CN103560763A - On-chip integrated body wave resonator and manufacturing method thereof - Google Patents
On-chip integrated body wave resonator and manufacturing method thereof Download PDFInfo
- Publication number
- CN103560763A CN103560763A CN201310555021.5A CN201310555021A CN103560763A CN 103560763 A CN103560763 A CN 103560763A CN 201310555021 A CN201310555021 A CN 201310555021A CN 103560763 A CN103560763 A CN 103560763A
- Authority
- CN
- China
- Prior art keywords
- wave resonator
- electrode
- energy
- body wave
- energy storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 23
- 238000004146 energy storage Methods 0.000 claims abstract description 89
- 239000000758 substrate Substances 0.000 claims description 37
- 238000000034 method Methods 0.000 claims description 20
- 239000012528 membrane Substances 0.000 claims description 8
- 239000011810 insulating material Substances 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims 1
- 230000009286 beneficial effect Effects 0.000 abstract description 5
- 230000010354 integration Effects 0.000 abstract description 4
- 229910052751 metal Inorganic materials 0.000 description 48
- 239000002184 metal Substances 0.000 description 48
- 239000000463 material Substances 0.000 description 23
- 239000003990 capacitor Substances 0.000 description 18
- 239000010409 thin film Substances 0.000 description 12
- 238000010586 diagram Methods 0.000 description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 229910052581 Si3N4 Inorganic materials 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 235000012239 silicon dioxide Nutrition 0.000 description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- WYTGDNHDOZPMIW-RCBQFDQVSA-N alstonine Natural products C1=CC2=C3C=CC=CC3=NC2=C2N1C[C@H]1[C@H](C)OC=C(C(=O)OC)[C@H]1C2 WYTGDNHDOZPMIW-RCBQFDQVSA-N 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 239000010931 gold Substances 0.000 description 4
- 238000000059 patterning Methods 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical group [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- UKDIAJWKFXFVFG-UHFFFAOYSA-N potassium;oxido(dioxo)niobium Chemical compound [K+].[O-][Nb](=O)=O UKDIAJWKFXFVFG-UHFFFAOYSA-N 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 238000010897 surface acoustic wave method Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- MAKDTFFYCIMFQP-UHFFFAOYSA-N titanium tungsten Chemical compound [Ti].[W] MAKDTFFYCIMFQP-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Landscapes
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
本发明公开了一种片上集成型体波谐振器及其制造方法,其中,该体波谐振器包括:体波谐振器;至少一储能元件,其中,至少一储能元件的至少部分位于体波谐振器在垂直方向的投影区域范围内。本发明通过将储能元件集成到体波谐振器在垂直方向的投影区域范围内,从而有效缩小储能元件和体波谐振器的集成空间,利于进一步缩减体波滤波器芯片的尺寸。
The invention discloses an on-chip integrated body wave resonator and a manufacturing method thereof, wherein the body wave resonator comprises: a body wave resonator; at least one energy storage element, wherein at least part of the at least one energy storage element is located in the body The wave resonator is within the range of the projected area in the vertical direction. The present invention integrates the energy storage element into the projection area of the bulk wave resonator in the vertical direction, thereby effectively reducing the integration space of the energy storage element and the bulk wave resonator, which is beneficial to further reducing the size of the bulk wave filter chip.
Description
技术领域technical field
本发明涉及半导体领域,并且特别地,涉及一种片上集成型体波谐振器及其制造方法。The present invention relates to the field of semiconductors, and in particular, to an on-chip integrated bulk wave resonator and a manufacturing method thereof.
背景技术Background technique
在手机通讯和高速串行数据应用等方面,利用压电薄膜在厚度方向上的纵向谐振所制成的薄膜压电体波谐振器已经成为声表面波器件和石英晶体谐振器的一个可行的替代。射频前端体波压电滤波器/双工器提供了优越的滤波特性,包括:低插入损耗,陡峭的过渡带,较大的功率容量,较强的抗静电放电(ESD)能力等。高频薄膜压电体波振荡器具有超低频率温度漂移,并且其相位噪声低,功耗低且带宽调制范围大。除此之外,这些微型薄膜压电谐振器在硅衬底上还使用互补式金属氧化物半导体(CMOS)兼容的加工工艺,这样可以降低单位成本,并且有利于谐振器与CMOS电路集成。In terms of mobile phone communication and high-speed serial data applications, thin-film piezoelectric bulk wave resonators made of piezoelectric thin-film longitudinal resonance in the thickness direction have become a viable alternative to surface acoustic wave devices and quartz crystal resonators. . The RF front-end bulk wave piezoelectric filter/duplexer provides superior filtering characteristics, including: low insertion loss, steep transition band, large power capacity, strong anti-electrostatic discharge (ESD) ability, etc. High-frequency thin-film piezoelectric bulk wave oscillators have ultra-low frequency temperature drift, and they have low phase noise, low power consumption, and large bandwidth modulation range. In addition, these miniature thin-film piezoelectric resonators use a complementary metal-oxide-semiconductor (CMOS)-compatible process on silicon substrates, which reduces unit cost and facilitates integration of the resonators with CMOS circuits.
典型的薄膜压电体波谐振器包括:两金属电极(包括顶部电极和底部电极)、压电材料、声反射结构,其中,压电材料位于金属电极之间,压电材料和两个金属电极组成的三明治结构,声反射结构位于底部金属电极下方。通常将顶部电极、压电层、底部电极组成的三层结构在厚度方向上重叠的区域定义为谐振器的有效区域。当两金属电极之间施加有一定频率的电压信号时,由于两金属电极之间的压电材料所具有的逆压电效应,有效区域内的顶部电极与底部电极之间会产生在垂直方向上传播的声波,声波在顶部电极与空气的交界面和底部电极下的声反射结构之间来回反射并在一定频率下产生谐振。如图1所示,为现有技术中已有的薄膜压电体波谐振器结构,如图1所示的谐振器包括:顶部电极T、压电层P、底部电极B、声反射结构X和衬底S。形成图1中谐振器的声反射结构X的步骤可以包括:A typical thin film piezoelectric bulk wave resonator includes: two metal electrodes (including the top electrode and the bottom electrode), a piezoelectric material, and an acoustic reflection structure, wherein the piezoelectric material is located between the metal electrodes, and the piezoelectric material and the two metal electrodes The sandwich structure is composed of the acoustic reflection structure located under the bottom metal electrode. Usually, the area where the three-layer structure composed of the top electrode, the piezoelectric layer and the bottom electrode overlaps in the thickness direction is defined as the effective area of the resonator. When a voltage signal of a certain frequency is applied between the two metal electrodes, due to the inverse piezoelectric effect of the piezoelectric material between the two metal electrodes, there will be a gap between the top electrode and the bottom electrode in the effective area in the vertical direction. The propagating sound wave is reflected back and forth between the interface between the top electrode and the air and the sound reflection structure under the bottom electrode and resonates at a certain frequency. As shown in Figure 1, it is an existing thin-film piezoelectric bulk wave resonator structure in the prior art. The resonator shown in Figure 1 includes: a top electrode T, a piezoelectric layer P, a bottom electrode B, and an acoustic reflection structure X and substrate S. The step of forming the acoustic reflection structure X of the resonator in Fig. 1 may include:
步骤1、在衬底S上刻蚀出空腔结构;Step 1, etching a cavity structure on the substrate S;
步骤2、以牺牲层材料填充空腔结构;Step 2, filling the cavity structure with a sacrificial layer material;
步骤3、在经过表面平坦化的衬底S上依次制作底部电极B、压电层P和顶部电极T。Step 3, fabricating the bottom electrode B, the piezoelectric layer P and the top electrode T on the substrate S after surface planarization.
步骤4、除去牺牲层材料形成悬浮结构。Step 4, removing the sacrificial layer material to form a suspension structure.
这样可以在谐振器的底部电极的下方形成空腔,由于底部电极与空气之间的声学阻抗比很大,声波在底部电极与空气的交界面上可以得到良好的反射,因此,可以在谐振器的工作过程中减少声波能量由谐振器内部往衬底的泄漏,从而提高谐振器的Q值,由此提高由多个谐振器组成的滤波器的性能。In this way, a cavity can be formed under the bottom electrode of the resonator. Since the acoustic impedance ratio between the bottom electrode and the air is very large, the sound wave can be well reflected on the interface between the bottom electrode and the air. Therefore, the resonator can During the working process, the leakage of acoustic wave energy from the inside of the resonator to the substrate is reduced, thereby improving the Q value of the resonator, thereby improving the performance of the filter composed of multiple resonators.
通过将不同频率的薄膜压电谐振器按照一定的拓扑结构连接在一起,可以构成薄膜压电体波滤波器,在滤波器的设计中,通常需要在并联谐振器上串联一段电感,如图2所示,为现有技术中连接有电感的滤波器结构的示意图。通过串联电感可以改变滤波器通带左侧传输零点的位置来获得较好的带外抑制,同时也能增加谐振器的有效机电耦合因数,达到拓宽带宽的作用。Thin-film piezoelectric bulk wave filters can be formed by connecting thin-film piezoelectric resonators of different frequencies together according to a certain topology. In the design of the filter, it is usually necessary to connect a section of inductor in series with the parallel resonator, as shown in Figure 2 Shown is a schematic diagram of a filter structure connected with an inductor in the prior art. The position of the transmission zero on the left side of the passband of the filter can be changed through the series inductance to obtain better out-of-band suppression, and at the same time, the effective electromechanical coupling factor of the resonator can be increased to achieve the effect of widening the bandwidth.
在双工器设计中,通常需要在接收滤波器和发送滤波器之间加入阻抗匹配网络,这部分电路可以是由电感和电容组成的π型网络、或者是一段四分之一波长传输线组成。阻抗匹配网络的作用是使接收滤波器在发送滤波器通带频段内呈现高阻抗,从而有利于传输发射通道信号。通常,将电感/电容等储能元件制造在芯片的封装基板上,是以贴片电感/电容或者印制螺旋线的形式实现,或者,还存在一种现有方法,在晶圆的制造过程中通过构图金属线的方式直接将电感/电容与滤波器集成在片上,其中电感/电容与滤波器平行布置。但是,以上方法共有的缺点是,无论是形成在封装基板上的电感电容还是集成在片上的电感电容,都占用了额外的面积,不利于滤波器芯片尺寸的缩小,因此,不能适应芯片进一步小型化的要求。In duplexer design, it is usually necessary to add an impedance matching network between the receiving filter and the transmitting filter. This part of the circuit can be a π-type network composed of inductors and capacitors, or a quarter-wavelength transmission line. The role of the impedance matching network is to make the receiving filter present a high impedance in the passband frequency band of the transmitting filter, which is beneficial to the transmission of the transmitting channel signal. Usually, energy storage elements such as inductors/capacitors are manufactured on the packaging substrate of the chip, which is realized in the form of chip inductors/capacitors or printed spiral wires, or there is an existing method, in the wafer manufacturing process In this method, the inductor/capacitor and filter are directly integrated on the chip by patterning metal lines, and the inductor/capacitor and the filter are arranged in parallel. However, the common disadvantage of the above methods is that both the inductance and capacitance formed on the packaging substrate or the inductance and capacitance integrated on the chip occupy additional area, which is not conducive to the reduction of the size of the filter chip. Therefore, it cannot adapt to further miniaturization of the chip. requirements of customization.
针对相关技术中体波滤波器芯片中储能元件要占用额外的芯片面积,不利于芯片尺寸进一步小型化的问题,目前尚未提出有效的解决方案。Aiming at the problem in the related art that the energy storage element in the bulk wave filter chip occupies an additional chip area, which is not conducive to further miniaturization of the chip size, no effective solution has been proposed yet.
发明内容Contents of the invention
针对相关技术中体波滤波器芯片中储能元件要占用额外的芯片面积,不利于芯片尺寸进一步小型化的问题,本发明提出一种片上集成型体波谐振器及其制造方法,能够将储能元件集成到体波谐振器中,从而利于进一步缩减体波滤波器芯片的尺寸。Aiming at the problem in the related art that the energy storage element in the bulk wave filter chip occupies an additional chip area, which is not conducive to further miniaturization of the chip size, the present invention proposes an on-chip integrated bulk wave resonator and its manufacturing method, which can store The energy components are integrated into the bulk wave resonator, which is beneficial to further reduce the size of the bulk wave filter chip.
本发明的技术方案是这样实现的:Technical scheme of the present invention is realized like this:
根据本发明的一个方面,提供了一种片上集成型体波谐振器。According to an aspect of the present invention, an on-chip integrated bulk wave resonator is provided.
该体波谐振器包括:The bulk wave resonator consists of:
体波谐振器;Bulk wave resonator;
至少一储能元件,其中,至少一储能元件的至少部分位于体波谐振器在垂直方向的投影区域范围内。At least one energy storage element, wherein at least part of the at least one energy storage element is located within the range of the projected area of the bulk wave resonator in the vertical direction.
其中,上述储能元件包括储能部和电极部。Wherein, the energy storage element includes an energy storage part and an electrode part.
并且,上述体波谐振器包括空腔,至少一储能元件的储能部位于空腔内。In addition, the bulk wave resonator includes a cavity, and the energy storage part of at least one energy storage element is located in the cavity.
此外,上述体波谐振器进一步包括:In addition, the above bulk wave resonator further includes:
第一电极;first electrode;
第二电极,位于第一电极下方,并且与第一电极电隔离;a second electrode positioned below the first electrode and electrically isolated from the first electrode;
基底,位于第二电极下方,空腔由基底的下凹表面形成。The base is located under the second electrode, and the cavity is formed by the concave surface of the base.
此外,上述体波谐振器进一步包括:In addition, the above bulk wave resonator further includes:
电极;electrode;
基底,位于电极下方,至少一储能元件的储能部位于基底和电极之间。The base is located under the electrodes, and the energy storage part of at least one energy storage element is located between the base and the electrodes.
另外,上述体波谐振器进一步包括:In addition, the above bulk wave resonator further includes:
电极;electrode;
基底,位于电极下方;a substrate, located below the electrodes;
至少一储能元件的储能部位于电极的上方。The energy storage portion of at least one energy storage element is located above the electrodes.
其中,在至少一储能元件的下方至少部分填充有绝缘材料或者存在间隙。Wherein, the bottom of at least one energy storage element is at least partially filled with insulating material or there is a gap.
可选地,体波谐振器的导电部与至少一储能元件之间存在间隙和/或绝缘材料。Optionally, there is a gap and/or insulating material between the conductive part of the bulk wave resonator and the at least one energy storage element.
优选地,储能元件包括电容和/或电感。Preferably, the energy storage element includes a capacitor and/or an inductor.
根据本发明的一个方面,提供了一种片上集成型体波谐振器的制造方法。According to one aspect of the present invention, there is provided a method of manufacturing an on-chip integrated bulk wave resonator.
该制造方法包括:The manufacturing method includes:
提供体波谐振器;Provide bulk wave resonators;
将至少一储能元件的至少部分设置于体波谐振器在垂直方向的投影区域范围内。At least part of the at least one energy storage element is arranged within the range of the projected area of the bulk wave resonator in the vertical direction.
其中,储能元件包括储能部和电极部。Wherein, the energy storage element includes an energy storage part and an electrode part.
可选地,在体波谐振器中形成空腔,并且将至少一储能元件的储能部设置于空腔内;Optionally, a cavity is formed in the bulk wave resonator, and the energy storage portion of at least one energy storage element is disposed in the cavity;
在空腔上方形成压电结构,压电结构包括上电极、压电层和下电极。A piezoelectric structure is formed above the cavity, and the piezoelectric structure includes an upper electrode, a piezoelectric layer and a lower electrode.
此外,在提供体波谐振器时,上述制造方法进一步包括:In addition, when providing a bulk wave resonator, the above manufacturing method further includes:
提供基底;provide the basis;
将至少一储能元件的储能部设置于基底上方;disposing the energy storage portion of at least one energy storage element above the substrate;
在至少一储能元件的上方形成隔膜层;forming a membrane layer over the at least one energy storage element;
在隔膜层上方形成压电结构,压电结构包括上电极、压电层和下电极。A piezoelectric structure is formed above the membrane layer, and the piezoelectric structure includes an upper electrode, a piezoelectric layer and a lower electrode.
优选地,上述储能元件包括电容和/或电感。Preferably, the above-mentioned energy storage element includes a capacitor and/or an inductor.
本发明通过将储能元件集成到体波谐振器在垂直方向的投影区域范围内,从而有效缩小储能元件和体波谐振器的集成空间,利于进一步缩减体波滤波器芯片的尺寸。The present invention integrates the energy storage element into the projection area of the bulk wave resonator in the vertical direction, thereby effectively reducing the integration space of the energy storage element and the bulk wave resonator, which is beneficial to further reducing the size of the bulk wave filter chip.
附图说明Description of drawings
图1是现有技术中体波谐振器的示意图;FIG. 1 is a schematic diagram of a bulk wave resonator in the prior art;
图2是现有技术中具有电感的滤波器结构的示意图;2 is a schematic diagram of a filter structure with an inductor in the prior art;
图3a是根据本发明实施例的体波谐振器的俯视图;Fig. 3a is a top view of a bulk wave resonator according to an embodiment of the present invention;
图3b是图3a所示的体波谐振器的空腔内结构的俯视图;Fig. 3b is a top view of the structure in the cavity of the bulk wave resonator shown in Fig. 3a;
图3c是沿图3a所示的体波谐振器中A-A方向的截面图;Fig. 3c is a cross-sectional view along the A-A direction in the bulk wave resonator shown in Fig. 3a;
图4a至图4j是根据本发明的一实施例的片上集成型体波谐振器的制造方法的示意图;4a to 4j are schematic diagrams of a manufacturing method of an on-chip bulk wave resonator according to an embodiment of the present invention;
图5是根据本发明的又一实施例的体波谐振器的示意图;5 is a schematic diagram of a bulk wave resonator according to another embodiment of the present invention;
图6a是根据本发明的一实施例的集成了蛇形电感结构的体波谐振器空腔内结构的俯视图;Fig. 6a is a top view of a bulk wave resonator cavity structure integrated with a serpentine inductor structure according to an embodiment of the present invention;
图6b是图6a所示体波谐振器的截面图;Fig. 6b is a cross-sectional view of the bulk wave resonator shown in Fig. 6a;
图7是本发明的又一实施例集成了电容的示意图;Fig. 7 is a schematic diagram of another embodiment of the present invention integrating a capacitor;
图8a是根据本发明的又一实施例的集成了电感的体波谐振器的示意图;Fig. 8a is a schematic diagram of a bulk wave resonator integrated with an inductor according to another embodiment of the present invention;
图8b是图8a所示体波谐振器中A-A方向的截面图;Fig. 8b is a cross-sectional view of the A-A direction in the bulk wave resonator shown in Fig. 8a;
图9是根据本发明的再一实施例的体波谐振器的截面图;9 is a cross-sectional view of a bulk wave resonator according to yet another embodiment of the present invention;
图10a至图10e是根据本发明的一实施例的片上集成型体波谐振器的制造方法的示意图;10a to 10e are schematic diagrams of a manufacturing method of an on-chip integrated bulk wave resonator according to an embodiment of the present invention;
图11是根据本发明的又一实施例集成了电感的体波谐振器的示意图;11 is a schematic diagram of a bulk wave resonator integrated with an inductor according to another embodiment of the present invention;
图12是根据本发明的又一实施例的集成了电容的体波谐振器的示意图。Fig. 12 is a schematic diagram of a bulk wave resonator integrated with a capacitor according to yet another embodiment of the present invention.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员所获得的所有其他实施例,都属于本发明保护的范围。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present invention belong to the protection scope of the present invention.
根据本发明的实施例,提供了一种片上集成型体波谐振器。According to an embodiment of the present invention, an on-chip integrated bulk wave resonator is provided.
根据本发明实施例的体波谐振器可以包括:A bulk wave resonator according to an embodiment of the present invention may include:
体波谐振器;Bulk wave resonator;
至少一储能元件,其中,储能元件可以包括电容和/或电感或者其它用于体波谐振器的储能元件,至少一储能元件的至少部分位于体波谐振器在垂直方向的投影区域范围内,优选地,至少一储能元件的至少部分位于空腔内。通过将储能元件集成到体波谐振器中,能够有效缩小储能元件和体波谐振器的集成空间,利于进一步缩减体波滤波器芯片的尺寸。At least one energy storage element, wherein the energy storage element may include capacitance and/or inductance or other energy storage elements for the bulk wave resonator, at least part of the at least one energy storage element is located in the projection area of the bulk wave resonator in the vertical direction Within the scope, preferably, at least part of at least one energy storage element is located in the cavity. By integrating the energy storage element into the bulk wave resonator, the integration space of the energy storage element and the bulk wave resonator can be effectively reduced, which is beneficial to further reducing the size of the bulk wave filter chip.
其中,上述储能元件包括储能部和电极部。并且,根据本发明实施例的体波谐振器包括空腔,至少一储能元件的储能部位于空腔内。Wherein, the energy storage element includes an energy storage part and an electrode part. Moreover, the bulk wave resonator according to the embodiment of the present invention includes a cavity, and the energy storage part of at least one energy storage element is located in the cavity.
此外,根据本发明实施例的体波谐振器进一步包括:In addition, the bulk wave resonator according to the embodiment of the present invention further includes:
第一电极;first electrode;
第二电极,位于第一电极下方,并且与第一电极电隔离;a second electrode positioned below the first electrode and electrically isolated from the first electrode;
基底,位于第二电极下方,空腔由基底的下凹表面形成,并且,至少一储能元件的至少部分位于空腔内。The substrate is located below the second electrode, the cavity is formed by the concave surface of the substrate, and at least part of at least one energy storage element is located in the cavity.
根据本发明的一个实施例,可以提供一种片上集成型体波谐振器。如图3a-3c所示,分别为根据本发明实施例的体波谐振器的俯视图、体波谐振器的空腔内结构的俯视图以及体波谐振器沿图3a中A-A方向的截面图,在图3a-3c所示的实施例中,空腔位于基底内。根据本发明实施例的体波谐振器包括基底110、空腔120、金属层130、电感的螺旋区域131、电感的金属电极132、绝缘层140、底部电极150、压电层160、顶部电极170。其中,电感为文中所说的储能元件,电感的金属层130起支撑螺旋区域131和电连接作用,螺旋区域131为储能部,金属电极132为电极部。According to an embodiment of the present invention, an on-chip integrated bulk wave resonator can be provided. As shown in Figures 3a-3c, they are respectively the top view of the bulk wave resonator according to the embodiment of the present invention, the top view of the structure in the cavity of the bulk wave resonator, and the cross-sectional view of the bulk wave resonator along the direction A-A in Figure 3a. In the embodiment shown in Figures 3a-3c, the cavity is located within the substrate. A bulk wave resonator according to an embodiment of the present invention includes a
如图3a所示,空腔120形成于基底110内,底部电极150覆盖空腔120,金属电极132用于连接空腔120内电感的螺旋区域131,绝缘层140位于底部电极150与电感的金属电极132之间,压电层160位于底部电极150上,顶部电极170位于压电层160上。As shown in Figure 3a, the
如图3b所示,电感的螺旋区域131悬浮在空腔120中,金属层130位于电感的螺旋区域131下方,用于从螺旋电感的中心引出电学连接同时对螺旋电感起一定支撑作用。As shown in FIG. 3 b , the
如图3c所示,电感的螺旋区域131悬浮在空腔中。金属层130位于电感的螺旋区域131下方,用于从螺旋电感的中心引出电学连接同时对螺旋电感起一定支撑作用。绝缘层140用于隔离电感的金属电极132与谐振器的底部电极150。As shown in Figure 3c, the
根据本发明的再一个实施例,可以提供一种体波谐振器,包括:According to yet another embodiment of the present invention, a bulk wave resonator may be provided, including:
电极;electrode;
基底,位于电极下方;a substrate, located below the electrodes;
至少一储能元件的储能部位于电极的上方。The energy storage portion of at least one energy storage element is located above the electrodes.
其中,在本文所述的实施例中,均可以在至少一储能元件的下方至少部分填充有绝缘材料(可以起到结构上的支撑作用)或者存在间隙。Wherein, in the embodiments described herein, the bottom of at least one energy storage element may be at least partially filled with insulating material (which may serve as a structural support) or there may be a gap.
此外,在本文所述的实施例中,均可以在体波谐振器的导电部与至少一储能元件之间存在间隙和/或绝缘材料,可以使储能元件与体波谐振器的导电部电隔离。In addition, in the embodiments described herein, gaps and/or insulating materials may exist between the conductive part of the bulk wave resonator and at least one energy storage element, so that the energy storage element and the conductive part of the bulk wave resonator Galvanic isolation.
根据本发明的实施例,提供了一种片上集成型体波谐振器的制造方法。According to an embodiment of the present invention, a method for manufacturing a bulk wave resonator integrated on a chip is provided.
根据本发明实施例的制造方法包括:A manufacturing method according to an embodiment of the invention includes:
提供体波谐振器;Provide bulk wave resonators;
将至少一储能元件的至少部分设置于体波谐振器在垂直方向的投影区域范围内,其中,储能元件包括储能部和电极部,可选地,储能元件包括电容和/或电感。At least part of at least one energy storage element is disposed within the projection area of the bulk wave resonator in the vertical direction, wherein the energy storage element includes an energy storage part and an electrode part, and optionally, the energy storage element includes a capacitor and/or an inductor .
优选地,在体波谐振器中形成空腔,并且将至少一储能元件的储能部设置于空腔内;Preferably, a cavity is formed in the bulk wave resonator, and the energy storage part of at least one energy storage element is arranged in the cavity;
在空腔上方形成压电结构,压电结构包括上电极、压电层和下电极。A piezoelectric structure is formed above the cavity, and the piezoelectric structure includes an upper electrode, a piezoelectric layer and a lower electrode.
此外,在提供体波谐振器时,根据本发明实施例的制造方法进一步包括:In addition, when providing the bulk wave resonator, the manufacturing method according to the embodiment of the present invention further includes:
提供基底;provide the basis;
将至少一储能元件的储能部设置于基底上方;disposing the energy storage portion of at least one energy storage element above the substrate;
在至少一储能元件的上方形成隔膜层;forming a membrane layer over the at least one energy storage element;
在隔膜层上方形成压电结构,压电结构包括上电极、压电层和下电极。A piezoelectric structure is formed above the membrane layer, and the piezoelectric structure includes an upper electrode, a piezoelectric layer and a lower electrode.
在上述实施例中将至少一储能元件的储能部设置于基底和电极之间,此外,也可以在顶部电极之上形成储能元件。即,还可以将电感或者电容布置在体波谐振器的上方,同样可以达到减小芯片面积的作用。In the above embodiments, the energy storage portion of at least one energy storage element is disposed between the substrate and the electrode. In addition, the energy storage element may also be formed on the top electrode. That is, the inductor or capacitor can also be arranged above the bulk wave resonator, which can also achieve the effect of reducing the chip area.
根据本发明的一个实施例,图4a-图4j所示的加工流程图,提供了一种片上集成型体波谐振器的制造方法,在该实施例中,空腔形成于基底内。According to an embodiment of the present invention, the processing flowcharts shown in Figs. 4a-4j provide a method for manufacturing an on-chip bulk wave resonator. In this embodiment, a cavity is formed in a substrate.
如图4a所示,通过干法刻蚀,在硅衬底110上形成凹陷的空腔结构,然后通过溅射或物理气相沉积等方法在硅衬底上沉积金属层,为了形成从空腔内向空腔外引出的金属电极,要求金属对空腔侧壁有良好的覆盖。紧接着通过光刻构图金属层形成电感下方的金属电极130。As shown in FIG. 4a, a concave cavity structure is formed on the
如图4b所示,通过化学气相沉积等方法在硅衬底110和金属电极130上方覆盖牺牲层材料180,并刻蚀出用于电感中心与金属电极130连接的通孔a。As shown in FIG. 4 b , a
如图4c所示,沉积用于形成电感的金属材料,并构图形成图3c所示的体波谐振器中的平面螺旋电感131,由于需要形成从空腔内向空腔外引出的金属电极,同样要求金属对侧壁有良好的覆盖。As shown in FIG. 4c, metal materials for forming inductance are deposited, and patterned to form the
如图4d所示,通过化学气相沉积等方法沉积牺牲层材料180,使牺牲层材料180覆盖空腔及空腔外的区域并达到一定厚度。As shown in FIG. 4 d , the
如图4e所示,利用化学机械研磨抛光牺牲层,并露出空腔外的衬底110,并形成平坦光滑的表面。As shown in FIG. 4e, the sacrificial layer is polished by chemical mechanical grinding, and the
如图4f所示,沉积金属层并构图金属电极,使得金属电极分别与空腔中电感的两个电学端相连接,形成用于连接电感的金属外部电极132。As shown in FIG. 4f , a metal layer is deposited and the metal electrodes are patterned so that the metal electrodes are respectively connected to the two electrical terminals of the inductor in the cavity to form a metal
如图4g所示,沉积绝缘层140,并且再次进行化学机械研磨以形成平坦光滑的表面,其中,绝缘层完全覆盖金属外部电极。As shown in FIG. 4g, an insulating
如图4h所示,在绝缘层上沉积金属材料,并合理构图形成压电体波谐振器的底部电极150。As shown in FIG. 4h , metal materials are deposited on the insulating layer and patterned properly to form the
如图4i所示,沉积压电薄膜(具有良好晶向性)以形成压电层160,然后在压电薄膜上沉积金属并合理构图形成谐振器的顶部电极170。As shown in Figure 4i, a piezoelectric thin film (with good crystal orientation) is deposited to form a
如图4j所示,选择性刻蚀压电层以及绝缘层以露出金属电极以便提供方便自由的电学连接。然后,利用对牺牲层刻蚀选择性较高的溶液去除牺牲层,使得底电极底部形成空腔,并且使得电感的螺旋形区域悬浮在空气中,为简单起见图4j中未示出用于将牺牲层去除溶液引入空腔的通道。As shown in FIG. 4j, the piezoelectric layer and the insulating layer are selectively etched to expose the metal electrodes to provide convenient and free electrical connections. Then, the sacrificial layer is removed by using a solution with high etching selectivity to the sacrificial layer, so that a cavity is formed at the bottom of the bottom electrode, and the spiral region of the inductor is suspended in the air, which is not shown in FIG. 4j for simplicity. A channel through which a sacrificial layer removal solution is introduced into the cavity.
此外,可以在储能元件的下方至少部分填充有绝缘材料(可以起到结构上的支撑作用)或者形成间隙。In addition, the lower part of the energy storage element may be at least partially filled with an insulating material (which may serve as a structural support) or form a gap.
如图5所示,是根据本发明的又一个实施例,在对电感Q值要求不高的情况下,将图4b中沉积的牺牲层材料改换成拥有较小电学损耗角的电介质材料190,使得电感不再悬浮在空气中,从而使得电感可以拥有更好的机械稳定性。As shown in FIG. 5, according to another embodiment of the present invention, in the case that the Q value of the inductance is not high, the sacrificial layer material deposited in FIG. 4b is replaced with a
本发明的技术方案中,螺旋电感平面形状可以不局限于正方形,还可以是圆形、八边形等多种形状。另外,如图6a所示,为集成了蛇形电感结构的体波谐振器空腔内结构的俯视图,电感可以为蛇形。由于蛇形电感的电学端分别在电感线两端,不需要像螺线电感一样从中间引出电学连接,因此,由图6b所示的体波谐振器的截面图可知,可以在制作流程中,只进行一次电感金属层构图即可形成储能元件,简化了工艺流程。In the technical solution of the present invention, the planar shape of the spiral inductor may not be limited to a square, but may also be various shapes such as a circle and an octagon. In addition, as shown in FIG. 6 a , which is a top view of the cavity structure of a bulk wave resonator integrated with a serpentine inductor structure, the inductor may be in a serpentine shape. Since the electrical ends of the serpentine inductor are at both ends of the inductance line, there is no need to lead out the electrical connection from the middle like the spiral inductor. Therefore, from the cross-sectional view of the bulk wave resonator shown in Figure 6b, it can be seen that in the manufacturing process, The energy storage element can be formed by patterning the inductive metal layer only once, which simplifies the process flow.
根据本发明的又一个实施例,如图7所示,可以使用类似于图4a-图4j所示的工艺流程在空腔底部集成电容。图7中所示的体波谐振器与图3c所示类似,除了图7中所示的体波谐振器中的储能元件为电容。通过控制金属电极231和232的面积,沉积具有适当厚度及介电常数的电介质220,可以在电极231和232之间形成一定大小的电容。According to yet another embodiment of the present invention, as shown in FIG. 7 , a capacitor can be integrated at the bottom of the cavity using a process similar to that shown in FIGS. 4 a - 4 j . The bulk wave resonator shown in Fig. 7 is similar to that shown in Fig. 3c, except that the energy storage element in the bulk wave resonator shown in Fig. 7 is a capacitor. By controlling the area of the
如图8a所示,为根据本发明的再一个实施例的片上集成型体波谐振器的俯视图,与图3c所示的谐振器的类似,除了图8a的波谐振器省略了图3c中的绝缘层140,通过合理构图谐振器底部电极340的形状,使底部电极340绕开电感电极332。图8b是沿图8a所示的A-A方向取的截面图,可以看出谐振器底部电极340与电感电极332之间留有空隙380,使得去除牺牲层的溶液可以由空隙380进入空腔,简化了制作工艺。As shown in Figure 8a, it is a top view of an on-chip integrated bulk wave resonator according to yet another embodiment of the present invention, which is similar to the resonator shown in Figure 3c, except that the wave resonator in Figure 8a omits the wave resonator in Figure 3c
根据本发明的又一个实施例,可以提供一种体波谐振器,包括:According to yet another embodiment of the present invention, a bulk wave resonator may be provided, including:
电极;electrode;
基底,位于电极下方,至少一储能元件的储能部位于基底和电极之间。在该实施例中,基底中不存在空腔,而在基底上方形成容纳储能元件的空腔。The base is located under the electrodes, and the energy storage part of at least one energy storage element is located between the base and the electrodes. In this embodiment, there is no cavity in the substrate, but a cavity for accommodating the energy storage element is formed above the substrate.
如图9所示,为根据本发明实施例的一种空腔位于基底上方的体波谐振器的截面图。该体波谐振器包括基底410、电感金属电极420、金属电感421、金属电感的另外一端金属电极422、空腔430、绝缘层440、压电谐振器的底部电极450、压电层460以及顶部电极470。其中,电感金属电极420用于从电感中心引出电学连接,金属电感421悬浮在空腔430中。As shown in FIG. 9 , it is a cross-sectional view of a bulk wave resonator with a cavity above a substrate according to an embodiment of the present invention. The bulk wave resonator includes a
如图10a至图10e所示,简单地示出了如图8a所示的谐振器的制作过程。As shown in Fig. 10a to Fig. 10e, the manufacturing process of the resonator shown in Fig. 8a is simply shown.
如图10a所示,提供衬底410,在衬底410上沉积并构图金属电极420,然后沉积并构图牺牲层480,使得金属电极的一部分露出以便于与之后构图的金属螺线电感中心相连接。As shown in Figure 10a, a
如图10b所示,先构图金属螺旋电感421,并使得螺旋电感中心与金属电极420相连,然后沉积牺牲层480将表面覆盖。As shown in FIG. 10 b , the
如图10c所示,通过化学机械研磨平坦化牺牲层的表面,然后通过刻蚀形成凸起的牺牲层台阶。As shown in FIG. 10c, the surface of the sacrificial layer is planarized by chemical mechanical polishing, and then raised steps of the sacrificial layer are formed by etching.
如图10d所示,沉积隔膜层440以作为支撑层,然后在隔膜层440上沉积并构图谐振器的底部电极450。As shown in Figure 1Od, a
如图10e所示,沉积压电层,沉积并构图顶部电极470,最后刻蚀压电层460和隔膜层以露出金属电感的连接电极420和421,最后利用对牺牲层刻蚀选择性较高的溶液去除牺牲层,使得底电极下方形成空腔,并且使得电感的螺旋形区域悬浮在空气中,为简单起见图中并没有画出用于将牺牲层去除溶液引入空腔的通道。As shown in Figure 10e, the piezoelectric layer is deposited, the
如图11所示,为根据本发明的另一个实施例的体波谐振器的截面图。在对电感Q值要求不高的情况下,将图10b中沉积的牺牲层材料改换成拥有较小电学损耗角的电介质材料490,可以使电感不再悬浮在空气中,从而拥有更好的机械稳定性。As shown in FIG. 11 , it is a cross-sectional view of a bulk wave resonator according to another embodiment of the present invention. In the case that the Q value of the inductance is not high, changing the material of the sacrificial layer deposited in FIG. mechanical stability.
根据本发明实施例的体波谐振器中的螺旋电感平面形状不局限于正方形,还可以是圆形、八边形等其它形状。另外,在实施例中的电感还可以是蛇形的,由于蛇形电感的电学端分别在电感线两端,不需要像螺线电感一样从中间引出电学连接,可以只进行一次电感金属层的构图,能够简化工艺流程。The planar shape of the spiral inductor in the bulk wave resonator according to the embodiments of the present invention is not limited to a square, and may also be circular, octagonal and other shapes. In addition, the inductance in the embodiment can also be serpentine. Since the electrical ends of the serpentine inductance are respectively at the two ends of the inductance line, there is no need to draw an electrical connection from the middle like a spiral inductance, and the inductance metal layer can only be connected once. Composition can simplify the process flow.
如图12所示,为根据本发明的另一个实施例的体波谐振器,可以参考图10a-图10j所示的工艺流程形成,即可以用类似的加工方法可以在空腔中集成电容。As shown in FIG. 12 , a bulk wave resonator according to another embodiment of the present invention can be formed with reference to the process flow shown in FIG. 10 a - FIG. 10 j , that is, a similar processing method can be used to integrate capacitors in the cavity.
此外,本发明的技术方案并不局限于谐振器底部空腔或其它位置只有一个电容或电感的情况,还可以是多个电容、多个电感或它们的组合。In addition, the technical solution of the present invention is not limited to the case where there is only one capacitor or inductor in the cavity at the bottom of the resonator or other positions, and may also be multiple capacitors, multiple inductors or a combination thereof.
本文中描述的基底可以由硅、锗、砷化镓、氮化镓、蓝宝石等或他们的组合构成,但并不局限于以上材料。顶部电极和底部电极可以由金(Au)、钨(W)、钼(Mo)、铂(Pt)、钌(Ru)、铱(Ir)、钛钨(TiW)、铝(Al)、钛(Ti)等类似金属形成。压电层可以为氮化铝(AlN)、氧化锌(ZnO)、锆钛酸铅(PZT)、铌酸锂(LiNbO3)、石英(quartz)、铌酸钾(KNbO3)或钽酸锂(LiTaO3)等材料形成,但不局限于以上材料。The substrate described herein can be made of silicon, germanium, gallium arsenide, gallium nitride, sapphire, etc. or their combination, but is not limited to the above materials. The top and bottom electrodes can be made of gold (Au), tungsten (W), molybdenum (Mo), platinum (Pt), ruthenium (Ru), iridium (Ir), titanium tungsten (TiW), aluminum (Al), titanium ( Ti) and similar metal formation. The piezoelectric layer can be aluminum nitride (AlN), zinc oxide (ZnO), lead zirconate titanate (PZT), lithium niobate (LiNbO 3 ), quartz (quartz), potassium niobate (KNbO 3 ) or lithium tantalate (LiTaO 3 ) and other materials, but not limited to the above materials.
本文中描述的金属电感可以由铜(Cu)、铝(Al)、金(Au)、钨(W)、钼(Mo)等材料构成,但不局限与以上材料。The metal inductors described herein may be made of copper (Cu), aluminum (Al), gold (Au), tungsten (W), molybdenum (Mo) and other materials, but are not limited to the above materials.
本文中描述的绝缘层可以由二氧化硅(SiO2)、聚合物(Polymer)、氮化硅(SiN)等材料构成,但不局限于以上材料。The insulating layer described herein may be made of silicon dioxide (SiO 2 ), polymer (Polymer), silicon nitride (SiN) and other materials, but is not limited to the above materials.
本文中描述的介电层可以为:二氧化硅(SiO2)、氮化硅(SiN)等材料,但不局限于以上材料。The dielectric layer described herein may be silicon dioxide (SiO 2 ), silicon nitride (SiN) and other materials, but not limited to the above materials.
本文中描述的隔膜层材料可以为:二氧化硅(SiO2),聚合物(Polymer),氮化硅(SiN)等材料构成,但不局限于以上材料。The diaphragm layer material described herein may be composed of silicon dioxide (SiO 2 ), polymer (Polymer), silicon nitride (SiN) and other materials, but is not limited to the above materials.
综上所述,借助于本发明的上述技术方案,本发明通过在芯片晶圆制作过程中在薄膜体波谐振器的底部空腔或其它结构内集成电感及电容等储能元件,由此将电感或电容等储能元件与薄膜体波谐振器在基底厚度方向上垂直布置,从而减小了芯片面积,最终减小芯片的尺寸。In summary, with the help of the above technical solution of the present invention, the present invention integrates energy storage elements such as inductors and capacitors in the bottom cavity of the thin film bulk wave resonator or other structures during the chip wafer manufacturing process, thereby converting The energy storage elements such as inductors or capacitors and the thin film bulk wave resonator are vertically arranged in the thickness direction of the substrate, thereby reducing the chip area and finally reducing the size of the chip.
以上所述仅为本发明的较佳实施例而已,并不用以限制本发明,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included in the scope of the present invention. within the scope of protection.
Claims (14)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310555021.5A CN103560763B (en) | 2013-11-08 | 2013-11-08 | On-chip integrated bulk wave resonator and manufacturing method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310555021.5A CN103560763B (en) | 2013-11-08 | 2013-11-08 | On-chip integrated bulk wave resonator and manufacturing method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103560763A true CN103560763A (en) | 2014-02-05 |
CN103560763B CN103560763B (en) | 2017-08-01 |
Family
ID=50014942
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310555021.5A Active CN103560763B (en) | 2013-11-08 | 2013-11-08 | On-chip integrated bulk wave resonator and manufacturing method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN103560763B (en) |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105262456A (en) * | 2015-10-09 | 2016-01-20 | 锐迪科微电子(上海)有限公司 | High-performance FBAR (thin-film bulk acoustic resonator) and manufacturing method thereof |
CN105262455A (en) * | 2015-10-09 | 2016-01-20 | 锐迪科微电子(上海)有限公司 | High-reliability FBAR (thin-film bulk acoustic resonator) and manufacturing method thereof |
CN107181469A (en) * | 2016-03-10 | 2017-09-19 | 中芯国际集成电路制造(上海)有限公司 | FBAR, semiconductor devices and its manufacture method |
CN107565927A (en) * | 2016-07-01 | 2018-01-09 | 三星电机株式会社 | Bulk accoustic wave filter |
CN108512520A (en) * | 2018-02-27 | 2018-09-07 | 贵州中科汉天下微电子有限公司 | The monolithic integrated structure and its manufacturing method of bulk acoustic wave resonator and capacitor, filter, duplexer and radio-frequency communication module |
CN110402538A (en) * | 2017-05-08 | 2019-11-01 | 株式会社村田制作所 | Resonant circuit components and circuit module |
CN111312667A (en) * | 2019-09-20 | 2020-06-19 | 天津大学 | Semiconductor device with conductive via offset structure, power supply structure, and electronic apparatus |
CN111541436A (en) * | 2020-04-26 | 2020-08-14 | 深圳市信维通信股份有限公司 | Forming method of filtering device |
CN111628747A (en) * | 2020-04-26 | 2020-09-04 | 深圳市信维通信股份有限公司 | Filtering device, radio frequency front-end device and wireless communication device |
CN112673571A (en) * | 2018-09-05 | 2021-04-16 | Rf360欧洲有限责任公司 | BAW resonator with coil integrated in the high-impedance layer of the Bragg mirror or in an additional high-impedance metal layer below the resonator |
CN113541628A (en) * | 2021-06-28 | 2021-10-22 | 杭州左蓝微电子技术有限公司 | Surface acoustic wave device and manufacturing method thereof |
WO2021258490A1 (en) * | 2020-06-22 | 2021-12-30 | 深圳市信维通信股份有限公司 | Filtering device, radio frequency front-end device, and wireless communication device |
CN114362717A (en) * | 2022-01-11 | 2022-04-15 | 武汉敏声新技术有限公司 | Film bulk acoustic resonator and preparation method thereof |
US11606080B2 (en) | 2020-04-26 | 2023-03-14 | Shenzhen Sunway Communication Co., Ltd. | Filter device, RF front-end device and wireless communication device |
US11955950B2 (en) | 2020-04-26 | 2024-04-09 | Shenzhen Sunway Communication Co., Ltd. | Formation method of filter device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1523754A (en) * | 2003-02-21 | 2004-08-25 | Lg | Duplex filter with thin-film cavity acoustic resonator and its semiconductor package |
JP2005286658A (en) * | 2004-03-29 | 2005-10-13 | Sanyo Electric Co Ltd | Semiconductor device |
CN102122941A (en) * | 2010-11-01 | 2011-07-13 | 中国电子科技集团公司第二十六研究所 | Tunable preset cavity type silicon on insulator (SOI) substrate film body acoustic resonator and manufacturing method thereof |
-
2013
- 2013-11-08 CN CN201310555021.5A patent/CN103560763B/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1523754A (en) * | 2003-02-21 | 2004-08-25 | Lg | Duplex filter with thin-film cavity acoustic resonator and its semiconductor package |
JP2005286658A (en) * | 2004-03-29 | 2005-10-13 | Sanyo Electric Co Ltd | Semiconductor device |
CN102122941A (en) * | 2010-11-01 | 2011-07-13 | 中国电子科技集团公司第二十六研究所 | Tunable preset cavity type silicon on insulator (SOI) substrate film body acoustic resonator and manufacturing method thereof |
Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105262455A (en) * | 2015-10-09 | 2016-01-20 | 锐迪科微电子(上海)有限公司 | High-reliability FBAR (thin-film bulk acoustic resonator) and manufacturing method thereof |
CN105262456B (en) * | 2015-10-09 | 2018-07-31 | 锐迪科微电子(上海)有限公司 | A kind of high performance thin film bulk acoustic wave resonator and its manufacturing method |
CN105262455B (en) * | 2015-10-09 | 2018-07-31 | 锐迪科微电子(上海)有限公司 | A kind of thin film bulk acoustic wave resonator and its manufacturing method of high reliability |
CN105262456A (en) * | 2015-10-09 | 2016-01-20 | 锐迪科微电子(上海)有限公司 | High-performance FBAR (thin-film bulk acoustic resonator) and manufacturing method thereof |
US10700663B2 (en) | 2016-03-10 | 2020-06-30 | Semiconductor Manufacturing International (Shanghai) Corporation | Resonator and related manufacturing method |
CN107181469A (en) * | 2016-03-10 | 2017-09-19 | 中芯国际集成电路制造(上海)有限公司 | FBAR, semiconductor devices and its manufacture method |
CN107181469B (en) * | 2016-03-10 | 2020-11-17 | 中芯国际集成电路制造(上海)有限公司 | Film bulk acoustic resonator, semiconductor device and method of manufacturing the same |
CN107565927A (en) * | 2016-07-01 | 2018-01-09 | 三星电机株式会社 | Bulk accoustic wave filter |
CN107565927B (en) * | 2016-07-01 | 2020-08-07 | 三星电机株式会社 | Bulk acoustic wave filter |
CN110402538A (en) * | 2017-05-08 | 2019-11-01 | 株式会社村田制作所 | Resonant circuit components and circuit module |
CN110402538B (en) * | 2017-05-08 | 2021-01-15 | 株式会社村田制作所 | Resonant circuit element and circuit module |
CN108512520B (en) * | 2018-02-27 | 2022-04-29 | 苏州汉天下电子有限公司 | Monolithic integrated structure of bulk acoustic wave resonator and capacitor, manufacturing method thereof, filter, duplexer, and radio frequency communication module |
CN108512520A (en) * | 2018-02-27 | 2018-09-07 | 贵州中科汉天下微电子有限公司 | The monolithic integrated structure and its manufacturing method of bulk acoustic wave resonator and capacitor, filter, duplexer and radio-frequency communication module |
CN112673571A (en) * | 2018-09-05 | 2021-04-16 | Rf360欧洲有限责任公司 | BAW resonator with coil integrated in the high-impedance layer of the Bragg mirror or in an additional high-impedance metal layer below the resonator |
CN111312667A (en) * | 2019-09-20 | 2020-06-19 | 天津大学 | Semiconductor device with conductive via offset structure, power supply structure, and electronic apparatus |
CN111628747A (en) * | 2020-04-26 | 2020-09-04 | 深圳市信维通信股份有限公司 | Filtering device, radio frequency front-end device and wireless communication device |
WO2021217748A1 (en) * | 2020-04-26 | 2021-11-04 | 深圳市信维通信股份有限公司 | Method for forming filtering device |
CN111541436A (en) * | 2020-04-26 | 2020-08-14 | 深圳市信维通信股份有限公司 | Forming method of filtering device |
CN111628747B (en) * | 2020-04-26 | 2023-01-17 | 深圳市信维通信股份有限公司 | Filtering device, radio frequency front-end device and wireless communication device |
US11606080B2 (en) | 2020-04-26 | 2023-03-14 | Shenzhen Sunway Communication Co., Ltd. | Filter device, RF front-end device and wireless communication device |
US11955950B2 (en) | 2020-04-26 | 2024-04-09 | Shenzhen Sunway Communication Co., Ltd. | Formation method of filter device |
WO2021258490A1 (en) * | 2020-06-22 | 2021-12-30 | 深圳市信维通信股份有限公司 | Filtering device, radio frequency front-end device, and wireless communication device |
CN113904644A (en) * | 2020-06-22 | 2022-01-07 | 深圳市信维通信股份有限公司 | A filtering device, a radio frequency front-end device and a wireless communication device |
CN113541628A (en) * | 2021-06-28 | 2021-10-22 | 杭州左蓝微电子技术有限公司 | Surface acoustic wave device and manufacturing method thereof |
CN114362717A (en) * | 2022-01-11 | 2022-04-15 | 武汉敏声新技术有限公司 | Film bulk acoustic resonator and preparation method thereof |
CN114362717B (en) * | 2022-01-11 | 2023-11-03 | 武汉敏声新技术有限公司 | Film bulk acoustic resonator and preparation method thereof |
Also Published As
Publication number | Publication date |
---|---|
CN103560763B (en) | 2017-08-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103560763B (en) | On-chip integrated bulk wave resonator and manufacturing method thereof | |
JP4326063B2 (en) | Monolithic filter using thin film bulk acoustic wave device and minimal passive element to control the shape and width of passband response | |
CN101908865B (en) | Bulk wave resonator and its processing method | |
JP4181525B2 (en) | Method for manufacturing thin film bulk acoustic resonator having support base | |
US8692631B2 (en) | Bulk acoustic wave resonator and method of fabricating same | |
JP4171214B2 (en) | Monolithic FBAR duplexer and method of making the same | |
KR102418744B1 (en) | Air-gap type fbar and method for fabricating by the same | |
KR101686689B1 (en) | Reactance filter having a steep edge | |
US10158340B1 (en) | Micromechanical devices based on piezoelectric resonators | |
CN105897211A (en) | Film bulk acoustic resonator having multiple resonance modes and preparation method thereof and filter | |
WO2021143520A1 (en) | Filter, duplexer, high-frequency front-end circuit, and communication apparatus | |
CN108512520A (en) | The monolithic integrated structure and its manufacturing method of bulk acoustic wave resonator and capacitor, filter, duplexer and radio-frequency communication module | |
JP2008066792A (en) | Piezoelectric thin film resonator and piezoelectric filter device | |
JP2008301453A (en) | Thin film piezoelectric resonator, and filter circuit using the same | |
JP2004007847A (en) | Thin film bulk wave resonator filter | |
JP2008172713A (en) | Piezoelectric thin film resonator, piezoelectric thin film resonator filter, and manufacturing method thereof | |
WO2022228385A1 (en) | Bulk acoustic wave resonator having thickened electrode, filter, and electronic device | |
US8925163B2 (en) | Method of manufacturing laterally coupled BAW thin films | |
CN114070224A (en) | Bulk acoustic wave resonator assembly with acoustic decoupling layer, manufacturing method of bulk acoustic wave resonator assembly, filter and electronic device | |
CN116846358A (en) | Filtering device and manufacturing method thereof | |
CN115694412A (en) | Integrated capacitor bulk acoustic wave resonator, filter and manufacturing method | |
TWI823258B (en) | Acoustic resonator filter | |
CN114465600A (en) | Integrated chip and preparation method thereof | |
US9160305B1 (en) | Capacitively and piezoelectrically transduced micromechanical resonators | |
TW202222033A (en) | Acoustic resonator filter |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: On-chip integrated body wave resonator and manufacturing method thereof Effective date of registration: 20180305 Granted publication date: 20170801 Pledgee: Tianjin Binhai New Area Hongxin Berg financing lease Co.,Ltd. Pledgor: ROFS MICROSYSTEM(TIANJIN) Co.,Ltd. Registration number: 2018120000007 |
|
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20200121 Granted publication date: 20170801 Pledgee: Tianjin Binhai New Area Hongxin Berg financing lease Co.,Ltd. Pledgor: ROFS MICROSYSTEM(TIANJIN) Co.,Ltd. Registration number: 2018120000007 |
|
CP03 | Change of name, title or address |
Address after: No. 27 Xinye Fifth Street, Tianjin Binhai New Area Economic and Technological Development Zone, 300462 Patentee after: ROFS MICROSYSTEM(TIANJIN) Co.,Ltd. Address before: Five street 300462 in Tianjin Binhai New Ring Road West, North Xinye Patentee before: ROFS MICROSYSTEM(TIANJIN) Co.,Ltd. |
|
CP03 | Change of name, title or address | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: On chip integrated bulk wave resonator and its manufacturing method Effective date of registration: 20210908 Granted publication date: 20170801 Pledgee: Tianjin TEDA Haihe intelligent manufacturing industry development fund partnership (L.P.) Pledgor: ROFS MICROSYSTEM(TIANJIN) Co.,Ltd. Registration number: Y2021980009022 |
|
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PP01 | Preservation of patent right |
Effective date of registration: 20240130 Granted publication date: 20170801 |
|
PP01 | Preservation of patent right | ||
PD01 | Discharge of preservation of patent |
Date of cancellation: 20241213 Granted publication date: 20170801 |
|
PD01 | Discharge of preservation of patent |