CN101776728B - Boundary scanning method and device of device inside single plate - Google Patents
Boundary scanning method and device of device inside single plate Download PDFInfo
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Abstract
本发明提供了一种单板内器件的边界扫描方法及装置,该方法及装置属于网络通信领域,所述单板包括第一可编程逻辑器件PLD、待检测器件和第一JTAG Jacket;其中所述第一JTAG Jacket和所述待检测器件的JTAG管脚分别连接在所述第一可编程逻辑器件的输入输出管脚Bank上;所述Bank的工作电平为其连接器件的工作电平,所述方法包括:通过所述第一PLD将所述待检测器件与所述第一JTAG Jacket串联;从所述第一JTAG Jacket接收JTAG检测信号,对所述串联的待检测器件进行边界扫描。本发明具有单板内检测器件连接关系简单,检测信号传送距离短,信号质量好,BOM清单少,成链方式灵活的优点。
The present invention provides a method and device for boundary scanning of devices in a single board, the method and device belong to the field of network communication, the single board includes a first programmable logic device PLD, a device to be detected and a first JTAG Jacket; wherein the The JTAG pins of the first JTAG Jacket and the device to be detected are respectively connected to the input and output pins Bank of the first programmable logic device; the working level of the Bank is the working level of the connected device, The method includes: connecting the device to be detected in series with the first JTAG Jacket through the first PLD; receiving a JTAG detection signal from the first JTAG Jacket, and performing boundary scan on the device to be detected in series. The invention has the advantages of simple connection relationship of detection devices in a single board, short transmission distance of detection signals, good signal quality, less BOM list and flexible chaining mode.
Description
技术领域 technical field
本发明涉及通信领域,尤其涉及一种单板内器件的边界扫描方法及装置。The invention relates to the communication field, in particular to a method and device for boundary scanning of devices in a single board.
背景技术 Background technique
目前设计的数字硬件单板密度很高,功能更为强大,板内器件种类繁多。这就给单板的生产维护带来很多困难和不便。为了对单板内的器件进行测试,现有技术提供一种单板内器件通用的检测方法,该方法采用边界扫描技术(Joint Test Action Group,JTAG)对单板内的器件进行检测,JTAG最初是用来对芯片进行测试的,JTAG的基本原理是在器件内部定义一个测试访问口(Test Access Port,TAP)通过专用的JTAG测试工具对进行内部节点进行测试。JTAG测试允许多个器件通过JTAG接口串联在一起,形成一个JTAG链,能实现对各个器件分别测试,所以在JTAG技术中,需要将单板上各器件的JTAG管脚串联,形成扫描链,进而对扫描链上的器件完成边界扫描。The currently designed digital hardware single board has a high density, more powerful functions, and a wide variety of devices on the board. This brings many difficulties and inconveniences to the production and maintenance of the veneer. In order to test the devices in the single board, the prior art provides a common detection method for the devices in the single board. The method uses boundary scan technology (Joint Test Action Group, JTAG) to detect the devices in the single board. JTAG initially It is used to test the chip. The basic principle of JTAG is to define a test access port (Test Access Port, TAP) inside the device to test the internal nodes through a dedicated JTAG test tool. The JTAG test allows multiple devices to be connected in series through the JTAG interface to form a JTAG chain, which can test each device separately. Therefore, in JTAG technology, it is necessary to connect the JTAG pins of each device on the board in series to form a scan chain. Boundary scan is performed on the devices in the scan chain.
在实现本发明的过程中,发明人发现现有技术存在如下问题:In the process of realizing the present invention, the inventor finds that the prior art has the following problems:
现有技术的方案,如果单板内的器件较多,器件的JTAG管脚之间的连接关系将会较复杂。In the solution of the prior art, if there are many devices in the single board, the connection relationship between the JTAG pins of the devices will be complicated.
发明内容 Contents of the invention
为了能够简化JTAG管脚之间的连接关系,本发明的一方面,提供了一种单板内器件的边界扫描方法,所述单板包括第一可编程逻辑器件PLD、待检测器件和第一JTAG Jacket;其中所述第一JTAG Jacket和所述待检测器件的JTAG管脚分别连接在所述第一可编程逻辑器件的输入输出管脚Bank上;所述Bank的工作电平为其连接器件的工作电平,所述方法包括:In order to simplify the connection relationship between JTAG pins, one aspect of the present invention provides a boundary scan method for devices in a single board, the single board includes a first programmable logic device PLD, a device to be detected and a first JTAG Jacket; wherein the JTAG pins of the first JTAG Jacket and the device to be detected are respectively connected to the input and output pins Bank of the first programmable logic device; the working level of the Bank is its connection device The working level, the method includes:
通过所述第一PLD将所述待检测器件与所述第一JTAG Jacket串联;The device to be detected is connected in series with the first JTAG Jacket through the first PLD;
从所述第一JTAG Jacket接收JTAG检测信号,对所述串联的待检测器件进行边界扫描。A JTAG detection signal is received from the first JTAG Jacket, and a boundary scan is performed on the serially connected devices to be detected.
本发明的另一方面,提供了一种单板内器件的边界扫描装置,包括:第一可编程逻辑器件PLD、待检测器件和第一JTAG Jacket;其中所述第一JTAGJacket和所述待检测器件的JTAG管脚分别连接在所述第一可编程逻辑器件的输入输出管脚Bank上;所述Bank的工作电平为其连接器件的工作电平。Another aspect of the present invention provides a boundary scan device for devices in a single board, including: a first programmable logic device PLD, a device to be detected, and a first JTAG Jacket; wherein the first JTAGJacket and the device to be detected The JTAG pins of the device are respectively connected to the input and output pins Bank of the first programmable logic device; the working level of the Bank is the working level of the connected device.
由上述所提供的技术方案可以看出,本发明实施例的技术方案待检测器件的JTAG管脚和JTAG EPLD连接,由于JTAG EPLD的Bank工作电平可以调节为连接在该Bank上的器件的工作电平,因而不需要额外的电平转换电路,可以简化待检测器件的JTAG管脚的连接关系,进而可简化BOM清单;并且该检测信号均通过JTAG EPLD发送,检测信号传送的距离短,信号质量好。As can be seen from the technical scheme provided above, the JTAG pin of the device to be detected in the technical scheme of the embodiment of the present invention is connected to the JTAG EPLD, because the Bank operating level of the JTAG EPLD can be adjusted to be connected to the work of the device on the Bank. Level, so no additional level conversion circuit is needed, which can simplify the connection relationship of the JTAG pins of the device to be detected, and then simplify the BOM list; and the detection signals are sent through the JTAG EPLD, the detection signal transmission distance is short, and the signal Good quality.
附图说明 Description of drawings
图1为本发明一实施例提供的一种单板内器件的边界扫描方法的流程示意图;FIG. 1 is a schematic flowchart of a boundary scan method for a device in a single board provided by an embodiment of the present invention;
图2为本发明另一一实施例提供的一种单板内器件的结构示意图;FIG. 2 is a schematic structural diagram of a device in a single board provided by another embodiment of the present invention;
图3为本发明一实施例提供的一种单板内器件的边界扫描方法的流程示意图;FIG. 3 is a schematic flowchart of a boundary scan method for a device in a single board provided by an embodiment of the present invention;
图4为本发明一实施例提供的一种单板内器件的边界扫描方法中改变待检测器件后的单板内器件的结构示意图;4 is a schematic structural diagram of a device in a board after changing the device to be detected in a boundary scan method for devices in a board according to an embodiment of the present invention;
图5为本发明一实施例提供的一种单板内器件的边界扫描方法中实现Boot加载时的单板内器件的结构示意图;5 is a schematic structural diagram of a device in a board when Boot loading is implemented in a boundary scan method for devices in a board according to an embodiment of the present invention;
具体实施方式 Detailed ways
本发明实施方式提供了一种单板内器件的边界扫描方法,单板包括第一可编程逻辑器件(Programmable Logic Device,PLD),如可擦除可编辑逻辑器件(Erasable Programmable Logic Device,EPLD)、CPLD、现场可编程门阵列(FieldProgrammable Gate Array,FPGA)等,为了描述的方便,下述叙述中第一PLD以JTAG EPLD为例进行说明。Embodiments of the present invention provide a boundary scan method for devices in a single board, where the single board includes a first programmable logic device (Programmable Logic Device, PLD), such as an erasable programmable logic device (Erasable Programmable Logic Device, EPLD) , CPLD, Field Programmable Gate Array (Field Programmable Gate Array, FPGA), etc., for the convenience of description, the first PLD in the following description will be explained by taking JTAG EPLD as an example.
在本实施中,单板包括JTAG EPLD、待检测器件和第一JTAG Jacket;其中该待检测器件的JTAG管脚,以及该第一JTAG Jacket分别连接在该JTAGEPLD的输入输出管脚Bank上;且该Bank的工作电平为连接在该Bank上的器件的工作电平,上述JTAG Jacket在为JTAG插口,可以与JTAG测试设备连接。在如图1所示的流程示意图中,包括如下步骤:In this implementation, the single board includes a JTAG EPLD, a device to be detected and a first JTAG Jacket; wherein the JTAG pins of the device to be detected and the first JTAG Jacket are respectively connected to the input and output pin Bank of the JTAGEPLD; and The working level of the Bank is the working level of the device connected to the Bank, and the above-mentioned JTAG Jacket is a JTAG socket, which can be connected with the JTAG test equipment. In the flow diagram shown in Figure 1, the following steps are included:
S11、通过JTAG EPLD将待检测器件与第一JTAG Jacket串联;S11, the device to be detected is connected in series with the first JTAG Jacket through the JTAG EPLD;
可以从待检测器件选择一个或多个(二个或二个以上)器件,与JTAG Jacket串联形成JTAG扫描链。其中成链的方案可以采用EPLD编程语言实现,如Verilog;在CPU的控制之下,如CPU通过配置JTAG EPLD内的寄存器,就可以形成不同的扫描链。One or more (two or more) devices can be selected from the device to be detected, and connected in series with JTAG Jacket to form a JTAG scan chain. Among them, the chaining scheme can be realized by EPLD programming language, such as Verilog; under the control of the CPU, if the CPU configures the registers in the JTAG EPLD, different scan chains can be formed.
S12、从第一JTAG Jacket接收JTAG检测信号,对该串联的待检测的器件进行边界扫描。S12. Receive a JTAG detection signal from the first JTAG Jacket, and perform boundary scan on the serially connected devices to be detected.
上述Bank可以为JTAG EPLD中的一对管脚,上述待检测的器件可以为单板内需要检测的电子器件,如CPU、FPGA等。The above-mentioned Bank can be a pair of pins in the JTAG EPLD, and the above-mentioned device to be detected can be an electronic device that needs to be detected in the single board, such as CPU, FPGA, etc.
可选的,上述单板还可以包括第二JTAG Jacket,该第二JTAG Jacket与JTAG EPLD的JTAG管脚相连,通过所述第二JTAG Jacket为JTAG EPLD在线加载软件。上述对JTAG EPLD在线加载软件的方法实际为,软件加载器件通过第二JTAG Jacket与JTAG EPLD相连,并完成对JTAG EPLD的在线加载软件。Optionally, the above-mentioned single board can also include a second JTAG Jacket, which is connected to the JTAG pin of the JTAG EPLD, and online loading software for the JTAG EPLD by the second JTAG Jacket. The above-mentioned method of loading software online to JTAG EPLD is actually that the software loading device is connected to JTAG EPLD through the second JTAG Jacket, and the online loading software to JTAG EPLD is completed.
上述软件加载器件可以为CPU或JTAG调试仪器等。The above-mentioned software loading device may be a CPU or a JTAG debugging instrument or the like.
本实施例提供的方法中,待检测器件的JTAG管脚和JTAG EPLD连接,由于JTAG EPLD的Bank工作电平可以调节为连接在该Bank上的器件的工作电平,因而不需要额外的电平转换电路,可以简化待检测器件的JTAG管脚的连接关系,进而可简化BOM清单;并且该检测信号均通过JTAG EPLD发送,检测信号传送的距离短,信号质量好;进一步的,待检测器件的连接方式可以通过软件实现,所以不需要改变器件的焊接点,成链方式较灵活。In the method provided by this embodiment, the JTAG pin of the device to be detected is connected to the JTAG EPLD, since the Bank operating level of the JTAG EPLD can be adjusted to the operating level of the device connected to the Bank, no additional level is required The conversion circuit can simplify the connection relationship of the JTAG pins of the device to be detected, thereby simplifying the BOM list; and the detection signals are all sent through the JTAG EPLD, the detection signal transmission distance is short, and the signal quality is good; further, the device to be detected The connection method can be realized by software, so there is no need to change the welding points of the devices, and the chaining method is more flexible.
本发明的另一实施例提供的方法,可以应用于如图2所示的单板中,该单板内器件具体可以包括:JTAG EPLD 21(这里的JTAG EPLD已经通过第二JTAG Jacket(图中未画出)完成了软件的加载)、第一JTAG Jacket 22、DSP23、专用集成电路24(Application Specific Integrated Circuit,ASIC)、第一集成电路(Integrated Circuit,IC)器件25、CPU 26、PLD 27、FPGA 28和第二IC器件29;其中,DSP23、ASIC24、第一IC器件25、CPU26、PLD27、FPGA 28和第二IC器件29可以为待检测的器件;上述JTAG EPLD21中与第一JTAG Jacket22、第一IC器件、CPU26、PLD27、FPGA28相连的Bank的工作电平为3.3V;JTAGEPLD21中与第二IC器件相连的Bank的工作电平为2.5V;JTAG EPLD21中与DSP23、ASIC24相连的Bank的工作电平为1.8V;需要说明的是,上述第一JTAGJacket 22、DSP23、ASIC24、第一IC器件25、CPU 26、PLD 27、FPGA 28和第二IC器件29与JTAG EPLD21相连的管脚均为JTAG管脚。The method provided by another embodiment of the present invention can be applied in the single board as shown in Figure 2, and the device in the single board can specifically include: JTAG EPLD 21 (the JTAG EPLD here has passed the second JTAG Jacket (in the figure) Not shown) completed the software loading), the first JTAG
在如图3所示的流程示意图中,包括如下步骤:In the schematic flow chart shown in Figure 3, the following steps are included:
S31、通过JTAG EPLD 21将单板内待检测的器件与第一JTAG Jacket 22串联;S31, through the JTAG
实现S31的具体方法可以为,通过JTAG EPLD 21将DSP23、ASIC24、第一IC器件、CPU 26、EPLD27、FPGA28、第二IC器件29和第一JTAG Jacket 22按顺序串联;当然在实际情况中,该串联也可以不按上述顺序串联,该串联只需包括所有的待检测的器件即可。实现上述串联的方法可以参见S11中的相关描述。The concrete method that realizes S31 can be, through JTAG EPLD 21, DSP23, ASIC24, first IC device,
可选的,在实际情况中,该待检测的器件还可以为单个器件,如单独对CPU进行检测,此时,只需将第一JTAG Jacket和CPU串联即可。Optionally, in actual situations, the device to be detected can also be a single device, such as detecting the CPU alone. At this time, it is only necessary to connect the first JTAG Jacket and the CPU in series.
S32、JTAG EPLD21从第一JTAG Jacket22接收检测信号,对待检测的器件按串联顺序发送检测信号,完成对待检测的器件检测。S32. The JTAG EPLD21 receives the detection signal from the first JTAG Jacket22, and sends the detection signal to the device to be detected in series order to complete the detection of the device to be detected.
上述完成S32的具体步骤可以包括:第一JTAG Jacket22通过JTAG EPLD21将检测信号发送给CPU26,如CPU26检测正常,则该检测信号通过JTAGEPLD21传递到PLD27,如PLD27检测正常,则该检测信号通过JTAG EPLD21传递到第一IC器件,如第一IC器件检测正常,则该检测信号通过JTAG EPLD21传递到下一个器件直至所有的器件均检测完毕为止。The concrete steps of above-mentioned finishing S32 can comprise: the first JTAG Jacket22 sends detection signal to CPU26 by JTAG EPLD21, as CPU26 detection is normal, then this detection signal is delivered to PLD27 by JTAGEPLD21, as PLD27 detection is normal, then this detection signal passes through JTAG EPLD21 Pass to the first IC device, if the detection of the first IC device is normal, then the detection signal is passed to the next device through JTAG EPLD21 until all the devices are detected.
可选的,当完成对待检测的器件的检测后,还需要对改变后的待检测器件进行检测时,这里以FPGA28为例进行说明,将待检测器件改变成FPGA28后,单板的内器件的结构示意图如图4所示,在如图3所示的流程示意图中,该方法还可以包括:Optionally, after the detection of the device to be detected is completed, it is necessary to detect the changed device to be detected. Here, FPGA28 is used as an example to illustrate. After the device to be detected is changed to FPGA28, the internal device of the single board The structural diagram is shown in Figure 4, and in the flowchart shown in Figure 3, the method may also include:
S33、通过JTAG EPLD21将第一JTAG Jacket22与FPGA28串联;S33, the first JTAG Jacket22 is connected in series with FPGA28 by JTAG EPLD21;
S34、第一JTAG Jacket22通过JTAG EPLD21将检测信号发送给FPGA28完成检测。S34, the first JTAG Jacket22 sends the detection signal to the FPGA28 through the JTAG EPLD21 to complete the detection.
另外,可选的,在S32之后,上述方法还可以包括控制PLD27完成启动程序Boot的加载,实现Boot的加载的单板内器件结构图如图5所示,加载过程如下操作:In addition, optionally, after S32, the above-mentioned method can also include controlling the PLD27 to complete the loading of the startup program Boot, and realize the device structure diagram in the single board loaded by the Boot as shown in Figure 5, and the loading process is as follows:
S35、通过JTAG EPLD21将PLD27与CPU26连接,且还通过JTAG EPLD21将PLD27与第一JTAG Jacket22连接;S35, connect PLD27 with CPU26 by JTAG EPLD21, and also connect PLD27 with the first JTAG Jacket22 by JTAG EPLD21;
S36、JTAG EPLD21接收到CPU26的加载命令和第一JTAG Jacket22的加载命令后,根据选择命令从CPU26和第一JTAG Jacket22中选择一个控制PLD27完成对单板Boot的加载。After S36, JTAG EPLD21 receives the loading command of CPU26 and the loading command of the first JTAG Jacket22, select a control PLD27 from CPU26 and the first JTAG Jacket22 according to selection command and finish the loading to single board Boot.
如上述选择命令选择第一JTAG Jacket22,则完成S36的方法可以包括:第一JTAG Jacket22将加载命令发送给JTAG EPLD21,JTAG EPLD21将该加载命令发送给PLD27以控制PLD27完成对单板Boot的加载。Select first JTAG Jacket22 as above-mentioned selection command, then the method for finishing S36 can comprise: first JTAG Jacket22 sends loading order to JTAG EPLD21, and JTAG EPLD21 sends this loading order to PLD27 to control PLD27 to finish the loading to single board Boot.
如上述选择命令选择CPU26,则完成S36的方法具体可以包括:CPU26将控制命令发送给JTAG EPLD21,JTAG EPLD21将该加载命令发送给PLD27以控制PLD27完成对单板Boot的加载。Select CPU26 as above-mentioned selection command, then the method for finishing S36 specifically can comprise: CPU26 sends control command to JTAG EPLD21, and JTAG EPLD21 sends this loading command to PLD27 to control PLD27 to complete the loading of single board Boot.
上述JTAG EPLD接收CPU的加载命令和第一JTAG Jacket的加载命令的具体实现方式可以是,JTAG EPLD接收CPU和第一JTAG Jacket分别发送的加载命令,也可以是JTAG EPLD接收由CPU转发的第一JTAG Jacket的加载命令和CPU发送的其自身的加载命令。The concrete realization mode that above-mentioned JTAG EPLD receives the load command of CPU and the load command of the first JTAG Jacket can be that JTAG EPLD receives the load command sent by CPU and the first JTAG Jacket respectively, also can be that JTAG EPLD receives the first load command forwarded by CPU. The load command of JTAG Jacket and its own load command sent by the CPU.
进一步的,在步骤S31之前,本实施例提供的方法还可以包括,通过JTAGEPLD的JTAG引脚为该JTAG EPLD在线加载软件。Further, before step S31, the method provided by this embodiment may also include loading software online for the JTAG EPLD through the JTAG pin of the JTAGEPLD.
如JTAG EPLD的JTAG引脚与JTAG Jacket相连,在JTAG EPLD上电或者复位后,通过该JTAG Jacket控制JTAG EPLD在线加载软件。For example, the JTAG pin of the JTAG EPLD is connected to the JTAG Jacket. After the JTAG EPLD is powered on or reset, the JTAG EPLD is controlled to load software online through the JTAG Jacket.
本实施例提供的方法中,待检测器件的JTAG管脚和JTAG EPLD连接,由于JTAG EPLD的Bank工作电平可以调节为连接在该Bank上的器件的工作电平,因而不需要额外的电平转换电路,可以简化待检测器件的JTAG管脚的连接关系,进而可简化BOM清单;并且该检测信号均通过JTAG EPLD发送,检测信号传送的距离短,信号质量好;进一步的,待检测器件的连接方式可以通过软件实现,所以不需要改变器件的焊接点,成链方式较灵活。In the method provided by this embodiment, the JTAG pin of the device to be detected is connected to the JTAG EPLD, since the Bank operating level of the JTAG EPLD can be adjusted to the operating level of the device connected to the Bank, no additional level is required The conversion circuit can simplify the connection relationship of the JTAG pins of the device to be detected, thereby simplifying the BOM list; and the detection signals are all sent through the JTAG EPLD, the detection signal transmission distance is short, and the signal quality is good; further, the device to be detected The connection method can be realized by software, so there is no need to change the welding points of the devices, and the chaining method is more flexible.
本发明还提供一种单板内器件的检测装置,包括:第一PLD、待检测器件和第一JTAG Jacket;其中该第一JTAG Jacket和该待检测器件的JTAG管脚分别连接在该第一PLD的输入输出管脚Bank上;且Bank的工作电平为连接在其上的器件的工作电平。The present invention also provides a device detection device in a single board, comprising: a first PLD, a device to be detected, and a first JTAG Jacket; wherein the first JTAG Jacket and the JTAG pins of the device to be detected are respectively connected to the first The input and output pin Bank of the PLD is on; and the working level of the Bank is the working level of the device connected to it.
可选的,上述装置还包括:Optionally, the above-mentioned device also includes:
串联单元,用于通过所述第一PLD将所述待检测器件与所述第一JTAGJacket串联。A series connection unit, configured to connect the device to be detected and the first JTAGJacket in series through the first PLD.
上述串联的具体实现可以参见S11中的相关描述。For the specific implementation of the above series connection, refer to the relevant description in S11.
当完成串联后,第一JTAG Jacket通过第一PLD完成对待检测器件的边界扫描。After the series connection is completed, the first JTAG Jacket completes the boundary scan of the device to be detected through the first PLD.
可选的,上述待检测器件至少为二个。Optionally, there are at least two devices to be detected.
可选的,如所述待检测的器件包括:CPU和第二PLD,且第二PLD通过第一PLD与CPU连接,还通过第一PLD将第二PLD与第一JTAG Jacket连接;上述装置还包括:Optionally, the device to be detected includes: a CPU and a second PLD, and the second PLD is connected to the CPU through the first PLD, and the second PLD is also connected to the first JTAG Jacket through the first PLD; the above-mentioned device also include:
加载单元,用于在第一PLD接收到CPU的加载命令和第一JTAG Jacket的加载命令后,根据选择命令从CPU和第一JTAG Jacket中选择一个控制第二PLD完成对单板Boot的加载。The loading unit is used to select a control second PLD from the CPU and the first JTAG Jacket according to the selection command to complete the loading of the single board Boot after the first PLD receives the loading command of the CPU and the loading command of the first JTAG Jacket.
可选的,上述单板还包括:第二JTAG Jacket,第二JTAG Jacket与第一PLD的JTAG管脚连接,并用于通过第二JTAG Jacket为第一PLD在线软件加载。Optionally, the above single board also includes: a second JTAG Jacket, the second JTAG Jacket is connected to the JTAG pin of the first PLD, and is used to load online software for the first PLD through the second JTAG Jacket.
在线软件加载的具体实现可以参见上述方法实施例中的相关描述。For the specific implementation of online software loading, reference may be made to the relevant descriptions in the foregoing method embodiments.
本实施例提供的装置中,所有的待检测的器件的JTAG管脚均是和第一PLD连接的,由于第一PLD的Bank工作电平可以调节为连接在该Bank上的器件的工作电平,因而不需要额外的电平转换电路,可以简化待检测器件的JTAG管脚的连接关系,进而可简化BOM清单;并且该检测信号均通过第一PLD发送,检测信号传送的距离短,信号质量好;进一步的,待检测器件的连接方式可以通过软件实现,所以不需要改变器件的焊接点,成链方式较灵活。In the device provided by this embodiment, the JTAG pins of all the devices to be detected are connected to the first PLD, because the Bank operating level of the first PLD can be adjusted to the operating level of the device connected to the Bank , so no additional level conversion circuit is needed, which can simplify the connection relationship of the JTAG pins of the device to be tested, and then simplify the BOM list; and the detection signals are all sent through the first PLD, the detection signal transmission distance is short, and the signal quality Good; furthermore, the connection method of the devices to be tested can be realized by software, so there is no need to change the soldering points of the devices, and the chaining method is more flexible.
本领域技术人员可以理解附图只是一个优选实施例的示意图,附图中的模块或流程并不一定是实施本发明所必须的。Those skilled in the art can understand that the drawing is only a schematic diagram of a preferred embodiment, and the modules or processes in the drawing are not necessarily necessary for implementing the present invention.
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分步骤可以通过程序来指令相关的硬件完成,所述的程序可以存储于一种计算机可读存储介质中,该程序在执行时,包括方法实施例的步骤之一或其组合。Those of ordinary skill in the art can understand that all or part of the steps in the methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium. When the program is executed, One or a combination of steps of the method embodiments are included.
综上所述,本发明具体实施方式提供的技术方案,具有单板内检测器件连接关系简单,检测信号传送距离短,信号质量好,BOM清单少,成链方式灵活的优点。To sum up, the technical solution provided by the specific embodiment of the present invention has the advantages of simple connection relationship of detection devices in a single board, short detection signal transmission distance, good signal quality, less BOM list, and flexible chaining.
以上对本发明实施例进行了详细介绍,本文中应用了具体个例对本发明的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本发明的方法及其核心思想;同时,对于本领域的一般技术人员,依据本发明的思想,在具体实施方式及应用范围上均会有改变之处,综上所述,本说明书内容不应理解为对本发明的限制。The embodiments of the present invention have been described in detail above, and specific examples have been used in this paper to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only used to help understand the method and core idea of the present invention; at the same time, for Those skilled in the art will have changes in the specific implementation and scope of application according to the idea of the present invention. In summary, the contents of this specification should not be construed as limiting the present invention.
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CN106918750A (en) * | 2015-12-24 | 2017-07-04 | 英业达科技有限公司 | Suitable for the test circuit plate of memory bank |
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