CN101626000B - Metal array substrate, photoelectric element, light emitting element and manufacturing method thereof - Google Patents
Metal array substrate, photoelectric element, light emitting element and manufacturing method thereof Download PDFInfo
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- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 229910052594 sapphire Inorganic materials 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
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- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 2
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Abstract
本发明公开了一种金属阵列基板、具有其的高热传导性光电元件和发光元件及其制作方法。金属阵列基板包含多个金属单元基板及位于金属单元基板间具有粘着功能的胶体物质。高热传导性光电元件包含金属单元基板,位于金属单元基板之上的接合层及位于接合层之上的外延结构。
The present invention discloses a metal array substrate, a high thermal conductivity photoelectric element and a light-emitting element having the same, and a manufacturing method thereof. The metal array substrate comprises a plurality of metal unit substrates and a colloidal substance with an adhesive function located between the metal unit substrates. The high thermal conductivity photoelectric element comprises a metal unit substrate, a bonding layer located on the metal unit substrate, and an epitaxial structure located on the bonding layer.
Description
技术领域 technical field
本发明披露一种金属阵列基板及形成于其上的高热传导性光电元件结构及其制造方法,特别是关于一种高热传导性发光二极管结构及其制造方法。The invention discloses a metal array substrate and a photoelectric element structure with high thermal conductivity formed thereon and its manufacturing method, in particular to a high thermal conductivity light-emitting diode structure and its manufacturing method.
背景技术 Background technique
已知承载蓝光发光二极管的氧化铝(sapphire)基板属于低热传导性材料(热传导系数约为40W/mK),在较高电流状况下操作时,无法有效地传递热量,造成热量累积而影响发光二极管的可靠度。It is known that the aluminum oxide (sapphire) substrate carrying the blue light-emitting diode is a material with low thermal conductivity (the thermal conductivity is about 40W/mK). When operating under a high current condition, it cannot effectively transfer heat, causing heat accumulation and affecting the light-emitting diode. reliability.
目前市面出现将整片高热传导性金属铜基板(热传导系数约为400W/mK)以电镀或粘贴方式与发光二极管连接,可有效地传递热量。然而在移除生长基板后,内应力压缩整片金属铜基板,造成芯片(wafer)翘曲而影响后续工艺良率。At present, the whole piece of metal copper substrate with high thermal conductivity (the thermal conductivity is about 400W/mK) is connected to the light-emitting diode by electroplating or pasting, which can effectively transfer heat. However, after the growth substrate is removed, the internal stress compresses the entire metal copper substrate, causing the wafer to warp and affecting the subsequent process yield.
发明内容 Contents of the invention
本发明提供一种具有高热传导性金属基板的结构,其由多个金属单元基板以及具有粘着功能且位于金属单元基板间的胶体物质所组成的金属阵列基板。The invention provides a metal substrate structure with high thermal conductivity, which is a metal array substrate composed of a plurality of metal unit substrates and a colloid substance with adhesion function and located between the metal unit substrates.
本发明提供一种具有高热传导性金属基板的结构,由铜、铝、镍、金及其合金组成。The present invention provides a structure with a high thermal conductivity metal substrate consisting of copper, aluminum, nickel, gold and alloys thereof.
本发明提供一种具有高热传导性金属基板的结构,其中胶体物质具有绝缘及耐高温特性,例如为二次硬化型液态树脂,可经由UV照射或加热(<400℃)烘烤而固化。The present invention provides a metal substrate structure with high thermal conductivity, wherein the colloidal substance has insulation and high temperature resistance properties, such as a secondary curing liquid resin, which can be cured by UV irradiation or heating (<400°C) baking.
本发明提供一种具有高热传导性光电元件的结构,其中的基板为金属阵列基板。The invention provides a photoelectric element structure with high thermal conductivity, wherein the substrate is a metal array substrate.
本发明提供一种具有高热传导性光电元件的结构,其中的基板为金属阵列基板,由多个金属单元基板所组成且每一金属单元基板侧面具有胶体物质。The invention provides a structure of photoelectric elements with high thermal conductivity, wherein the substrate is a metal array substrate, which is composed of a plurality of metal unit substrates and each metal unit substrate has a colloid substance on the side.
本发明提供一种具有高热传导性光电元件的结构,其中的基板为金属阵列基板,由多个金属单元基板所组成,且利用接合层或电镀方式与发光二极管结构接合。The invention provides a structure of photoelectric elements with high thermal conductivity, wherein the substrate is a metal array substrate, which is composed of a plurality of metal unit substrates, and is bonded to the light-emitting diode structure by means of a bonding layer or electroplating.
本发明提供一种具有高热传导性光电元件的结构,其中的基板为金属阵列基板,由多个金属单元基板所组成且每一金属单元基板面积可相等或不相等。The invention provides a photoelectric element structure with high thermal conductivity, wherein the substrate is a metal array substrate, which is composed of a plurality of metal unit substrates, and the area of each metal unit substrate can be equal or unequal.
本发明提供一种具有高热传导性光电元件的结构,其中的基板为金属阵列基板,由于其热传导效率高,故此光电元件可直接进行封装步骤而不需另加一载板(submount)。The invention provides a structure of photoelectric elements with high thermal conductivity, wherein the substrate is a metal array substrate. Due to its high heat conduction efficiency, the photoelectric elements can be directly packaged without adding a submount.
本发明提供一种具有高热传导性光电元件的结构,可为垂直结构或水平结构。The invention provides a structure of photoelectric elements with high thermal conductivity, which can be a vertical structure or a horizontal structure.
本发明揭示一种具有高热传导性金属基板的发光结构,其金属基板并非整片粘贴或电镀于发光结构上,而是以胶体物质粘结金属单元基板而成为金属阵列基板。当生长基板移除后,不需再切割金属基板,且由于胶体物质具有缓冲应力的功能,可降低芯片翘曲发生的机率,提高后续工艺良率。The invention discloses a light-emitting structure with a metal substrate with high thermal conductivity. The metal substrate is not pasted or electroplated on the light-emitting structure as a whole, but the metal unit substrate is bonded with a colloidal substance to form a metal array substrate. After the growth substrate is removed, there is no need to cut the metal substrate, and because the colloidal substance has the function of buffering stress, it can reduce the probability of chip warpage and improve the yield of subsequent processes.
附图说明 Description of drawings
图1显示本发明的金属阵列基板外观图;Figure 1 shows the appearance of the metal array substrate of the present invention;
图2A-2H显示本发明的金属阵列基板的制作流程图;2A-2H show the fabrication flow chart of the metal array substrate of the present invention;
图3-7显示本发明实施例的光电元件制作流程图;Fig. 3-7 shows the photoelectric element fabrication flowchart of the embodiment of the present invention;
图8-12显示本发明另一实施例的光电元件制作流程图;Fig. 8-12 shows the production flow diagram of the photoelectric element of another embodiment of the present invention;
图4及13-19显示本发明再一实施例的光电元件制作流程图。4 and 13-19 show the fabrication flow chart of the photoelectric element according to another embodiment of the present invention.
【主要元件符号说明】[Description of main component symbols]
1~铜基板1~copper substrate
2~光致抗蚀剂2~Photoresist
3~条状结构3~strip structure
4~胶体物质4~Colloidal substance
5、6a、6b~金属单元基板5, 6a, 6b~Metal unit substrate
7a、7b~电镀镍层7a, 7b~electroplated nickel layer
8~电镀铜层8~electroplated copper layer
10、20~金属阵列基板10, 20~metal array substrate
11~接合层11~Joining layer
21~生长基板21 ~ growth substrate
22~外延结构22~Epitaxial structure
23~第一电性半导体层23 ~ the first electrical semiconductor layer
24~活性层24~active layer
25~第二电性半导体层25~Second electrical semiconductor layer
26~第二电性接触层26~Second electrical contact layer
27~反射层27~reflective layer
28~第一电性接触层28~The first electrical contact layer
29~第一电极29 ~ the first electrode
30~切割道30~cutting lane
31~临时基板31~Temporary substrate
32~粘着层32~adhesive layer
33~第二电极33~Second electrode
34~胶膜34~film
100、200、300~发光二极管管芯100, 200, 300~LED die
具体实施方式 Detailed ways
本发明披露一种金属阵列基板及形成于其上的高热传导性光电元件结构及其制造方法。为了使本发明的叙述更加详尽与完备,可参照下列描述并配合图1至图19。The invention discloses a metal array substrate, a photoelectric element structure with high thermal conductivity formed thereon and a manufacturing method thereof. In order to make the description of the present invention more detailed and complete, reference may be made to the following description together with FIGS. 1 to 19 .
实施例一Embodiment one
本发明的光电元件以发光二极管为例,其结构与制作方法如图1-8所示。图1为本发明所使用的金属阵列基板外观图。图2A至图2H为本发明所使用的金属阵列基板制作方法的流程图。如图2A所示,将金属基板1,例如铜基板,在其下方粘着胶膜34,在其上表面涂布一层光致抗蚀剂2(如图2B),再利用黄光显影蚀刻工艺于金属基板1蚀刻形成多道条状结构3,其中相邻两道条状结构的距离依后续与其粘贴的发光二极管结构设计而定(如图2C、2D)。再于条状结构内充填胶体物质4(如图2E、2F),其中胶体物质具有绝缘及耐高温特性,例如为二次硬化型液态树脂,可经由UV照射或加热(<400℃)烘烤而固化。最后移除光致抗蚀剂,即形成利用胶体物质粘结多个相邻且面积相同的金属单元基板5所组成的高导热性金属阵列基板10或多个相邻但面积不同的金属单元基板6a及6b所组成的高导热性金属阵列基板20,如图2 G、2H所示。其中金属阵列基板10、20可为铜(Cu)、铝(Al)、镍(Ni)、金(Au)等金属或其合金所组成。The photoelectric element of the present invention takes a light emitting diode as an example, and its structure and manufacturing method are shown in Figures 1-8. FIG. 1 is an appearance view of a metal array substrate used in the present invention. 2A to 2H are flow charts of the fabrication method of the metal array substrate used in the present invention. As shown in FIG. 2A, a metal substrate 1, such as a copper substrate, is adhered with an adhesive film 34 below it, and a layer of photoresist 2 is coated on its upper surface (as shown in FIG. 2B ), and then the yellow light development and etching process is used. A plurality of strip structures 3 are formed by etching on the metal substrate 1, wherein the distance between two adjacent strip structures depends on the design of the LED structure to be pasted thereafter (as shown in Figures 2C and 2D). Then fill the strip structure with colloidal substance 4 (as shown in Figure 2E, 2F), wherein the colloidal substance has insulation and high temperature resistance properties, such as a secondary hardening liquid resin, which can be baked by UV irradiation or heating (<400°C) And solidified. Finally, the photoresist is removed to form a high thermal conductivity metal array substrate 10 composed of a plurality of adjacent metal unit substrates 5 with the same area bonded by colloidal substances or a plurality of adjacent metal unit substrates with different areas. The high thermal conductivity metal array substrate 20 composed of 6a and 6b is shown in FIGS. 2G and 2H. The metal array substrates 10 and 20 may be composed of metals such as copper (Cu), aluminum (Al), nickel (Ni), gold (Au) or alloys thereof.
如图3所示,在金属阵列基板10上形成接合层11,其材料可为银、金、铝、铟等金属材料,或为自发性导电高分子,或高分子中掺杂如铝、金、铂、锌、银、镍、锗、铟、锡、钛、铅、铜、钯或其合金所组成的导电材料。As shown in FIG. 3, a bonding layer 11 is formed on the metal array substrate 10, and its material can be metal materials such as silver, gold, aluminum, indium, or a spontaneous conductive polymer, or a polymer doped with aluminum, gold, etc. , platinum, zinc, silver, nickel, germanium, indium, tin, titanium, lead, copper, palladium or their alloys composed of conductive materials.
图4所示为发光结构,例如为发光二极管,包含生长基板21,其材料可为砷化镓、硅、碳化硅、蓝宝石、磷化铟、磷化镓、氮化铝或氮化镓等。接着,在生长基板21上形成外延结构22。外延结构22通过外延工艺所形成,例如有机金属气相沉积外延法(MOCVD)、液相外延法(LPE)或分子束外延法(MBE)等外延工艺。此外延结构22至少包含第一电性半导体层23,例如为n型磷化铝镓铟(AlxGa1-x)yIn1-yP层或n型氮化铝镓铟(AlxGa1-x)yIn1-yN层;活性层24,例如为磷化铝镓铟(AlxGa1-x)yIn1-yP或氮化铝镓铟(AlxGa1-x)yIn1-yN所形成的多重量子阱结构;以及第二电性半导体层25,例如为p型磷化铝镓铟(AlxGa1-x)yIn1-yP层或p型氮化铝镓铟(AlxGa1-x)yIn1-yN层。另外,本实施例的活性层24可由例如同质结构、单异质结构、双异质结构、或是多重量子阱结构所堆叠而成。FIG. 4 shows a light-emitting structure, such as a light-emitting diode, including a growth substrate 21 made of gallium arsenide, silicon, silicon carbide, sapphire, indium phosphide, gallium phosphide, aluminum nitride, or gallium nitride. Next, an epitaxial structure 22 is formed on the growth substrate 21 . The epitaxial structure 22 is formed by an epitaxial process, such as metal organic vapor deposition epitaxy (MOCVD), liquid phase epitaxy (LPE) or molecular beam epitaxy (MBE). The epitaxial structure 22 includes at least a first electrical semiconductor layer 23, such as an n-type aluminum gallium indium phosphide (Al x Ga 1-x ) y In 1-y P layer or an n-type aluminum gallium indium nitride (Al x Ga 1-x ) y In 1-y N layer; the active layer 24 is, for example, aluminum gallium indium phosphide (Al x Ga 1-x ) y In 1-y P or aluminum gallium indium nitride (Al x Ga 1-x ) a multiple quantum well structure formed by y In 1-y N; and the second electrical semiconductor layer 25, for example, a p-type aluminum gallium indium phosphide (Al x Ga 1-x ) y In 1-y P layer or p type aluminum gallium indium nitride (Al x Ga 1-x ) y In 1-y N layer. In addition, the active layer 24 of this embodiment can be formed by stacking, for example, a homostructure, a single heterostructure, a double heterostructure, or a multiple quantum well structure.
接着,在外延结构22上形成第二电性接触层26及反射层27。第二电性接触层26的材料可为氧化铟锡(Indium Tin Oxide)、氧化铟(Indium Oxide)、氧化锡(Tin Oxide)、氧化镉锡(Cadmium Tin Oxide)、氧化锌(Zinc Oxide)、氧化镁(Magnesium Oxide)或氮化钛(Titanium Nitride)等。反射层27可为金属材料,例如铝、金、铂、锌、银、镍、锗、铟、锡等金属或其合金;也可由金属和氧化物组合而成,例如氧化铟锡/银(ITO/Ag)、氧化铟锡/氧化铝/银(ITO/AlOx/Ag)、氧化铟锡/氧化钛/氧化硅(ITO/TiOx/SiOx)、氧化钛/氧化硅/铝(TiOx/SiOx/Al)、氧化铟锡/氮化硅/铝(ITO/SiNx/Al)、氧化铟锡/氮化硅/银(ITO/SiNx/Ag)、氧化铟锡/氮化硅/氧化铝/铝(ITO/SiNx/Al2O3/Al)、或氧化铟锡/氮化硅/氧化铝/银(ITO/SiNx/Al2O3/Ag)等。Next, a second electrical contact layer 26 and a reflective layer 27 are formed on the epitaxial structure 22 . The material of the second electrical contact layer 26 can be indium tin oxide (Indium Tin Oxide), indium oxide (Indium Oxide), tin oxide (Tin Oxide), cadmium tin oxide (Cadmium Tin Oxide), zinc oxide (Zinc Oxide), Magnesium Oxide or Titanium Nitride, etc. The reflective layer 27 can be a metal material, such as aluminum, gold, platinum, zinc, silver, nickel, germanium, indium, tin and other metals or alloys thereof; it can also be made of a combination of metal and oxide, such as indium tin oxide/silver (ITO /Ag), indium tin oxide/alumina/silver (ITO/AlO x /Ag), indium tin oxide/titanium oxide/silicon oxide (ITO/TiO x /SiO x ), titanium oxide/silicon oxide/aluminum (TiO x /SiO x /Al), indium tin oxide/silicon nitride/aluminum (ITO/SiN x /Al), indium tin oxide/silicon nitride/silver (ITO/SiN x /Ag), indium tin oxide/silicon nitride /aluminum oxide/aluminum (ITO/SiN x /Al 2 O 3 /Al), or indium tin oxide/silicon nitride/aluminum oxide/silver (ITO/SiN x /Al 2 O 3 /Ag), etc.
接着,如图5所示将具有反射层27的发光结构接合于如图3所示的接合层11之上,并移除胶膜。接着如图6所示,通过激光剥离技术、蚀刻工艺或化学机械抛光工艺等方式移除生长基板21后,裸露出外延结构22的第一电性半导体层23的表面,再于其上形成第一电性接触层28。第一电性接触层28的材料可为氧化铟锡(Indium Tin Oxide)、氧化铟(Indium Oxide)、氧化锡(Tin Oxide)、氧化镉锡(Cadmium Tin Oxide)、氧化锌(Zinc Oxide)、氧化镁(Magnesium Oxide)、氮化钛(Titanium Nitride)、锗金(Ge/Au)或锗金镍(Ge/Au/Ni)所形成的薄膜,并可选择性地于薄膜上以蚀刻工艺形成特定图案。利用热蒸镀(Thermal Evaporation)、电子束蒸镀(E-beam)或离子溅镀(Sputtering)等方法,在第一电性接触层28的特定图案间形成第一电极29。若第一电性接触层28为未形成特定图案的连续薄膜层,则第一电极29则可直接形成于第一电性接触层之上。于此实施例中,金属阵列基板10可作为第二电极。接着蚀刻多道切割道30,再沿着切割道将发光二极管切割成多个具有高导热金属单元基板5的发光二极管管芯100,如图7所示,其中金属单元基板的侧面具有胶体物质4。Next, as shown in FIG. 5 , the light emitting structure with the reflective layer 27 is bonded on the bonding layer 11 as shown in FIG. 3 , and the adhesive film is removed. Next, as shown in FIG. 6 , after the growth substrate 21 is removed by means of laser lift-off technology, etching process or chemical mechanical polishing process, the surface of the first electrical semiconductor layer 23 of the epitaxial structure 22 is exposed, and then the first electrical semiconductor layer 23 is formed thereon. An electrical contact layer 28 . The material of the first electrical contact layer 28 can be indium tin oxide (Indium Tin Oxide), indium oxide (Indium Oxide), tin oxide (Tin Oxide), cadmium tin oxide (Cadmium Tin Oxide), zinc oxide (Zinc Oxide), A thin film formed of magnesium oxide (Magnesium Oxide), titanium nitride (Titanium Nitride), germanium gold (Ge/Au) or germanium gold nickel (Ge/Au/Ni), and can be selectively formed on the film by etching process specific patterns. The first electrodes 29 are formed between the specific patterns of the first electrical contact layer 28 by means of thermal evaporation, electron beam evaporation (E-beam) or ion sputtering (Sputtering). If the first electrical contact layer 28 is a continuous film layer without a specific pattern, the first electrode 29 can be directly formed on the first electrical contact layer. In this embodiment, the metal array substrate 10 can be used as the second electrode. Then etch a plurality of dicing lines 30, and then cut the light-emitting diodes along the dicing lines into a plurality of light-emitting diode dies 100 having a metal unit substrate 5 with high thermal conductivity, as shown in FIG. .
实施例二Embodiment two
本发明的另一实施例中的金属阵列基板制作方法的流程图与实施例一相同(图2A至图2H)。其所形成的发光结构以发光二极管为例,结构与制作方法则如图8-12所示,图8包含生长基板21,其材料可为砷化镓、硅、碳化硅、蓝宝石、磷化铟、磷化镓、氮化铝或氮化镓等。接着,在生长基板21上形成外延结构22。外延结构22通过外延工艺所形成,例如有机金属气相沉积外延法(MOCVD)、液相外延法(LPE)或分子束外延法(MBE)等外延工艺。此外延结构22至少包含第一电性半导体层23,例如为n型磷化铝镓铟(AlxGa1-x)yIn1-yP层或n型氮化铝镓铟(AlxGa1-x)yIn1-yN层;活性层24,例如为磷化铝镓铟(AlxGa1-x)yIn1-yP或氮化铝镓铟(AlxGa1-x)y In1-yN所形成的多重量子阱结构;以及第二电性半导体层25,例如为p型磷化铝镓铟(AlxGa1-x)yIn1-yP层或p型氮化铝镓铟(AlxGa1-x)yIn1-yN层。另外,本实施例的活性层24可由例如同质结构、单异质结构、双异质结构、或是多重量子阱结构所堆叠而成。接着,在外延结构22上形成第二电性接触层26,其材料可为氧化铟锡(IndiumTin Oxide)、氧化铟(Indium Oxide)、氧化锡(Tin Oxide)、氧化镉锡(Cadmium TinOxide)、氧化锌(Zinc Oxide)、氧化镁(Magnesium Oxide)或氮化钛(TitaniumNitride)等。The flowchart of the manufacturing method of the metal array substrate in another embodiment of the present invention is the same as that in the first embodiment (FIG. 2A to FIG. 2H). The formed light-emitting structure takes a light-emitting diode as an example. The structure and manufacturing method are shown in Figures 8-12. Figure 8 includes a growth substrate 21 whose material can be gallium arsenide, silicon, silicon carbide, sapphire, indium phosphide , gallium phosphide, aluminum nitride or gallium nitride, etc. Next, an epitaxial structure 22 is formed on the growth substrate 21 . The epitaxial structure 22 is formed by an epitaxial process, such as metal organic vapor deposition epitaxy (MOCVD), liquid phase epitaxy (LPE) or molecular beam epitaxy (MBE). The epitaxial structure 22 includes at least a first electrical semiconductor layer 23, such as an n-type aluminum gallium indium phosphide (Al x Ga 1-x ) y In 1-y P layer or an n-type aluminum gallium indium nitride (Al x Ga 1-x ) y In 1-y N layer; the active layer 24 is, for example, aluminum gallium indium phosphide (Al x Ga 1-x ) y In 1-y P or aluminum gallium indium nitride (Al x Ga 1-x ) a multiple quantum well structure formed by y In 1-y N; and the second electrical semiconductor layer 25, for example, a p-type aluminum gallium indium phosphide (Al x Ga 1-x ) y In 1-y P layer or p type aluminum gallium indium nitride (Al x Ga 1-x ) y In 1-y N layer. In addition, the active layer 24 of this embodiment can be formed by stacking, for example, a homostructure, a single heterostructure, a double heterostructure, or a multiple quantum well structure. Next, a second electrical contact layer 26 is formed on the epitaxial structure 22, and its material can be Indium Tin Oxide, Indium Oxide, Tin Oxide, Cadmium Tin Oxide, Zinc oxide (Zinc Oxide), magnesium oxide (Magnesium Oxide) or titanium nitride (Titanium Nitride), etc.
接着,如图9所示,将具有第二电性接触层26的外延结构通过粘着层32与临时基板31接合,再利用激光剥离技术、蚀刻工艺或化学机械抛光工艺等方式移除生长基板(未图示)。Next, as shown in FIG. 9, the epitaxial structure having the second electrical contact layer 26 is bonded to the temporary substrate 31 through the adhesive layer 32, and then the growth substrate is removed by laser lift-off technology, etching process or chemical mechanical polishing process ( not shown).
接着如图10所示,生长基板21移除后,裸露出外延结构22的第一电性半导体层23的表面,再于其上形成第一电性接触层28。第一电性接触层28的材料可为氧化铟锡(Indium Tin Oxide)、氧化铟(Indium Oxide)、氧化锡(Tin Oxide)、氧化镉锡(Cadmium Tin Oxide)、氧化锌(Zinc Oxide)、氧化镁(Magnesium Oxide)、氮化钛(Titanium Nitride)、锗金(Ge/Au)或锗金镍(Ge/Au/Ni)所形成的薄膜,并可选择性地于薄膜上以蚀刻工艺形成特定图案。接着将发光二极管从第一电性接触层28、第一电性半导体层23、活性层24、第二电性半导体层25由上而下蚀刻至露出第二电性接触层26,再分别于第一电性接触层28上表面形成第一电极29,并于第二电性接触层26暴露的表面形成第二电极33。其中第一电极与第二电极的材料可为金锡合金或金铟合金。在此实施例中,亦可将第一电性接触层28上表面及/或下表面与第二电性接触层26暴露的表面蚀刻成粗糙面。接着,将芯片切割成一个个具有第一电极29及第二电极33的元件结构管芯,并将其粘着于胶膜34之上。Next, as shown in FIG. 10 , after the growth substrate 21 is removed, the surface of the first electrical semiconductor layer 23 of the epitaxial structure 22 is exposed, and then the first electrical contact layer 28 is formed thereon. The material of the first electrical contact layer 28 can be indium tin oxide (Indium Tin Oxide), indium oxide (Indium Oxide), tin oxide (Tin Oxide), cadmium tin oxide (Cadmium Tin Oxide), zinc oxide (Zinc Oxide), A thin film formed of magnesium oxide (Magnesium Oxide), titanium nitride (Titanium Nitride), germanium gold (Ge/Au) or germanium gold nickel (Ge/Au/Ni), and can be selectively formed on the film by etching process specific patterns. Next, the light-emitting diode is etched from the first electrical contact layer 28, the first electrical semiconductor layer 23, the active layer 24, and the second electrical semiconductor layer 25 from top to bottom to expose the second electrical contact layer 26, and then respectively The first electrode 29 is formed on the upper surface of the first electrical contact layer 28 , and the second electrode 33 is formed on the exposed surface of the second electrical contact layer 26 . The materials of the first electrode and the second electrode may be gold-tin alloy or gold-indium alloy. In this embodiment, the upper surface and/or the lower surface of the first electrical contact layer 28 and the exposed surface of the second electrical contact layer 26 may also be etched into a rough surface. Next, the chip is cut into element structure dies having the first electrodes 29 and the second electrodes 33 one by one, and these are adhered on the adhesive film 34 .
接着如图11所示,将胶膜上的管芯直接接合于如图2H所示的高导热性金属阵列基板20之上,使第一电极29及第二电极33分别对应于相邻的金属单元基板6b、6a之上,且金属单元基板6b、6a之间胶体物质具有隔绝两电极的功用。再移除上下的胶膜34(未图示),临时基板31与粘着层32。若临时基板31为可透光性基板时,则不需移除。接下来,沿着切割道将发光二极管切割成多个具有高导热金属单元基板的倒装芯片式发光二极管管芯200,如图12所示。其中金属单元基板由6a、6b二个相邻面积不同的单元基板所组成,其面积由相对应的第二电极33与第一电极29间的距离而定,且其侧面具有胶体物质4。Next, as shown in FIG. 11, the die on the adhesive film is directly bonded to the high thermal conductivity metal array substrate 20 shown in FIG. 2H, so that the first electrodes 29 and the second electrodes 33 correspond to the adjacent metal The colloid substance on the unit substrates 6b, 6a and between the metal unit substrates 6b, 6a has the function of isolating the two electrodes. Then remove the upper and lower adhesive films 34 (not shown), the temporary substrate 31 and the adhesive layer 32 . If the temporary substrate 31 is a translucent substrate, it does not need to be removed. Next, the LED is cut along the dicing line into a plurality of flip-chip LED dies 200 having metal unit substrates with high thermal conductivity, as shown in FIG. 12 . The metal unit substrate is composed of two adjacent unit substrates 6a and 6b with different areas, the area of which is determined by the distance between the corresponding second electrode 33 and the first electrode 29, and colloidal substance 4 is provided on its side.
实施例三Embodiment Three
本发明的再一实施例,其结构与制作方法如第13-19图所示。Still another embodiment of the present invention, its structure and manufacturing method are shown in Figures 13-19.
图13所示为以图4所形成的结构为例,在反射层27之上以光致抗蚀剂2定义出切割道的位置,接着如图14所示形成电镀层,例如电镀镍(7a)/铜(8)/镍(7b)(其厚度分别为10-50μm/50-100μm/5-20μm),其中镍的作用为缓和铜之内应力,且可以以镍合金替代。然后将光致抗蚀剂去除,即形成多道切割道30(如图15所示)。再将耐热胶体物质4填满整个切割道,即形成利用胶体物质粘结多个金属单元基板所组成的高导热性金属阵列基板(如图16)。接着进行移除生长基板21(未图示),再于第一电性半导体层23之上形成第一电性接触层28,如图17所示。于第一电性接触层之上形成第一电极29,在电镀镍7b表面形成第二电极33,并以黄光蚀刻工艺形成多道切割道30,如图18所示。再以激光或钻石刀进行管芯切割,将发光二极管切割成多个具有高导热金属单元基板的发光二极管管芯300,如图19所示。Figure 13 shows that taking the structure formed in Figure 4 as an example, the photoresist 2 is used to define the position of the cutting line on the reflective layer 27, and then an electroplating layer is formed as shown in Figure 14, such as electroplating nickel (7a )/copper (8)/nickel (7b) (thicknesses are 10-50 μm/50-100 μm/5-20 μm respectively), wherein the function of nickel is to relieve the internal stress of copper, and nickel alloy can be used instead. Then the photoresist is removed, that is, multiple cutting lines 30 are formed (as shown in FIG. 15 ). Then, the heat-resistant colloidal substance 4 is filled up the entire cutting line to form a metal array substrate with high thermal conductivity composed of a plurality of metal unit substrates bonded by the colloidal substance (as shown in FIG. 16 ). Then remove the growth substrate 21 (not shown), and then form the first electrical contact layer 28 on the first electrical semiconductor layer 23 , as shown in FIG. 17 . A first electrode 29 is formed on the first electrical contact layer, a second electrode 33 is formed on the surface of the electroplated nickel 7b, and multiple cutting lines 30 are formed by photolithography, as shown in FIG. 18 . Then use a laser or a diamond knife to cut the die, and cut the light emitting diode into a plurality of light emitting diode die 300 with metal unit substrates with high thermal conductivity, as shown in FIG. 19 .
虽然本发明已以优选实施例披露如上,然其并非用以限定本发明,任何熟习此技艺者,在不脱离本发明的精神和范围内,当可作各种的更动与润饰,因此本发明的保护范围当视权利要求所界定者为准。Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Anyone skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, this The scope of protection of the invention should be defined by the claims.
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