CN101740668A - Light emitting element - Google Patents
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- CN101740668A CN101740668A CN200810171059A CN200810171059A CN101740668A CN 101740668 A CN101740668 A CN 101740668A CN 200810171059 A CN200810171059 A CN 200810171059A CN 200810171059 A CN200810171059 A CN 200810171059A CN 101740668 A CN101740668 A CN 101740668A
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- 239000004065 semiconductor Substances 0.000 claims description 44
- 239000000463 material Substances 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 6
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- 229910052738 indium Inorganic materials 0.000 claims description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 4
- 239000011777 magnesium Substances 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052785 arsenic Inorganic materials 0.000 claims description 3
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 3
- 229910052788 barium Inorganic materials 0.000 claims description 3
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052790 beryllium Inorganic materials 0.000 claims description 3
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical group [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 229910052749 magnesium Inorganic materials 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 229910052757 nitrogen Inorganic materials 0.000 claims description 3
- 229910052698 phosphorus Inorganic materials 0.000 claims description 3
- 239000011574 phosphorus Substances 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims 6
- 229910045601 alloy Inorganic materials 0.000 claims 6
- 239000000203 mixture Substances 0.000 claims 3
- 239000004411 aluminium Substances 0.000 claims 2
- 239000000126 substance Substances 0.000 claims 2
- 239000002648 laminated material Substances 0.000 claims 1
- 230000004888 barrier function Effects 0.000 description 43
- 238000010586 diagram Methods 0.000 description 14
- 239000000758 substrate Substances 0.000 description 10
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical class [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 4
- 239000002019 doping agent Substances 0.000 description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 3
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- RNQKDQAVIXDKAG-UHFFFAOYSA-N aluminum gallium Chemical compound [Al].[Ga] RNQKDQAVIXDKAG-UHFFFAOYSA-N 0.000 description 1
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
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- 229910052751 metal Inorganic materials 0.000 description 1
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- 150000004767 nitrides Chemical class 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
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Abstract
Description
技术领域technical field
本发明涉及一种发光元件结构,特别是涉及有源层中具有至少一掺杂垒层与一未掺杂垒层的发光元件。The present invention relates to a light-emitting device structure, in particular to a light-emitting device with at least one doped barrier layer and one undoped barrier layer in the active layer.
背景技术Background technique
发光二极管(light-emitting diode,LED)是光电元件中一种被广泛使用的光源。相较于传统的白炽灯泡或荧光灯管,发光二极管具有省电及使用寿命较长的特性,因此逐渐取代传统光源,而应用于各种领域,如交通号志、背光模块、路灯照明、医疗设备等。Light-emitting diode (LED) is a widely used light source in optoelectronic components. Compared with traditional incandescent bulbs or fluorescent tubes, light-emitting diodes have the characteristics of energy saving and long service life, so they gradually replace traditional light sources and are used in various fields, such as traffic signs, backlight modules, street lighting, medical equipment wait.
图1A为已知的发光元件结构示意图,如图1A所示,已知的发光元件100包含基板10、位于基板10上的半导体叠层12,以及位于半导体叠层12上的电极14,其中半导体叠层12由上而下至少包含p型半导体层120、有源层122,以及n型半导体层124;此外,在已知的发光元件100中,其有源层122为多量子阱(Multiple Quantum Well,MQW)结构,所谓的“多量子阱结构”是指有源层122是由多个量子阱层(quantum well layer)126与多个垒层128(barrier layer)交错堆叠的区域。FIG. 1A is a schematic structural view of a known light-emitting element. As shown in FIG. 1A, a known light-
发光二极管100的发光原理是通过电子与空穴分别由n型半导体层124与p型半导体层120注入有源层122中,电子e与空穴h在有源层122中的量子阱层126复合并以光的形式释放出能量。图1B为已知发光二极管的能隙(bandgap)及发光机制示意图,如图1B所示,由于空穴h的载流子迁移率(carrier mobility)较电子e的载流子迁移率小,已知发光二极管100中电子e与空穴h往往仅在较靠近p型半导体层120的量子阱层126复合(recombine),是故,在有源层122中发光区域集中于靠近p型半导体124几个量子阱层126附近,造成有源层122中仅有少数结构能够发光。The light-emitting principle of the light-
发明内容Contents of the invention
本发明的主要目的是披露发光元件,包含半导体叠层,其中半导体叠层具有有源层,此有源层还包含相邻交错堆叠的多个量子阱层与多个垒层,其中上述多个垒层中至少有一掺杂垒层(doped barrier layer)与一未掺杂垒层(undoped barrier layer)。The main purpose of the present invention is to disclose a light-emitting element, including a semiconductor stack, wherein the semiconductor stack has an active layer, and the active layer also includes a plurality of quantum well layers and a plurality of barrier layers stacked adjacently and alternately, wherein the above-mentioned plurality The barrier layer has at least one doped barrier layer and one undoped barrier layer.
本发明的另一目的在于提供具有多量子阱结构有源层的发光元件,其中多量子阱结构中具有选择性p型掺杂的垒层,以提高空穴的载流子迁移率。Another object of the present invention is to provide a light-emitting device with an active layer of a multi-quantum well structure, wherein the multi-quantum well structure has a selective p-type doped barrier layer to increase the carrier mobility of holes.
本发明的又一目的在于通过多量子阱结构中具有选择性p型掺杂的垒层提高空穴的载流子迁移率,使空穴均匀地分布于有源层中,由此增加多量子阱结构的发光区域并提升内量子效率。Another object of the present invention is to improve the carrier mobility of holes through the barrier layer with selective p-type doping in the multi-quantum well structure, so that the holes are evenly distributed in the active layer, thereby increasing the number of quantum wells. The light-emitting area of the well structure and improve the internal quantum efficiency.
附图说明Description of drawings
图1A为已知的发光元件结构示意图。FIG. 1A is a schematic structural diagram of a known light-emitting element.
图1B为已知的发光元件能隙与发光原理示意图。FIG. 1B is a schematic diagram of a known light-emitting device energy gap and light-emitting principle.
图2为本发明一实施例的结构示意图。Fig. 2 is a schematic structural diagram of an embodiment of the present invention.
图3为本发明又一实施例的结构示意图。Fig. 3 is a schematic structural diagram of another embodiment of the present invention.
图4为本发明再一实施例的结构示意图。Fig. 4 is a schematic structural diagram of yet another embodiment of the present invention.
图5为本发明另一实施例的结构式意图。Fig. 5 is a structural diagram of another embodiment of the present invention.
图6为本发明另一实施例的结构式意图。Fig. 6 is a structural diagram of another embodiment of the present invention.
图7为本发明另一实施例的结构式意图。Fig. 7 is a structural diagram of another embodiment of the present invention.
图8为本发明实施例的能隙示意图。Fig. 8 is a schematic diagram of an energy gap of an embodiment of the present invention.
附图标记说明Explanation of reference signs
100:发光元件 10:基板100: Light emitting element 10: Substrate
12:半导体叠层 120:p型半导体层12: Semiconductor stack 120: p-type semiconductor layer
122:有源层 124:n型半导体层122: Active layer 124: n-type semiconductor layer
126:量子阱层 128:垒层126: quantum well layer 128: barrier layer
14:电极 200:发光元件14: Electrode 200: Light emitting element
20:基板 22:半导体叠层20: Substrate 22: Semiconductor stack
220:第一导电型半导体层 222:有源层220: first conductivity type semiconductor layer 222: active layer
224:第二导电型半导体层 226:量子阱层224: Second conductivity type semiconductor layer 226: Quantum well layer
228:垒层 2280:外侧垒层228: Base layer 2280: Outside base layer
2282:内侧垒层 2282’:p型掺杂垒层2282: inner barrier layer 2282': p-type doped barrier layer
24:电极24: electrode
具体实施方式Detailed ways
以下配合附图说明本发明的实施例。Embodiments of the present invention are described below with reference to the accompanying drawings.
图2与图3为本发明实施例的结构示意图。如图2所示,发光元件200包含基板20、位于基板20上的半导体叠层22,以及至少一电极24位于半导体叠层22上,其中上述的基板20可以为绝缘、导电、透明或吸光基板,其材料可以是金属、氧化锌(ZnO)、碳化硅(SiC)、蓝宝石(sapphire)、硅(silicon)、砷化镓(GaAs)或磷化镓(GaP)等材料,而上述的半导体叠层22的材料可以选自材料包含铝(Al)、镓(Ga)、铟(In)、磷(P)、砷(As)或氮(N)等III/V族的半导体材料,诸如氮化镓(GaN)系列材料、磷化铝镓铟(AlGaInP)系列材料或砷化镓(GaAs)材料等;本实施例是以基板20为氧化锌导电透明基板而半导体叠层22为氮化镓系列材料进行说明。2 and 3 are structural schematic diagrams of embodiments of the present invention. As shown in FIG. 2, the light-
上述半导体叠层22由上而下至少包含第一导电型半导体层220、有源层222,以及第二导电型半导体层224,其中此有源层222是由多个量子阱层(quantum well layer)226与多个垒层(barrier layer)228相邻且交错堆叠而形成的多量子阱(multiple quantum well)结构,其中量子阱层226的材料为氮化铟镓(InGaN),而垒层228的材料则为氮化镓(GaN)。Above-mentioned semiconductor laminated
上述的多个垒层228包含有最靠近第一导电型半导体层220与第二导电型半导体层224的外侧垒层2280,以及内侧垒层2282;于上述的内侧垒层2282中,任意挑选一个或多个内侧垒层进行掺杂,其掺杂物(impurity)为p型掺杂物,其材料可以是铍(Be)、镁(Mg)、钡(Ba)或碳(C)等材料。换言之,在本发明实施例中,内侧垒层2282至少包含一具有p型掺杂物的p型掺杂垒层2282’,且外侧垒层2280为未掺杂垒层(undoped barrier layer)。The above
如图2所示,在此实施例中,有源层222是以10对(pair)垒层228与量子阱层226相邻且交互堆叠而成的结构为例,在上述的垒层228中,可以选择位于有源层222中间的内侧垒层2282进行掺杂,换句话说,即是选择靠近第一导电型半导体层220算起的第5层垒层进行掺杂,以形成p型掺杂垒层2282’。As shown in FIG. 2 , in this embodiment, the
此外,本发明实施例亦可如图3所示,选择靠近第一导电型半导体层220算起的第3层与第7层的垒层228进行掺杂,以形成p型掺杂垒层2282’,使p型掺杂垒层2282’均匀地分布于有源层222中。In addition, in the embodiment of the present invention, as shown in FIG. 3 , the
本发明的p型掺杂垒层2282’,除了可以如图2或图3所示,位于有源层222中间或均匀地分布于有源层222中外,亦可如图4与图5所示不均匀地分布于有源层222中。图4与图5为本发明另一实施例结构示意图,如图4所示,在内侧垒层2282中选择靠近第一导电型半导体层220的区域进行p型掺杂,使p型掺杂垒层2282’形成于靠近第一导电型半导体层220的区域。此外,亦可如图5所示,在内侧垒层2282中选择靠近第二导电型半导体层224的区域进行p型掺杂,使p型掺杂垒层2282’形成于靠近第二导电型半导体层224的区域。The p-type doped barrier layer 2282' of the present invention, in addition to being located in the middle of the
不仅如此,在本发明所披露的发光元件200中,掺杂物除了能均匀地掺杂分布于p型掺杂垒层2282’中外,亦可将掺杂物集中于p型掺杂垒层2282’中特定的掺杂区域。图6与图7为本发明又一实施例结构示意图,如图6所示,本发明实施例是将杂质以δ掺杂(delta doping)的方法掺杂于p型掺杂垒层2282’中,使p型掺杂垒层2282’中形成未掺杂区域B包夹着掺杂区域A的结构;如图7所示,掺杂区域A位于p型掺杂垒层2282’中靠近相邻的量子阱层区域。Furthermore, in the light-emitting
图8为本发明实施例的能隙示意图,如图8所示,p型掺杂垒层2282’提高了空穴h的迁移率,增加空穴h的注入量,使得空穴h能够较均匀地分布于有源层222中,由此使得电子e与空穴h复合(recombine)的区域较为均匀。Fig. 8 is a schematic diagram of the energy gap of the embodiment of the present invention. As shown in Fig. 8, the p-type doped barrier layer 2282' improves the mobility of the holes h, increases the injection amount of the holes h, and makes the holes h more uniform. are distributed in the
通过本发明所揭示的发光元件结构,能增加发光元件200的内部量子复合的机率,以提高内量子效率(internal quantum efficiency)以及发光元件的亮度。Through the light-emitting element structure disclosed in the present invention, the probability of internal quantum recombination of the light-emitting
以上所述的实施例仅为说明本发明的技术思想及特点,其目的在使本领域一般技术人员能够了解本发明的内容并据以实施,当不能以的限定本发明的权利要求,即大凡依本发明所揭示的精神所作的等同变化或修饰,仍应涵盖在本发明的权利要求内。The above-described embodiments are only to illustrate the technical ideas and characteristics of the present invention, and its purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly. When it is not possible to limit the claims of the present invention, that is, generally Equivalent changes or modifications made according to the spirit disclosed in the present invention shall still be covered by the claims of the present invention.
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Cited By (6)
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CN102157647A (en) * | 2011-05-03 | 2011-08-17 | 映瑞光电科技(上海)有限公司 | Nitride LED structure and preparation method thereof |
CN102185058A (en) * | 2011-04-02 | 2011-09-14 | 映瑞光电科技(上海)有限公司 | Nitride light-emitting diode (LED) structure and preparation method thereof |
CN102185060A (en) * | 2011-04-15 | 2011-09-14 | 映瑞光电科技(上海)有限公司 | Nitride light emitting diode (LED) structure and preparation method thereof |
CN102280547A (en) * | 2011-08-31 | 2011-12-14 | 厦门大学 | GaN semiconductor luminotron with P-type active region |
CN102306691A (en) * | 2011-09-02 | 2012-01-04 | 华灿光电股份有限公司 | Method for raising light emitting diode luminescence efficiency |
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JP2003332694A (en) * | 2002-05-17 | 2003-11-21 | Mitsubishi Electric Corp | Semiconductor laser |
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Cited By (7)
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CN102185058A (en) * | 2011-04-02 | 2011-09-14 | 映瑞光电科技(上海)有限公司 | Nitride light-emitting diode (LED) structure and preparation method thereof |
CN102185060A (en) * | 2011-04-15 | 2011-09-14 | 映瑞光电科技(上海)有限公司 | Nitride light emitting diode (LED) structure and preparation method thereof |
CN102157647A (en) * | 2011-05-03 | 2011-08-17 | 映瑞光电科技(上海)有限公司 | Nitride LED structure and preparation method thereof |
CN102280547A (en) * | 2011-08-31 | 2011-12-14 | 厦门大学 | GaN semiconductor luminotron with P-type active region |
CN102306691A (en) * | 2011-09-02 | 2012-01-04 | 华灿光电股份有限公司 | Method for raising light emitting diode luminescence efficiency |
CN102306691B (en) * | 2011-09-02 | 2014-04-30 | 华灿光电股份有限公司 | Method for raising light emitting diode luminescence efficiency |
CN105140357A (en) * | 2015-09-18 | 2015-12-09 | 华灿光电股份有限公司 | Epitaxial wafer with high light-emitting efficiency quantum barrier and preparation method thereof |
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