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CN103606589A - Amorphous silicon film solar cell and manufacturing method thereof - Google Patents

Amorphous silicon film solar cell and manufacturing method thereof Download PDF

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CN103606589A
CN103606589A CN201310313476.6A CN201310313476A CN103606589A CN 103606589 A CN103606589 A CN 103606589A CN 201310313476 A CN201310313476 A CN 201310313476A CN 103606589 A CN103606589 A CN 103606589A
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amorphous silicon
deposition
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cell
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张津燕
郁操
胡安红
曲铭浩
徐希翔
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Kunming Yuantong photovoltaic equipment Co. Ltd. platinum Yang
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KUNMING APOLLO YUANHONG ENERGY SCIENCE & TECHNOLOGY Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/10Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
    • H10F71/103Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material including only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • H10F10/17Photovoltaic cells having only PIN junction potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/14Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • H10F77/147Shapes of bodies
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract

本发明公开了一种非晶硅薄膜太阳能电池及其制造方法,包括步骤:提供基板;在所述基板表面沉积透明导电前电极层;在所述透明导电前电极层表面沉积包括非晶硅顶层电池的叠层电池层;在所述叠层电池层表面沉积导电背电极层;其中,所述非晶硅顶层电池的本征层从P层到N层分为四步沉积,靠近P层的第一层沉积高氢稀释比的非晶硅层;第二层沉积第一非晶硅层;第三层沉积主体层,第四层沉积第二非晶硅层。本发明的方法通过对通过简单的沉积工艺控制和组合优化,很好的解决产业化进程中成本和质量的矛盾,即高速沉积和高质量非晶硅材料之间的矛盾。

Figure 201310313476

The invention discloses an amorphous silicon thin-film solar cell and a manufacturing method thereof, comprising the steps of: providing a substrate; depositing a transparent conductive front electrode layer on the surface of the substrate; depositing an amorphous silicon top layer on the surface of the transparent conductive front electrode layer The stacked battery layer of the battery; a conductive back electrode layer is deposited on the surface of the stacked battery layer; wherein, the intrinsic layer of the amorphous silicon top battery is deposited in four steps from the P layer to the N layer, and the layer near the P layer The first layer deposits an amorphous silicon layer with a high hydrogen dilution ratio; the second layer deposits the first amorphous silicon layer; the third layer deposits a main body layer, and the fourth layer deposits a second amorphous silicon layer. The method of the invention well solves the contradiction between cost and quality in the process of industrialization through simple deposition process control and combination optimization, that is, the contradiction between high-speed deposition and high-quality amorphous silicon material.

Figure 201310313476

Description

非晶硅薄膜太阳能电池及其制造方法Amorphous silicon thin film solar cell and manufacturing method thereof

技术领域technical field

本发明涉及光伏太阳能电池技术领域,特别涉及一种非晶硅薄膜太阳能电池及其制造方法。The invention relates to the technical field of photovoltaic solar cells, in particular to an amorphous silicon thin-film solar cell and a manufacturing method thereof.

背景技术Background technique

硅基薄膜太阳能电池,尤其是非晶硅与微晶硅相结合的多叠层电池结构,已经成为太阳能光伏领域中最有竞争力的一种替代电池,产业化的电池效率已经达到10%的水准。目前这种多叠层电池的光电转换效率仍然偏低,需要进一步将转换效率提高到12%以上。然而,效率的提高依赖于新工艺或新结构的引入,来提高光的有效吸收,降低电池的结构缺陷和增大电池的电压和电流。Silicon-based thin-film solar cells, especially the multi-stack cell structure combining amorphous silicon and microcrystalline silicon, have become the most competitive alternative cells in the field of solar photovoltaics, and the efficiency of industrialized cells has reached 10%. . At present, the photoelectric conversion efficiency of this multi-stack battery is still low, and it is necessary to further increase the conversion efficiency to more than 12%. However, the improvement of efficiency depends on the introduction of new processes or new structures to improve the effective absorption of light, reduce the structural defects of the cell and increase the voltage and current of the cell.

硅基薄膜太阳电池由于其本身特殊的优势,大面积连续化生产、成本相对低廉、原材料丰富等,近几年来在实验室研究和产业化方面得到了快速的发展。不论是非晶硅单结电池、非晶硅/微晶硅叠层电池,还是非晶硅/非晶硅锗/微晶硅三结电池,其电池堆栈结构中的顶层均为非晶硅电池,既顶层电池的发电有源层材料为非晶硅本征层。自从1977年Staebler和Wronski发现了非晶硅材料的光致衰退现象之后,很多研究机构和研究人员都致力于开发高光照稳定性、低光致衰减的非晶硅太阳电池。降低非晶硅光致衰减的方法主要从两方面入手:1)采用双结或三结叠层电池,降低非晶硅发电层的厚度;2)采用高质量的非晶本征层。而高质量、结构相对致密的非晶硅材料一般需要采用高氢稀释比、低沉积功率等低速沉积的方法来实现。对产业化来说,低的沉积速率意味着低的设备产出、高的投资成本,因此采用高速沉积薄膜的工艺沉积非晶硅本征层是产业化道路的必要条件。Silicon-based thin-film solar cells have achieved rapid development in laboratory research and industrialization in recent years due to their special advantages, such as large-area continuous production, relatively low cost, and abundant raw materials. Whether it is an amorphous silicon single-junction battery, an amorphous silicon/microcrystalline silicon stacked battery, or an amorphous silicon/amorphous silicon germanium/microcrystalline silicon triple-junction battery, the top layer of the battery stack structure is an amorphous silicon battery. That is, the material of the power generation active layer of the top cell is the intrinsic layer of amorphous silicon. Since Staebler and Wronski discovered the light-induced degradation of amorphous silicon materials in 1977, many research institutions and researchers have devoted themselves to developing amorphous silicon solar cells with high light stability and low light-induced degradation. The method of reducing the light-induced attenuation of amorphous silicon mainly starts from two aspects: 1) adopt double-junction or triple-junction laminated cells to reduce the thickness of the amorphous silicon power generation layer; 2) adopt high-quality amorphous intrinsic layer. However, amorphous silicon materials with high quality and relatively dense structure generally need to be realized by low-speed deposition methods such as high hydrogen dilution ratio and low deposition power. For industrialization, a low deposition rate means low equipment output and high investment costs. Therefore, it is a necessary condition for industrialization to deposit an intrinsic layer of amorphous silicon using a high-speed thin film deposition process.

发明内容Contents of the invention

因此,本发明的目的在于提供一种非晶硅薄膜太阳能电池的制造方法,包括步骤:Therefore, the object of the present invention is to provide a kind of manufacture method of amorphous silicon thin-film solar cell, comprising steps:

提供基板;Provide the substrate;

在所述基板表面沉积透明导电前电极层;Depositing a transparent conductive front electrode layer on the surface of the substrate;

在所述透明导电前电极层表面沉积包括非晶硅顶层电池的叠层电池层;Depositing a stacked cell layer comprising an amorphous silicon top layer cell on the surface of the transparent conductive front electrode layer;

在所述叠层电池层表面沉积导电背电极层;Depositing a conductive back electrode layer on the surface of the laminate battery layer;

其中,所述非晶硅顶层电池的本征层从P层到N层分为四步沉积,靠近P层的第一层沉积高氢稀释比的非晶硅层;第二层沉积第一非晶硅层;第三层沉积主体层,第四层沉积第二非晶硅层。Wherein, the intrinsic layer of the amorphous silicon top cell is deposited in four steps from the P layer to the N layer, and the first layer near the P layer is deposited with an amorphous silicon layer with a high hydrogen dilution ratio; the second layer is deposited with the first amorphous silicon layer. a crystalline silicon layer; the third layer deposits the main body layer, and the fourth layer deposits the second amorphous silicon layer.

所述叠层电池层包括非晶硅PIN或NIP单结电池、非晶硅/微晶硅叠层电池、或非晶硅/非晶硅锗/微晶硅三结电池。The stacked battery layer includes an amorphous silicon PIN or NIP single junction battery, an amorphous silicon/microcrystalline silicon stacked battery, or an amorphous silicon/amorphous silicon germanium/microcrystalline silicon triple junction battery.

所述高氢稀释比的非晶硅层的沉积条件为高氢稀释比,H2/SiH4为5-15,沉积压力为0.3-0.5mbar,功率密度为180-280W/m2,膜层厚度为5-30nm。The deposition conditions of the amorphous silicon layer with high hydrogen dilution ratio are high hydrogen dilution ratio, H 2 /SiH 4 is 5-15, deposition pressure is 0.3-0.5mbar, power density is 180-280W/m 2 , the film layer The thickness is 5-30nm.

所述第一非晶硅层的沉积条件为:H2/SiH4的比例为4-10,沉积压力为0.3-0.5mbar,功率密度为100-160W/m2,膜层厚度为20-60nm。The deposition conditions of the first amorphous silicon layer are: the ratio of H2 / SiH4 is 4-10, the deposition pressure is 0.3-0.5mbar, the power density is 100-160W/ m2 , and the film thickness is 20-60nm .

所述主体层4为高速沉积层,沉积速率在4A/s以上,H2/SiH4的比例为1-4,沉积压力为0.4-0.7mbar,功率密度为220-280W/m2,膜层厚度为100-400nm。The main body layer 4 is a high-speed deposition layer, the deposition rate is above 4A/s, the ratio of H 2 /SiH 4 is 1-4, the deposition pressure is 0.4-0.7mbar, and the power density is 220-280W/m 2 . The thickness is 100-400nm.

所述第二非晶硅层的沉积条件为H2/SiH4的比例为4-10,沉积压力0.3-0.5mbar,功率密度100-160W/m2,膜层厚度10-30nm。The deposition conditions of the second amorphous silicon layer are that the ratio of H 2 /SiH 4 is 4-10, the deposition pressure is 0.3-0.5 mbar, the power density is 100-160 W/m 2 , and the film thickness is 10-30 nm.

所述基板为玻璃、PI膜、不锈钢或者铝箔。The substrate is glass, PI film, stainless steel or aluminum foil.

所述透明导电前电极层为SnO2:F、ZnO:B、ZnO:Al、Al/AZO或Al/Ag/GZO。The transparent conductive front electrode layer is SnO 2 :F, ZnO:B, ZnO:Al, Al/AZO or Al/Ag/GZO.

所述背电极层为透明导电氧化物/金属复合膜或者透明导电膜ZnO:B。The back electrode layer is a transparent conductive oxide/metal composite film or a transparent conductive film ZnO:B.

本发明还相应提供了一种非晶硅薄膜太阳能电池,包括基板、透明导电前电极层、以及包括非晶硅顶层电池的叠层电池层和导电背电极层,所述非晶硅顶层电池的本征层从P层到N层依次包括高氢稀释比的非晶硅层、第一非晶硅层、主体层和第二非晶硅层。The present invention also provides an amorphous silicon thin-film solar cell correspondingly, comprising a substrate, a transparent conductive front electrode layer, and a stacked battery layer comprising an amorphous silicon top cell and a conductive back electrode layer, the amorphous silicon top cell The intrinsic layer sequentially includes an amorphous silicon layer with a high hydrogen dilution ratio, a first amorphous silicon layer, a main body layer and a second amorphous silicon layer from the P layer to the N layer.

与现有技术相比,本发明具有以下优点:Compared with the prior art, the present invention has the following advantages:

本发明的方法通过对通过简单的沉积工艺控制和组合优化,很好的解决产业化进程中成本和质量的矛盾,即高速沉积和高质量非晶硅材料之间的矛盾。拥有此结构非晶硅本征层的电池具有高的光电转换效率和高的光照稳定性,可以在4A/s的高速沉积条件下得到光致衰减系数在15%以内的非晶硅单结电池和光致衰减系数在10%以内的非晶硅/微晶硅叠层电池。The method of the invention well solves the contradiction between cost and quality in the process of industrialization through simple deposition process control and combination optimization, that is, the contradiction between high-speed deposition and high-quality amorphous silicon material. The cell with this structure of the intrinsic layer of amorphous silicon has high photoelectric conversion efficiency and high light stability, and can obtain an amorphous silicon single-junction cell with a light-induced attenuation coefficient within 15% under the high-speed deposition condition of 4A/s And amorphous silicon/microcrystalline silicon laminated cells with a light-induced attenuation coefficient within 10%.

附图说明Description of drawings

通过附图中所示的本发明的优选实施例的更具体说明,本发明的上述及其它目的、特征和优势将更加清晰。在全部附图中相同的附图标记未必指示相同的部分。并未刻意按比例绘制附图,重点在于示出本发明的主旨。在附图中,为清楚起见,放大了层的厚度。The above and other objects, features and advantages of the present invention will be more apparent by a more specific description of preferred embodiments of the present invention shown in the accompanying drawings. The same reference numerals do not necessarily refer to the same parts throughout the drawings. The drawings have not been drawn to scale, emphasis instead being placed upon illustrating the gist of the invention. In the drawings, the thickness of layers are exaggerated for clarity.

图1为说明本发明方法的非晶硅薄膜太阳能电池结构示意图;Fig. 1 is the structural representation of the amorphous silicon thin-film solar cell illustrating the inventive method;

图2为根据本发明实施例的非晶硅薄膜太阳能电池的结构示意图。FIG. 2 is a schematic structural view of an amorphous silicon thin-film solar cell according to an embodiment of the present invention.

所述示图是说明性的,而非限制性的,在此不能过度限制本发明的保护范围。The illustrations are illustrative rather than restrictive, and the scope of protection of the invention should not be unduly limited here.

具体实施方式Detailed ways

为使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附图对本发明的具体实施方式做详细的说明。在下面的描述中阐述了很多具体细节以便于充分理解本发明。但是本发明能够以很多不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本发明内涵的情况下做类似推广。因此本发明不受下面公开的具体实施的限制。In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many ways other than those described here, and those skilled in the art can make similar extensions without departing from the connotation of the present invention. Accordingly, the invention is not limited to the specific implementations disclosed below.

本发明为了解决产业化进程中低成本和高质量之间的矛盾,即高速沉积与高质量非晶硅材料层之间的矛盾,本发明提出了四步法沉积非晶硅本征层的方法。实验发现,对于非晶硅材料而言,造成其光致衰减的主要原因为短波段高能量的入射光,而长波段低能量的入射光对材料的破坏作用相对较弱。短波段太阳光主要在非晶硅顶电池的P层和靠近P层的非晶本征层中被吸收。因此,靠近P层的非晶本征层必须具有高质量和高光照稳定性,而主体部分的非晶硅本征层的质量可适当降低。靠近N层的本征层材料亦采用高质量的非晶硅层,该层材料结构致密,起到了很好的界面钝化作用。因此本发明的方法可以在基本不降低非晶硅太阳电池光照稳定性的前提下,大大提高非晶硅本征层的沉积速率,提高设备产能。In order to solve the contradiction between low cost and high quality in the process of industrialization, that is, the contradiction between high-speed deposition and high-quality amorphous silicon material layer, the present invention proposes a four-step method for depositing an intrinsic layer of amorphous silicon . Experiments have found that for amorphous silicon materials, the main cause of light-induced attenuation is short-wavelength high-energy incident light, while long-wavelength low-energy incident light has relatively weak damage to the material. Short-wavelength sunlight is mainly absorbed in the P layer of the amorphous silicon top cell and the amorphous intrinsic layer close to the P layer. Therefore, the amorphous intrinsic layer near the P layer must have high quality and high light stability, while the quality of the amorphous silicon intrinsic layer in the main part can be appropriately reduced. The material of the intrinsic layer close to the N layer is also made of high-quality amorphous silicon layer, which has a dense structure and plays a good role in interface passivation. Therefore, the method of the present invention can greatly increase the deposition rate of the intrinsic layer of amorphous silicon and improve the production capacity of the equipment without substantially reducing the light stability of the amorphous silicon solar cell.

四步法沉积的非晶硅本征层第一层(靠近P层)沉积高氢稀释比的非晶硅层;第二层沉积高质量非晶硅层;第三层沉积主体层,采用高速沉积的方法制备,沉积速率可以在4A/s以上;第四层沉积高质量的非晶硅层。Intrinsic layer of amorphous silicon deposited by four-step method The first layer (close to the P layer) deposits an amorphous silicon layer with a high hydrogen dilution ratio; the second layer deposits a high-quality amorphous silicon layer; the third layer deposits the main layer, using high-speed The deposition method is prepared, and the deposition rate can be above 4A/s; the fourth layer deposits a high-quality amorphous silicon layer.

本发明的非晶硅薄膜太阳能电池的制造方法,首先提供基板,在所述基板表面沉积透明导电前电极层,在所述透明导电前电极层表面沉积包括非晶硅顶层电池的叠层电池层,在所述叠层电池层表面沉积导电背电极层。其中,所述非晶硅顶层电池的本征层从P层到N层分为四步沉积,靠近P层的第一层沉积高氢稀释比的非晶硅层;第二层沉积第一非晶硅层;第三层沉积主体层,第四层沉积第二非晶硅层。The manufacturing method of the amorphous silicon thin-film solar cell of the present invention first provides a substrate, deposits a transparent conductive front electrode layer on the surface of the substrate, and deposits a stacked battery layer including an amorphous silicon top layer battery on the surface of the transparent conductive front electrode layer , depositing a conductive back electrode layer on the surface of the laminate battery layer. Wherein, the intrinsic layer of the amorphous silicon top cell is deposited in four steps from the P layer to the N layer, and the first layer near the P layer is deposited with an amorphous silicon layer with a high hydrogen dilution ratio; the second layer is deposited with the first amorphous silicon layer. a crystalline silicon layer; the third layer deposits the main body layer, and the fourth layer deposits the second amorphous silicon layer.

图1为说明本发明方法的非晶硅薄膜太阳能电池结构示意图。如图1所示,本发明的非晶硅薄膜太阳能电池的制造方法首先在玻璃、PI膜基板1上沉积透明导电薄膜2;在透明导电薄膜2上依次沉积非晶硅薄膜的P型导电层3、非晶硅本征层4(包括高氢稀释比的非晶硅层41、第一非晶硅层42、主体层43和第二非晶硅层44);在非晶硅本征层4上面沉积N型导电层5;在N型导电层5上沉积氧化物/金属复合膜6。其中,本征层41为高氢稀释比的非晶硅本征层,沉积速率为0.5-1A/s,厚度为5-30nm;本征层42为高质量非晶硅层,沉积速率为0.5-2A/s,厚度为20-60nm;本征层43为快速沉积的非晶硅层,沉积速率在3A/s以上;本征层44为高质量的非晶硅层,沉积速率为0.5-2A/s,厚度为10-30nm。Fig. 1 is a schematic diagram illustrating the structure of an amorphous silicon thin-film solar cell illustrating the method of the present invention. As shown in Figure 1, the manufacturing method of amorphous silicon thin film solar cell of the present invention at first deposits transparent conductive film 2 on glass, PI film substrate 1; 3. Intrinsic layer 4 of amorphous silicon (including an amorphous silicon layer 41 with a high hydrogen dilution ratio, a first amorphous silicon layer 42, a main body layer 43 and a second amorphous silicon layer 44); in the intrinsic layer of amorphous silicon An N-type conductive layer 5 is deposited on 4; an oxide/metal composite film 6 is deposited on the N-type conductive layer 5. Among them, the intrinsic layer 41 is an intrinsic layer of amorphous silicon with a high hydrogen dilution ratio, the deposition rate is 0.5-1A/s, and the thickness is 5-30nm; the intrinsic layer 42 is a high-quality amorphous silicon layer, and the deposition rate is 0.5 -2A/s, with a thickness of 20-60nm; the intrinsic layer 43 is a rapidly deposited amorphous silicon layer, and the deposition rate is above 3A/s; the intrinsic layer 44 is a high-quality amorphous silicon layer, and the deposition rate is 0.5- 2A/s, the thickness is 10-30nm.

实施例1:在玻璃基板1上采用CVD法沉积800nm的SnO2:F薄膜2,作为电池的透明前电极。在2上采用等离子体增强气相化学沉积法(PECVD)依次制备15nm的P型导电a-SiC:H层3.1、非晶硅本征层41、42、43和44;在非晶硅本征层4上面沉积20nm的N型导电a-Si:H层5;在N型导电层5上沉积AZO/Al复合背电极6。其中非晶硅层41的沉积条件为高氢稀释比,H2/SiH4为10,沉积压力为0.3mbar,功率密度为210W/m2,膜层厚度为10nm;非晶硅层42的沉积条件为H2/SiH4为4,沉积压力为0.3mbar,功率密度为132W/m2,膜层厚度为50nm;非晶硅层43为高速沉积层,沉积速率为4.5A/s,H2/SiH4为1-4,沉积压力为0.5mbar,功率密度为260W/m2,膜层厚度为280nm;非晶硅层44为高质量非晶硅层,沉积条件H2/SiH4为4,沉积压力为0.5mbar,功率密度为130W/m2,膜层厚度为30nm。相对采用4.5A/s高速沉积单层本征层结构电池而言,此三层结构下得到的非晶硅薄膜太阳电池的光致衰减系数改善了15.8%(相对值),其1000小时光照后的光致衰减系数控制在16%以内。Example 1: A 800nm SnO 2 :F thin film 2 is deposited on a glass substrate 1 by CVD method as a transparent front electrode of a battery. On 2, P-type conductive a-SiC:H layer 3.1, amorphous silicon intrinsic layers 41, 42, 43 and 44 are sequentially prepared by plasma enhanced chemical vapor deposition (PECVD) of 15 nm; 4. A 20nm N-type conductive a-Si:H layer 5 is deposited on it; and an AZO/Al composite back electrode 6 is deposited on the N-type conductive layer 5. The deposition conditions of the amorphous silicon layer 41 are high hydrogen dilution ratio, H 2 /SiH 4 is 10, the deposition pressure is 0.3mbar, the power density is 210W/m 2 , and the film thickness is 10nm; the deposition of the amorphous silicon layer 42 The condition is that H 2 /SiH 4 is 4, the deposition pressure is 0.3mbar, the power density is 132W/m 2 , and the film thickness is 50nm; the amorphous silicon layer 43 is a high-speed deposition layer, the deposition rate is 4.5A/s, and the H 2 /SiH 4 is 1-4, the deposition pressure is 0.5mbar, the power density is 260W/m 2 , the film thickness is 280nm; the amorphous silicon layer 44 is a high-quality amorphous silicon layer, and the deposition condition H 2 /SiH 4 is 4 , the deposition pressure is 0.5mbar, the power density is 130W/m 2 , and the film thickness is 30nm. Compared with the solar cell with single-layer intrinsic layer structure deposited at a high speed of 4.5A/s, the light-induced attenuation coefficient of the amorphous silicon thin-film solar cell obtained under the three-layer structure has been improved by 15.8% (relative value), and after 1000 hours of light The light-induced attenuation coefficient is controlled within 16%.

实施例2:在玻璃基板1上采用LPCVD法沉积1500nm的ZnO:B薄膜2,作为电池的透明前电极。在2上采用等离子体增强气相化学沉积法(PECVD)依次制备15nm的P型导电a-SiC:H层3.1、非晶硅本征层41、42、43和44;在非晶硅本征层4上面沉积20nm的N型导电a-Si:H层5;在N型导电层5上沉积1μm厚的微晶硅PIN底电池;然后采用LPCVD的方法沉积1600nm厚的ZnO:B薄膜背电极6。其中非晶硅层41的沉积条件为高氢稀释比,H2/SiH4为10,沉积压力为0.3mbar,功率密度为210W/m2,膜层厚度为10nm;非晶硅层42的沉积条件为H2/SiH4为4,沉积压力为0.3mbar,功率密度为132W/m2,膜层厚度为40nm;非晶硅层43为高速沉积层,沉积速率为4.5A/s,H2/SiH4为1-4,沉积压力为0.5mbar,功率密度为260W/m2,膜层厚度为140nm;非晶硅层44为高质量非晶硅层,沉积条件H2/SiH4为4,沉积压力为0.5mbar,功率密度为130W/m2,膜层厚度为30nm。相对采用4.5A/s高速沉积单层220nm厚的非晶硅本征层结构电池而言,此三层结构下得到的非晶硅/微晶硅叠层薄膜太阳电池的光致衰减系数改善了16.7%(相对值),其1000小时光照后的光致衰减系数控制在10%以内。Example 2: A 1500nm ZnO:B thin film 2 is deposited on a glass substrate 1 by LPCVD method as a transparent front electrode of a battery. On 2, P-type conductive a-SiC:H layer 3.1, amorphous silicon intrinsic layers 41, 42, 43 and 44 are sequentially prepared by plasma enhanced chemical vapor deposition (PECVD) of 15 nm; 4 Deposit 20nm N-type conductive a-Si:H layer 5 above; Deposit 1 μm thick microcrystalline silicon PIN bottom cell on N-type conductive layer 5; Then adopt LPCVD method to deposit 1600nm thick ZnO:B film back electrode 6 . The deposition conditions of the amorphous silicon layer 41 are high hydrogen dilution ratio, H 2 /SiH 4 is 10, the deposition pressure is 0.3mbar, the power density is 210W/m 2 , and the film thickness is 10nm; the deposition of the amorphous silicon layer 42 The condition is that H 2 /SiH 4 is 4, the deposition pressure is 0.3mbar, the power density is 132W/m 2 , and the film thickness is 40nm; the amorphous silicon layer 43 is a high-speed deposition layer, the deposition rate is 4.5A/s, and the H 2 /SiH 4 is 1-4, the deposition pressure is 0.5mbar, the power density is 260W/m 2 , and the film thickness is 140nm; the amorphous silicon layer 44 is a high-quality amorphous silicon layer, and the deposition condition H 2 /SiH 4 is 4 , the deposition pressure is 0.5mbar, the power density is 130W/m 2 , and the film thickness is 30nm. Compared with the 220nm-thick amorphous silicon intrinsic layer structure cell with a single layer deposited at a high speed of 4.5A/s, the light-induced attenuation coefficient of the amorphous silicon/microcrystalline silicon stacked thin film solar cell obtained under this three-layer structure is improved. 16.7% (relative value), and its light-induced attenuation coefficient after 1000 hours of light is controlled within 10%.

图2为根据本发明实施例的非晶硅薄膜太阳能电池的结构示意图。如图2所示,根据本发明实施例的非晶硅薄膜太阳能电池,包括基板1、透明导电前电极层2、以及包括非晶硅顶层电池的叠层电池层和导电背电极层9,其中,非晶硅顶层电池的本征层4从P层3到N层5依次包括高氢稀释比的非晶硅层41、第一非晶硅层42、主体层43和第二非晶硅层44。叠层电池层还包括微晶硅PIN底电池,其包括p层6、i层7和n层8。FIG. 2 is a schematic structural view of an amorphous silicon thin-film solar cell according to an embodiment of the present invention. As shown in Figure 2, an amorphous silicon thin-film solar cell according to an embodiment of the present invention includes a substrate 1, a transparent conductive front electrode layer 2, and a stacked battery layer including an amorphous silicon top layer cell and a conductive back electrode layer 9, wherein , the intrinsic layer 4 of the amorphous silicon top layer cell includes an amorphous silicon layer 41 with a high hydrogen dilution ratio, a first amorphous silicon layer 42, a main body layer 43 and a second amorphous silicon layer in sequence from the P layer 3 to the N layer 5 44. The stack cell layer also includes a microcrystalline silicon PIN bottom cell, which includes a p-layer 6 , an i-layer 7 and an n-layer 8 .

以上所述,仅是本发明的较佳实施例而已,并非对本发明作任何形式上的限制。任何熟悉本领域的技术人员,在不脱离本发明技术方案范围情况下,都可利用上述揭示的技术内容对本发明技术方案做出许多可能的变动和修饰,或修改为等同变化的等效实施例。因此,凡是未脱离本发明技术方案的内容,依据本发明的技术实质对以上实施例所做的任何简单修改、等同变化及修饰,均仍属于本发明技术方案的保护范围内。The above descriptions are only preferred embodiments of the present invention, and do not limit the present invention in any form. Any person familiar with the art, without departing from the scope of the technical solution of the present invention, can use the technical content disclosed above to make many possible changes and modifications to the technical solution of the present invention, or modify it into equivalent embodiments of equivalent changes . Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments according to the technical essence of the present invention that do not deviate from the technical solution of the present invention still belong to the protection scope of the technical solution of the present invention.

Claims (10)

1.一种非晶硅薄膜太阳能电池的制造方法,包括步骤:1. A method for manufacturing an amorphous silicon thin-film solar cell, comprising steps: 提供基板;Provide the substrate; 在所述基板表面沉积透明导电前电极层;Depositing a transparent conductive front electrode layer on the surface of the substrate; 在所述透明导电前电极层表面沉积包括非晶硅顶层电池的叠层电池层;Depositing a stacked cell layer comprising an amorphous silicon top layer cell on the surface of the transparent conductive front electrode layer; 在所述叠层电池层表面沉积导电背电极层;Depositing a conductive back electrode layer on the surface of the laminate battery layer; 其中,所述非晶硅顶层电池的本征层从P层到N层分为四步沉积,靠近P层的第一层沉积高氢稀释比的非晶硅层;第二层沉积第一非晶硅层;第三层沉积主体层,第四层沉积第二非晶硅层。Wherein, the intrinsic layer of the amorphous silicon top cell is deposited in four steps from the P layer to the N layer, and the first layer near the P layer is deposited with an amorphous silicon layer with a high hydrogen dilution ratio; the second layer is deposited with the first amorphous silicon layer. a crystalline silicon layer; the third layer deposits the main body layer, and the fourth layer deposits the second amorphous silicon layer. 2.根据权利要求1所述的方法,其特征在于:所述叠层电池层包括非晶硅PIN或NIP单结电池、非晶硅/微晶硅叠层电池、或非晶硅/非晶硅锗/微晶硅三结电池。2. The method according to claim 1, characterized in that: the stacked battery layer comprises amorphous silicon PIN or NIP single-junction cells, amorphous silicon/microcrystalline silicon stacked cells, or amorphous silicon/amorphous Silicon germanium/microcrystalline silicon triple junction cells. 3.根据权利要求1所述的方法,其特征在于:所述高氢稀释比的非晶硅层的沉积条件为高氢稀释比,H2/SiH4为5-15,沉积压力为0.3-0.5mbar,功率密度为180-280W/m2,膜层厚度为5-30nm。3. The method according to claim 1, characterized in that: the deposition condition of the amorphous silicon layer with a high hydrogen dilution ratio is a high hydrogen dilution ratio, H 2 /SiH 4 is 5-15, and the deposition pressure is 0.3- 0.5mbar, power density 180-280W/m 2 , film thickness 5-30nm. 4.根据权利要求1所述的方法,其特征在于:所述第一非晶硅层的沉积条件为:H2/SiH4的比例为4-10,沉积压力为0.3-0.5mbar,功率密度为100-160W/m2,膜层厚度为20-60nm。4. The method according to claim 1, characterized in that: the deposition conditions of the first amorphous silicon layer are: the ratio of H 2 /SiH 4 is 4-10, the deposition pressure is 0.3-0.5 mbar, and the power density 100-160W/m 2 , and the film thickness is 20-60nm. 5.根据权利要求1所述的方法,其特征在于:所述主体层4为高速沉积层,沉积速率在4A/s以上,H2/SiH4的比例为1-4,沉积压力为0.4-0.7mbar,功率密度为220-280W/m2,膜层厚度为100-400nm。5. The method according to claim 1, characterized in that: the main body layer 4 is a high-speed deposition layer, the deposition rate is above 4A/s, the ratio of H 2 /SiH 4 is 1-4, and the deposition pressure is 0.4- 0.7mbar, power density 220-280W/m 2 , film thickness 100-400nm. 6.根据权利要求1所述的方法,其特征在于:所述第二非晶硅层的沉积条件为H2/SiH4的比例为4-10,沉积压力0.3-0.5mbar,功率密度100-160W/m2,膜层厚度10-30nm。6. The method according to claim 1, characterized in that: the deposition conditions of the second amorphous silicon layer are that the ratio of H 2 /SiH 4 is 4-10, the deposition pressure is 0.3-0.5 mbar, and the power density is 100- 160W/m 2 , film thickness 10-30nm. 7.根据权利要求1所述的方法,其特征在于:所述基板为玻璃、PI膜、不锈钢或者铝箔。7. The method according to claim 1, wherein the substrate is glass, PI film, stainless steel or aluminum foil. 8.根据权利要求1所述的方法,其特征在于:所述透明导电前电极层为SnO2:F、ZnO:B、ZnO:Al、Al/AZO或Al/Ag/GZO。8 . The method according to claim 1 , wherein the transparent conductive front electrode layer is SnO 2 :F, ZnO:B, ZnO:Al, Al/AZO or Al/Ag/GZO. 9.根据权利要求1所述的方法,其特征在于:所述背电极层为透明导电氧化物/金属复合膜或者透明导电膜ZnO:B。9. The method according to claim 1, characterized in that: the back electrode layer is a transparent conductive oxide/metal composite film or a transparent conductive film ZnO:B. 10.一种非晶硅薄膜太阳能电池,包括基板、透明导电前电极层、以及包括非晶硅顶层电池的叠层电池层和导电背电极层,其特征在于:所述非晶硅顶层电池的本征层从P层到N层依次包括高氢稀释比的非晶硅层、第一非晶硅层、主体层和第二非晶硅层。10. An amorphous silicon thin-film solar cell, comprising a substrate, a transparent conductive front electrode layer, and a stacked cell layer and a conductive back electrode layer comprising an amorphous silicon top cell, characterized in that: the amorphous silicon top cell The intrinsic layer sequentially includes an amorphous silicon layer with a high hydrogen dilution ratio, a first amorphous silicon layer, a main body layer and a second amorphous silicon layer from the P layer to the N layer.
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