CN101576603A - Testing device - Google Patents

Abstract

The invention relates to a testing device which is suitable for testing a plurality of boards to be tested of different types. The testing device comprises a programmable testing platform and a storage unit. The programmable test platform comprises a programmable system chip, a storage unit and an input/output unit, wherein the storage unit is electrically connected to the programmable system chip, and an operating system is stored in the storage unit. The input/output unit is electrically connected to one of the programmable system chip and the board to be tested and the storage unit. The input/output unit is suitable for generating a starting signal according to an input action, and the programmable system chip is suitable for selecting a preset test flow according to the starting signal and testing a board to be tested which is electrically connected to the input/output unit according to the preset test flow. The storage unit is used for storing a test result output by the programmable system chip. The testing device can reduce the testing cost and the testing time.

Description

test device

technical field

The invention relates to a test device, in particular to a test device capable of testing a variety of boards under test (Unit Under Test, UUT), which can reduce test cost and test time.

Background technique

Please refer to FIG. 1 , which is a block diagram of a conventional testing device. The conventional test device 100 includes a host computer (Host PC) 110, a test board 120 and a shop floor information system (Shop Floor Information System, SFIS) 130. The host computer 110 is electrically connected to the testing board 120 and the on-site real-time information system 130 , and the testing board 120 is used to electrically connect to a board under test 50 .

The testing and updating of the conventional testing device 100 is controlled by the host computer 110 , and the testing board 120 cannot independently test the board 50 to be tested. Therefore, the testing procedure in the prior art is to start the testing process through the host computer 110 and to test the board 50 to be tested through the testing board 120 . After the test is completed, the host computer 110 will send the test result to the on-site real-time information system 130, and the on-site real-time information system 130 will store the test result.

In the prior art, each test board 120 is used to test a specific board 50 to be tested, so the test board 120 needs to be replaced when testing different boards 50 to be tested. In addition, since each board 50 to be tested includes a plurality of parts to be tested, if the board 50 to be tested is upgraded, it is usually necessary to develop a new extension card, add components to the test board 120 or redesign the test board 120, Each portion to be tested of the board to be tested 50 is completely tested. In particular, if the board to be tested 50 has an active component (such as a Local Area Network (LAN) chip), it is often necessary to replace another test board or add new components.

Because the prior art needs to develop many test boards 120 , it is costly. In addition, when testing different boards 50 to be tested, the test board 120 needs to be replaced, so it is time-consuming. In addition, when setting up the host computer 110, it is necessary to install an operating system (Operating System, OS), drivers, and related software, and to configure a network, so it will take a lot of time.

Based on the above, the existing conventional technology has the disadvantages of high testing cost and long testing time.

This shows that the above-mentioned existing testing device obviously still has inconvenience and defects in structure and use, and needs to be further improved urgently. In order to solve the above-mentioned problems, the relevant manufacturers have tried their best to find a solution, but no suitable design has been developed for a long time, and the general products do not have a suitable structure to solve the above-mentioned problems. urgent problem to be solved. Therefore, how to create a test device with a new structure is one of the current important research and development topics, and it has also become a goal that the industry needs to improve.

In view of the defects in the above-mentioned existing testing devices, the inventor actively researches and innovates on the basis of years of rich practical experience and professional knowledge in the design and manufacture of such products, and cooperates with the application of academic principles, in order to create a new type of testing device. The device can improve the general existing test device to make it more practical. Through continuous research, design, and after repeated trial samples and improvements, the present invention with practical value is finally created.

Contents of the invention

The purpose of the present invention is to overcome the defects of the existing testing device and provide a testing device with a new structure. The technical problem to be solved is to reduce the testing cost and testing time, which is very suitable for practical use.

The purpose of the present invention and the solution to its technical problems are achieved by adopting the following technical solutions. According to a kind of test device that the present invention proposes, be suitable for testing a plurality of boards to be tested of different types, this test device comprises: a programmable test platform, comprises: a programmable system chip (chip is chip, is referred to herein as chip ); a storage unit (memory unit, hereinafter referred to as the storage unit), electrically connected to the programmable system chip, the storage unit stores an operating system; an input/output unit, electrically connected to the programmable system chip One of the chip and the boards under test, wherein the input/output unit is adapted to generate an activation signal according to an input action, and the programmable system chip is adapted to select a preset test process according to the activation signal, and testing the board under test electrically connected to the I/O unit according to the preset test process; and a storage unit electrically connected to the I/O unit to store the output of the programmable system chip a test result.

The purpose of the present invention and its technical problems can also be further realized by adopting the following technical measures.

In the aforementioned testing device, the programmable system chip is a field programmable logic gate array chip.

In the aforementioned test device, the programmable test platform further includes a display unit electrically connected to the programmable system chip to display a test information.

In the aforementioned test device, the programmable test platform is an embedded system development platform.

The aforementioned test device further includes a real-time information system on site, and the storage unit is located in the real-time information system on site.

The aforementioned testing device further includes a server, and the storage unit is located in the server.

The aforementioned test device, wherein the input/output unit includes a barcode scanner, and each board to be tested is provided with a code, and the barcode scanner is used to scan the board to be tested electrically connected to the input/output unit on the barcode to generate the activation signal.

In the aforementioned test device, the input/output unit includes a keyboard, a barcode scanner, a button switch or a control element.

In the aforementioned test device, the input/output unit includes a plurality of connection interfaces for electrically connecting the programmable system chip, the boards under test and the storage unit.

The aforementioned test device, wherein these connection interfaces include a general-purpose serial bus (a bus is a bus, which is referred to herein as a bus), a general-purpose input/output, a joint test workgroup port, an Ethernet port, and a wireless network interface At least one of , audio port, low voltage differential signal interface, printing terminal port, serial port, second generation personal system port (PS/2 port) and video image array port.

Compared with the prior art, the present invention has obvious advantages and beneficial effects. As can be seen from the above, in order to achieve the above purpose, the present invention provides a testing device, which is suitable for testing a plurality of different types of boards to be tested. The testing device includes a programmable testing platform (Programmable Testing Platform) and a storage unit. The programmable test platform includes a programmable system chip (System On Programmable Chip, SOPC), a storage unit and an input/output unit, wherein the storage unit is electrically connected to the programmable system chip, and the storage unit stores an operating system. The input/output unit is electrically connected to the programmable system chip, one of the boards under test and the storage unit. The input/output unit is adapted to generate an activation signal according to an input action, and the programmable system chip is adapted to select a preset test process according to the activation signal, and is electrically connected to the input/output unit according to the preset test process The board under test is tested. The storage unit is used for storing a test result output by the programmable system chip.

In an embodiment of the present invention, the aforementioned programmable system chip is a Field Programmable Gate Array chip (Field Programmable Gate Array, FPGA).

In an embodiment of the present invention, the above-mentioned programmable test platform further includes a display unit, which is electrically connected to the programmable system chip to display a test information.

In an embodiment of the present invention, the above-mentioned programmable test platform is an embedded system development platform (Embedded System Development Platform, ESDP).

In an embodiment of the present invention, the test device further includes a real-time information system on site, and the storage unit is located in the real-time information system.

In an embodiment of the present invention, the above-mentioned testing device further includes a server (Server), and the storage unit is located in the server.

In one embodiment of the present invention, the above-mentioned input/output unit includes a barcode scanner (Barcode Scanner), and each board to be tested is provided with a barcode, and the barcode scanner is used for scanning the electronically connected to the input/output unit. Barcode on the board to be tested to generate a start signal.

In an embodiment of the present invention, the above-mentioned input/output unit includes a keyboard, a barcode scanner, a button switch or a control element.

In an embodiment of the present invention, the above-mentioned input/output unit includes a plurality of connection interfaces for electrically connecting the programmable system chip, the board under test and the storage unit.

In an embodiment of the present invention, the connection interface includes a Universal Serial Bus (Universal Serial Bus, USB), a General Purpose I/O (General Purpose I/O), a Joint Test Action Group Port (JTAG Port) ), Ethernet Port (EthernetPort), wireless network interface, audio port, Low-Voltage Differential Signaling (Low-Voltage DifferentialSignaling, LVDS) interface, printing terminal port (Line Print Terminal Port, LPTPort), serial port (COM Port ), at least one of a second-generation personal system port and a video image array port (Video Graphics Array Port, VGA Port).

By means of the above-mentioned technical solution, the testing device of the present invention has at least the following advantages and beneficial effects: In the testing device of the present invention, since the programmable system chip has an operating system built in and multiple testing procedures are preset, it can target different types of The board under test is tested. Compared with the prior art, the present invention does not need a host computer, and does not need to make many test boards, which not only saves the cost of making test boards, but also saves the time for replacing test boards. Therefore, the test device of the present invention can reduce test cost and test time.

To sum up, the testing device of the present invention can reduce testing cost and testing time. The present invention has the above-mentioned many advantages and practical value, and it has great improvement no matter in product structure or function, has remarkable progress in technology, and has produced easy-to-use and practical effects, and has more advantages than existing testing devices. The outstanding function of promotion is more suitable for practical use, and it is a novel, progressive and practical new design.

The above description is only an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention, it can be implemented according to the contents of the description, and in order to make the above and other purposes, features and advantages of the present invention more obvious and understandable , the following preferred embodiments are specifically cited below, and are described in detail as follows in conjunction with the accompanying drawings.

Description of drawings

Fig. 1 is a block diagram of a conventional testing device.

Fig. 2 is a block diagram of a testing device in a preferred embodiment of the present invention.

FIG. 3 is a block diagram of an input/output unit in the testing device of FIG. 2 .

FIG. 4 is a diagram of testing steps of the testing device in FIG. 2 .

5A and 5B are block diagrams of testing devices in another two preferred embodiments of the present invention.

50: Board to be tested 60: Board to be tested

62: barcode 100, 200, 200a, 200b: test device

110: Host computer 120: Test board

130, 400: On-site real-time information system 210: Storage unit

300: Programmable Test Platform 310: Programmable System Chip

320: input/output unit 322: connection interface

324: barcode scanner 326: keyboard

330: Display unit 340: Storage unit

350: Clock Generation Unit 360: Power Management Unit

370: Operating System 500: Server

S110～S140: steps

Detailed ways

In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, the specific implementation, structure, characteristics and effects of the test device proposed according to the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments. The description is as follows.

The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of preferred embodiments with reference to the drawings. Through the description of the specific implementation mode, when the technical means and functions adopted by the present invention to achieve the predetermined purpose can be obtained a deeper and more specific understanding, but the accompanying drawings are only for reference and description, and are not used to explain the present invention be restricted.

Please refer to FIG. 2 , which is a block diagram of a testing device according to a preferred embodiment of the present invention. The testing device 200 of the preferred embodiment of the present invention is suitable for testing a plurality of different types of boards 60 to be tested. The test device 200 includes a storage unit 210 and a programmable test platform 300 .

The above programmable test platform 300 includes a programmable system chip 310, a storage unit 340 and an input/output unit 320, wherein:

The storage unit 340 is electrically connected to the programmable system chip 310, and the storage unit 340 can be used as an extended memory. In addition, the storage unit 340 stores an operating system 370 . When the programmable test platform 300 is turned on, the operating system 370 will be loaded into the programmable system chip 310 .

The input/output unit 320 is electrically connected to the programmable system chip 310 , one of the above-mentioned multiple boards under test 60 and the storage unit 210 . The input/output unit 320 is adapted to generate an activation signal according to an input action, and the programmable system chip 310 is adapted to select a preset test process according to the activation signal, and electrically connect to the input/output according to the preset test process. The board under test 60 of the output unit 320 is tested. The storage unit 210 is used for storing a test result output by the programmable system chip 310 .

In the above-mentioned test device 200, the programmable test platform 300 is, for example, an embedded system development platform, the programmable system chip 310 is, for example, a field programmable logic gate array chip, and the operating system 370 can be Linux, μC-Linux, Windows CE, μC-OS II, VxWorks, PalmOS, QNX or other applicable operating systems. The programmable system chip 310 has a plurality of preset test procedures in its memory, which can be tested for different types of boards 60 to be tested.

In addition, the programmable test platform 300 may further include a display unit 330, wherein the display unit 330 is electrically connected to the programmable system chip 310 to display a test information (including test results and test process guidance). The display unit 330 may include a screen, a Seven Segment Display or other lights. In addition, the programmable test platform 300 may further include a clock generator unit (Clock Generator Unit) 350 and a power management unit 360 electrically connected to the programmable system chip 310, wherein the clock generator unit 350 is used to provide a programmable system Chip 310 is used for clock generation.

Please refer to FIG. 2 and FIG. 3 . FIG. 3 is a block diagram of the input/output unit in the testing device of FIG. 2 . The I/O unit 320 includes a plurality of connection interfaces 322 for electrically connecting the programmable SoC 310 , the board under test 60 and the storage unit 210 . These connection interfaces 322 can be universal serial bus, universal input/output, joint test workgroup port, Ethernet port, wireless network interface, audio port, low voltage differential signal interface, printing terminal port, serial port, At least one of the second generation personal system connection port and the video image array port, but not limited thereto. In addition, the user can program and write the programmable system chip 310 through the joint test working group port. In addition, in one embodiment, the input/output unit 320 may further include a barcode scanner 324 for scanning the barcode 62 on the board 60 to be tested. The input/output unit 320 may further include a keyboard 326 .

The testing steps of the testing device 200 of this embodiment will be described below with reference to the drawings. Please refer to FIG. 2 , FIG. 3 and FIG. 4 , wherein FIG. 4 is a diagram of testing steps of the testing device 200 in FIG. 2 .

The testing steps of the testing device 200 in this embodiment include the following steps: First, as shown in step S110 , an input action is performed so that the input/output unit 320 provides a start signal to the programmable system chip 310 . Specifically, the input action is, for example, operating the control element or button switch of the input/output unit 320, or inputting the type of the board to be tested 60 with the keyboard 326, or scanning the barcode 62 of the board to be tested 60 with the barcode scanner 324, but It is not limited to this. The input/output unit 320 provides an activation signal including the information of the board under test 60 to output to the programmable system chip 310 according to the input action.

Next, as shown in step S120, a preset test process is selected by the programmable system chip 310 according to the start signal. In more detail, because the programmable system chip 310 has multiple preset test procedures in memory, the programmable system chip 310 will select a test procedure suitable for the test board 60 according to the startup signal after receiving the startup signal. .

Afterwards, as shown in step S130 , the board under test 60 is tested by the programmable system chip 310 according to the selected test flow. At the same time, the display unit 330 will display the test information of the board under test 60 . In addition, during the test, the display unit 330 may display options that need to be selected by the tester. At this point, the tester can perform selected actions through the keyboard 326 to assist in completing the entire testing process.

Next, as shown in step S140, the test result is transmitted to the storage unit 210, so that the storage unit 210 stores the test result. In more detail, if the board under test 60 passes the test, the programmable system chip 310 will directly transmit the test result to the storage unit 210 . If the board to be tested 60 fails the test, the display unit 330 will display an option of whether to retest for the tester to choose. If the tester chooses not to retest, the programmable system chip 310 will transmit the test result to the storage unit 210 .

In the test device 200 of this embodiment, since the programmable test platform 300 can independently test the board 60 to be tested and transmit the test result to the storage unit 210 , there is no need to use a host computer in the prior art. In this way, the cost of the test device 200 and the time for setting up the host computer 110 can be saved. In addition, the programmable system chip 310 stores a plurality of preset test procedures, and the input/output unit 320 also includes a variety of connection interfaces 322 , so it can be tested for different types of boards 60 to be tested. Moreover, if the board under test 60 is changed or upgraded, it only needs to modify the program of the programmable system chip 310 to support related tests. Therefore, compared with the prior art, the test device 200 of this embodiment does not need to manufacture various test boards, which can save the cost of the test boards and the time for replacing the test boards. In other words, the testing device 200 of this embodiment can reduce testing cost and testing time.

Please refer to FIG. 5A and FIG. 5B , which are block diagrams of testing devices in another two preferred embodiments of the present invention. Please first refer to Fig. 5A, the test device 200a of the present embodiment is similar to the test device 200 in Fig. It is located in the on-site real-time information system 400 . In addition, referring to FIG. 5B , the testing device 200b of this embodiment is similar to the testing device 200 in FIG. located within the server 500.

In summary, the testing device of the present invention has at least the following advantages:

1. The programmable testing platform of the present invention can replace the host computer of the prior art, so the cost of the host computer and the time spent on setting up the host computer can be saved.

2. Since the programmable system chip has a built-in operating system and a variety of test procedures are preset, it can be tested for different types of boards to be tested. In this way, the cost of the test board in the prior art and the time for replacing the test board can be saved.

The above description is only a preferred embodiment of the present invention, and does not limit the present invention in any form. Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Anyone familiar with this field Those skilled in the art, without departing from the scope of the technical solution of the present invention, can use the technical content disclosed above to make some changes or modify equivalent embodiments with equivalent changes, but all the content that does not depart from the technical solution of the present invention, according to the present invention Any simple modifications, equivalent changes and modifications made to the above embodiments by the technical essence still belong to the scope of the technical solutions of the present invention.

Claims (10)

1, a kind of proving installation is suitable for testing different types of a plurality of board under test, it is characterized in that this proving installation comprises:

One programmable testing platform comprises:

One programmable chip system;

One storage unit is electrically connected to this programmable chip system, and this memory cell has an operating system;

One I/O unit, be electrically connected to this programmable chip system and those boards under test one of them, wherein this I/O unit is suitable for producing an enabling signal according to an input action, and this programmable chip system is suitable for choosing a default testing process according to this enabling signal, and according to this default testing process this board under test that is electrically connected to this I/O unit is tested; And

One storage element is electrically connected to this I/O unit, to store the test result that this programmable chip system is exported.

2, proving installation according to claim 1 is characterized in that wherein said programmable chip system is an on-the-spot programmable logic lock array chip.

3, proving installation according to claim 1 is characterized in that wherein said programmable testing platform more comprises a display unit, is electrically connected to this programmable chip system, to show a test information.

4, proving installation according to claim 1 is characterized in that wherein said programmable testing platform is an embedded system development platform.

5, proving installation according to claim 1 it is characterized in that it more comprises an on-the-spot real time information system, and this storage element is to be positioned at this scene real time information system.

6, proving installation according to claim 1 it is characterized in that it more comprises a servomechanism, and this storage element is to be positioned at this servomechanism.

7, proving installation according to claim 1, it is characterized in that wherein said I/O unit comprises a barcode scanner, and each board under test is provided with a bar code, this barcode scanner is electrically connected to this bar code on this board under test of this I/O unit in order to scanning, to produce this enabling signal.

8, proving installation according to claim 1 is characterized in that wherein said I/O unit comprises a keyboard, a barcode scanner, a pushbutton switch or a control element.

9, proving installation according to claim 1 is characterized in that wherein said I/O unit comprises a plurality of connection interfaces, to electrically connect this programmable chip system, those boards under test and this storage element.

10, proving installation according to claim 9, it is characterized in that wherein those connect interfaces comprise universal serial bus, universal I/O, joint test working group port, second net very much port, Wi-Fi interface, audio port, Low Voltage Differential Signal interface, printing terminal port, serial port, second generation ps Port and video graphics array port at least one of them.

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