CN102746795A - Polishing solution for printed circuit microsections and preparation method thereof - Google Patents
Polishing solution for printed circuit microsections and preparation method thereof Download PDFInfo
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- 238000005498 polishing Methods 0.000 title claims abstract description 73
- 238000002360 preparation method Methods 0.000 title claims abstract description 13
- LNTHITQWFMADLM-UHFFFAOYSA-N gallic acid Chemical compound OC(=O)C1=CC(O)=C(O)C(O)=C1 LNTHITQWFMADLM-UHFFFAOYSA-N 0.000 claims abstract description 50
- 239000000843 powder Substances 0.000 claims abstract description 35
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims abstract description 29
- 229940074391 gallic acid Drugs 0.000 claims abstract description 23
- 235000004515 gallic acid Nutrition 0.000 claims abstract description 23
- 239000003960 organic solvent Substances 0.000 claims abstract description 22
- 239000000243 solution Substances 0.000 claims description 31
- 239000002245 particle Substances 0.000 claims description 21
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical group CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 19
- 238000000498 ball milling Methods 0.000 claims description 15
- 239000006185 dispersion Substances 0.000 claims description 10
- 239000012530 fluid Substances 0.000 claims description 7
- 238000010790 dilution Methods 0.000 claims description 4
- 239000012895 dilution Substances 0.000 claims description 4
- 238000010907 mechanical stirring Methods 0.000 claims description 2
- 238000013019 agitation Methods 0.000 claims 1
- 239000000470 constituent Substances 0.000 claims 1
- 239000007788 liquid Substances 0.000 abstract description 17
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 239000013078 crystal Substances 0.000 abstract description 5
- 238000003860 storage Methods 0.000 abstract description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 abstract description 4
- 239000003292 glue Substances 0.000 abstract description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract description 3
- 229910052802 copper Inorganic materials 0.000 abstract description 3
- 239000010949 copper Substances 0.000 abstract description 3
- 238000000576 coating method Methods 0.000 abstract description 2
- 230000007774 longterm Effects 0.000 abstract description 2
- 229910052759 nickel Inorganic materials 0.000 abstract description 2
- 238000011160 research Methods 0.000 abstract description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 15
- 238000000034 method Methods 0.000 description 12
- 230000000694 effects Effects 0.000 description 8
- 238000001465 metallisation Methods 0.000 description 6
- 239000010410 layer Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- 238000005054 agglomeration Methods 0.000 description 4
- 230000002776 aggregation Effects 0.000 description 4
- 239000004744 fabric Substances 0.000 description 4
- 239000000314 lubricant Substances 0.000 description 3
- 238000007517 polishing process Methods 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 239000000725 suspension Substances 0.000 description 3
- 238000007385 chemical modification Methods 0.000 description 2
- 238000007865 diluting Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 150000002910 rare earth metals Chemical class 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 238000003760 magnetic stirring Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002113 nanodiamond Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000001132 ultrasonic dispersion Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
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Abstract
一种印制电路金相切片用抛光液及其制备方法,属于印制电路板制造技术领域。本发明提供一种专门用于抛光印制电路板金相切片的抛光液,适用于抛光采用水晶胶固定的铜、镍等镀层的观测研究。该抛光液由氧化铝粉体、没食子酸(3,4,5-三羟基苯甲酸)和有机溶剂组成,该抛光液具有制备过程简单、价格便宜,抛光液可长时间稳定存放的特点,经其抛光的金相切片表面平整,便于观察。
The invention discloses a polishing solution for metallographic sectioning of printed circuits and a preparation method thereof, belonging to the technical field of printed circuit board manufacturing. The invention provides a polishing solution specially used for polishing metallographic sections of printed circuit boards, which is suitable for observation and research of polishing copper, nickel and other coatings fixed by crystal glue. The polishing liquid is composed of alumina powder, gallic acid (3,4,5-trihydroxybenzoic acid) and an organic solvent. The polishing liquid has the characteristics of simple preparation process, low price, and long-term stable storage of the polishing liquid. Its polished metallographic section has a flat surface for easy observation.
Description
技术领域 technical field
本发明属于印制电路板制造技术领域,特别涉及了印制电路金相切片制作中的抛光技术。 The invention belongs to the technical field of printed circuit board manufacture, and in particular relates to the polishing technology in the manufacture of printed circuit metallographic slices. the
背景技术 Background technique
印制电路板的小型化与高密度化发展要求实现层间互连功能的孔微细化与应用板内埋盲孔技术的普及化。孔金属化过程需要先经过化学镀或黑孔形成孔内导电层,然后电镀加厚,但往住受电镀溶液成分、电镀工艺参数与设计板厚孔径比大的影响,孔金属化的质量无法定性控制,因此需要通过金相切片手段观测孔金属化的效果,最终选择合适的设计与电镀溶液确保孔金属化的高质量。 The miniaturization and high-density development of printed circuit boards requires the miniaturization of holes for interlayer interconnection functions and the popularization of buried blind hole technology in application boards. The hole metallization process needs to go through electroless plating or black holes to form a conductive layer in the hole, and then electroplate to thicken it. However, the quality of the hole metallization is often affected by the composition of the electroplating solution, the parameters of the electroplating process, and the large ratio of the designed plate thickness to the aperture. Qualitative control, so it is necessary to observe the effect of hole metallization by means of metallographic section, and finally select the appropriate design and plating solution to ensure the high quality of hole metallization. the
制作金相切片过程应在不破坏孔金属化原始效果的情况下保证环氧树脂水晶胶与电路板切片的金属层表面光滑平整,从而实现孔金属化质量的可靠观察。经不同目数的砂纸打磨后,金相切片最后还需经历抛光过程,而抛光效果的好坏将直接影响观测的效率。抛光过程是利用抛光布和抛光介质对金相切片表面进行平滑修饰加工,抛光所用颗粒体系的质量对于抛光效果影响巨大。具备良好抛光效果的抛光介质,其颗粒体系须具备以下要求:(1)微粉粒度均匀一致;(2)纯度高;(3)分散性和吸附性良好;(4)粉体颗粒有一定的晶格形态,破碎时形成锐利的尖角,以提高抛光效率;(5)有合适的硬度和密度,且与水溶液有良好浸润性和悬浮性。刚玉型氧化铝硬度高,其细微粉体随抛光布转动时可以有效地对切片的表面进行微量切割,切片的表面平整度高,满足抛光效果的基本要求。 The process of making metallographic slices should ensure that the surface of the epoxy resin crystal glue and the metal layer of the circuit board slice is smooth and flat without destroying the original effect of hole metallization, so as to achieve reliable observation of the quality of hole metallization. After being polished with sandpaper of different meshes, the metallographic section needs to go through a polishing process at the end, and the quality of the polishing effect will directly affect the efficiency of observation. The polishing process is to use polishing cloth and polishing media to smooth and modify the surface of the metallographic section. The quality of the particle system used in polishing has a great influence on the polishing effect. The particle system of the polishing medium with good polishing effect must meet the following requirements: (1) The particle size of the micropowder is uniform; (2) High purity; (3) Good dispersibility and adsorption; (4) The powder particles have certain crystal It has a lattice shape and forms sharp sharp angles when broken to improve polishing efficiency; (5) It has suitable hardness and density, and has good wettability and suspension with aqueous solution. Corundum-type alumina has high hardness, and its fine powder can effectively cut a small amount of the surface of the slice when it rotates with the polishing cloth. The surface of the slice has high flatness, which meets the basic requirements for polishing effect. the
常用的抛光介质包括抛光粉与抛光液。在抛光过程中最普遍使用的是抛光粉,主要有碳化硅抛光粉、稀土型抛光粉与氧化铝抛光粉等,此类抛光粉属于固相抛光材料,可以实现粗糙的抛光过程,但是粉体用量无法准确控制导致用量大浪费多,放置时间长易造成颗粒团聚,而且抛光粉粒径分布不均造成金相切片的划痕多,影响抛光整体效果。抛光液属于液相抛光材料,是将抛光粉分散在有机或无机溶液中从而形成一定浓度的抛光粉分散液。与抛光粉相比,抛光液有明显的优点:由于液体连续相的包裹,使得抛光粉颗粒相互间不直接接触, 减少了团聚作用;抛光液粘度低,颗粒分布均匀,有效控制使用量。但是抛光液中的微细粒子团聚体分离成单个粒子或者由少量粒子组成的小团聚体并均匀侵入有机溶液时,粒子由于表面能大而容易产生浸湿现象,如果粒子因浸湿而使其表面构成有机膜或者带有双电层或者形成聚合物吸附层等,都会对粒子的初步分散产生积极效应,但对粒子的深度分散则应考虑粒子的分散与团聚的平衡性。而配制稳定可靠的抛光液实质上就是将抛光粉深度分散在溶液的过程,因此必须通过粒子进行化学改性或化学修饰等方法削弱粒子的表面吸附作用,增强粒子间的排斥作用能,最终减小粒子发生团聚现象。聂祚人等(中国发明专利,专利申请号200610001059.8)利用超声分散法制备了用于化学机械抛光的稀土抛光液,张贺等(中国发明专利,专利申请号201010591103.1)利用机械搅拌法制备了碳化硅抛光液,高璐等(中国发明专利,专利申请号201010170416.X)利用高速剪切法制备了氧化铝抛光液。这些制备抛光液的方法所涉及的仪器设备均比较贵重,工艺流程复杂,不适合在大规模工业化的PCB生产中广泛应用。翟海军等(中国发明专利,专利申请号201110244241.7)采用了球磨、处理、再分离、分散的方法配制了纳米金刚石抛光液,其制作工序复杂,耗时长。本发明提供一种通过球磨细化与搅拌稀释实现简易制作抛光液的方法。 Commonly used polishing media include polishing powder and polishing liquid. Polishing powder is most commonly used in the polishing process, mainly including silicon carbide polishing powder, rare earth polishing powder and alumina polishing powder. Unable to accurately control the dosage will lead to a large amount of waste, long storage time will easily cause particle agglomeration, and the uneven distribution of polishing powder particle size will cause many scratches on the metallographic section, which will affect the overall polishing effect. The polishing liquid belongs to the liquid phase polishing material, which is to disperse the polishing powder in the organic or inorganic solution to form a certain concentration of the polishing powder dispersion. Compared with polishing powder, polishing liquid has obvious advantages: due to the wrapping of the liquid continuous phase, the polishing powder particles do not directly contact each other, which reduces the agglomeration; the polishing liquid has low viscosity, uniform particle distribution, and effective control of usage. However, when the fine particle aggregates in the polishing liquid are separated into single particles or small aggregates composed of a small number of particles and evenly invade the organic solution, the particles are prone to wetting due to their large surface energy. Forming an organic film or having an electric double layer or forming a polymer adsorption layer will have a positive effect on the initial dispersion of the particles, but for the deep dispersion of the particles, the balance between the dispersion and agglomeration of the particles should be considered. The preparation of a stable and reliable polishing solution is essentially the process of deeply dispersing the polishing powder in the solution. Therefore, the surface adsorption of the particles must be weakened by chemical modification or chemical modification of the particles, and the repulsion between the particles can be enhanced. Agglomeration of small particles occurs. Nie Zuoren et al. (Chinese invention patent, patent application number 200610001059.8) prepared a rare earth polishing solution for chemical mechanical polishing by ultrasonic dispersion method, Zhang He et al. Liquid, Gao Lu et al. (Chinese invention patent, patent application number 201010170416.X) prepared alumina polishing liquid by high-speed shearing method. The instruments and equipment involved in these methods for preparing polishing solutions are relatively expensive, and the process flow is complicated, so they are not suitable for wide application in large-scale industrialized PCB production. Zhai Haijun et al. (Chinese invention patent, patent application number 201110244241.7) used ball milling, treatment, re-separation, and dispersion methods to prepare nano-diamond polishing fluid. The production process is complicated and time-consuming. The invention provides a simple method for preparing polishing liquid through ball milling and stirring and diluting. the
发明内容 Contents of the invention
本发明提供一种专门用于抛光印制电路板金相切片的抛光液,适用于抛光采用水晶胶固定的铜、镍等镀层的观测研究。该抛光液由氧化铝粉体、没食子酸(3,4,5-三羟基苯甲酸)和有机溶剂组成,该抛光液具有制备过程简单、价格便宜,抛光液可长时间稳定存放的特点,经其抛光的金相切片表面平整,便于观察。 The invention provides a polishing solution specially used for polishing metallographic sections of printed circuit boards, which is suitable for observation and research of polishing copper, nickel and other coatings fixed by crystal glue. The polishing liquid is composed of alumina powder, gallic acid (3,4,5-trihydroxybenzoic acid) and an organic solvent. The polishing liquid has the characteristics of simple preparation process, low price, and long-term stable storage of the polishing liquid. Its polished metallographic section has a flat surface for easy observation. the
本发明详细技术方案: Detailed technical scheme of the present invention:
一种印制电路金相切片抛光液,包括氧化铝粉体、没食子酸和有机溶剂,各组分质量百分比含量为:氧化铝粉体0.5%~3%、没食子酸0.1%~1%,其余为有机溶剂;所述有机溶剂为乙醇或乙二醇。 A metallographic section polishing solution for printed circuit, comprising alumina powder, gallic acid and organic solvent, the mass percent content of each component is: 0.5%~3% of alumina powder, 0.1%~1% of gallic acid, and the rest It is an organic solvent; the organic solvent is ethanol or ethylene glycol. the
一种印制电路金相切片抛光液的制备方法,包括如下步骤: A preparation method for a printed circuit metallographic section polishing solution, comprising the steps of:
步骤1:配制没食子酸有机溶液。将没食子酸溶于乙醇或乙二醇有机溶剂中,配制成0.5%到1%浓度的溶液。 Step 1: Prepare gallic acid organic solution. Dissolve gallic acid in ethanol or ethylene glycol organic solvent to prepare a solution with a concentration of 0.5% to 1%. the
步骤2:球磨。将氧化铝粉体与步骤1所配制的没食子酸有机溶液混合后进行球磨细化处理。 Step 2: Ball milling. The alumina powder is mixed with the gallic acid organic solution prepared in step 1, and then subjected to ball milling treatment. the
步骤3:稀释。往步骤2球磨细化处理后的混合体系添加没食子酸、乙醇或乙二醇有机溶剂进行分散稀释,配制成最终的抛光液;所述抛光液中氧化铝粉体、没食子酸和有机溶剂的质量百分比含量为:氧化铝粉体0.5%~3%、没食子酸0.1%~1%,其余为有机溶剂;所述有机溶剂为乙醇或乙二醇。 Step 3: Dilution. Add gallic acid, ethanol or ethylene glycol organic solvent to the mixed system after the ball milling treatment in step 2 for dispersion and dilution, and prepare the final polishing solution; the quality of alumina powder, gallic acid and organic solvent in the polishing solution The percentage content is: 0.5%~3% of alumina powder, 0.1%~1% of gallic acid, and the rest is organic solvent; the organic solvent is ethanol or ethylene glycol. the
没食子酸是一种稳定混合体系的添加剂,在抛光液中的质量百分比浓度为0.1%~1%时可以有效改善抛光效果,保持氧化铝粉体均匀稳定分散在有机溶液中。步骤1中没食子酸的有机溶液作为氧化铝球磨处理的预分散液,其作用是充当球磨细化氧化铝粉体的润滑剂。球磨处理后的氧化铝粉体颗粒的粒径控制在100±5nm,可有效抑制氧化铝粉体颗粒尺寸过大而受重力作用沉聚在有机溶剂底部。球磨处理后的氧化铝预分散液直接添加有机溶剂和没食子酸分散稀释,稀释时,采用机械搅拌或者磁力搅拌,以加快氧化铝粉体在有机溶剂的分散速度。 Gallic acid is an additive to stabilize the mixed system. When the mass percentage concentration in the polishing solution is 0.1%~1%, it can effectively improve the polishing effect and keep the alumina powder uniformly and stably dispersed in the organic solution. The organic solution of gallic acid in step 1 is used as the pre-dispersion liquid for the alumina ball milling treatment, and its function is to act as a lubricant for the ball milling fine alumina powder. The particle size of the alumina powder after ball milling is controlled at 100±5nm, which can effectively prevent the particle size of the alumina powder from being too large and agglomerating at the bottom of the organic solvent due to gravity. The alumina pre-dispersion liquid after ball milling is directly added with organic solvent and gallic acid to disperse and dilute. When diluting, mechanical stirring or magnetic stirring is used to speed up the dispersion speed of alumina powder in organic solvent. the
本发明的有益效果是: The beneficial effects of the present invention are:
本发明提供了一种专门用于PCB金相切片的抛光液及其制备方法,在产品质量达到现有标准的同时,降低了生产成本,简便易操作且在抛光液配制成后可长时间稳定存放,不发生团聚,可长途运输或保存。 The invention provides a polishing solution specially used for PCB metallographic slicing and a preparation method thereof. While the product quality reaches the existing standard, the production cost is reduced, the operation is simple and easy, and the polishing solution can be stable for a long time after it is prepared. Storage, no reunion, long-distance transport or storage. the
附图说明 Description of drawings
图1是本发明提供的印制电路金相切片用抛光液制备方法流程示意图。 Fig. 1 is a schematic flowchart of a method for preparing a polishing solution for metallographic sectioning of printed circuits provided by the present invention. the
图2是球磨后氧化铝粉体的扫描电子显微镜图片。 Fig. 2 is a scanning electron microscope picture of alumina powder after ball milling. the
图3是金相切片的金相显微镜图片。 Figure 3 is a metallographic microscope picture of a metallographic section. the
具体实施方式Detailed ways
可以通过下列实例来实现本发明: The present invention can be realized by the following examples:
实例1: Example 1:
溶剂体系的配制:将没食子酸按照需要的比例溶解在乙醇中,配成浓度为0.5%到1%的溶液。 Preparation of solvent system: Dissolve gallic acid in ethanol according to the required ratio to prepare a solution with a concentration of 0.5% to 1%. the
取少量配制好的溶剂,作为润滑剂,对氧化铝粉体进行球磨处理12小时。将球磨后的氧化铝悬液用配好的溶剂稀释至上述要求的比例,并搅拌均匀。 Take a small amount of prepared solvent as a lubricant, and ball mill the alumina powder for 12 hours. Dilute the ball-milled alumina suspension to the above-mentioned ratio with the prepared solvent, and stir evenly. the
取少量配制好的抛光液放置在润湿的抛光布上,进行抛光,水晶胶表面经过十分钟左右处理就可达到表面平整光滑,光学显微镜下无明显划痕。 Take a small amount of the prepared polishing solution and place it on a wet polishing cloth for polishing. After about ten minutes of treatment, the surface of the crystal glue can be smooth and smooth, and there is no obvious scratch under the optical microscope. the
配制好的抛光液在密封条件下可以长时间保存。 The prepared polishing solution can be stored for a long time under sealed conditions. the
实例2: Example 2:
溶液体系的配制:将没食子酸按照需要的比例溶解在乙二醇中,配成浓度为0.1%到0.5%的溶液。 Preparation of the solution system: Dissolve gallic acid in ethylene glycol according to the required ratio to prepare a solution with a concentration of 0.1% to 0.5%. the
按照实例1的步骤,取少量配制好的溶剂,作为润滑剂,对氧化铝粉体进行球磨处理12小时。将球磨后的氧化铝悬液用配好的溶剂稀释至上述要求的比例,并搅拌均匀。 According to the steps of Example 1, a small amount of prepared solvent was used as a lubricant, and the alumina powder was ball milled for 12 hours. Dilute the ball-milled alumina suspension to the above-mentioned ratio with the prepared solvent, and stir evenly. the
取少量配制好的抛光液放置在润湿的抛光布上,进行抛光,铜层表面经过十分钟左右处理就可达到表面平整光滑,光学显微镜下无明显划痕。 Take a small amount of the prepared polishing solution and place it on a wet polishing cloth for polishing. After about ten minutes of treatment, the surface of the copper layer will be smooth and smooth, and there will be no obvious scratches under the optical microscope. the
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CN103728167A (en) * | 2013-12-23 | 2014-04-16 | 四川材料与工艺研究所 | Long-term preservation method and observation method of light metal hydride metallographic specimen |
CN106769169A (en) * | 2017-02-17 | 2017-05-31 | 安徽国家铜铅锌及制品质量监督检验中心 | A kind of preparation method of printed circuit board failed areas sample |
CN107699138A (en) * | 2017-10-31 | 2018-02-16 | 诺土(上海)新材料技术有限公司 | A kind of preparation method of the alumina polishing solution of water-based controlled particle size |
CN108336218A (en) * | 2018-01-29 | 2018-07-27 | 长安大学 | A kind of road piezo-electricity composite material and preparation method thereof |
CN116005239A (en) * | 2022-12-02 | 2023-04-25 | 确信乐思化学(上海)有限公司 | Preparation of electrolytic polishing liquid for observing the original appearance of the copper-plated layer and the method for observing the original appearance of the copper-plated layer |
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CN1787895A (en) * | 2003-05-12 | 2006-06-14 | 高级技术材料公司 | Improved chemical mechanical polishing compositions for copper and associated materials and method of using same |
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Cited By (7)
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CN103728167A (en) * | 2013-12-23 | 2014-04-16 | 四川材料与工艺研究所 | Long-term preservation method and observation method of light metal hydride metallographic specimen |
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CN106769169A (en) * | 2017-02-17 | 2017-05-31 | 安徽国家铜铅锌及制品质量监督检验中心 | A kind of preparation method of printed circuit board failed areas sample |
CN107699138A (en) * | 2017-10-31 | 2018-02-16 | 诺土(上海)新材料技术有限公司 | A kind of preparation method of the alumina polishing solution of water-based controlled particle size |
CN108336218A (en) * | 2018-01-29 | 2018-07-27 | 长安大学 | A kind of road piezo-electricity composite material and preparation method thereof |
CN108336218B (en) * | 2018-01-29 | 2021-12-07 | 长安大学 | Piezoelectric composite material for road and preparation method thereof |
CN116005239A (en) * | 2022-12-02 | 2023-04-25 | 确信乐思化学(上海)有限公司 | Preparation of electrolytic polishing liquid for observing the original appearance of the copper-plated layer and the method for observing the original appearance of the copper-plated layer |
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