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CN103646934B - First plate for two times and lose metal frame subtraction afterwards and bury chip and just filling flat leg structure and processing method - Google Patents

First plate for two times and lose metal frame subtraction afterwards and bury chip and just filling flat leg structure and processing method Download PDF

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Publication number
CN103646934B
CN103646934B CN201310645302.XA CN201310645302A CN103646934B CN 103646934 B CN103646934 B CN 103646934B CN 201310645302 A CN201310645302 A CN 201310645302A CN 103646934 B CN103646934 B CN 103646934B
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metal substrate
photoresistance film
metal
back side
photoresist film
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CN103646934A (en
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梁志忠
梁新夫
王亚琴
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JCET Group Co Ltd
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Jiangsu Changjiang Electronics Technology Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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Abstract

本发明涉及一种二次先镀后蚀金属框减法埋芯片正装平脚结构及工艺方法,所述结构包括金属基板框(1),所述金属基板框(1)内部设置有基岛(2)和引脚(3),所述引脚(3)呈台阶状,所述基岛(2)背面与引脚(3)的台阶面齐平,所述引脚(3)的台阶面上设置有金属层(4),所述基岛(2)背面正装有芯片(6),所述芯片(6)表面与金属层(4)表面之间通过金属线(7)相连接,所述金属基板框(1)内部区域填充有塑封料(8),所述塑封料(8)正面与引脚(3)台阶面齐平,所述塑封料(8)背面与金属基板框(1)背面齐平,所述基岛(2)正面、引脚(3)的正面和背面以及金属基板框(1)的正面和背面设置有抗氧化层(9)。本发明的有益效果是:它能够解决传统金属引线框无法埋入物件而限制金属引线框的功能性和应用性能。

The present invention relates to a structure and a process method of a metal frame subtraction embedded chip after plating first and then etching. The structure includes a metal substrate frame (1), and a base island (2) is arranged inside the metal substrate frame (1). ) and the pin (3), the pin (3) is stepped, the back of the base island (2) is flush with the stepped surface of the pin (3), and the stepped surface of the pin (3) A metal layer (4) is provided, and a chip (6) is mounted on the back of the base island (2), and the surface of the chip (6) is connected to the surface of the metal layer (4) through a metal wire (7). The inner area of the metal substrate frame (1) is filled with plastic encapsulant (8), the front of the plastic encapsulant (8) is flush with the stepped surface of the pin (3), and the back of the plastic encapsulant (8) is flush with the metal substrate frame (1) The back is flush, and the front and back of the base island (2), the front and back of the pin (3), and the front and back of the metal substrate frame (1) are provided with an anti-oxidation layer (9). The beneficial effect of the invention is that it can solve the problem that the traditional metal lead frame cannot be embedded in objects and limits the functionality and application performance of the metal lead frame.

Description

二次先镀后蚀金属框减法埋芯片正装平脚结构及工艺方法The structure and process method of the front-mounted flat feet of the metal frame subtraction embedded chip after the second plating

技术领域 technical field

本发明涉及一种二次先镀后蚀金属框减法埋芯片正装平脚结构及工艺方法,属于半导体封装技术领域。 The invention relates to a structure and a process method of a front-mounted flat leg structure and a process method of a metal frame subtraction embedded chip after plating first and then etching, and belongs to the technical field of semiconductor packaging.

背景技术 Background technique

传统的四面扁平无引脚金属引线框结构主要有两种: There are two main types of conventional four-sided flat leadless metal leadframe structures:

一种是四面扁平无引脚封装(QFN)引线框,这种结构的引线框由铜材金属框架与耐高温胶膜组成(如图22所示); One is the four-sided flat no-lead package (QFN) lead frame, which is composed of a copper metal frame and a high-temperature resistant adhesive film (as shown in Figure 22);

一种是预包封四面扁平无引脚封装(PQFN)引线框,这种结构的引线框结构包括引脚与基岛,引脚与基岛之间的蚀刻区域填充有塑封料(如图23所示)。 One is a pre-encapsulated four-sided flat no-lead package (PQFN) lead frame. The lead frame structure of this structure includes pins and base islands, and the etched area between the pins and the base island is filled with plastic encapsulant (as shown in Figure 23 shown).

上述传统金属引线框存在以下缺点: The above conventional metal lead frame has the following disadvantages:

1、传统金属引线框作为装载芯片的封装载体,本身不具备系统功能,从而限制了传统金属引线框封装后的集成功能性与应用性能; 1. The traditional metal lead frame, as the packaging carrier for loading chips, does not have system functions, which limits the integrated functionality and application performance of the traditional metal lead frame after packaging;

2、由于传统金属引线框本身不具备系统功能,只能在引线框正面进行芯片及组件的平铺或者堆叠封装,而功率器件与控制芯片封装在同一封装体内,功率器件的散热会影响控制芯片信号的传输; 2. Since the traditional metal lead frame itself does not have system functions, chips and components can only be tiled or stacked on the front of the lead frame. However, the power device and the control chip are packaged in the same package, and the heat dissipation of the power device will affect the control chip. transmission of signals;

3、由于传统金属引线框本身不具备系统功能,所以多功能系统集成模块只能在传统金属引线框正面通过多芯片及组件的平铺或堆叠而实现,相应地也就增大元器件模块在PCB上所占用的空间。 3. Since the traditional metal lead frame itself does not have system functions, the multi-functional system integration module can only be realized by tiling or stacking multiple chips and components on the front of the traditional metal lead frame, which correspondingly increases the number of component modules in the system. space occupied on the PCB.

发明内容 Contents of the invention

本发明的目的在于克服上述不足,提供一种二次先镀后蚀金属框减法埋芯片正装平脚结构及工艺方法,它能够解决传统金属引线框缺乏系统功能的问题。 The purpose of the present invention is to overcome the above-mentioned disadvantages, and provide a structure and process method of first plating and then etching the metal frame subtractive embedded chip front-mounted flat feet, which can solve the problem of lack of system functions in traditional metal lead frames.

本发明的目的是这样实现的:一种二次先镀后蚀金属框减法埋芯片正装平脚结构,它包括金属基板框,所述金属基板框内部设置有基岛和引脚,所述引脚呈台阶状,所述基岛和引脚的正面与金属基板框正面齐平,所述引脚的背面与金属基板框的背面齐平,所述基岛背面与引脚的台阶面齐平,所述引脚的台阶面上设置有金属层,所述基岛背面通过导电或不导电粘结物质正装有芯片,所述芯片表面与金属层表面之间通过金属线相连接,所述金属基板框内部区域填充有塑封料,所述塑封料正面与引脚台阶面齐平,所述塑封料背面与金属基板框背面齐平,所述基岛正面、引脚的正面和背面以及金属基板框的正面和背面设置有金属抗氧化层或是披覆抗氧化剂(OSP)。 The object of the present invention is achieved in the following way: a metal frame subtractive embedded chip is mounted on a flat foot structure after secondary plating, which includes a metal substrate frame, and base islands and pins are arranged inside the metal substrate frame, and the lead The feet are stepped, the front of the base island and the pin are flush with the front of the metal substrate frame, the back of the pin is flush with the back of the metal substrate frame, and the back of the base island is flush with the stepped surface of the pin , the step surface of the pin is provided with a metal layer, the back of the base island is equipped with a chip through a conductive or non-conductive adhesive substance, the surface of the chip is connected with the surface of the metal layer by a metal wire, the metal The inner area of the substrate frame is filled with molding compound, the front of the molding compound is flush with the stepped surface of the pins, the back of the molding compound is flush with the back of the metal substrate frame, the front of the base island, the front and back of the pins and the metal substrate The front and back sides of the frame are provided with a metal anti-oxidation layer or Oxidation Antioxidant Overlay (OSP).

所述芯片与基岛背面之间设置有金属层。 A metal layer is arranged between the chip and the back surface of the base island.

一种二次先镀后蚀金属框减法埋芯片正装平脚结构的工艺方法,所述方法包括以下步骤: A kind of process method of first plating and then etching metal frame subtraction method of embedded chip front-mounted flat leg structure, said method comprises the following steps:

步骤一、取金属基板 Step 1. Take the metal substrate

步骤二、贴光阻膜作业 Step 2. Paste photoresist film

在金属基板正面及背面分别贴上可进行曝光显影的光阻膜; Paste a photoresist film that can be exposed and developed on the front and back of the metal substrate;

步骤三、金属基板正面及背面去除部分光阻膜 Step 3. Remove part of the photoresist film on the front and back of the metal substrate

利用曝光显影设备将步骤二完成贴光阻膜作业的金属基板正面及背面进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板正面及背面后续需要进行电镀的区域; Use exposure and developing equipment to expose, develop and remove part of the graphic photoresist film on the front and back of the metal substrate that has been pasted with the photoresist film in step 2, so as to expose the areas that need to be electroplated on the front and back of the metal substrate;

步骤四、电镀抗氧化金属层或披覆抗氧化剂(OSP) Step 4. Plating anti-oxidation metal layer or coating anti-oxidant (OSP)

在步骤三中金属基板正面及背面去除部分光阻膜的区域电镀上抗氧化金属层或披覆抗氧化剂(OSP); Electroplating an anti-oxidation metal layer or coating an anti-oxidant (OSP) on the area where part of the photoresist film is removed on the front and back of the metal substrate in step 3;

步骤五、去除光阻膜 Step 5. Remove the photoresist film

去除金属基板表面的光阻膜; Remove the photoresist film on the surface of the metal substrate;

步骤六、贴光阻膜作业 Step 6. Paste photoresist film

在步骤四完成电镀抗氧化金属层后的金属基板正面及背面贴上可进行曝光显影的光阻膜; After the electroplating of the anti-oxidation metal layer is completed in step 4, a photoresist film that can be exposed and developed is pasted on the front and back of the metal substrate;

步骤七、金属基板背面去除部分光阻膜 Step 7. Remove part of the photoresist film on the back of the metal substrate

利用曝光显影设备将步骤六完成贴光阻膜作业的金属基板背面蚀刻区域进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板背面后续需要进行蚀刻的区域; Use exposure and development equipment to expose, develop and remove part of the graphic photoresist film on the etched area on the back of the metal substrate that has completed the photoresist film pasting operation in step 6, so as to expose the area that needs to be etched on the back of the metal substrate;

步骤八、蚀刻 Step 8. Etching

在步骤七中金属基板背面去除部分光阻膜的区域进行化学蚀刻; Perform chemical etching in the area where part of the photoresist film is removed on the back of the metal substrate in step 7;

步骤九、去除光阻膜 Step 9. Remove the photoresist film

去除金属基板表面的光阻膜; Remove the photoresist film on the surface of the metal substrate;

步骤十、贴光阻膜作业 Step 10. Paste photoresist film

在步骤八完成蚀刻后的金属基板正面及背面贴上可进行曝光显影的光阻膜; Paste a photoresist film that can be exposed and developed on the front and back of the etched metal substrate in step 8;

步骤十一、金属基板背面去除部分光阻膜 Step 11. Remove part of the photoresist film on the back of the metal substrate

利用曝光显影设备将步骤十完成贴光阻膜作业的金属基板背面蚀刻区域进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板背面蚀刻区域后续需要进行电镀的区域; Use the exposure and development equipment to expose, develop and remove part of the graphic photoresist film on the etched area on the back of the metal substrate where the photoresist film pasting operation has been completed in step ten, so as to expose the area that needs to be electroplated in the etched area on the back of the metal substrate;

步骤十二、电镀金属线路层 Step 12. Electroplating the metal circuit layer

在步骤十一中金属基板背面蚀刻区域去除部分光阻膜的区域内电镀上金属线路层,金属线路层电镀完成后即在金属基板背面形成相应的基岛和引脚; In the eleventh step, the metal circuit layer is electroplated in the area where part of the photoresist film is removed from the etching area on the back of the metal substrate. After the electroplating of the metal circuit layer is completed, corresponding base islands and pins are formed on the back of the metal substrate;

步骤十三、去除光阻膜 Step 13. Remove the photoresist film

去除金属基板表面的光阻膜; Remove the photoresist film on the surface of the metal substrate;

步骤十四、装片 Step 14, loading film

在步骤十二形成的基岛背面通过导电或不导电粘结物质植入芯片; Implanting the chip on the back of the base island formed in step 12 through a conductive or non-conductive bonding substance;

步骤十五、金属线键合 Step 15. Wire Bonding

在芯片正面与步骤十二形成的引脚之间进行键合金属线作业; Perform bonding metal wire operation between the front side of the chip and the pins formed in step 12;

步骤十六、环氧树脂塑封 Step 16. Epoxy resin plastic sealing

在完成装片打线后的金属基板背面蚀刻区域进行环氧树脂塑封保护; Epoxy resin molding protection is carried out on the etching area on the back of the metal substrate after chip loading and wiring;

步骤十七、贴光阻膜作业 Step 17. Paste photoresist film

在步骤十六完成环氧树脂塑封后的金属基板正面及背面贴上可进行曝光显影的光阻膜; Paste a photoresist film that can be exposed and developed on the front and back of the metal substrate after epoxy resin molding is completed in step sixteen;

步骤十八、金属基板正面去除部分光阻膜 Step 18. Remove part of the photoresist film from the front of the metal substrate

利用曝光显影设备将步骤十七完成贴光阻膜作业的金属基板正面进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板正面后续需要进行蚀刻的区域; Using the exposure and development equipment, perform pattern exposure, development and removal of part of the pattern photoresist film on the front of the metal substrate that has completed the photoresist film pasting operation in step 17, so as to expose the area that needs to be etched later on the front of the metal substrate;

步骤十九、蚀刻 Step 19. Etching

在步骤十八中金属基板正面去除部分光阻膜的区域进行化学蚀刻; Perform chemical etching in the region where part of the photoresist film is removed from the front of the metal substrate in step 18;

步骤二十、去除光阻膜 Step 20, remove the photoresist film

去除金属基板表面的光阻膜。 Remove the photoresist film on the surface of the metal substrate.

当步骤四电镀的抗氧化金属层为镍金或镍钯金时,步骤六和步骤七可省略。 When the anti-oxidation metal layer electroplated in step four is nickel gold or nickel palladium gold, step six and step seven can be omitted.

与现有技术相比,本发明具有以下有益效果: Compared with the prior art, the present invention has the following beneficial effects:

1、金属减法技术引线框架的夹层可以因为系统与功能的需要而在需要的位置或是区域内埋入主动元件或是组件或是被动的组件,成为一个单层线路系统级的金属引线框架; 1. The interlayer of the metal subtraction technology lead frame can embed active components or components or passive components in the required position or area due to the needs of the system and functions, and become a single-layer line system-level metal lead frame;

2、从金属减法技术引线框架成品的外观完全看不出来内部夹层已埋入了因系统或是功能需要的对象,尤其是硅材的芯片的埋入连X光都无法检视,充分达到系统与功能的隐密性及保护性; 2. From the appearance of the finished lead frame of metal subtraction technology, it is completely impossible to see that the internal interlayer has been embedded with objects required by the system or function, especially the embedding of silicon chips that cannot be inspected even by X-rays, which fully meets the requirements of the system and Confidentiality and protection of functions;

3、金属减法技术引线框架的夹层在制作过程中可以埋入高功率器件,二次封装再进行控制芯片的装片,从而高功率器件与控制芯片分别装在金属减法技术引线框两侧,可以避免高功率器件因热辐射而干扰控制芯片的信号传输; 3. The interlayer of the metal subtraction technology lead frame can be embedded with high-power devices during the production process, and then the control chip is mounted after secondary packaging, so that the high-power device and the control chip are respectively installed on both sides of the metal subtraction technology lead frame, which can Avoid high-power devices from interfering with the signal transmission of the control chip due to thermal radiation;

4、金属减法技术引线框架本身内含埋入对象的功能,二次封装后可以充分实现系统功能的集成与整合,从而同样功能的元器件模块的体积尺寸要比传统引线框封装的模块来的小,相应在PCB上所占用的空间也就比较少,从而也就降低了成本; 4. Metal subtraction technology The lead frame itself contains the function of embedded objects, and the integration and integration of system functions can be fully realized after secondary packaging, so that the volume size of the component module with the same function is smaller than that of the traditional lead frame packaged module. Small, correspondingly occupy less space on the PCB, thus reducing the cost;

5、金属减法技术引线框架的夹层在制作过程中可以因为导热或是散热需要而在需要的位置或是区域内埋入导热或是散热对象,从而改善整个封装结构的散热效果; 5. The metal subtraction technology lead frame interlayer can embed heat conduction or heat dissipation objects in the required position or area due to heat conduction or heat dissipation requirements during the production process, thereby improving the heat dissipation effect of the entire package structure;

6、金属减法技术引线框架成品本身就富含了各种的组件,如果不再进行后续第二次封装的情况下,将金属减法技术引线框架依照每一格单元切开,本身就可成为一个超薄的封装体; 6. The finished metal subtraction technology lead frame itself is rich in various components. If the subsequent second packaging is not carried out, the metal subtraction technology lead frame is cut according to each cell, and it can become a Ultra-thin package;

7、金属减法技术引线框架除了本身内含对象的埋入功能之外还可以在封装体外围再叠加不同的单元封装或是系统级封装,充分达到单层线路金属引线框架的双系统或是多系统级的封装技术能力; 7. Metal subtraction technology In addition to the embedded function of the embedded object, the lead frame can also be superimposed with different unit packages or system-level packages on the periphery of the package, fully achieving the dual system or multi-system of single-layer metal lead frames. System-level packaging technology capabilities;

8、金属减法技术引线框架内所埋入的物件或对象均与金属厚度齐平,充分的体现出超薄与高密度的填充在金属减法技术引线框内的厚度空间之中。 8. The objects or objects embedded in the metal subtraction technology lead frame are all flush with the metal thickness, which fully reflects the ultra-thin and high-density filling in the thickness space in the metal subtraction technology lead frame.

9、二次先蚀后镀金属框减法技术引线框会在金属引线框表面塑封料正面呈现一定的高低断差,其优点是在第二次塑封料塑封后可以牢牢的抓扣住金属凸点,从而降低了塑封体与金属引线框因为CTE(膨胀系数或是收缩率)的差距而产生分层的可靠性的不良。 9. Subtraction technology of plating metal frame after secondary etching The lead frame will present a certain height difference on the front of the plastic compound on the surface of the metal lead frame. Its advantage is that it can firmly grasp and buckle the metal bump Points, thereby reducing the poor reliability of delamination caused by the gap between the plastic package and the metal lead frame due to the difference in CTE (expansion coefficient or shrinkage rate).

附图说明 Description of drawings

图1~图20为本发明一种二次先镀后蚀金属框减法埋芯片正装平脚结构工艺方法的各工序示意图。 Figures 1 to 20 are schematic diagrams of each process of a process method of the present invention, which is a process method of first plating first and then etching the metal frame subtractive buried chip front mounting flat leg structure.

图21为本发明一种二次先镀后蚀金属框减法埋芯片正装平脚结构的示意图。 Fig. 21 is a schematic diagram of a flat leg structure of a metal frame subtractive embedded chip with secondary plating first and then etching in the present invention.

图22为传统四面扁平无引脚封装(QFN)引线框结构的示意图。 FIG. 22 is a schematic diagram of a conventional quad flat no-leads (QFN) lead frame structure.

图23为预包封四面扁平无引脚封装(PQFN)引线框结构的示意图。 Figure 23 is a schematic diagram of a pre-encapsulated quad flat no-leads (PQFN) lead frame structure.

其中: in:

金属基板框1 Metal Substrate Frame 1

基岛2 Key Island 2

引脚3 pin 3

金属层4 metal layer 4

导电或不导电粘结物质5 Conductive or non-conductive bonding substances5

芯片6 Chip 6

金属线7 Metal wire 7

塑封料8 Plastic compound 8

抗氧化层9。 Antioxidant layer9.

具体实施方式 detailed description

参见图21,本发明一种二次先镀后蚀金属框减法埋芯片正装平脚结构,它包括金属基板框1,所述金属基板框1内部设置有基岛2和引脚3,所述引脚3呈台阶状,所述基岛2和引脚3的正面与金属基板框1正面齐平,所述引脚3的背面与金属基板框1的背面齐平,所述基岛2背面与引脚3的台阶面齐平,所述引脚3的台阶面上设置有金属层4,所述基岛2背面通过导电或不导电粘结物质5正装有芯片6,所述芯片6表面与金属层4表面之间通过金属线7相连接,所述金属基板框1内部区域填充有塑封料8,所述塑封料8正面与引脚3台阶面齐平,所述塑封料8背面与金属基板框1背面齐平,所述基岛2正面、引脚3的正面和背面以及金属基板框1的正面和背面设置有抗氧化层9。 Referring to Fig. 21 , the present invention is a metal frame subtractive embedded chip structure with secondary plating first and then etching, which includes a metal substrate frame 1, and a base island 2 and pins 3 are arranged inside the metal substrate frame 1. The pin 3 is stepped, the front of the base island 2 and the pin 3 is flush with the front of the metal substrate frame 1, the back of the pin 3 is flush with the back of the metal substrate frame 1, and the back of the base island 2 is flush with the metal substrate frame 1. It is flush with the step surface of the pin 3, the metal layer 4 is arranged on the step surface of the pin 3, the back of the base island 2 is equipped with a chip 6 through a conductive or non-conductive adhesive substance 5, and the surface of the chip 6 is It is connected with the surface of the metal layer 4 through a metal wire 7. The inner area of the metal substrate frame 1 is filled with a molding compound 8. The front side of the molding compound 8 is flush with the stepped surface of the pin 3, and the back side of the molding compound 8 is flush with the stepped surface of the pin 3. The back of the metal substrate frame 1 is flush, and the front and back of the base island 2 , the front and back of the pin 3 and the front and back of the metal substrate frame 1 are provided with an anti-oxidation layer 9 .

所述芯片6与基岛2背面之间设置有金属层4。 A metal layer 4 is provided between the chip 6 and the back surface of the base island 2 .

其工艺方法如下: Its process method is as follows:

步骤一、取金属基板 Step 1. Take the metal substrate

参见图1,取一片厚度合适的金属基板,金属基板的材质可以是铜材、铁材、镀锌材、不锈钢材、铝材或可以达到导电功能的金属物质或非金属物质,厚度的选择可依据产品特性进行选择; See Figure 1, take a piece of metal substrate with appropriate thickness, the material of the metal substrate can be copper, iron, galvanized material, stainless steel, aluminum or metal or non-metal material that can achieve conductive function, the choice of thickness can be Choose according to product characteristics;

步骤二、贴光阻膜作业 Step 2. Paste photoresist film

参见图2,在金属基板正面及背面分别贴上可进行曝光显影的光阻膜,光阻膜可以是干式光阻膜也可以是湿式光阻膜; Referring to Figure 2, a photoresist film that can be exposed and developed is pasted on the front and back of the metal substrate, and the photoresist film can be a dry photoresist film or a wet photoresist film;

步骤三、金属基板正面及背面去除部分光阻膜 Step 3. Remove part of the photoresist film on the front and back of the metal substrate

参见图3,利用曝光显影设备将步骤二完成贴光阻膜作业的金属基板正面及背面进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板正面及背面后续需要进行电镀的区域; Referring to Figure 3, use the exposure and developing equipment to expose, develop and remove part of the graphic photoresist film on the front and back of the metal substrate that has completed the photoresist film pasting operation in step 2, so as to expose the areas that need to be electroplated on the front and back of the metal substrate;

步骤四、电镀抗氧化金属层或披覆抗氧化剂(OSP) Step 4. Plating anti-oxidation metal layer or coating anti-oxidant (OSP)

参见图4,在步骤三中金属基板正面及背面去除部分光阻膜的区域电镀上抗氧化金属层或披覆抗氧化剂(OSP); Referring to Fig. 4, in step 3, in the area where part of the photoresist film is removed from the front and back of the metal substrate, an anti-oxidation metal layer is electroplated or coated with an antioxidant (OSP);

步骤五、去除光阻膜 Step 5. Remove the photoresist film

参见图5,去除金属基板表面的光阻膜,去除光阻膜的方法采用化学药水软化并采用高压水冲洗即可; See Figure 5, to remove the photoresist film on the surface of the metal substrate, the method of removing the photoresist film is softened by chemical potion and rinsed with high-pressure water;

步骤六、贴光阻膜作业 Step 6. Paste photoresist film

参见图6,在步骤四完成电镀抗氧化金属层后的金属基板正面及背面贴上可进行曝光显影的光阻膜,光阻膜可以是干式光阻膜也可以是湿式光阻膜; Referring to Fig. 6, after the oxidation-resistant metal layer is electroplated in step 4, a photoresist film that can be exposed and developed is attached to the front and back of the metal substrate. The photoresist film can be a dry photoresist film or a wet photoresist film;

步骤七、金属基板背面去除部分光阻膜 Step 7. Remove part of the photoresist film on the back of the metal substrate

参见图7,利用曝光显影设备将步骤六完成贴光阻膜作业的金属基板背面蚀刻区域进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板背面后续需要进行蚀刻的区域; Referring to Fig. 7, use the exposure and developing equipment to expose, develop and remove part of the graphic photoresist film on the etched area on the back of the metal substrate that has completed the photoresist film pasting operation in step 6, so as to expose the area that needs to be etched on the back of the metal substrate;

步骤八、蚀刻 Step 8. Etching

参见图8,在步骤七中金属基板背面去除部分光阻膜的区域进行化学蚀刻,化学蚀刻的技术可以采用氯化铜、氯化铁或是可以进行腐蚀金属材料的化学药剂; Referring to Figure 8, perform chemical etching on the area where part of the photoresist film is removed on the back of the metal substrate in step 7. The chemical etching technology can use copper chloride, ferric chloride or chemicals that can corrode metal materials;

步骤九、去除光阻膜 Step 9. Remove the photoresist film

参见图9,去除金属基板表面的光阻膜,去除光阻膜的方法采用化学药水软化并采用高压水冲洗即可; Referring to Figure 9, remove the photoresist film on the surface of the metal substrate. The method of removing the photoresist film is softened by chemical potion and rinsed with high-pressure water;

步骤十、贴光阻膜作业 Step 10. Paste photoresist film

参见图10,在步骤八完成蚀刻后的金属基板正面及背面贴上可进行曝光显影的光阻膜,光阻膜可以是干式光阻膜也可以是湿式光阻膜; Referring to FIG. 10 , the front and back of the metal substrate after etching in step 8 are pasted with a photoresist film that can be exposed and developed. The photoresist film can be a dry photoresist film or a wet photoresist film;

步骤十一、金属基板背面去除部分光阻膜 Step 11. Remove part of the photoresist film on the back of the metal substrate

参见图11,利用曝光显影设备将步骤十完成贴光阻膜作业的金属基板背面蚀刻区域进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板背面蚀刻区域后续需要进行电镀的区域; Referring to FIG. 11 , use the exposure and developing equipment to expose, develop and remove part of the graphic photoresist film on the etched area on the back of the metal substrate where the photoresist film pasting operation has been completed in Step 10, so as to expose the etched area on the back of the metal substrate that needs to be subsequently electroplated;

步骤十二、电镀金属线路层 Step 12. Electroplating the metal circuit layer

参见图12,在步骤十一中金属基板背面蚀刻区域去除部分光阻膜的区域内电镀上金属线路层,金属线路层电镀完成后即在金属基板背面形成相应的基岛和引脚,金属线路层的材质可以是银、镍金或镍钯金等,可以根据不同特性变换电镀的厚度或是可导电的金属材料,电镀方式可以是电解电镀也可以采用化学沉积的方式; Referring to Figure 12, in step 11, the metal circuit layer is electroplated in the area where part of the photoresist film is removed from the etching area on the back of the metal substrate. After the metal circuit layer is electroplated, corresponding base islands and pins are formed on the back of the metal substrate. The metal circuit The material of the layer can be silver, nickel-gold or nickel-palladium-gold, etc. The thickness of the electroplating or the conductive metal material can be changed according to different characteristics. The electroplating method can be electrolytic plating or chemical deposition;

步骤十三、去除光阻膜 Step 13. Remove the photoresist film

参见图13,去除金属基板表面的光阻膜,去除光阻膜的方法采用化学药水软化并采用高压水冲洗即可; Referring to Figure 13, remove the photoresist film on the surface of the metal substrate. The method of removing the photoresist film is softened by chemical potion and rinsed with high-pressure water;

步骤十四、装片 Step 14, loading film

参见图14,在步骤十二形成的基岛背面通过导电或不导电粘结物质植入芯片,植入芯片的方式可以根据产品特性灵活选择,可以采用基岛正面点胶装片、芯片背面覆盖胶层或DAF(DieAttachFilm)膜的方式进行装片; Referring to Figure 14, the back of the base island formed in step 12 is implanted into the chip through conductive or non-conductive adhesive substances. The way of implanting the chip can be flexibly selected according to the product characteristics, and the front of the base island can be glued and mounted, and the back of the chip can be covered. Laminate or DAF (DieAttachFilm) film for loading;

步骤十五、金属线键合 Step 15. Wire Bonding

参见图15,在芯片正面与步骤十二形成的引脚之间进行键合金属线作业; Referring to Figure 15, perform bonding metal wire operation between the front side of the chip and the pins formed in step 12;

步骤十六、环氧树脂塑封 Step 16. Epoxy resin plastic sealing

参见图16,在完成装片打线后的金属基板背面蚀刻区域进行环氧树脂塑封保护,环氧树脂材料可以依据产品特性选择有填料或是没有填料的种类; Referring to Figure 16, the etched area on the back of the metal substrate is protected by epoxy resin molding after chip loading and wiring. The epoxy resin material can be filled or unfilled according to product characteristics;

步骤十七、贴光阻膜作业 Step 17. Paste photoresist film

参见图17,在步骤十六完成环氧树脂塑封后的金属基板正面及背面贴上可进行曝光显影的光阻膜; Referring to Fig. 17, in step 16, the front and back of the metal substrate after epoxy resin molding is completed, and a photoresist film that can be exposed and developed is pasted;

步骤十八、金属基板正面去除部分光阻膜 Step 18. Remove part of the photoresist film from the front of the metal substrate

参见图18,利用曝光显影设备将步骤十七完成贴光阻膜作业的金属基板正面进行图形曝光、显影与去除部分图形光阻膜,以露出金属基板正面后续需要进行蚀刻的区域; Referring to FIG. 18 , use the exposure and developing equipment to expose, develop and remove part of the graphic photoresist film on the front of the metal substrate that has completed the photoresist film pasting operation in step 17, so as to expose the area that needs to be etched later on the front of the metal substrate;

步骤十九、蚀刻 Step 19. Etching

参见图19,在步骤十八中金属基板正面去除部分光阻膜的区域进行化学蚀刻,化学蚀刻的技术可以采用氯化铜、氯化铁或是可以进行腐蚀金属材料的化学药剂; Referring to FIG. 19, chemical etching is carried out in the area where part of the photoresist film is removed from the front of the metal substrate in step 18. The chemical etching technology can use copper chloride, ferric chloride or chemicals that can corrode metal materials;

步骤二十、去除光阻膜 Step 20, remove the photoresist film

参见图20,去除金属基板表面的光阻膜,去除光阻膜的方法采用化学药水软化并采用高压水冲洗即可。 Referring to FIG. 20 , the photoresist film on the surface of the metal substrate is removed. The method for removing the photoresist film is to soften it with chemical potions and wash it with high-pressure water.

Claims (1)

1. one kind is first plated for two times and loses metal frame subtraction afterwards and bury the processing method that chip is just filling flat leg structure, it is characterised in that described method comprises the following steps:
Step one, get metal substrate
Step 2, subsides photoresistance film operation
The photoresistance film that can carry out exposure imaging is sticked respectively in metal substrate front and the back side;
Step 3, metal substrate front and back side removal unit divide photoresistance film
Exposure imaging equipment is utilized to complete step 2 to paste the metal substrate front of photoresistance film operation and the back side carries out graph exposure, development and removal partial graphical photoresistance film, to expose the region that the follow-up needs in metal substrate front and the back side carry out electroplating;
Step 4, plating anti-oxidant metal layer
In step 3, metal substrate front and back side removal unit divide anti-oxidant metal layer in the region plating of photoresistance film;
Step 5, removal photoresistance film
Remove the photoresistance film of metallic substrate surfaces;
Step 6, subsides photoresistance film operation
The photoresistance film that can carry out exposure imaging is sticked at metal substrate front and the back side after step 4 completes plating anti-oxidant metal layer;
Step 7, metal substrate back side removal unit divide photoresistance film
The metal substrate back etched region utilizing exposure imaging equipment that step 6 completes to paste photoresistance film operation carries out graph exposure, development and removes partial graphical photoresistance film, to expose the region that the follow-up needs in the metal substrate back side carry out etching;
Step 8, etching
In step 7, the region of metal substrate back side removal unit point photoresistance film carries out chemical milling;
Step 9, removal photoresistance film
Remove the photoresistance film of metallic substrate surfaces;
Step 10, subsides photoresistance film operation
The photoresistance film that can carry out exposure imaging is sticked at metal substrate front and the back side after step 8 completes etching;
Step 11, metal substrate back side removal unit divide photoresistance film
The metal substrate back etched region utilizing exposure imaging equipment that step 10 completes to paste photoresistance film operation carries out graph exposure, development and removes partial graphical photoresistance film, to expose the region that the follow-up needs in metal substrate back etched region carry out electroplating;
Step 12, plated metal line layer
In step 11, metal substrate back etched region removal unit divides in the region of photoresistance film metallic circuit layer in plating, and namely metallic circuit layer forms corresponding Ji Dao and pin at the metal substrate back side after having electroplated;
Step 13, removal photoresistance film
Remove the photoresistance film of metallic substrate surfaces;
Step 14, load
Chip is implanted by conduction or the bonding material that do not conduct electricity at the Ji Dao back side that step 12 is formed;
Step 15, metal wire are bonded
Carry out being bonded metal wire operation between the pin that chip front side and step 12 are formed;
Step 10 six, epoxy resin plastic packaging
Complete load play line after metal substrate back etched region carry out epoxy resin plastic packaging protection;
Step 10 seven, subsides photoresistance film operation
The photoresistance film that can carry out exposure imaging is sticked at metal substrate front and the back side after step 10 six completes epoxy resin plastic packaging;
Step 10 eight, metal substrate front removal unit divide photoresistance film
The metal substrate front utilizing exposure imaging equipment that step 10 seven completes to paste photoresistance film operation carries out graph exposure, development and removes partial graphical photoresistance film, to expose the region that the follow-up needs in metal substrate front carry out etching;
Step 10 nine, etching
In step 10 eight, the region of metal substrate front removal unit point photoresistance film carries out chemical milling;
Step 2 ten, removal photoresistance film
Remove the photoresistance film of metallic substrate surfaces.
CN201310645302.XA 2013-12-05 2013-12-05 First plate for two times and lose metal frame subtraction afterwards and bury chip and just filling flat leg structure and processing method Active CN103646934B (en)

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CN103298275A (en) * 2013-05-20 2013-09-11 江苏长电科技股份有限公司 Metal circuit plating and etching successive method for multilayer circuit base board with metal frame
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CN103298275A (en) * 2013-05-20 2013-09-11 江苏长电科技股份有限公司 Metal circuit plating and etching successive method for multilayer circuit base board with metal frame
CN103413766A (en) * 2013-08-06 2013-11-27 江苏长电科技股份有限公司 Etching-first-packaging-second upside-upward-installation three-dimensional system-in-package metal circuit board structure and process method

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