CN102998321A - Anti-counterfeiting subject matter, preparation method and detection method thereof - Google Patents
Anti-counterfeiting subject matter, preparation method and detection method thereof Download PDFInfo
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- CN102998321A CN102998321A CN2012101452083A CN201210145208A CN102998321A CN 102998321 A CN102998321 A CN 102998321A CN 2012101452083 A CN2012101452083 A CN 2012101452083A CN 201210145208 A CN201210145208 A CN 201210145208A CN 102998321 A CN102998321 A CN 102998321A
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Abstract
The invention discloses an anti-counterfeiting subject matter, a preparation method and a detection method of the anti-counterfeiting subject matter, wherein the preparation method comprises the steps of acquiring various components with the corresponding content according to preset component types and various component contents of a metal nano-mixture, and uniformly mixing to obtain the uniform metal nano-mixture; providing a subject matter, and implanting the uniform metal nano-mixture into the subject matter, so as to form the anti-counterfeiting subject matter. According to the anti-counterfeiting subject matter, the preparation method and the detection method of the subject matter disclosed by the invention, by implanting the metal nano-mixture with preset component types and various component contents in the anti-counterfeiting subject matter, when detecting whether a subject matter is the anti-counterfeiting subject matter, X ray is adopted to radiate the subject matter when determining whether the element types and various element contents in the subject matter are consist with the implanted metal nano-mixture according to an obtained X ray florescence spectrum; others cannot copy the anti-counterfeiting subject matter disclosed by the invention, so that generation of fake subject matter is avoided; and the anti-counterfeiting subject matter can be applied to ceramic, glass, metal and other technical fields.
Description
Technical field
The present invention relates to field of anti-counterfeit technology, especially relate to a kind of false proof subject matter and preparation method thereof, detection method.
Background technology
Anti-counterfeiting technology refers to the Adopts measure in order to reach false proof purpose, and it can accurately be discerned the false from the genuine within the specific limits, and is difficult for the technology that is imitated and copies.Briefly be exactly to prevent from copying counterfeit technology.False proof is to take deception as purpose, and the activity of copying or copying without the owner permits and the measure that prevents taked.The anti-counterfeiting technology product is take false proof as purpose, and has adopted anti-counterfeiting technology to make, and has anti-fraud functional product.
The anti-counterfeiting technology kind is a lot, mainly contains antiforge technology, nano metal powder anti-counterfeiting technology, physics anti-counterfeiting technology, digital information false proof technology, structure and package anti-counterfeiting technology, human body and biological characteristic anti-counterfeiting technology etc.
Wherein, it is low that described nano metal powder anti-counterfeiting technology has a cost, detects very convenient.But nano metal powder can only be confined in ink paste, prepared Chinese ink, the paper technical field in the prior art.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of false proof subject matter and preparation method thereof, detection method, and the fake products of stopping false proof subject matter produces, the technical field that the expanded metal nano-mixture is used.
The present invention proposes a kind of false proof subject matter, is prepared from by following steps:
Component kind and each component concentration of the metal nano potpourri that step 1, basis are preset obtain each component of corresponding content, and make it to mix the uniform metal nano potpourri of formation;
Step 2, provide subject matter, described uniform metal nano potpourri is implanted in the described subject matter, form false proof subject matter.
The present invention proposes a kind of preparation method of false proof subject matter in addition, may further comprise the steps:
Component kind and each component concentration of the metal nano potpourri that step 1, basis are preset obtain each component of corresponding content, and make it to mix the uniform metal nano potpourri of formation;
Step 2, described uniform metal nano potpourri is implanted in the false proof subject matter.
The present invention proposes a kind of false-proof detection method of false proof subject matter in addition, may further comprise the steps:
Step 1, the tested subject matter of employing x-ray bombardment obtain the XRF spectrum;
Step 2, determine element kind corresponding to this XRF spectrum according to the wavelength of XRF spectrum;
Step 3, determine the content of this XRF spectrum corresponding element according to the intensity of XRF spectrum;
Step 4, the element kind of judge determining and definite constituent content, whether consistent with component kind and each component concentration in the metal nano potpourri that false proof subject matter is implanted; If consistent, represent that then tested subject matter is false proof subject matter; If inconsistent, represent that then tested subject matter is non-false proof subject matter.
Preferably, described XRF spectrum comprises a kind of XRF spectrum of wavelength or multi-wavelength's XRF spectrum; The XRF of every kind of wavelength is composed corresponding a kind of element.
A kind of false proof subject matter provided by the present invention and preparation method thereof, detection method, wherein by implant the metal nano potpourri that presets component kind and each component concentration at false proof subject matter, when whether the detection subject matter is false proof subject matter, only need to adopt the x-ray bombardment subject matter, according to the XRF spectrum that obtains determine contained element kind in the subject matter and each constituent content whether with the metal nano potpourri of implanting in component and each component concentration consistent getting final product whether, other people can't copy this false proof subject matter of the present invention, and the fake products that therefore can stop false proof subject matter produces; This false proof subject matter can be applicable to numerous technical fields such as pottery, glass, metal simultaneously.
Description of drawings
Fig. 1 is the process flow diagram of the preparation method embodiment of false proof subject matter of the present invention;
Fig. 2 is the process flow diagram of the detection method embodiment of false proof subject matter of the present invention;
Fig. 3 is the principle schematic of x-ray bombardment atom;
Fig. 4 is that atom is subjected to after the x-ray bombardment principle schematic of electronic transition in the atomic nucleus.
The realization of the object of the invention, functional characteristics and advantage are described further with reference to accompanying drawing in connection with embodiment.
Embodiment
Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
Referring to Fig. 1, a kind of false proof subject matter of the present invention is proposed, the preparation method of this subject matter may further comprise the steps:
Component kind and each component concentration of the metal nano potpourri that step S101, basis are preset obtain each component of corresponding content, and make it to mix the uniform metal nano potpourri of formation;
Step S102, provide subject matter, described uniform metal nano potpourri is implanted in the described subject matter, form false proof subject matter.
In above-described embodiment, contained component kind and each component concentration of the metal nano potpourri of implanting for different subject matter can be identical or different.The contained component of described metal nano potpourri can light metal, heavy metal or rare metal.
Referring to Fig. 2, other proposes the false-proof detection method embodiment of a kind of false proof subject matter of the present invention, may further comprise the steps:
Step S201, the tested subject matter of the employing sufficiently high x-ray bombardment of energy obtain the XRF spectrum;
Step S202, determine element kind corresponding to this XRF spectrum according to the wavelength of XRF spectrum;
Step S203, determine the content of this XRF spectrum corresponding element according to the intensity of XRF spectrum;
Step S204, the element kind of judge determining and definite constituent content, whether consistent with component kind and each component concentration in the metal nano potpourri that false proof subject matter is implanted; If consistent, represent that then tested subject matter is false proof subject matter; If inconsistent, represent that then tested subject matter is non-false proof subject matter.
Further, among the false-proof detection method embodiment of above-mentioned false proof subject matter, described XRF spectrum comprises a kind of XRF spectrum of wavelength or multi-wavelength's XRF spectrum; The XRF of every kind of wavelength is composed corresponding a kind of element.
In above-described embodiment, contained component kind and each component concentration of the metal nano potpourri of implanting for different subject matter can be identical or different.The contained component of described metal nano potpourri can light metal, heavy metal or rare metal.
Whether among the false-proof detection method embodiment of above-mentioned false proof subject matter of the present invention, detecting subject matter by XRF is that the principle of false proof subject matter is as follows:
When the atom of element is subject to the sigmatron irradiation in the subject matter, can launch the XRF spectrum with certain feature, the wavelength of characteristic spectral line is only relevant with Atom of Elements (Z); What of the intensity of characteristic spectral line and constituent content are relevant.Therefore according to wavelength corresponding to XRF spectrum, comprise as can be known any element in the subject matter, according to the XRF spectral intensity of a certain wavelength, contain as can be known the content of this wavelength corresponding element in the subject matter.
Because the XRF of sending from subject matter has the natural wavelength of contained element, this natural wavelength can represent with following formula: λ=2d sin θ--------(1).Therefore among the step S202 among the false-proof detection method embodiment of above-mentioned false proof subject matter, wavelength corresponding to XRF spectrum calculates by following formula (1).
Wherein, d is that the interplanar distance of analyzing crystal is known, the angle of diffraction of the θ XRF that to be analyzing crystal launch subject matter.Described θ needs to measure in advance, then calculates the wavelength X of XRF according to formula (1).
Because the XRF wavelength in the XRF spectrum and the relation of element are as follows:
（1/λ）
1/2=K（Z-S）------（2）；
Wherein, λ is the XRF wavelength, and Z is the atom coefficient of element, and K and S are constant; In the wavelength substitution formula (2) that therefore formula (1) can be calculated, calculate atom coefficient Z corresponding to this wavelength, thereby determine element kind corresponding to this wavelength.
As can be known when the atom coefficient increase of element, corresponding XRF wavelength shortens from above-mentioned formula (2).
XRF is the electromagnetic wave in certain particular range of wavelengths in the electromagnetic wave spectrum, its characteristic usually use energy (unit: keV, keV) and wavelength (unit: nm) description.
XRF is the phenomenon due to the intratomic changes.Referring to Fig. 3, a stable atomic structure is comprised of atomic nucleus and extranulear electron.Its extranulear electron all moves at separately trapped orbit with distinctive energy separately, inner electron (such as the K layer) breaks away from the constraint of atom under the x-ray bombardment of enough energy, discharge, the ejecting of electronics can cause this electron shell to occur mutually should the electron vacancy.At this moment the electronics (as: L layer) that is in the high-energy electron shell can transit to that this low energy electrons shell fills up mutually should the electron vacancy.Because exist the energy difference distance between the different electron shells, the difference on these energy discharges with the form of secondary x rays fluorescence, the secondary x rays fluorescence that different elements discharges has specific energy response.
The XRF of incident has relatively large energy, can pound the electronics in the atom internal layer of element.During K layer vacancy, electronics enters the K layer by the transition of L layer, and the characteristic X-ray fluorescence that gives off is called K
αLine; Enter the K layer from the transition of M layer, the characteristic X-ray fluorescence that gives off is called K
βLine.Referring to Fig. 4, in like manner L is that XRF also has L
αL
βDeng characteristic X-ray fluorescence, it is that L is fluorescence that x ray fluorescence spectrometry adopts K more, the less employing of other linear systems.
And according to quantum theory, XRF can be regarded as by a kind of quantum or the molecular particle flux of light, and the energy that each light has is:
E=hν=hC/λ----------（3）；
In the formula (3), E is the energy of XRF photon, and unit is keV; H is Planck's constant; ν is the frequency of light wave; C is the light velocity.
Therefore, as long as measure wavelength or the energy of XRF, just can know the kind of element.
The intensity of the characteristic X-ray fluorescence of each element is except outside the Pass having with the energy of excitaton source and intensity, also with the content positive correlation of this element in subject matter.
Because what x-ray fluorescence analysis obtained is relative assay value, so need standard specimen when carrying out quantitative test. selected analyzing crystal and detecting device, the intensity of the XRF that the statistical measurement sample sends, standard model and the unknown sample of known content are measured under identical conditions, determined the content of unknown sample.
The inner X-fluorescence ray that produces of subject matter, before arriving the subject matter surface, coexistence elements on every side can produce absorption (absorption effect), also can produce simultaneously the X-fluorescence ray and to coexistence elements secondary excitation (secondary excitation effect).Therefore even content is the same, because the difference of coexistence elements, the X-fluorescence transmitted intensity is difference to some extent also, matrix effect that Here it is.When quantitative test, need to consider the impact of matrix effect.
The foundation that the XRF fluorescent spectrometry carries out quantitative test is that the x-ray fluorescence intensity Ii of element is directly proportional with the content Wi of this element in the subject matter:
Ii=IsWi---------（4）；
In the formula (4), when Is is Wi=100%, the intensity of the XRF of this element.According to above-mentioned formula (4), can adopt calibration curve method, method of addition, internal standard method etc. to carry out quantitative test.It is same or similar as far as possible that but these methods all will make the composition of standard model and subject matter form, otherwise the impact of the matrix effect of subject matter or coexistence elements can cause very large deviation to measurement result.So-called matrix effect refers to the impact that the variation of the basic chemical composition of subject matter and physical and chemical state causes x-ray fluorescence intensity.The variation of chemical composition can affect subject matter to the absorption of primary X-ray fluorescence and XRF, also can change enhancement effect of fluorescence.For example, during the element such as Fe and Ni, because exciting of primary X-ray fluorescence can produce NiK α XRF, NiK α may be absorbed by Fe in sample, Fe is excited produce FeK α in measuring stainless steel; When measuring Ni, because the absorption effect of Fe makes Lower result; When measuring Fe, because enhancement effect of fluorescence makes the result higher.But it almost is again impossible disposing identical matrix.For overcoming this problem, X penetrates the fluorescence spectrum quantivative approach can adopt fundamental parameters method.Fundamental parameters method calculates element XRF theoretical strength with standard specimen or pure material, and surveys the intensity of its XRF on the basis of the absorption between each element of consideration and enhancement effect.Observed strength and theoretical strength are compared, obtain the sensitivity coefficient of this element, when surveying unknown subject matter, measure first the x-ray fluorescence intensity of subject matter, set the initial concentration value according to observed strength and sensitivity coefficient, again by this concentration value theory of computation intensity.To measure intensity and theoretical strength relatively, and make both reach a certain predetermined accuracy, otherwise will again revise, this fundamental parameters method is wanted elements all in the measurement and calculation subject matter, and consider between these elements mutually disturbing effect, calculate very complicatedly, must rely on computing machine to calculate.When calculating the atom content of certain element in subject matter by this fundamental parameters method, when this atom content greater than 1% the time, its relative standard deviation can be less than 1%.
The above-mentioned basic parameter quantitative analysis method that provides is solid and powdered sample for the metal nano potpourri of implanting subject matter, and then the atom content of light element detects and is limited to 50 μ g/g, and the atom of heavy element detects and is limited to 5 μ g/g.
Step S203 determines according to the intensity of XRF spectrum that the method for the content of this XRF spectrum corresponding element can adopt and above-mentionedly mentions any quantitative detecting method and detect among the false-proof detection method embodiment of above-mentioned false proof subject matter.
False proof subject matter provided by the present invention, because component and each component concentration pre-set in the metal nano potpourri of implanting, when detecting false proof subject matter by XRF detect metal nano component contained in it and each component concentration whether with pre-set consistent, if consistent, show that then tested subject matter is false proof subject matter, otherwise show that tested subject matter is non-false proof subject matter.Almost other people can't copy this false proof subject matter of the present invention, and the fake products that therefore can stop false proof subject matter produces.This false proof subject matter application is extensive simultaneously, can use in the technical fields such as pottery, glass, metal.
Should be understood that; below only be the preferred embodiments of the present invention; can not therefore limit claim of the present invention; every equivalent structure or equivalent flow process conversion that utilizes instructions of the present invention and accompanying drawing content to do; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present invention.
Claims (4)
1. a false proof subject matter is characterized in that, is prepared from by following steps:
Component kind and each component concentration according to default metal nano potpourri obtain each component of corresponding content, and make it to mix the uniform metal nano potpourri of formation;
Subject matter is provided, described uniform metal nano potpourri is implanted in the described subject matter, form false proof subject matter.
2. the preparation method of a false proof subject matter is characterized in that, may further comprise the steps:
Component kind and each component concentration according to default metal nano potpourri obtain each component of corresponding content, and make it to mix the uniform metal nano potpourri of formation;
Described uniform metal nano potpourri is implanted in the false proof subject matter.
3. the false-proof detection method of a false proof subject matter is characterized in that, may further comprise the steps:
Adopt the tested subject matter of x-ray bombardment, obtain the XRF spectrum;
Determine element kind corresponding to this XRF spectrum according to the wavelength of XRF spectrum;
Determine the content of this XRF spectrum corresponding element according to the intensity of XRF spectrum;
The element kind of judge determining and the constituent content of determining, whether consistent with component kind and each component concentration in the metal nano potpourri that false proof subject matter is implanted; If consistent, represent that then tested subject matter is false proof subject matter; If inconsistent, represent that then tested subject matter is non-false proof subject matter.
4. the false-proof detection method of false proof subject matter according to claim 3 is characterized in that, described XRF spectrum comprises a kind of XRF spectrum of wavelength or multi-wavelength's XRF spectrum; The XRF of every kind of wavelength is composed corresponding a kind of element.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104312034A (en) * | 2014-09-19 | 2015-01-28 | 金发科技股份有限公司 | Polyvinyl chloride anti-counterfeiting film and preparation method thereof |
| CN107077680A (en) * | 2014-10-16 | 2017-08-18 | 艾科菱株式会社 | Identification systems and authentication method |
| CN107578254A (en) * | 2017-09-01 | 2018-01-12 | 景德镇陶瓷大学 | An anti-counterfeiting method for ceramic products based on adding trace element identification area |
| CN110208303A (en) * | 2019-07-11 | 2019-09-06 | 深圳市应星开物科技有限公司 | The detection method of boccaro ware |
| CN110885232A (en) * | 2018-09-07 | 2020-03-17 | 宜兴益工坊紫砂泥料研究所有限公司 | Anti-counterfeiting purple clay teapot and preparation method thereof |
| WO2020248116A1 (en) * | 2019-06-11 | 2020-12-17 | 南通纺织丝绸产业技术研究院 | Anti-counterfeiting composition for anti-counterfeiting chemical fiber, preparation method therefor and application thereof |
| CN116735842A (en) * | 2023-08-14 | 2023-09-12 | 中国标准化研究院 | A rapid test and comparison method and system for similar paper objects |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1132153A (en) * | 1994-12-16 | 1996-10-02 | 电化学工业有限公司（国际） | Composition for delocalized marking of articles, its preparation and use |
| CN1230738A (en) * | 1998-11-09 | 1999-10-06 | 天津戈德防伪识别有限公司 | Article truth identifying system |
| US6666991B1 (en) * | 1998-11-27 | 2003-12-23 | Nittetsu Mining Co., Ltd. | Fluorescent or phosphorescent composition |
| EP1632908A1 (en) * | 2004-09-02 | 2006-03-08 | Giesecke & Devrient GmbH | Value document with luminescent properties |
| CN1845806A (en) * | 2003-09-05 | 2006-10-11 | 三菱麻铁里亚尔株式会社 | Metal microparticles, composition containing the microparticles, and method for producing metal microparticles |
| CN101102905A (en) * | 2005-01-14 | 2008-01-09 | 卡伯特公司 | Security features, their use, and processes for making them |
| CN101177555A (en) * | 2006-07-31 | 2008-05-14 | 纳幕尔杜邦公司 | Coatable compositions, coatings prepared therefrom, process and luminescent coated articles |
| CN101405146A (en) * | 2006-03-20 | 2009-04-08 | 巴斯夫欧洲公司 | Nanoparticulate metal boride composition and its use for identification-marking plastic parts |
| CN102031037A (en) * | 2009-09-27 | 2011-04-27 | 施乐公司 | Ferromagnetic nanometer particle with strong magnetic anisotropy for MICR (Magnetic Ink Character Recognition) ink application |
| CN201837586U (en) * | 2008-12-13 | 2011-05-18 | 亚力高亚洲科技(香港)有限公司 | Apparatus for article authentication using taggant material |
-
2012
- 2012-05-11 CN CN2012101452083A patent/CN102998321A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1132153A (en) * | 1994-12-16 | 1996-10-02 | 电化学工业有限公司（国际） | Composition for delocalized marking of articles, its preparation and use |
| CN1230738A (en) * | 1998-11-09 | 1999-10-06 | 天津戈德防伪识别有限公司 | Article truth identifying system |
| US6666991B1 (en) * | 1998-11-27 | 2003-12-23 | Nittetsu Mining Co., Ltd. | Fluorescent or phosphorescent composition |
| CN1845806A (en) * | 2003-09-05 | 2006-10-11 | 三菱麻铁里亚尔株式会社 | Metal microparticles, composition containing the microparticles, and method for producing metal microparticles |
| EP1632908A1 (en) * | 2004-09-02 | 2006-03-08 | Giesecke & Devrient GmbH | Value document with luminescent properties |
| CN101102905A (en) * | 2005-01-14 | 2008-01-09 | 卡伯特公司 | Security features, their use, and processes for making them |
| CN101405146A (en) * | 2006-03-20 | 2009-04-08 | 巴斯夫欧洲公司 | Nanoparticulate metal boride composition and its use for identification-marking plastic parts |
| CN101177555A (en) * | 2006-07-31 | 2008-05-14 | 纳幕尔杜邦公司 | Coatable compositions, coatings prepared therefrom, process and luminescent coated articles |
| CN201837586U (en) * | 2008-12-13 | 2011-05-18 | 亚力高亚洲科技(香港)有限公司 | Apparatus for article authentication using taggant material |
| CN102031037A (en) * | 2009-09-27 | 2011-04-27 | 施乐公司 | Ferromagnetic nanometer particle with strong magnetic anisotropy for MICR (Magnetic Ink Character Recognition) ink application |
Non-Patent Citations (4)
| Title |
|---|
| 人生无限: "X射线荧光分析", 《百度百科 HTTP://BAIKE.BAIDU.COM/HISTORY/21942372》, 20 July 2011 (2011-07-20) * |
| 宋苏环 等: "波长色散型X射线荧光光谱仪与能量色散型X射线荧光光谱仪的比较", 《现代仪器》, no. 6, 31 December 1999 (1999-12-31), pages 47 - 48 * |
| 简虎 等: "能量色散X射线荧光光谱分析及其应用", 《电子质量》, 31 December 2006 (2006-12-31), pages 13 - 15 * |
| 蔡宏伟等: "《分析化学》", 31 August 2008, article "X射线荧光光谱法", pages: 203 * |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104312034A (en) * | 2014-09-19 | 2015-01-28 | 金发科技股份有限公司 | Polyvinyl chloride anti-counterfeiting film and preparation method thereof |
| CN107077680A (en) * | 2014-10-16 | 2017-08-18 | 艾科菱株式会社 | Identification systems and authentication method |
| CN107077680B (en) * | 2014-10-16 | 2021-03-12 | 艾科菱株式会社 | Authentication system and authentication method |
| CN107578254A (en) * | 2017-09-01 | 2018-01-12 | 景德镇陶瓷大学 | An anti-counterfeiting method for ceramic products based on adding trace element identification area |
| CN107578254B (en) * | 2017-09-01 | 2021-01-01 | 景德镇陶瓷大学 | Ceramic product anti-counterfeiting method based on trace element added identification area |
| CN110885232A (en) * | 2018-09-07 | 2020-03-17 | 宜兴益工坊紫砂泥料研究所有限公司 | Anti-counterfeiting purple clay teapot and preparation method thereof |
| WO2020248116A1 (en) * | 2019-06-11 | 2020-12-17 | 南通纺织丝绸产业技术研究院 | Anti-counterfeiting composition for anti-counterfeiting chemical fiber, preparation method therefor and application thereof |
| CN110208303A (en) * | 2019-07-11 | 2019-09-06 | 深圳市应星开物科技有限公司 | The detection method of boccaro ware |
| CN110208303B (en) * | 2019-07-11 | 2021-10-15 | 深圳市应星开物科技有限公司 | Detection method of purple sand ware |
| CN116735842A (en) * | 2023-08-14 | 2023-09-12 | 中国标准化研究院 | A rapid test and comparison method and system for similar paper objects |
| CN116735842B (en) * | 2023-08-14 | 2023-10-17 | 中国标准化研究院 | A rapid test and comparison method and system for similar paper objects |
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