CN101996613B - Electronic device output test method, system and platform - Google Patents

Abstract

The present invention relates to an electronic device output test method, system and platform. The electronic device output test method comprises: causing a device under test to transmit a first signal to a test platform through a test channel. The test platform analyzes whether a signal received from the test channel corresponds to the first signal. When the received signal corresponds to the first signal, it is determined that the test channel of the device under test is functioning normally. When the received signal does not correspond to the first signal, it is determined that the test channel of the device under test is functioning abnormally.

Description

Electronic device output test method, system and platform

technical field

The invention relates to an electronic device output testing method and its application, in particular to an audio-visual output testing method and its application.

Background technique

Video Graphics Array (VGA) is currently the most widely used display interface specification on the market. In the past, traditional screens only received analog signals, so the display card of the computer had to convert digital signals into analog signals before they could be displayed on the screen. However, during the conversion process, the signal will be depleted, thus distorting the displayed image.

Therefore, the digital visual interface (Digital Visual Interface, DVI) specification appeared on the market, which enables the signal to be transmitted to the screen in a completely digital transmission mode. Due to the one less conversion process, the display quality has naturally been greatly improved. However, due to the insufficient bandwidth of DVI, the display effect of a large-size screen using a DVI interface is greatly limited.

Therefore, a high-resolution multimedia interface (High Definition Multimedia Interface, HDMI) with high transmission bandwidth (up to 5Gbps) has been introduced on the market. Among them, HDMI can not only transmit video signals, but also further integrate the transmission of audio signals. Therefore, various audio-visual devices, such as set-top boxes, DVD players, digital TVs, monitors, projectors, etc., all support HDMI one after another.

With the constant innovation of the above-mentioned displays, in order to seize consumers with different needs, various manufacturers have produced audio-visual devices that support multiple display interfaces. However, in the past, when testing an audio-visual device, it was necessary to connect the audio-visual device to a display device that supports multiple display interfaces. Then, the test images are transmitted to the display device through each display interface one by one, and whether the images presented by the display device are checked by human eyes is correct, so as to test each display interface. When the number of audio-visual devices to be tested is huge, the above-mentioned testing process is not only time-consuming but also requires a lot of manpower.

Contents of the invention

Therefore, an object of the present invention is to provide a method, system and platform for testing the output of an electronic device, so that the device under test transmits a test signal to the channel under test, and the test platform analyzes whether the signal received from the channel under test is Corresponding to the test signal, to determine whether the tested channel of the device under test is functioning normally.

According to an embodiment of the present invention, a method for testing output of an electronic device includes: enabling a device under test to transmit a first signal to a test platform through a channel under test. enabling the test platform to analyze whether a signal received from the channel under test corresponds to the first signal. When the received signal corresponds to the first signal, it is determined that the tested channel of the device under test is functioning normally. When the received signal does not correspond to the first signal, it is determined that the tested channel of the tested device is abnormal.

According to another embodiment of the present invention, an output test system for an electronic device includes a channel under test, a device under test, and a test platform. The device under test includes at least one first transmission interface electrically connected to the channel under test for transmitting a first signal to the channel under test. The test platform includes at least a second transmission interface and a processing module. The second transmission interface is electrically connected to the channel under test for receiving a signal from the channel under test. The processing module is electrically connected to the second transmission interface, and judges whether the function of the first transmission interface of the device under test is normal by comparing whether the first signal and the signal received through the second transmission interface are the same. Wherein, when the first signal and the received signal are the same, it is determined that the function of the first transmission interface of the device under test is normal.

According to yet another embodiment of the present invention, a test platform output by an electronic device includes a plurality of transmission interfaces, a selection module, and a processing module. The transmission interface is electrically connected to a device under test through a plurality of transmission channels respectively. The selection module selects one of the transmission interfaces as a channel under test according to a selection signal. The device under test transmits a first signal to the channel under test. The test platform output by the electronic device receives a signal from the channel under test through the selected transmission interface. The processing module is electrically connected with the transmission interface, and is used for judging whether the tested channel of the device under test is functioning normally by comparing whether the first signal and the received signal are the same. Wherein, when the first signal and the received signal are the same, it is determined that the tested channel of the device under test is functioning normally.

Description of drawings

In order to make the above and other objects, features, advantages and embodiments of the present invention more comprehensible, the embodiments of the present invention are described in conjunction with the accompanying drawings.

FIG. 1 shows a functional block diagram of an electronic device output test system according to an embodiment of the present invention.

FIG. 2 is a flowchart of an output testing method of an electronic device according to another embodiment of the present invention.

Description of reference symbols

100: Device under test 240: Select module

111, 112,..., 11n: transmission interface 300: select transmission interface

130: Select module 311～31n: Transmission channel

200: Test platform 400: Electronic device output test method

210: Processing module 410～490: Steps

231, 232, ..., 23n: transmission interface

Detailed ways

Please refer to FIG. 1 , which shows a functional block diagram of an electronic device output testing system according to an embodiment of the present invention. The device under test of the electronic device output test system transmits the test signal to the channel under test, and the test platform of the electronic device output test system judges the device under test by analyzing whether the signal received from the channel under test corresponds to the test signal. Whether the channel is functioning properly.

The electronic device output test system includes a device under test 100 , a test platform 200 for the output of the electronic device, and a channel 311 under test. The device under test 100 includes a transmission interface 111 , and the test platform 200 includes a transmission interface 231 and a processing module 210 . The transmission interface 111 of the device under test 100 and the transmission interface 231 of the test platform 200 are electrically connected through the channel under test 311 .

Wherein, the device under test 100 may include a plurality of transmission interfaces 111, 112, ..., 11n, and the test platform 200 may also include a plurality of transmission interfaces 231, 232, ..., 23n for electrically connecting the tested The transmission interfaces 111, 112, . . . , 11n of the device 100 form a plurality of transmission channels 311, 312, . . . , 31n. In other words, when using the electronic device output test system of the present invention, the multiple transmission interfaces 111, 112, . , 232, ..., 23n, to be tested. Wherein, the transmission channels 311, 312, . In fact, the transmission channels 311, 312, ..., 31n can be applied to high-definition multimedia interface (High Definition Multimedia Interface, HDMI), digital visual interface (Digital Visual Interface, DVI), S-video (S-video), composite video (Composite video), component video, video graphics array (Video Graphics Array, VGA), stereo (stereo) or other video and audio transmission interfaces.

Next, one of the transmission interfaces 111 , . . . , 11 n is selected by a selection module 130 of the device under test 100 . For example, in this embodiment, the selection module 130 selects the transmission interface 111 , so that the transmission channel 311 connected to the selected transmission interface 111 is regarded as the channel 311 under test. A selection module 240 of the test platform 200 obtains information (or called a selection signal) of the transmission interface 111 selected by the selection module 130 of the device under test 100 through a selection transmission interface 300 . Wherein, the selection transmission interface 300 can use RS-232 or other transmission interfaces to be electrically connected to the selection module 130 of the device under test 100 and the selection module 130 of the test platform 200 respectively. Then, the selection module 240 selects the transmission interface 231 from the transmission interfaces 231, 232, . . . , 23n according to the selection signal. Next, the transmission channel 311 connected to the transmission interface 231 is used as the channel 311 under test. Wherein, the information of the transmission interface 111 may include the audio-visual transmission interface applied by the tested channel 111, so that the selection module 240 selects the transmission interface 231 connected to the transmission interface 111 through the tested channel 311 because the same audio-visual transmission interface is used. . In addition, the information of the transmission interface 111 may include identification information (such as an identification number) of the transmission interface 111 , so that the selection module 240 selects the corresponding transmission interface 231 . However, in other embodiments, the information of the transmission interface 111 may include other information as a basis for the selection module 240 to select the transmission interface 231 , which is not limited to this embodiment. In addition, in other embodiments, the number of transmission interfaces of the device under test may also be different from the number of transmission interfaces of the test platform. In addition, in other embodiments, the selection module 240 of the test platform 200 may also select the transmission interface 231 , and the selection module 130 of the device under test 100 may select the corresponding transmission interface 111 accordingly.

After the transmission interface 111 is selected, the transmission interface 111 of the device under test 100 transmits the first signal to the channel under test 311 connected thereto. Wherein, the transmission interface 111 can convert the first signal according to the transmission interface standard applied by the channel under test 311 for transmission to the channel under test 311 . For example, when the channel under test 311 uses a high-definition multimedia interface, the transmission interface 111 converts the first signal into a format used by the high-definition multimedia interface for transmission to the channel under test 311 . However, in other embodiments, the first signal can be converted into different formats according to the audio-video transmission interface applied by the channel under test 311 , which is not limited to this embodiment. In addition, when the transmission interface 111 has multiple pins, the first signal can be transmitted to the channel under test 311 through each pin one by one by using a specially designed first signal. In this way, each pin of the transmission interface 111 of the device under test 100 can be tested.

The transmission interface 231 of the test platform 200 receives a signal from the channel under test 311 . The processing module 210 of the test platform 200 judges whether the transmission interface 111 of the device under test and the channel under test 311 through which it passes are functioning normally by comparing whether the first signal is the same as the signal received by the transmission interface 231 . Wherein, when the first signal and the received signal are the same, it is determined that the transmission interface 111 and the channel under test 311 of the device under test 100 are functioning normally. In addition, since a video deinterlacer (scalar) chip can process video and audio signals, the processing module 210 can be implemented using a video deinterlacer/scalar chip. However, in other embodiments, the processing module 210 may also use other types of processing components, and is not limited to this embodiment.

Please refer to FIG. 2 , which is a flowchart of an output testing method of an electronic device according to another embodiment of the present invention. In the electronic device output test method, a device under test transmits a test signal to a channel under test, and a test platform judges the channel under test of the device under test by analyzing whether the signal received from the channel under test corresponds to the test signal Is it functioning properly. The electronic device output testing method 400 includes the following steps:

In step 410, a test platform is made to send an initial signal to a device under test. In step 420, after the device under test receives the initial signal, the device under test starts to transmit a first signal to the test platform through a channel under test. Wherein, when the device under test has multiple channels under test electrically connected with the test platform, the test platform can select the channel under test from the channels under test, and make the transmitted initial signal contain the information of the channel under test. In this way, the device under test can transmit the first signal to the test platform through the selected channel under test according to the information of the channel under test in the initial signal (step 420 ). Among them, the channel under test and the channel to be tested can apply high-definition multimedia interface, digital visual interface, S-video, composite video, color difference, video graphic array, stereo or other audio-visual transmission interface. Therefore, when transmitting the first signal (step 420 ), the first signal can be converted into a corresponding format according to the audio-video transmission interface used by the channel under test.

In addition, before step 420, a confirmation request may be sent to the device under test to obtain a confirmation signal from the channel under test of the device under test. Wherein, when the confirmation signal is obtained from the channel under test of the device under test, it is determined that the channel under test of the device under test is in an enabled state, so that the test platform is ready to receive signals from the channel under test of the device under test.

In step 430, it is determined whether the test platform receives a signal from the device under test within a period of time after sending the initial signal. After a period of time after sending the initial signal, if the test platform still does not receive a signal from the device under test, it is determined that the contact between the device under test and the channel under test or between the channel under test and the test platform is abnormal (step 490 ). Next, make the test platform send an initial signal to the device under test (step 410 ), so as to test the next channel under test of the device under test. In this way, after step 490, the contact between the chip pin of the channel under test of the device under test and the circuit board can be detected, or other possible contact between the device under test and the channel under test or between the channel under test and the channel under test can be detected. Factors that expose exceptions between test platforms.

Within a period of time after transmitting the initial signal, if a signal is received from the device under test, the test platform is made to analyze whether the signal received from the channel under test corresponds to the first signal (step 440 ). Wherein, step 440 can be analyzed by comparing whether the first signal and the received signal are the same. When the first signal and the received signal are the same, it is determined that the signal received from the channel under test corresponds to the first signal. When the first signal is different from the received signal, it is determined that the signal received from the channel under test does not correspond to the first signal. However, in other embodiments, other analysis methods may also be used to analyze whether the signal received from the channel under test corresponds to the first signal (step 440 ), which is not limited to this embodiment.

When the signal received from the channel under test corresponds to the first signal, it is determined that the channel under test of the device under test is functioning normally (step 450 ). Next, display and record that the channel under test of the device under test is functioning normally (step 460 ), and make the test platform send an initial signal to the device under test (step 410 ) to test the next channel under test of the device under test.

When the received signal does not correspond to the first signal, it is determined that the channel under test of the device under test is malfunctioning (step 470 ). Next, display and record that the channel under test of the device under test is abnormal (step 480 ), and make the test platform send an initial signal to the device under test (step 410 ) to test the next channel under test of the device under test. In this way, by outputting the testing method 400 from the electronic device, the testing of each channel to be tested of the device under test can be completed one by one.

It can be known from the above embodiments of the present invention that the application of the present invention has the following advantages. Each transmission interface of the device under test can be tested by simply connecting the multiple transmission interfaces of the device under test to the corresponding transmission ports on the test device. In particular, when the device under test is an audio-visual device, the application of the present invention does not need to use different display devices to present test images in response to each transmission interface. Therefore, the purchase cost of display devices corresponding to different transmission interfaces can be reduced. In addition, it is only necessary to connect the audio-visual device to be tested to the test platform, without manpower checking the test image or sound output by the audio-visual device, which further saves manpower required for testing.

Although the present invention has been disclosed as above in terms of implementation, it is not intended to limit the present invention. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the present invention The scope of protection is based on the claims of the present invention.

Claims (16)

1. A method for testing the output of an electronic device, comprising: making a device under test transmit a test signal to a test platform through a channel under test; causing the test platform to analyze whether a signal received from the channel under test corresponds to the test signal; determining that the channel under test of the device under test is functioning properly when the received signal corresponds to the test signal; and When the received signal does not correspond to the test signal, it is determined that the channel under test of the device under test is malfunctioning. 2. The electronic device output testing method as claimed in claim 1, further comprising: causing the test platform to transmit an initial signal to the device under test, thereby causing the device under test to begin transmitting the test signal to the test platform through the channel under test; and After transmitting the initial signal for a period of time, if the test platform still does not receive the signal, it is determined that the contact between the device under test and the channel under test or between the channel under test and the test platform is abnormal. 3. The electronic device output testing method as claimed in claim 1, further comprising: sending a confirmation request to the device under test to obtain a confirmation signal from the channel under test of the device under test, wherein when the confirmation signal is obtained from the channel under test of the device under test, it is determined that the device under test The channel under test is enabled so that the test platform is ready to receive the signal from the channel under test of the device under test. 4. The electronic device output testing method as claimed in claim 1, wherein when the tested device has a plurality of channels to be tested, the electronic device output testing method further comprises: The channel under test is selected from the channels under test. 5. The output testing method of an electronic device as claimed in claim 1, wherein the tested channel is an image transmission channel, an audio transmission channel or an audio-visual transmission channel. 6. An electronic device output test system, comprising: a channel under test; A device under test, comprising: at least one first transmission interface, electrically connected to the channel under test, and transmits a test signal to the channel under test; A test platform, including: at least one second transmission interface, electrically connected to the channel under test, and receiving a signal from the channel under test; and a processing module, electrically connected to the second transmission interface, and judging whether the first transmission interface of the device under test is functioning normally by comparing the test signal with the signal received through the second transmission interface, wherein When the test signal is the same as the received signal, it is determined that the function of the first transmission interface of the device under test is normal. 7. The electronic device output testing system as claimed in claim 6, wherein the first transmission interface has a plurality of pins, and the test signal is transmitted to the channel under test through the pins of the transmission interface one by one. 8. The electronic device output testing system as claimed in claim 6, wherein the channel under test is an image transmission channel, an audio transmission channel or an audio-visual transmission channel. 9 . The electronic device output test system as claimed in claim 6 , wherein the channel under test is an application of high-definition multimedia interface, digital visual interface, S-video, composite video, color difference, video graphics array or stereo. 10. The electronic device output test system as claimed in claim 6, wherein the electronic device output test platform system further comprises a plurality of transmission channels, and when the number of the at least one first transmission interface is multiple, the first transmission interface They are respectively electrically connected to the transmission channels one by one, and the device under test also includes: A selection module selects one of the first transmission interfaces, and uses the transmission channel connected to the selected first transmission interface as the channel under test. 11. The electronic device output test system as claimed in claim 10, further comprising: a selection transmission interface, wherein the test platform obtains the information of the channel under test selected by the selection module through the selection transmission interface, so that the second transmission interface is from the channel under test selected by the selection module, receive the signal. 12. The electronic device output testing system as claimed in claim 11, wherein the optional transmission interface is RS-232. 13. The electronic device output testing system as claimed in claim 6, wherein the processing module of the electronic device testing platform is a video deinterlacing chip. 14. A test platform output by an electronic device, comprising: A plurality of transmission interfaces are respectively electrically connected to a device under test through a plurality of transmission channels; A selection module, according to a selection signal, selects one of the transmission interfaces as a channel under test, wherein the device under test transmits a test signal to the channel under test, and the test platform output by the electronic device passes the selected transmission interface receives a signal from the channel under test; and A processing module, electrically connected to the transmission interface, by comparing the test signal and the received signal to determine whether the tested channel of the device under test is functioning normally, wherein the test signal and the received signal When the signals are the same, it is determined that the tested channel of the tested device is functioning normally. 15. The test platform output by the electronic device as claimed in claim 14, further comprising: A selection transmission interface electrically connected to the device under test, wherein the selection module obtains the selection signal from the device under test through the selection transmission interface. 16. The test platform output by an electronic device as claimed in claim 14, wherein the processing module is a video deinterlacing chip.

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