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CN101740668A - Light emitting element - Google Patents

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CN101740668A
CN101740668A CN200810171059A CN200810171059A CN101740668A CN 101740668 A CN101740668 A CN 101740668A CN 200810171059 A CN200810171059 A CN 200810171059A CN 200810171059 A CN200810171059 A CN 200810171059A CN 101740668 A CN101740668 A CN 101740668A
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light
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emitting component
quantum well
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CN101740668B (en
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王俊凯
洪详竣
许育宾
朱瑞溢
吴欣显
颜伟昱
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Epistar Corp
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Epistar Corp
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Abstract

The invention discloses a light emitting device, comprising a semiconductor stack having an active layer, wherein the active layer is a multi-quantum well (MQW) structure formed by alternately stacking a plurality of quantum well layers and a plurality of barrier layers, and at least one of the barrier layers is a doped barrier layer and an undoped barrier layer. The doped barrier layer can improve the carrier mobility of holes, homogenize the light-emitting region in the active layer and improve the Internal Quantum Efficiency (IQE) of the light-emitting element.

Description

发光元件 Light emitting element

技术领域technical field

本发明涉及一种发光元件结构,特别是涉及有源层中具有至少一掺杂垒层与一未掺杂垒层的发光元件。The present invention relates to a light-emitting device structure, in particular to a light-emitting device with at least one doped barrier layer and one undoped barrier layer in the active layer.

背景技术Background technique

发光二极管(light-emitting diode,LED)是光电元件中一种被广泛使用的光源。相较于传统的白炽灯泡或荧光灯管,发光二极管具有省电及使用寿命较长的特性,因此逐渐取代传统光源,而应用于各种领域,如交通号志、背光模块、路灯照明、医疗设备等。Light-emitting diode (LED) is a widely used light source in optoelectronic components. Compared with traditional incandescent bulbs or fluorescent tubes, light-emitting diodes have the characteristics of energy saving and long service life, so they gradually replace traditional light sources and are used in various fields, such as traffic signs, backlight modules, street lighting, medical equipment wait.

图1A为已知的发光元件结构示意图,如图1A所示,已知的发光元件100包含基板10、位于基板10上的半导体叠层12,以及位于半导体叠层12上的电极14,其中半导体叠层12由上而下至少包含p型半导体层120、有源层122,以及n型半导体层124;此外,在已知的发光元件100中,其有源层122为多量子阱(Multiple Quantum Well,MQW)结构,所谓的“多量子阱结构”是指有源层122是由多个量子阱层(quantum well layer)126与多个垒层128(barrier layer)交错堆叠的区域。FIG. 1A is a schematic structural view of a known light-emitting element. As shown in FIG. 1A, a known light-emitting element 100 includes a substrate 10, a semiconductor stack 12 on the substrate 10, and an electrode 14 on the semiconductor stack 12, wherein the semiconductor The laminated layer 12 comprises at least a p-type semiconductor layer 120, an active layer 122, and an n-type semiconductor layer 124 from top to bottom; in addition, in the known light-emitting element 100, its active layer 122 is a multiple quantum well (Multiple Quantum Well) Well, MQW) structure, the so-called "multiple quantum well structure" means that the active layer 122 is a region in which multiple quantum well layers (quantum well layers) 126 and multiple barrier layers 128 (barrier layers) are stacked alternately.

发光二极管100的发光原理是通过电子与空穴分别由n型半导体层124与p型半导体层120注入有源层122中,电子e与空穴h在有源层122中的量子阱层126复合并以光的形式释放出能量。图1B为已知发光二极管的能隙(bandgap)及发光机制示意图,如图1B所示,由于空穴h的载流子迁移率(carrier mobility)较电子e的载流子迁移率小,已知发光二极管100中电子e与空穴h往往仅在较靠近p型半导体层120的量子阱层126复合(recombine),是故,在有源层122中发光区域集中于靠近p型半导体124几个量子阱层126附近,造成有源层122中仅有少数结构能够发光。The light-emitting principle of the light-emitting diode 100 is that electrons and holes are respectively injected into the active layer 122 by the n-type semiconductor layer 124 and the p-type semiconductor layer 120, and electrons e and holes h recombine in the quantum well layer 126 in the active layer 122. And release energy in the form of light. Figure 1B is a schematic diagram of the energy gap (bandgap) and light-emitting mechanism of a known light-emitting diode. As shown in Figure 1B, since the carrier mobility of the hole h is smaller than that of the electron e, it has been It is known that the electrons e and the holes h in the light emitting diode 100 are often only recombined in the quantum well layer 126 closer to the p-type semiconductor layer 120, so the light-emitting region in the active layer 122 is concentrated near the p-type semiconductor 124. Near the quantum well layer 126, only a few structures in the active layer 122 can emit light.

发明内容Contents of the invention

本发明的主要目的是披露发光元件,包含半导体叠层,其中半导体叠层具有有源层,此有源层还包含相邻交错堆叠的多个量子阱层与多个垒层,其中上述多个垒层中至少有一掺杂垒层(doped barrier layer)与一未掺杂垒层(undoped barrier layer)。The main purpose of the present invention is to disclose a light-emitting element, including a semiconductor stack, wherein the semiconductor stack has an active layer, and the active layer also includes a plurality of quantum well layers and a plurality of barrier layers stacked adjacently and alternately, wherein the above-mentioned plurality The barrier layer has at least one doped barrier layer and one undoped barrier layer.

本发明的另一目的在于提供具有多量子阱结构有源层的发光元件,其中多量子阱结构中具有选择性p型掺杂的垒层,以提高空穴的载流子迁移率。Another object of the present invention is to provide a light-emitting device with an active layer of a multi-quantum well structure, wherein the multi-quantum well structure has a selective p-type doped barrier layer to increase the carrier mobility of holes.

本发明的又一目的在于通过多量子阱结构中具有选择性p型掺杂的垒层提高空穴的载流子迁移率,使空穴均匀地分布于有源层中,由此增加多量子阱结构的发光区域并提升内量子效率。Another object of the present invention is to improve the carrier mobility of holes through the barrier layer with selective p-type doping in the multi-quantum well structure, so that the holes are evenly distributed in the active layer, thereby increasing the number of quantum wells. The light-emitting area of the well structure and improve the internal quantum efficiency.

附图说明Description of drawings

图1A为已知的发光元件结构示意图。FIG. 1A is a schematic structural diagram of a known light-emitting element.

图1B为已知的发光元件能隙与发光原理示意图。FIG. 1B is a schematic diagram of a known light-emitting device energy gap and light-emitting principle.

图2为本发明一实施例的结构示意图。Fig. 2 is a schematic structural diagram of an embodiment of the present invention.

图3为本发明又一实施例的结构示意图。Fig. 3 is a schematic structural diagram of another embodiment of the present invention.

图4为本发明再一实施例的结构示意图。Fig. 4 is a schematic structural diagram of yet another embodiment of the present invention.

图5为本发明另一实施例的结构式意图。Fig. 5 is a structural diagram of another embodiment of the present invention.

图6为本发明另一实施例的结构式意图。Fig. 6 is a structural diagram of another embodiment of the present invention.

图7为本发明另一实施例的结构式意图。Fig. 7 is a structural diagram of another embodiment of the present invention.

图8为本发明实施例的能隙示意图。Fig. 8 is a schematic diagram of an energy gap of an embodiment of the present invention.

附图标记说明Explanation of reference signs

100:发光元件              10:基板100: Light emitting element 10: Substrate

12:半导体叠层             120:p型半导体层12: Semiconductor stack 120: p-type semiconductor layer

122:有源层                124:n型半导体层122: Active layer 124: n-type semiconductor layer

126:量子阱层              128:垒层126: quantum well layer 128: barrier layer

14:电极                   200:发光元件14: Electrode 200: Light emitting element

20:基板                   22:半导体叠层20: Substrate 22: Semiconductor stack

220:第一导电型半导体层    222:有源层220: first conductivity type semiconductor layer 222: active layer

224:第二导电型半导体层    226:量子阱层224: Second conductivity type semiconductor layer 226: Quantum well layer

228:垒层                  2280:外侧垒层228: Base layer 2280: Outside base layer

2282:内侧垒层             2282’:p型掺杂垒层2282: inner barrier layer 2282': p-type doped barrier layer

24:电极24: electrode

具体实施方式Detailed ways

以下配合附图说明本发明的实施例。Embodiments of the present invention are described below with reference to the accompanying drawings.

图2与图3为本发明实施例的结构示意图。如图2所示,发光元件200包含基板20、位于基板20上的半导体叠层22,以及至少一电极24位于半导体叠层22上,其中上述的基板20可以为绝缘、导电、透明或吸光基板,其材料可以是金属、氧化锌(ZnO)、碳化硅(SiC)、蓝宝石(sapphire)、硅(silicon)、砷化镓(GaAs)或磷化镓(GaP)等材料,而上述的半导体叠层22的材料可以选自材料包含铝(Al)、镓(Ga)、铟(In)、磷(P)、砷(As)或氮(N)等III/V族的半导体材料,诸如氮化镓(GaN)系列材料、磷化铝镓铟(AlGaInP)系列材料或砷化镓(GaAs)材料等;本实施例是以基板20为氧化锌导电透明基板而半导体叠层22为氮化镓系列材料进行说明。2 and 3 are structural schematic diagrams of embodiments of the present invention. As shown in FIG. 2, the light-emitting element 200 includes a substrate 20, a semiconductor stack 22 on the substrate 20, and at least one electrode 24 on the semiconductor stack 22, wherein the above-mentioned substrate 20 can be an insulating, conductive, transparent or light-absorbing substrate , its material can be metal, zinc oxide (ZnO), silicon carbide (SiC), sapphire (sapphire), silicon (silicon), gallium arsenide (GaAs) or gallium phosphide (GaP) and other materials, and the above-mentioned semiconductor stack The material of layer 22 may be selected from III/V semiconductor materials including aluminum (Al), gallium (Ga), indium (In), phosphorus (P), arsenic (As) or nitrogen (N), such as nitride Gallium (GaN) series materials, aluminum gallium indium phosphide (AlGaInP) series materials or gallium arsenide (GaAs) materials, etc.; in this embodiment, the substrate 20 is a zinc oxide conductive transparent substrate and the semiconductor stack 22 is a gallium nitride series Materials are explained.

上述半导体叠层22由上而下至少包含第一导电型半导体层220、有源层222,以及第二导电型半导体层224,其中此有源层222是由多个量子阱层(quantum well layer)226与多个垒层(barrier layer)228相邻且交错堆叠而形成的多量子阱(multiple quantum well)结构,其中量子阱层226的材料为氮化铟镓(InGaN),而垒层228的材料则为氮化镓(GaN)。Above-mentioned semiconductor laminated layer 22 comprises at least first conductive type semiconductor layer 220, active layer 222, and second conductive type semiconductor layer 224 from top to bottom, wherein this active layer 222 is made of multiple quantum well layers (quantum well layer ) 226 and a plurality of barrier layers (barrier layer) 228 are adjacent and stacked to form a multiple quantum well (multiple quantum well) structure, wherein the material of the quantum well layer 226 is indium gallium nitride (InGaN), and the barrier layer 228 The material used is gallium nitride (GaN).

上述的多个垒层228包含有最靠近第一导电型半导体层220与第二导电型半导体层224的外侧垒层2280,以及内侧垒层2282;于上述的内侧垒层2282中,任意挑选一个或多个内侧垒层进行掺杂,其掺杂物(impurity)为p型掺杂物,其材料可以是铍(Be)、镁(Mg)、钡(Ba)或碳(C)等材料。换言之,在本发明实施例中,内侧垒层2282至少包含一具有p型掺杂物的p型掺杂垒层2282’,且外侧垒层2280为未掺杂垒层(undoped barrier layer)。The above multiple barrier layers 228 include the outer barrier layer 2280 closest to the first conductive type semiconductor layer 220 and the second conductive type semiconductor layer 224, and the inner barrier layer 2282; among the above inner barrier layers 2282, one is selected arbitrarily One or more inner barrier layers are doped, and the impurity is a p-type dopant, and its material can be beryllium (Be), magnesium (Mg), barium (Ba) or carbon (C). In other words, in the embodiment of the present invention, the inner barrier layer 2282 includes at least a p-type doped barrier layer 2282' having p-type dopants, and the outer barrier layer 2280 is an undoped barrier layer.

如图2所示,在此实施例中,有源层222是以10对(pair)垒层228与量子阱层226相邻且交互堆叠而成的结构为例,在上述的垒层228中,可以选择位于有源层222中间的内侧垒层2282进行掺杂,换句话说,即是选择靠近第一导电型半导体层220算起的第5层垒层进行掺杂,以形成p型掺杂垒层2282’。As shown in FIG. 2 , in this embodiment, the active layer 222 is an example of a structure in which 10 pairs of (pair) barrier layers 228 and quantum well layers 226 are adjacent and alternately stacked. , the inner barrier layer 2282 located in the middle of the active layer 222 can be selected for doping, in other words, the fifth barrier layer close to the first conductivity type semiconductor layer 220 can be selected for doping to form a p-type doped barrier layer 2282'.

此外,本发明实施例亦可如图3所示,选择靠近第一导电型半导体层220算起的第3层与第7层的垒层228进行掺杂,以形成p型掺杂垒层2282’,使p型掺杂垒层2282’均匀地分布于有源层222中。In addition, in the embodiment of the present invention, as shown in FIG. 3 , the barrier layer 228 of the third layer and the seventh layer close to the first conductivity type semiconductor layer 220 can be selected for doping to form a p-type doped barrier layer 2282. ', so that the p-type doped barrier layer 2282' is uniformly distributed in the active layer 222.

本发明的p型掺杂垒层2282’,除了可以如图2或图3所示,位于有源层222中间或均匀地分布于有源层222中外,亦可如图4与图5所示不均匀地分布于有源层222中。图4与图5为本发明另一实施例结构示意图,如图4所示,在内侧垒层2282中选择靠近第一导电型半导体层220的区域进行p型掺杂,使p型掺杂垒层2282’形成于靠近第一导电型半导体层220的区域。此外,亦可如图5所示,在内侧垒层2282中选择靠近第二导电型半导体层224的区域进行p型掺杂,使p型掺杂垒层2282’形成于靠近第二导电型半导体层224的区域。The p-type doped barrier layer 2282' of the present invention, in addition to being located in the middle of the active layer 222 or evenly distributed in the active layer 222 as shown in Figure 2 or Figure 3, can also be as shown in Figure 4 and Figure 5 are unevenly distributed in the active layer 222 . 4 and 5 are structural schematic diagrams of another embodiment of the present invention. As shown in FIG. 4 , in the inner barrier layer 2282, a region close to the first conductivity type semiconductor layer 220 is selected for p-type doping, so that the p-type doped barrier The layer 2282 ′ is formed in a region close to the first conductivity type semiconductor layer 220 . In addition, as shown in FIG. 5 , in the inner barrier layer 2282, a region close to the second conductive type semiconductor layer 224 can be selected for p-type doping, so that the p-type doped barrier layer 2282' is formed near the second conductive type semiconductor layer. Layer 224 area.

不仅如此,在本发明所披露的发光元件200中,掺杂物除了能均匀地掺杂分布于p型掺杂垒层2282’中外,亦可将掺杂物集中于p型掺杂垒层2282’中特定的掺杂区域。图6与图7为本发明又一实施例结构示意图,如图6所示,本发明实施例是将杂质以δ掺杂(delta doping)的方法掺杂于p型掺杂垒层2282’中,使p型掺杂垒层2282’中形成未掺杂区域B包夹着掺杂区域A的结构;如图7所示,掺杂区域A位于p型掺杂垒层2282’中靠近相邻的量子阱层区域。Furthermore, in the light-emitting element 200 disclosed in the present invention, in addition to uniformly doping and distributing the dopant in the p-type doped barrier layer 2282 ′, the dopant can also be concentrated in the p-type doped barrier layer 2282 'Specific doped regions. Figure 6 and Figure 7 are schematic structural diagrams of another embodiment of the present invention, as shown in Figure 6, the embodiment of the present invention is to dope impurities into the p-type doped barrier layer 2282' by delta doping , so that the p-type doped barrier layer 2282' forms a structure in which the undoped region B sandwiches the doped region A; as shown in Figure 7, the doped region A is located in the p-type doped barrier layer 2282' and is close the quantum well layer region.

图8为本发明实施例的能隙示意图,如图8所示,p型掺杂垒层2282’提高了空穴h的迁移率,增加空穴h的注入量,使得空穴h能够较均匀地分布于有源层222中,由此使得电子e与空穴h复合(recombine)的区域较为均匀。Fig. 8 is a schematic diagram of the energy gap of the embodiment of the present invention. As shown in Fig. 8, the p-type doped barrier layer 2282' improves the mobility of the holes h, increases the injection amount of the holes h, and makes the holes h more uniform. are distributed in the active layer 222 , so that the electron e and the hole h recombine (recombine) region is relatively uniform.

通过本发明所揭示的发光元件结构,能增加发光元件200的内部量子复合的机率,以提高内量子效率(internal quantum efficiency)以及发光元件的亮度。Through the light-emitting element structure disclosed in the present invention, the probability of internal quantum recombination of the light-emitting element 200 can be increased to improve internal quantum efficiency and brightness of the light-emitting element.

以上所述的实施例仅为说明本发明的技术思想及特点,其目的在使本领域一般技术人员能够了解本发明的内容并据以实施,当不能以的限定本发明的权利要求,即大凡依本发明所揭示的精神所作的等同变化或修饰,仍应涵盖在本发明的权利要求内。The above-described embodiments are only to illustrate the technical ideas and characteristics of the present invention, and its purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly. When it is not possible to limit the claims of the present invention, that is, generally Equivalent changes or modifications made according to the spirit disclosed in the present invention shall still be covered by the claims of the present invention.

Claims (12)

1. light-emitting component, at least comprise first conductive-type semiconductor layer, active layer, and second conductive-type semiconductor layer, wherein this active layer is by a plurality of quantum well layers and a plurality of layer multi-quantum pit structure that is staggeredly stacked and is formed of building, at least comprise the p type in this a plurality of bases layer and mix and build layer, and the base layer of the most close this first conductive-type semiconductor layer or this second conductive-type semiconductor layer is built for not mixing layer.
2. light-emitting component as claimed in claim 1, wherein the alloy of this p type doping base layer is beryllium, magnesium, barium or carbon.
3. light-emitting component as claimed in claim 2, wherein this alloy is distributed in this p type equably and mixes to build in the layer or be distributed in this p type and mix and build specific region in the layer.
4. light-emitting component as claimed in claim 3, wherein the specific region in this p type doping base layer is the part near this quantum well layer.
5. light-emitting component as claimed in claim 2, wherein this alloy is doped in this p type doping base layer with the method for δ doping.
6. light-emitting component as claimed in claim 1, wherein the material of this first conductive-type semiconductor layer, active layer and second conductive-type semiconductor layer is selected from the semiconductor substance that comprises aluminium, gallium, indium, nitrogen, phosphorus or arsenic.
7. light-emitting component, comprise semiconductor laminated, wherein this semiconductor laminatedly has an active layer, this active layer comprises a plurality of quantum well layers and builds the multi-quantum pit structure that layer is staggeredly stacked and is formed, wherein this base layer comprises at least one outside base layer and a plurality of inboard layer of building, wherein this outside is built layer and is built layer for mixing, and comprise a p type at least and mixes and build layer and should the inboard build layer.
8. light-emitting component as claimed in claim 7, wherein the alloy of this p type doping base layer is beryllium, magnesium, barium or carbon.
9. light-emitting component as claimed in claim 8, wherein this alloy is distributed in this p type equably and mixes to build in the layer or be distributed in this p type and mix and build specific region in the layer.
10. light-emitting component as claimed in claim 9, wherein the specific region in this p type doping base layer is the part near this quantum well layer.
11. light-emitting component as claimed in claim 8, wherein this alloy is doped in this p type doping base layer with the method for δ doping.
12. light-emitting component as claimed in claim 7, wherein this semiconductor laminated material is selected from the semiconductor substance that comprises aluminium, gallium, indium, nitrogen, phosphorus or arsenic.
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CN102185060A (en) * 2011-04-15 2011-09-14 映瑞光电科技(上海)有限公司 Nitride light emitting diode (LED) structure and preparation method thereof
CN102280547A (en) * 2011-08-31 2011-12-14 厦门大学 GaN semiconductor luminotron with P-type active region
CN102306691A (en) * 2011-09-02 2012-01-04 华灿光电股份有限公司 Method for raising light emitting diode luminescence efficiency
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CN102185058A (en) * 2011-04-02 2011-09-14 映瑞光电科技(上海)有限公司 Nitride light-emitting diode (LED) structure and preparation method thereof
CN102185060A (en) * 2011-04-15 2011-09-14 映瑞光电科技(上海)有限公司 Nitride light emitting diode (LED) structure and preparation method thereof
CN102157647A (en) * 2011-05-03 2011-08-17 映瑞光电科技(上海)有限公司 Nitride LED structure and preparation method thereof
CN102280547A (en) * 2011-08-31 2011-12-14 厦门大学 GaN semiconductor luminotron with P-type active region
CN102306691A (en) * 2011-09-02 2012-01-04 华灿光电股份有限公司 Method for raising light emitting diode luminescence efficiency
CN102306691B (en) * 2011-09-02 2014-04-30 华灿光电股份有限公司 Method for raising light emitting diode luminescence efficiency
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