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CN102412336A - Miniaturized infrared thermal sensing module and method of manufacturing the same - Google Patents

Miniaturized infrared thermal sensing module and method of manufacturing the same Download PDF

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CN102412336A
CN102412336A CN2010102926726A CN201010292672A CN102412336A CN 102412336 A CN102412336 A CN 102412336A CN 2010102926726 A CN2010102926726 A CN 2010102926726A CN 201010292672 A CN201010292672 A CN 201010292672A CN 102412336 A CN102412336 A CN 102412336A
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pads
infrared thermal
chip
thermal sensing
substrate
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CN102412336B (en
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李宗昇
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UniMEMS Manufacturing Co Ltd
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Abstract

一种微小化的红外线热感测组件的制造方法,其步骤包括:提供一晶圆与一基板,晶圆设有数个晶片。于晶片底部成形四个焊垫部、一热敏电阻以及一红外线热感测层,该四个焊垫部分别电性连接于热敏电阻与红外线热感测层。将数个焊料分别固定于焊垫部上。将晶片顶面进行背向蚀刻,使晶片成形一感测薄膜及环绕连接于感测薄膜周围的一环侧壁。将晶圆与基板对接。加热焊料,使每一晶片与基板焊接在一起。将数个滤光片分别插设于每一晶片的环侧壁内。切割晶圆与基板以成形数个红外线热感测组件。此外,本发明另提供一种微小化的红外线热感测组件。

A method for manufacturing a miniaturized infrared thermal sensing component, the steps of which include: providing a wafer and a substrate, wherein the wafer is provided with a plurality of chips. Forming four pads, a thermistor, and an infrared thermal sensing layer at the bottom of the chip, wherein the four pads are electrically connected to the thermistor and the infrared thermal sensing layer, respectively. Fixing a plurality of solders on the pads, respectively. Back-etching the top surface of the chip to form a sensing film and a ring side wall surrounding the sensing film. Butt-joining the wafer and the substrate. Heating the solder to weld each chip to the substrate. Inserting a plurality of filters into the ring side wall of each chip, respectively. Cutting the wafer and the substrate to form a plurality of infrared thermal sensing components. In addition, the present invention further provides a miniaturized infrared thermal sensing component.

Description

微小化的红外线热感测组件及其制造方法Miniaturized infrared thermal sensing component and manufacturing method thereof

技术领域 technical field

本发明是有关一种微小化的红外线热感测组件,尤指一种接收红外线的热感测组件及其制造方法。The invention relates to a miniaturized infrared thermal sensing component, especially a thermal sensing component for receiving infrared rays and a manufacturing method thereof.

背景技术 Background technique

请参阅图1至图2,此为习知的红外线热感测组件,其包括:一基座1a、数个接脚2a、一晶片3a、数个导线4a、一盖体5a、一滤光片6a以及一热敏电阻7a。Please refer to Fig. 1 to Fig. 2, this is the conventional infrared thermal sensing assembly, which includes: a base 1a, several pins 2a, a chip 3a, several wires 4a, a cover 5a, a light filter Sheet 6a and a thermistor 7a.

该基座1a形成数个贯穿基座1a的穿孔11a,该些接脚2a分别设置于穿孔11a;该晶片3a具有一感测薄膜31a以及环绕于感测薄膜31a周围的一环侧壁32a,环侧壁32a底面形成一开口321a,并且环侧壁32a的底面固定于基座1a上,该热敏电阻7a设置于基座1a上,该些导线4a分别将该些接脚2a连接于环侧壁32a顶面以及热敏电阻7a;该盖体5a固定于基座1a上且晶片3a设置于盖体5a内,盖体5a对应于感测薄膜31a的部位形成一固定孔51a,该滤光片6a固定于固定孔51a上。The base 1a forms several through holes 11a through the base 1a, and the pins 2a are respectively disposed in the through holes 11a; the chip 3a has a sensing film 31a and a ring side wall 32a surrounding the sensing film 31a, An opening 321a is formed on the bottom surface of the ring side wall 32a, and the bottom surface of the ring side wall 32a is fixed on the base 1a, the thermistor 7a is arranged on the base 1a, and the wires 4a respectively connect the pins 2a to the ring Side wall 32a top surface and thermistor 7a; The cover body 5a is fixed on the base 1a and the chip 3a is arranged in the cover body 5a, and the position of the cover body 5a corresponding to the sensing film 31a forms a fixing hole 51a, the filter The optical sheet 6a is fixed on the fixing hole 51a.

上述结构的成形,主要是先准备一晶圆(图略),该晶圆具有数个晶片3a,并且该些晶片3a于组装前,其皆先进行背向蚀刻,藉以将各晶片3a内形成一凹槽状结构。The forming of the above-mentioned structure mainly prepares a wafer (figure omitted) earlier, and this wafer has several wafers 3a, and before these wafers 3a are assembled, it all carries out back etching earlier, in order to form in each wafer 3a A groove-like structure.

接着,再将晶圆做切割,藉以形成数个晶片3a,取其中一个晶片3a,以黏晶机(图略)将晶片3a黏接于具有接脚2a的基座1a上,且将热敏电阻7a设置于基座1a上,其后以打线机(图略)将晶片3a与热敏电阻7a分别连接于接脚2a上,最后,将装设有滤光片6a的盖体5a密合于基座1a上。其中,接脚2a装设于基座1a内以及滤光片6a固定于盖体5a,此两部分须在进行上述组装前就准备完成。Then, the wafer is cut to form several chips 3a, and one of the chips 3a is taken, and the chip 3a is bonded to the base 1a with the pins 2a by a die bonder (not shown), and the heat-sensitive The resistor 7a is set on the base 1a, and then the chip 3a and the thermistor 7a are respectively connected to the pins 2a with a wire bonder (not shown), and finally, the cover 5a with the optical filter 6a is tightly sealed. fit on the base 1a. Wherein, the pin 2a is installed in the base 1a and the optical filter 6a is fixed on the cover 5a, these two parts must be prepared before the above assembly.

习知的红外线热感测组件主要由红外线穿透滤光片6a,进而被感测薄膜31a所接收。但滤光片6a与感测薄膜31a之间的距离过大,所以容易产生目标红外线辐射的重叠干扰现象。再者,于生产时须以单颗红外线热感测组件为一个单位进行生产,并且接脚2a装设于基座1a内、滤光片6a固定于盖体5a,以及热敏电阻7a需黏接于基座1a,且接线至接脚2a,此三部分须有额外的制程,使得整体生产成本过高。The conventional infrared thermal sensing components are mainly received by the infrared sensing film 31a through the infrared transmission filter 6a. However, the distance between the optical filter 6a and the sensing film 31a is too large, so overlapping interference phenomenon of target infrared radiation is likely to occur. Furthermore, a single infrared thermal sensing component must be produced as a unit during production, and the pin 2a is installed in the base 1a, the filter 6a is fixed on the cover 5a, and the thermistor 7a needs to be glued. Connected to the base 1a and wired to the pin 2a, these three parts require additional manufacturing processes, which makes the overall production cost too high.

因此,本发明人有感上述缺失的可改善,乃特潜心研究并配合学理的运用,终于提出一种设计合理且有效改善上述缺失的本发明。Therefore, the inventor of the present invention feels that the above shortcomings can be improved, so he devoted himself to research and combined with the application of theories, and finally proposed an invention with reasonable design and effective improvement of the above shortcomings.

发明内容 Contents of the invention

本发明的主要目的,在于提供一种尺寸小、生产成本低以及可避免红外线重叠干扰现象的红外线热感测组件。The main object of the present invention is to provide an infrared heat sensing component with small size, low production cost and avoiding infrared overlapping interference phenomenon.

为达上述的目的,本发明提供一种微小化的红外线热感测组件的制造方法,其步骤包括:提供一晶圆以及一基板,该晶圆设有数个晶片;于每一晶片底部成形四个焊垫部、一热敏电阻以及一红外线热感测层,将该四个焊垫部其中两个电性连接于该热敏电阻,另两个焊垫部电性连接于该红外线热感测层;将数个焊料分别固定于该四个焊垫部上;将每一晶片顶面进行背向蚀刻,使每一晶片内皆成形一感测薄膜以及环绕连接于该感测薄膜周围的一环侧壁;将数个焊料分别固定于该至少两焊垫与该热敏电阻上;将该晶圆与该基板对接;加热该些焊料,使每一晶片与该基板焊接在一起;将数个滤光片分别插设于每一晶片的该环侧壁内;以及切割该晶圆与该基板以成形数个红外线热感测组件。In order to achieve the above-mentioned purpose, the present invention provides a method for manufacturing a miniaturized infrared thermal sensing component. The steps include: providing a wafer and a substrate, the wafer is provided with several chips; forming four chips at the bottom of each chip Two pads, a thermistor and an infrared thermal sensing layer, two of the four pads are electrically connected to the thermistor, and the other two pads are electrically connected to the infrared thermal sensor A plurality of solders are respectively fixed on the four soldering pads; the top surface of each chip is etched backward, so that a sensing film is formed in each chip and a sensor is connected around the sensing film. a ring side wall; several solders are respectively fixed on the at least two welding pads and the thermistor; the wafer is connected to the substrate; the solders are heated to weld each chip to the substrate; Several optical filters are respectively inserted in the ring side wall of each wafer; and the wafer and the substrate are cut to form several infrared thermal sensing components.

本发明另提供一种微小化的红外线热感测组件的制造方法,其步骤包括:提供一晶圆以及一基板,该晶圆设有数个晶片;于每一晶片底部成形四个焊垫部、一热敏电阻与一红外线热感测层,将该四个焊垫部其中两个电性连接于该热敏电阻,另两个焊垫部电性连接于该红外线热感测层;将数个焊料分别固定于该四个焊垫部上;将每一晶片顶面进行背向蚀刻,使每一晶片内皆成形一感测薄膜以及环绕连接于该感测薄膜周围的一环侧壁;切割该晶圆为数个晶片;将数个焊料分别固定于该至少两焊垫与该热敏电阻上;将每一晶片接合于该基板上;加热该些焊料,使每一晶片与该基板焊接在一起;将数个滤光片分别插设于每一晶片的该环侧壁内;以及切割该基板以成形数个红外线热感测组件。The present invention also provides a method for manufacturing a miniaturized infrared thermal sensing component, the steps of which include: providing a wafer and a substrate, the wafer is provided with several chips; forming four pads at the bottom of each chip, A thermistor and an infrared heat sensing layer, two of the four pads are electrically connected to the thermistor, and the other two pads are electrically connected to the infrared heat sensing layer; A solder is respectively fixed on the four welding pads; the top surface of each chip is etched backward, so that a sensing film is formed in each chip and a ring side wall is connected around the sensing film; cutting the wafer into several chips; fixing several solders on the at least two pads and the thermistor respectively; bonding each chip to the substrate; heating the solders to weld each chip to the substrate together; inserting several optical filters in the ring side wall of each wafer; and cutting the substrate to form several infrared thermal sensing components.

本发明又提供一种微小化的红外线热感测组件,包括:一晶片,其具有一感测薄膜以及环绕连接于该感测薄膜周围的一环侧壁,该感测薄膜内形成有一红外线热感测层,该环侧壁顶面形成一开口,该环侧壁底部形成有四个焊垫部以及一热敏电阻;以及一滤光片,其通过该开口设置于该环侧壁内缘;其中,该四个焊垫部其中两个电性连接于该热敏电阻,另两焊垫部电性连接于该红外线热感测层。The present invention also provides a miniaturized infrared heat sensing component, including: a chip, which has a sensing film and a ring side wall surrounding and connected to the sensing film, and an infrared heat sensor is formed in the sensing film. In the sensing layer, an opening is formed on the top surface of the side wall of the ring, four pads and a thermistor are formed on the bottom of the side wall of the ring; and an optical filter is arranged on the inner edge of the side wall of the ring through the opening ; Among them, two of the four pads are electrically connected to the thermistor, and the other two pads are electrically connected to the infrared thermal sensing layer.

本发明具有下述有益的效果:The present invention has following beneficial effect:

(1)可批量生产降低生产成本:本发明的制造方法可进行大规模的量产制造,而不须以单个进行生产,因此,可大幅地降低生产成本。(1) Mass production is possible to reduce production cost: the manufacturing method of the present invention can be mass-produced on a large scale without the need for individual production, therefore, the production cost can be greatly reduced.

(2)避免红外线的重叠干扰现象:本发明将滤光片设置于环侧壁的内缘,使得滤光片与感测薄膜之间的距离大幅的缩短,进而可有效地避免红外线的重叠干扰现象。(2) Avoid overlapping interference of infrared rays: the present invention arranges the optical filter on the inner edge of the ring side wall, so that the distance between the optical filter and the sensing film is greatly shortened, thereby effectively avoiding overlapping interference of infrared rays Phenomenon.

(3)大幅缩小尺寸:本发明将滤光片的一部份设置于环侧壁内缘所包覆的空间,使得红外线热感测组件的高度大幅降低,进而缩小尺寸。并且,使用电路板令尺寸更进一步的缩小。(3) Significantly reduced size: In the present invention, a part of the optical filter is arranged in the space covered by the inner edge of the ring side wall, so that the height of the infrared thermal sensing component is greatly reduced, thereby reducing the size. Also, the use of circuit boards further reduces the size.

(4)降低原料耗费成本:本发明不须使用盖体,并且将热敏电阻直接形成于环侧壁底部,因此,每个红外线热感测组件所需耗费的原料成本将显著地下降。(4) Reduce raw material cost: the present invention does not need to use a cover body, and the thermistor is directly formed on the bottom of the ring side wall, therefore, the raw material cost required for each infrared heat sensing component will be significantly reduced.

(5)应用范围广:本发明的整体大小与一个晶片的尺寸相当,因此,本发明的微小化的红外线热感测组件的应用范围更广,如可应用于手机、耳温枪以及传感器等装置,并且使该些装置具有缩小尺寸的空间。(5) Wide range of applications: the overall size of the present invention is equivalent to the size of a chip, therefore, the miniaturized infrared heat sensing component of the present invention has a wider range of applications, such as being applicable to mobile phones, ear thermometers and sensors, etc. devices, and enable these devices to have a reduced size space.

为使能更进一步了解本发明的特征及技术内容,请参阅以下有关本发明的详细说明与附图,但是此等说明与附图仅是用来说明本发明,而非对本发明的权利范围作任何的限制。In order to enable a further understanding of the features and technical contents of the present invention, please refer to the following detailed descriptions and drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than to limit the scope of rights of the present invention. any restrictions.

附图说明 Description of drawings

图1为习知红外线感测组件的示意图。FIG. 1 is a schematic diagram of a conventional infrared sensing device.

图2为习知红外线感测组件的剖视图。FIG. 2 is a cross-sectional view of a conventional infrared sensing component.

图3为本发明第一实施例的步骤流程图。FIG. 3 is a flowchart of the steps of the first embodiment of the present invention.

图4为本发明第二实施例的步骤流程图。FIG. 4 is a flowchart of the steps of the second embodiment of the present invention.

图5为本发明第三实施例的俯视图。Fig. 5 is a top view of a third embodiment of the present invention.

图6为本发明第三实施例的仰视图。Fig. 6 is a bottom view of the third embodiment of the present invention.

图7为本发明第三实施例反射层涂设于感测薄膜的剖视图。7 is a cross-sectional view of a reflective layer coated on a sensing film according to a third embodiment of the present invention.

图8为本发明第三实施例反射层涂设于电路板的剖视图。8 is a cross-sectional view of a reflective layer coated on a circuit board according to a third embodiment of the present invention.

图9为本发明第四实施例反射层涂设于感测薄膜的剖视图。9 is a cross-sectional view of a reflective layer coated on a sensing film according to a fourth embodiment of the present invention.

图10为本发明第四实施例反射层涂设于电路板的剖视图。10 is a cross-sectional view of a reflective layer coated on a circuit board according to a fourth embodiment of the present invention.

符号说明Symbol Description

1a基座                    11a穿孔1a base 11a perforation

2a接脚                    3a晶片2a pin 3a chip

31a感测薄膜               32a环侧壁31a Sensing film 32a Ring side wall

321a开口                  4a导线321a opening 4a wire

5a盖体                    51a固定孔5a cover body 51a fixing hole

6a滤光片                  7a热敏电阻6a filter 7a thermistor

1基板                     11电路板1 base board 11 circuit board

111接点                   112线路111 contacts 112 lines

2晶片                     21感测薄膜2 chip 21 sensing film

211红外线热感测材料       212开孔211 infrared heat sensing material 212 opening

22环侧壁                  221开口22 ring side wall 221 opening

222斜面                   223阶梯面222 inclined plane 223 stepped surface

23焊垫部                  231焊垫23 Welding Pads 231 Welding Pads

24热敏电阻                3焊料24 Thermistor 3 Solder

4第一黏接件               5滤光片4 The first bonding part 5 Optical filter

6第二黏接件               7反射层6 The second bonding part 7 Reflective layer

具体实施方式 Detailed ways

请参阅图3并且参酌图5至图10,其为本发明的第一实施例,本实施例为一种微小化的红外线热感测组件的制造方法,其步骤包括:Please refer to FIG. 3 and refer to FIG. 5 to FIG. 10 , which is the first embodiment of the present invention. This embodiment is a method of manufacturing a miniaturized infrared thermal sensing component. The steps include:

提供一晶圆(图略)以及一基板1,该晶圆设有数个晶片2。其中,该基板1可为电路板11、陶瓷板或硅晶圆(图略)。A wafer (not shown) and a substrate 1 are provided, the wafer is provided with several chips 2 . Wherein, the substrate 1 can be a circuit board 11 , a ceramic board or a silicon wafer (not shown).

请参阅图6,于每一晶片2底部成形四个焊垫部23、一热敏电阻24以及一红外线热感测层211。热敏电阻24以薄膜制程成形,并且将该四个焊垫部23其中两个电性连接于热敏电阻24,另两个焊垫部23电性连接于红外线热感测层211。其中,该四个焊垫部23各成形至少一焊垫231,且焊垫部23成形于红外线热感测层211的外侧。此外,本实施例的焊垫部23数量以四个为例,每一焊垫部23的焊垫231以三个为例,但并不以此为限。Referring to FIG. 6 , four pads 23 , a thermistor 24 and an infrared thermal sensing layer 211 are formed on the bottom of each chip 2 . The thermistor 24 is formed by a thin film process, and two of the four pads 23 are electrically connected to the thermistor 24 , and the other two pads 23 are electrically connected to the infrared thermal sensing layer 211 . Wherein, each of the four welding pads 23 is formed with at least one welding pad 231 , and the welding pads 23 are formed outside the infrared thermal sensing layer 211 . In addition, the number of pads 23 in this embodiment is four, and the number of pads 231 of each pad 23 is three, but not limited thereto.

其后,将数个焊料3(如图7所示)分别固定于焊垫部23的焊垫231上。其中,该些焊料3可固定于每一焊垫部23中的至少一个焊垫231上,或者,该些焊料3可固定于每一焊垫部23的所有焊垫231上。Thereafter, several solders 3 (as shown in FIG. 7 ) are respectively fixed on the pads 231 of the pad portion 23 . Wherein, the solders 3 can be fixed on at least one solder pad 231 in each pad portion 23 , or, the solders 3 can be fixed on all the solder pads 231 in each pad portion 23 .

请参阅图5,将每一晶片2顶面进行背向蚀刻,使每一晶片2内皆成形一感测薄膜21以及环绕连接于该感测薄膜21周围的一环侧壁22。红外线热感测层211位于感测薄膜21内,并且感测薄膜21的边缘可成形数个开孔212(如图6)。环侧壁22的内缘皆成形为斜面状(如图7和图8)或阶梯状(如图9和图10)。其中,若环侧壁22的内缘成形为阶梯状,则晶片2顶面需进行至少两次背向蚀刻。Referring to FIG. 5 , the top surface of each wafer 2 is reversely etched, so that each wafer 2 is formed with a sensing film 21 and a ring side wall 22 surrounding the sensing film 21 . The infrared heat sensing layer 211 is located in the sensing film 21 , and several openings 212 can be formed on the edge of the sensing film 21 (as shown in FIG. 6 ). The inner edges of the ring side walls 22 are all shaped as inclined surfaces (as shown in FIGS. 7 and 8 ) or stepped (as shown in FIGS. 9 and 10 ). Wherein, if the inner edge of the ring side wall 22 is formed into a stepped shape, the top surface of the wafer 2 needs to be etched at least twice.

请参阅图6和图7,于基板1上涂布一第一黏接件4。使用覆晶黏晶机(图略)且以覆晶封装方式将晶圆与基板1对接。其后,加热焊料3使每一晶片2与基板1焊接在一起。Referring to FIGS. 6 and 7 , a first adhesive 4 is coated on the substrate 1 . A flip-chip die-bonding machine (not shown) is used to connect the wafer to the substrate 1 in a flip-chip packaging manner. Thereafter, the solder 3 is heated to solder each chip 2 and the substrate 1 together.

请参阅图7,使用黏晶机(图略)将数个滤光片5分别插设于每一晶片2的环侧壁22内,其后,于每一晶片2的顶面涂布一第二黏接件6。Please refer to FIG. 7 , use a die bonder (figure omitted) to insert several optical filters 5 respectively in the ring sidewall 22 of each chip 2, and then coat a first layer on the top surface of each chip 2. Two bonding parts 6.

切割晶圆与基板1以成形数个红外线热感测组件。The wafer and the substrate 1 are diced to form several infrared thermal sensing components.

此外,本发明可进一步于感测薄膜21与基板1之间涂布一反射层7。其中,反射层7可涂布于感测薄膜21或基板1上。In addition, the present invention can further coat a reflective layer 7 between the sensing film 21 and the substrate 1 . Wherein, the reflective layer 7 can be coated on the sensing film 21 or the substrate 1 .

请参阅图4并且参酌图5至图10,其为本发明的第二实施例,本实施例为一种微小化的红外线热感测组件的制造方法,其步骤包括:Please refer to FIG. 4 and refer to FIG. 5 to FIG. 10, which is the second embodiment of the present invention. This embodiment is a method of manufacturing a miniaturized infrared thermal sensing component, the steps of which include:

提供一晶圆(图略)以及一基板1,晶圆设有数个晶片2。其中,基板1可为电路板11、陶瓷板或硅晶圆(图略)。A wafer (not shown) and a substrate 1 are provided, and several chips 2 are provided on the wafer. Wherein, the substrate 1 can be a circuit board 11 , a ceramic board or a silicon wafer (not shown).

请参阅图6,于每一晶片2底部成形四个焊垫部23、一热敏电阻24以及一红外线热感测层211。热敏电阻24以薄膜制程成形,且将该四个焊垫部23其中两个电性连接于热敏电阻24,另两个焊垫部23电性连接于红外线热感测层211。其中,该四个焊垫部23各成形至少一焊垫23 1,且焊垫部23成形于红外线热感测层211的外侧。此外,本实施例的焊垫部23数量以四个为例,每一焊垫部23的焊垫231以三个为例,但并不以此为限。Referring to FIG. 6 , four pads 23 , a thermistor 24 and an infrared thermal sensing layer 211 are formed on the bottom of each chip 2 . The thermistor 24 is formed by a thin film process, and two of the four pads 23 are electrically connected to the thermistor 24 , and the other two pads 23 are electrically connected to the infrared thermal sensing layer 211 . Wherein, the four welding pads 23 each form at least one welding pad 231, and the welding pads 23 are formed on the outside of the infrared thermal sensing layer 211. In addition, the number of pads 23 in this embodiment is four, and the number of pads 231 of each pad 23 is three, but not limited thereto.

其后,将数个焊料3(如图7所示)分别固定于焊垫部23的焊垫231上。其中,该些焊料3可固定于每一焊垫部23中的至少一个焊垫231上,或者,该些焊料3可固定于每一焊垫部23的所有焊垫231上。Thereafter, several solders 3 (as shown in FIG. 7 ) are respectively fixed on the pads 231 of the pad portion 23 . Wherein, the solders 3 can be fixed on at least one solder pad 231 in each pad portion 23 , or, the solders 3 can be fixed on all the solder pads 231 in each pad portion 23 .

请参阅图5,并将每一晶片2顶面进行背向蚀刻,使每一晶片2内皆成形一感测薄膜21以及环绕连接于该感测薄膜21周围的一环侧壁22。红外线热感测层211位于感测薄膜21内,并且感测薄膜21的边缘可成形数个开孔212(如图6)。环侧壁22的内缘皆成形为斜面状(如图7和图8)或阶梯状(如图9和图10)。其中,若环侧壁22的内缘成形为阶梯状,则晶片2顶面需进行至少两次背向蚀刻。Referring to FIG. 5 , the top surface of each wafer 2 is reversely etched, so that each wafer 2 is formed with a sensing film 21 and a ring side wall 22 surrounding the sensing film 21 . The infrared heat sensing layer 211 is located in the sensing film 21 , and several openings 212 can be formed on the edge of the sensing film 21 (as shown in FIG. 6 ). The inner edges of the ring side walls 22 are all shaped as inclined surfaces (as shown in FIGS. 7 and 8 ) or stepped (as shown in FIGS. 9 and 10 ). Wherein, if the inner edge of the ring side wall 22 is formed into a stepped shape, the top surface of the wafer 2 needs to be etched at least twice.

请参阅图6和图7,切割该晶圆为数个晶片2,并于基板1上涂布一第一黏接件4。将每一晶片2接合于基板1上。其后,加热焊料3,使每一晶片2与基板1焊接在一起。Referring to FIGS. 6 and 7 , the wafer is cut into several chips 2 , and a first adhesive 4 is coated on the substrate 1 . Each chip 2 is bonded on the substrate 1 . Thereafter, the solder 3 is heated to solder each chip 2 and the substrate 1 together.

请参阅图7,使用黏晶机(图略)且以覆晶封装方式将数个滤光片5分别插设于每一晶片2的环侧壁22内,其后,于每一晶片2的顶面涂布一第二黏接件6。Please refer to FIG. 7 , use a die bonder (figure omitted) and insert several optical filters 5 in the ring sidewall 22 of each chip 2 in a flip-chip packaging manner, and then place them on the ring side wall 22 of each chip 2 A second adhesive member 6 is coated on the top surface.

切割基板1以成形数个红外线热感测组件。The substrate 1 is cut to form several infrared thermal sensing components.

此外,本实施例可进一步于感测薄膜21与基板1之间涂布一反射层7。In addition, in this embodiment, a reflective layer 7 can be further coated between the sensing film 21 and the substrate 1 .

请参阅图5至图8,其为本发明的第三实施例,本实施例为使用上述方法所制造的微小化的红外线热感测组件,其包括:一基板1、一晶片2、数个焊料3、一滤光片5以及一反射层7。该些焊料3连接基板1与晶片2,该滤光片5插设于晶片2内。Please refer to Fig. 5 to Fig. 8, which is the third embodiment of the present invention. This embodiment is a miniaturized infrared heat sensing component manufactured by the above method, which includes: a substrate 1, a chip 2, several Solder 3 , a filter 5 and a reflection layer 7 . The solders 3 connect the substrate 1 and the chip 2 , and the optical filter 5 is inserted in the chip 2 .

请参阅图7,该基板1以电路板11为例,但并不以此为限,基板1亦可为陶瓷板或硅晶圆。该电路板11的顶面形成四个接点111,而电路板11顶面的四个接点111向下延伸形成导通该电路板11顶面与底面的四条线路112。另,接点111与线路112的数量各以四个为例,但并不以此为限。Please refer to FIG. 7 , the substrate 1 is a circuit board 11 as an example, but not limited thereto, the substrate 1 can also be a ceramic board or a silicon wafer. Four contact points 111 are formed on the top surface of the circuit board 11 , and the four contact points 111 on the top surface of the circuit board 11 extend downward to form four lines 112 connecting the top surface and the bottom surface of the circuit board 11 . In addition, the numbers of the contacts 111 and the lines 112 are four as an example, but it is not limited thereto.

请参阅图5和图6,该晶片2具有一感测薄膜21以及环绕连接于感测薄膜21周围的一环侧壁22。感测薄膜21内形成有一红外线热感测层211,环侧壁22的顶面形成一开口221,环侧壁22的内缘为一斜面222,环侧壁22的底部形成四个焊垫部23与一热敏电阻24,该四个焊垫部23各形成至少一焊垫23 1。焊垫部23形成于感测薄膜21的外侧。热敏电阻24形成于两个焊垫部23之间且电性连接于上述两个焊垫部23,而另两个焊垫部23电性连接于红外线热感测层211。此外,感测薄膜21外缘可设有数个开孔212,藉以使感测薄膜21受热时,不易膨胀破裂。另,此处焊垫部23以四个为例,每一焊垫部23的焊垫23 1以三个为例,但并不以此为限。Please refer to FIG. 5 and FIG. 6 , the chip 2 has a sensing film 21 and a ring side wall 22 surrounding the sensing film 21 . An infrared thermal sensing layer 211 is formed in the sensing film 21, an opening 221 is formed on the top surface of the ring side wall 22, an inclined surface 222 is formed on the inner edge of the ring side wall 22, and four pads are formed on the bottom of the ring side wall 22 23 and a thermistor 24, each of the four pads 23 forms at least one pad 231. The pad portion 23 is formed outside the sensing film 21 . The thermistor 24 is formed between the two pads 23 and is electrically connected to the two pads 23 , while the other two pads 23 are electrically connected to the infrared thermal sensing layer 211 . In addition, several openings 212 may be provided on the outer edge of the sensing film 21 , so that the sensing film 21 is not easy to expand and crack when heated. In addition, here four welding pads 23 are taken as an example, and three welding pads 231 of each welding pad 23 are taken as an example, but it is not limited thereto.

请参阅图6和图7,焊料3分别设置于接点111与焊垫231之间。其中,焊料3可为锡球。该滤光片5通过该开口221设置于该斜面222上。Please refer to FIG. 6 and FIG. 7 , the solder 3 is disposed between the contacts 111 and the pads 231 respectively. Wherein, the solder 3 can be a solder ball. The filter 5 is disposed on the slope 222 through the opening 221 .

该反射层7可涂设于感测薄膜21的底面(如图7所示),或者反射层7可涂设于电路板11的顶面(如图8所示)。The reflective layer 7 can be coated on the bottom surface of the sensing film 21 (as shown in FIG. 7 ), or the reflective layer 7 can be coated on the top surface of the circuit board 11 (as shown in FIG. 8 ).

此外,本发明可具有一第一黏接件4与一第二黏接件6。第一黏接件4设置于该电路板11顶面以及环侧壁22的底面之间,藉以胶合电路板11与晶片2,进而防止湿气影响组件特性。第二黏接件6设置于环侧壁22的顶面且抵触该滤光片5,藉以黏接晶片2与滤光片5。其中,第一黏接件4与第二黏接件6可为硅胶。In addition, the present invention may have a first adhesive part 4 and a second adhesive part 6 . The first adhesive member 4 is disposed between the top surface of the circuit board 11 and the bottom surface of the ring side wall 22 , so as to glue the circuit board 11 and the chip 2 to prevent moisture from affecting the characteristics of the components. The second adhesive member 6 is disposed on the top surface of the ring sidewall 22 and contacts the filter 5 , so as to bond the chip 2 and the filter 5 . Wherein, the first adhesive part 4 and the second adhesive part 6 can be silica gel.

请参阅图9至图10,其为本发明的第四实施例,本实施例相较于第三实施例主要的不同在于,环侧壁22的内缘为阶梯状且形成至少一阶梯面223。滤光片5通过开口221设置于阶梯面223上。Please refer to FIG. 9 to FIG. 10 , which is the fourth embodiment of the present invention. Compared with the third embodiment, the main difference of this embodiment is that the inner edge of the ring side wall 22 is stepped and forms at least one stepped surface 223 . The filter 5 is disposed on the stepped surface 223 through the opening 221 .

再者,该反射层7可涂设于感测薄膜21的底面(如图9所示),或者反射层7可涂设于电路板11的顶面(如图10所示)。Furthermore, the reflective layer 7 can be coated on the bottom surface of the sensing film 21 (as shown in FIG. 9 ), or the reflective layer 7 can be coated on the top surface of the circuit board 11 (as shown in FIG. 10 ).

〔本发明的特点〕[Features of the present invention]

(1)可批量生产降低生产成本:本发明的制造方法可进行大规模的量产制造,而不须以单个进行生产,因此,可大幅地降低生产成本。(1) Mass production is possible to reduce production cost: the manufacturing method of the present invention can be mass-produced on a large scale without the need for individual production, therefore, the production cost can be greatly reduced.

(2)良率提升:感测薄膜21外缘设有数个开孔212,藉以令感测薄膜21受热时,不易膨胀破裂,进而提升生产良率。(2) Improvement of yield rate: several openings 212 are provided on the outer edge of the sensing film 21 to prevent the sensing film 21 from expanding and cracking when heated, thereby improving the production yield.

(3)避免红外线的重叠干扰现象:本发明将滤光片5设置于环侧壁22的内缘,使得滤光片5与感测薄膜21之间的距离大幅的缩短,进而可有效地避免红外线的重叠干扰现象。(3) Avoid overlapping interference of infrared rays: the present invention arranges the optical filter 5 on the inner edge of the ring side wall 22, so that the distance between the optical filter 5 and the sensing film 21 is greatly shortened, thereby effectively avoiding Infrared overlapping interference phenomenon.

(4)大幅缩小尺寸:本发明将滤光片5的一部份设置于环侧壁22内缘所包覆的空间,使得红外线热感测组件的高度大幅降低,进而缩小尺寸。并且,以电路板11取代习知的基座和接脚,令尺寸更进一步的缩小。(4) Significantly reduced size: In the present invention, a part of the optical filter 5 is arranged in the space covered by the inner edge of the ring side wall 22, so that the height of the infrared thermal sensing component is greatly reduced, thereby reducing the size. Moreover, the conventional base and pins are replaced by the circuit board 11 to further reduce the size.

(5)降低原料耗费成本:本发明不须使用盖体,以电路板11取代习知的基座和接脚,以焊料3替代习知的打线,并且将热敏电阻24直接形成于环侧壁22底部,因此,每个红外线热感测组件所需耗费的原料成本将显著地下降。(5) Reduce the cost of raw materials: the present invention does not need to use the cover body, replaces the conventional base and pins with the circuit board 11, replaces the conventional bonding wire with the solder 3, and directly forms the thermistor 24 on the ring The bottom of the side wall 22, therefore, the cost of raw materials required for each infrared heat sensing component will be significantly reduced.

(6)提升感测灵敏度:本发明的反射层7可将已穿透感测薄膜21的红外线,再次反射回感测薄膜21,藉以提高红外线热感测组件的感测灵敏度。(6) Improve sensing sensitivity: the reflective layer 7 of the present invention can reflect the infrared rays that have penetrated the sensing film 21 back to the sensing film 21 again, so as to improve the sensing sensitivity of the infrared thermal sensing component.

(7)应用范围广:本发明的整体大小与一个晶片2的尺寸相当,并且相较于习知的接脚,本发明的电路板11底面即可进行电性连接,故相当于表面安装组件(SMD),因此,本发明的微小化的红外线热感测组件的应用范围更广,如可应用于手机、耳温枪以及传感器等装置,并且使该些装置具有缩小尺寸的空间。(7) Wide range of applications: the overall size of the present invention is equivalent to the size of a chip 2, and compared with conventional pins, the bottom surface of the circuit board 11 of the present invention can be electrically connected, so it is equivalent to a surface mount assembly (SMD), therefore, the miniaturized infrared heat sensing component of the present invention has a wider range of applications, such as mobile phones, ear thermometers, and sensors, and allows these devices to have a reduced size space.

以上所揭露者,仅为本发明较佳实施例而已,自不能以此限定本发明的权利范围,因此依本发明申请范围所做的均等变化或修饰,仍属本发明所涵盖的范围。The above disclosures are only preferred embodiments of the present invention, and cannot limit the scope of rights of the present invention. Therefore, equivalent changes or modifications made according to the application scope of the present invention still fall within the scope of the present invention.

Claims (15)

1.一种微小化的红外线热感测组件的制造方法,其特征在于,步骤包括:1. A method for manufacturing a miniaturized infrared thermal sensing assembly, characterized in that the steps comprise: 提供一晶圆以及一基板,该晶圆设有数个晶片;providing a wafer and a substrate, the wafer having a plurality of chips; 于每一晶片底部成形四个焊垫部、一热敏电阻以及一红外线热感测层,将该四个焊垫部其中两个电性连接于该热敏电阻,另两个焊垫部电性连接于该红外线热感测层;Form four pads, a thermistor and an infrared thermal sensing layer on the bottom of each chip, two of the four pads are electrically connected to the thermistor, and the other two pads are electrically connected to the thermistor. Sexually connected to the infrared thermal sensing layer; 将数个焊料分别固定于该四个焊垫部上;fixing several solders on the four pads respectively; 将每一晶片顶面进行背向蚀刻,使每一晶片内皆成形一感测薄膜以及环绕连接于该感测薄膜周围的一环侧壁;Carrying out back etching on the top surface of each chip, so that a sensing film and a ring side wall surrounding and connecting the sensing film are formed in each chip; 将该晶圆与该基板对接;docking the wafer with the substrate; 加热该些焊料,使每一晶片与该基板焊接在一起;heating the solders to solder each chip to the substrate; 将数个滤光片分别插设于每一晶片的该环侧壁内;以及a plurality of optical filters are respectively inserted in the sidewall of the ring of each chip; and 切割该晶圆与该基板以成形数个红外线热感测组件。The wafer and the substrate are cut to form several infrared thermal sensing components. 2.如权利要求1所述的微小化的红外线热感测组件的制造方法,其特征在于,该四个焊垫部各成形至少一焊垫,该些焊料分别固定于该四个焊垫部的焊垫上,且于该基板上涂布一第一黏接件,而于该些滤光片分别插设于每一晶片的该环侧壁内后,于每一晶片的顶面涂布一第二黏接件。2. The method of manufacturing a miniaturized infrared thermal sensing component as claimed in claim 1, wherein each of the four soldering pads forms at least one soldering pad, and the solders are respectively fixed on the four soldering pads on the pads of the substrate, and coat a first adhesive on the substrate, and after the filters are respectively inserted in the ring sidewalls of each chip, coat a top surface of each chip with a Second adhesive. 3.如权利要求1所述的微小化的红外线热感测组件的制造方法,其特征在于,该些环侧壁的内缘皆成形为斜面状或阶梯状。3 . The method of manufacturing a miniaturized infrared thermal sensing element as claimed in claim 1 , wherein the inner edges of the ring sidewalls are all shaped as slopes or steps. 4 . 4.如权利要求1所述的微小化的红外线热感测组件的制造方法,其特征在于,该感测薄膜成形数个开孔。4. The method of manufacturing a miniaturized infrared thermal sensing component as claimed in claim 1, wherein the sensing film is formed with several openings. 5.如权利要求1所述的微小化的红外线热感测组件的制造方法,其特征在于,进一步于该感测薄膜与该基板之间涂布一反射层。5 . The method of manufacturing a miniaturized infrared thermal sensing element as claimed in claim 1 , further comprising coating a reflective layer between the sensing film and the substrate. 6 . 6.一种微小化的红外线热感测组件的制造方法,其特征在于,步骤包括:6. A method for manufacturing a miniaturized infrared thermal sensing assembly, characterized in that the steps include: 提供一晶圆以及一基板,该晶圆设有数个晶片;providing a wafer and a substrate, the wafer having a plurality of chips; 于每一晶片底部成形四个焊垫部、一热敏电阻与一红外线热感测层,将该四个焊垫部其中两个电性连接于该热敏电阻,另两个焊垫部电性连接于该红外线热感测层;Form four pads, a thermistor and an infrared thermal sensing layer on the bottom of each chip, two of the four pads are electrically connected to the thermistor, and the other two pads are electrically connected to the thermistor. Sexually connected to the infrared thermal sensing layer; 将数个焊料分别固定于该四个焊垫部上;fixing several solders on the four pads respectively; 将每一晶片顶面进行背向蚀刻,使每一晶片内皆成形一感测薄膜以及环绕连接于该感测薄膜周围的一环侧壁;Carrying out back etching on the top surface of each chip, so that a sensing film and a ring side wall surrounding and connecting the sensing film are formed in each chip; 切割该晶圆为数个晶片;dicing the wafer into a plurality of wafers; 将每一晶片接合于该基板上;bonding each die to the substrate; 加热该些焊料,使每一晶片与该基板焊接在一起;heating the solders to solder each chip to the substrate; 将数个滤光片分别插设于每一晶片的该环侧壁内;以及a plurality of optical filters are respectively inserted in the sidewall of the ring of each chip; and 切割该基板以成形数个红外线热感测组件。The substrate is cut to form several infrared thermal sensing components. 7.如权利要求6所述的微小化的红外线热感测组件的制造方法,其特征在于,该四个焊垫部各成形至少一焊垫,该些焊料分别固定于该四个焊垫部的焊垫上,且于该基板上涂布一第一黏接件,而于该些滤光片分别插设于每一晶片的该环侧壁内后,于每一晶片的顶面涂布一第二黏接件。7. The method of manufacturing a miniaturized infrared thermal sensing component as claimed in claim 6, wherein each of the four pads is formed with at least one pad, and the solders are respectively fixed on the four pads on the pads of the substrate, and coat a first adhesive on the substrate, and after the filters are respectively inserted in the ring sidewalls of each chip, coat a top surface of each chip with a Second adhesive. 8.如权利要求6所述的微小化的红外线热感测组件的制造方法,其特征在于,该些环侧壁的内缘皆成形为斜面状或阶梯状。8 . The method for manufacturing a miniaturized infrared thermal sensing element as claimed in claim 6 , wherein the inner edges of the ring sidewalls are all shaped as slopes or steps. 9 . 9.如权利要求6所述的微小化的红外线热感测组件的制造方法,其特征在于,该感测薄膜成形数个开孔。9. The method of manufacturing a miniaturized infrared thermal sensing component as claimed in claim 6, wherein the sensing film is formed with several openings. 10.如权利要求6所述的微小化的红外线热感测组件的制造方法,其特征在于,进一步于该感测薄膜与该基板之间涂布一反射层。10 . The method for manufacturing a miniaturized infrared thermal sensing element as claimed in claim 6 , further comprising coating a reflective layer between the sensing film and the substrate. 11 . 11.一种微小化的红外线热感测组件,其特征在于,包括:11. A miniaturized infrared thermal sensing component, characterized in that it comprises: 一晶片,其具有一感测薄膜以及环绕连接于该感测薄膜周围的一环侧壁,该感测薄膜内形成有一红外线热感测层,该环侧壁顶面形成一开口,该环侧壁底部形成有四个焊垫部以及一热敏电阻;以及A chip, which has a sensing film and a ring side wall surrounding and connected to the sensing film, an infrared thermal sensing layer is formed in the sensing film, an opening is formed on the top surface of the ring side wall, and the ring side four pads and a thermistor are formed on the bottom of the wall; and 一滤光片,其通过该开口设置于该环侧壁内缘;a filter, which is arranged on the inner edge of the ring side wall through the opening; 其中,该四个焊垫部其中两个电性连接于该热敏电阻,另两个焊垫部电性连接于该红外线热感测层。Wherein, two of the four pads are electrically connected to the thermistor, and the other two pads are electrically connected to the infrared thermal sensing layer. 12.如权利要求11所述的微小化的红外线热感测组件,其特征在于,该环侧壁内缘为斜面状或阶梯状。12 . The miniaturized infrared thermal sensing component according to claim 11 , wherein the inner edge of the side wall of the ring is inclined or stepped. 13 . 13.如权利要求11所述的微小化的红外线热感测组件,其特征在于,该感测薄膜外缘设有数个开孔。13. The miniaturized infrared heat sensing component as claimed in claim 11, wherein a plurality of openings are formed on the outer edge of the sensing film. 14.如权利要求11所述的微小化的红外线热感测组件,其特征在于,进一步包括一电路板以及数个焊料,该电路板顶面相对于该感测薄膜底面,该电路板的顶面形成数个接点,该四个焊垫部各形成至少一焊垫,该些焊料分别设置于该些接点与该四个焊垫部的焊垫之间,该电路板顶面的该些接点向下延伸形成导通该电路板顶面与底面的数条线路。14. The miniaturized infrared thermal sensing assembly according to claim 11, further comprising a circuit board and several solders, the top surface of the circuit board is opposite to the bottom surface of the sensing film, and the top surface of the circuit board Several contacts are formed, each of the four pads forms at least one pad, and the solders are respectively arranged between the contacts and the pads of the four pads, and the contacts on the top surface of the circuit board face extending downward to form several lines connecting the top surface and the bottom surface of the circuit board. 15.如权利要求14所述的微小化的红外线热感测组件,其特征在于,在该感测薄膜的底面或该电路板的顶面涂设有一反射层。15. The miniaturized infrared thermal sensing component as claimed in claim 14, wherein a reflective layer is coated on the bottom surface of the sensing film or the top surface of the circuit board.
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