CN101924142B - 一种GaAs肖特基变容二极管及其制作方法 - Google Patents
一种GaAs肖特基变容二极管及其制作方法 Download PDFInfo
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- CN101924142B CN101924142B CN2009100873473A CN200910087347A CN101924142B CN 101924142 B CN101924142 B CN 101924142B CN 2009100873473 A CN2009100873473 A CN 2009100873473A CN 200910087347 A CN200910087347 A CN 200910087347A CN 101924142 B CN101924142 B CN 101924142B
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- 229910001218 Gallium arsenide Inorganic materials 0.000 title claims abstract description 43
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000002184 metal Substances 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 claims abstract description 13
- 238000001704 evaporation Methods 0.000 claims abstract 4
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 6
- 238000001039 wet etching Methods 0.000 claims description 6
- 238000000151 deposition Methods 0.000 claims description 3
- 238000001312 dry etching Methods 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 1
- 229910052710 silicon Inorganic materials 0.000 claims 1
- 239000010703 silicon Substances 0.000 claims 1
- 230000010354 integration Effects 0.000 abstract 1
- 230000004888 barrier function Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000001413 cellular effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000013517 stratification Methods 0.000 description 1
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CN2009100873473A CN101924142B (zh) | 2009-06-17 | 2009-06-17 | 一种GaAs肖特基变容二极管及其制作方法 |
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CN101924142A CN101924142A (zh) | 2010-12-22 |
CN101924142B true CN101924142B (zh) | 2011-09-14 |
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CN104795453B (zh) * | 2015-04-24 | 2018-06-12 | 中国电子科技集团公司第十三研究所 | 一种多梁式引线砷化镓基肖特基倍频二极管 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1270704A (zh) * | 1997-09-11 | 2000-10-18 | 艾利森电话股份有限公司 | 电器件及其制造方法 |
US6787882B2 (en) * | 2002-10-02 | 2004-09-07 | The United States Of America As Represented By The Secretary Of The Navy | Semiconductor varactor diode with doped heterojunction |
CN101015058A (zh) * | 2004-08-27 | 2007-08-08 | 国际商业机器公司 | 使用隔离阱的mos变容二极管 |
CN101036228A (zh) * | 2004-10-05 | 2007-09-12 | 皇家飞利浦电子股份有限公司 | 半导体器件及其用途 |
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- 2009-06-17 CN CN2009100873473A patent/CN101924142B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1270704A (zh) * | 1997-09-11 | 2000-10-18 | 艾利森电话股份有限公司 | 电器件及其制造方法 |
US6787882B2 (en) * | 2002-10-02 | 2004-09-07 | The United States Of America As Represented By The Secretary Of The Navy | Semiconductor varactor diode with doped heterojunction |
CN101015058A (zh) * | 2004-08-27 | 2007-08-08 | 国际商业机器公司 | 使用隔离阱的mos变容二极管 |
CN101036228A (zh) * | 2004-10-05 | 2007-09-12 | 皇家飞利浦电子股份有限公司 | 半导体器件及其用途 |
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Effective date of registration: 20201218 Address after: 510000 601, building a, 136 Kaiyuan Avenue, Huangpu District, Guangzhou City, Guangdong Province Patentee after: AoXin integrated circuit technology (Guangdong) Co.,Ltd. Address before: 100029 Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee before: Institute of Microelectronics of the Chinese Academy of Sciences |
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