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CN102176453B - Vertical-structure on-chip integrated transformer - Google Patents

Vertical-structure on-chip integrated transformer Download PDF

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CN102176453B
CN102176453B CN 201110064627 CN201110064627A CN102176453B CN 102176453 B CN102176453 B CN 102176453B CN 201110064627 CN201110064627 CN 201110064627 CN 201110064627 A CN201110064627 A CN 201110064627A CN 102176453 B CN102176453 B CN 102176453B
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CN102176453A (en
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刘军
孙玲玲
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Hangzhou Dianzi University
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Abstract

The invention discloses a vertical-structure on-chip integrated transformer. As the structure of a transformer is made vertical to the horizontal direction of the chip, the occupied chip plane area is greatly reduced, the area of an inductance-covered substrate is reduced, the parasitic capacitance between the transformer and substrate is reduced, the resonance frequency of the transformer is improved, and the structure is suitable for a high-frequency circuit.

Description

一种垂直结构片上集成变压器A Vertical Structure On-Chip Integrated Transformer

技术领域 technical field

本发明属微电子技术领域,涉及一种片上的变压器,具体涉及一种集成螺旋结构的变压器。  The invention belongs to the technical field of microelectronics, relates to an on-chip transformer, in particular to a transformer with an integrated spiral structure. the

背景技术 Background technique

随着硅工艺技术的成熟,无线通信实现了革命性的突破,例如个人通信系统,无线局域网络,卫星通信以及全球定位系统方面,进一步导致射频集成电路(RFICs)制造技术和特性分析成为研究的热点。由于互感的存在使片上螺旋变压器的工作效率相对片上集成电感更高,因此,片上螺旋变压器已被广泛应用到射频集成电路以及模拟前端电路的设计过程中。例如射频集成电路中的阻抗变换、阻抗匹配、直流隔离、信号耦合中。在过去的十几年里,对于如何设计高性能螺旋变压器,人们做了大量的实验和理论研究工作,它们具有高品质因素、高谐振频率以及最小的芯片面积。为了有效地改进螺旋变压器的品质因素,学者们提出很多工艺上的或者形状上的优化方案,例如悬空垂直结构,差分驱动模式,应用高阻硅作为衬底,插入格状接地屏蔽(PGS)等。进一步地,芯片占用的面积也是影响芯片性能的重要因素之一,在如何减省芯片占用面积的同时,提高变压器谐振频率,也是设计者应该注意的问题。  With the maturity of silicon process technology, wireless communication has achieved revolutionary breakthroughs, such as personal communication systems, wireless local area networks, satellite communications, and global positioning systems, which further lead to the manufacture technology and characteristic analysis of radio frequency integrated circuits (RFICs). hotspot. Due to the existence of mutual inductance, the working efficiency of the on-chip helical transformer is higher than that of the on-chip integrated inductor. Therefore, the on-chip helical transformer has been widely used in the design process of radio frequency integrated circuits and analog front-end circuits. For example, impedance transformation, impedance matching, DC isolation, and signal coupling in radio frequency integrated circuits. Over the past decade, a lot of experimental and theoretical work has been done on how to design high-performance helical transformers with high quality factor, high resonant frequency, and minimal chip area. In order to effectively improve the quality factor of the spiral transformer, scholars have proposed many process or shape optimization schemes, such as suspended vertical structure, differential drive mode, using high-resistance silicon as a substrate, and inserting a lattice ground shield (PGS), etc. . Furthermore, the area occupied by the chip is also one of the important factors affecting the performance of the chip. How to increase the resonant frequency of the transformer while reducing the area occupied by the chip is also a problem that designers should pay attention to. the

发明内容 Contents of the invention

本发明的目的在于减小芯片平面面积的同时减小电感覆盖衬底的面积,提高变压器的谐振频率,使之适用于高频电路。  The purpose of the present invention is to reduce the plane area of the chip and at the same time reduce the area of the substrate covered by the inductance, increase the resonant frequency of the transformer, and make it suitable for high-frequency circuits. the

   为实现上述目的,本发明采用如下技术方案:  In order to achieve the above object, the present invention adopts the following technical solutions:

一种垂直结构片上集成变压器,包括初级线圈、次级线圈、初级线圈的第一一引线(11)和第一二引线(12),次级线圈的第一三引线(13)和第一四引线(14),初级线圈由第七金属层(1)分别经过第二一通孔(V21)、第二一金属层(21)、第二二通孔(V22)、第二二金属层(22)、第二三通孔(V23)、第二三金属层(23)、第二四通孔(V24)、第二四金属层(24)、第二五通孔(V25)连接到第三一金属层(31)的一端,第三一金属层(31)的另一端分别经过第四一通孔(V41)、第四一金属层(41)、第四二通孔(V42)连接到第五一金属层(51)的一端,第五一金属层(51)另一端经过第五一通孔(V51)连接到第八金属层(6)的一端、第八金属层(6)的另一端经过第五二通孔(V52)连接到第五二金属层(52)的一端,第五二金属层(52)的另一端分别经过第四三通孔(V43)、第四二金属层(42)、第四四通孔(V44)连接到第三二金属层(32)的一端、第三二金属层(32)另一端分别经过第七五通孔(V75)、第七五金属层(75)、第七四通孔(V74)、第七四金属层(74)、第七三通孔(V73)、第七三金属层(73)、第七二通孔(V72)、第七二金属层(72)、第七一通孔(V71)连接到第九金属层(8)的一端所组成;次级线圈通过第一三金属层(13)经过第五三通孔(V53)连接到第一五金属层(15)的一端,第一五金属层(15)的另一端分别经过第二六通孔(V26)、第二六金属层(26)、第二七通孔(V27)、第二七金属层(27)、第二八通孔(V28)连接到第二八金属层(28)、第二八金属层(28)的另一端经过第五四通孔(V54)、第五四金属层(54)、第五五通孔(V55)、第五五金属层(55)、第五六通孔(V56)连接到第一六金属层(16)的一端,第一六金属层(16)的另一端经过第五七通孔(V57)连接到第一四金属层(14) A transformer with a vertical structure integrated on a chip, including a primary coil, a secondary coil, the first one lead (11) and the first two leads (12) of the primary coil, the first three leads (13) and the first four leads of the secondary coil The lead wire (14), the primary coil passes through the seventh metal layer (1) respectively through the second one through hole (V21), the second one metal layer (21), the second two through holes (V22), the second two metal layer ( 22), the second three through holes (V23), the second three metal layers (23), the second four through holes (V24), the second four metal layers (24), the second five through holes (V25) are connected to the first One end of the third metal layer (31) and the other end of the third metal layer (31) are respectively connected through the fourth through hole (V41), the fourth first metal layer (41), and the fourth second through hole (V42) To one end of the fifth first metal layer (51), the other end of the fifth first metal layer (51) is connected to one end of the eighth metal layer (6) through the fifth first through hole (V51), the eighth metal layer (6) The other end of the fifth and second metal layer (52) is connected to one end of the fifth and second metal layer (52) through the fifth and second through holes (V52), and the other end of the fifth and second metal layer (52) respectively passes through the fourth and third through holes (V43), the fourth and second The metal layer (42), the fourth and fourth through holes (V44) are connected to one end of the third and second metal layers (32), and the other end of the third and second metal layers (32) passes through the seventh and fifth through holes (V75), the seventh The fifth metal layer (75), the seventh and fourth vias (V74), the seventh and fourth metal layers (74), the seventh and third vias (V73), the seventh and third metal layers (73), the seventh and second vias (V72 ), the seventh and second metal layers (72), the seventh and first through holes (V71) connected to one end of the ninth metal layer (8); the secondary coil passes through the first and third metal layers (13) and passes through the fifth three-way The hole (V53) is connected to one end of the first fifth metal layer (15), and the other end of the first fifth metal layer (15) passes through the second sixth via hole (V26), the second sixth metal layer (26), the second The seven through holes (V27), the second and seventh metal layers (27), the second and eighth through holes (V28) are connected to the second and eighth metal layers (28), and the other end of the second and eighth metal layers (28) passes through the fifth and fourth Vias (V54), fifth and fourth metal layers (54), fifth and fifth through holes (V55), fifth and fifth metal layers (55), fifth and sixth through holes (V56) are connected to the first and sixth metal layers (16 ), the other end of the first sixth metal layer (16) is connected to the first fourth metal layer (14) through the fifth and seventh via holes (V57)

的一端所成; formed by one end;

    所述第一一引线(11)与第七金属层(1)相连,第一二引线(12)与第九金属层(8)相连,第一三引线(13)经过第五三通孔(V53)与第一五金属层(15)的一端相连,第一四引线(14)经过第五七通孔(V57)与第一六金属层(16)的一端相连; The first and first leads (11) are connected to the seventh metal layer (1), the first and second leads (12) are connected to the ninth metal layer (8), and the first and third leads (13) pass through the fifth and third through holes ( V53) is connected to one end of the first fifth metal layer (15), and the first fourth lead (14) is connected to one end of the first sixth metal layer (16) through the fifth and seventh through holes (V57);

所述第七金属层(1)和第九金属层(8)同属于第一金属层且相互绝缘,第一五金属层(15)、第一六金属层(16)、第二一金属层(21)和第七二金属层(72)同属于第二金属层且相互绝缘,第二二金属层(22)、第二六金属层(26)、第五五金属层(55)、第八金属层(6)和第七三金属层(73)同属于第三金属层且相互绝缘,第二三金属层(23)、第二七金属层(27)、第五一金属层(51)、第五二金属层(52)、第五四金属层(54)和第七四金属层(74)同属于第四金属层且相互绝缘,第二四金属层(24)、第二八金属层(28)和第七五金属层(75)同属于第五金属层且相互绝缘,第三一金属层(31)和第三二金属层(32)同属于第六金属层且相互绝缘; The seventh metal layer (1) and the ninth metal layer (8) belong to the first metal layer and are insulated from each other, the fifth metal layer (15), the sixth metal layer (16), the second metal layer (21) and the seventh and second metal layers (72) belong to the second metal layer and are insulated from each other, the second and second metal layers (22), the second and sixth metal layers (26), the fifth and fifth metal layers (55), the The eighth metal layer (6) and the seventh and third metal layers (73) belong to the third metal layer and are insulated from each other, the second and third metal layers (23), the second and seventh metal layers (27), the fifth and first metal layers (51 ), the fifth and second metal layers (52), the fifth and fourth metal layers (54) and the seventh and fourth metal layers (74) belong to the fourth metal layer and are insulated from each other, the second and fourth metal layers (24), the second and eighth The metal layer (28) and the seventh and fifth metal layers (75) belong to the fifth metal layer and are insulated from each other, and the third and first metal layers (31) and the third and second metal layers (32) belong to the sixth metal layer and are insulated from each other ;

所述第五一金属层(51)与第五二金属层(52),第四一金属层(41)与第四二金属层(42),第三一金属层(31)与第三二金属层(32)成中心对称; The fifth first metal layer (51) and the fifth second metal layer (52), the fourth first metal layer (41) and the fourth second metal layer (42), the third first metal layer (31) and the third second metal layer The metal layer (32) is centrosymmetric;

所述的第一金属层的中轴线、第二金属层的中轴线、第三金属层的中轴线、第四金属层的中轴线、第五金属层的中轴线、第六金属层的中轴线位于同一平面内,且该平面垂直于芯片上下表面; The central axis of the first metal layer, the central axis of the second metal layer, the central axis of the third metal layer, the central axis of the fourth metal layer, the central axis of the fifth metal layer, and the central axis of the sixth metal layer Located in the same plane, and the plane is perpendicular to the upper and lower surfaces of the chip;

所述初级线圈和次级线圈相互绝缘。 The primary coil and the secondary coil are insulated from each other.

作为可选方案,所述第一、第二、第三、第四、第五、第六金属层由标准COMS工艺中从上而下的6层金属层构成。  As an optional solution, the first, second, third, fourth, fifth and sixth metal layers are composed of 6 metal layers from top to bottom in a standard CMOS process. the

作为可选方案,所述第一金属层其厚度为4um、第二金属层其厚度为3um、第三金属层其厚度为0.5um、第四金属层其厚度为0.25um、第五金属层其厚度为0.25um、第六金属层其厚度为0.25um;所述第一金属层与第二金属层之间的通孔厚度为1.5 um、第二金属层与第三金属层之间的通孔其厚度为2.1um、第三金属层与第四金属层之间的通孔厚度为0.5 um、第四金属层与第五金属层之间的通孔厚度为0.245 um、第五金属层和第六金属层之间的通孔厚度为0.245 um。  As an optional solution, the first metal layer has a thickness of 4um, the second metal layer has a thickness of 3um, the third metal layer has a thickness of 0.5um, the fourth metal layer has a thickness of 0.25um, and the fifth metal layer has a thickness of 0.5um. The thickness is 0.25um, the thickness of the sixth metal layer is 0.25um; the thickness of the via hole between the first metal layer and the second metal layer is 1.5um, the via hole between the second metal layer and the third metal layer Its thickness is 2.1um, the thickness of the via hole between the third metal layer and the fourth metal layer is 0.5um, the thickness of the via hole between the fourth metal layer and the fifth metal layer is 0.245um, the fifth metal layer and the fifth metal layer The via thickness between the six metal layers is 0.245 um. the

本发明的有益效果在于一方面将变压器的结构制作成垂直于芯片水平方向,其最明显的优势就是大大减小了所占用的芯片平面面积,另一方面,该结构减小了电感覆盖衬底的面积,由此一来,变压器与衬底间的寄生电容便减小了,这样有利于提高变压器的谐振频率,因此,该种结构适用于高频电路。  The beneficial effect of the present invention is that on the one hand, the structure of the transformer is made perpendicular to the horizontal direction of the chip, and its most obvious advantage is that the plane area of the chip occupied is greatly reduced; As a result, the parasitic capacitance between the transformer and the substrate is reduced, which is conducive to improving the resonant frequency of the transformer. Therefore, this structure is suitable for high-frequency circuits. the

附图说明 Description of drawings

图1为集成变压器的正向立体图;  Figure 1 is a forward perspective view of the integrated transformer;

图2为集成变压器的左视图; Figure 2 is a left view of the integrated transformer;

图3为集成变压器的前视图; Figure 3 is the front view of the integrated transformer;

图4为本发明实施例的L-f关系仿真图; Fig. 4 is the L-f relationship simulation figure of the embodiment of the present invention;

图5为本发明实施例的Q-f关系仿真图。 Fig. 5 is a simulation diagram of the Q-f relationship of the embodiment of the present invention.

具体实施方式 Detailed ways

以下结合附图和具体实施例对本发明作进一步描述。  The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments. the

本结构共采用IBM标准工艺的六层金属,由上而下依次为第一金属层其厚度为4um,第二金属层其厚度为3um,第三金属层其厚度为0.5um,第四金属层其厚度为0.25um,第五金属层其厚度为0.25um,第六金属层其厚度为0.25um,平行的各层金属之间以通孔连接,第一金属层与第二金属层之间的通孔厚度为1.5 um,第二金属层与第三金属层之间的通孔其厚度为2.1um,第三金属层与第四金属层之间的通孔厚度为0.5 um,第四金属层与第五金属层之间的通孔厚度为0.245 um,第五金属层和第六金属层之间的通孔厚度为0.245 um。  This structure uses a total of six metal layers of IBM standard technology. From top to bottom, the first metal layer has a thickness of 4um, the second metal layer has a thickness of 3um, the third metal layer has a thickness of 0.5um, and the fourth metal layer Its thickness is 0.25um, the thickness of the fifth metal layer is 0.25um, and the thickness of the sixth metal layer is 0.25um. The parallel layers of metal are connected by through holes, and the connection between the first metal layer and the second metal layer The thickness of the through hole is 1.5 um, the thickness of the through hole between the second metal layer and the third metal layer is 2.1 um, the thickness of the through hole between the third metal layer and the fourth metal layer is 0.5 um, the fourth metal layer The thickness of the through hole between the fifth metal layer and the fifth metal layer is 0.245 um, and the thickness of the through hole between the fifth metal layer and the sixth metal layer is 0.245 um. the

如图1所示,变压器的结构细节为:首先描述初级线圈,引线11、引线12为第一金属层上变压器初级线圈的两个端口,金属层1、金属层8为同层金属上的互连线;线2为垂直于芯片方向上的连线,其具体构成由上而下依次为通孔V21、金属层21、通孔V22、金属层22、通孔V23、金属层23、通孔V24、金属层 24以及通孔V25;金属层31为第六金属层上的互连线,从左向右看,其走向为先沿-x轴方向构建一段长度,继而沿y轴方向延伸一段距离。如图2所示,金属层41为第五金属层上的互连线;金属层51为第四金属层上的互连线,从左向右看,其走向为先沿-x轴方向构建一段长度,继而沿-y轴方向延伸一段距离,该延伸距离与金属层31在y轴方向上延伸的长度相等。金属层6为第三金属层上互连线;金属层52与金属层51、金属层42与金属层41、金属层32与金属层31成中心对称,这里不作赘述,线7与线2结构相同且成中心对称,也为垂直于芯片方向上的连线。  As shown in Figure 1, the structural details of the transformer are as follows: Firstly, the primary coil is described, the lead wires 11 and 12 are the two ports of the primary coil of the transformer on the first metal layer, and the metal layer 1 and metal layer 8 are interconnections on the same layer of metal. Connection line; line 2 is a connection line perpendicular to the direction of the chip, and its specific composition from top to bottom is through hole V21, metal layer 21, through hole V22, metal layer 22, through hole V23, metal layer 23, through hole V24, metal layer 24, and through hole V25; metal layer 31 is the interconnection line on the sixth metal layer. Viewed from left to right, its direction is to first build a length along the -x axis direction, and then extend along the y axis direction for a section distance. As shown in Figure 2, the metal layer 41 is the interconnection line on the fifth metal layer; the metal layer 51 is the interconnection line on the fourth metal layer, and its direction is first constructed along the -x axis direction when viewed from left to right A length, and then extend a distance along the -y-axis direction, the extension distance is equal to the length of the metal layer 31 extending in the y-axis direction. Metal layer 6 is the interconnection line on the third metal layer; metal layer 52 and metal layer 51, metal layer 42 and metal layer 41, metal layer 32 and metal layer 31 are center-symmetrical, and will not be described here. The structure of line 7 and line 2 They are the same and symmetrical to the center, and are also lines perpendicular to the direction of the chip. the

初级线圈的电流流向为:引线11,金属层1,线2,金属层31,通孔V41,金属层41,通孔V42,金属层51,通孔V51,金属层6,通孔V52,金属层52,通孔V43,金属层42,通孔V44,金属层32,线7,金属层8,引线12。  The current flow direction of the primary coil is: lead wire 11, metal layer 1, wire 2, metal layer 31, via V41, metal layer 41, via V42, metal layer 51, via V51, metal layer 6, via V52, metal Layer 52, via V43, metal layer 42, via V44, metal layer 32, line 7, metal layer 8, lead 12. the

次级线圈的结构为引线13、引线14为第一金属层上变压器次级线圈的两个端口,金属层15、金属层16为第二金属层上的互连线;线21为垂直于芯片方向上的连线,其具体构成由上而下依次为通孔V26、金属层26、通孔V27、金属层27,通孔V28;金属层28为第五金属层上的互连线;线71与线21的结构相同,也为垂直于芯片方向上的连线,这里不作赘述。  The structure of the secondary coil is that the lead wire 13 and the lead wire 14 are two ports of the secondary coil of the transformer on the first metal layer, and the metal layer 15 and the metal layer 16 are the interconnection lines on the second metal layer; the line 21 is perpendicular to the chip The connection line in the direction, its specific composition from top to bottom is through hole V26, metal layer 26, through hole V27, metal layer 27, through hole V28; metal layer 28 is the interconnection line on the fifth metal layer; line 71 has the same structure as the line 21, and is also a connection line perpendicular to the direction of the chip, which will not be repeated here. the

次级线圈的电流流向为:引线13,通孔V53,金属层15,线21,金属层28,线71,金属层16,通孔V57,引线14。  The current flow direction of the secondary coil is: lead wire 13 , through hole V53 , metal layer 15 , wire 21 , metal layer 28 , wire 71 , metal layer 16 , through hole V57 , lead wire 14 . the

实施例一:  Embodiment one:

此电变压器初级线圈外径OD_pri=140um,次级线圈外径线OD_sec=60um,线宽W=8um,各通孔沿x方向的长度也为8um,四个端口的长度为20um。如图4所示,圆点曲线L11表示初级线圈的自感值,三角曲线L22表示次级线圈的自感值,初级线圈与次级线圈的变压比约为1.5。与此同时,该结构的自谐振频率较高, 60GHz时仍未谐振,该特性说明它适用与高频电路。图5为本实施例的Q-f关系仿真图,同样的圆点曲线Q11表示初级线圈的品质因数Q值,三角点曲线Q22表示次级线圈的品质因数Q值。从图中可以看出初级线圈品质因数最大值peak Q约为6,次级线圈品质因数最大值peak Q约为12。当电流通过变压器线圈时,交变电流产生的周期磁场仅在导线的周围区域产生磁场,进而在衬底中产生的感应电流会相应很小,因此该变压器具有较高的Q值。达到peak Q时的频率较高,这个性质也说明它适用于较高频率的电路。 The outer diameter of the primary coil of this transformer is OD_pri=140um, the outer diameter of the secondary coil is OD_sec=60um, the line width W=8um, the length of each through hole along the x direction is also 8um, and the length of the four ports is 20um. As shown in FIG. 4 , the dot curve L11 represents the self-inductance value of the primary coil, and the triangular curve L22 represents the self-inductance value of the secondary coil. The transformation ratio of the primary coil and the secondary coil is about 1.5. At the same time, the self-resonant frequency of the structure is relatively high, and there is no resonance at 60GHz, which shows that it is suitable for high-frequency circuits. FIG. 5 is a simulation diagram of the Q-f relationship of this embodiment. The same dot curve Q11 represents the quality factor Q value of the primary coil, and the triangle point curve Q22 represents the quality factor Q value of the secondary coil. It can be seen from the figure that the maximum value peak Q of the quality factor of the primary coil is about 6, and the maximum value peak Q of the quality factor of the secondary coil is about 12. When the current passes through the transformer coil, the periodic magnetic field generated by the alternating current only generates a magnetic field in the surrounding area of the wire, and the induced current generated in the substrate will be correspondingly small, so the transformer has a high Q value. The frequency when peak Q is reached is higher, and this property also shows that it is suitable for higher frequency circuits.

以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员,在不脱离本发明构思的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围内。  The above is only a preferred embodiment of the present invention, it should be pointed out that for those of ordinary skill in the art, without departing from the concept of the present invention, some improvements and modifications can also be made, and these improvements and modifications should also be considered Within the protection scope of the present invention. the

Claims (3)

1. vertical-structure on-chip integrated transformer, comprise primary coil, secondary coil, the one one lead-in wire (11) of primary coil and the one or two lead-in wire (12), the one or three lead-in wire (13) of secondary coil and the one or four lead-in wire (14), it is characterized in that, primary coil by the 7th metal level (1) respectively through the 21 through hole (V21), the 21 metal level (21), the two or two through hole (V22), the two or two metal level (22), the two or three through hole (V23), the two or three metal level (23), the second four-way hole (V24), the two or four metal level (24), the second five-way hole (V25) is connected to an end of the 31 metal level (31), the other end of the 31 metal level (31) is respectively through the 41 through hole (V41), the 41 metal level (41), the four or two through hole (V42) is connected to an end of metal level on May Day (51), metal level on May Day (51) other end is connected to an end of the 8th metal level (6) through through hole on May Day (V51), the other end of the 8th metal level (6) is connected to an end of the five or two metal level (52) through the five or two through hole (V52), the other end of the five or two metal level (52) is respectively through the four or three through hole (V43), the four or two metal level (42), the 4th four-way hole (V44) is connected to an end of the three or two metal level (32), the three or two metal level (32) other end is respectively through the Seventh Five-Year Plan through hole (V75), the Seventh Five-Year Plan metal level (75), the 7th four-way hole (V74), the seven or four metal level (74), the seven or three through hole (V73), the seven or three metal level (73), the seven or two through hole (V72), the seven or two metal level (72), the end that the through hole July 1st (V71) is connected to the 9th metal level (8) forms; Secondary coil is connected to an end of the one or five metal level (15) through the five or three through hole (V53) by the one or three metal level (13), the other end of the one or five metal level (15) is respectively through the two or six through hole (V26), the two or six metal level (26), the two or seven through hole (V27), the two or seven metal level (27), the two or eight through hole (V28) is connected to the two or eight metal level (28), the other end of the two or eight metal level (28) is through the May 4th through hole (V54), the May 4th metal level (54), the 5th five-way hole (V55), the five or five metal level (55), the five or six through hole (V56) is connected to an end of the one or six metal level (16), and the other end of the one or six metal level (16) is connected to the one or four metal level (14) through the five or seven through hole (V57)
An end become;
Described the one one lead-in wire (11) links to each other with the 7th metal level (1), the one or two lead-in wire (12) links to each other with the 9th metal level (8), the one or three lead-in wire (13) links to each other with an end of the one or five metal level (15) through the five or three through hole (V53), and the one or four lead-in wire (14) links to each other with an end of the one or six metal level (16) through the five or seven through hole (V57);
Described the 7th metal level (1) and the 9th metal level (8) belong to the first metal layer and mutually insulated, the one or five metal level (15), the one or six metal level (16), the 21 metal level (21) and the seven or two metal level (72) belong to the second metal level and mutually insulated, the two or two metal level (22), the two or six metal level (26), the five or five metal level (55), the 8th metal level (6) and the seven or three metal level (73) belong to the 3rd metal level and mutually insulated, the two or three metal level (23), the two or seven metal level (27), metal level on May Day (51), the five or two metal level (52), the May 4th metal level (54) and the seven or four metal level (74) belong to the 4th metal level and mutually insulated, the two or four metal level (24), the two or eight metal level (28) and the Seventh Five-Year Plan metal level (75) belong to the 5th metal level and mutually insulated, and the 31 metal level (31) and the three or two metal level (32) belong to the 6th metal level and mutually insulated;
Described metal level on May Day (51) and the five or two metal level (52), the 41 metal level (41) and the four or two metal level (42), the 31 metal level (31) becomes Central Symmetry with the three or two metal level (32);
The axis of the axis of the axis of the axis of the axis of the axis of described the first metal layer, the second metal level, the 3rd metal level, the 4th metal level, the 5th metal level, the 6th metal level is positioned at same plane, and this plane is perpendicular to the chip upper and lower surface;
Described primary coil and secondary coil mutually insulated.
2. a kind of vertical-structure on-chip integrated transformer according to claim 1 is characterized in that, described the first, second, third, fourth, the 5th, the 6th metal level is made of from top to down 6 layers of metal level in the standard CMOS process.
3. a kind of vertical-structure on-chip integrated transformer according to claim 1, it is characterized in that, its thickness of described the first metal layer is that 4um, its thickness of the second metal level are that 3um, its thickness of the 3rd metal level are that 0.5um, its thickness of the 4th metal level are that 0.25um, its thickness of the 5th metal level are that 0.25um, its thickness of the 6th metal level are 0.25um; Through hole thickness between described the first metal layer and the second metal level is that its thickness of through hole between 1.5 um, the second metal level and the 3rd metal level is that through hole thickness between 2.1um, the 3rd metal level and the 4th metal level is that through hole thickness between 0.5 um, the 4th metal level and the 5th metal level is that through hole thickness between 0.245 um, the 5th metal level and the 6th metal level is 0.245 um.
CN 201110064627 2011-03-17 2011-03-17 Vertical-structure on-chip integrated transformer Expired - Fee Related CN102176453B (en)

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CN103760395A (en) * 2014-01-02 2014-04-30 国家电网公司 Multiple-output electronic voltage transformer for GIS
US10236115B2 (en) 2014-06-16 2019-03-19 Stmicroelectronics S.R.L. Integrated transformer
CN108039344B (en) * 2017-11-29 2018-12-28 温州大学 A kind of restructural on piece integrated transformer and its adjusting method
CN108447862B (en) * 2018-02-27 2020-01-14 温州大学 Reconfigurable on-chip integrated transformer and method for adjusting inductance value of signal line thereof
CN109686549B (en) * 2019-01-11 2020-12-29 杭州矽磁微电子有限公司 Integrated transformer with multiple winding coils manufactured through micro-nano processing

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6486765B1 (en) * 1999-09-17 2002-11-26 Oki Electric Industry Co, Ltd. Transformer
CN1522450A (en) * 2001-06-29 2004-08-18 �ʼҷ����ֵ������޹�˾ Multiple Interleaved Integrated Circuit Transformers
CN101142638A (en) * 2005-08-04 2008-03-12 加利福尼亚大学董事 Interleaved 3D On-Chip Differential Inductor and Transformer
US7821372B2 (en) * 2008-12-31 2010-10-26 Taiwan Semiconductor Manufacturing Co., Ltd. On-chip transformer BALUN structures

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6486765B1 (en) * 1999-09-17 2002-11-26 Oki Electric Industry Co, Ltd. Transformer
CN1522450A (en) * 2001-06-29 2004-08-18 �ʼҷ����ֵ������޹�˾ Multiple Interleaved Integrated Circuit Transformers
CN101142638A (en) * 2005-08-04 2008-03-12 加利福尼亚大学董事 Interleaved 3D On-Chip Differential Inductor and Transformer
US7821372B2 (en) * 2008-12-31 2010-10-26 Taiwan Semiconductor Manufacturing Co., Ltd. On-chip transformer BALUN structures

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