CN103823175B - A kind of photodetection circuit frequency response function test method based on OTDR - Google Patents
A kind of photodetection circuit frequency response function test method based on OTDR Download PDFInfo
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- CN103823175B CN103823175B CN201410012090.6A CN201410012090A CN103823175B CN 103823175 B CN103823175 B CN 103823175B CN 201410012090 A CN201410012090 A CN 201410012090A CN 103823175 B CN103823175 B CN 103823175B
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- 238000010998 test method Methods 0.000 title claims abstract description 27
- 238000000253 optical time-domain reflectometry Methods 0.000 title claims abstract description 19
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- 238000001228 spectrum Methods 0.000 claims abstract description 41
- 230000003287 optical effect Effects 0.000 claims abstract description 40
- 238000012360 testing method Methods 0.000 claims abstract description 31
- 239000013307 optical fiber Substances 0.000 claims abstract description 30
- 238000001514 detection method Methods 0.000 claims abstract description 27
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- 230000005622 photoelectricity Effects 0.000 description 2
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CN112099037B (en) * | 2020-09-17 | 2023-11-10 | 上海波汇科技有限公司 | Target detection method and device based on FMCW laser radar Gao Dian cloud acquisition |
CN112858805B (en) * | 2020-12-29 | 2023-02-28 | 西南技术物理研究所 | Frequency response characteristic parameter measuring device for quadrant photoelectric detector |
CN113091795B (en) | 2021-03-29 | 2023-02-28 | 上海橙科微电子科技有限公司 | Method, system, device and medium for measuring photoelectric device and channel |
CN114112006B (en) * | 2021-11-26 | 2024-08-16 | 中科传启(苏州)科技有限公司 | Noise monitoring method and device and electronic equipment |
CN115347952B (en) * | 2022-10-19 | 2023-01-31 | 高勘(广州)技术有限公司 | Optical path testing method, device, equipment and storage medium |
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JPH03134536A (en) * | 1989-10-19 | 1991-06-07 | Yokogawa Electric Corp | Measuring apparatus of frequency characteristic |
JP2871547B2 (en) * | 1995-09-08 | 1999-03-17 | 日本電気株式会社 | Optical spectrum analyzer apparatus and optical amplifier control method |
CN101793533A (en) * | 2010-03-12 | 2010-08-04 | 上海华魏光纤传感技术有限公司 | Optical fiber radiation sensing system and sensing method thereof |
CN102539983A (en) * | 2011-11-21 | 2012-07-04 | 西南技术物理研究所 | High and low temperature test system for multi-quadrant photoelectric detectors |
CN103389453A (en) * | 2012-05-10 | 2013-11-13 | 鸿富锦精密工业(深圳)有限公司 | Photovoltaic conversion chip testing device and method |
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Address after: 201203 room 177, No. 203 blue wave road, Zhangjiang hi tech park, Shanghai Applicant after: SHANGHAI BANDWEAVER TECHNOLOGIES CO., LTD. Applicant after: Pinghu Bohui Communication Technology Co., Ltd. Address before: 201203, Shanghai Pudong New Area Zhangjiang hi tech park, No. 177 blue wave road, B District, 2 floor Applicant before: Shanghai Bohui Communication Technology Co., Ltd. Applicant before: Pinghu Bohui Communication Technology Co., Ltd. |
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Address after: Room 103, Building 299, Zhongchen Road, Songjiang District, Shanghai, 20113 Co-patentee after: Pinghu Bohui Communication Technology Co., Ltd. Patentee after: Shanghai Bohui Technology Co., Ltd. Address before: Room 203, 177 Bibo Road, Zhangjiang High-tech Park, Shanghai, 201203 Co-patentee before: Pinghu Bohui Communication Technology Co., Ltd. Patentee before: Shanghai Bandweaver Technology Co., Ltd. |