CN103267798B - Measuring device and measuring method of high-concentration tritium in gas - Google Patents
Measuring device and measuring method of high-concentration tritium in gas Download PDFInfo
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Abstract
本发明提供了一种气体中高浓度氚测量装置及其测量方法。本发明的测量装置由两个结构和材料完全相同、尺寸不同的圆柱形电离室组成。本发明的测量方法是将含氚气体依次通过本发明的测量装置中的两个电离室,并使氚测量装置中两个电离室工作在补偿模式下,通过信号符合的方式获得气体中的氚浓度。本发明的测量装置可完全消除在测量气体中高浓度氚时由于电离室室壁对氚的吸附而产生的记忆效应对测量结果的影响,实现高浓度情况下气体中氚的长期、准确测量。本发明完全满足各种场所中高浓度氚实时连续测量的要求。
The invention provides a device for measuring high-concentration tritium in gas and a measuring method thereof. The measuring device of the present invention is composed of two cylindrical ionization chambers with identical structures and materials but different sizes. The measurement method of the present invention is to pass the tritium-containing gas through the two ionization chambers in the measurement device of the present invention in sequence, and make the two ionization chambers in the tritium measurement device work in the compensation mode, and obtain the tritium in the gas by signal matching. concentration. The measuring device of the invention can completely eliminate the influence of the memory effect on the measurement result caused by the adsorption of tritium on the wall of the ionization chamber when measuring high-concentration tritium in gas, and realize long-term and accurate measurement of tritium in gas under high-concentration conditions. The invention fully meets the requirements of real-time and continuous measurement of high-concentration tritium in various places.
Description
技术领域 technical field
本发明属于辐射防护与环境保护技术领域,具体涉及一种气体中高浓度氚测量装置及其测量方法。适用于氚操作手套箱、二级容器及其它氚包容容器内氚浓度的实时测量。 The invention belongs to the technical field of radiation protection and environmental protection, and in particular relates to a measuring device for high-concentration tritium in gas and a measuring method thereof. It is suitable for real-time measurement of tritium concentration in tritium operating glove boxes, secondary containers and other tritium containing containers.
背景技术 Background technique
氚是氢的唯一放射性同位素,氚衰变发出的β射线最大能量为18.6keV,其平均能量为5.65keV。氚可能对包容材料产生腐蚀,或造成材料性能的退化(脆裂、老化)。而且,氚还能够经过吸入、食入和经完好皮肤渗入进入人体,被人体组织吸收并使之受到内照射危害,由于其放射性危害和它在环境中的特性,在辐射防护监测中,氚的监测日益受到重视。 Tritium is the only radioactive isotope of hydrogen. The maximum energy of beta rays emitted by tritium decay is 18.6keV, and its average energy is 5.65keV. Tritium may corrode containment materials or cause degradation of material properties (brittleness, aging). Moreover, tritium can also enter the human body through inhalation, ingestion, and infiltration through intact skin, and be absorbed by human tissue and cause it to be exposed to internal radiation hazards. Due to its radioactive hazards and its characteristics in the environment, in radiation protection monitoring, tritium Monitoring is receiving increasing attention.
氚的低能β粒子的穿透能力非常弱,在水中最大射程为6μm,在空气中最大射程仅为5mm,难以用普通的β探测器进行测量,所以要测量氚必须将含氚气体引入探测器的内部进行测量。 Tritium’s low-energy β particles have very weak penetrating ability. The maximum range in water is 6 μm, and the maximum range in air is only 5mm. It is difficult to measure with ordinary β detectors. Therefore, to measure tritium, tritium-containing gas must be introduced into the detector. measurement inside.
目前,针对气体中高浓度氚的测量均是采用的电离室的方法。然而,在氚浓度高时,尤其是氚化水蒸汽存在时,电离室将由于室壁材料对氚的大量吸附而导致电离室本底大大升高(一般情况下将升高2个数量级以上),这在氚浓度连续监测时将直接导致电离室测量结果偏高,无法准确测量。另外,污染后电离室去污较为困难,需要很长时间使电离室本底恢复正常。 At present, the method of ionization chamber is used for the measurement of high concentration tritium in gas. However, when the concentration of tritium is high, especially in the presence of tritiated water vapor, the background of the ionization chamber will be greatly increased due to the large amount of tritium adsorption by the chamber wall material (generally, it will increase by more than 2 orders of magnitude) , which will directly lead to high ionization chamber measurement results during continuous monitoring of tritium concentration, which cannot be accurately measured. In addition, it is difficult to decontaminate the ionization chamber after contamination, and it takes a long time to restore the background of the ionization chamber to normal.
发明内容 Contents of the invention
为了消除现有技术中电离室测氚中由于室壁对氚的吸附而产生的记忆效应,提高高浓度氚测量的准确性,本发明的目的是提供一种气体中高浓度氚测量装置,本发明的另一目的是提供一种气体中高浓度氚测量方法。通过信号补偿的方式消除电离室室壁对氚的吸附而产生的记忆效应,实现气体中高浓度氚的实时测量。 In order to eliminate the memory effect caused by the adsorption of tritium on the wall of the ionization chamber in the prior art and improve the accuracy of high-concentration tritium measurement, the purpose of the present invention is to provide a high-concentration tritium measurement device in gas. Another purpose of the invention is to provide a method for measuring high concentration tritium in gas. The memory effect caused by the adsorption of tritium on the wall of the ionization chamber is eliminated by means of signal compensation, and the real-time measurement of high-concentration tritium in the gas is realized.
本发明的气体中高浓度氚测量方法是基于不同几何结构的圆柱形在内表面积相同时体积不同的几何原理,设置两个内表面积完全相同的圆柱形电离室,利用其体积差作为电离室系统的灵敏体积进行测量。本发明的测量装置是基于两个电离室构建,两个电离室均为圆柱形,内表面积完全相同,采用相同的材料和工艺加工。在测量时,两个电离室分别加极性相反的饱和电压,使两个电离室分别收集正离子和电子,再进行信号的符合。由于内表面积相同,在经过高浓度氚后电离室室壁对氚的吸附相同,这部分在两个电离室信号符合时可完全消除,即电离室的记忆效应将被有效消除,电离室系统的最终输出信号为两个电离室体积差所输出的信号。 The method for measuring high-concentration tritium in gas of the present invention is based on the geometrical principle that the volumes of cylinders with different geometric structures are the same when the inner surface area is the same. Sensitive volume for measurement. The measuring device of the present invention is constructed based on two ionization chambers, both of which are cylindrical, have completely the same inner surface area, and are processed with the same material and process. During the measurement, the two ionization chambers are respectively applied with saturation voltages of opposite polarities, so that the two ionization chambers collect positive ions and electrons respectively, and then carry out the coincidence of the signals. Due to the same inner surface area, the adsorption of tritium on the wall of the ionization chamber is the same after high-concentration tritium, and this part can be completely eliminated when the signals of the two ionization chambers coincide, that is, the memory effect of the ionization chamber will be effectively eliminated, and the ionization chamber system The final output signal is the signal output by the volume difference of the two ionization chambers.
本发明解决其技术问题所采用的技术方案如下: The technical solution adopted by the present invention to solve its technical problems is as follows:
本发明的气体中高浓度氚测量装置,其特点是,所述的测量装置含有两个结构相同的圆柱形的第一电离室、第二电离室。其中,第一电离室包括外壳、第一绝缘件、电离室室壁、第二绝缘件、第一气管、第一收集极、第三绝缘件、第四绝缘件、保护环、第五绝缘件、电离室下盖、第六绝缘件、高压接线柱、螺帽、高压电缆头、信号电缆头、第二气管;其连接关系为,所述收集极位于第一电离室中心轴线上,收集极的下端悬空于第一电离室内部,上端设置有第四绝缘件,收集极的上端与第四绝缘件通过螺帽固定;第四绝缘件外设置有保护环,保护环外设置有第五绝缘件,第五绝缘件设置有电离室下盖;电离室室壁与电离室下盖连接;高压接线柱固定在电离室下盖上;第一气管连接在电离室室壁上,第一气管与电离室室壁之间设置有第二绝缘件;所述电离室室壁、电离室下盖均设置于外壳内,电离室室壁与外壳之间设置有第一绝缘件;电离室下盖与底座之间设置有第六绝缘件;高压电缆头与信号电缆头固定在底座侧面;所述第一电离室的收集极、电离室室壁、外壳均为同心设置; The device for measuring high-concentration tritium in gas of the present invention is characterized in that the measuring device contains two cylindrical first ionization chambers and second ionization chambers with the same structure. Wherein, the first ionization chamber includes a shell, a first insulating member, an ionization chamber wall, a second insulating member, a first gas pipe, a first collector, a third insulating member, a fourth insulating member, a guard ring, and a fifth insulating member , the lower cover of the ionization chamber, the sixth insulator, the high-voltage terminal, the nut, the high-voltage cable head, the signal cable head, and the second gas pipe; the connection relationship is that the collector is located on the central axis of the first ionization chamber, and the collector The lower end of the collector is suspended in the first ionization chamber, the upper end is provided with a fourth insulator, the upper end of the collector is fixed with the fourth insulator by a nut; the fourth insulator is provided with a protection ring, and the protection ring is provided with a fifth insulator The fifth insulator is provided with the lower cover of the ionization chamber; the wall of the ionization chamber is connected to the lower cover of the ionization chamber; the high-voltage terminal is fixed on the lower cover of the ionization chamber; the first gas pipe is connected to the wall of the ionization chamber, and the first gas pipe A second insulator is arranged between the walls of the ionization chamber; the walls of the ionization chamber and the lower cover of the ionization chamber are both arranged in the casing, and a first insulating member is arranged between the walls of the ionization chamber and the casing; the lower cover of the ionization chamber is A sixth insulator is arranged between the bases; the high-voltage cable head and the signal cable head are fixed on the side of the base; the collector of the first ionization chamber, the wall of the ionization chamber, and the shell are concentrically arranged;
所述第一电离室与第二电离室外壳均固定在底座上;第一电离室通过第二气管与第二电离室连接,第二气管与第一电离室的电离室下盖之间设置有第三绝缘件,第二气管与第二电离室的电离室下盖之间设置有第七绝缘件;第一电离室的第一收集极与第二电离室的第二收集极通过信号电缆连接。 Both the shell of the first ionization chamber and the second ionization chamber are fixed on the base; the first ionization chamber is connected with the second ionization chamber through the second gas pipe, and a The third insulator, the seventh insulator is arranged between the second gas pipe and the lower cover of the ionization chamber of the second ionization chamber; the first collector of the first ionization chamber is connected with the second collector of the second ionization chamber through a signal cable .
所述收集极、第四绝缘件、保护环、第五绝缘件、电离室下盖之间均为过盈配合;第二气管、电离室下盖、第三绝缘件之间均为过盈配合;第一气管、电离室室壁、第二绝缘件之间为过盈配合。 The collector, the fourth insulating part, the protective ring, the fifth insulating part, and the lower cover of the ionization chamber are all interference fits; the second air pipe, the lower cover of the ionization chamber, and the third insulating part are all interference fits ; There is an interference fit between the first air pipe, the wall of the ionization chamber and the second insulating member.
所述第四绝缘件、第五绝缘件材料均为聚四氟乙烯;电离室室壁、收集极、保护环、电离室下盖材料均为316L不锈钢。 The materials of the fourth insulating part and the fifth insulating part are polytetrafluoroethylene; the materials of the ionization chamber wall, collecting electrode, protective ring, and the lower cover of the ionization chamber are all 316L stainless steel.
所述第一电离室与第二电离室的内表面积相同。 The first ionization chamber and the second ionization chamber have the same inner surface area.
所述第一电离室、第二电离室中采用的材料相同。 The materials used in the first ionization chamber and the second ionization chamber are the same.
本发明的气体中高浓度氚测量方法,其特征在于依次包括以下步骤: The method for measuring high-concentration tritium in gas of the present invention is characterized in that comprising the following steps in sequence:
①.电离室系统等效体积计算 ①. Calculation of equivalent volume of ionization chamber system
第一电离室、第二电离室灵敏体积分别为: 和,且,则电离室系统的等效体积为: (1) The sensitive volumes of the first ionization chamber and the second ionization chamber are respectively: and ,and , then the equivalent volume of the ionization chamber system is: (1)
②.电离室饱和工作电压测量 ②.Ionization chamber saturation working voltage measurement
分别测量电离室系统内第一电离室和第二电离室的饱和工作电压; Measure the saturation operating voltages of the first ionization chamber and the second ionization chamber in the ionization chamber system respectively;
保持电离室内氚浓度、气体压强、气体温度不变,在电离室高压电极上加不同高压,测量电离室所收集到的电流,获得电离室的饱和电压区间,记第一电离室饱和工作电压区间为,第二电离室饱和工作电压区间为; Keep the tritium concentration, gas pressure, and gas temperature in the ionization chamber constant, apply different high voltages to the high-voltage electrodes of the ionization chamber, measure the current collected by the ionization chamber, obtain the saturation voltage range of the ionization chamber, and record the saturation working voltage range of the first ionization chamber for , the saturation working voltage interval of the second ionization chamber is ;
③. 电离室系统的等效饱和电流测量 ③. Equivalent saturation current measurement of ionization chamber system
分别在第一电离室和第二电离室上加极性相反的饱和工作电压,在第一电离室加饱和工作电压,在第二电离室加饱和工作电压,通过弱电流测量仪测量电离室系统收集到的饱和电流信号; Apply saturation operating voltages with opposite polarities to the first ionization chamber and the second ionization chamber respectively, and apply saturation operating voltage to the first ionization chamber , add saturation working voltage in the second ionization chamber , the saturation current signal collected by the ionization chamber system is measured by a weak current measuring instrument ;
④.气体中氚浓度计算 ④. Calculation of tritium concentration in gas
在测得电离室系统收集到的饱和电流后,气体中氚浓度可用公式(2)计算: The saturation current collected in the measured ion chamber system After that, the tritium concentration in the gas can be calculated by formula (2):
(2) (2)
式中: In the formula:
E-为氚的β射线的平均能量,单位eV,取5.65keV; E - is the average energy of beta rays of tritium, unit eV, take 5.65keV;
e-为电子电荷,单位1.6×10-19C; e - electronic charge, unit 1.6×10 -19 C;
-为密封容器中气体的平均电离功,即在密封容器内气体中每产生一对离子所需要的平均能量,单位eV,对应于空气该值为36.0eV/离子对; - is the average ionization work of the gas in the sealed container, that is, the average energy required to generate a pair of ions in the gas in the sealed container, the unit is eV, and the value corresponding to air is 36.0eV/ion pair;
V eff -为电离室灵敏体积,单位m3; V eff - is the sensitive volume of the ionization chamber, in m 3 ;
将上述参数带入公式(2),得到气体中氚浓度值。 Bring the above parameters into the formula (2) to get the tritium concentration value in the gas.
本发明的的工作原理是采用两个电离室组成的系统来消除室壁对氚的吸附产生的记忆效应。工作时,在两个电离室高压电极上加极性相反的高压,使电离室收集极收集到的信号相反,通过直接连接两个电离室的收集极的方法使两个电离室的输出信号进行符合,完全消除电离室室壁对氚的吸附而产生的记忆效应,实现气体中高浓度氚的准确测量。本发明完全满足各种场所(如手套箱、二级容器及其它氚包容容器)中高浓度氚在线连续测量的要求。 The working principle of the present invention is to use a system composed of two ionization chambers to eliminate the memory effect produced by the adsorption of tritium on the walls of the chambers. When working, add high voltage with opposite polarity to the high-voltage electrodes of the two ionization chambers, so that the signals collected by the collectors of the ionization chambers are opposite, and the output signals of the two ionization chambers are directly connected to the collectors of the two ionization chambers. Conformity, completely eliminate the memory effect caused by the adsorption of tritium on the wall of the ionization chamber, and realize the accurate measurement of high-concentration tritium in the gas. The invention fully satisfies the requirements of continuous on-line measurement of high-concentration tritium in various places (such as glove boxes, secondary containers and other tritium containing containers).
附图说明 Description of drawings
图1为本发明的气体中高浓度氚测量装置结构示意图。 Fig. 1 is a schematic structural diagram of a device for measuring high-concentration tritium in gas according to the present invention.
图中:1.外壳 2.第一绝缘件 3. 电离室室壁 4.第二绝缘件 5.第一气管 6.第一收集极 7.第三绝缘件 8.第四绝缘件 9.保护环 10.第五绝缘件 11.电离室下盖 12.第六绝缘件 13.高压接线柱 14.螺帽 15.高压电缆头 16.信号电缆头 17.第二气管 18.底座 。 In the figure: 1. Shell 2. First insulating part 3. Ionization chamber wall 4. Second insulating part 5. First gas pipe 6. First collector 7. Third insulating part 8. Fourth insulating part 9. Protection Ring 10. The fifth insulating piece 11. The lower cover of the ionization chamber 12. The sixth insulating piece 13. High voltage terminal 14. Nut 15. High voltage cable head 16. Signal cable head 17. Second gas pipe 18. Base.
具体实施方式 Detailed ways
下面结合附图对本发明作进一步详细说明。 The present invention will be described in further detail below in conjunction with the accompanying drawings.
实施例1 Example 1
图1为本发明的气体中高浓度氚测量装置结构示意图。在图1中,本发明的气体中高浓度氚测量装置含有两个结构相同的圆柱形的第一电离室Ⅰ、第二电离室Ⅱ。其中,第一电离室Ⅰ包括外壳1、第一绝缘件2、电离室室壁3、第二绝缘件4、第一气管5、第一收集极6、第三绝缘件7、第四绝缘件8、保护环9、第五绝缘件10、电离室下盖11、第六绝缘件12、高压接线柱13、螺帽14、高压电缆头15、信号电缆头16、第二气管17;其连接关系为,所述收集极6位于第一电离室Ⅰ中心轴线上,收集极6的下端悬空于第一电离室Ⅰ内部,上端设置有第四绝缘件8,收集极6的上端与第四绝缘件8通过螺帽14固定;第四绝缘件8外设置有保护环9,保护环9外设置有第五绝缘件10,第五绝缘件10设置有电离室下盖11;电离室室壁3与电离室下盖11连接;高压接线柱13固定在电离室下盖11上;第一气管5连接在电离室室壁3上,第一气管5与离室室壁3之间设置有第二绝缘件4;所述电离室室壁3、电离室下盖11均设置于外壳1内,电离室室壁3与外壳1之间设置有第一绝缘件2;电离室下盖11与底座18之间设置有第六绝缘件12;高压电缆头15与信号电缆头16固定在底座18侧面;所述第一电离室的收集极6、电离室室壁3、外壳1均为同心设置; Fig. 1 is a schematic structural diagram of a device for measuring high-concentration tritium in gas according to the present invention. In Fig. 1, the device for measuring high-concentration tritium in gas of the present invention contains two cylindrical first ionization chambers I and second ionization chambers II with the same structure. Among them, the first ionization chamber I includes a shell 1, a first insulating member 2, an ionization chamber wall 3, a second insulating member 4, a first gas pipe 5, a first collector 6, a third insulating member 7, and a fourth insulating member 8. Protective ring 9, fifth insulator 10, ionization chamber lower cover 11, sixth insulator 12, high-voltage terminal 13, nut 14, high-voltage cable head 15, signal cable head 16, second gas pipe 17; its connection The relationship is that the collector 6 is located on the central axis of the first ionization chamber I, the lower end of the collector 6 is suspended in the interior of the first ionization chamber I, the upper end is provided with a fourth insulating member 8, and the upper end of the collector 6 is insulated from the fourth The part 8 is fixed by a nut 14; the fourth insulating part 8 is provided with a protective ring 9, and the protective ring 9 is provided with a fifth insulating part 10, and the fifth insulating part 10 is provided with an ionization chamber lower cover 11; the ionization chamber wall 3 It is connected to the lower cover 11 of the ionization chamber; the high-voltage terminal 13 is fixed on the lower cover 11 of the ionization chamber; the first gas pipe 5 is connected to the wall 3 of the ionization chamber, and a second Insulator 4; the ionization chamber wall 3 and the ionization chamber lower cover 11 are all arranged in the shell 1, and a first insulating member 2 is arranged between the ionization chamber wall 3 and the shell 1; the ionization chamber lower cover 11 and the base 18 A sixth insulator 12 is arranged between them; the high-voltage cable head 15 and the signal cable head 16 are fixed on the side of the base 18; the collector 6 of the first ionization chamber, the wall 3 of the ionization chamber, and the shell 1 are all arranged concentrically;
所述第一电离室Ⅰ与第二电离室Ⅱ外壳均固定在底座18上;第一电离室Ⅰ通过第二气管17与第二电离室Ⅱ连接,第二气管17与第一电离室Ⅰ的电离室下盖11之间设置有第三绝缘件7,第二气管17与第二电离室Ⅱ的电离室下盖之间设置有绝缘件;第一电离室Ⅰ的第一收集极6与第二电离室Ⅱ的第二收集极通过信号电缆连接。 Both the shells of the first ionization chamber I and the second ionization chamber II are fixed on the base 18; the first ionization chamber I is connected with the second ionization chamber II through the second gas pipe 17, and the second gas pipe 17 is connected with the A third insulator 7 is arranged between the lower cover 11 of the ionization chamber, and an insulating member is arranged between the second gas pipe 17 and the lower cover of the ionization chamber of the second ionization chamber II; the first collector 6 of the first ionization chamber I and the second The second collector of the second ionization chamber II is connected by a signal cable.
所述收集极6、第四绝缘件8、保护环9、第五绝缘件10、电离室下盖11之间均为过盈配合;第二气管17、电离室下盖11、第三绝缘件7之间均为过盈配合;第一气管5、电离室室壁3、第二绝缘件4之间为过盈配合。 The collector 6, the fourth insulator 8, the guard ring 9, the fifth insulator 10, and the lower cover 11 of the ionization chamber are all interference fits; the second gas pipe 17, the lower cover 11 of the ionization chamber, and the third insulator 7 are all interference fits; the first air pipe 5, the ionization chamber wall 3, and the second insulating member 4 are interference fits.
所述第四绝缘件8、第五绝缘件10材料均为聚四氟乙烯;电离室室壁3、收集极6、保护环9、电离室下盖11材料均为316L不锈钢。 The materials of the fourth insulating part 8 and the fifth insulating part 10 are polytetrafluoroethylene; the materials of the ionization chamber wall 3, the collector 6, the protection ring 9 and the lower cover 11 of the ionization chamber are all 316L stainless steel.
所述第一电离室Ⅰ与第二电离室Ⅱ的内表面积相同,体积不同。 The first ionization chamber I and the second ionization chamber II have the same inner surface area but different volumes.
所述第一电离室Ⅰ、第二电离室Ⅱ中采用的材料相同。 The materials used in the first ionization chamber I and the second ionization chamber II are the same.
本发明的一种气体中高浓度氚测量方法,包括以下步骤: A method for measuring high-concentration tritium in gas of the present invention comprises the following steps:
①.电离室系统等效体积计算 ①. Calculation of equivalent volume of ionization chamber system
在本实例中,两个电离室体积分别为1.4L、1.0L,则等效体积。 In this example, the volumes of the two ionization chambers are 1.4L and 1.0L respectively, then the equivalent volume .
②.电离室饱和工作电压测量 ②.Ionization chamber saturation working voltage measurement
保持电离室内氚浓度气体压强、气体温度不变的条件下,测得有效体积为1.4L和1.0L的电离室饱和工作电压区间分别为和。 Under the condition of keeping the tritium concentration gas pressure and gas temperature in the ionization chamber constant, the measured saturation working voltage intervals of the ionization chambers with effective volumes of 1.4L and 1.0L are respectively and .
③. 电离室系统的等效饱和电流测量 ③. Equivalent saturation current measurement of ionization chamber system
本实施例中,在第Ⅰ电离室和第Ⅱ电离室分别加饱和工作电压和,使用弱电流测量仪测得的电离室系统的等效饱和电流nA。 In this embodiment, the saturation operating voltage is applied to the first ionization chamber and the second ionization chamber respectively and , the equivalent saturation current of the ionization chamber system measured with a weak current measuring instrument nA.
④. 气体中氚浓度计算 ④. Calculation of tritium concentration in gas
根据公式(2),本实施例中氚浓度为: According to formula (2), the tritium concentration in this embodiment is:
在测量完该浓度含氚气体后,用氮气冲洗15分钟,电离室系统恢复本底电流。 After measuring the concentration of tritium-containing gas, flush with nitrogen for 15 minutes, and the ionization chamber system restores the background current.
本发明不限于该实施例,本发明所述均可实施并具有良好效果。 The present invention is not limited to this embodiment, and all described in the present invention can be implemented and have good effects.
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US9921184B2 (en) * | 2016-05-20 | 2018-03-20 | Terrapower, Llc | Sodium-cesium ionization detector |
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