CN203631107U - Exoelectron test system of medium protective film material - Google Patents
Exoelectron test system of medium protective film material Download PDFInfo
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- CN203631107U CN203631107U CN201320761355.3U CN201320761355U CN203631107U CN 203631107 U CN203631107 U CN 203631107U CN 201320761355 U CN201320761355 U CN 201320761355U CN 203631107 U CN203631107 U CN 203631107U
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Abstract
本实用新型一种介质保护膜材料的外逸电子测试系统，包括驱动电路，光电倍增管，示波器，计算机，控制电路和电源电路；驱动电路包括用于提供测试时施加电压的扫描驱动电路和维持驱动电路；扫描驱动电路和维持驱动电路分别对应连接在被测等离子体显示屏上的扫描电极Y和维持电极X上；光电倍增管设置在被测等离子体显示屏中显示单元前面板的图像输出侧，光电倍增管的电信号输出端与示波器的输入端连接；示波器的输入端还分别通过高压探头与扫描电极Y和维持电极X连接，输出端与计算机的输入端连接；计算机包括用于设置施加电压的加载参数输入装置，输出端依次与控制电路和驱动电路相连接；电源电路分别与驱动电路和控制电路相连接。
The utility model relates to an escape electronic test system of a dielectric protective film material, comprising a drive circuit, a photomultiplier tube, an oscilloscope, a computer, a control circuit and a power supply circuit; the drive circuit includes a scanning drive circuit and a maintenance Drive circuit; the scan drive circuit and the sustain drive circuit are respectively connected to the scan electrode Y and the sustain electrode X on the plasma display screen under test; the photomultiplier tube is arranged in the plasma display screen under test to display the image output of the front panel of the unit On the side, the electrical signal output end of the photomultiplier tube is connected to the input end of the oscilloscope; the input end of the oscilloscope is also connected to the scanning electrode Y and the sustain electrode X through a high-voltage probe, and the output end is connected to the input end of the computer; the computer includes a set The loading parameter input device for applying voltage is connected with the control circuit and the drive circuit in turn at the output end; the power supply circuit is respectively connected with the drive circuit and the control circuit.
Description
Technical field
The utility model relates to the technical field of utilizing gas discharge to measure small electronics, is specially a kind of exoelectron test macro of media protection membrane material.
Background technology
Media protection membrane material is with its high resistance sputtering, and the long-life, high secondary electron emission characteristic is widely used in the fields such as space, military project, figure image intensifying, measurement.Wherein, the application of medium protection film in plasma scope (PDP, Plasma Display Panel) is particularly important.The ultraviolet ray excited light-emitting phosphor that PDP mainly utilizes gas discharge to produce, realizes the demonstration of character and image.According to the difference of driving voltage and display unit, plasma scope is divided into direct current and AC discharge type.Current, alternating-current plasma display mainly adopts the addressing of three-electrode structure to separate (ADS with demonstration, Address Display Separate) driving method realize full color show, because it has the features such as long-life, high reliability and lower manufacturing cost, become the main flow of plasma scope, below three electrode AC discharge type plasma scopes have been called to plasma scope (PDP).
In prior art, as shown in Figure 1, PDP is mainly made up of prebasal plate 1 and metacoxal plate 2 two parts.On prebasal plate 1 inside surface, have and maintain two parallel and coplanar combination electrodes of electrode X and scan electrode Y.Every combination electrode is to be again made up of metal electrode and indium tin oxide transparency electrode.The transparent dielectric layer 3 that also has one deck to adopt low glass powder sintering to form between the combination electrode of prebasal plate 1 and gas discharge space.Dielectric layer 3 has played isolation combination electrode and discharge space, has suppressed the effect of discharge current.Have the medium protection film 4 of one deck magnesium oxide (MgO) material on dielectric layer 3 surfaces, medium protection film 4 mainly plays protective medium and electrode is not subject to discharge ion sputter, extends the effect of medium mission life.Because the secondary electron yield on medium protection film 4 surfaces is higher, and can provide the exoelectron of some.Medium protection film 4 also has the effect that reduces operating voltage, shortens discharge delay, improves device job stability.Addressing electrode A, rear plate dielectric layer 3, phosphor powder layer 6 and barrier 5 are distributing successively on PDP metacoxal plate 2.
PDP sustain discharge mainly prolongs at prebasal plate 1 row that horizontal direction extends arranges maintain between electrode X and scan electrode Y and carry out, after the phosphor powder layer 6 that the vacuum ultraviolet (VUV) of discharge generation is applied by metacoxal plate absorbs, change into visible ray and transmit from prebasal plate, formed demonstration image.Addressing electrode A is distributed in metacoxal plate 2 surfaces and prolongs the row arrangement that vertical direction is extended.Scan electrode Y, maintain electrode X and addressing electrode A and form a two-dimensional matrix, each point of crossing of this matrix has formed display unit (pixel), and plasma display panel (PDP) realizes normal image by the discharge process of display unit and shows.This discharging structure that maintains electrode X and scan electrode Y co-planar designs has increased space and the electric discharge effective coverage of VUV radiation, has higher discharging gap consistance, and can avoid phosphor powder layer 6 directly to be bombarded by VUV.Therefore, can improve display frame brightness uniformity, improve the luminescence efficiency of display screen.
As shown in Figure 2, PDP mainly comprises plasma display panel (PDP), control circuit, scan drive circuit, maintains driving circuit, addressing waveforms produces the elementary cells such as circuit.In PDP course of normal operation, addressing waveforms produces circuit and provides given voltage V according to the control signal of control circuit to addressing electrode A
a.Scan drive circuit provides given voltage V to scan electrode Y
y.Maintain driving circuit and provide given voltage V to maintaining electrode X
x.
As shown in Figure 3, a complete display cycle of ADS driving method by SF1～SF10 totally 10 subfields form, each subfield is by preparatory stage (containing common reseting procedure t1 or Global reset process t2), address period (addressing process t3) and maintenance phase (maintenance process t4) formation.In ADS driving method, between the preparatory stage, maintain the voltage applying on electrode X and scan electrode Y and make the each discharge cell mesospore of display CHARGE DISTRIBUTION even, reach consistent state.Address period is mainly to select to need luminous discharge cell and non-luminous discharge cell.Applied voltage waveform is applied in a certain order to scan electrode Y and needs on the addressing electrode A of luminous discharge cell.Maintenance period, will maintain pulse and be alternately applied to scan electrode Y and maintain on electrode X.Make to participate in to produce in the display unit space of addressing lasting gas discharge excitated fluorescent powder luminous.
In prior art, PDP need to use high Xe(xenon in order to improve luminescence efficiency) working gas of content, this makes to adopt increase the PDP discharge time (Td) of ADS driving method, and the electric discharge timing statistics (Ts) in addressing process is elongated.After the addressing time increases, show that holding time of image will correspondingly reduce, directly impact shows contrast and the brightness of image, also can cause addressing inaccurate and maintain and misplace electricity, the serious demonstration image quality that hinders when serious.The development that is particularly accompanied by the emerging display techniques such as 3D demonstration and 4 times of high definitions more needs further to reduce the PDP addressing time.And improve addressing stability, reducing the addressing time just needs the exoelectron emitting performance of amplified medium diaphragm material, studies the media protection membrane material of high exoelectron emission characteristics to reduce the addressing time of PDP.Accurately measuring of exoelectron is an important content in the research of medium protection film material behavior.In addition, also day by day come into one's own at the high exoelectron emissive material in the field such as space science, electronic surveying, become the focus of research.At present, exoelectron test process mainly adopts direct method of testing.
In prior art, PDP exoelectron all adopts direct method of testing as shown in Figure 4, this method of testing by the scan electrode Y of the whole display units of plasma display panel (PDP), addressing electrode A, maintain electrode X and be connected to together, then apply square wave at scan electrode Y with maintaining on electrode X, the electric current on test addressing electrode A.Because addressing electrode A itself does not participate in electric discharge substantially; the electric current of its formation can be regarded as the electron emission producing on vacuum-ultraviolet light (VUV, Vacuum ultraviolet) the exciting media diaphragm material that between electrode X and scan electrode Y, gas discharge produces owing to maintaining.After addressing electrode A draws, utilize current testing device to test in this electric current, and exoelectron using test result as this media protection membrane material forms electric current, thereby its exoelectron transmitting situation is judged.
In addition; can also suppress medium protection film material surface secondary by metal otter board to escaping Electronic Testing; the method that promotes medium protection film to produce small exoelectron emission current detects exoelectron emission current, and its core is mainly also the electric current that produces of test exoelectron amplification detection in addition.
But in prior art there is many weak points in these measurements that escape electric current.Take high definition PDP as example, its display unit only has 0.81 × 0.27mm
2.When test, the exoelectron of each display unit forms electric current and is less than 2pA, even if most of display unit is linked together, the exoelectron of integrated circuit forms electric current and also only has several nA.The testing current of this nA rank needs professional equipment just can carry out, and these equipment are not only expensive, and is easily subject to the device large current affects that alternately sustain discharge of variation produces itself, and constantly occurs current overload phenomenon alternately; Particularly escape electric current itself very little, and environment current noise is relatively large, test data is easily fallen into oblivion by neighbourhood noise, is difficult to obtain measure accurately numerical value.And the outer meeting resistance that connects large resistance on addressing electrode A that partial monopoly is mentioned, the method for measuring exoelectron electric current by the pressure drop of resistance also can affect because of the precision of resistance own and distributed capacitance the accuracy of test result.
The test result deviation of the direct method of testing of existing exoelectron can produce certain impact for the application of deielectric-coating protective material, need to find more accurate, practical method of testing and test macro to realize accurately measuring of display unit exoelectron.
Utility model content
For problems of the prior art, the utility model provides a kind of exoelectron test macro of media protection membrane material, can reduce testing cost, improves the accuracy of test result, realizes medium protection film exoelectron emitting performance and accurately measures.
The utility model is to be achieved through the following technical solutions:
The exoelectron test macro of a kind of media protection membrane material of the utility model, comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises for providing when test to execute alive scan drive circuit and maintaining driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively scan electrode Y in tested plasma display panel (PDP) and maintain on electrode X; Described photomultiplier is arranged on the image outgoing side of the front panel of display unit in tested plasma display panel (PDP), and the electrical signal of photomultiplier is connected with oscillographic input end; Described oscillographic input end is also respectively by high-voltage probe and scan electrode Y with maintain electrode X and be connected, and output terminal is connected with the input end of computing machine; Described computing machine comprises for arranging executes alive loading parameters input media, and output terminal is connected with the input end of control circuit; Described control circuit output terminal is connected with driving circuit input end; Described power circuit is connected with control circuit with driving circuit respectively.
Preferably, photomultiplier is for detection of the light signal being produced by working gas discharge process in display unit, and light signal is converted to electric signal is input in oscillograph; Oscillograph is also carried in scan electrode Y and maintains the voltage signal that applies on electrode X for testing correspondence; Computing machine is used for receiving that oscillograph collects Yi road electric signal and two-way applies voltage signal, and for the calculating of signal data to specific output; Control circuit is for being converted to switching signal by the loading parameters of computer export, and power circuit is used to driving circuit and control circuit that required voltage is provided.
Further, between photomultiplier and the front panel of display unit, be provided with optics backup system, optics backup system comprises at least one group of eyepiece system, for making the sensing range of photomultiplier gather the target viewing area of target display unit or multiple display unit formation.
Further again, in eyepiece system, stack arranges optical filter.
Preferably, power circuit comprises pressure adjustable type D.C. regulated power supply.
Preferably, scan drive circuit comprises the circuit and square-wave for applying voltage waveform control on scan electrode Y, upper slope circuit and lower slope circuit, and the described driving circuit that maintains comprises the circuit and square-wave and the slope circuit that on electrode X, apply voltage waveform control for maintaining.
Further, driving circuit comprises that some rated current are not less than the power device that 150A, rated voltage are not less than 300V.
Further again, power device adopts IGBT or switch mosfet pipe.
Compared with prior art, the utlity model has following useful technique effect:
Test macro described in the utility model, realize scan electrode and maintained by driving circuit and in electrode different cycles, executed alive output, utilize photomultiplier realize in display unit because of working gas discharge collection and the conversion of the faint optical signal sending, thereby judge accurately the generation of process gas discharge, synchronous scan electrode and maintain the test voltage applying on electrode while passing through oscillograph collecting work gas discharge; Utilize computing machine to adjust dynamically in real time correspondence and execute alive loading parameters, realize the control to test process, realize the logical sequence of loading parameters by control circuit, obtain switch control time sequence signal, realize scan drive circuit corresponding in driving circuit and the sequential control that maintains driving circuit; System highly versatile, equipment cost is low, realizes simple.Do not carry out directly exoelectron being formed the test of electric current, therefore avoided the impact of equipment precision on test result, strengthen accuracy and the practicality of exoelectron test, overcome device current test specification and the impact of payload on test in prior art.
Further; by each test macro being comprised to the functional specification of parts, the perfect cooperative ability of test macro entirety, has improved the compatibility energy of system; thereby can better meet testing requirement, improve the adaptability of test macro to various media protection membrane material exoelectron tests.
Further, by the setting of eyepiece system, can improve specific aim and the accuracy of test macro to optical signal detecting in display unit, and guaranteed light signal normally to be picked up and do not fallen into oblivion by outer signals, thereby reduce test error.
Further, utilize the optical filter that stack arranges in eyepiece system, can also before optical system, add in use the optical filter of respective wavelength to filter the impact of surround lighting on test result, improved the sensitivity to optical signal detecting.
Further, by the restriction to power circuit, better meet the demand of control circuit and driving circuit, guaranteed the normal stable operation of test macro.
Further, by scan drive circuit and the setting that maintains driving circuit, can better meet test time, apply the demand of voltage to Waveform Control, improve the efficiency of test, reduce the difficulty operating.
Further, the driving circuit that utilizes power device to form, can meet the demand of driving circuit to large electric current high voltage processing power, has improved stability and the adaptive faculty of system; Can make driving circuit be easy to by the selection of IGBT or switch mosfet pipe integrated, simplify and control, improve manipulation stability and adaptive faculty.
Accompanying drawing explanation
Fig. 1 is the horizontal section structural representation of the display unit of prior art applying plasma display screen.
Fig. 2 is the basic structure schematic diagram of PDP in prior art.
Fig. 3 is that in prior art, PDP adopts the subfield of ADS driving method to form time distribution map.
Fig. 4 is the direct method of testing schematic diagram of PDP exoelectron in prior art.
Fig. 5 is the alive waveform schematic diagram of executing while adopting test macro described in the utility model to test.
Fig. 6 is test system structure block diagram described in the utility model.
Fig. 7 is driving circuit block diagram described in the utility model; 7a is scan drive circuit block diagram, and 7b is for maintaining driving circuit block diagram.
Fig. 8 is the connection diagram of display unit described in the utility model and test macro.
Fig. 9 is test macro described in the utility model display unit sparking voltage and schematic diagram of discharge time while testing.
In figure: 1 is prebasal plate, 2 is metacoxal plate, and 3 is dielectric layer, and 4 is medium protection film, and 5 is barrier, and 6 is phosphor powder layer, and 7 is visible ray, and 8 is optics backup system, and X is for maintaining electrode, and Y is scan electrode, and A is addressing electrode.
Embodiment
Below in conjunction with specific embodiment, the utility model is described in further detail, described in be to explanation of the present utility model rather than restriction.
The exoelectron test macro of a kind of media protection membrane material of the utility model, as shown in Figure 6, it comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises for providing when test to execute alive scan drive circuit and maintaining driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively scan electrode Y in tested plasma display panel (PDP) and maintain on electrode X; Described photomultiplier is arranged on the image outgoing side of the front panel of display unit in tested plasma display panel (PDP), and the electrical signal of photomultiplier is connected with oscillographic input end; Described oscillographic input end is also respectively by high-voltage probe and scan electrode Y with maintain electrode X and be connected, and output terminal is connected with the input end of computing machine; Described computing machine comprises the input media of executing alive loading parameters for arranging, and output terminal is connected with the input end of control circuit; Described control circuit output terminal is connected with driving circuit input end; Described power circuit is connected with control circuit with driving circuit respectively.
As preferably, described photomultiplier is for detection of the light signal being produced by working gas discharge process in display unit, and light signal is converted to electric signal is input in oscillograph; Oscillograph is also carried in scan electrode Y and maintains the voltage signal that applies on electrode X for testing correspondence; Computing machine is used for receiving that oscillograph collects Yi road electric signal and two-way applies voltage signal, and for the calculating of signal data to specific output; Control circuit is for being converted to switching signal by the loading parameters of computer export, and power circuit is used to driving circuit and control circuit that required voltage is provided.
Wherein, computing machine is for arranging the loading parameters such as the required shape formation of executing alive waveform of exoelectron test, cycle index, duration, also the discharge position of oscillograph transmission and the data of sparking voltage will be gathered simultaneously, form corresponding result of calculation, with the formal output of report, thereby draw for the assessment report to the test of medium protection film exoelectron emitting performance; The voltage that applies that driving circuit utilizes the switch control time sequence of control circuit transmission to realize the corresponding waveform that maintains, scans the output of two-way driving circuit is loaded into respectively maintaining on electrode and scan electrode of display screen; Oscillograph unit, be used for testing three road signals, wherein two-way preferably uses high-voltage probe acquisition scans electrode and maintains the alive waveform of executing on electrode, analysis-driven circuit working state, another road adopts photomultiplier transit instrument to gather the discharge scenario of display unit in measuring period, three circuit-switched data can pass to computing machine by interface, scanning voltage data while forming discharge position and electric discharge after analyzing.Photomultiplier converts the faint light signal producing in process gas discharge to electric signal to judge the generation of process gas discharge, thereby accurately gathers the poor of the test voltage that maintains in discharge process between electrode X and scan electrode Y.In use procedure, for each discharge cycle T of excitation cycle
ccycle Length and the time span of waveform rising edge, negative edge, and the time parameter of latent period all can carry out parameter adjustment and be realized corresponding sequential control by control circuit by computing machine, realize the accurate control of starting point and end point to applying voltage waveform.
At computing machine, control circuit is applied the transmission of voltage-drop loading correlation parameter, the namely transmission of Waveform Control parameter, preferably can adopt parameter list form, comprise on off state, the duration of corresponding state and the cycling time of various periodic waveforms of each control signal.This parameter list can on-the-fly modify each signal and sequential thereof, to guarantee that the display screen of different technical parameters can have the waveform adapting to it, realizes the Stability and veracity of test.And computing machine can increase the cycle index of excitation cycle as required to executing alive control, extend the time of latent period, adjust the waveform slope of test period, realize the Selection and Constitute to multiple waveforms such as square wave, index, triangles, increase exoelectron transmitting quantity, reduce the impact of wall electric charge on test result.Meet method of testing to the demand of controlling, can carry out in real time, after computer interface parameter modification, can carry out real time modifying by the communication of computing machine and control circuit.
In this preferred embodiment, as shown in Figure 8, between photomultiplier and the front panel of display unit, be provided with optics backup system, optics backup system comprises at least one group of eyepiece system, for making the sensing range of photomultiplier gather the target viewing area of target display unit or multiple display unit formation, make light signal form a millivolt magnitude voltage signals through focusing, filtration, the amplification of the optics backup system 8 of photomultiplier front end and test.Preferably, in eyepiece system, stack arranges optical filter to reduce the impact of surround lighting on test result.
In this preferred embodiment, power circuit adopts the pressure adjustable type D.C. regulated power supply that low pressure and high pressure can be provided.Scan drive circuit comprises the circuit and square-wave for applying voltage waveform control on scan electrode Y, upper slope circuit and lower slope circuit, and the described driving circuit that maintains comprises the circuit and square-wave and the slope circuit that on electrode X, apply voltage waveform control for maintaining.
In this preferred embodiment, driving circuit comprises that some ratings are at least the power device of 150A and 300V, and by its in parallel use, preferred power device adopts IGBT or switch mosfet pipe when needed.
On the basis of test macro described in the utility model, carry out the test of exoelectron by following method of testing, as shown in Figure 5, it comprises at least one cycle period T for testing, and described cycle period T comprises that the voltage carrying out continuously successively as follows applies the cycle
1) excitation cycle T
s; Alternately be applied to and comprise less a discharge cycle T maintaining on electrode X and scan electrode Y of tested plasma display panel (PDP)
cexciting voltage, at a discharge cycle T
cinterior working gas at least completes single step of releasing electric process; Exciting voltage is not less than the firing voltage V that in tested plasma display panel (PDP), working gas discharges required
f; Thereby maintaining the VUV gas discharge that is formed for exciting exoelectron between electrode X and scan electrode Y.
2) latent period T
w; At excitation cycle T
safter end, the voltage that applies maintaining on electrode X and scan electrode Y is placed on wait voltage, waits for that voltage is less than the firing voltage V that in tested plasma display panel (PDP), working gas discharges required
f; The life period of the exoelectron that the stand-by period produces while being not more than working gas electric discharge; Thereby reduce medium protection film surface wall electric charge; strengthen the quantity of exoelectron in discharge space electric charge, wait voltage can be selected on zero setting or a fixing fixed level position that can not cause electric discharge, in this preferred embodiment; as shown in Figure 5, to wait for that voltage selection zero setting is as example.
3) test period T
r; At latent period T
wafter end, maintaining the test voltage that applies respectively synchronous rising on electrode X and scan electrode Y, scan electrode Y and maintain the difference V of the test voltage between electrode X
dincrease gradually and only produce one action process gas discharge; Detect and record the light signal being produced by working gas discharge process in display unit in tested plasma display panel (PDP), scan electrode Y and maintain the difference V of the test voltage between electrode X while simultaneously obtaining producing light signal
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.The exoelectron of having realized in the discharge process to escaping electron institute participation is measured, and testing current of the prior art is become to visible ray test, changes to improve the accuracy of test by detecting corresponding impressed voltage.
Its method of testing ultimate principle is, in display unit internal discharge process, and the firing voltage V that gas discharge is required
ffor impressed voltage and discharge space internal charge formation internal electric field V
wsum.The voltage V that gas discharge is required
ffor certain value, produce impressed voltage corresponding on the time point of VUV position applying corresponding actual discharge on voltage, maintain on electrode X and scan electrode Y and execute alive voltage difference V
d, and the fields inside voltage V that display unit inside produces because of exoelectron
w=V
f– V
d.Therefore, by the position of test period internal cause working gas discharge generation VUV photon pulse and corresponding apply the scan electrode on voltage and maintain test voltage that electrode adds calculating process gas discharge in the difference V of test voltage
d, the namely impressed voltage of corresponding luminous point, and then can calculate internal electric field V with firing voltage and impressed voltage
wmagnitude of voltage.Now internal electric field is mainly formed by exoelectron, obtains internal electric field V
wjust can obtain afterwards the size of exoelectron, realize exoelectron and measure.
In method of testing, the structure mechanism of cycle period is: exoelectron derives from the Auger effect in electronics and hole compound nucleus process; the Auger electron transmitting that particularly 147nmVUV photon excitation produces to the band gap of medium protection film; so exoelectron has the longer life-span; and quantity is subject to the impact of gas discharge time; discharge time is more, and exoelectron quantity is also more.In the utility model, the discharge cycle T discharging by adjustment cycle
cnumber of times just can adjust the number of times of VUV photon excitation, and then increase the transmitting of effective Auger electron, improve exoelectron quantity.Changing the time span of latent period just can adjust and measure front exoelectron and the wall electric charge stand-by period before test period, after excitation cycle.Because the ion lifetime that working gas circuit produces is very short, continuity in time in latent period, wall electric charge will run off, and the exoelectron life-span is longer, after waiting process, the electric charge that can exist in display unit is mainly exoelectron, thereby has improved the accuracy of measurement result.Avoid in measuring process, due to the negligible amounts of exoelectron own, the electric current forming is very little, the problem being fallen into oblivion by environment current noise, the impact of extra electric field when working gas electric discharge by measuring the internal electric field forming in the inner exoelectron accumulation of display unit, and then the quantity of measurement exoelectron.
When test, the waveform of exciting voltage is one or more the combination in square wave, triangular wave, trapezoidal wave, multiple-pulse ripple, sine wave and exponential wave; The waveform of test voltage is oblique wave, and in this preferred embodiment, as shown in Figure 5, the waveform of exciting voltage is square wave, and the waveform of test voltage is oblique wave.
In the time adopting the utility model test, the stand-by period is greater than 1ms, and after this stand-by period, wall electric charge will run off in a large number, can further improve the accounting that escapes electric charge.Scan electrode Y in tested plasma display panel (PDP) and maintain electrode and be shorted together respectively and apply in succession voltage, addressing electrode A is shorted together ground connection and arranges, and exoelectron can not be subject to the impact of external circuit when guaranteeing to test, improves test accuracy.Meanwhile, in order to guarantee the correctness of data, by the repeatedly repeated test of same cycle duration T, obtain respectively the difference V of corresponding multiple test voltages
d, average as the difference V of test voltage
dfinal testing result.
When the utility model operation, by being alternately applied to the exciting voltage maintaining on electrode and scan electrode in excitation cycle, make to maintain the working gas discharge generation VUV between electrode and scan electrode, and then media protection membrane material is excited to generation exoelectron; The exciting voltage that comprises multiple discharge cycles can be by the quantity of the continuous accumulation exoelectron of the electric discharge of each working gas, thereby reduce greatly the difficulty of test of exoelectron, can also pass through the adjustment to discharge cycle quantity simultaneously, realization meets different test demands, control the quantity of exoelectron, control accurately, applied widely.
Utilize working gas because of electric discharge form the wall electric charge that is attached to medium protection film surface exist the cycle to have the characteristic in cycle much smaller than exoelectron, the wait voltage lower than firing voltage applying in latent period, the wall electric charge existing in latent period is progressively run off, and quantity reduces; Stand-by period by adjustment latent period reduces to minimum by display unit mesospore electric charge to escaping the impact of Electronic Testing, improve greatly the accounting of exoelectron at working gas Space-charge, thereby get rid of the harmful effect of test result mesospore electric charge, guaranteed the accuracy of test result.
By to executing alive control, realize the electric discharge of display unit working gas, thereby generation light signal, utilize the detection to light signal, and corresponding light signal position draws scan electrode and maintains test voltage poor of electrode, thereby the difference of the test voltage that can calculate by fixing gas ignition voltage and collection obtains the magnitude of voltage of internal electric field, because the internal electric field after latent period is mainly formed by exoelectron, therefore can obtain the quantity of exoelectron, test simple and convenient; In the utility model, adopt be by the collection of the light signal that escapes electron production to judge the generation of process gas discharge, and then obtain exoelectron produce electric field, calculate the quantity of the electronics escaping, realize the indirectly testing to escaping electronic surveying, avoided the impact of direct test Instrumental on measuring accuracy; And due to direct test to as if light signal but not current signal; overcome the annihilation effect of environment current noise to exoelectron Weak current; realize the Measurement accuracy to exoelectron; practical high with test accuracy, can be good at being applied in the medium protection film exoelectron measurement of various materials under varying environment.
When test, by the restriction to exciting voltage, reduce the operation easier of method of testing, by the restriction to test voltage wave, can meet easily test voltage and synchronously rise simultaneously, and the requirement of the difference of test voltage increase, reduce calculating and operation easier, improved testing efficiency.By the restriction of stand-by period lower limit, guarantee a large amount of losses of wall electric charge, make being mainly of existence in display unit escape electric charge, improve the accuracy of test.By in test process, the short circuit of scan electrode, maintain the short circuit of electrode, and the short circuit ground connection of addressing electrode, while having guaranteed test, exoelectron can not be subject to the impact of external circuit, has improved the accuracy of test.By the algorithm of averaging after the difference of test voltage is repeatedly measured, guarantee the correctness of computational data, avoid the randomness of image data, better improve the accuracy of test.
Concrete while utilizing test macro described in the utility model to carry out the test of exoelectron.
As shown in Figure 5, for a cycle period T who once tests, at excitation cycle T
sstage; by maintain the exciting voltage alternately changing applying on electrode X and scan electrode Y cause display unit in working gas excite electric discharge; this process gas discharge can produce a large amount of VUV photons, and VUV photon provides the electronics of energy exciting media diaphragm solid surface defect capture to escape into discharge space and forms exoelectron.Meanwhile, after gas ionization itself, can also form the wall electric charge that is attached to medium protection film surface.In this process, maintain upper alternately variation of electrode X and scan electrode Y and carry out the discharge cycle T that periodicity applies
cquantity determined that gas discharge produces the quantity of wall electric charge and exoelectron.Exciting voltage discharge cycle T
cmore, exoelectron is more, and more easily test, therefore needs according to actual test case discharge cycle T
cdynamically adjust.Concrete, excitation cycle adopts voltage magnitude V
s=200V, the single discharge cycle T using
cadopt the square wave that dutycycle is 50% to form, the cycle is 20 μ s, discharge cycle T
cquantity be 50.
At latent period T
wstage, maintain on electrode X and scan electrode Y and apply wait voltage, wait for that under voltage, electric discharge phenomena can not occur working gas, because the cycle that exists of wall electric charge will be much smaller than exoelectron, along with the increase of stand-by period, wall electric charge will progressively be passed, and quantity tails off, and exoelectron passes through at excitation cycle T
sinside continuous compound-excitation process, has longer life period, and its quantity does not have obvious variation.Improve the content of exoelectron in test electronics by latent period, strengthened the accuracy of test signal.Concrete, in latent period, wait for that voltage adopts scan electrode Y and the wait voltage maintaining on electrode X to be all set to 0V, whole latent period time T
w=5ms.
At test period T
rin the stage, maintain electrode X and scan electrode Y and apply respectively difform oblique wave seat test voltage, and the test voltage voltage magnitude wherein applying on scan electrode Y is V
s+ V
r, the amplitude that maintains the test voltage applying on electrode X is V
s, and use photomultiplier transit instrument test scan electrode Y and maintain the reference position and the voltage swing that between electrode X, discharge.The numerical value of the difference by test test voltage and then can calculate the quantity of exoelectron; Concrete, at test period T
r, the test voltage vertical uplift that scan electrode Y applies is V to amplitude
safter, progressively rise to voltage V with slope 2V/ μ s
r, V
r=200V.After this it is V that the voltage that, scan electrode Y applies vertically drops to amplitude
s, then be down to 0V with slope 1.6V/ μ s, maintain the test voltage that electrode X applies and progressively rise to voltage magnitude as V take slope 1.4V/ μ s
s, electrode Y to be scanned and to maintain the upper test voltage of the electrode X amplitude that peaks be respectively V
s+ V
rand V
safter, maintain electrode drop to 0V, under the waveform of this test voltage, complete a test period T
rtest process.
When test, as shown in Figure 6, computing machine can the test of adaptive testing system to different medium diaphragm material for the test macro of employing; Power circuit provides driving circuit and the required voltage of control circuit, can adopt pressure adjustable type heavy DC stabilized voltage supply; Concrete, control circuit adopts the logic control device with logical process and interface communication ability to realize, output power device control signal Wei14 road, and the sequential minimum resolution of the signal that generates is 25ns; Driving circuit is for the concrete described method of this preferred embodiment and requirements set, and as shown in Figure 7, scan drive circuit comprises structure: circuit and square-wave, upper slope circuit, lower slope circuit, maintain driving circuit and comprise circuit and square-wave and slope circuit.This driving circuit can produce in the utility model embodiment, propose apply the needed square wave of voltage and oblique wave, the power device that driving circuit comprises is rated current and is not less than 150A, rated voltage is not less than High Speed I GBT or the switch mosfet pipe of 300V, in order to meet the needs of actual waveform electric current, in partial circuit, these power devices carry out parallel connection use, and in this preferred embodiment, adopting ratings is the power device of 160A and 360V.Execute alive Waveform Control and produce by control circuit whole, control circuit is exported 14 road logical sequence signals altogether, control respectively the turntable driving shown in Fig. 7 and maintained the switch controlling signal of QerH, QerL in driving circuit, QsusH, QsusL, QrampH, QpassH, QrampL, QpassL constant power device, the V in Fig. 5 and 7
s=200V, V
setup=200V, V
y=0V is high voltage direct current, is provided by power circuit unit, and in the present embodiment, in whole cycle period T, executing alive waveform is square wave and oblique wave combined waveform.
When test, the display unit syndeton of test macro and tested plasma display panel (PDP) as shown in Figure 8, photomultiplier is applied directly to by optics backup system 8 on the prebasal plate 1 of display unit, thereby photomultiplier can be tested the faint light that maintains the working gas discharge generation between electrode X and scan electrode Y, and convert light signal to an electric signal formation electric impulse signal higher than neighbourhood noise.The photomultiplier using in this preferred embodiment can pick up nA level dark current, there is higher radiant sensitivity, can pick up the photon that electric discharge produces in display unit and be amplified to a millivolt magnitude voltage signals and be transferred to oscillograph, the voltage signal of this rank can normally be identified by oscillograph.Do not fallen into oblivion by outer signals in order to ensure this VUV photon signal can normally pick up, can also in the stack of optics backup system, add in use the optical filter of respective wavelength to filter the impact of surround lighting on test result, the sensitivity that improves signal.
The data corresponding relation obtaining after test as shown in Figure 9, at test period T
rafter beginning, the test voltage vertical uplift applying on scan electrode Y is V to amplitude
sthe test voltage that rear beginning and maintaining applies on electrode continues synchronous rising with the oblique wave of Different Slope.Now, scan electrode and maintain alive voltage difference on electrode and progressively increase, exoelectron is at the electric charge V of display unit inner accumulation
wand the difference V of the test voltage applying
dsum reaches working gas firing voltage V
fafter, between two electrodes, occur that dark discharge produces VUV photon.Now photomultiplier can be tested a luminous brightness peak, the A point in these brightness corresponding diagram 9 scan electrode test voltage wave and maintain C point on electrode test voltage waveform, the voltage V between test C point and A point
aCjust can calculate gas ignition voltage V
fwith voltage V
aCbetween pressure reduction, this pressure reduction is mainly accumulated the V forming in display unit inner space by exoelectron
w.And the t Changing Pattern calculating between A point and measuring period starting point B can also be studied the impact of exoelectron on discharge stability.
According to the technical scheme of the utility model embodiment, offer control circuit by the corresponding waveform parameter of computer installation and sequential relationship, and produce corresponding power device clock signal and form the waveform of corresponding test voltage by control circuit in driving circuit.This method can realize comparatively flexibly, simply Waveform Control and generation, and can, according to actual displayed screen test needs, dynamically adjust shape, quantity and the time span of in excitation cycle, executing waveform in alive discharge cycle.This employing parameter arranges controls the method that test waveform produces, and executes under alive waveform studying difference, and the variation of exoelectron emitting performance and raising exoelectron transmitting quantity, increase test accuracy and have positive meaning.
In the embodiment that adopts the utility model to measure, measure mainly round in scanning with maintain and maintain that the voltage difference between scan electrode carries out while forming dark discharge on electrode oblique wave, this voltage difference reflected excitation cycle form exoelectron quantity number, although exoelectron lazy weight is tested required electric current, the difference V of the test voltage applying can change greatly electric discharge during in display unit inside to produce conventional equipment
d.In addition; by optics backup system; the research of exoelectron transmitting can be concentrated on to required concrete display unit or concrete region; acquired results can be got rid of ambient noise interference; there is higher accuracy and signal to noise ratio (S/N ratio), to studies show that the transmitting of screen media protection membrane material exoelectron has great importance.
Obviously, those skilled in the art should be understood that, the modules of above-mentioned utility model or step can realize by multiple relevant device, device, and they can be combined in a device inside or be distributed on the network of multiple devices formations, are even solidified into circuit module and realize.Therefore, the utility model is not restricted to the combination of any specific hardware and software.
The present embodiment has only provided the concrete example application of part, belongs to the utility model preferred embodiment, is not limited to the utility model.For those skilled in the art of correlation technique research, the utility model still has multiple change and variation.All within by utility model right claimed range; design the relevant of different excitation cycles, latent period and measuring period and in prior art, modify, be equal to the various deformation proving installation that replacement, improvement etc. form according to above-described embodiment, all should be encompassed among protection domain of the present utility model.
Claims (8)
1. an exoelectron test macro for media protection membrane material, is characterized in that, comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises for providing when test to execute alive scan drive circuit and maintaining driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively scan electrode Y in tested plasma display panel (PDP) and maintain on electrode X; Described photomultiplier is arranged on the image outgoing side of display unit front panel in tested plasma display panel (PDP), and the electrical signal of photomultiplier is connected with oscillographic input end; Described oscillographic input end is also respectively by high-voltage probe and scan electrode Y with maintain electrode X and be connected, and output terminal is connected with the input end of computing machine; Described computing machine comprises the input media of executing alive loading parameters for arranging, and output terminal is connected with the input end of control circuit; Described control circuit output terminal is connected with driving circuit input end; Described power circuit is connected with control circuit with driving circuit respectively.
2. the exoelectron test macro of a kind of media protection membrane material according to claim 1, it is characterized in that, described photomultiplier is for detection of the light signal being produced by working gas discharge process in display unit, and light signal is converted to electric signal is input in oscillograph; Oscillograph is also carried in scan electrode Y and maintains the voltage signal that applies on electrode X for testing correspondence; Computing machine is used for receiving that oscillograph collects Yi road electric signal and two-way applies voltage signal, and for the calculating of signal data to specific output; Control circuit is for being converted to switching signal by the loading parameters of computer export, and power circuit is used to driving circuit and control circuit that required voltage is provided.
3. the exoelectron test macro of a kind of media protection membrane material according to claim 1 and 2; it is characterized in that; between described photomultiplier and the front panel of display unit, be provided with optics backup system; optics backup system comprises at least one group of eyepiece system, for making the sensing range of photomultiplier gather the target viewing area of target display unit or multiple display unit formation.
4. the exoelectron test macro of a kind of media protection membrane material according to claim 3, is characterized in that, in described eyepiece system, stack arranges optical filter.
5. the exoelectron test macro of a kind of media protection membrane material according to claim 1 and 2, is characterized in that, described power circuit comprises pressure adjustable type D.C. regulated power supply.
6. the exoelectron test macro of a kind of media protection membrane material according to claim 1 and 2; it is characterized in that; described scan drive circuit comprises the circuit and square-wave for applying voltage waveform control on scan electrode Y, upper slope circuit and lower slope circuit, and the described driving circuit that maintains comprises the circuit and square-wave and the slope circuit that on electrode X, apply voltage waveform control for maintaining.
7. the exoelectron test macro of a kind of media protection membrane material according to claim 6, is characterized in that, described driving circuit comprises that some rated current are not less than the power device that 150A, rated voltage are not less than 300V.
8. the exoelectron test macro of a kind of media protection membrane material according to claim 7, is characterized in that, described power device adopts IGBT or switch mosfet pipe.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109660225A (en) * | 2018-12-18 | 2019-04-19 | 北方民族大学 | The multi-layer piezoelectric substrate and preparation method thereof of beryllium alumin(i)um alloy film is set |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109660225A (en) * | 2018-12-18 | 2019-04-19 | 北方民族大学 | The multi-layer piezoelectric substrate and preparation method thereof of beryllium alumin(i)um alloy film is set |
| CN109660225B (en) * | 2018-12-18 | 2023-03-03 | 北方民族大学 | Multi-layer piezoelectric substrate provided with beryllium-aluminum alloy film and preparation method thereof |
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