CN104483104A - Spectral response analysis system for photoelectric detector - Google Patents
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Abstract
本发明公开了一种光电探测器光谱响应分析系统。所述光电探测器光谱响应分析系统包括:可控单色光源,用于在一定波段内以连续可调的方式输出固定频率的单色光波;探测器室,用于取得参考光电探测器和待测光电探测器对所述单色光波的光谱响应信号;以及控制装置,用于控制所述可控单色光源以及探测器室,并接收光谱响应信号,以生成待测光电探测器的相对光谱响应曲线。本发明的光电探测器光谱响应分析系统改进光源设计,实现一定波段内出射光波的连续、窄带输出。从而解决现有技术方案中,因透射光波带宽较宽,造成累积效应从而测试精度低的技术问题。
The invention discloses a photodetector spectral response analysis system. The photodetector spectral response analysis system includes: a controllable monochromatic light source, which is used to output a fixed-frequency monochromatic light wave in a continuously adjustable manner within a certain wavelength band; a detector room, which is used to obtain reference photodetectors and waiting Measuring the spectral response signal of the photodetector to the monochromatic light wave; and a control device for controlling the controllable monochromatic light source and the detector chamber, and receiving the spectral response signal to generate the relative spectrum of the photodetector to be measured response curve. The spectral response analysis system of the photodetector of the invention improves the design of the light source, and realizes continuous and narrow-band output of outgoing light waves within a certain band. Therefore, in the prior art solution, the technical problem of low test accuracy due to the accumulation effect caused by the wide bandwidth of the transmitted light wave is solved.
Description
技术领域technical field
本发明涉及光电探测器技术领域,特别是涉及一种光电探测器光谱响应分析系统。The invention relates to the technical field of photodetectors, in particular to a photodetector spectral response analysis system.
背景技术Background technique
光谱响应(Spectral Response)反应光电探测器与辐照波长λ之间的关系,是光电探测器件一项基本性能参数。光电探测器作为一种感光传感器件,其对于不同波长λ的辐照光波,同样具有不同的响应特性。The spectral response (Spectral Response) reflects the relationship between the photodetector and the irradiation wavelength λ, and is a basic performance parameter of the photodetector device. As a photosensitive sensing device, the photodetector also has different response characteristics to irradiated light waves of different wavelengths λ.
对于图像传感器的光谱响应,目前多采用宽带滤光片法进行测试。从辐照光源出射的光波,经滤光片后投射到被测光电探测器上。由于滤光片的波长选择性,仅该滤光片中心波长及附近一定带宽内的光波可以透过。检测上述波长光波照射下,探测器的输出值,并对比标准探测器输出值,从而获得受试探测器在该波长下的光谱响应度。连续选取不同中心波长的滤光片,从而可获得在一个光谱波段内,探测器的光谱响应曲线。For the spectral response of the image sensor, the broadband filter method is mostly used for testing at present. The light wave emitted from the irradiating light source is projected onto the photodetector under test after passing through the filter. Due to the wavelength selectivity of the filter, only the light waves within the central wavelength of the filter and within a certain bandwidth nearby can pass through. Detect the output value of the detector under the irradiation of the light wave of the above wavelength, and compare the output value of the standard detector, so as to obtain the spectral responsivity of the tested detector at this wavelength. Continuously select filters with different central wavelengths to obtain the spectral response curve of the detector within a spectral band.
现有技术最大缺点是滤光片带宽较宽,当辐照光波透过滤光片后,透射的光波中既包含了滤光片的中心波长光波,又包括其附近的其他波长光波。例如,常用的中心波长550nm的可见光滤光片,其波长范围常在±20nm~±100nm。因此,检测获得的探测器输出是该微小波段光波的累积效果,故检测精度较低。The biggest disadvantage of the existing technology is that the bandwidth of the filter is relatively wide. When the irradiated light wave passes through the filter, the transmitted light wave includes not only the central wavelength of the filter, but also other nearby wavelengths. For example, the commonly used visible light filter with a center wavelength of 550nm usually has a wavelength range of ±20nm to ±100nm. Therefore, the detector output obtained by detection is the cumulative effect of light waves in this small wavelength band, so the detection accuracy is low.
另外,为获得光谱响应曲线,需要连续更换滤光片,并不断切换照射标准探测器和受试探测器进行对比。操作差异往往造成光斑对准的机械精度误差,从而也会对测试结果带来误差。In addition, in order to obtain the spectral response curve, it is necessary to continuously replace the optical filter, and constantly switch between the standard detector and the tested detector for comparison. Operational differences often result in errors in the mechanical precision of the light spot alignment, which will also cause errors in the test results.
因此希望有一种光电探测器光谱响应分析系统来克服或至少减轻现有技术的上述缺陷中的一个或多个。It is therefore desirable to have a photodetector spectral response analysis system that overcomes or at least alleviates one or more of the above-mentioned deficiencies of the prior art.
发明内容Contents of the invention
本发明的目的在于提供一种光电探测器光谱响应分析系统来克服或至少减轻现有技术的上述缺陷中的一个或多个。The object of the present invention is to provide a photodetector spectral response analysis system to overcome or at least alleviate one or more of the above-mentioned defects of the prior art.
为实现上述目的,本发明提供一种光电探测器光谱响应分析系统,所述光电探测器光谱响应分析系统包括:To achieve the above object, the present invention provides a photodetector spectral response analysis system, said photodetector spectral response analysis system comprising:
可控单色光源,用于在一定波段以内连续可调的方式输出固定频率的单色光波;The controllable monochromatic light source is used to output monochromatic light waves with a fixed frequency in a continuously adjustable manner within a certain wavelength band;
探测器室,其包括至少一个参考光电探测器和待测光电探测器,所述至少一个参考光电探测器和待测光电探测器用于探测所述单色光波的光谱响应信号并输出;以及a detector chamber, which includes at least one reference photodetector and a photodetector to be measured, the at least one reference photodetector and the photodetector to be measured are used to detect and output the spectral response signal of the monochromatic light wave; and
控制装置,用于提供系统电源,并控制所述可控单色光源以及探测器室,并接收光谱响应信号,以生成待测光电探测器的相对光谱响应曲线。The control device is used to provide system power, control the controllable monochromatic light source and the detector chamber, and receive a spectral response signal to generate a relative spectral response curve of the photodetector to be tested.
优选地,所述光电探测器光谱响应分析系统进一步包括准直光路,所述准直光路设置在可控单色光源和探测器室之间,用于对所述可控单色光源输出的单色光波的发散角进行调整。Preferably, the photodetector spectral response analysis system further includes a collimating optical path, the collimating optical path is arranged between the controllable monochromatic light source and the detector chamber, and is used for monochromatic output of the controllable monochromatic light source. The divergence angle of the colored light wave can be adjusted.
优选地,所述光电探测器光谱响应分析系统进一步包括阻尼隔振平台,作为光电探测器光谱响应分析系统的水平基台。Preferably, the photodetector spectral response analysis system further includes a damped vibration isolation platform as a horizontal base of the photodetector spectral response analysis system.
优选地,所述可控单色光源包括一个溴钨灯和一个氘灯。Preferably, the controllable monochromatic light source includes a bromine tungsten lamp and a deuterium lamp.
优选地,所述可控单色光源包括光学斩波器,所述光学斩波器与控制装置相连,并按照设定频率对入射光波进行斩波调制,将连续光波调制为固定频率的单色光波,并将所述固定频率输出至控制装置,用于与所述控制装置内的锁相放大器配合使用。Preferably, the controllable monochromatic light source includes an optical chopper, which is connected to the control device, and performs chopping modulation on the incident light wave according to a set frequency, and modulates the continuous light wave into a monochromatic light wave with a fixed frequency. light waves, and output the fixed frequency to the control device for use with a lock-in amplifier in the control device.
优选地,所述可控单色光源进一步包括滤光轮片,在光路上,滤光轮片位于光学斩波器的下游,用于消除多级光谱。Preferably, the controllable monochromatic light source further includes a filter wheel, and on the optical path, the filter wheel is located downstream of the optical chopper for eliminating multi-stage spectrum.
优选地,所述滤光轮片与控制装置相连,能够根据设定的光源工作波段,自动更换滤光片。Preferably, the filter wheel is connected to the control device, and can automatically replace the filter according to the set working wavelength band of the light source.
优选地,所述探测器室包括光阑和光学衰减器,用于进行入射光光强控制。Preferably, the detector chamber includes a diaphragm and an optical attenuator for controlling the intensity of incident light.
优选地,所述探测器室包括步进电机,所述步进电机由所述控制装置控制,而自动驱动执行机构切换被照射样品。Preferably, the detector chamber includes a stepping motor, the stepping motor is controlled by the control device, and the automatic driving actuator switches the samples to be irradiated.
本发明的光电探测器光谱响应分析系统改进光源设计,实现一定波段内出射光波的连续输出。从而解决现有技术方案中,因透射光波带宽较宽,造成累积效应从而测试精度低的技术问题。The spectral response analysis system of the photodetector of the present invention improves the design of the light source, and realizes the continuous output of outgoing light waves in a certain band. Therefore, in the prior art solution, the technical problem of low test accuracy due to the accumulation effect caused by the wide bandwidth of the transmitted light wave is solved.
附图说明Description of drawings
图1是根据本发明一实施例的光电探测器光谱响应分析系统的结构示意图。FIG. 1 is a schematic structural diagram of a photodetector spectral response analysis system according to an embodiment of the present invention.
图2是图1所示光电探测器光谱响应分析系统中的原理示意图。FIG. 2 is a schematic diagram of the principles of the photodetector spectral response analysis system shown in FIG. 1 .
附图标记:Reference signs:
具体实施方式Detailed ways
为使本发明实施的目的、技术方案和优点更加清楚,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行更加详细的描述。在附图中,自始至终相同或类似的标号表示相同或类似的元件或具有相同或类似功能的元件。所描述的实施例是本发明一部分实施例,而不是全部的实施例。下面通过参考附图描述的实施例是示例性的,旨在用于解释本发明,而不能理解为对本发明的限制。基于本发明中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。下面结合附图对本发明的实施例进行详细说明。In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below in conjunction with the drawings in the embodiments of the present invention. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are some, but not all, embodiments of the invention. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
图1所示的光电探测器光谱响应分析系统包括:可控单色光源1、准直光路2、探测器室3、控制装置4、阻尼隔振平台5。The photodetector spectral response analysis system shown in FIG. 1 includes: a controllable monochromatic light source 1 , a collimated optical path 2 , a detector chamber 3 , a control device 4 , and a damping vibration isolation platform 5 .
可控单色光源1用于输出波长在一定波段内连续可调的固定频率的单色光波。准直光路2设置在所述可控单色光源1和探测器室3之间,用于调整所述单色光波的发散角,使其使出射光束为平行均匀光束。探测器室3用于探测参考探测器和待测光电探测器对所述单色光波的光谱响应。控制装置4用于控制可控单色光源1、准直光路2、探测器室3,并接收光谱响应信号,以生成待测光电探测器的相对光谱响应曲线。阻尼隔振平台5作为系统水平基台,用于承载所述可控单色光源1和探测器室3,并隔离震动对光学系统的影响。The controllable monochromatic light source 1 is used to output a fixed-frequency monochromatic light wave whose wavelength is continuously adjustable within a certain wavelength band. The collimating optical path 2 is arranged between the controllable monochromatic light source 1 and the detector chamber 3, and is used to adjust the divergence angle of the monochromatic light wave so that the outgoing beam is a parallel and uniform beam. The detector chamber 3 is used to detect the spectral response of the reference detector and the photodetector to be tested to the monochromatic light wave. The control device 4 is used for controlling the controllable monochromatic light source 1, the collimating light path 2, and the detector chamber 3, and receiving the spectral response signal to generate a relative spectral response curve of the photodetector to be tested. The damping and vibration-isolation platform 5 is used as a system horizontal base for carrying the controllable monochromatic light source 1 and the detector chamber 3, and isolating the impact of vibration on the optical system.
可控单色光源1是光电探测器光谱响应分析系统的核心之一,其包括至少一个覆盖一定辐照光波波长范围的光源;本发明一具体实施例中可控单色光源1的设计原理如图2所示。本实施例中,可控单色光源1主要包括9个部分:光源控制器11、反射镜12、75W溴钨灯13、30W氘灯14、光学斩波器15、滤光轮片16、准直凹面镜17、成像凹面镜18和平面反射光栅19。The controllable monochromatic light source 1 is one of the cores of the photodetector spectral response analysis system, which includes at least one light source covering a certain irradiated light wavelength range; the design principle of the controllable monochromatic light source 1 in a specific embodiment of the present invention is as follows: Figure 2 shows. In this embodiment, the controllable monochromatic light source 1 mainly includes 9 parts: a light source controller 11, a reflector 12, a 75W bromine tungsten lamp 13, a 30W deuterium lamp 14, an optical chopper 15, a filter wheel 16, a quasi- Straight concave mirror 17, imaging concave mirror 18 and plane reflective grating 19.
光源控制器11通过电源和数据线缆与控制装置4相连,接收用户数据输出控制信号,用于控制选择所述75W溴钨灯13和30W氘灯14中的一个作为光源,并控制所选择光源输出的光强。具体地,可通过控制光源的供电电流,来控制光源的光强。电流强度可在所选光源的额定最大电流和最小工作电流中进行调节。The light source controller 11 is connected to the control device 4 through a power supply and a data cable, receives user data and outputs a control signal for controlling and selecting one of the 75W bromine tungsten lamp 13 and the 30W deuterium lamp 14 as a light source, and controlling the selected light source output light intensity. Specifically, the light intensity of the light source can be controlled by controlling the power supply current of the light source. The current intensity can be adjusted between the rated maximum current and the minimum operating current of the selected light source.
75W溴钨灯13的输出辐照光波波长范围在可见光波段和近红外波段(通常为400nm至2500nm)。30W氘灯14的输出辐照光波波长范围在紫外波段(通常为190nm至400nm)。75W溴钨灯13和30W氘灯14均在光源控制器11控制下工作,上述光源辐照光波波长可覆盖190nm至2500nm。可以理解的是,光源种类不限制于上述种类和数量,可根据需要进行选择和替换。The wavelength range of the irradiated light output by the 75W bromine tungsten lamp 13 is in the visible light band and the near infrared band (usually 400nm to 2500nm). The output radiation wavelength range of the 30W deuterium lamp 14 is in the ultraviolet band (usually 190nm to 400nm). Both the 75W bromine tungsten lamp 13 and the 30W deuterium lamp 14 work under the control of the light source controller 11, and the wavelength of light irradiated by the above light sources can cover 190nm to 2500nm. It can be understood that the types and quantities of the light sources are not limited to the above types and quantities, and can be selected and replaced as required.
所述光源的出射光经反射镜12反射后被改变光路以传播至光学斩波器15。The outgoing light of the light source is reflected by the reflector 12 and then changes the optical path to propagate to the optical chopper 15 .
光学斩波器15也通过线缆与控制装置4相连,接收控制装置4的控制信号,并按照用户设定频率对入射光波进行斩波调制,将连续光波调制为固定频率的光波,并将所述固定频率输出至控制装置4,用于与控制装置4内的锁相放大器配合使用。The optical chopper 15 is also connected to the control device 4 through a cable, receives the control signal of the control device 4, and performs chopping modulation on the incident light wave according to the frequency set by the user, modulates the continuous light wave into a light wave with a fixed frequency, and converts the The fixed frequency is output to the control device 4 for use in cooperation with the lock-in amplifier in the control device 4.
调制后的光波依次经过滤光轮片16和入射狭缝,进入后续分光光路。此处滤光轮片16主要用于消除多级光谱。滤光轮片16与控制装置4通过数据线缆相连,可根据控制装置4输出的用户设定的光源工作波段,自动更换滤光片。滤光轮片是由不同滤光片(中心波长和带宽不同)组成的一个滤光片组合,可根据测试时对入射光波长的设定,自动或手动选取相应滤光片,旋转并覆盖到通光孔径上,消除出射光波中的多级光谱。The modulated light waves sequentially pass through the filter wheel 16 and the incident slit, and then enter the subsequent light splitting path. Here the filter wheel 16 is mainly used to eliminate multi-level spectrum. The filter wheel 16 is connected to the control device 4 through a data cable, and can automatically replace the filter according to the user-set light source working band output by the control device 4 . The filter wheel is a filter combination composed of different filters (with different central wavelengths and bandwidths). According to the setting of the incident light wavelength during the test, the corresponding filter can be automatically or manually selected, rotated and covered to On the clear aperture, the multi-order spectrum in the outgoing light wave is eliminated.
光波经过滤光轮片16后,经入射狭缝进入到分光装置。分光装置采用经典Czerny-Turner(切尼-特纳)光路结构,由准直凹面镜17、平面反射光栅19、成像凹面镜18等组成。入射狭缝位于准直凹面镜17的焦平面,通过入射狭缝的光波经准直凹面17反射,形成平行光束投射到平面反射光栅19上。经平面反射光栅19色散和成像凹面镜18反射,最终在出射狭缝上获得单色光波信号。After passing through the filter wheel 16, the light wave enters the spectroscopic device through the incident slit. The beam splitting device adopts the classic Czerny-Turner (Czerny-Turner) optical path structure, which is composed of a collimating concave mirror 17, a plane reflection grating 19, and an imaging concave mirror 18, etc. The incident slit is located at the focal plane of the collimating concave mirror 17 , and light waves passing through the incident slit are reflected by the collimating concave surface 17 to form parallel beams and projected onto the plane reflective grating 19 . After being dispersed by the plane reflective grating 19 and reflected by the imaging concave mirror 18, the monochromatic light wave signal is finally obtained on the exit slit.
入射光波通过上述由准直凹面镜17、平面反射光栅19、成像凹面镜18等组成的分光装置后,会分解成不同波长的单色光波,并形成一定波段内的连续光谱。所述入射狭缝和出射狭缝的狭缝宽度与谱线宽度成正比,狭缝宽度越小,光波中谱线宽度越小,光波单色性越好。After the incident light wave passes through the spectroscopic device composed of collimating concave mirror 17, planar reflection grating 19, imaging concave mirror 18, etc., it will be decomposed into monochromatic light waves of different wavelengths and form a continuous spectrum within a certain band. The slit width of the incident slit and the exit slit is directly proportional to the spectral line width, the smaller the slit width, the smaller the spectral line width in the light wave, and the better the monochromaticity of the light wave.
可控单色光源1输出的光波信号,通过出射狭缝,进入到准直光路2。准直光路2主要用于控制光信号发散角,利于后续光路传输。具体地,出射光束从出射狭缝中射出,具有一定发散角,当传播路径长时,会使光束发散、束宽变大,光强变弱。而加入准直光路后,可减小发散角,使之在一定光程内,保持平行均匀光束输出,利于光路传输。The light wave signal output by the controllable monochromatic light source 1 enters the collimated optical path 2 through the exit slit. The collimating optical path 2 is mainly used to control the divergence angle of the optical signal, which is beneficial to subsequent optical path transmission. Specifically, the outgoing light beam is emitted from the outgoing slit with a certain divergence angle. When the propagation path is long, the light beam will diverge, the beam width will become larger, and the light intensity will become weaker. After adding the collimated optical path, the divergence angle can be reduced, so that within a certain optical path, the parallel and uniform beam output can be maintained, which is beneficial to the optical path transmission.
探测器室3也是光电探测器光谱响应分析系统的核心组成部分。探测器室3主要包括:光阑31、光学衰减器32、半透半反镜33、监视光路34、第一参考探测器样品台35、第二参考探测器样品台36、待测光学探测器样品台37、精密步进电机38、精密水平导轨39、整体暗箱310。The detector chamber 3 is also the core component of the photodetector spectral response analysis system. The detector chamber 3 mainly includes: an aperture 31, an optical attenuator 32, a half mirror 33, a monitoring optical path 34, a first reference detector sample stage 35, a second reference detector sample stage 36, an optical detector to be tested Sample table 37 , precision stepping motor 38 , precision horizontal guide rail 39 , and overall dark box 310 .
可选地,所述第一参考探测器样品台35上可为参考Si探测器,所述第二参考探测器样品台36上可为参考InGaSn探测器;如果待测光学探测器是用半导体Si材料制做,则与参考Si探测器进行比较;如果采用InGaSn材料制作,则选择参考InGaSn探测器作为参考对象。Optionally, the first reference detector sample stage 35 can be a reference Si detector, and the second reference detector sample stage 36 can be a reference InGaSn detector; if the optical detector to be tested is made of semiconductor Si If it is made of InGaSn material, then compare it with the reference Si detector; if it is made of InGaSn material, then select the reference InGaSn detector as the reference object.
整体暗箱310为系统提供光学暗室,其内部涂覆黑色吸光材料,用于吸收光反射、散射。另外,整体暗箱310提供光学、电学安装接口。整体暗箱310的正面开有操作门,内部有照明灯,用于样品装卸和设备调试,测试时应关闭照明灯和操作门,保持箱内密闭不透光。The overall dark box 310 provides an optical dark room for the system, and its interior is coated with a black light-absorbing material for absorbing light reflection and scattering. In addition, the integral dark box 310 provides optical and electrical installation interfaces. There is an operation door on the front of the integral obscura 310, and there is a light inside, which is used for sample loading and unloading and equipment debugging. During the test, the light and the operation door should be turned off to keep the inside of the box airtight and opaque.
单色光波通过准直光路2进入整体暗箱310后,经全反镜反射改变光路,先后进入光阑31和光学衰减器32,上述两个元件用于进行入射光光强控制。After the monochromatic light wave enters the overall obscura 310 through the collimated optical path 2, it is reflected by the total mirror to change the optical path, and enters the diaphragm 31 and the optical attenuator 32 successively. The above two components are used to control the intensity of incident light.
光阑是带有光孔的光学元件。一般成圆形薄片状,其中央有通光孔径,且孔径大小通过旋钮可调。通过缩放通光孔径实现光强的调节。如通光孔径大则通过的光强强,反之则弱。A diaphragm is an optical element with a light hole. Generally, it is in the shape of a circular sheet with a clear aperture in the center, and the aperture size can be adjusted by the knob. The light intensity can be adjusted by zooming the clear aperture. If the clear aperture is large, the light passing through is strong, otherwise it is weak.
光学衰减器是一种具有固定衰减倍率的光学元件。An optical attenuator is an optical component with a fixed attenuation ratio.
通过上述两个部件,主要是根据需要,对入射光光强进行衰减,以防止光强过强,使光电探测器的的光生电子一直处于饱和状态。Through the above two components, the light intensity of the incident light is attenuated mainly according to needs, so as to prevent the light intensity from being too strong, so that the photogenerated electrons of the photodetector are always in a saturated state.
经过衰减的单色光束通过半反半透镜33,透射光束直接投射到样品台。样品台包括:第一参考探测器样品台35、第二参考探测器样品台36、待测光学探测器样品台37。需要指出的是,根据待测光电探测器材料特性和所探测的波段,选用参考探测器。The attenuated monochromatic light beam passes through the half mirror 33, and the transmitted light beam is directly projected onto the sample stage. The sample stage includes: a first reference detector sample stage 35 , a second reference detector sample stage 36 , and an optical detector sample stage 37 to be tested. It should be pointed out that the reference detector is selected according to the material characteristics of the photodetector to be tested and the detected wavelength band.
本发明中,所测数据为相对光谱响应,即在同一光强、同一波长单色光波照射下,被测光电探测器的输出信号与参考光电探测器(注:需经过国家标准机构的检定校准,已准确获得其绝对光谱响应曲线)输出信号之间进行对比,获得其相对值。因此测试时,需根据待测光电传感器的材料特性(如Si探测器、InGaSn探测器),选定一种参考光电探测器,然后在同一条件下,先后照射参考探测器和待测探测器,从而取得其相对值。In the present invention, the measured data is the relative spectral response, that is, under the same light intensity and monochromatic light wave irradiation of the same wavelength, the output signal of the photodetector under test and the reference photodetector (note: it needs to be verified and calibrated by the national standard organization) , have accurately obtained its absolute spectral response curve) and compare the output signals to obtain its relative value. Therefore, when testing, it is necessary to select a reference photodetector according to the material characteristics of the photoelectric sensor to be tested (such as Si detector, InGaSn detector), and then under the same conditions, successively irradiate the reference detector and the detector to be tested. to obtain its relative value.
例如,待测光学探测器样品台37如果为Si基光电探测器,则与标准的参考Si探测器对比;同理如果为InGaSn基光电探测器,则与标准参考InGaSn探测器对比。还需要指出的是,标准参考光电探测器件,不仅限于上述材料和种类,可根据需要进行选择,但均需事先进行标定。光电探测器样品均夹持于样品台,安装于精密水平导轨39上,受精密步进电机38控制,可在水平方向电控往返移动。垂直方向上,手动操作粗调/微调旋钮,可调节样品高度。For example, if the optical detector sample stage 37 to be tested is a Si-based photodetector, it is compared with a standard reference Si detector; similarly, if it is an InGaSn-based photodetector, it is compared with a standard reference InGaSn detector. It should also be pointed out that the standard reference photodetector device is not limited to the above-mentioned materials and types, and can be selected according to needs, but all need to be calibrated in advance. The photodetector samples are all clamped on the sample stage, installed on the precision horizontal guide rail 39, controlled by the precision stepping motor 38, and can be electrically controlled to move back and forth in the horizontal direction. In the vertical direction, manually operate the coarse/fine adjustment knob to adjust the height of the sample.
测试前,需进行光学对准。打开探测器室操作门和箱内照明灯。环境光及单色光斑通过半反半透镜的反射面反射,进入监测光路。监测光路包含CCD相机和镜头组件,实时采集光斑和样品图像,可通过数据线缆输出至采集控制装置实时显示。用户可根据实时图像,控制电机进行水平方向移动,并手动调节垂直高度,使单色光光斑垂直投射到光电探测器上,并覆盖光电探测器感光区域。高度调节完毕后锁定调节旋钮,关闭箱内照明灯和操作门。一旦光学对准完毕,则参考探测器样品台和受试探测器样品台水平间距L确定,如精密步进电机步长为m,则电机步进数目n以下式计算:Optical alignment is required prior to testing. Open the operating door of the detector room and the lighting inside the box. Ambient light and monochromatic light spots are reflected by the reflective surface of the half-mirror and enter the monitoring light path. The monitoring optical path includes a CCD camera and lens assembly, which collects spot and sample images in real time, which can be output to the collection control device for real-time display through data cables. According to the real-time image, the user can control the motor to move in the horizontal direction, and manually adjust the vertical height, so that the monochromatic light spot is vertically projected onto the photodetector and covers the photosensitive area of the photodetector. After the height adjustment is completed, lock the adjustment knob, close the lighting inside the box and the operation door. Once the optical alignment is completed, the horizontal distance L between the reference detector sample stage and the tested detector sample stage is determined. If the step size of the precision stepping motor is m, the number of motor steps n is calculated by the following formula:
n=L/m。n=L/m.
测试时,由控制装置操作步进电机实现水平方向L距离的往复移动,实现被照射的样品的切换,从而获得下述数据:During the test, the stepper motor is operated by the control device to realize the reciprocating movement of the distance L in the horizontal direction, and realize the switching of the irradiated samples, so as to obtain the following data:
有光照情况下待测光电探测器的电流输出Is_light(λ)、无光照情况下待测光电探测器的电流输出Is_dark(λ)、有光照情况下参考光电探测器的电流输出Ir_light(λ)和无光照情况下参考光电探测器的电流输出Ir_dark(λ)。The current output I s_light (λ) of the photodetector to be tested under the condition of illumination, the current output I s_dark (λ) of the photodetector to be tested under the condition of no illumination, the current output I r_light ( λ) and the current output I r_dark (λ) of the reference photodetector in the absence of light.
本发明的光电探测器光谱响应分析系统集成电控样品台和光学监视系统,实现样品切换和电控对焦,从而减小手动操作带来的机械精度误差,及其对测试结果的不利影响。The photodetector spectral response analysis system of the present invention integrates an electronically controlled sample stage and an optical monitoring system to realize sample switching and electronically controlled focusing, thereby reducing mechanical precision errors caused by manual operations and their adverse effects on test results.
控制装置4用于控制可控单色光源1、准直光路2、探测器室3,并接收光谱响应信号,以生成待测光电探测器的相对光谱响应曲线。控制装置4在一个实施例中的实现形式为控制机柜,由稳压电源模块、锁相放大器、工控机组成。稳压电源模块为可控单色光源1、探测器室3及控制装置4内各个部件供电。锁相放大器采集参考光电探测器光生电流输出以及待测光电探测器光生电流,应参考光学斩波信号,进行锁相和信号放大,其采集和数字化的结果提交工控机进行换算和曲线绘制。工控机同时通过UART、USB、Ethernet等接口同可控单色光源、探测器室内各部件相连。发送控制信号,接收图像数据。并提供用户界面,用于系统参数设定、数据显示、图表绘制等。The control device 4 is used for controlling the controllable monochromatic light source 1, the collimating light path 2, and the detector chamber 3, and receiving the spectral response signal to generate a relative spectral response curve of the photodetector to be tested. In one embodiment, the control device 4 is realized in the form of a control cabinet, which is composed of a regulated power supply module, a lock-in amplifier, and an industrial computer. The stabilized power supply module supplies power to the controllable monochromatic light source 1 , the detector chamber 3 and each component in the control device 4 . The lock-in amplifier collects the photogenerated current output of the reference photodetector and the photogenerated current of the photodetector to be tested. It should refer to the optical chopper signal for phase locking and signal amplification. The collected and digitized results are submitted to the industrial computer for conversion and curve drawing. At the same time, the industrial computer is connected with the controllable monochromatic light source and various components in the detector chamber through UART, USB, Ethernet and other interfaces. Send control signals and receive image data. And provide a user interface for system parameter setting, data display, chart drawing, etc.
阻尼隔振平台5作为整个系统的水平基台。阻尼隔振平台5提供水平基准和安装固定机构,并隔离和减少震动对系统测试的影响。The damping vibration isolation platform 5 is used as the horizontal base of the whole system. The damping vibration isolation platform 5 provides a horizontal reference and a fixed mechanism for installation, and isolates and reduces the impact of vibration on system testing.
本发明技术方案带来如下有益效果。光源波长连续可选,单色光波带宽小。利用多种光源和分光装置,取得了190nm至2500nm波长范围类的连续波谱分布,中心波长准确度可达±0.25nm,分辨率可达0.4nm,远远优于单色滤光片的测试方案。The technical solution of the present invention brings the following beneficial effects. The wavelength of the light source is continuously optional, and the bandwidth of the monochromatic light is small. Using a variety of light sources and spectroscopic devices, a continuous wave spectrum distribution in the wavelength range from 190nm to 2500nm has been obtained, the center wavelength accuracy can reach ±0.25nm, and the resolution can reach 0.4nm, which is far superior to the monochromatic filter test scheme. .
被测样品被夹持在样品台,可通过精密步进电机和执行机构在水平维度进行往复移动,测试时可自动切换被照射样品,替代手工操作,执行效率和精度大幅提高。The sample to be tested is clamped on the sample stage, and can be reciprocated in the horizontal dimension by a precision stepping motor and an actuator. During the test, the sample to be irradiated can be automatically switched, replacing manual operation, and the execution efficiency and accuracy are greatly improved.
数据采集结果实时显示和计算,参数曲线实时绘制,波段扫描完毕即可获得计算结果和曲线分布,分析效率大幅提高。The data acquisition results are displayed and calculated in real time, and the parameter curves are drawn in real time. The calculation results and curve distribution can be obtained after the band scanning is completed, and the analysis efficiency is greatly improved.
需要指出的是,可控单色光源1中的光源,其波长、功率、数量等参数可根据测试需要自行选择。如测试红外光电探测器时,则选用红外波段光源。标准参考光电探测器件,不仅限于上述材料和种类,可根据测试波段和探测器材料自行选择,但均需事先进行标定。系统中电源/控制模块与用户PC间的数据交互方式,可以通过UART/USB/Ethernet/光纤等接口形式实现。It should be pointed out that the wavelength, power, quantity and other parameters of the light source in the controllable monochromatic light source 1 can be selected according to the test needs. For example, when testing infrared photodetectors, the infrared band light source is selected. Standard reference photodetectors are not limited to the above materials and types, and can be selected according to the test wavelength band and detector material, but all need to be calibrated in advance. The data interaction between the power supply/control module and the user's PC in the system can be realized through interfaces such as UART/USB/Ethernet/optical fiber.
本发明的光电探测器光谱响应分析系统的测试原理如下。光电探测器件在波长为λ,光照强度为E(λ)的光波照射下,产生电流输出I(λ),则此时绝对光谱响应s(λ)为:The test principle of the photodetector spectral response analysis system of the present invention is as follows. The photodetector device produces a current output I(λ) under the irradiation of light waves with a wavelength of λ and an illumination intensity of E(λ), then the absolute spectral response s(λ) at this time is:
实际测试中为了测试精确,常采集一次无光照情况下光电探测器的输出Idark(λ),再采集一次光照情况下的输出Ilight(λ),并采用两者的差值△I(λ)=Ilight(λ)-Idark(λ)作为实际有效输出。In the actual test, in order to test accurately, the output I dark (λ) of the photodetector under the condition of no light is often collected once, and the output I light (λ) under the condition of light is collected again, and the difference between the two is used △I(λ )=I light (λ)-I dark (λ) as the actual effective output.
为了使用方便,常对绝对光谱响应进行归一化处理:For convenience, the absolute spectral response is often normalized:
其中
对于参考光电探测器(注:需经过国家专门计量单位提前标定,获得其光谱响应曲线),其绝对光谱响应曲线可表示为:For the reference photodetector (note: it needs to be calibrated by a national special measurement unit in advance to obtain its spectral response curve), its absolute spectral response curve can be expressed as:
Sr(λ)=κr·sr(λ),S r (λ) = κ r s r (λ),
对于待测光电探测器,其绝对光谱响应曲线可表示为:For the photodetector to be tested, its absolute spectral response curve can be expressed as:
Ss(λ)=κs·ss(λ),S s (λ) = κ s s s (λ),
则可知:Then we can know:
其中而参考光电探测器的Sr(λ)已知,则可通过测量Is_light(λ)、Is_dark(λ)、Ir_light(λ)、Ir_dark(λ),即可获得待测光电探测器的相对光谱响应曲线。in While the S r (λ) of the reference photodetector is known, the photodetector to be tested can be obtained by measuring I s_light (λ), I s_dark (λ), I r_light (λ), and I r_dark (λ). relative spectral response curve.
最后需要指出的是:以上实施例仅用以说明本发明的技术方案,而非对其限制。尽管参照前述实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。Finally, it should be pointed out that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that: they can still modify the technical solutions described in the aforementioned embodiments, or perform equivalent replacements for some of the technical features; and these The modification or replacement does not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.
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CN112904089A (en) * | 2021-01-18 | 2021-06-04 | 桂林电子科技大学 | Optical dielectric response tester and test method for optical dielectric material |
CN113865829A (en) * | 2021-10-12 | 2021-12-31 | 中国电子科技集团公司第四十四研究所 | Multichannel light focusing device for parameter test of photoelectric detector |
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