CN103617773A - Exoelectron testing system and method for medium protecting film material - Google Patents
Exoelectron testing system and method for medium protecting film material Download PDFInfo
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Abstract
The invention relates to an exoelectron testing system and method for a medium protecting film material. At least one circulation period T used for testing is included, and the circulation period T comprises the following voltage application periods of (1) an excitation period Ts, (2) a waiting period Tw and (3) a testing period TR, wherein (1) the excitation period Ts, (2) the waiting period Tw and (3) the testing period TR are carried out consecutively in sequence. Optical signals generated by the working gas discharging process inside a display unit in a detected plasma display screen in the testing period are detected and recorded, the testing voltage difference VD between a scanning electrode Y and a maintenance electrode X when the optical signals generated is obtained simultaneously, the voltage Vw of an internal field in the display unit is calculated and obtained by the equation Vw=Vf-VD, the amount of exoelectrons in the display unit is calculated and obtained through the Vw, and one test of the exoelectrons of the medium protecting film material is completed. The exoelectron testing system for implementing the testing method for the medium protecting film material comprises a drive circuit, a photomultiplier counter tube, an oscilloscope, a computer, a control circuit and a power circuit.
Description
Technical field
The present invention relates to utilize gas discharge to measure the technical field of small electronics, be specially a kind of exoelectron test macro and method of media protection membrane material.
Background technology
Media protection membrane material is with its high resistance sputtering, and the long-life, high secondary electron emission characteristic is widely used in the fields such as space, military project, figure image intensifying, measurement.Wherein, the application of medium protection film in plasma scope (PDP, Plasma Display Panel) is particularly important.The ultraviolet ray excited light-emitting phosphor that PDP mainly utilizes gas discharge to produce, realizes the demonstration of character and image.According to the difference of driving voltage and display unit, plasma scope is divided into direct current and AC discharge type.Current, alternating-current plasma display mainly adopts the addressing and the separated (ADS of demonstration of three-electrode structure, Address Display Separate) driving method is realized full color demonstration, because it has long-life, high reliability and the lower features such as manufacturing cost, become the main flow of plasma scope, below three electrode AC discharge type plasma scopes have been called to plasma scope (PDP).
In prior art, as shown in Figure 1, PDP mainly consists of prebasal plate 1 and metacoxal plate 2 two parts.On prebasal plate 1 inside surface, have and maintain two parallel and coplanar combination electrodes of electrode X and scan electrode Y.Every combination electrode is again to consist of metal electrode and indium tin oxide transparency electrode.The transparent dielectric layer 3 that also has one deck to adopt low glass powder sintering to form between the combination electrode of prebasal plate 1 and gas discharge space.Dielectric layer 3 has played isolation combination electrode and discharge space, has suppressed the effect of discharge current.The medium protection film 4 that has one deck magnesium oxide (MgO) material on dielectric layer 3 surfaces, medium protection film 4 mainly plays protective medium and electrode is not subject to discharge ion sputter, extends the effect of medium mission life.Because the secondary electron yield on medium protection film 4 surfaces is higher, and can provide the exoelectron of some.Medium protection film 4 also has the effect that reduces operating voltage, shortens discharge delay, improves device job stability.Addressing electrode A, rear plate dielectric layer 3, phosphor powder layer 6 and barrier 5 are distributing successively on PDP metacoxal plate 2.
PDP sustain discharge mainly prolongs at prebasal plate 1 maintaining between electrode X and scan electrode Y that row that horizontal direction extends arranges and carries out, after the phosphor powder layer 6 that the vacuum ultraviolet of discharge generation (VUV) is applied by metacoxal plate absorbs, change into visible ray and transmit from prebasal plate, formed demonstration image.Addressing electrode A is distributed in metacoxal plate 2 surfaces and prolongs the row arrangement that vertical direction is extended.Scan electrode Y, maintain electrode X and addressing electrode A and form a two-dimensional matrix, each point of crossing of this matrix has formed display unit (pixel), and plasma display panel (PDP) realizes normal image by the discharge process of display unit and shows.This discharging structure that maintains electrode X and scan electrode Y co-planar designs has increased space and the electric discharge effective coverage of VUV radiation, has higher discharging gap consistance, and can avoid phosphor powder layer 6 directly by VUV, to be bombarded.Therefore, can improve display frame brightness uniformity, improve the luminescence efficiency of display screen.
As shown in Figure 2, PDP mainly comprises plasma display panel (PDP), control circuit, scan drive circuit, maintains driving circuit, addressing waveforms produces the elementary cells such as circuit.In PDP course of normal operation, addressing waveforms produces circuit and to addressing electrode A, provides given voltage V according to the control signal of control circuit
a.Scan drive circuit provides given voltage V to scan electrode Y
y.Maintain driving circuit and provide given voltage V to maintaining electrode X
x.
As shown in Figure 3, a complete display cycle of ADS driving method by SF1～SF10 totally 10 subfields form, each subfield is by preparatory stage (containing common reseting procedure t1 or Global reset process t2), address period (addressing process t3) and maintenance phase (maintenance process t4) formation.In ADS driving method, between the preparatory stage, maintain the voltage applying on electrode X and scan electrode Y and make each discharge cell mesospore CHARGE DISTRIBUTION of display even, reach consistent state.Address period is mainly to select to need luminous discharge cell and non-luminous discharge cell.Applied voltage waveform is applied in a certain order to scan electrode Y and needs on the addressing electrode A of luminous discharge cell.Maintenance period, will maintain pulse and be alternately applied to scan electrode Y and maintain on electrode X.Make to participate in to produce lasting gas discharge excitated fluorescent powder in the display unit space of addressing luminous.
In prior art, PDP need to be used high Xe(xenon in order to improve luminescence efficiency) working gas of content, this makes to adopt increase the PDP discharge time (Td) of ADS driving method, and the electric discharge timing statistics (Ts) in addressing process is elongated.After the addressing time increases, show that holding time of image will correspondingly reduce, directly impact shows contrast and the brightness of image, also can cause addressing inaccurate and maintain and misplace electricity, the serious demonstration image quality that hinders when serious.The development that is particularly accompanied by the emerging display techniques such as 3D demonstration and 4 times of high definitions more needs further to reduce the PDP addressing time.And improve addressing stability, reducing the addressing time just needs the exoelectron emitting performance of amplified medium diaphragm material, studies the media protection membrane material of high exoelectron emission characteristics to reduce the addressing time of PDP.Accurately measuring of exoelectron is an important content in the research of medium protection film material behavior.In addition, the high exoelectron emissive material in fields such as space science, electronic surveyings also comes into one's own day by day, becomes the focus of research.At present, exoelectron test process mainly adopts direct method of testing.
In prior art, PDP exoelectron all adopts direct method of testing as shown in Figure 4, this method of testing by the scan electrode Y of the whole display units of plasma display panel (PDP), addressing electrode A, maintain electrode X and be connected to together, then at scan electrode Y, apply square wave with maintaining on electrode X, the electric current on test addressing electrode A.Because addressing electrode A itself does not participate in electric discharge substantially; the electric current of its formation can be regarded as the electron emission producing on vacuum-ultraviolet light (VUV, Vacuum ultraviolet) the exciting media diaphragm material that between electrode X and scan electrode Y, gas discharge produces owing to maintaining.After addressing electrode A draws, utilize current testing device to test in this electric current, and the formation of the exoelectron using test result as this media protection membrane material electric current, thereby its exoelectron transmitting situation is judged.
In addition; to escaping Electronic Testing, can also suppress medium protection film material surface secondary by metal otter board; the method that promotes medium protection film to produce small exoelectron emission current detects exoelectron emission current, and its core is mainly also the electric current that produces of test exoelectron amplification detection in addition.
Yet in prior art there is many weak points in these measurements that escape electric current.Take high definition PDP as example, and its display unit only has 0.81 * 0.27mm
2.During test, the exoelectron of each display unit forms electric current and is less than 2pA, even if most of display unit is linked together, the exoelectron of integrated circuit forms electric current and also only has several nA.This other testing current of nA level needs professional equipment just can carry out, and these equipment are not only expensive, and is easily subject to the device large current affects that alternately sustain discharge of variation produces itself, and constantly occurs current overload phenomenon alternately; Particularly escape electric current itself very little, and environment current noise is relatively large, test data is easily fallen into oblivion by neighbourhood noise, is difficult to obtain measure accurately numerical value.And partial monopoly is mentioned, connect the outer meeting resistance of large resistance on addressing electrode A, the method for measuring exoelectron electric current by the pressure drop of resistance also can affect because of the precision of resistance own and distributed capacitance the accuracy of test result.
The test result deviation of the direct method of testing of existing exoelectron can produce certain impact for the application of deielectric-coating protective material, need to find more accurate, practical method of testing to realize accurately measuring of display unit exoelectron.
Summary of the invention
For problems of the prior art, the invention provides a kind of exoelectron test macro and method of media protection membrane material, can reduce testing cost, improve the accuracy of test result, realize medium protection film exoelectron emitting performance and accurately measure.
The present invention is achieved through the following technical solutions:
The exoelectron method of testing of a kind of media protection membrane material of the present invention, comprises at least one cycle period T for testing, and described cycle period T comprises that the voltage carrying out continuously successively as follows applies the cycle,
1) excitation cycle T
s; Maintaining on electrode X and scan electrode Y of tested plasma display panel (PDP), be alternately applied to and comprise less a discharge cycle T
cexciting voltage, at a discharge cycle T
cinterior working gas at least completes single step of releasing electric process; Exciting voltage is not less than the firing voltage V that in tested plasma display panel (PDP), working gas discharges required
f;
2) latent period T
w; At excitation cycle T
safter end, the voltage that applies maintaining on electrode X and scan electrode Y is placed on wait voltage, waits for that voltage is less than the firing voltage V that in tested plasma display panel (PDP), working gas discharges required
f; The life period of the exoelectron that the stand-by period produces while being not more than working gas electric discharge;
3) test period T
r; At latent period T
wafter end, maintaining the test voltage that applies respectively synchronous rising on electrode X and scan electrode Y, scan electrode Y and maintain the difference V of the test voltage between electrode X
dincrease gradually and only produce one action process gas discharge;
Detect and record the light signal being produced by working gas discharge process in display unit in tested plasma display panel (PDP), scan electrode Y and maintain the difference V of the test voltage between electrode X while simultaneously obtaining producing light signal
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.
Preferably, the waveform of exciting voltage is one or more the combination in square wave, triangular wave, trapezoidal wave, multiple-pulse ripple, sine wave and exponential wave; The waveform of test voltage is one or more combinations in oblique wave, exponential wave, triangular wave, trapezoidal wave.
Preferably, the stand-by period is greater than 1ms.
Preferably, the scan electrode Y in tested plasma display panel (PDP) and maintain electrode and be shorted together respectively and apply in succession voltage, addressing electrode A is shorted together ground connection and arranges.
Preferably, by the repeatedly repeated test of same cycle duration T, obtain respectively the difference V of corresponding a plurality of test voltages
d, average as the difference V of test voltage
dfinal testing result.
The present invention is a kind of comprises driving circuit for realizing the exoelectron test macro of the media protection membrane material of method of testing of the present invention, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises for providing to be executed alive scan drive circuit and maintains driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively scan electrode Y in tested plasma display panel (PDP) and maintain on electrode X; Described photomultiplier is arranged on the image outgoing side of display unit front panel in tested plasma display panel (PDP), for detection of the light signal being produced by working gas discharge process in display unit, and light signal is converted to electric signal is input in oscillograph; Described oscillograph is also carried in scan electrode Y and maintains the voltage signal that applies on electrode X for testing correspondence; Described computing machine is executed alive loading parameters for arranging, for receiving oscillograph, collect electric signal He Er road, Yi road and apply voltage signal, and for the calculating of signal data to specific output; Described control circuit is used for the loading parameters of computer export to be converted to switching signal, and together outputs in driving circuit with the switch control time sequence signal producing; Described power circuit is used to driving circuit and control circuit that required voltage is provided.
Preferably, between photomultiplier and the front panel of display unit, be provided with optics backup system, optics backup system comprises at least one group of eyepiece system, for making the sensing range of photomultiplier gather the target viewing area of target display unit or a plurality of display unit formation.
Further, in eyepiece system, stack arranges optical filter.
Preferably, power circuit comprises pressure adjustable type D.C. regulated power supply.
Preferably, scan drive circuit comprises circuit and square-wave, upper slope circuit and the lower slope circuit of controlling for applying voltage waveform on scan electrode Y, and the described driving circuit that maintains comprises circuit and square-wave and the slope circuit that applies voltage waveform control on electrode X for maintaining.
Compared with prior art, exoelectron method of testing of the present invention has following useful technique effect:
1. by being alternately applied to the exciting voltage maintaining on electrode and scan electrode in excitation cycle, making to maintain the working gas discharge generation VUV between electrode and scan electrode, and then media protection membrane material is excited to generation exoelectron; The exciting voltage that comprises a plurality of discharge cycles can constantly be accumulated by the electric discharge of each working gas the quantity of exoelectron, thereby reduced greatly the difficulty of test of exoelectron, can also pass through the adjustment to discharge cycle quantity simultaneously, realization meets different test demands, control the quantity of exoelectron, control accurately, applied widely.
2. utilize working gas to exist the cycle much smaller than the characteristic that has the cycle of exoelectron because of the wall electric charge that is attached to medium protection film surface that electric discharge forms, the wait voltage lower than firing voltage applying in latent period, the wall electric charge existing in latent period is progressively run off, and quantity reduces; By adjusting the stand-by period of latent period, display unit mesospore electric charge is reduced to minimum to escaping the impact of Electronic Testing, improved greatly the accounting of exoelectron at working gas Space-charge, thereby got rid of the harmful effect of test result mesospore electric charge, guaranteed the accuracy of test result.
3. by executing alive control, realize the electric discharge of display unit working gas, thereby generation light signal, the detection of utilization to light signal, and corresponding light signal position draws scan electrode and maintains test voltage poor of electrode, thereby the difference of the test voltage that can calculate by fixing gas ignition voltage and collection obtains the magnitude of voltage of internal electric field, because the internal electric field after latent period is mainly formed by exoelectron, therefore can access the quantity of exoelectron, test simple and convenient; In the present invention, adopt be by escape electron production light signal collection with judgement process gas discharge generation, and then obtain the electric field that exoelectron produces, calculate the quantity of the electronics escaping, realized escaping the indirectly testing of electronic surveying, avoided the impact of direct test Instrumental on measuring accuracy; And due to direct test to as if light signal but not current signal; overcome the annihilation effect of environment current noise to exoelectron Weak current; the Measurement accuracy of realization to exoelectron; practical high with test accuracy, can be good at being applied in the medium protection film exoelectron measurement of various materials under varying environment.
Further, by the restriction to exciting voltage, reduced the operation easier of method of testing, by the restriction to test voltage wave, can meet easily test voltage and synchronously rise simultaneously, and the requirement of the difference of test voltage increase, reduce calculating and operation easier, improved testing efficiency.
Further, by the restriction of stand-by period lower limit, guarantee a large amount of losses of wall electric charge, made being mainly of existence in display unit escape electric charge, thereby better improved the accuracy of test.
Further, by test process, the short circuit of scan electrode, maintain the short circuit of electrode, and the short circuit ground connection of addressing electrode, while having guaranteed test, exoelectron can not be subject to the impact of external circuit, has better improved the accuracy of test.
Further, by the algorithm of averaging after the difference of test voltage is repeatedly measured, guarantee the correctness of computational data, avoided the randomness of image data, better improved the accuracy of test.
Test macro of the present invention, by driving circuit, realized scan electrode and maintained and in electrode different cycles, executed alive output, utilize photomultiplier to realize collection and the conversion of the faint optical signal to sending because of working gas electric discharge in display unit, thereby judge accurately the generation of process gas discharge, synchronous scan electrode and maintain the test voltage applying on electrode while passing through oscillograph collecting work gas discharge; Utilize computing machine to adjust dynamically in real time correspondence and execute alive loading parameters, the control of realization to test process, by control circuit, realize the logical sequence of loading parameters, obtain switch control time sequence signal, realize scan drive circuit corresponding in driving circuit and the sequential control that maintains driving circuit; System highly versatile, equipment cost is low, realize simple, do not carry out directly exoelectron being formed the test of electric current, therefore avoided the impact of equipment precision on test result, strengthen accuracy and the practicality of exoelectron test, overcome device current test specification and the impact of payload on test in prior art.
Further, by the setting of eyepiece system, can improve test macro to the specific aim of optical signal detecting in display unit and accuracy, and guaranteed light signal normally to be picked up and by outer signals, do not fallen into oblivion, thereby reduce test error.
Further, utilize the optical filter that stack arranges in eyepiece system, can also before optical system, add in use the optical filter of respective wavelength to filter the impact of surround lighting on test result, improved the sensitivity to optical signal detecting.
Further, by the restriction to circuit, better met control circuit and driving circuit to high pressure and low pressure and between the demand of conversion, guaranteed the normal stable operation of test macro.
Further, by scan drive circuit and the setting that maintains driving circuit, in the time of can better meeting test, apply the demand of voltage to Waveform Control, improve the efficiency of test, reduce the difficulty operating.
Accompanying drawing explanation
Fig. 1 is the horizontal section structural representation of prior art applying plasma display screen display unit.
Fig. 2 is the basic structure schematic diagram of PDP in prior art.
Fig. 3 is that in prior art, PDP adopts the subfield of ADS driving method to form time distribution map.
Fig. 4 is the direct method of testing schematic diagram of PDP exoelectron in prior art.
Fig. 5 is the alive waveform schematic diagram of executing of the present invention.
Fig. 6 is test system structure block diagram of the present invention.
Fig. 7 is driving circuit block diagram of the present invention; 7a is scan drive circuit block diagram, and 7b is for maintaining driving circuit block diagram.
Fig. 8 is the connection diagram of display unit of the present invention and test macro.
Fig. 9 is display unit sparking voltage of the present invention and the schematic diagram of discharge time.
In figure: 1 is prebasal plate, 2 is metacoxal plate, and 3 is dielectric layer, and 4 is medium protection film, and 5 is barrier, and 6 is phosphor powder layer, and 7 is visible ray, and 8 is optics backup system, and X is for maintaining electrode, and Y is scan electrode, and A is addressing electrode.
Embodiment
Below in conjunction with specific embodiment, the present invention is described in further detail, and the explanation of the invention is not limited.
The exoelectron method of testing of a kind of media protection membrane material of the present invention, as shown in Figure 5, it comprises at least one cycle period T for testing, described cycle period T comprises that the voltage carrying out continuously successively as follows applies the cycle,
1) excitation cycle T
s; Maintaining on electrode X and scan electrode Y of tested plasma display panel (PDP), be alternately applied to and comprise less a discharge cycle T
cexciting voltage, at a discharge cycle T
cinterior working gas at least completes single step of releasing electric process; Exciting voltage is not less than the firing voltage V that in tested plasma display panel (PDP), working gas discharges required
f; Thereby maintaining the VUV gas discharge that is formed for exciting exoelectron between electrode X and scan electrode Y.
2) latent period T
w; At excitation cycle T
safter end, the voltage that applies maintaining on electrode X and scan electrode Y is placed on wait voltage, waits for that voltage is less than the firing voltage V that in tested plasma display panel (PDP), working gas discharges required
f; The life period of the exoelectron that the stand-by period produces while being not more than working gas electric discharge; Thereby reduce medium protection film surface wall electric charge; strengthen the quantity of exoelectron in discharge space electric charge, wait voltage can be selected on zero setting or a fixing fixed level position that can not cause electric discharge, in this preferred embodiment; as shown in Figure 5, take and wait for that it is example that voltage is selected zero setting.
3) test period T
r; At latent period T
wafter end, maintaining the test voltage that applies respectively synchronous rising on electrode X and scan electrode Y, scan electrode Y and maintain the difference V of the test voltage between electrode X
dincrease gradually and only produce one action process gas discharge; Detect and record the light signal being produced by working gas discharge process in display unit in tested plasma display panel (PDP), scan electrode Y and maintain the difference V of the test voltage between electrode X while simultaneously obtaining producing light signal
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.The exoelectron of having realized escaping in the discharge process that electron institute participates in is measured, and testing current of the prior art is become to visible ray test, changes to improve the accuracy of test by detecting corresponding impressed voltage.
Method of testing ultimate principle of the present invention is, in display unit internal discharge process, and the firing voltage V that gas discharge is required
ffor impressed voltage and discharge space internal charge formation internal electric field V
wsum.The voltage V that gas discharge is required
ffor certain value, produce impressed voltage corresponding on the time point of VUV position applying corresponding actual discharge on voltage, maintain on electrode X and scan electrode Y and execute alive voltage difference V
d, and the fields inside voltage V that display unit inside produces because of exoelectron
w=V
f– V
d.Therefore, by the position at test period internal cause working gas discharge generation VUV photon pulse and the corresponding difference V that applies the scan electrode on voltage and maintain test voltage in test voltage that electrode adds calculating process gas discharge
d, the impressed voltage of corresponding luminous point namely, and then can calculate internal electric field V with firing voltage and impressed voltage
wmagnitude of voltage.Now internal electric field is mainly formed by exoelectron, obtains internal electric field V
wjust can obtain afterwards the size of exoelectron, realize exoelectron and measure.
In method of testing of the present invention, the structure mechanism of cycle period is: exoelectron derives from the Auger effect in electronics and hole compound nucleus process; particularly 147nmVUV photon excitation is to the Auger electron transmitting of the band gap generation of medium protection film; so exoelectron has the longer life-span; and quantity is subject to the impact of gas discharge time; discharge time is more, and exoelectron quantity is also more.In the present invention, the discharge cycle T discharging by adjustment cycle
cnumber of times just can adjust the number of times of VUV photon excitation, and then increase the transmitting of effective Auger electron, improve exoelectron quantity.The time span that changes latent period just can be adjusted and measure front exoelectron and the wall electric charge stand-by period before test period, after excitation cycle.Because the ion lifetime that working gas circuit produces is very short, continuity in time in latent period, wall electric charge will run off, and the exoelectron life-span is longer, after waiting process, the electric charge that can exist in display unit is mainly exoelectron, thereby has improved the accuracy of measurement result.Avoided in measuring process, due to the negligible amounts of exoelectron own, the electric current forming is very little, the problem being fallen into oblivion by environment current noise, the impact of extra electric field when working gas is discharged by measuring the internal electric field forming in the inner exoelectron accumulation of display unit, and then the quantity of measurement exoelectron.
Preferably, the waveform of exciting voltage is one or more the combination in square wave, triangular wave, trapezoidal wave, multiple-pulse ripple, sine wave and exponential wave; The waveform of test voltage is oblique wave, and in this preferred embodiment, as shown in Figure 5, the waveform of exciting voltage is square wave, and the waveform of test voltage is oblique wave.
Preferably, the stand-by period is greater than 1ms, and after this stand-by period, wall electric charge will run off in a large number, further improve the accounting that escapes electric charge.When adopting method of testing of the present invention, scan electrode Y in tested plasma display panel (PDP) and maintain electrode and be shorted together respectively and apply in succession voltage, addressing electrode A is shorted together ground connection and arranges, during with assurance test, exoelectron can not be subject to the impact of external circuit, improves test accuracy.
Preferably, in order to guarantee the correctness of data, by the repeatedly repeated test of same cycle duration T, obtain respectively the difference V of corresponding a plurality of test voltages
d, average as the difference V of test voltage
dfinal testing result.
The present invention is a kind of, and for realizing the exoelectron test macro of the media protection membrane material of above-described method of testing, as shown in Figure 6, it comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises for providing to be executed alive scan drive circuit and maintains driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively scan electrode Y in tested plasma display panel (PDP) and maintain on electrode X; Described photomultiplier is arranged on the image outgoing side of display unit front panel in tested plasma display panel (PDP), for detection of the light signal being produced by working gas discharge process in display unit, and light signal is converted to electric signal is input in oscillograph; Described oscillograph is also carried in scan electrode Y and maintains the voltage signal that applies on electrode X for testing correspondence; Described computing machine is executed alive loading parameters for arranging, for receiving oscillograph, collect electric signal He Er road, Yi road and apply voltage signal, and for the calculating of signal data to specific output; Described control circuit is used for the loading parameters of computer export to be converted to switching signal, and together outputs in driving circuit with the switch control time sequence signal producing; Described power circuit is used to driving circuit and control circuit that required voltage is provided.
Wherein, computing machine is for arranging the loading parameters such as the required shape formation of executing alive waveform of exoelectron test, cycle index, duration, also the discharge position of oscillograph transmission and the data of sparking voltage will be gathered simultaneously, form corresponding result of calculation, with the formal output of report, thereby draw for the assessment report to the test of medium protection film exoelectron emitting performance; The voltage that applies that driving circuit utilizes the switch control time sequence of control circuit transmission to realize the corresponding waveform that maintains, scans the output of two-way driving circuit is loaded into respectively maintaining on electrode and scan electrode of display screen; Oscillograph unit, be used for testing three road signals, wherein two-way is preferably used high-voltage probe acquisition scans electrode and maintains the alive waveform of executing on electrode, analysis-driven circuit working state, another road adopts photomultiplier transit instrument to gather display unit in the discharge scenario of measuring period, and three circuit-switched data pass to scanning voltage data while forming discharge position and electric discharge after Computer Analysis by interface.Photomultiplier converts the faint light signal producing in process gas discharge to electric signal with the generation of judgement process gas discharge, thereby accurately gathers the poor of the test voltage that maintains in discharge process between electrode X and scan electrode Y.In use procedure, for each discharge cycle T of excitation cycle
ccycle Length and the time span of waveform rising edge, negative edge, and the time parameter of latent period all can carry out parameter adjustment and be realized corresponding sequential control by control circuit by computing machine, realize applying the accurate control of starting point and the end point of voltage waveform.
At computing machine, control circuit is applied the transmission of voltage-drop loading correlation parameter, the namely transmission of Waveform Control parameter, preferably can adopt parameter list form, comprise the cycling time of the on off state of each control signal, the duration of corresponding state and various periodic waveforms.This parameter list can on-the-fly modify each signal and sequential thereof, to guarantee that the display screen of different technical parameters can have the waveform adapting to it, realizes the Stability and veracity of test.And computing machine can increase the cycle index of excitation cycle as required to executing alive control, extend the time of latent period, adjust the waveform slope of test period, the Selection and Constitute of realization to multiple waveforms such as square wave, index, triangles, increase exoelectron transmitting quantity, reduce the impact of wall electric charge on test result.Meet method of testing to the requirement of controlling, can carry out in real time, after computer interface parameter modification, can carry out real time modifying by the communication of computing machine and control circuit.
In this preferred embodiment, as shown in Figure 8, between photomultiplier and the front panel of display unit, be provided with optics backup system, optics backup system comprises at least one group of eyepiece system, for making the sensing range of photomultiplier gather the target viewing area of target display unit or a plurality of display unit formation, make light signal form a millivolt magnitude voltage signals and test through focusing, filtration, the amplification of the optics backup system 8 of photomultiplier front end.Preferably, in eyepiece system, stack arranges optical filter to reduce the impact of surround lighting on test result.
In this preferred embodiment, power circuit adopts and comprises the adjustable D.C. regulated power supply that low pressure and high pressure can be provided.Scan drive circuit comprises circuit and square-wave, upper slope circuit and the lower slope circuit of controlling for applying voltage waveform on scan electrode Y, and the described driving circuit that maintains comprises circuit and square-wave and the slope circuit that applies voltage waveform control on electrode X for maintaining.
Concrete while utilizing method of testing of the present invention and described test macro to carry out the test of exoelectron.
As shown in Figure 5, for a cycle period T who once tests, at excitation cycle T
sstage; cause display unit by the exciting voltage alternately changing applying on maintaining electrode X and scan electrode Y in, working gas excites electric discharge; this process gas discharge can produce a large amount of VUV photons, and VUV photon provides the electronics of energy exciting media diaphragm solid surface defect capture to escape into discharge space and forms exoelectron.Meanwhile, after gas ionization itself, can also form the wall electric charge that is attached to medium protection film surface.In this process, maintain upper alternately variation of electrode X and scan electrode Y and carry out the discharge cycle T that periodicity applies
cquantity determined that gas discharge produces the quantity of wall electric charge and exoelectron.Exciting voltage discharge cycle T
cmore, exoelectron is more, and more easily test, therefore need to be according to actual test case to discharge cycle T
cdynamically adjust.Concrete, excitation cycle adopts voltage magnitude V
s=200V, the single discharge cycle T using
cadopt the square wave that dutycycle is 50% to form, the cycle is 20 μ s, discharge cycle T
cquantity be 50.
At latent period T
wstage, maintain on electrode X and scan electrode Y and apply wait voltage, wait for that under voltage, working gas electric discharge phenomena can not occur, because the cycle that exists of wall electric charge will be much smaller than exoelectron, increase along with the stand-by period, wall electric charge will progressively be passed, and quantity tails off, and exoelectron passes through at excitation cycle T
sinside continuous compound-excitation process, has longer life period, and its quantity does not have obvious variation.By latent period, improve the content of exoelectron in test electronics, strengthened the accuracy of test signal.Concrete, in latent period, wait for that voltage adopts scan electrode Y and the wait voltage maintaining on electrode X to be all set to 0V, whole latent period time T
w=5ms.
At test period T
rin the stage, maintain electrode X and scan electrode Y and apply respectively difform oblique wave seat test voltage, and the test voltage voltage magnitude wherein applying on scan electrode Y is V
s+ V
r, the amplitude that maintains the test voltage applying on electrode X is V
s, and use photomultiplier transit instrument test scan electrode Y and maintain reference position and the voltage swing discharging between electrode X.The numerical value of the difference by test test voltage and then can calculate the quantity of exoelectron; Concrete, at test period T
r, the test voltage vertical uplift that scan electrode Y applies is V to amplitude
safter, with slope 2V/ μ s, progressively rise to voltage V
r, V
r=200V.After this, it is V that the voltage that scan electrode Y applies vertically drops to amplitude
s, then be down to 0V with slope 1.6V/ μ s, maintain test voltage that electrode X applies and take slope 1.4V/ μ s and progressively rise to voltage magnitude as V
s, electrode Y to be scanned and to maintain the upper test voltage of the electrode X amplitude that peaks be respectively V
s+ V
rand V
safter, maintain electrode drop to 0V, under the waveform of this test voltage, completed a test period T
rtest process.
During test, as shown in Figure 6, computing machine can the test of adaptive testing system to different medium diaphragm material for the test macro of employing; Power circuit provides driving circuit and the required voltage of control circuit, can adopt pressure adjustable type heavy DC stabilized voltage supply; Concrete, control circuit adopts the logic control device with logical process and interface communication ability to realize, output power device control signal Wei14 road, and the sequential minimum resolution of the signal that generates is 25ns; Driving circuit is for the concrete described method of this preferred embodiment and requirements set, and as shown in Figure 7, scan drive circuit comprises structure: circuit and square-wave, upper slope circuit, lower slope circuit, maintain driving circuit and comprise circuit and square-wave and slope circuit.This driving circuit can produce in the embodiment of the present invention, propose apply the needed square wave of voltage and oblique wave, the power device that driving circuit comprises all adopts ratings to be at least 150A and 300V, in this preferred embodiment, adopting ratings is 160A, the High Speed I GBT of 350V or switch mosfet pipe, in order to meet the needs of actual waveform electric current, in partial circuit, these power devices carry out parallel connection use.To whole, execute alive Waveform Control and produce by control circuit, control circuit is exported 14 road logical sequence signals altogether, control respectively the turntable driving shown in Fig. 7 and maintained the switch controlling signal of QerH, QerL in driving circuit, QsusH, QsusL, QrampH, QpassH, QrampL, QpassL constant power device, the V in Fig. 5 and 7
s=200V, V
setup=200V, V
y=0V is high voltage direct current, by power circuit unit, is provided, and in the present embodiment, in whole cycle period T, executing alive waveform is square wave and oblique wave combined waveform.
During test, the display unit syndeton of test macro and tested plasma display panel (PDP) as shown in Figure 8, photomultiplier is applied directly on the prebasal plate 1 of display unit by optics backup system 8, thereby photomultiplier can be tested the faint light that maintains the working gas discharge generation between electrode X and scan electrode Y, and convert light signal to an electric signal formation electric impulse signal higher than neighbourhood noise.The photomultiplier using in this preferred embodiment can pick up nA level dark current, there is higher radiant sensitivity, can pick up the photon that electric discharge produces in display unit and be amplified to a millivolt magnitude voltage signals and be transferred to oscillograph, other voltage signal of this level can normally be identified by oscillograph.In order to ensure this VUV photon signal can normally be picked up, by outer signals, do not fallen into oblivion, can also in the stack of optics backup system, add in use the optical filter of respective wavelength to filter the impact of surround lighting on test result, the sensitivity that improves signal.
The data corresponding relation obtaining after test as shown in Figure 9, at test period T
rafter beginning, the test voltage vertical uplift applying on scan electrode Y is V to amplitude
sthe test voltage that rear beginning and maintaining applies on electrode continues synchronous rising with the oblique wave of Different Slope.Now, scan electrode and maintain alive voltage difference on electrode and progressively increase, exoelectron is at the electric charge V of display unit inner accumulation
wand the difference V of the test voltage applying
dsum reaches working gas firing voltage V
fafter, between two electrodes, occur that dark discharge produces VUV photon.Now photomultiplier can be tested a luminous brightness peak, the A point in these brightness corresponding diagram 9 scan electrode test voltage wave and maintain C point on electrode test voltage waveform, the voltage V between test C point and A point
aCjust can calculate gas ignition voltage V
fwith voltage V
aCbetween pressure reduction, the V that this pressure reduction is mainly formed in display unit inner space accumulation by exoelectron
w.And the t Changing Pattern calculating between A point and measuring period starting point B can also be studied the impact of exoelectron on discharge stability.
According to the technical scheme of the embodiment of the present invention, by the corresponding waveform parameter of computer installation and sequential relationship, offer control circuit, and produce by control circuit the waveform that corresponding power device clock signal forms corresponding test voltage in driving circuit.This method can realize comparatively flexibly, simply Waveform Control and generation, and can, according to actual displayed screen test needs, dynamically adjust shape, quantity and the time span of in excitation cycle, executing waveform in alive discharge cycle.This employing parameter arranges the method that test waveform produces of controlling, to studying difference, execute under alive waveform, namely, under drive waveforms, the variation of exoelectron emitting performance and raising exoelectron transmitting quantity, increase test accuracy and have positive meaning.
In embodiments of the invention, measure mainly round in scanning and maintain maintain while forming dark discharge point on electrode oblique wave and scan electrode between voltage difference carry out, this voltage difference reflected the exoelectron quantity that forms at excitation cycle number, although exoelectron lazy weight is tested required electric current, the difference V of the test voltage applying in the time of can changing greatly electric discharge in display unit inside to produce conventional equipment
d.In addition; by optics backup system; the research of exoelectron transmitting can be concentrated on to required concrete display unit or concrete region; acquired results can be got rid of ambient noise interference; there is higher accuracy and signal to noise ratio (S/N ratio), to studies show that the transmitting of screen media protection membrane material exoelectron has great importance.
Obviously, those skilled in the art should be understood that, the modules of foregoing invention or step can realize by multiple relevant device, device, and they can be combined in a device inside or be distributed on the network of a plurality of devices formations, are even solidified into circuit module and realize.Therefore, the present invention is not restricted to the combination of any specific hardware and software.
The present embodiment has only provided the concrete example application of part, belongs to the preferred embodiment of the present invention, is not limited to the present invention.For those skilled in the art of correlation technique research, the present invention still has multiple change and variation.All within by invention right claimed range; according to above-described embodiment, design the relevant of different excitation cycles, latent period and measuring period and execute alive waveform and in prior art, modify, be equal to various deformation proving installation and the method for testing that replacement, improvement etc. form, all should be encompassed among protection scope of the present invention.
Claims (10)
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5940052A (en) * | 1997-01-15 | 1999-08-17 | Micron Technology, Inc. | Current monitor for field emission displays |
| WO2002076105A1 (en) * | 2001-03-16 | 2002-09-26 | Olympus Optical Co., Ltd. | Field sequential color display device |
| US20050005220A1 (en) * | 2003-06-30 | 2005-01-06 | Lg.Philips Lcd Co., Ltd. | Apparatus for testing display device and method for testing the same |
-
2013
- 2013-11-27 CN CN201310613018.4A patent/CN103617773B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5940052A (en) * | 1997-01-15 | 1999-08-17 | Micron Technology, Inc. | Current monitor for field emission displays |
| WO2002076105A1 (en) * | 2001-03-16 | 2002-09-26 | Olympus Optical Co., Ltd. | Field sequential color display device |
| US20050005220A1 (en) * | 2003-06-30 | 2005-01-06 | Lg.Philips Lcd Co., Ltd. | Apparatus for testing display device and method for testing the same |
Non-Patent Citations (2)
| Title |
|---|
| 沈强: "交流等离子体显示器介质保护膜放电特性测量装置的研究", 《西安交通大学学报》, vol. 33, no. 11, 30 November 1999 (1999-11-30), pages 5 - 9 * |
| 蔡秋萍: "PDP器件中MgO薄膜二次电子发射系数y的研究", 《固体电子学研究与进展》, vol. 23, no. 4, 30 November 2003 (2003-11-30), pages 416 - 420 * |
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