency of the power supply voltage rejection ratio of the traditional bandgap reference source, the first NMOS transistor NM1 and the first PMOS are introduced. The active load inverting amplifier composed of tube PM1 and the negative feedback loop formed by the second resistor R2 suppress the influence of fluctuations in the power supply voltage; the gate of the first NMOS transistor NM1 is connected to the output terminal of the operational amplifier OP, and the drain is connected to At the drain of the first PMOS transistor PM1, the gate and drain of the first PMOS transistor PM1 are connected to the gates of the PMOS transistor current mirror pair PM2 and PM3, and the second resistor R2 is connected between the first resistor R1 and the second PMOS transistor. Between tube PM2; the working mechanism of this feedback loop is as follows: when the power supply voltage changes, for example, when the power supply voltage increases, this will cause the current of the PMOS current mirror branch to increase, and the potential change at point A will Due to the existence of the first resistor R1, it is greater than point B, and the output of the operational amplifier will therefore drop. The inverting amplifier composed of the first NMOS transistor NM1 and the first PMOS transistor PM1 will then make the gates of the first PM1 and the third PM3 transistor The potential rises accordingly, and the drop of the gate-source voltage reduces the branch current, realizing the negative feedback process of the power supply voltage fluctuation. At the same time, its strength can be flexibly adjusted due to the introduction of the second resistor R2, avoiding the occurrence of For the problem that the negative feedback strength is too strong or too weak, the above measures greatly improve the power supply voltage rejection ratio of the bandgap reference source.
正温度系数补偿电压产生电路2和基准输出支路电路3构成了本带隙基准电压源的温度补偿核心部分。正温度系数补偿电压产生电路由第四、第五PMOS管PM4、PM5,第二至第三NMOS管NM2、NM3,第三电阻R3,第三PNP三极管Q3组成;其中,第二NMOS管NM2的漏极和源极分别接在第二电阻R3的两端,栅极接在第五PMOS管PM5和第三电阻R3之间,第二NMOS管NM2的作用是分流流过第三电阻R3的PMOS电流镜复制而来的正温度系数电流,第三NMOS管NM3的漏极和源极分别接在第三PNP三极管Q3的两端,栅极接在第五PMOS管PM5和第三电阻R3之间,该NMOS管NM3的作用是分流流过PNP管Q3的正温度系数电流;基准输出支路电路由第六、第七PMOS管PM6、PM7,第四、第五NMOS管NM4、NM5,第四电阻R4,第四PNP三极管Q4连接组成;其中,第四NMOS管NM4的漏极和源极分别接在第四电阻R4的两端,栅极接在第五PMOS管PM5和第三电阻R3之间,第四NMOS管NM4的作用是分流流过第四电阻R4的正温度系数电流,第五NMOS管NM5的漏极和源极分别接在第四PNP三极管Q4的两端,栅极接在第七PMOS管PM7和第四电阻R4之间,第五NMOS管NM5的作用是分流流过第四PNP三极管Q4的正温度系数电流;本带隙基准源温度补偿核心部分的工作原理和机制如下:为了实现温度的分段线性补偿,考虑到当带隙基准源处于负温度系数占优的状态时,此时跨接在第四PNP三极管Q4两端的第五NMOS管NM5在栅极电压的控制下会漏掉相应的一部分电流,流过第四PNP三极管Q4的电流就会减小,其上的压降也会降低,由于其上的压降具有负温度系数,此时就相当于削弱了其负温度系数影响,因而使得带隙基准源的输出电压在负温度系数占优的温度区间(低温段)内的变化更为平缓,从而实现了负温度系数区间内的温度分段线性补偿。考虑到当带隙基准源处于正温度系数占优的状态时,此时跨接在第四电阻R4两端的第四NMOS管NM4在栅极电压的控制下也会分流掉一部分电流,流过第四电阻R4的正温度系数电流就会减小,因此第四电阻R4上的正温度系数电压也会因此降低,此时就相当于削弱了其正温度系数占优影响,因而使得带隙基准源的输出电压在正温度系数占优的温度区间(高温段)内的变化更为平缓,从而实现了正温度系数区间内的温度分段线性补偿。第四NMOS管NM4的栅极电压由正温度系数补偿电压产生电路提供,这是因为四NMOS管NM4是补偿高温段正温度系数占优时的分流NMOS管,当温度较高时,由于NMOS管阈值电压的降低,流过四NMOS管NM4的电流会增大很多,为了避免由此引入的高温段的负温度系数,第四NMOS管NM4的栅极控制电压必须满足如下条件:a)当电路进入正温度系数电流占优的温度区间时,第四NMOS管NM4的栅极必须有足够的电压以确保此时可以漏掉可观的电流来降低第四电阻R4上的正温度系数电压;b)进入较高温度后,第四NMOS管NM4栅极电压必须下降来保证不会漏掉过多的电流使带隙基准源呈现负的温度系数。为此,正温度系数补偿电压产生电路用于提供第四NMOS管NM4的栅极电压,其中第三电阻R3阻值较大以确保正温度系数补偿电压在低温段是足够的,同时第二NMOS管较大的宽长比会使其输出控制电压在高温段会下降,以满足条件b。采用以上分段温度补偿措施的带隙基准源具有非常好的温度特性。 The positive temperature coefficient compensation voltage generation circuit 2 and the reference output branch circuit 3 constitute the temperature compensation core part of the bandgap reference voltage source. The positive temperature coefficient compensation voltage generating circuit is composed of the fourth and fifth PMOS transistors PM4 and PM5, the second to third NMOS transistors NM2 and NM3, the third resistor R3, and the third PNP transistor Q3; wherein, the second NMOS transistor NM2 The drain and the source are respectively connected to both ends of the second resistor R3, the gate is connected between the fifth PMOS transistor PM5 and the third resistor R3, and the function of the second NMOS transistor NM2 is to shunt the PMOS flowing through the third resistor R3 The positive temperature coefficient current copied from the current mirror, the drain and source of the third NMOS transistor NM3 are respectively connected to the two ends of the third PNP transistor Q3, and the gate is connected between the fifth PMOS transistor PM5 and the third resistor R3 , the function of the NMOS transistor NM3 is to shunt the positive temperature coefficient current flowing through the PNP transistor Q3; the reference output branch circuit is composed of the sixth and seventh PMOS transistors PM6 and PM7, the fourth and fifth NMOS transistors NM4 and NM5, and the fourth The resistor R4 is connected to the fourth PNP transistor Q4; wherein, the drain and the source of the fourth NMOS transistor NM4 are respectively connected to both ends of the fourth resistor R4, and the gate is connected to the fifth PMOS transistor PM5 and the third resistor R3. Between, the function of the fourth NMOS transistor NM4 is to shunt the positive temperature coefficient current flowing through the fourth resistor R4, the drain and the source of the fifth NMOS transistor NM5 are respectively connected to both ends of the fourth PNP transistor Q4, and the gate is connected to Between the seventh PMOS transistor PM7 and the fourth resistor R4, the function of the fifth NMOS transistor NM5 is to shunt the positive temperature coefficient current flowing through the fourth PNP transistor Q4; the working principle and mechanism of the core part of the temperature compensation of the bandgap reference source are as follows : In order to realize the piecewise linear compensation of temperature, it is considered that when the bandgap reference source is in a state where the negative temperature coefficient is dominant, the control of the gate voltage of the fifth NMOS transistor NM5 connected across the fourth PNP transistor Q4 at this time A corresponding part of the current will be missed, the current flowing through the fourth PNP transistor Q4 will decrease, and the voltage drop on it will also decrease. Since the voltage drop on it has a negative temperature coefficient, it is equivalent to weakening The influence of its negative temperature coefficient makes the change of the output voltage of the bandgap reference source more gentle in the temperature range (low temperature section) where the negative temperature coefficient is dominant, thus realizing the temperature piecewise linear compensation in the negative temperature coefficient range. Considering that when the bandgap reference source is in a state where the positive temperature coefficient is dominant, the fourth NMOS transistor NM4 connected across the fourth resistor R4 will also shunt a part of the current under the control of the gate voltage, and flow through the first The positive temperature coefficient current of the four resistors R4 will decrease, so the positive temperature coefficient voltage on the fourth resistor R4 will also decrease, which is equivalent to weakening the dominant influence of its positive temperature coefficient, thus making the bandgap reference source The output voltage of the output voltage changes more smoothly in the temperature range (high temperature section) where the positive temperature coefficient is dominant, thus realizing the temperature piecewise linear compensation in the positive temperature coefficient range. The gate voltage of the fourth NMOS transistor NM4 is provided by the positive temperature coefficient compensation voltage generating circuit. This is because the four NMOS transistors NM4 are shunt NMOS transistors that compensate for the high-temperature section when the positive temperature coefficient is dominant. When the temperature is high, due to the NMOS transistor As the threshold voltage decreases, the current flowing through the four NMOS transistors NM4 will increase a lot. In order to avoid the negative temperature coefficient of the high temperature section introduced thereby, the gate control voltage of the fourth NMOS transistor NM4 must meet the following conditions: a) When the circuit When entering the temperature range where the positive temperature coefficient current is dominant, the gate of the fourth NMOS transistor NM4 must have sufficient voltage to ensure that considerable current can be leaked at this time to reduce the positive temperature coefficient voltage on the fourth resistor R4; b) After entering a higher temperature, the gate voltage of the fourth NMOS transistor NM4 must drop to ensure that too much current will not be leaked so that the bandgap reference source has a negative temperature coefficient. For this reason, the positive temperature coefficient compensation voltage generating circuit is used to provide the gate voltage of the fourth NMOS transistor NM4, wherein the resistance of the third resistor R3 is relatively large to ensure that the positive temperature coefficient compensation voltage is sufficient in the low temperature section, while the second NMOS The larger width-to-length ratio of the tube will cause its output control voltage to drop in the high temperature section, so as to meet condition b. The bandgap reference source adopting the above subsection temperature compensation measures has very good temperature characteristics.
上面设计的利用负反馈提高带隙基准源的电源电压抑制比和通过NMOS管分流实现分段温度线性补偿的方法,能非常有效改善现用带隙基准源电源电压抑制比与其温度系数方面的不足之处,具有电路简单明了,而且性能卓越,二是改善效果明显。在参照CSMC0.5μm标准下,在Cadence Spectre仿真器下本带隙基准源在低频下具有83.0dB的电源电压抑制比,在-40-120℃的温度范围内具有8.20ppm/℃的温度系数,这些仿真结果很好的验证了以上措施的有效性。 The method designed above using negative feedback to improve the power supply voltage rejection ratio of the bandgap reference source and realizing segmental temperature linear compensation through the NMOS tube shunt can effectively improve the current bandgap reference source power supply voltage rejection ratio and its temperature coefficient. The advantage is that the circuit is simple and clear, and the performance is excellent, and the second is that the improvement effect is obvious. With reference to the CSMC0.5μm standard, this bandgap reference source has a power supply voltage rejection ratio of 83.0dB at low frequencies and a temperature coefficient of 8.20ppm/℃ in the temperature range of -40-120℃ under the Cadence Specter simulator. These simulation results have well verified the effectiveness of the above measures.
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CN107272796B (en) * | 2016-04-07 | 2018-11-16 | 中芯国际集成电路制造(上海)有限公司 | A kind of band-gap reference circuit |
JP6873827B2 (en) * | 2017-01-18 | 2021-05-19 | 新日本無線株式会社 | Reference voltage generation circuit |
CN107943192A (en) * | 2018-01-05 | 2018-04-20 | 天津工业大学 | A kind of band-gap reference source circuit of superhigh precision |
CN110908426B (en) * | 2019-10-30 | 2022-04-22 | 西安空间无线电技术研究所 | A Total Dose Guard Bandgap Reference Source Circuit |
CN111831043B (en) * | 2019-11-18 | 2025-01-07 | 紫光同芯微电子有限公司 | A high-precision oscillator circuit |
CN111245432B (en) * | 2020-04-21 | 2024-06-14 | 成都启英泰伦科技有限公司 | Ring oscillator |
CN113885641B (en) * | 2021-10-26 | 2022-09-13 | 西安微电子技术研究所 | High-low temperature compensation circuit for band gap reference source |
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KR100790476B1 (en) * | 2006-12-07 | 2008-01-03 | 한국전자통신연구원 | Low Voltage Bandgap Voltage Reference Generator |
CN101216718B (en) * | 2007-12-27 | 2011-07-20 | 电子科技大学 | Piecewise linear temperature compensating circuit and temperature compensation voltage reference source |
CN101763136A (en) * | 2009-11-09 | 2010-06-30 | 天津南大强芯半导体芯片设计有限公司 | Asymmetric band-gap reference circuit |
US8461912B1 (en) * | 2011-12-20 | 2013-06-11 | Atmel Corporation | Switched-capacitor, curvature-compensated bandgap voltage reference |
CN203552114U (en) * | 2013-10-09 | 2014-04-16 | 长沙学院 | High-accuracy band-gap reference voltage source |
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